CN111933750A - Preparation method of thermal oxidation alkali polishing SE-PERC solar cell - Google Patents
Preparation method of thermal oxidation alkali polishing SE-PERC solar cell Download PDFInfo
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- 238000005498 polishing Methods 0.000 title claims abstract description 24
- 239000003513 alkali Substances 0.000 title claims abstract description 15
- 230000003647 oxidation Effects 0.000 title claims abstract description 10
- 238000007254 oxidation reaction Methods 0.000 title claims abstract description 10
- 238000002360 preparation method Methods 0.000 title claims description 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 117
- 239000010703 silicon Substances 0.000 claims abstract description 117
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 117
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 32
- 238000000034 method Methods 0.000 claims abstract description 17
- 239000011241 protective layer Substances 0.000 claims abstract description 16
- 238000005245 sintering Methods 0.000 claims abstract description 16
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052698 phosphorus Inorganic materials 0.000 claims abstract description 15
- 239000011574 phosphorus Substances 0.000 claims abstract description 15
- 235000012239 silicon dioxide Nutrition 0.000 claims abstract description 15
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 15
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 13
- 229910052709 silver Inorganic materials 0.000 claims abstract description 13
- 239000004332 silver Substances 0.000 claims abstract description 13
- 230000005684 electric field Effects 0.000 claims abstract description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 7
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 7
- 238000002347 injection Methods 0.000 claims abstract description 6
- 239000007924 injection Substances 0.000 claims abstract description 6
- 238000009792 diffusion process Methods 0.000 claims description 16
- 238000002161 passivation Methods 0.000 claims description 15
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 7
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 7
- 238000000151 deposition Methods 0.000 claims description 6
- 238000007639 printing Methods 0.000 claims description 6
- 239000011521 glass Substances 0.000 claims description 2
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 abstract description 7
- 239000005368 silicate glass Substances 0.000 abstract description 5
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- 229910052814 silicon oxide Inorganic materials 0.000 abstract description 2
- 238000006243 chemical reaction Methods 0.000 description 15
- 238000002310 reflectometry Methods 0.000 description 15
- 239000000243 solution Substances 0.000 description 15
- 238000005516 engineering process Methods 0.000 description 11
- 239000010410 layer Substances 0.000 description 7
- 239000005360 phosphosilicate glass Substances 0.000 description 7
- 239000000654 additive Substances 0.000 description 6
- 229910004205 SiNX Inorganic materials 0.000 description 5
- 230000004580 weight loss Effects 0.000 description 5
- 238000001039 wet etching Methods 0.000 description 5
- 239000002253 acid Substances 0.000 description 4
- 230000000996 additive effect Effects 0.000 description 4
- 238000005530 etching Methods 0.000 description 4
- 238000007517 polishing process Methods 0.000 description 4
- XNRNVYYTHRPBDD-UHFFFAOYSA-N [Si][Ag] Chemical compound [Si][Ag] XNRNVYYTHRPBDD-UHFFFAOYSA-N 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 3
- 239000002585 base Substances 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000006798 recombination Effects 0.000 description 3
- 238000005215 recombination Methods 0.000 description 3
- 101001073212 Arabidopsis thaliana Peroxidase 33 Proteins 0.000 description 2
- 101001123325 Homo sapiens Peroxisome proliferator-activated receptor gamma coactivator 1-beta Proteins 0.000 description 2
- 102100028961 Peroxisome proliferator-activated receptor gamma coactivator 1-beta Human genes 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 239000013585 weight reducing agent Substances 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- HIVGXUNKSAJJDN-UHFFFAOYSA-N [Si].[P] Chemical compound [Si].[P] HIVGXUNKSAJJDN-UHFFFAOYSA-N 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/121—The active layers comprising only Group IV materials
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/14—Photovoltaic cells having only PN homojunction potential barriers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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Abstract
本发明涉及SE—PERC太阳能电池生产领域。一种热氧化碱抛光SE—PERC太阳能电池制备方法,在硅片双面形成绒面;在硅片表面进行磷扩散,磷扩散后硅片方阻为100‑170Ω/sq;在硅片正面进行激光重掺杂,完成后,硅片重掺杂区域方阻与未掺杂区域方阻差值为30‑70Ω/sq;在硅片正面重掺杂区形成热氧化二氧化硅保护层,二氧化硅保护层厚度为1.0‑4.0nm;去除硅片背面磷硅玻璃;对硅片背面进行碱抛光;对硅片进行氧化处理;在硅片正面沉积氮化硅膜;在硅片背面沉积钝化膜;对硅片背面进行激光开膜;在硅片背面印刷背电极银浆、背电场铝浆,正面印刷正电极银浆;进行高温烧结,形成硅基电池;烧结完成后的硅基电池进行电注入。The invention relates to the field of SE-PERC solar cell production. A method for preparing a SE-PERC solar cell by thermal oxidation alkali polishing. A textured surface is formed on both sides of a silicon wafer; phosphorus is diffused on the surface of the silicon wafer, and the square resistance of the silicon wafer after the phosphorus is diffused is 100-170Ω/sq; Laser heavy doping, after completion, the square resistance difference between the heavily doped area of the silicon wafer and the undoped area is 30-70Ω/sq; a thermal oxide silicon dioxide protective layer is formed on the heavily doped area on the front of the silicon wafer, two The thickness of the silicon oxide protective layer is 1.0-4.0nm; the phosphorous silicate glass on the back of the silicon wafer is removed; the backside of the silicon wafer is alkali-polished; the silicon wafer is oxidized; The backside of the silicon wafer is subjected to laser film opening; the back electrode silver paste and back electric field aluminum paste are printed on the backside of the silicon wafer, and the positive electrode silver paste is printed on the front side; high-temperature sintering is performed to form a silicon-based battery; the silicon-based battery after sintering is completed Perform electrical injection.
Description
技术领域technical field
本发明涉及SE—PERC太阳能电池生产领域。The invention relates to the field of SE-PERC solar cell production.
背景技术Background technique
SE-PERC太阳能电池是目前市场上最流行的高效电池之一,其将正面激光重掺杂技术(SE)与局部接触背钝化技术(PERC)相结合,大大提升了太阳能电池的效率。SE-PERC太阳能电池从下往上依次包括背电极、背电场、SiNx/SiNxOx叠层、P型硅、N++层、N+层、氧化硅、氮化硅和正电极,N++层通过正面激光推进磷硅玻璃(PSG)中的磷实现。现有的SE-PERC电池的制备方法主要为酸刻蚀制备法,其制备流程为:制绒-扩散-正面激光-酸法刻蚀抛光+去PSG-退火-背面沉积钝化膜-沉积减反膜-背面激光开孔-背电极、背电场和正电极印刷-高温烧结。在SE-PERC电池的制备过程中,酸法抛光虽然流程简单,但其被反射率低,光投射损失大,转化效率低,因此有必要对SE-PERC电池的制备方法进行改进。SE-PERC solar cells are one of the most popular high-efficiency cells on the market today, which combine front-side laser heavy doping (SE) with local contact back passivation (PERC) to greatly improve solar cell efficiency. SE-PERC solar cell includes, from bottom to top, back electrode, back electric field, SiNx/SiNxOx stack, P-type silicon, N++ layer, N+ layer, silicon oxide, silicon nitride and positive electrode, the N++ layer is propelled by front-side laser phosphorous silicon Phosphorus in glass (PSG) implementation. The preparation method of the existing SE-PERC battery is mainly an acid etching preparation method, and the preparation process is: texturing-diffusion-front laser-acid etching and polishing+PSG removal-annealing-back deposition passivation film-deposition reduction. Reverse film - back laser opening - back electrode, back electric field and positive electrode printing - high temperature sintering. In the preparation process of SE-PERC cells, although the process of acid polishing is simple, it has low reflectivity, large light projection loss, and low conversion efficiency. Therefore, it is necessary to improve the preparation method of SE-PERC cells.
发明内容SUMMARY OF THE INVENTION
本发明所要解决的技术问题是:如何防止在传统碱抛光过程中表面磷松落导致的方阻上升问题,和电极印刷后银硅接触差的问题,进一步提高电池转化效率。The technical problem to be solved by the present invention is: how to prevent the increase of square resistance caused by the loose surface phosphorus in the traditional alkali polishing process and the problem of poor silver-silicon contact after electrode printing, so as to further improve the conversion efficiency of the battery.
本发明所采用的技术方案是:一种热氧化碱抛光SE—PERC太阳能电池制备方法,按照如下步骤进行:The technical scheme adopted in the present invention is: a preparation method of thermal oxidation alkali polishing SE-PERC solar cell, which is carried out according to the following steps:
(1)在硅片双面形成绒面;(1) The suede is formed on both sides of the silicon wafer;
采用湿法刻蚀技术,在硅片双面形成绒面;采用湿法刻蚀技术进行刻蚀,形成具有倒金字塔结构的绒面。优选的,制绒后,硅片减重0.2-0.8g,优选的为0.5-0.6g;制绒后,硅片反射率为8-14%;优选的为10-13%,进一步优选为11-12%;控制制绒后硅片的反射率有利于后期控制太阳能电池对于太阳光的反射率,有效增加太阳能电池对太阳光的吸收率,提升太阳能电池转换效率。Wet etching technology is used to form a textured surface on both sides of the silicon wafer; wet etching technology is used to etch to form a textured surface with an inverted pyramid structure. Preferably, after texturing, the weight of the silicon wafer is reduced by 0.2-0.8g, preferably 0.5-0.6g; after texturing, the reflectivity of the silicon wafer is 8-14%; preferably 10-13%, more preferably 11% -12%; Controlling the reflectivity of the silicon wafer after texturing is beneficial to control the reflectivity of solar cells to sunlight in the later stage, effectively increase the absorption rate of solar cells to sunlight, and improve the conversion efficiency of solar cells.
(2)在硅片表面进行磷扩散;(2) Phosphorus diffusion on the surface of the silicon wafer;
通过低压扩散技术,在硅片表面进行磷扩散;优选的,扩散后硅片的方阻为100-170Ω/sq,进一步优选的为120-140Ω/sq;提升硅片的表面方阻,可降低表面掺杂浓度,不仅可以提高电池的短波效应,提高短路电流;而且可以使表面复合导致的暗饱和电流减小,开路电压增大;优化电池性能。Phosphorus is diffused on the surface of the silicon wafer through low-pressure diffusion technology; preferably, the square resistance of the silicon wafer after diffusion is 100-170Ω/sq, more preferably 120-140Ω/sq; increasing the surface square resistance of the silicon wafer can reduce the The surface doping concentration can not only improve the short-wave effect of the battery and increase the short-circuit current, but also reduce the dark saturation current and increase the open-circuit voltage caused by surface recombination, and optimize the battery performance.
(3)在硅片正面进行激光重掺杂;(3) Laser heavy doping is performed on the front side of the silicon wafer;
使用迈为激光进行正面掺杂;激光掺杂提升了电极区掺杂浓度;降低了银浆与硅片之间的欧姆接触,进而提高了填充因子;提升了太阳能电池的性能。优选的,重掺杂后,硅片重掺杂区域方阻与为掺杂区域方阻差值为30-70Ω/sq,优选的为45-55Ω/sq;重掺杂电极区方阻在此范围内可提升太阳能电池转化效率。The front-side doping is performed using the Maiwei laser; the laser doping increases the doping concentration of the electrode region; reduces the ohmic contact between the silver paste and the silicon wafer, thereby improving the fill factor; and improving the performance of the solar cell. Preferably, after heavy doping, the difference between the square resistance of the heavily doped area of the silicon wafer and the square resistance of the doped area is 30-70Ω/sq, preferably 45-55Ω/sq; the square resistance of the heavily doped electrode area is here The conversion efficiency of solar cells can be improved within the range.
(4)在硅片正面重掺杂区形成热氧化二氧化硅保护层;(4) A thermal oxide silicon dioxide protective layer is formed on the heavily doped area on the front side of the silicon wafer;
通过高温热氧化技术,在硅片正面重掺杂区形成热氧化二氧化硅保护层,有效防止了在传统碱抛光过程中表面磷松落导致的方阻上升问题,防止了电极印刷后银硅接触差,降低电池转化效率的问题。优选的,形成热氧化二氧化硅保护层厚度1.0-4.0nm,进一步优选的为2.5-3.5nm。Through high-temperature thermal oxidation technology, a thermal oxide silicon dioxide protective layer is formed on the heavily doped area on the front side of the silicon wafer, which effectively prevents the increase of square resistance caused by surface phosphorus loosening during the traditional alkali polishing process, and prevents the silver silicon after electrode printing. Poor contact reduces the problem of battery conversion efficiency. Preferably, the thermal oxide silicon dioxide protective layer is formed with a thickness of 1.0-4.0 nm, more preferably 2.5-3.5 nm.
需要说明的是,一般认为,激光重掺杂是利用磷扩散过程中产生的磷硅玻璃为掺杂源,通过激光照射将磷硅玻璃层中的磷推进到硅片深处,进而形成重掺杂区;即在磷掺杂后直接进行激光重掺杂,能保障具有较高浓度的掺杂源,从而能够最大程度上降低重掺杂区的方阻,提升电极与底片的欧姆接触,提升太阳能电池转化效率。本发明在进行正面激光重掺杂后,增加热氧化二氧化硅保护层工艺;按照传统思路,去除背面磷硅玻璃的过程中会去除部分正面磷硅玻璃,减少激光重掺杂过程中的磷源,对提升太阳能电池转化效率不利。然而,本发明通过增加热氧化二氧化硅保护层工艺,通过大量的研究证明,不仅没有降低重掺杂区的方阻(掺杂区方阻与为掺杂区方阻差值为40-60Ω/sq);同时还有效克服了传统碱刻蚀过程中碱抛光使得重掺杂区磷丧失,提升方阻的问题;将SE-PERC太阳能电池效率提升了将近1%,取得了意想不到的技术效果。It should be noted that, it is generally believed that the laser heavy doping is to use the phosphorous silicate glass produced in the phosphorus diffusion process as the doping source, and the phosphorous in the phosphorous silicate glass layer is pushed into the depth of the silicon wafer by laser irradiation, thereby forming heavy doping. Impurity region; that is, laser heavy doping is performed directly after phosphorus doping, which can ensure a high concentration of doping source, thereby reducing the square resistance of the heavily doped region to the greatest extent, improving the ohmic contact between the electrode and the substrate, and improving the Solar cell conversion efficiency. In the present invention, after the front-side laser heavy doping is performed, a thermal oxide silicon dioxide protective layer process is added; according to the traditional idea, part of the front-side phosphorous silicate glass will be removed in the process of removing the back-side phosphorous silicate glass, so as to reduce the phosphorus in the laser heavy-doping process. source, which is not conducive to improving the conversion efficiency of solar cells. However, by increasing the thermal oxide silicon dioxide protective layer process in the present invention, a large number of studies have proved that not only does not reduce the square resistance of the heavily doped area (the difference between the square resistance of the doped area and the square resistance of the doped area is 40-60Ω) /sq); at the same time, it also effectively overcomes the problem of loss of phosphorus in the heavily doped area due to alkali polishing in the traditional alkali etching process and improves the square resistance; the efficiency of SE-PERC solar cells is increased by nearly 1%, and an unexpected technology has been achieved. Effect.
优选的,在经过本发明增加热氧化二氧化硅保护层后,硅片正面激光重掺杂区方阻为60-80Ω/sq;本发明在碱抛光前增加热氧化二氧化硅保护层,有效防止了传统碱抛光过程中将激光重掺杂区表面松散磷洗掉的问题;保证了重掺杂区低方阻;从而提升了欧姆接触; 提升了太阳能电池的转化效率。Preferably, after the thermal oxide silicon dioxide protective layer is added in the present invention, the square resistance of the laser heavily doped area on the front side of the silicon wafer is 60-80Ω/sq; the thermal oxide silicon dioxide protective layer is added in the present invention before alkali polishing, which is effective The problem of washing off the loose phosphorus on the surface of the laser heavily doped area in the traditional alkali polishing process is prevented; the low square resistance of the heavily doped area is ensured; thus the ohmic contact is improved; and the conversion efficiency of the solar cell is improved.
(5)去除硅片背面磷硅玻璃;(5) Remove the phosphosilicate glass on the back of the silicon wafer;
其中采用HF溶液去除硅片背面磷硅玻璃;优选的,采用HF溶液去除硅片背面磷硅玻璃;HF溶液体积浓度为3%-9%。HF溶液能够快速地除去硅片背面的磷硅玻璃;防止反应时间过长而造成硅片损伤。Wherein, HF solution is used to remove the phosphosilicate glass from the back of the silicon wafer; preferably, the HF solution is used to remove the phosphosilicate glass from the back of the silicon wafer; the volume concentration of the HF solution is 3%-9%. The HF solution can quickly remove the phosphosilicate glass on the back of the silicon wafer; it can prevent the silicon wafer from being damaged due to too long reaction time.
(6)对硅片背面进行碱抛光;(6) Alkali polishing the back of the silicon wafer;
其中采用含有添加剂的KOH溶液对硅片背面进行抛光;优选的,在盛有KOH(含有添加剂)溶液的抛光槽中对硅片背面进行抛光;进一步优选的,KOH溶液的体积浓度为5%-10%,进一步优选为6-8%。KOH溶液碱性强,抛光作用更加明显。The KOH solution containing additives is used to polish the backside of the silicon wafer; preferably, the backside of the silicon wafer is polished in a polishing tank filled with a KOH (containing additive) solution; further preferably, the volume concentration of the KOH solution is 5%- 10%, more preferably 6-8%. KOH solution is alkaline, and the polishing effect is more obvious.
优选的,抛光过程中硅片减重为0.1-0.3g,进一步优选为0.12-0.20g;抛光后硅片背面反射率为35-45%,进一步优选为40-55%。碱抛光可有效地提升硅片背面的反射率,使得长波段透射率明显降低,从而减少了光的透射损失,增加了电流密度Jsc,进而提高了SE-PERC太阳能电池的转换效率。Preferably, the weight reduction of the silicon wafer during polishing is 0.1-0.3 g, more preferably 0.12-0.20 g; the reflectivity of the back surface of the silicon wafer after polishing is 35-45%, more preferably 40-55%. Alkali polishing can effectively improve the reflectivity of the backside of the silicon wafer, so that the long-wavelength transmittance is significantly reduced, thereby reducing the transmission loss of light, increasing the current density Jsc, and improving the conversion efficiency of SE-PERC solar cells.
需要说明的是,在传统的酸刻蚀法制备SE-PERC太阳能的电池过程中,采用HF与HNO3的混合溶液进行硅片背面抛光;然而其抛光后的背反射率低,一般低于30%;减少了太阳光的吸收,降低了电流密度,降低了太阳能电池的转换效率。本发明采用含有添加剂的KOH溶液进行抛光,可有效提升太阳能电池背面反射率。It should be noted that in the process of preparing SE-PERC solar cells by the traditional acid etching method, the mixed solution of HF and HNO3 is used to polish the back of the silicon wafer; however, the back reflectivity after polishing is low, generally lower than 30% ; Reduce the absorption of sunlight, reduce the current density, and reduce the conversion efficiency of solar cells. In the present invention, the KOH solution containing additives is used for polishing, which can effectively improve the reflectivity of the back surface of the solar cell.
(7)对硅片进行氧化处理;(7) Oxidize the silicon wafer;
使用热氧进行氧化处理;优选的,氧化后温度控制在500-800℃ ;进一步优选为650-750℃。高温通氧过程可有效地对硅片进行氧化,起到钝化的作用,从而可以降低结区复合,提高开路电压,提高产品良率。The oxidation treatment is carried out by using thermal oxygen; preferably, the temperature after oxidation is controlled at 500-800°C; more preferably, it is 650-750°C. The high-temperature oxygen supply process can effectively oxidize the silicon wafer and play a passivation role, thereby reducing the junction recombination, increasing the open circuit voltage, and improving the product yield.
(8)在硅片正面沉积氮化硅膜;(8) Deposit a silicon nitride film on the front side of the silicon wafer;
其中,所述减反膜为氮化硅膜;可采用PECAD法沉积所述减反膜;优选的,沉积厚度为60-90nm;沉积减反膜后硅片正面折射率为1.5-3.0;正面减反膜可有效提升太阳能的吸收率,提升太阳能电池的转化效率。Wherein, the anti-reflection film is a silicon nitride film; the anti-reflection film can be deposited by PECAD method; preferably, the deposition thickness is 60-90 nm; the front refractive index of the silicon wafer after the anti-reflection film is deposited is 1.5-3.0; The anti-reflection film can effectively improve the absorption rate of solar energy and improve the conversion efficiency of solar cells.
(9)在硅片背面沉积钝化膜;(9) Deposit a passivation film on the back of the silicon wafer;
其中,所述钝化膜为SiNxOx/SiNx膜;可采用PECAD沉积所述钝化膜;优选的,沉积厚度为80-160nm。钝化膜可有效降低硅片背面复合,提高开路电压,提升太阳能电池转化效率。Wherein, the passivation film is a SiNxOx/SiNx film; the passivation film can be deposited by PECAD; preferably, the deposition thickness is 80-160 nm. The passivation film can effectively reduce the recombination on the back of the silicon wafer, increase the open circuit voltage, and improve the conversion efficiency of solar cells.
(10)对硅片背面进行激光开膜;(10) Laser film opening on the back of the silicon wafer;
其中,采用帝尔激光对背面钝化膜进行开孔,使铝硅形成欧姆接触,激光功率20-40W,开孔光斑直径20-40µm。(11)在硅片背面印刷背电极银浆、背电场铝浆,正面印刷正电极银浆;Among them, the backside passivation film is opened by Dier laser to form ohmic contact between aluminum and silicon, the laser power is 20-40W, and the diameter of the opening spot is 20-40µm. (11) Print the back electrode silver paste and the back electric field aluminum paste on the back of the silicon wafer, and print the positive electrode silver paste on the front;
(12)进行高温烧结,形成硅基电池;(12) Sintering at high temperature to form a silicon-based battery;
其中,烧成温度为300-900℃,优选为400-900℃,优选为400-850℃。Among them, the firing temperature is 300-900°C, preferably 400-900°C, and preferably 400-850°C.
(13)烧结完成后的硅基电池进行电注入。(13) Electric injection is performed on the silicon-based battery after sintering.
本发明的有益效果是:本发明通过使用背面碱抛光有效提升了太阳能电池背面反射率,使得长波段透射率明显降低,从而减少了光的透射损失,增加了电流密度Jsc,进而提高了SE-PERC太阳能电池的转换效率。本发明通过增加热氧化工艺,在硅片正面重掺杂区形成热氧化二氧化硅保护层,有效防止了在传统碱抛光过程中表面磷松落导致的方阻上升问题,防止了电极印刷后银硅接触差,降低电池转化效率的问题。通过本发明的制备流程,可将太阳能电池转化效率提升至≥22.40%。The beneficial effects of the present invention are as follows: the present invention effectively improves the backside reflectivity of the solar cell by using the backside alkali polishing, so that the long-wavelength transmittance is significantly reduced, thereby reducing the transmission loss of light, increasing the current density Jsc, and further improving the SE- Conversion efficiency of PERC solar cells. By adding a thermal oxidation process, the present invention forms a thermally oxidized silicon dioxide protective layer on the heavily doped area on the front side of the silicon wafer, which effectively prevents the increase in square resistance caused by surface phosphorus loosening during the traditional alkali polishing process, and prevents the electrode after printing. Poor silver-silicon contact reduces cell conversion efficiency. Through the preparation process of the present invention, the conversion efficiency of the solar cell can be improved to ≥22.40%.
具体实施方式Detailed ways
实施例1Example 1
本实施例中高效率SE-PERC太阳能电池的制备方法如下:The preparation method of the high-efficiency SE-PERC solar cell in this embodiment is as follows:
制绒:选用1200pcs的P型硅片为基底材料,使用湿法刻蚀技术,在硅片表面形成绒面,减重控制为0.46g,反射率为12.3%;Texturing: 1200pcs P-type silicon wafer is used as the base material, wet etching technology is used to form a textured surface on the surface of the silicon wafer, the weight loss is controlled to 0.46g, and the reflectivity is 12.3%;
扩散:使用低压扩散技术,形成PN结,扩散后硅片的方块电阻为122Ω/sq;Diffusion: Using low-voltage diffusion technology to form a PN junction, the sheet resistance of the silicon wafer after diffusion is 122Ω/sq;
在硅片正面进行激光重掺杂,硅片方阻下降控为48Ω/sq;Laser heavy doping is performed on the front side of the silicon wafer, and the square resistance drop of the silicon wafer is controlled to 48Ω/sq;
在硅片正面重掺杂区形成热氧化二氧化硅保护层,厚度为1.1nm;A thermal oxide silicon dioxide protective layer is formed on the heavily doped area on the front side of the silicon wafer with a thickness of 1.1 nm;
去除硅片背面磷硅玻璃,体积浓度为6%的HF溶液去除背面PSG层;Remove the phosphosilicate glass on the back of the silicon wafer, and remove the PSG layer on the back with an HF solution with a volume concentration of 6%;
对硅片背面进行碱抛光,使用体积浓度6.1%的KOH/添加剂溶液进行背面抛光,减重为0.12g,反射率控制在39%;Alkaline polishing was performed on the back of the silicon wafer, and KOH/additive solution with a volume concentration of 6.1% was used for back polishing, the weight loss was 0.12g, and the reflectivity was controlled at 39%;
对硅片进行氧化处理,温度控制在700℃;The silicon wafer is oxidized, and the temperature is controlled at 700℃;
在硅片正面沉积氮化硅膜,膜厚控制在72nm,折射率为2.12;A silicon nitride film is deposited on the front side of the silicon wafer, the film thickness is controlled at 72nm, and the refractive index is 2.12;
在硅片背面沉积钝化膜,钝化膜为SiNxOx/SiNx膜,厚度为121nm;A passivation film is deposited on the back of the silicon wafer, and the passivation film is SiNxOx/SiNx film with a thickness of 121nm;
使用帝尔激光对硅片背面进行激光开膜,激光功率为30W,开孔光斑直径为29µm;The backside of the silicon wafer is laser-opened with Dier laser, the laser power is 30W, and the aperture diameter is 29µm;
在硅片背面印刷背电极银浆、背电场铝浆,正面印刷正电极银浆;The back electrode silver paste and the back electric field aluminum paste are printed on the back of the silicon wafer, and the positive electrode silver paste is printed on the front;
进行高温烧结,形成硅基电池,烧结温度为820℃;High-temperature sintering is performed to form a silicon-based battery, and the sintering temperature is 820 °C;
烧结完成后的硅基电池进行电注入。The silicon-based cell after sintering is completed for electrical injection.
实施例2Example 2
本实施例中高效率SE-PERC太阳能电池的制备方法如下:The preparation method of the high-efficiency SE-PERC solar cell in this embodiment is as follows:
制绒:选用1200pcs的P型硅片为基底材料,使用湿法刻蚀技术,在硅片表面形成绒面,减重控制为0.53g,反射率为12.5%;Texturing: 1200pcs P-type silicon wafer is selected as the base material, wet etching technology is used to form a textured surface on the surface of the silicon wafer, the weight loss is controlled to 0.53g, and the reflectivity is 12.5%;
扩散:使用低压扩散技术,形成PN结,扩散后硅片的方块电阻为131Ω/sq;Diffusion: Use low-voltage diffusion technology to form a PN junction, and the sheet resistance of the silicon wafer after diffusion is 131Ω/sq;
在硅片正面进行激光重掺杂,硅片方阻下降控为52Ω/sq;The laser is heavily doped on the front side of the silicon wafer, and the square resistance drop of the silicon wafer is controlled to 52Ω/sq;
在硅片正面重掺杂区形成热氧化二氧化硅保护层,厚度为2.2nm;A thermal oxide silicon dioxide protective layer is formed on the heavily doped area on the front side of the silicon wafer with a thickness of 2.2nm;
去除硅片背面磷硅玻璃,体积浓度为6%的HF溶液去除背面PSG层;Remove the phosphosilicate glass on the back of the silicon wafer, and remove the PSG layer on the back with an HF solution with a volume concentration of 6%;
对硅片背面进行碱抛光,使用体积浓度6.1%的KOH/添加剂溶液进行背面抛光,减重为0.15g,反射率控制在40%;Alkaline polishing was performed on the back of the silicon wafer, and KOH/additive solution with a volume concentration of 6.1% was used for back polishing, the weight loss was 0.15g, and the reflectivity was controlled at 40%;
对硅片进行氧化处理,温度控制在700℃;The silicon wafer is oxidized, and the temperature is controlled at 700℃;
在硅片正面沉积氮化硅膜,膜厚控制在72nm,折射率为2.12;A silicon nitride film is deposited on the front side of the silicon wafer, the film thickness is controlled at 72nm, and the refractive index is 2.12;
在硅片背面沉积钝化膜,钝化膜为SiNxOx/SiNx膜,厚度为123nm;A passivation film is deposited on the back of the silicon wafer, and the passivation film is SiNxOx/SiNx film with a thickness of 123nm;
使用帝尔激光对硅片背面进行激光开膜,激光功率为30W,开孔光斑直径为28µm;The backside of the silicon wafer is laser-opened with Dier laser, the laser power is 30W, and the aperture spot diameter is 28µm;
在硅片背面印刷背电极银浆、背电场铝浆,正面印刷正电极银浆;The back electrode silver paste and the back electric field aluminum paste are printed on the back of the silicon wafer, and the positive electrode silver paste is printed on the front;
进行高温烧结,形成硅基电池,烧结温度为820℃;High-temperature sintering is performed to form a silicon-based battery, and the sintering temperature is 820 °C;
烧结完成后的硅基电池进行电注入。The silicon-based cell after sintering is completed for electrical injection.
实施例3Example 3
本实施例中高效率SE-PERC太阳能电池的制备方法如下:The preparation method of the high-efficiency SE-PERC solar cell in this embodiment is as follows:
制绒:选用1200pcs的P型硅片为基底材料,使用湿法刻蚀技术,在硅片表面形成绒面,减重控制为0.55g,反射率为12.3%;Texturing: 1200pcs P-type silicon wafer is selected as the base material, wet etching technology is used to form a textured surface on the surface of the silicon wafer, the weight reduction is controlled to 0.55g, and the reflectivity is 12.3%;
扩散:使用低压扩散技术,形成PN结,扩散后硅片的方块电阻为157Ω/sq;Diffusion: Use low-voltage diffusion technology to form a PN junction, and the sheet resistance of the silicon wafer after diffusion is 157Ω/sq;
在硅片正面进行激光重掺杂,硅片方阻下降控为58Ω/sq;Laser heavy doping is performed on the front side of the silicon wafer, and the square resistance drop of the silicon wafer is controlled to 58Ω/sq;
在硅片正面重掺杂区形成热氧化二氧化硅保护层,厚度为3.8nm;A thermal oxide silicon dioxide protective layer is formed on the heavily doped area on the front side of the silicon wafer with a thickness of 3.8nm;
去除硅片背面磷硅玻璃,体积浓度为6%的HF溶液去除背面PSG层;Remove the phosphosilicate glass on the back of the silicon wafer, and remove the PSG layer on the back with an HF solution with a volume concentration of 6%;
对硅片背面进行碱抛光,使用体积浓度6.1%的KOH/添加剂溶液进行背面抛光,减重为0.19g,反射率控制在41%;Alkaline polishing was performed on the back of the silicon wafer, and KOH/additive solution with a volume concentration of 6.1% was used for back polishing, the weight loss was 0.19g, and the reflectivity was controlled at 41%;
对硅片进行氧化处理,温度控制在700℃;The silicon wafer is oxidized, and the temperature is controlled at 700℃;
在硅片正面沉积氮化硅膜,膜厚控制在71nm,折射率为2.13;A silicon nitride film is deposited on the front side of the silicon wafer, the film thickness is controlled at 71nm, and the refractive index is 2.13;
在硅片背面沉积钝化膜,钝化膜为SiNxOx/SiNx膜,厚度为125nm;A passivation film is deposited on the back of the silicon wafer, and the passivation film is SiNxOx/SiNx film with a thickness of 125nm;
使用帝尔激光对硅片背面进行激光开膜,激光功率为31W,开孔光斑直径为30µm;The backside of the silicon wafer is laser-opened with Dier laser, the laser power is 31W, and the aperture diameter is 30µm;
在硅片背面印刷背电极银浆、背电场铝浆,正面印刷正电极银浆;The back electrode silver paste and the back electric field aluminum paste are printed on the back of the silicon wafer, and the positive electrode silver paste is printed on the front;
进行高温烧结,形成硅基电池,烧结温度为820℃;High-temperature sintering is performed to form a silicon-based battery, and the sintering temperature is 820 °C;
烧结完成后的硅基电池进行电注入。The silicon-based cell after sintering is completed for electrical injection.
将实施例1-3中的SE-PERC太阳能电池进行性能测定,其结果如表1。The performance of the SE-PERC solar cells in Examples 1-3 was measured, and the results are shown in Table 1.
表1Table 1
由表中可以看出,本发明中的SE-PERC太阳能电池效率在22.30%以上。相比传统SE-PERC太阳能电池,效率有了显著提升。It can be seen from the table that the efficiency of the SE-PERC solar cell in the present invention is above 22.30%. Compared with traditional SE-PERC solar cells, the efficiency has been significantly improved.
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