CN112378862A - High-low temperature cone light interference measuring device and method - Google Patents
High-low temperature cone light interference measuring device and method Download PDFInfo
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- 230000005540 biological transmission Effects 0.000 claims description 35
- 238000012360 testing method Methods 0.000 claims description 32
- 239000005337 ground glass Substances 0.000 claims description 15
- 238000005305 interferometry Methods 0.000 claims description 12
- 230000010287 polarization Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 abstract description 8
- 239000005338 frosted glass Substances 0.000 abstract 1
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 10
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- G—PHYSICS
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/23—Bi-refringence
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
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Abstract
本发明提供了一种高低温锥光干涉测量装置及方法，包括使一束可见波段的激光依次通过置于高低温试验箱中的两个45°放置的平面反射镜、起偏镜、毛玻璃、待测晶体、检偏镜，然后经观察窗口射出后用透射光屏接收透射光点和锥光干涉图样。利用五维精密调节架调节激光入射方向，利用透射光点在锥光干涉图样中的位置指示激光入射方向，通过调节使透射光点位于锥光干涉图样的对称中心，此时激光垂直于待测晶体的端面入射；通过平移激光器，可以观察晶体通光截面内不同区域的锥光干涉图样。本发明能够测量双折射晶体在不同温度下的锥光干涉图样，对晶体在高低温下的双折射特性、光学均匀性等光学性质进行研究，具有操作简单、调试方便、结果直观等优点。
The invention provides a high and low temperature conoscopic light interference measurement device and method, which includes making a beam of visible band laser pass through two 45° flat reflecting mirrors, polarizers, frosted glass, The crystal to be tested, the analyzer, and then out through the observation window, the transmitted light spot and the cone light interference pattern are received by the transmitted light screen. Use the five-dimensional precision adjustment frame to adjust the laser incident direction, use the position of the transmitted light spot in the conoscopic interference pattern to indicate the laser incident direction, and make the transmitted light spot at the symmetry center of the conoscopic interference pattern through adjustment. At this time, the laser is perpendicular to the object to be measured The end face of the crystal is incident; by translating the laser, the conoscopic interference patterns in different regions of the crystal clear cross section can be observed. The invention can measure the conoscopic interference patterns of birefringent crystals at different temperatures, study the optical properties such as birefringence characteristics and optical uniformity of the crystals at high and low temperatures, and has the advantages of simple operation, convenient debugging, and intuitive results.
Description
Technical Field
The invention relates to the field of optical measurement and detection, in particular to a high-low temperature conoscopic light interference measurement device and method.
Background
The conoscopic interference technique is that after a beam of divergent (or convergent) light passes through a birefringent crystal disposed between polarizers, due to the anisotropy of the crystal, the phase retardation and the intrinsic polarization direction of the laser light incident in different directions after passing through the crystal are different, which leads to inconsistent polarization state changes, so that after the divergent light passes through the polarization system, interference fringes, i.e., conoscopic interference patterns, are formed on the light screen. The conoscopic interference of the crystal relates to the properties of the crystal such as birefringence, light wave polarization, light wave interference and the like, is an intuitive and convenient method for knowing the characteristics of the crystal, and is a common method for measuring various characteristic parameters of the crystal. The cone light interference pattern can be used for explaining and researching a plurality of optical properties of the crystal, such as judging whether the crystal is uniaxial crystal or biaxial crystal, determining the orientation of a refractive index ellipsoid of the crystal, judging a light sign, measuring a light axis angle, detecting the optical uniformity of the crystal, and the like. For some birefringent crystals, an electro-optic effect, a piezoelectric effect, an elasto-optic effect, a pyroelectric effect, a refractive index temperature effect and the like exist at the same time, the birefringent characteristics of the crystals change under the influence of an external electric field, pressure, temperature and the like, and the effects can also be researched by using a cone light interference technology. In addition, in many optical applications, device performance can be tuned to optimal operating conditions using conoscopic interferograms for tuning.
Many crystal optical devices are often subjected to a wide temperature range for practical applications, particularly in the military, typically operating at temperatures in the range of-50 ℃ to 65 ℃. Due to the various effects of the crystal, temperature variations may result in variations in the crystal properties, which in turn leads to temperature instability in device performance. For example, an electro-optical Q-switch prepared by using lithium niobate crystals plays a crucial role in military pulse solid-state lasers, but in practical application, the lithium niobate electro-optical Q-switch is found to have poor low-temperature Q-switching performance, and phenomena such as light leakage and low dynamic output energy occur at low temperature. According to the principle of electro-optic Q-switching, the change of crystal birefringence and distribution thereof at low temperature is clarified, which is the key to find out the reason of low-temperature performance reduction and further improve the device performance. However, current studies on the temperature effect of crystal birefringence are focused only on the variation of maximum birefringence with temperature. For a crystal device, when the temperature changes, besides the direct influence of the temperature on the birefringence, various effects of the crystal can also influence the birefringence, so that the birefringence changes at various positions in the crystal are not consistent, and therefore, it is not significant to study the change of the maximum birefringence with the temperature. As described above, parameters such as birefringence characteristics and optical uniformity of a crystal can be studied by using a conoscopic interference technique, but the present conoscopic interference measurement is performed at normal temperature. Although the existing device for refrigerating the crystal independently has more light-passing windows, the light-passing aperture is smaller, and the cone light interference incident light is divergent light, so that the low-temperature cone light measurement requirement is difficult to meet, and no report of high-temperature and low-temperature cone light interference measurement is seen at present.
Disclosure of Invention
The invention provides a high-low temperature conoscopic interferometry device and method, which solve the problem that the conventional conoscopic interferometry can only be carried out at normal temperature.
The technical scheme for realizing the invention is as follows:
the utility model provides a high low temperature cone light interferometry device, includes visible light laser instrument and high low temperature test box, the visible light laser instrument is installed on five-dimensional accurate alignment jig, is equipped with the optics flat board in the high low temperature test box, is equipped with first plane speculum and second plane speculum on the optics flat board, has placed polarizer, ground glass, the crystal and the analyzer that await measuring along the reflection light path of second plane speculum coaxial in proper order, and high low temperature test box still is equipped with the transmission light screen outward.
The first plane reflector and the second plane reflector are arranged along 45 degrees and are perpendicular to each other. Laser emitted by the visible light laser passes through an observation window of the high-low temperature test chamber and then is incident on the first plane reflector, is incident on the second plane reflector after being reflected, passes through the polarizer, the ground glass, the crystal to be detected and the analyzer which are coaxially arranged after being reflected by the second plane reflector, and then is emitted to the transmission light screen after passing through the observation window of the high-low temperature test chamber.
The transmission directions of the polarizer and the analyzer are mutually vertical, the scattering degree of the ground glass is proper, part of laser can be directly transmitted, and part of laser forms scattered light.
The method for the device to perform high and low temperature cone light interferometry comprises the following steps:
(a) firstly, a light path is debugged in a normal temperature environment, and the pitching of a visible laser is adjusted by using a five-dimensional precise adjusting frame, so that the laser is transmitted along the horizontal direction; sequentially mounting a first plane reflector, a second plane reflector, a polarizer, ground glass, a crystal to be detected and an analyzer on an optical flat plate along a laser light path, and placing a transmission light screen at the tail end of the light path;
(b) adjusting the pitching and the position of each element, enabling laser to be incident to the center of a first plane reflector and then vertically reflected to the center of a second plane reflector, enabling the laser to sequentially pass through the centers of a polarizer, ground glass, a crystal to be detected and an analyzer which are coaxially arranged after reflection, forming a cone light interference pattern and a transmission light spot on a transmission light screen, enabling the transmission light spot to be located at the symmetrical center of the cone light interference pattern, and fixing each element on an optical flat plate after adjustment is completed;
(c) placing the optical flat plate and all elements into a high-low temperature test chamber, enabling the input and output ends of a light path to be close to an observation window of the high-low temperature test chamber, installing a visible light laser on a five-dimensional precision adjusting frame and placing the visible light laser outside the high-low temperature test chamber, and enabling the laser to pass through the observation window and then to be incident on a first plane reflector; the transmission light screen is arranged outside the high-low temperature test box and is arranged at the tail end of the light path; adjusting the five-dimensional precision adjusting frame to form a cone light interference pattern and a transmission light spot on the transmission light screen, wherein the transmission light spot is positioned at the symmetrical center of the cone light interference pattern; translating the laser light path by using a five-dimensional precision adjusting frame, and measuring the cone light interference patterns of different areas in the light passing section of the crystal to be measured;
(d) and opening the high-low temperature test chamber, setting a temperature control program, and measuring the cone light interference patterns of the crystal in different areas in the light transmission section at different temperatures.
When the optical path is debugged in the step (b), the distance between the first plane reflector and the second plane reflector is set according to the size of the observation window of the high-low temperature test chamber, so that the incident laser and the formed cone light interference pattern are not shielded after the optical flat plate and all elements are placed into the high-low temperature test chamber.
The invention has the beneficial effects that: the invention fills the blank of high and low temperature conoscopic interferometry, expands the research method of the high and low temperature performance of the birefringent crystal, can visually reflect the change conditions of the birefringence characteristics of the crystal, the optical uniformity of the crystal and the like along with the temperature according to the measurement result, and is beneficial to explaining and researching the high and low temperature performance of the crystal device. By adopting the ground glass with proper scattering degree, the transmission light spot and the interference pattern are formed at the same time, and the transmission light spot is used as an indication, so that the debugging process is simple and convenient, and the measurement result is visual.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of a high and low temperature conoscopic interferometry apparatus according to the present invention.
FIG. 2 is a conoscopic interference pattern and transmitted light point locations measured in an embodiment of the present invention, the transmitted light point being located at the center of symmetry of the conoscopic interference pattern.
FIG. 3 is a conoscopic interference pattern of different regions in the light-passing cross-section of a lithium niobate crystal after being cooled from room temperature to 0 ℃ at a rate of 2 ℃/min and kept at the same temperature for 0.5h, measured in an embodiment of the present invention.
FIG. 4 is a conoscopic interference pattern of different regions in the light-passing cross-section of a lithium niobate crystal after increasing the temperature from room temperature to 60 ℃ at a rate of 2 ℃/min and maintaining the temperature for 0.5h, measured in an embodiment of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the following embodiments of the present invention, and it should be understood that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without inventive effort based on the embodiments of the present invention, are within the scope of the present invention.
As shown in fig. 1, a high-low temperature cone light interference measuring device, including visible light laser 1 and high-low temperature test box 11, visible light laser 1 installs on five-dimensional precision adjusting bracket 2, be equipped with the dull and stereotyped 10 of optics in the high-low temperature test box 11, be equipped with first plane speculum 3 and second plane speculum 4 on the dull and stereotyped 10 of optics, first plane speculum 3 and second plane speculum 4 all place and the direction mutually perpendicular along 45, polarizer 5, ground glass 6, the crystal 7 and the analyzer 8 of awaiting measuring have coaxially placed in proper order along the reflection light path of second plane speculum 4, high-low temperature test box 11 still is equipped with transmission light screen 9 outward.
Laser emitted by the visible light laser 1 passes through an observation window 12 of a high-low temperature test box 10 and then is incident on a first plane reflector 3, is incident on a second plane reflector 4 after being reflected, passes through a polarizer 5, ground glass 6, a crystal 7 to be tested and an analyzer 8 which are coaxially arranged after being reflected by the second plane reflector 4, and then is emitted to a transmission light screen 9 after passing through the observation window 12 of the high-low temperature test box 10; the polarizer 5 is vertical to the transmission direction of the analyzer 8; the ground glass 6 is suitably scattered, and a part of laser light is directly transmitted and a part of laser light forms scattered light.
In this embodiment, the adopted visible light laser is a green light laser with a wavelength of 532 nm, the crystal to be measured is a lithium niobate crystal with a size of 9mm × 9mm × 9.4mm (X × Y × Z), and light passes along the Z-axis direction.
The method for the device to perform high and low temperature cone light interferometry comprises the following steps:
(a) firstly, a light path is debugged in a normal temperature environment, and the pitching of the visible laser 1 is adjusted by using a five-dimensional precise adjusting frame 2, so that the laser is transmitted along the horizontal direction; the method comprises the following steps of sequentially mounting a first plane reflector 3, a second plane reflector 4, a polarizer 5, ground glass 6, a crystal to be detected 7 and an analyzer 8 on an optical flat plate 10 along a laser light path, and placing a transmission light screen 9 at the tail end of the light path;
(b) adjusting the pitching and the position of each element, enabling laser to be incident to the center of the first plane reflector 3 and then vertically reflected to the center of the second plane reflector 4, after reflection, sequentially passing through the centers of a polarizer 5, ground glass 6, a crystal 7 to be measured and an analyzer 8 which are coaxially arranged, and forming a cone light interference pattern and a transmission light spot on a transmission light screen 9, so that the transmission light spot is positioned at the symmetrical center of the cone light interference pattern; as shown in fig. 2, when the optical path is adjusted, the distance between the first and second plane mirrors is set according to the size of the observation window 12, so as to ensure that the incident laser and the formed cone light interference pattern are not blocked; after the adjustment is finished, fixing each element on the optical flat plate;
(c) placing an optical flat plate 10 and all elements into a high-low temperature test chamber 11, enabling an input/output end of a light path to be close to an observation window 12 of the high-low temperature test chamber 11, installing a visible light laser 1 on a five-dimensional precision adjusting frame 2, placing the visible light laser outside the high-low temperature test chamber 11, and enabling the laser to pass through the observation window 12 and then to enter a first plane reflector 3; the transmission light screen 9 is arranged outside the high-low temperature test box 10 and is arranged at the tail end of the light path; adjusting the five-dimensional precision adjusting frame 2 to form a cone light interference pattern and a transmission light spot on the transmission light screen 9; and the transmission light spot is positioned at the symmetrical center of the conical light interference pattern, and the laser is incident perpendicular to the end face of the lithium niobate crystal; measuring the conoscopic interference patterns of different areas in the light-passing section of the lithium niobate crystal by utilizing a translation light path of the five-dimensional precision adjusting frame 2;
(d) and (3) opening the high-low temperature test box 11, setting a temperature control program, and measuring the cone light interference patterns of the lithium niobate crystal in different areas in the light transmission section at different temperatures. FIG. 3 is a schematic diagram showing the interference pattern of cone light in different areas of the light-passing cross-section of the lithium niobate crystal after the temperature is decreased from room temperature to 0 ℃ at a rate of 2 ℃/min and kept constant for 0.5h, and FIG. 4 is a schematic diagram showing the interference pattern of cone light in different areas of the light-passing cross-section of the lithium niobate crystal after the temperature is increased from room temperature to 60 ℃ at a rate of 2 ℃/min and kept constant for 0.5 h.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (6)
1. The utility model provides a high low temperature conoscopic light interferometry device which characterized in that: including visible light laser instrument (1) and high low temperature test box (11), install on five-dimensional accurate alignment jig (2) visible light laser instrument (1), be equipped with optics flat board (10) in high low temperature test box (11), be equipped with first plane speculum (3) and second plane speculum (4) on optics flat board (10), reflection light path along second plane speculum (4) has coaxially placed polarizer (5) in proper order, ground glass (6), crystal (7) and analyzer (8) await measuring, high low temperature test box (11) still are equipped with transmission light screen (9) outward.
2. The high and low temperature conoscopic interferometry apparatus according to claim 1, wherein: the first plane reflecting mirror (3) and the second plane reflecting mirror (4) are arranged along an angle of 45 degrees and are mutually vertical in direction.
3. The high and low temperature conoscopic interferometry apparatus according to claim 1, wherein: the polarization directions of the polarizer (5) and the analyzer (8) are mutually vertical.
4. The high and low temperature conoscopic interferometry apparatus according to claim 1, wherein: the ground glass can make a part of laser light directly transmit and a part of laser light form scattered light.
5. Method for performing high and low temperature conoscopic interferometry using the device according to any of claims 1-4, comprising the steps of:
(a) firstly, a light path is debugged in a normal temperature environment, and the pitching of the visible laser (1) is adjusted by using a five-dimensional precise adjusting frame (2) so that the laser can be transmitted along the horizontal direction; a first plane reflector (3), a second plane reflector (4), a polarizer (5), ground glass (6), a crystal to be detected (7) and an analyzer (8) are sequentially arranged on an optical flat plate (10) along a laser light path, and a transmission light screen (9) is arranged at the tail end of the light path;
(b) adjusting the pitching and the position of each element, enabling laser to be incident to the center of a first plane reflector (3) and then vertically reflected to the center of a second plane reflector (4), after reflection, sequentially passing through the centers of a polarizer (5), ground glass (6), a crystal (7) to be measured and an analyzer (8) which are coaxially arranged, forming a cone light interference pattern and a transmission light spot on a transmission light screen (9), enabling the transmission light spot to be positioned at the symmetrical center of the cone light interference pattern, and after adjustment is completed, fixing each element on an optical flat plate (10);
(c) an optical flat plate (10) and all elements are placed in a high-low temperature test chamber (11), the input and output ends of a light path are close to an observation window (12) of the high-low temperature test chamber (11), a visible light laser (1) is installed on a five-dimensional precision adjusting frame (2) and placed outside the high-low temperature test chamber (11), and the laser passes through the observation window (12) and then is incident on a first plane reflector (3); the transmission light screen (9) is arranged outside the high-low temperature test box (10) and at the tail end of the light path; adjusting the five-dimensional precision adjusting frame (2) to form a cone light interference pattern and a transmission light spot on the transmission light screen (9), wherein the transmission light spot is positioned at the symmetrical center of the cone light interference pattern; translating the laser light path by using the five-dimensional precision adjusting frame (2) to measure the cone light interference patterns of different areas in the light passing section of the crystal to be measured;
(d) and (3) opening the high-low temperature test box (11), setting a temperature control program, and measuring the cone light interference patterns of the crystal in different areas in the light passing cross section at different temperatures.
6. The method of claim 5, wherein: and (b) when the optical path is debugged in the step (b), setting the distance between the first plane reflector (3) and the second plane reflector (4) according to the size of the observation window (12) of the high-low temperature test chamber, and ensuring that the incident laser and the formed cone light interference pattern are not shielded after the optical flat plate (10) and all elements are placed in the high-low temperature test chamber (11).
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113358574A (en) * | 2021-04-28 | 2021-09-07 | 宁波大学 | System and method for measuring optical glass elasto-optical coefficient |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113358574A (en) * | 2021-04-28 | 2021-09-07 | 宁波大学 | System and method for measuring optical glass elasto-optical coefficient |
| CN113358574B (en) * | 2021-04-28 | 2024-05-14 | 宁波大学 | System and method for measuring elasto-optical coefficient of optical glass |
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