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CN219084786U - Chip sample point detection device - Google Patents

Chip sample point detection device Download PDF

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Publication number
CN219084786U
CN219084786U CN202223600923.XU CN202223600923U CN219084786U CN 219084786 U CN219084786 U CN 219084786U CN 202223600923 U CN202223600923 U CN 202223600923U CN 219084786 U CN219084786 U CN 219084786U
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China
Prior art keywords
chip
detected
camera
driving motor
sample point
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CN202223600923.XU
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Chinese (zh)
Inventor
张建
华子昂
刘宝全
竹添
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Beijing Baionaxin Biotechnology Co ltd
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Beijing Baionaxin Biotechnology Co ltd
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Priority to CN202223600923.XU priority Critical patent/CN219084786U/en
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Abstract

The application provides a chip sample point detection device, this chip sample point detection device includes: the carrier is used for carrying the chip to be detected; the shooting device comprises a camera shooting assembly used for placing a camera bellows of the chip to be detected and shooting a sample point of the chip to be detected in the camera bellows; the transfer device comprises a clamp for clamping the chip to be detected and a mechanical arm for transferring the clamp to the camera bellows; the mechanical arm is located between the carrier and the camera bellows. In the technical scheme, the shooting device is adopted to shoot the chip to be detected, so that the sample point can be detected according to the shot picture, and the detection efficiency of the chip to be detected is improved.

Description

Chip sample point detection device
Technical Field
The present application relates to the field of biochip detection technology, and in particular, to a chip sample point detection device.
Background
The biochip technology is a micro biochemical analysis system integrating discontinuous analysis processes in the life science field on the surface of a silicon chip or a glass chip according to the principle of specific interactions between molecules. So as to realize accurate, rapid and large-information detection of cells, proteins, genes and other biological components.
Biochips include microarray chips, microfluidic chips, lab-on-a-chip, and related instruments and devices. The most common biochip preparation method is the direct spotting method. The method specifically comprises the following steps: after mixing the sample with the sample application liquid, the sample is applied on a substrate by a sample application instrument, and the biochip is manufactured by the subsequent process. The sample application volume of each sample point on the biochip is small, the diameter of the formed sample point is small, and the sample points are difficult to distinguish by naked eyes.
The sample application process is taken as an important process for preparing the chip, and the quality of the sample points after sample application can directly influence the quality of the biochip. Therefore, the quality of detection spotting is a serious issue in detecting biochips, but the current detection mode is direct observation by a microscope, but the field of view of the microscope is smaller, resulting in a lower detection rate.
Disclosure of Invention
The application provides a chip sample point detection device for improve the efficiency that chip sample point detected.
The application provides a chip sample point detection device, this chip sample point detection device includes:
the carrier is used for carrying the chip to be detected;
the shooting device comprises a camera shooting assembly used for placing a camera bellows of the chip to be detected and shooting a sample point of the chip to be detected in the camera bellows;
the transfer device comprises a clamp for clamping the chip to be detected and a mechanical arm for transferring the clamp to the camera bellows; the mechanical arm is located between the carrier and the camera bellows.
In the technical scheme, the shooting device is adopted to shoot the chip to be detected, so that the sample point can be detected according to the shot picture, and the detection efficiency of the chip to be detected is improved.
In a specific embodiment, the fixture comprises a placement table and a clamping mechanism for abutting the chip to be tested against the placement table.
In a specific implementation manner, the placing table comprises a cross arm and two vertical arms fixedly connected with the cross arm, wherein the two vertical arms are arranged at intervals, and a space for accommodating the chip to be detected is formed between the two vertical arms and the cross arm.
In a specific embodiment, the clamping mechanism comprises clamping assemblies which are arranged in a one-to-one correspondence with the two vertical arms;
each clamping assembly comprises a driving motor rotationally connected with the cross arm, a screw rod coaxially fixed with an output shaft of the driving motor, and a limiting block in threaded connection with the screw rod; wherein the rotating shaft around which the driving motor rotates is parallel to the arrangement direction of the two vertical arms; each clamping assembly further comprises a drawing wire connected with one end, far away from the driving motor, of the lead screw, and the drawing wire is connected with the driving mechanism of the mechanical arm and used for driving the lead screw and the driving motor to rotate;
the vertical arm is provided with a chute in sliding fit with the corresponding limiting block, and the length direction of the chute is along the length direction of the vertical arm;
when the driving motor rotates to a first position, the limiting block is separated from the sliding groove, and the limiting block avoids the chip to be detected;
when the driving motor rotates to a second position, the limiting block is positioned in the sliding groove;
when the driving motor drives the limiting block to slide in the sliding groove to a set position, the limiting block and the cross arm clamp the chip to be detected.
In a specific embodiment, the pull wire comprises an elastic member connected with one end of the screw rod far away from the driving motor and a steel wire rope connected with the elastic member.
In a specific embodiment, a sleeve is further included, the sleeve surrounding the pull wire.
In a specific embodiment, the camera assembly includes: a camera and a light source member; the camera lens faces the camera box, and the light source piece is fixed on the camera lens.
In a specific embodiment, the device further comprises a dust cover, and the carrier, the shooting device and the transferring device are all located in the dust cover.
In a specific embodiment, a humidifying device is further included, the humidifying device being in communication with the dust cover.
In a specific implementation manner, the device further comprises an image processing system, wherein the image processing system is connected with the image pickup assembly and used for detecting sample points of pictures shot by the image pickup assembly, judging sample point quality on a chip and distinguishing qualified products from unqualified products.
Drawings
Fig. 1 is a schematic structural diagram of a chip sample point detection device according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of an image capturing assembly according to an embodiment of the present application;
FIG. 3 is a schematic front view of a clamp according to an embodiment of the present application;
FIG. 4 is a schematic side view of a clamp provided in an embodiment of the present application;
fig. 5 is a schematic diagram of a clamping mechanism avoiding a chip to be detected according to an embodiment of the present application;
fig. 6 is a schematic diagram of another chip sample detection device according to an embodiment of the present application.
Detailed Description
The present application is further described in detail below by way of the accompanying drawings and examples. The features and advantages of the present application will become more apparent from the description.
The word "exemplary" is used herein to mean "serving as an example, embodiment, or illustration. Any embodiment described herein as "exemplary" is not necessarily to be construed as preferred or advantageous over other embodiments. Although various aspects of the embodiments are illustrated in the accompanying drawings, the drawings are not necessarily drawn to scale unless specifically indicated.
In addition, the technical features described below in the different embodiments of the present application may be combined with each other as long as they do not collide with each other.
In order to facilitate understanding of the chip sample point detection device provided in the embodiments of the present application, an application scenario thereof will be described first. The chip sampling point detection device provided by the embodiment of the application is used for detecting the sampling point quality on the biochip. The current chip sampling point detection mode is to detect through a microscope, but the detection efficiency is lower due to the smaller view angle range of the microscope. Therefore, the embodiment of the application provides a chip sampling point detection device so as to improve the efficiency of chip sampling point detection. The following detailed description refers to the accompanying drawings and examples.
Referring to fig. 1, fig. 1 shows a schematic structural diagram of a chip sample detection device according to an embodiment of the present application. The chip sample detection device provided in the embodiment of the present application mainly includes a carrier 100, a shooting device 200, and a transferring device 300. The carrier 100 is used for carrying a chip to be detected, the transfer device 300 is used for transferring the chip to be detected stored on the carrier 100 to the photographing device 200, and the photographing device 200 is used for photographing a sample point of the chip to be detected, so as to detect the sample point subsequently. The structure of each component of the chip spot detection apparatus is described in detail below with reference to the drawings.
With continued reference to fig. 1, a carrier 100 provided in embodiments of the present application may be placed on a support surface formed by a base or other structure. The carrier 100 is a frame structure, and a receiving slot for receiving a chip to be tested is provided thereon. When the chip to be detected is placed, the chip to be detected can be vertically inserted into the accommodating groove. Of course, it should be understood that the carrier 100 provided in the embodiment of the present application is not limited to the carrying manner of the accommodating groove in the foregoing example, and other carrying manners may be adopted, which are not described in detail in the embodiment of the present application.
The photographing device 200 provided in the embodiment of the application is used for photographing a chip to be detected. The camera module comprises a camera module 210 for placing a chip to be detected, and a camera module 220 for shooting a sample of the chip to be detected in the camera module 210. The camera module 210 is disposed on a supporting surface of the carrier 100 and is used for providing a shooting environment for providing a contrast of light when the camera module 220 shoots.
As an example, the camera bellows 210 may be 12cm in height, 10cm in length, and 10cm in width. In addition, an opening of 7.5cm×2.6cm is provided on the upper surface of the dark box 210, for placing the chip to be detected. The upper surface of the camera module 210 refers to the surface of the camera module 210 facing the camera module 220. The position of the opening is located in the view angle range of the camera assembly 220, so as to ensure that the camera assembly 220 can shoot the chip to be detected.
Referring to fig. 2, fig. 2 shows a schematic configuration of the camera assembly. The camera assembly 220 may include a camera 221 and a light source member when specifically configured; the lens of the camera 221 faces the camera case 210, and the light source member is fixed to the lens. In a specific setting, the pixels of the camera 221 are not lower than 500 ten thousand, so as to ensure that the shot image information of the sample point on the chip to be detected meets the detection requirement. When the light source is arranged, a hollow round light source is connected to the bottom of the lens of the camera 221, the hollow round light source is fixed on the lens through a screw, and the lens is nested in the center of the unprecedented round light source.
To support the camera 221, the image capturing assembly 220 may further include a lens holder, where the lens holder is fixed on a supporting surface of the carrier. The lens holder may include a cross bar 222 and a vertical bar 223, wherein the vertical bar 223 may be fixed on the base, and the cross bar 222 is fixed on the vertical bar 223 and forms an inverted L-shaped structure. Referring to fig. 1 and 2, when the camera 221 is fixed, the camera 221 is fixed at one end of the cross bar 222 away from the vertical bar 223, and the lens of the camera 221 faces the opening of the camera box 210, so as to ensure that the camera 221 can shoot the chip to be detected. As an example, when the camera 221 is fixed, the interval between the lens bottom surface of the camera 221 and the upper surface of the camera box 210 may be 12cm.
It should be understood that, when the camera assembly 220 provided in the embodiments of the present application supports the camera 221, other supporting structures may be adopted besides the lens holders illustrated in the above examples, which are not described in detail in the embodiments of the present application.
In the embodiment of the application, the chip sample point detection device shoots the chip to be detected by adopting the shooting device, so that the sample point can be detected according to the shot picture, and the detection efficiency of the chip to be detected is improved.
With continued reference to fig. 1, when photographing the chip to be inspected, the chip to be inspected needs to be transferred from the carrier 100 to the camera bellows 210. For this reason, the embodiment of the present application provides a transferring device 300, and the transferring device 300 can transfer the chip to be tested from the carrier 100 to the camera bellows 210.
The transfer device 300 provided in the embodiment of the present application includes a fixture 310 and a mechanical arm 320. The clamp 310 is used for clamping a chip to be tested. The driving mechanism can transfer the fixture 310 and the chip to be tested to the camera bellows 210.
Referring to fig. 3, fig. 3 shows a schematic structural view of the jig. When the jig 310 is specifically provided, its specific structure may include a placement stage 311 and a clamping mechanism for abutting the chip 10 to be inspected against the placement stage 311. The following detailed description is made with reference to the specific drawings and examples.
Referring to fig. 3 and fig. 4 together, the placement platform 311 provided in the example of the present application includes a cross arm 3111 and two vertical arms 3112 fixedly connected to the cross arm 3111. When two vertical arms 3112 are specifically provided, the two vertical arms 3112 are arranged at intervals, thereby forming an inverted U-shaped structure. To enclose a space between the two vertical arms 3112 and the cross arm 3111 for accommodating the chip 10 to be inspected.
As an alternative, two vertical arms 3112 are fixed to both ends of the cross arm 3111 in the length direction. When the vertical arm 3112 is fixedly connected to the cross arm 3111, the vertical arm may be connected by bolts or screws, or may be fixedly connected by different means such as bonding, welding, or the like. Of course, in addition to the above, the vertical arm 3112 and the cross arm 3111 may be integrally formed, that is, an inverted U-shaped structure may be directly formed by a mold during the manufacturing process.
When the chip 10 to be detected is fixed, the chip 10 to be detected is pressed against the cross arm 3111 of the placing table 311 by the holding mechanism to fix the chip 10 to be detected. When clamping the chip 10 to be tested, the vertical array of sample spots 11 is arranged.
As one example, as shown in fig. 3, the clamping mechanism may include two clamping assemblies 312, where the two clamping assemblies 312 are in one-to-one correspondence with the two vertical arms 3112 when provided. Each clamping assembly 312 may include a screw 3122, a driving motor 3121, and a limiting block 3124.
When the driving motor 3121 is provided, the driving motor 3121 is rotatably connected to the cross arm 3111, and an axis around which the driving motor 3121 rotates is parallel to a length direction of the cross arm 3111, that is, a rotation axis around which the driving motor 3121 rotates is parallel to a direction in which the two vertical arms 3112 are arranged. As shown in fig. 5 with an arrowed arcuate line. As the driving motor 3121 rotates, it may swing in the direction of the arc line. For convenience of description, a first position a is a position where the driving motor 3121 is located in fig. 5, and a second position B is a position where the driving motor 3121 is located in fig. 4 are defined.
When the screw 3122 is provided, the longitudinal direction of the screw 3122 is parallel to the longitudinal direction of the vertical arm 3112, and the screw 3122 is driven to rotate by the driving motor 3121. Illustratively, in one manner in which the drive motor 3121 drives the lead screw 3122, the output shaft of the drive motor 3121 is perpendicular to the length direction of the cross arm 3111. And when the driving motor 3121 is connected with the screw 3122, an output shaft of the driving motor 3121 is fixedly connected with the screw 3122 coaxially, so that the screw 3122 can be driven to rotate by the output shaft when the driving motor 3121 rotates.
The stopper 3124 is a structure that cooperates with the cross arm 3111 to fix the chip 10 to be detected. When the stopper 3124 is specifically provided, the stopper 3124 is screwed with the screw 3122 and is slidable with respect to the vertical arm 3112. As shown in fig. 4 and 5, the vertical arm 3112 is provided with a chute 3112a slidably engaged with the corresponding stopper 3124, and a longitudinal direction of the chute 3112a is provided along a longitudinal direction of the vertical arm 3112. The stopper 3124 may be located in the chute 3112a and may slide along the length direction of the chute 3112 a. When the chip 10 to be detected needs to be pressed, the driving motor 3121 drives the screw 3122 to rotate, and the limiting block 3124 cannot rotate along with the screw 3122 due to the limitation of the chute 3112 a. In addition, the threaded connection between the screw 3122 and the limiting block 3124 drives the limiting block 3124 to move along the length direction of the chute 3112a, so that the chip 10 to be detected is pushed to move beyond the cross arm 3111 by the limiting block 3124, and when the driving motor 3121 drives the limiting block 3124 to slide in the chute 3112a to a set position, the limiting block 3124 and the cross arm 3111 clamp the chip 10 to be detected.
With continued reference to fig. 5, when the clamping assembly 312 cooperates with the placement table 311 to clamp and fix the chip 10 to be detected, the limiting block 3124 needs to avoid the chip 10 to be detected in the process that the placement table 311 is inserted into the chip 10 to be detected, so as to avoid the limiting block 3124 blocking the chip 10 to be detected from entering the placement table 311. For this reason, the clamping assembly 312 provided in the embodiment of the present application further includes a pull wire connected to one end of the screw 3122 away from the driving motor 3121, where the pull wire is connected to the driving mechanism of the mechanical arm 320 and is used to drive the screw and the driving motor 3121 to rotate. As shown in fig. 4 and 5, since fig. 4 and 5 are side views of the jig, the chute is indicated by a dotted line for convenience of illustration. When the screw 3122 and the stopper 3124 are located at the positions shown in fig. 4, the driving motor 3121 is located at the second position B, and the stopper 3124 is located in the chute 3112a, so that the stopper 3124 can block the chip 10 to be detected from entering between the cross arm 3111 and the vertical arm 3112. As shown in fig. 5, when the driving motor 3121 is rotated to a certain angle, the driving motor 3121 is located at the first position a, the stopper 3124 is disengaged from the sliding engagement with the vertical arm 3112 (the stopper 3124 is disengaged from the chute 3112 a). At this time, the limiting block 3124 is away from the chip to be detected, and the chip to be detected 10 can be inserted into the space enclosed by the cross arm 3111 and the vertical arm 3112. As an alternative example, the lead screw 3122 is rotated by an angle of not more than 60 °, such as different angles of 20 °, 30 °, 40 °, 50 °, 60 °, etc.
When the motor 3121 is driven to rotate, the motor 3121 is driven to rotate through the pull wire 3123 in the clamping assembly 312, so as to drive the screw 3122 and the limiting block 3124 to rotate synchronously. In a specific arrangement, the pull wire 3123 is connected to an end of the lead screw 3122 remote from the drive motor 3121. The pull wire 3123 is connected to a driving mechanism of the mechanical arm 320 and is used for driving the screw 3122 and the driving motor 3121 to rotate. Illustratively, one end of the pull wire 3123 is connected to an end of the lead screw 3122 remote from the driving motor 3121, and the other end is connected to a driving mechanism of the mechanical arm 320. The driving mechanism of the mechanical arm 320 is a driving mechanism capable of realizing displacement movement. For example, the driving mechanism may be a driving cylinder or a driving hydraulic cylinder, a piston rod of the driving cylinder is connected with an end portion of the drawing wire 3123, when the piston rod stretches, the drawing wire 3123 is driven to move, and since one end of the drawing wire 3123 is connected with one end of the lead screw 3122 away from the driving motor 3121, when the drawing wire 3123 is pulled to be tightened by the driving mechanism, the driving motor 3121 is driven to rotate to the first setting position.
As an alternative, with continued reference to fig. 4, the pull wire 3123 includes an elastic member 3123b and a wire rope 3123a connected to the elastic member 3123 b. Wherein the elastic member 3123b is connected to an end of the screw 3122 remote from the driving motor 3121. That is, one end of the elastic member 3123b is connected to one end of the screw 3122 away from the driving motor 3121, and the other end is connected to the wire rope 3123a, and the wire rope 3123a is connected to the driving mechanism of the mechanical arm 320. In the practice of this application, the resilient member 3123b may be a tension spring or other resilient material made of a connecting member.
As an alternative, a sleeve (not shown) may be further included, which is sleeved on the pull wire 3123, so as to move within the sleeve when the pull wire 3123 is pulled, and reduce friction generated between the pull wire 3123 and other components during the movement. The sleeve may be a flexible sleeve, and the specific material is not specifically limited in the embodiments of the present application.
With continued reference to fig. 1, the mechanical arm 320 provided in the embodiment of the present application is a three-dimensional mechanical arm, which can perform three-dimensional movement in a vertical direction and a horizontal direction, and the specific structure of the mechanical arm 320 is not specifically limited in the embodiment of the present application. When the mechanical arm 320 is specifically disposed, it may be located between the carrier 100 and the camera bellows 210, so that the mechanical arm 320 drives the fixture 310 to move between the carrier 100 and the camera bellows 210.
When the mechanical arm 320 drives the fixture 310 to move to the camera bellows 210, the mechanical arm 320 can align the fixture 310 with the upper opening of the camera bellows 210 and place the chip to be detected in the opening, at this time, the fixture 310 and the camera bellows 210 are integrated, and the chip to be detected is located below the lens of the camera.
In the current detection mode, a microscope is placed in an open environment, the volume of a sample point on a chip is nano-scale, the sample point is greatly influenced by the environment, the solvent volatilizes after long-time detection, the quality of the sample point is reduced, and the quality of the chip cannot be guaranteed. To this end, the present application provides another sample detection device.
As shown in fig. 6, fig. 6 is a modified structure of the sample detection device shown in fig. 1. The sample detection device provided in the embodiment of the present application includes a dust cover 600, and the carrier 100, the shooting device 200, and the transferring device 300 are all located in the dust cover 600. As shown in fig. 6, in a specific arrangement, a clean environment can be provided by the dust cover 600, so as to prevent dust from falling on the chip to be detected, and ensure the quality of the chip product.
As an example, the dust cover 600 is composed of four parts including three baffles and an upper cover plate, wherein one baffle is installed in each of three directions of the left and right and rear sides of the base, the upper cover plate has an inverted L-shaped structure, and the horizontal part of the upper cover plate serves as a top plate and the vertical part serves as a side plate. The upper cover plate is connected with the rear side baffle through a rotating shaft, and the left side baffle and the right side baffle are connected with the upper cover plate through a gas spring hydraulic rod; after the upper cover plate of the dust cover 600 is opened, the gas spring hydraulic rod can play a role in positioning the upper cover plate, so that the upper cover plate is prevented from falling.
As an alternative, the chip sampling point detection device provided in the embodiment of the present application may further include an image processing system (not shown in the figure), where the image processing system is connected to the image capturing component and is used to detect a sampling point of a picture captured by the image capturing component. When the image processing system detects the shot picture of the chip to be detected, whether the sample point reaches the standard can be judged by comparing the picture with a set image template, or whether the sample point reaches the standard can be judged by detecting whether the size of the sample point in the picture reaches the set size. When the method is adopted, the sample application qualified chips and the unqualified chips can be distinguished through the image processing system, and the detection time is shortened and the chip quality is improved through automatic flow control. It should be understood that the above image processing system detects the picture in a conventional detection manner, which is not described in detail in the embodiments of the present application. In addition, the image processing system may further perform image processing on the image captured by the image capturing component to obtain a clear sample image, where the image processing is also a conventional image processing manner, which is not described in detail in the embodiments of the present application.
As an alternative, the chip sampling point detection apparatus provided in the embodiment of the present application may further include a controller (not shown in the figure), which is configured to control the transfer apparatus 300 to place the detected chips on the product rack 400 and the product rack 500 according to the detection result of the image processing system. When the image care system detects that the chip is not qualified, the transfer device 300 is controlled to place the chip on the product failure frame 500; when the chip detected by the image processing system is qualified, the transfer device 300 is controlled to place the chip on the product rack 400.
In the specific arrangement of the product fit frame 400 and the product fit frame 500, both the product fit frame 400 and the product fit frame 500 are also located within the dust cover 600. The product fitting frame 400, the product non-fitting frame 500, the carrier 100 and the shooting device 200 are arranged around the transfer device 300, so that the transfer device 300 can transfer chips in a smaller moving range.
It should be understood that the controller provided in the present application may be a common control device such as a single chip microcomputer or an industrial personal computer. The controller controls the movement of the transfer device 300 according to the detection result of the image processing system, which is conventional data processing, and will not be described in detail in the embodiment of the present application.
As an alternative, the chip sampling point detection device provided in the embodiment of the present application may further include a humidifying device 700, where the humidifying device 700 is in communication with the dust cover 600. The humidifying device 700 and the dust cover 600 may be in communication through a pipe to adjust the humidity in the dust cover through the humidifying device 700.
As an alternative, a humidity sensor (not shown) may be further disposed in the dust cover 600, and the controller may control the humidifier to operate according to humidity information in the dust cover 600 detected by the humidity sensor. Illustratively, when the humidity detected by the humidity sensor is less than the set value, the humidifying device 700 is controlled to humidify; when the humidity detected by the humidity sensor is equal to or higher than the set value, the humidification device 700 is controlled to stop humidification.
In the description of the present application, it should be noted that the directions or positional relationships indicated by the terms "upper", "lower", "inner", "outer", "front", "rear", "left", "right", etc. are based on the directions or positional relationships in the working state of the present application, are merely for convenience of description and simplification of description, and do not indicate or imply that the apparatus or element to be referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application.
In the description of the present application, it should be noted that the terms "mounted," "connected," and "connected" are to be construed broadly, unless explicitly specified and limited otherwise. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art in a specific context.
The present application has been described in connection with the preferred embodiments, but these embodiments are merely exemplary and serve only as illustrations. On the basis of this, many alternatives and improvements can be made to the present application, which fall within the scope of protection of the present application.

Claims (10)

1. A chip sample point detection device, comprising:
the carrier is used for carrying the chip to be detected;
the shooting device comprises a camera shooting assembly used for placing a camera bellows of the chip to be detected and shooting a sample point of the chip to be detected in the camera bellows;
the transfer device comprises a clamp for clamping the chip to be detected and a mechanical arm for transferring the clamp to the camera bellows; the mechanical arm is located between the carrier and the camera bellows.
2. The chip spot detection apparatus according to claim 1, wherein the jig includes a placement stage, and a clamping mechanism for abutting the chip to be detected against the placement stage.
3. The chip sample point detection device according to claim 2, wherein the placement table comprises a cross arm and two vertical arms fixedly connected with the cross arm, wherein the two vertical arms are arranged at intervals, and a space for accommodating the chip to be detected is enclosed between the two vertical arms and the cross arm.
4. The chip spot detection apparatus according to claim 3, wherein the clamping mechanism comprises clamping assemblies arranged in one-to-one correspondence with the two vertical arms;
each clamping assembly comprises a driving motor rotationally connected with the cross arm, a screw rod coaxially fixed with an output shaft of the driving motor, and a limiting block in threaded connection with the screw rod; wherein the rotating shaft around which the driving motor rotates is parallel to the arrangement direction of the two vertical arms; each clamping assembly further comprises a drawing wire connected with one end, far away from the driving motor, of the lead screw, and the drawing wire is connected with the driving mechanism of the mechanical arm and used for driving the lead screw and the driving motor to rotate;
the vertical arm is provided with a chute in sliding fit with the corresponding limiting block, and the length direction of the chute is along the length direction of the vertical arm;
when the driving motor rotates to a first position, the limiting block is separated from the sliding groove, and the limiting block avoids the chip to be detected;
when the driving motor rotates to a second position, the limiting block is positioned in the sliding groove;
when the driving motor drives the limiting block to slide in the sliding groove to a set position, the limiting block and the cross arm clamp the chip to be detected.
5. The chip sample point detection device according to claim 4, wherein the pull wire comprises an elastic member connected with one end of the screw rod far away from the driving motor and a steel wire rope connected with the elastic member.
6. The chip spot detection apparatus according to claim 4, further comprising a sleeve that encases the pull wire.
7. The chip sample point detection device according to claim 1, wherein the image pickup assembly comprises: a camera and a light source member; the camera lens faces the camera box, and the light source piece is fixed on the camera lens.
8. The chip spot detection apparatus according to any one of claims 1 to 7, further comprising a dust cover, wherein the carrier, the imaging device, and the transfer device are all located in the dust cover.
9. The chip spot detection apparatus according to claim 8, further comprising a humidifying device in communication with the dust cover.
10. The chip sample detection device of claim 7, further comprising an image processing system coupled to the camera assembly and configured to detect a sample of a picture taken by the camera assembly.
CN202223600923.XU 2022-12-30 2022-12-30 Chip sample point detection device Active CN219084786U (en)

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Application Number Priority Date Filing Date Title
CN202223600923.XU CN219084786U (en) 2022-12-30 2022-12-30 Chip sample point detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202223600923.XU CN219084786U (en) 2022-12-30 2022-12-30 Chip sample point detection device

Publications (1)

Publication Number Publication Date
CN219084786U true CN219084786U (en) 2023-05-26

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