DE19782254T1 - Verfahren und Vorrichtung zur Strommessung auf der Basis von angelegter Spannung - Google Patents
Verfahren und Vorrichtung zur Strommessung auf der Basis von angelegter SpannungInfo
- Publication number
- DE19782254T1 DE19782254T1 DE19782254T DE19782254T DE19782254T1 DE 19782254 T1 DE19782254 T1 DE 19782254T1 DE 19782254 T DE19782254 T DE 19782254T DE 19782254 T DE19782254 T DE 19782254T DE 19782254 T1 DE19782254 T1 DE 19782254T1
- Authority
- DE
- Germany
- Prior art keywords
- applied voltage
- current based
- measuring current
- measuring
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/08—Circuits for altering the measuring range
- G01R15/09—Autoranging circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Measurement Of Current Or Voltage (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP1997/004398 WO1999028756A1 (en) | 1997-12-02 | 1997-12-02 | Method of measuring current while applying a voltage and apparatus therefor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE19782254T1 true DE19782254T1 (de) | 2000-01-13 |
Family
ID=14181583
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19782254T Withdrawn DE19782254T1 (de) | 1997-12-02 | 1997-12-02 | Verfahren und Vorrichtung zur Strommessung auf der Basis von angelegter Spannung |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6255842B1 (de) |
| JP (1) | JP3184539B2 (de) |
| DE (1) | DE19782254T1 (de) |
| GB (1) | GB2336217B (de) |
| TW (1) | TW356525B (de) |
| WO (1) | WO1999028756A1 (de) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012207217A1 (de) * | 2012-04-30 | 2013-10-31 | Leica Microsystems Cms Gmbh | Beleuchtungseinrichtung für ein Mikroskop |
| DE102021210139B4 (de) | 2021-09-14 | 2024-05-29 | Volkswagen Aktiengesellschaft | Messkörper für ein Ermitteln einer Funktionalität eines Bordnetzes eines Fahrzeuges sowie Fahrzeug |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002236148A (ja) * | 2001-02-08 | 2002-08-23 | Mitsubishi Electric Corp | 半導体集積回路の試験装置およびそれを用いた半導体集積回路の試験方法 |
| US6777970B2 (en) * | 2001-04-19 | 2004-08-17 | Intel Corporation | AC testing of leakage current in integrated circuits using RC time constant |
| JP2003075515A (ja) * | 2001-08-31 | 2003-03-12 | Mitsubishi Electric Corp | 半導体集積回路の試験装置およびその試験方法 |
| DK175691B1 (da) * | 2002-09-11 | 2005-01-17 | Bactoforce As | Fremgangsmåde til at undersøge en varmeveksler for lækage |
| CN100489550C (zh) * | 2002-12-11 | 2009-05-20 | 株式会社爱德万测试 | 外加电压的电流测量装置及所用具有开关的电流缓存器 |
| US7276893B2 (en) * | 2005-02-28 | 2007-10-02 | Keithley Instruments, Inc. | Automatic ranging current shunt |
| JP3953087B2 (ja) * | 2005-10-18 | 2007-08-01 | 日本電産リード株式会社 | 絶縁検査装置及び絶縁検査方法 |
| US7492181B1 (en) * | 2006-05-31 | 2009-02-17 | Credence Systems Corporation | Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range |
| US7557592B2 (en) * | 2006-06-06 | 2009-07-07 | Formfactor, Inc. | Method of expanding tester drive and measurement capability |
| JP2009115506A (ja) * | 2007-11-02 | 2009-05-28 | Yokogawa Electric Corp | 直流試験装置及び半導体試験装置 |
| JP4983688B2 (ja) * | 2008-03-27 | 2012-07-25 | 富士通セミコンダクター株式会社 | 半導体装置 |
| FR2932568B1 (fr) * | 2008-06-11 | 2010-06-11 | Schneider Electric Ind Sas | Dispositif de mesure de courant et unite de traitement comportant un tel dispositif |
| US8278909B2 (en) | 2009-07-16 | 2012-10-02 | Mks Instruments, Inc. | Wide-dynamic range electrometer with a fast response |
| JP5489798B2 (ja) * | 2010-03-17 | 2014-05-14 | 三菱電機株式会社 | 電流検出装置およびモータシステム |
| KR20120139795A (ko) * | 2010-05-31 | 2012-12-27 | 가부시키가이샤 어드밴티스트 | 측정 장치 및 방법 |
| US8823385B2 (en) * | 2011-03-10 | 2014-09-02 | Infineon Technologies Ag | Detection of pre-catastrophic, stress induced leakage current conditions for dielectric layers |
| CN103649688B (zh) | 2011-06-30 | 2017-02-22 | 迈普尔平版印刷Ip有限公司 | 用于电容式测量系统的有源屏蔽 |
| US9551741B2 (en) * | 2011-11-23 | 2017-01-24 | Intel Corporation | Current tests for I/O interface connectors |
| SG2012068490A (en) | 2012-09-13 | 2014-04-28 | Schneider Electric South East Asia Hq Pte Ltd | A relay for automatically selecting a monitoring range |
| US10024889B2 (en) * | 2015-12-23 | 2018-07-17 | Intel IP Corporation | Apparatuses, methods, and systems for detection of a current level |
| FR3056299B1 (fr) * | 2016-09-16 | 2018-10-19 | STMicroelectronics (Alps) SAS | Procede de determination de la consommation en courant d'une charge active, par exemple une unite de traitement, et circuit electronique associe |
| TWI628448B (zh) * | 2017-03-07 | 2018-07-01 | 慧榮科技股份有限公司 | 電路測試方法 |
| CN109959818B (zh) * | 2017-12-25 | 2022-02-08 | 中国电信股份有限公司 | 电流测试方法、控制器和装置 |
| JP6996420B2 (ja) * | 2018-05-25 | 2022-01-17 | 三菱電機株式会社 | 半導体装置の試験方法 |
| WO2020244831A1 (en) * | 2019-06-07 | 2020-12-10 | Commsolid Gmbh | Method and apparatus for precise power and energy consumption measurements of communication modems |
| JP2021021580A (ja) * | 2019-07-25 | 2021-02-18 | 株式会社Gsユアサ | 電流計測装置、電流の計測方法、蓄電装置及び抵抗器 |
| JP2021032735A (ja) * | 2019-08-26 | 2021-03-01 | 日置電機株式会社 | 検出回路及び測定装置 |
| JP6865361B1 (ja) * | 2019-08-28 | 2021-04-28 | パナソニックIpマネジメント株式会社 | 換気装置 |
| JP7666866B2 (ja) * | 2021-04-22 | 2025-04-22 | 東京エレクトロン株式会社 | デバイス検査装置及びデバイス検査方法 |
| KR20230030436A (ko) * | 2021-08-25 | 2023-03-06 | 삼성전자주식회사 | 모니터링 회로, 모니터링 회로를 포함하는 집적 회로 및 모니터링 회로의 동작 방법 |
| FR3133675B1 (fr) * | 2022-03-21 | 2024-05-31 | Stmicroelectronics Grand Ouest Sas | Disposisif d’alimentation d’une charge et de mesure de la consommation de courant de cette charge |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2590068B2 (ja) | 1986-07-11 | 1997-03-12 | 株式会社日立製作所 | 自動取引装置 |
| JPH0611510Y2 (ja) * | 1986-07-21 | 1994-03-23 | 株式会社アドバンテスト | 電圧印加電流測定装置 |
| CH677266A5 (de) | 1986-10-28 | 1991-04-30 | Pacific Wietz Gmbh & Co Kg | |
| JPS63190975U (de) * | 1987-05-29 | 1988-12-08 | ||
| JP2748321B2 (ja) | 1987-11-16 | 1998-05-06 | キヤノン株式会社 | 画像形成装置 |
| JPH01129667U (de) * | 1988-02-19 | 1989-09-04 | ||
| US5428297A (en) * | 1993-06-15 | 1995-06-27 | Grace; James W. | Precision integrated resistors |
| JPH10124159A (ja) * | 1996-10-18 | 1998-05-15 | Advantest Corp | 電圧印加回路 |
-
1997
- 1997-12-02 US US09/341,893 patent/US6255842B1/en not_active Expired - Fee Related
- 1997-12-02 GB GB9916466A patent/GB2336217B/en not_active Expired - Fee Related
- 1997-12-02 DE DE19782254T patent/DE19782254T1/de not_active Withdrawn
- 1997-12-02 WO PCT/JP1997/004398 patent/WO1999028756A1/ja not_active Ceased
- 1997-12-02 JP JP53054099A patent/JP3184539B2/ja not_active Expired - Fee Related
- 1997-12-11 TW TW086118703A patent/TW356525B/zh active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012207217A1 (de) * | 2012-04-30 | 2013-10-31 | Leica Microsystems Cms Gmbh | Beleuchtungseinrichtung für ein Mikroskop |
| DE102012207217B4 (de) * | 2012-04-30 | 2021-03-04 | Leica Microsystems Cms Gmbh | Mikroskop mit einer Beleuchtungseinrichtung |
| DE102021210139B4 (de) | 2021-09-14 | 2024-05-29 | Volkswagen Aktiengesellschaft | Messkörper für ein Ermitteln einer Funktionalität eines Bordnetzes eines Fahrzeuges sowie Fahrzeug |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3184539B2 (ja) | 2001-07-09 |
| GB2336217B (en) | 2002-06-19 |
| WO1999028756A1 (en) | 1999-06-10 |
| US6255842B1 (en) | 2001-07-03 |
| GB9916466D0 (en) | 1999-09-15 |
| GB2336217A (en) | 1999-10-13 |
| TW356525B (en) | 1999-04-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8607 | Notification of search results after publication | ||
| 8139 | Disposal/non-payment of the annual fee |