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CN201936204U - Device for measuring and controlling internal temperature of operational amplifier chip - Google Patents

Device for measuring and controlling internal temperature of operational amplifier chip Download PDF

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Publication number
CN201936204U
CN201936204U CN2010206457893U CN201020645789U CN201936204U CN 201936204 U CN201936204 U CN 201936204U CN 2010206457893 U CN2010206457893 U CN 2010206457893U CN 201020645789 U CN201020645789 U CN 201020645789U CN 201936204 U CN201936204 U CN 201936204U
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China
Prior art keywords
chip
temperature
operational amplifier
amplifier chip
observing
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Expired - Fee Related
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CN2010206457893U
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Chinese (zh)
Inventor
苟刚
宋建平
姜哲
朱太宜
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Hohai University HHU
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Hohai University HHU
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Priority to CN2010206457893U priority Critical patent/CN201936204U/en
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Publication of CN201936204U publication Critical patent/CN201936204U/en
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Abstract

本实用新型公开了一种运放芯片内部温度的测控装置,包括温度采集模块(1)、单片机(2)、运算放大器(3)、被测控运放芯片(4)、数码管(5)及旋钮(6),利用被测控运放芯片(4)内部的三极管的温度特征自由控制运放芯片内部温度,同时能测量运放芯片内部真实温度。可以测试芯片的精确度和工作能力,消除温度变化对该芯片造成的误差,提高芯片的安全性,该装置结构简单,易于生产。

Figure 201020645789

The utility model discloses a device for measuring and controlling the internal temperature of an op-amp chip, comprising a temperature acquisition module (1), a single-chip microcomputer (2), an operational amplifier (3), an op-amp chip to be measured and controlled (4), a digital tube (5) and The knob (6) freely controls the internal temperature of the operational amplifier chip by using the temperature characteristics of the triode inside the operational amplifier chip (4) to be measured and controlled, and at the same time can measure the real temperature inside the operational amplifier chip. The accuracy and working ability of the chip can be tested, the error caused by the temperature change to the chip can be eliminated, and the safety of the chip can be improved. The device has a simple structure and is easy to produce.

Figure 201020645789

Description

The measure and control device of amplifier chip internal temperature
Technical field
The utility model relates to the measurement and control of temperature field, is specifically related to a kind of measure and control device that utilizes the temperature profile of triode to amplifier chip internal temperature.
Background technology
At present, we know that triode is a kind of element very responsive to temperature.As 1 ° of C of the every rising of temperature, the about Xia of Ube Jiang – 2 mV/ ° C, the b value increases 0.5%-1 % approximately, and Icbq roughly will double.Utilize this feature, can be when the precision measurement electric current and voltage, it is more important that temperature controlling just seems, but in disclosed technology, do not utilize the temperature profile of triode simultaneously amplifier chip internal temperature to be carried out measure and control device.
Summary of the invention
The purpose of this utility model is to have overcome the temperature profile of triode that do not utilize of the prior art simultaneously amplifier chip internal temperature to be carried out measure and control device, and a kind of device that can carry out observing and controlling to amplifier chip internal temperature is provided.
In order to solve the problems of the technologies described above, the utility model is to be achieved through the following technical solutions:
A kind of measure and control device of amplifier chip internal temperature, comprise temperature collect module, single-chip microcomputer, operational amplifier, by observing and controlling amplifier chip, charactron and knob, it is characterized in that the temperature input port of described single-chip microcomputer is connected with the signal of temperature collect module; The demonstration output port of described single-chip microcomputer is connected with charactron; The temperature control port of described single-chip microcomputer is connected with the inverting input of operational amplifier; Described single-chip microcomputer temperature is provided with port and is connected with knob; Describedly comprised triode more than 2 or 2 by observing and controlling amplifier chip, wherein the in-phase input end of operational amplifier is connected with the triode that is used to measure temperature in the observing and controlling amplifier chip, and the output port of operational amplifier is connected with the triode that is used to control temperature in the observing and controlling amplifier chip.
The beneficial effects of the utility model are:
The device that the utility model is realized can freely be controlled amplifier chip internal temperature, simultaneously energy measurement amplifier chip internal true temperature.Degree of accuracy and ability to work that can test chip be eliminated the error that temperature variation causes this chip, improve the security of chip, and this apparatus structure is simple, are easy to produce.
Description of drawings
Fig. 1 is the structural drawing of the measure and control device of amplifier chip internal temperature of the present utility model.
Embodiment
Provide specific embodiment below in conjunction with accompanying drawing, further the utility model is elaborated.
The structural drawing of the measure and control device of amplifier chip internal temperature of the present utility model as shown in Figure 1, a kind of temperature measurement and control instrument of amplifier chip internal, comprise temperature collect module 1, single-chip microcomputer 2, operational amplifier 3, by observing and controlling amplifier chip 4, charactron 5 and knob 6, the temperature input port of described single-chip microcomputer 2 is connected with the signal of temperature collect module 1; The demonstration output port of described single-chip microcomputer 2 is connected with charactron 5; The temperature control port of described single-chip microcomputer 2 is connected with the inverting input of operational amplifier 3; The temperature of described single-chip microcomputer 2 is provided with port and is connected with knob 6; The described triode that is comprised more than 2 or 2 by observing and controlling amplifier chip 4, wherein the in-phase input end mouth of operational amplifier 3 is connected with the triode that is used to measure temperature in the observing and controlling amplifier chip 4, and the output port of operational amplifier 3 is connected with the triode that is used to control temperature in the observing and controlling amplifier chip 4.Wherein single-chip microcomputer 2 is controlled whole device as primary processor; Temperature collect module 1 is gathered by observing and controlling amplifier chip 4 temperature; Charactron 5 is used for display chip 4 inner true temperatures, and knob 6 controls are by the heating of observing and controlling amplifier chip 4; Operational amplifier 3 is used for being compared by observing and controlling amplifier chip 4 temperature and the needed temperature of knob 6 inputs, wherein formed by two triodes at least by observing and controlling amplifier chip 4, be respectively applied for and measure temperature and heating, all the other triodes are used for operate as normal, utilize the temperature profile of triode and the dissipated power of the triode work range of linearity that it is carried out thermometric and heating.
The undeclared part that relates in the utility model is same as the prior art or adopt prior art to be realized.

Claims (1)

1. the measure and control device of an amplifier chip internal temperature, comprise temperature collect module (1), single-chip microcomputer (2), operational amplifier (3), by observing and controlling amplifier chip (4), charactron (5) and knob (6), it is characterized in that the temperature input port of described single-chip microcomputer (2) is connected with the signal of temperature collect module (1); The demonstration output port of described single-chip microcomputer (2) is connected with charactron (5); The temperature control port of described single-chip microcomputer (2) is connected with the inverting input of operational amplifier (3); The temperature of described single-chip microcomputer (2) is provided with port and is connected with knob (6); Describedly comprised triode more than 2 or 2 by observing and controlling amplifier chip (4), wherein the in-phase input end of operational amplifier (3) is connected with the triode that is used to measure temperature in the observing and controlling amplifier chip (4), and the output port of operational amplifier (3) is connected with the triode that is used to control temperature in the observing and controlling amplifier chip (4).
CN2010206457893U 2010-12-07 2010-12-07 Device for measuring and controlling internal temperature of operational amplifier chip Expired - Fee Related CN201936204U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010206457893U CN201936204U (en) 2010-12-07 2010-12-07 Device for measuring and controlling internal temperature of operational amplifier chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010206457893U CN201936204U (en) 2010-12-07 2010-12-07 Device for measuring and controlling internal temperature of operational amplifier chip

Publications (1)

Publication Number Publication Date
CN201936204U true CN201936204U (en) 2011-08-17

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102548149A (en) * 2012-01-11 2012-07-04 山东浪潮华光照明有限公司 Control method of LED (Light Emitting Diode) drive
CN103176489A (en) * 2013-02-06 2013-06-26 南京千韵电子科技有限公司 Method and device for controlling chip inner temperature and experiment instrument based on same method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102548149A (en) * 2012-01-11 2012-07-04 山东浪潮华光照明有限公司 Control method of LED (Light Emitting Diode) drive
CN103176489A (en) * 2013-02-06 2013-06-26 南京千韵电子科技有限公司 Method and device for controlling chip inner temperature and experiment instrument based on same method
CN103176489B (en) * 2013-02-06 2015-09-30 南京千韵电子科技有限公司 Chip internal temperature-controlled process and device and the experiment instrument based on this method

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GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20110817

Termination date: 20111207