[go: up one dir, main page]

CN1316749A - Mechanical process for preparing controllable nm-class conducting wire - Google Patents

Mechanical process for preparing controllable nm-class conducting wire Download PDF

Info

Publication number
CN1316749A
CN1316749A CN 01110205 CN01110205A CN1316749A CN 1316749 A CN1316749 A CN 1316749A CN 01110205 CN01110205 CN 01110205 CN 01110205 A CN01110205 A CN 01110205A CN 1316749 A CN1316749 A CN 1316749A
Authority
CN
China
Prior art keywords
nano
scanning probe
substrate
nanoparticles
particle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN 01110205
Other languages
Chinese (zh)
Other versions
CN1167085C (en
Inventor
李壮
吴爱国
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Changchun Institute of Applied Chemistry of CAS
Original Assignee
Changchun Institute of Applied Chemistry of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Changchun Institute of Applied Chemistry of CAS filed Critical Changchun Institute of Applied Chemistry of CAS
Priority to CNB011102055A priority Critical patent/CN1167085C/en
Publication of CN1316749A publication Critical patent/CN1316749A/en
Application granted granted Critical
Publication of CN1167085C publication Critical patent/CN1167085C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Sampling And Sample Adjustment (AREA)

Abstract

A process for mechanically preparing the nm conducting wire whose length and diameter are controllable incldues such steps as choosing the nm (1.5-98nm) particles of metal or semiconductor sol, dipping the scan probe of microscope in the sol, moving said nm particles on the substrate in the atom-level planar area by capillary action, obtaining the form distribution graphics of said nm particles, turning off feedback loop, and controlling the mechanical movement of nm particles to arrange needed nm conducting wire by said microscope.

Description

The mechanical preparation method of controllable nm-class conducting wire
The invention belongs to the mechanical preparation method of length and controllable diameter nm-class conducting wire.
Existing reports such as some single nano-devices such as nanometer chi, nano pen, nanometer tweezers, nanometer plotter, the Leiber group of Harvard University has produced nanodevices such as nano-transistor and nano luminescent diode recently again.The nm/min sub-conductor that these nanodevices are coupled together is the key technology of following nano science.At present, the preparation of nm/min sub-conductor mainly contains following two kinds of methods: a kind of is that professor Penner as the disclosed California, USA of science magazine university Irvine branch school in 2000 utilizes the step method of modifying to generate various nm-class conducting wires or semiconductor nanowires; Another kind method is that the synthetic method of template prepares the nm/min sub-conductor.These two kinds of methods all have the following disadvantages to some extent, and the vary in diameter scope of the nm-class conducting wire that the step method of modifying generates is big, do not wait from about several nanometers to a micron; Length is also from several nanometers to millimeter level, even the Centimeter Level difference.The nm-class conducting wire length that template synthesis method generates is wayward, and not easily separated.
The mechanical preparation method that the purpose of this invention is to provide a kind of controllable nm-class conducting wire.This method is arranged by the mechanical movement of scanning probe microscopy control nano particle and is formed nm-class conducting wire, and the length of lead is controlled as required.
When the scanning probe microscopy needle point is the nano particle of 1.5-98 nanometer near diameter, because needle point and nano particle repel mutually, needle point is bent upwards, when crooked deformation produces enough elastic force, promote nano particle and do mechanical movement; The formation nm-class conducting wire is arranged in mechanical movement by scanning probe microscopy control nano particle, and the diameter of nm-class conducting wire is determined, is the diameter of nano particle; The length of lead is controlled as required.
The present invention selects the 1.5-98 nanophase to answer the metal that can form nano particle or the semiconductor colloidal sol nano particle of size according to the diameter of required nm-class conducting wire, utilize the needle point of scanning probe microscopy, this nano-particle solution that takes a morsel is dipped at the tip of nanotube or nano pen etc., relying on capillarity nano particle to be moved in the substrate microcell on atom level plane is seated in the substrate, obtain the topographic profile figure of nano particle again by scanning probe microscopy, then in this substrate microcell, close feedback loop and arrange the required nm-class conducting wire of formation by the mechanical movement of scanning probe microscopy control nano particle, the length of nm-class conducting wire generates as required.
The inventive method is because nano particle forms good one dimension lead through closely contacting after the mechanical impetus to arrange, even have the also conducting of very little gap between the nano particle, can not resemble other method influences the lead conduction owing to the defective of component performance owing to tunnel effect.
Embodiment provided by the invention is as follows:
Embodiment 1: the preparation of platinum nm-class conducting wire in the noble metal nano lead
Utilize the needle point of scanning probe microscopy to dip in the nano platinum particle solution of 5 nanometers that take a morsel, relying on capillarity nano platinum particle to be moved in the mica substrate microcell on atom level plane is seated in the substrate, obtain the topographic profile figure of nano platinum particle again by scanning probe microscopy, close feedback loop is controlled nano platinum particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension platinum nm-class conducting wire.
Embodiment 2: the preparation of silver-colored nm-class conducting wire in the noble metal nano lead
Utilize nanotube to dip in to take a morsel the silver nano-particle solution of 35 nanometers, relying on capillarity Nano silver grain to be moved in the substrate of glass microcell on atom level plane is seated in the substrate, obtain the topographic profile figure of Nano silver grain again by scanning probe microscopy, close feedback loop is controlled Nano silver grain under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension silver nm-class conducting wire.
Embodiment 3: the preparation of gold nano lead in the noble metal nano lead
Utilize the needle point of scanning probe microscopy to dip in the solution of gold nanoparticles of 98 nanometers that take a morsel, relying on capillarity golden nanometer particle to be moved in the mica substrate microcell on atom level plane is seated in the substrate, obtain the topographic profile figure of golden nanometer particle again by scanning probe microscopy, close feedback loop is controlled golden nanometer particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension gold nano lead.
Embodiment 4: the preparation of cadmium nm-class conducting wire in the common metal nano conductor
The cadmium nano-particle solution of 2 nanometers of utilizing nanotube to dip in to take a morsel, relying on capillarity the cadmium nano particle to be moved in the substrate of glass microcell on atom level plane is seated in the substrate, obtain the topographic profile figure of cadmium nano particle again by scanning probe microscopy, close feedback loop is controlled the cadmium nano particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension cadmium nm-class conducting wire.
Embodiment 5: the preparation of copper nm-class conducting wire in the common metal nano conductor
The copper nano-particle solution of 12 nanometers of utilizing nanotube to dip in to take a morsel, relying on capillarity copper nano-particle to be moved at the bottom of the silicon wafer-based on atom level plane is seated in the substrate in the microcell, obtain the topographic profile figure of copper nano-particle again by scanning probe microscopy, close feedback loop is controlled copper nano-particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension copper nm-class conducting wire.
Embodiment 6: the preparation of cadmium selenide semiconductor nanowires in the semiconductor nanowires
Utilize the needle point of scanning probe microscopy to dip in the CdSe nano-particle solution of 1.5 nanometers that take a morsel, rely on capillarity CdSe nano-particle to be moved in the substrate of glass microcell on atom level plane and be seated in the substrate; Obtain the topographic profile figure of CdSe nano-particle again by scanning probe microscopy, close feedback loop is controlled CdSe nano-particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension cadmium selenide nano lead.
Embodiment 7: the preparation of CdS semiconduct nano wire in the semiconductor nanowires
Utilize the needle point of scanning probe microscopy to dip in the cadmium sulfide nano-particles solution of 3.1 nanometers that take a morsel, rely on capillarity cadmium sulfide nano-particles to be moved in the mica substrate microcell on atom level plane and be seated in the substrate; Obtain the topographic profile figure of cadmium sulfide nano-particles again by scanning probe microscopy, close feedback loop is controlled cadmium sulfide nano-particles under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension cadmium sulfide nano lead.
Embodiment 8: the preparation of titanium dioxide semiconductor nano wire in the semiconductor nanowires
Utilize the scanning probe microscopy nano pen to dip in to take a morsel the titanium dioxide nano-particle solution of 5 nanometers, rely on capillarity titanium dioxide nano-particle to be moved in the mica substrate microcell on atom level plane and be seated in the substrate; Obtain the topographic profile figure of titanium dioxide nano-particle again by scanning probe microscopy, close feedback loop is controlled titanium dioxide nano-particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one-dimensional titanium dioxide nm-class conducting wire.
Embodiment 9: the preparation of zinc sulfide semiconductor nano wire in the semiconductor nanowires
Utilize the nano pen of scanning probe microscopy to dip in the Zinc sulfide nano-particle solution of 15 nanometers that take a morsel, rely on capillarity Zinc sulfide nano-particle to be moved in the substrate of glass microcell on atom level plane and be seated in the substrate; Obtain the topographic profile figure of Zinc sulfide nano-particle again by scanning probe microscopy, close feedback loop is controlled Zinc sulfide nano-particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension zinc sulfide nano lead.
Embodiment 10: the preparation of lead sulfide semiconductor nano wire in the semiconductor nanowires
Utilize the scanning probe microscopy nano pen to dip in to take a morsel the vulcanized lead nano-particle solution of 25 nanometers, rely on capillarity the vulcanized lead nano particle to be moved at the bottom of the silicon wafer-based on atom level plane and be seated in the substrate in the microcell; Obtain the topographic profile figure of vulcanized lead nano particle again by scanning probe microscopy, close feedback loop is controlled the vulcanized lead nano particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension vulcanized lead nm-class conducting wire.
Embodiment 11: the preparation of silver sulfide semiconductor nanowires in the semiconductor nanowires
Utilize the scanning probe microscopy nano pen to dip in to take a morsel the silver sulfide nano-particle solution of 5 nanometers, rely on capillarity the silver sulfide nano particle to be moved in the mica substrate microcell on atom level plane and be seated in the substrate; Obtain the topographic profile figure of silver sulfide nano particle again by scanning probe microscopy, close feedback loop is controlled the silver sulfide nano particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension silver sulfide nm-class conducting wire.
Embodiment 12: the preparation of silver iodide semiconductor nano wire in the semiconductor nanowires
Utilize the scanning probe microscopy nano pen to dip in to take a morsel the silver iodide nano-particle solution of 18 nanometers, rely on capillarity the silver iodide nano particle to be moved at the bottom of the silicon wafer-based on atom level plane and be seated in the substrate in the microcell; Obtain the topographic profile figure of silver iodide nano particle again by scanning probe microscopy, close feedback loop is controlled the silver iodide nano particle under noncontact mode by scanning probe microscopy mechanical movement arrangement formation one dimension silver iodide nm-class conducting wire.
Embodiment 13: the preparation of zinc oxide semi-conductor nano wire in the semiconductor nanowires
Utilize the scanning probe microscopy nano pen to dip in to take a morsel the zinc oxide nano-particle solution of 51 nanometers, rely on capillarity zinc oxide nano-particle to be moved in the mica substrate microcell on atom level plane and be seated in the substrate; Obtain the topographic profile figure of zinc oxide nano-particle again by scanning probe microscopy, close feedback loop and arrange formation one-dimension zinc oxide nm-class conducting wire by the mechanical movement of scanning probe microscopy controlled oxidation zinc nano particle under noncontact mode.

Claims (4)

1.一种可控纳米导线的机械制备方法,其特征在于根据所需纳米导线的直径选择1.5-98纳米的能形成纳米粒子的金属或半导体溶胶纳米粒子,利用扫描探针显微镜的针尖、纳米管或纳米笔的尖端蘸取少量的该纳米粒子溶液,依靠毛细作用将纳米粒子移至原子级平面的基底微区内置放在基底上,再通过扫描探针显微镜获取纳米粒子的形貌分布图,然后在该基底微区内,关闭反馈回路通过扫描探针显微镜控制纳米粒子的机械运动排列形成所需的纳米导线,纳米导线的长度根据需要生成。1. A mechanical preparation method of a controllable nanowire, characterized in that according to the diameter of the required nanowire, metal or semiconductor sol nanoparticles capable of forming nanoparticles are selected from 1.5 to 98 nanometers, and the tip of a scanning probe microscope, nanotube or The tip of the nano-pen dips a small amount of the nanoparticle solution, and relies on capillary action to move the nanoparticles to the atomic-level plane of the substrate and place them on the substrate, and then obtain the morphology distribution map of the nanoparticles through a scanning probe microscope, and then In the micro-region of the substrate, close the feedback loop and control the arrangement of the mechanical movement of the nanoparticles through the scanning probe microscope to form the required nanowires, and the length of the nanowires is generated according to the needs. 2.如权利要求1所述的可控纳米导线的机械制备方法,其特征在于能形成纳米粒子的金属为金、银、铂、镉或铜。2. The mechanical preparation method of controllable nanowires according to claim 1, characterized in that the metal capable of forming nanoparticles is gold, silver, platinum, cadmium or copper. 3.如权利要求1所述的可控纳米导线的机械制备方法,其特征在于半导体溶胶纳米粒子为硒化镉、硫化镉、二氧化钛、硫化锌、硫化银、氧化锌或碘化银。3. The mechanical preparation method of controllable nanowires according to claim 1, characterized in that the semiconductor sol nanoparticles are cadmium selenide, cadmium sulfide, titanium dioxide, zinc sulfide, silver sulfide, zinc oxide or silver iodide. 4.如权利要求1所述的可控纳米导线的机械制备方法,其特征在于原子级平面的基底为云母、玻璃或硅片。4. The mechanical preparation method of controllable nanowires according to claim 1, characterized in that the atomic-level flat substrate is mica, glass or silicon wafer.
CNB011102055A 2001-04-02 2001-04-02 Mechanical preparation of controllable nanowires Expired - Fee Related CN1167085C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB011102055A CN1167085C (en) 2001-04-02 2001-04-02 Mechanical preparation of controllable nanowires

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB011102055A CN1167085C (en) 2001-04-02 2001-04-02 Mechanical preparation of controllable nanowires

Publications (2)

Publication Number Publication Date
CN1316749A true CN1316749A (en) 2001-10-10
CN1167085C CN1167085C (en) 2004-09-15

Family

ID=4658416

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB011102055A Expired - Fee Related CN1167085C (en) 2001-04-02 2001-04-02 Mechanical preparation of controllable nanowires

Country Status (1)

Country Link
CN (1) CN1167085C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100484867C (en) * 2004-10-22 2009-05-06 中国科学院上海应用物理研究所 Methods for Isolating and Replacing Nanoparticles

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100484867C (en) * 2004-10-22 2009-05-06 中国科学院上海应用物理研究所 Methods for Isolating and Replacing Nanoparticles

Also Published As

Publication number Publication date
CN1167085C (en) 2004-09-15

Similar Documents

Publication Publication Date Title
Aspoukeh et al. Synthesis, properties and uses of ZnO nanorods: a mini review
Haick et al. Making contact: Connecting molecules electrically to the macroscopic world
KR101190983B1 (en) Nanostructures formed of branched nanowhiskers and method of producing the same
CN100416872C (en) Contact fabrics using heterostructures of metal/semiconductor nanorods and methods of making the same
US6982174B2 (en) Directed assembly of nanometer-scale molecular devices
US20080128761A1 (en) Novel Nanostructures And Method For Selective Preparation
AU2001285439A1 (en) Directed assembly of nanometer-scale molecular devices
EP1597194A4 (en) THREADS ASSEMBLED IN CALIBER BEAMS
CN113649584A (en) Growth method of laser-induced morphology-controllable gold or gold composite nanostructure and application thereof
KR20070057602A (en) Nanowire manufacturing method and nanowire structure using porous template
CN1167085C (en) Mechanical preparation of controllable nanowires
CN1475798A (en) Manufacturing method of tin dioxide nano sensor device
US20090212279A1 (en) Nanostructure-Based Electronic Device
KR20020095800A (en) Method for developing carbon nanotube horizontally
CN1140907C (en) Physicochemical Preparation of Controllable Nanowires
Rolandi et al. Manipulation and immobilization of alkane-coated gold nanocrystals using scanning tunneling microscopy
Schmid et al. Physical and chemical properties of large metal and semiconductor clusters in view of future applications
CN1654230A (en) Method for manufacturing nano-patterns with dynamic combination mode "dipping pen" nano-etching technology
DE19619287C2 (en) Process for creating structures from nanoparticles
JP2005011901A (en) Molecular transistor with three terminals
KR100276436B1 (en) Method for manufacturing single-temperature device
RU2386191C1 (en) Spherical multilayer component of electronic circuit for nano- and microelectronics
Dey Plasmon enhanced hybrid photovoltaics
Li et al. Controlled Preparation of Inorganic Nanostructures on Substrates by Dip‐Pen Nanolithography
Rashid Wafer Reproduction of Nanowires Silicone Wafer and Mounting or Growth of Nanowire Particles

Legal Events

Date Code Title Description
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C06 Publication
PB01 Publication
C14 Grant of patent or utility model
GR01 Patent grant
C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee