CN206756727U - A kind of Seebeck coefficient testing devices - Google Patents
A kind of Seebeck coefficient testing devices Download PDFInfo
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- CN206756727U CN206756727U CN201720412861.XU CN201720412861U CN206756727U CN 206756727 U CN206756727 U CN 206756727U CN 201720412861 U CN201720412861 U CN 201720412861U CN 206756727 U CN206756727 U CN 206756727U
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Abstract
本实用新型涉及一种Seebeck系数测试装置,其包括控制模块、加热模块和数据采集模块;所述控制模块控制所述加热模块工作,且所述加热模块与所述数据采集模块连接;所述控制模块包括两可控硅调压器、一延时继电器、一单刀双掷开关和一总开关;两所述可控硅调压器一端都连接至零线,另一端都连接至火线,且两所述可控硅调压器的控制端都经所述单刀双掷开关连接至零线;位于其中一所述可控硅调压器控制端,在所述单刀双掷开关与零线之间还连接有所述延时继电器;位于零线上还设置有负责所述控制模块整体电源通断的所述总开关。本实用新型结构简单、测试准确、使用方便,提供较宽的测量范围,可以在半导体测试领域中广泛应用。
The utility model relates to a Seebeck coefficient testing device, which comprises a control module, a heating module and a data acquisition module; the control module controls the work of the heating module, and the heating module is connected with the data acquisition module; the control The module includes two thyristor voltage regulators, a delay relay, a single-pole double-throw switch and a main switch; one end of the two thyristor voltage regulators is connected to the neutral line, the other end is connected to the live wire, and the two The control ends of the thyristor voltage regulators are all connected to the neutral line through the single-pole double-throw switch; the control end of one of the thyristor voltage regulators is located between the single-pole double-throw switch and the neutral line The time-delay relay is also connected; the main switch responsible for the overall power supply of the control module is also arranged on the neutral line. The utility model has the advantages of simple structure, accurate testing, convenient use, wide measuring range and wide application in the field of semiconductor testing.
Description
技术领域technical field
本实用新型涉及一种半导体测试装置,特别是关于一种对样品进行加热以及测温的Seebeck系数测试装置。The utility model relates to a semiconductor testing device, in particular to a Seebeck coefficient testing device for heating samples and measuring temperature.
背景技术Background technique
Seebeck系数是反应材料热电性能的重要参数,快速、准确测量Seebeck系数对评估材料热电性能具有很大意义。目前,测量Seebeck系数的方法主要有静态法和动态法。其中,采用静态法的技术已经相当成熟,但是过程较为繁琐;采用动态法的技术过程相对简便,但是需要合适的配置才能达到理想的测试精度。对于动态方法,若要获得较高的测试精度,需要做到以下几点:1、电压和温度信号必须在同一位置、同时测量;2、测温和测电压探头必须和试样表面有很好的热接触和电接触;3、热电偶的反应时间必须足够短,以能够准确地测量动态变化中的温度;4、能够高精度、快速采集温度和电压信号。因此,亟需提供一种新的装置来实现具有较高测试精度的动态测试。The Seebeck coefficient is an important parameter of the thermoelectric performance of the reaction material, and the rapid and accurate measurement of the Seebeck coefficient is of great significance for evaluating the thermoelectric performance of the material. At present, the methods of measuring Seebeck coefficient mainly include static method and dynamic method. Among them, the technology using the static method is quite mature, but the process is relatively cumbersome; the technical process using the dynamic method is relatively simple, but it requires proper configuration to achieve the ideal test accuracy. For the dynamic method, in order to obtain high test accuracy, the following points need to be done: 1. The voltage and temperature signals must be measured at the same position and at the same time; 2. The temperature and voltage measurement probes must be in good contact with the sample surface. 3. The response time of the thermocouple must be short enough to accurately measure the temperature in dynamic changes; 4. It can collect temperature and voltage signals with high precision and quickly. Therefore, there is an urgent need to provide a new device to realize dynamic testing with higher testing accuracy.
发明内容Contents of the invention
针对上述问题,本实用新型的目的是提供一种Seebeck系数测试装置,其结构简单、测试准确、使用方便,能提供较宽的测量范围。In view of the above problems, the purpose of this utility model is to provide a Seebeck coefficient testing device, which is simple in structure, accurate in testing, easy to use, and can provide a wider measurement range.
为实现上述目的,本实用新型采取以下技术方案:一种Seebeck系数测试装置,其特征在于:它包括控制模块、加热模块和数据采集模块;所述控制模块控制所述加热模块工作,且所述加热模块与所述数据采集模块连接;所述控制模块包括两可控硅调压器、一延时继电器、一单刀双掷开关和一总开关;两所述可控硅调压器一端都连接至零线,另一端都连接至火线,且两所述可控硅调压器的控制端都经所述单刀双掷开关连接至零线;位于其中一所述可控硅调压器控制端,在所述单刀双掷开关与零线之间还连接有所述延时继电器;位于零线上还设置有负责所述控制模块整体电源通断的所述总开关。To achieve the above object, the utility model takes the following technical solutions: a Seebeck coefficient testing device, characterized in that: it includes a control module, a heating module and a data acquisition module; the control module controls the work of the heating module, and the The heating module is connected with the data acquisition module; the control module includes two thyristor voltage regulators, a delay relay, a single-pole double-throw switch and a main switch; one end of the two thyristor voltage regulators is connected to the neutral line, and the other end is connected to the live line, and the control terminals of the two thyristor voltage regulators are connected to the neutral line through the single-pole double-throw switch; located at the control end of one of the thyristor voltage regulators The time delay relay is also connected between the single pole double throw switch and the neutral line; the main switch responsible for on-off of the overall power supply of the control module is also arranged on the neutral line.
所述加热模块包括一个陶瓷底座、两个高功率加热管和两个紫铜导热片;所述陶瓷底座上放置有样品,两个所述高功率加热管分别位于所述陶瓷底座上样品的两端,且每个所述高功率加热管上方都设置有一个所述紫铜导热片。The heating module includes a ceramic base, two high-power heating tubes and two copper heat-conducting sheets; samples are placed on the ceramic base, and the two high-power heating tubes are respectively located at both ends of the sample on the ceramic base , and each of the high-power heating tubes is provided with a copper heat-conducting sheet.
每个所述高功率加热管都连接至一个所述可控硅调压器控制端,并位于所述单刀双掷开关与零线之间;且其中一个所述高功率加热管与所述延时继电器并联。Each of the high-power heating tubes is connected to a control terminal of the thyristor voltage regulator, and is located between the single-pole double-throw switch and the neutral line; and one of the high-power heating tubes is connected to the extension The relays are connected in parallel.
所述陶瓷底座设置在椴木层外壳内,所述陶瓷底座与所述椴木层外壳之间贴设有石棉保温层。The ceramic base is arranged in the basswood layer shell, and an asbestos insulation layer is pasted between the ceramic base and the basswood layer shell.
所述数据采集模块包括两个热电偶、一台万用表和计算机;两所述热电偶一端分别与所述样品两端接触,两所述热电偶的另一端都与所述万用表连接,将采集到的温度和电压信号传输至所述计算机。The data acquisition module includes two thermocouples, a multimeter and a computer; one end of the two thermocouples is respectively in contact with the two ends of the sample, and the other end of the two thermocouples is connected with the multimeter, and the collected The temperature and voltage signals are transmitted to the computer.
本实用新型由于采取以上技术方案,其具有以下优点:1、本实用新型由于采用控制模块、加热模块和数据采集模块构成,便于组装、拆卸、维护和重复使用。2、本实用新型采用可控硅调压器和延时继电器,能方便地调节升温速率和温差大小,能进行较宽的测量范围。3、本实用新型在陶瓷底座外部设置有椴木层外壳,并在陶瓷底座与椴木层外壳之间贴设有石棉保温层,进而有效减少热量损失,提高了测试的精确度。Because the utility model adopts the above technical scheme, it has the following advantages: 1. Since the utility model is composed of a control module, a heating module and a data acquisition module, it is convenient for assembly, disassembly, maintenance and repeated use. 2. The utility model adopts a thyristor voltage regulator and a time-delay relay, which can conveniently adjust the heating rate and temperature difference, and can carry out a wide measurement range. 3. The utility model is provided with a basswood layer shell outside the ceramic base, and an asbestos insulation layer is pasted between the ceramic base and the basswood layer shell, thereby effectively reducing heat loss and improving the accuracy of the test.
综上所述,本实用新型可以在半导体测试领域中广泛应用。In summary, the utility model can be widely used in the field of semiconductor testing.
附图说明Description of drawings
图1是本实用新型的整体结构示意图;Fig. 1 is the overall structural representation of the utility model;
图2是本实用新型的控制模块结构示意图;Fig. 2 is the structural representation of the control module of the utility model;
图3是本实用新型的加热模块椴木层外壳侧视图。Fig. 3 is a side view of the basswood layer shell of the heating module of the present invention.
具体实施方式detailed description
下面结合附图和实施例对本实用新型进行详细的描述。Below in conjunction with accompanying drawing and embodiment the utility model is described in detail.
如图1所示,本实用新型提供一种基于动态法的Seebeck系数测试装置,用于快速测定试样的Seebeck系数,其包括控制模块1、加热模块2和数据采集模块3。控制模块1控制加热模块2工作,且加热模块2与数据采集模块3连接,由数据采集模块3进行测试数据采集。As shown in FIG. 1 , the utility model provides a Seebeck coefficient testing device based on a dynamic method for rapidly measuring the Seebeck coefficient of a sample, which includes a control module 1 , a heating module 2 and a data acquisition module 3 . The control module 1 controls the heating module 2 to work, and the heating module 2 is connected to the data acquisition module 3, and the data acquisition module 3 collects test data.
如图2所示,控制模块1包括两可控硅调压器4、一单刀双掷开关5、一延时继电器6和一总开关7。两可控硅调压器4一端都连接至零线,另一端都连接至火线,且两可控硅调压器4的控制端都经单刀双掷开关5连接至零线。位于其中一可控硅调压器4控制端,在单刀双掷开关5与零线之间还连接有延时继电器6,由延时继电器6控制其中该可控硅调压器4相对另一个可控硅调压器4的延迟开启时间。位于零线上还设置有总开关7,由总开关7负责控制模块整体电源通断。As shown in FIG. 2 , the control module 1 includes two thyristor voltage regulators 4 , a single-pole double-throw switch 5 , a delay relay 6 and a main switch 7 . One end of the two thyristor voltage regulators 4 is connected to the neutral line, and the other end is connected to the live line, and the control terminals of the two thyristor voltage regulators 4 are connected to the neutral line through the SPDT switch 5 . Located at the control end of one of the thyristor voltage regulators 4, a delay relay 6 is also connected between the SPDT switch 5 and the neutral line, and the delay relay 6 controls the thyristor voltage regulator 4 relative to the other Delayed turn-on time of SCR4. A main switch 7 is also arranged on the neutral line, and the main switch 7 is responsible for controlling the on-off of the overall power supply of the module.
加热模块2包括一个陶瓷底座8、两个高功率加热管9和两个紫铜导热片。陶瓷底座8上放置有样品,两个高功率加热管9分别位于陶瓷底座8上样品的两端,且每个高功率加热管9上方都设置有一个紫铜导热片。每个高功率加热管9都连接至一个可控硅调压器4控制端,并位于单刀双掷开关5与零线之间,由可控硅调压器1控制对应高功率加热管9的加热电压大小;且其中一个高功率加热管9与延时继电器6并联,通过延时继电器6延时接通该高功率加热管9所在电路。The heating module 2 includes a ceramic base 8, two high-power heating tubes 9 and two copper heat conducting sheets. A sample is placed on the ceramic base 8 , and two high-power heating tubes 9 are respectively located at both ends of the sample on the ceramic base 8 , and a red copper heat conducting sheet is arranged above each high-power heating tube 9 . Each high-power heating tube 9 is connected to a control terminal of a thyristor voltage regulator 4, and is located between the SPDT switch 5 and the neutral line, and the corresponding high-power heating tube 9 is controlled by the thyristor voltage regulator 1 The heating voltage; and one of the high-power heating tubes 9 is connected in parallel with the delay relay 6, and the circuit where the high-power heating tube 9 is located is connected through the delay relay 6.
上述实施例中,如图3所示,陶瓷底座8设置在椴木层外壳10内,陶瓷底座8与椴木层外壳10之间贴设有石棉保温层。In the above embodiment, as shown in FIG. 3 , the ceramic base 8 is set in the basswood layer shell 10 , and an asbestos insulation layer is pasted between the ceramic base 8 and the basswood layer shell 10 .
数据采集模块3包括两个热电偶、一台万用表和计算机。两热电偶一端分别与样品两端接触,两热电偶的另一端都与万用表连接,将采集到的温度和电压信号传输至计算机,由计算机实时记录,完成样品的Seebeck系数测试。The data acquisition module 3 includes two thermocouples, a multimeter and a computer. One end of the two thermocouples is in contact with both ends of the sample, and the other end of the two thermocouples is connected to a multimeter, and the collected temperature and voltage signals are transmitted to the computer, which records in real time and completes the Seebeck coefficient test of the sample.
综上所述,本实用新型在使用时,首先闭合总开关7,调整好可控硅调压器4的输出电压以及延时继电器6的延时时间;然后闭合单刀双掷开关5,一个高功率加热管9立即开始加热,达到设定时间后,另一个高功率加热管9也开始加热。In summary, when the utility model is in use, first close the main switch 7, adjust the output voltage of the thyristor voltage regulator 4 and the delay time of the delay relay 6; then close the SPDT switch 5, a high The power heating tube 9 starts heating immediately, and after reaching the set time, another high-power heating tube 9 also starts heating.
上述各实施例仅用于说明本实用新型,各部件的连接和结构都是可以有所变化的,在本实用新型技术方案的基础上,凡根据本实用新型原理对个别部件的连接和结构进行的改进和等同变换,均不应排除在本实用新型的保护范围之外。The above-mentioned embodiments are only used to illustrate the utility model, and the connection and structure of each component can be changed. Improvements and equivalent transformations should not be excluded from the protection scope of the present utility model.
Claims (5)
- A kind of 1. Seebeck coefficient testing devices, it is characterised in that:It includes control module, heating module and data acquisition module Block;The control module controls the heating module work, and the heating module is connected with the data acquisition module;The control module includes two controllable silicon pressure regulators, a time-delay relay, a single-pole double-throw switch (SPDT) and a master switch;Two institutes State thyristor regulating depressor one end and be connected to zero line, the other end is connected to live wire, and the control of the two thyristor regulating depressors End is all connected to zero line through the single-pole double-throw switch (SPDT);A thyristor regulating depressor control terminal is located therein, in the hilted broadsword The time-delay relay is also associated between commutator and zero line;It is whole that the responsible control module is additionally provided with zero line The master switch of body on/off.
- A kind of 2. Seebeck coefficient testing devices as claimed in claim 1, it is characterised in that:The heating module includes one Individual ceramic base, two high power heating tubes and two red copper thermally conductive sheets;Sample is placed with the ceramic base, described in two High power heating tube is respectively positioned at the both ends of sample on the ceramic base, and set above each high power heating tube There is a red copper thermally conductive sheet.
- A kind of 3. Seebeck coefficient testing devices as claimed in claim 2, it is characterised in that:Each high power heating Pipe is connected to a thyristor regulating depressor control terminal, and between the single-pole double-throw switch (SPDT) and zero line;And wherein One high power heating tube is in parallel with the time-delay relay.
- A kind of 4. Seebeck coefficient testing devices as described in any one of Claims 2 or 3, it is characterised in that:The ceramic bottom Seat is arranged in linden layer shell, and being sticked between the ceramic base and the linden layer shell has asbestos heat-insulation layer.
- A kind of 5. Seebeck coefficient testing devices as claimed in claim 2 or claim 3, it is characterised in that:The data acquisition module Including two thermocouples, a universal meter and computer;Two described thermocouple one end respectively with the end in contact of sample two, two institutes The other end for stating thermocouple is all connected with the universal meter, and the temperature collected and voltage signal are transmitted to the computer.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109613051A (en) * | 2018-10-24 | 2019-04-12 | 武汉嘉仪通科技有限公司 | A kind of device and method using method of comparison measurement material Seebeck coefficient |
| CN109781781A (en) * | 2019-01-18 | 2019-05-21 | 中国工程物理研究院材料研究所 | A kind of alternating-current measurement device and method of Seebeck coefficient |
| CN110530927A (en) * | 2019-10-10 | 2019-12-03 | 王雪强 | A kind of thermoelectric material Seebeck coefficient test device and method |
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2017
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109613051A (en) * | 2018-10-24 | 2019-04-12 | 武汉嘉仪通科技有限公司 | A kind of device and method using method of comparison measurement material Seebeck coefficient |
| CN109613051B (en) * | 2018-10-24 | 2021-08-17 | 武汉嘉仪通科技有限公司 | Device and method for measuring Seebeck coefficient of material by using contrast method |
| CN109781781A (en) * | 2019-01-18 | 2019-05-21 | 中国工程物理研究院材料研究所 | A kind of alternating-current measurement device and method of Seebeck coefficient |
| CN110530927A (en) * | 2019-10-10 | 2019-12-03 | 王雪强 | A kind of thermoelectric material Seebeck coefficient test device and method |
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