CN111366797A - Capacitance testing device - Google Patents

Abstract

The invention provides a capacitance testing device, which includes a feeding module, a pre-checking module and a charging testing module. The feeding module is used for placing a plurality of capacitors to be measured in a plurality of positions to be measured. The pre-check module is used for testing a plurality of capacitances to be tested in the plurality of positions to be tested, and to determine whether each capacitance to be tested meets the pre-check standard. The charging test module is used to perform a charging test procedure on the capacitor to be tested that meets the pre-check standard. Wherein, when the pre-check module determines that one of the plurality of capacitors to be tested does not meet the pre-check standard, the pre-check module removes the capacitor to be tested that does not meet the pre-check standard from the corresponding position to be measured.

Description

Capacitance Test Device

technical field

The present invention relates to a capacitance testing device, in particular to a capacitance testing device that performs pre-check before charging test.

Background technique

With the advancement of technology, there are more and more types of electronic products and more and more popular. As each electronic product needs to use a different number of capacitors, it is inevitable that the market demand for capacitors is increasing. Large-capacity capacitors, such as electrostatic double-layer capacitors (EDLC or double-layer capacitors), have been launched in the market today, with various discharge times and current sizes to choose from.

When the supercapacitor leaves the factory, it may be repeatedly tested to check the reliability of the supercapacitor. Taking the aging test of supercapacitors as an example, when multiple supercapacitors are tested in batches, it is necessary to use a rack to clamp the connecting pins of multiple supercapacitors, and then bake them in a high-temperature oven for a certain period of time to simulate the aging of supercapacitors. state. At this time, the bent frame may supply current to all the supercapacitors clamped at the same time, so as to speed up the process of subsequent detection (eg, leakage current detection). However, if the connecting pins of some supercapacitors are not really clamped by the bent frame, or the connecting pins of some supercapacitors are crooked or damaged during transportation, the subsequent testing will be inaccurate, and it may even lead to damage to the testing machine. .

Therefore, the industry needs a new capacitor testing device, which can detect whether the connecting pins of the capacitor are indeed clamped and whether the connecting pins of the capacitor are damaged before the charging test.

SUMMARY OF THE INVENTION

In view of this, the present invention proposes a capacitance testing device, which can perform pre-checking before charging and testing, and charge the capacitance that meets the pre-checking standard. Thereby, the present invention can stop the subsequent testing of the capacitor in time after finding that the capacitor does not meet the pre-check standard, so as to avoid unexpected failure or damage to the testing machine.

The invention provides a capacitance testing device, which includes a feeding module, a pre-checking module and a charging testing module. The feeding module is used for placing a plurality of capacitors to be measured in a plurality of positions to be measured. The pre-check module is used for testing a plurality of capacitances to be tested in the plurality of positions to be tested, and to determine whether each capacitance to be tested meets the pre-check standard. The charging test module is used to perform a charging test procedure on the capacitor to be tested that meets the pre-check standard. Wherein, when the pre-checking module determines that one of the capacitors to be tested does not meet the pre-checking standard, the pre-checking module removes the capacitance to be measured that does not meet the pre-checking standard from the corresponding to-be-measured position.

In some embodiments, the pre-check module may include a first voltage source, a first current setting unit, and a plurality of voltage detection units. The first voltage source is electrically connected to the first end and the second end of each position to be tested for providing a first test voltage to the first end and the second end of each position to be tested. The first current setting unit is used for setting the first test current flowing through each position to be tested. Each voltage detection unit is electrically connected to one of the plurality of positions to be tested, and is used for detecting whether the capacitance to be tested in the plurality of positions to be tested meets the pre-check standard. Here, one of the plurality of positions to be tested may be defined as the first position to be tested, and the first voltage source and the first current setting unit are respectively used for providing the first test voltage and the first test current to the first test position. position for a preset period of time. In addition, the voltage detection unit can determine whether the cross-voltage between the first end and the second end of the first position to be measured is within the preset voltage range, and when the cross-voltage between the first end and the second end of the first position to be measured is within the preset voltage Within the range, the capacitance to be measured in the first location to be measured meets the pre-check standard.

In some embodiments, the feeding module is used for placing the plurality of capacitors to be tested on the plurality of positions to be tested on the carrier plate, and the plurality of positions to be tested are arranged in a first array. The pre-checking module can simultaneously determine whether the plurality of positions to be tested corresponding to one column of the first array meet the pre-checking standard. The pre-checking module may mark locations to be tested that do not meet the pre-checking criteria in the first array.

To sum up, the capacitance testing device provided by the present invention has a pre-checking module, and the pre-checking module can check whether the capacitance to be tested meets certain standards before charging and testing. When the pre-check module thinks that the capacitor under test does not meet the standard, it will not continue to charge the capacitor under test. Thereby, the capacitance testing device of the present invention can reduce the chance of the capacitance testing device being damaged when testing the capacitance.

The details of other functions and embodiments of the present invention are described below with reference to the accompanying drawings.

Description of drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only These are some embodiments described in this application. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings without creative efforts.

1 is a functional block diagram of a capacitance testing device according to an embodiment of the present invention;

2 is a schematic diagram of a carrier tray applied to a feeding module according to an embodiment of the present invention;

FIG. 3 is a functional block diagram of a pre-check module according to an embodiment of the present invention.

Symbol Description

1 Capacitance test device 10 Feeding module

12 Pre-check module 120 Voltage source

122 Current setting unit 124 Voltage detection unit

14 Charge Test Module 2 Carrier Tray

20a～20e row 200 position to be measured

2000 First End 2002 Second End

DUT capacitance to be measured

Detailed ways

The foregoing and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of a preferred embodiment with reference to the accompanying drawings. The directional terms mentioned in the following embodiments, such as: up, down, left, right, front or rear, etc., are only referring to the directions of the drawings. Accordingly, the directional terms used are illustrative and not limiting of the present invention.

Please refer to FIG. 1 . FIG. 1 is a functional block diagram of a capacitance testing apparatus according to an embodiment of the present invention. As shown in FIG. 1 , the capacitance testing device 1 includes a feeding module 10 , a pre-checking module 12 and a charging testing module 14 . The capacitance testing device 1 can be an automatic testing equipment for conducting electrical testing on the capacitance to be tested (not shown in FIG. 1 ). The feeding module 10 , the pre-checking module 12 and the charging and testing module 14 can be used in the electrical testing process of the capacitor to be tested, for example, can be used to perform high temperature aging testing of the capacitor to be tested. Of course, the capacitance testing device 1 may also have a discharging module, or a computer for controlling the feeding module 10 , the pre-checking module 12 , and the charging test module 14 , which is not limited in this embodiment. In other words, the feeding module 10 , the pre-checking module 12 and the charging and testing module 14 can be only a part of the capacitance testing device 1 , which are used to ensure that the capacitors to be tested can be properly fed and to actively detect non-standard capacitors to be tested. , so that only the capacitor to be tested that meets the standard is charged and tested. Each part of the capacitance testing device 1 will be described below.

The feeding module 10 can be controlled by the control computer for placing a plurality of capacitors to be measured in a plurality of positions to be measured, respectively. In one example, the feeding module 10 may place the plurality of capacitors to be tested at a plurality of positions to be tested on the carrier plate, and the plurality of positions to be tested may be arranged in a first array. Please refer to FIG. 1 and FIG. 2 together. FIG. 2 is a schematic diagram illustrating a carrier tray applied to a feeding module according to an embodiment of the present invention. As shown in the figure, the carrier plate 2 may have a plurality of positions 200 to be tested arranged in an array (a first array), and the array may, for example, have a plurality of rows 20a-20e, and the number of positions to be tested in each row may be multiple. For example, the number of positions to be tested in each row may be between 30 and 50, and the total number of positions to be tested of the carrier disc 2 may be, for example, between 3000 and 5000, which is not included in this embodiment. limit.

In one example, the feeding module 10 may include a vibration device (not shown) to which the carrier tray 2 may be connected. When a plurality of capacitors to be measured are scattered on the carrier plate 2, the vibration device can be turned on, so that the carrier plate 2 vibrates with the vibration device, so that the plurality of capacitors to be measured can be respectively dropped in different positions to be measured after vibration. . In addition, the shape of each position to be tested 200 in the carrier plate 2 can also be specially designed, for example, the shape of each position to be tested 200 can be designed to accommodate exactly one capacitor to be tested, and multiple capacitors to be tested can be regularly are arranged in the carrier tray 2 . In an example, the designed position 200 to be tested can make the connection pins of the capacitor to be tested face the same direction. For example, when the capacitor to be tested is placed at the position to be tested 200, one connecting pin of the capacitor to be tested can be designed to be located at the first end of the position to be tested 200, and the other connecting pin of the capacitor to be tested can be designed to be located at the first end of the capacitor to be tested Second end of position 200. In practice, the plurality of capacitors to be tested can also be placed in the position to be tested 200 in other ways, for example, by using an automated device to place them by a robotic arm, or even manually placing them, which is not limited in this embodiment.

After a plurality of capacitors to be tested have been individually placed in different positions 200 to be tested in the carrier tray 2 , the feeding module 10 can determine that the feeding step has been completed at this time. Thus, the carrier tray 2 can be removed from the feeding module 10 and moved to the pre-inspection module 12 for subsequent steps. In one example, the feeding module 10 and the pre-inspection module 12 can be regarded as different testing stations in the capacitance testing device 1, and the carrier plate 2 can be moved between the feeding module 10 and the pre-inspection module 12 through a robotic arm or a conveyor belt. .

The pre-checking module 12 can be used to test the capacitances to be tested in each of the locations 200 to be tested, and determine whether each capacitance to be tested meets the pre-checking standard. For convenience of description, please refer to FIG. 1 , FIG. 2 and FIG. 3 together. FIG. 3 is a functional block diagram of a pre-check module according to an embodiment of the present invention. As shown in the figure, the pre-checking module 12 may include a voltage source 120 (a first voltage source), a current setting unit 122 (a first current setting unit), and a voltage detection unit 124 . The voltage source 120 can be electrically connected to the first terminal 2000 and the second terminal 2002 of each position to be tested 200 for providing a test voltage (first test voltage) to the first terminal 2000 and the second terminal 2002 . The current setting unit 122 can be used to set the test current (first test current) flowing through each position to be tested 200 . The voltage detection unit 124 is electrically connected to one of the positions to be tested 200 for detecting whether the capacitance DUT to be tested in the position to be tested 200 complies with the pre-check standard.

In practice, the pre-checking module 12 may have multiple voltage detection units 124 , which may correspond to multiple positions 200 to be tested in the carrier tray 2 , so that the capacitance DUT to be tested in the positions 200 to be tested can be measured in batches. In one example, a plurality of voltage detection units 124 may correspond to a plurality of positions to be tested 200 in the same row, so that the pre-check module 12 can test a plurality of positions to be tested 200 row by row. In an example, taking the position to be measured 200 (the first position to be measured) corresponding to one of the voltage detection units 124 as an example, the voltage detection unit 124 may have a conductive clip, and the voltage detection unit 124 may use the conductive clip to try to clamp it. A first end 2000 and a second end 2002 of the position to be tested 200 . If the connection pins of the capacitor DUT under test are normal, the conductive clip should be able to smoothly clamp the two connection pins of the capacitor DUT under test. Conversely, if the connection pins of the capacitor DUT to be tested are damaged or skewed, the conductive clip may not be able to successfully clamp the two connection pins of the capacitor DUT to be tested, or only one of the connection pins of the capacitor DUT to be tested. Those skilled in the art should understand that the main function of the conductive clip is not to fix the connecting pins of the capacitor DUT under test, but to electrically connect the connecting pins of the capacitor DUT under test. Therefore, the present embodiment does not limit the voltage detection unit 124 to use a conductive clip to electrically connect the first end 2000 and the second end 2002 , and the voltage detection unit 124 may also use a probe or other devices suitable for electrically connecting the first end 2000 2002 assembly with the second end.

In a practical example, the voltage source 120 will stably output a known voltage to the position to be tested 200 , and the current flowing through the position to be tested 200 can be set by the current setting unit 122 . When the quality of the capacitor DUT to be tested and the connection pins are normal, the voltage detection unit 124 can measure the voltage across the capacitor DUT to be tested from the first terminal 2000 and the second terminal 2002, and through the voltage across the capacitor DUT to be tested, Determine whether the capacitance DUT under test meets the pre-check standard. For example, the voltage source 120 can stably charge the capacitor DUT under test for a period of time (preset time), and the voltage detection unit 124 can measure the cross-voltage (the voltage difference between the two connection pins) of the capacitor DUT under test for It increases with time, and it is estimated whether the capacitance value of the capacitor DUT to be measured is normal through the cross-voltage increasing with time. In practice, when the voltage, current and charging time (preset time) are all known, a person with ordinary knowledge in the art should be able to easily calculate the capacitance value of the capacitor to be measured DUT, and can use the calculated capacitance value to judge whether the capacitance DUT to be tested meets the pre-check standard. For example, generally speaking, if the capacitance value of the capacitor DUT under test is within a preset range, for example, it meets the requirements of quality control, it can be inferred that the capacitor DUT under test meets the pre-check standard.

On the other hand, when the quality of the capacitor DUT under test or the connection pins are abnormal, the voltage detection unit 124 can measure the voltage across the capacitor DUT to be tested from the first terminal 2000 and the second terminal 2002 to be abnormal. For example, when the quality of the capacitor DUT under test is abnormal, the voltage detection unit 124 may not be able to measure the voltage difference from the first terminal 2000 and the second terminal 2002, that is, there is a short circuit inside the capacitor DUT under test. Since it is obviously not within the preset voltage range, the voltage detection unit 124 can directly determine that the capacitance DUT to be measured does not meet the pre-check standard at this time. Alternatively, the voltage detection unit 124 may find that the efficiency of the increase of the cross-voltage is obviously problematic (for example, the increase of the cross-voltage is too fast or too slow), and can directly determine that the capacitor DUT under test does not meet the pre-check standard. In addition, when the connecting pin of the capacitor DUT to be measured is skewed and not correctly positioned at the first end 2000 or the second end 2002 , the connection between the first end 2000 and the second end 2002 is equal to an open circuit state. At this time, not only the voltage detection unit 124 can judge that the capacitor DUT to be measured does not meet the pre-check standard by the voltage difference between the first terminal 2000 and the second terminal 2002, but also the current setting unit 122 can find that the current is abnormal (there is no open circuit). current), directly determine that the capacitor DUT under test does not meet the pre-check standard.

In one example, if the pre-check module 12 determines that the capacitance DUT to be tested at a specific location to be tested 200 does not meet the pre-check standard, the capacitance DUT to be tested that does not meet the pre-check standard can be removed from the corresponding location to be measured 200 . In other words, the pre-inspection module 12 may have a mechanism for rejecting defective products, so as to prevent the capacitance DUT to be tested that does not meet the pre-inspection standard from remaining at the position to be tested 200 . For example, the pre-inspection module 12 may have a spring or a spring sheet to directly eject the capacitance DUT to be tested in the specific position 200 out of the carrier plate 2, or the pre-inspection module 12 may have a mechanical arm or a jig to eject the capacitance DUT to be tested in the specific position 200 The capacitor DUT is clamped to the outside of the carrier plate 2 (eg, placed in a defective product box). Of course, the pre-check module 12 can also mark the position to be tested 200 that does not meet the pre-check standard, so that the subsequent charging test program does not charge the position to be tested 200, so as to avoid that the bad capacitor DUT to be tested cannot be correctly excluded. Causes damage to the capacitance testing device 1 .

Continuing to refer to FIG. 1 , the charging test module 14 can perform a charging test procedure on the capacitor DUT to be tested that meets the pre-check standard. This embodiment does not limit the test items and means of the charging test procedure. For example, the charging test module 14 can perform charging tests, discharge tests, high temperature tests, leakage tests, internal resistance tests, or other electrical tests. It is not limited here. It is worth mentioning that the pre-checking module 12 can limit the pre-checking module 12 to operate in a low voltage and low current state through the voltage source 120 and the current setting unit 122, and the charging test module 14 may use a larger voltage or current for the operation. The test of the capacitance DUT under test. The purpose of restricting the pre-checking module 12 to operate with low voltage and low current is that, since it is uncertain whether the capacitor DUT to be tested is normal, the test is performed first with a lower voltage and current to avoid damage to the capacitor testing device 1 . Afterwards, after the capacitor DUT to be tested is simply tested and screened by the pre-checking module 12, the capacitor DUT to be tested with obvious defects in quality can be excluded first, and then the capacitor DUT to be tested is charged with higher voltage and current by the charging test module 14. The performance test can better guarantee the capacitance test device 1.

To sum up, the capacitance testing device provided by the present invention can perform pre-inspection before charging and testing, and charge the capacitor to be tested that meets the pre-inspection standard. Thereby, the capacitance testing device of the present invention can exclude the capacitance to be tested that does not meet the pre-check standard before testing with high voltage and large current, so as to avoid unexpected failure or damage to the testing machine.

The above-mentioned embodiments and/or implementations are only used to illustrate the preferred embodiments and/or implementations for realizing the technology of the present invention, and are not intended to limit the implementation of the technology of the present invention in any form. Personnel, without departing from the scope of the technical means disclosed in the content of the present invention, may make some changes or modifications to other equivalent embodiments, but they should still be regarded as substantially the same technology or embodiment of the present invention.

Claims (8)

1. A capacitance measuring device, comprising:

the feeding module is used for respectively placing a plurality of capacitors to be tested at a plurality of positions to be tested;

the system comprises a pre-inspection module, a detection module and a control module, wherein the pre-inspection module is used for testing the capacitors to be tested in the positions to be tested and judging whether each capacitor to be tested meets a pre-inspection standard; and

the charging test module is used for carrying out a charging test program on the capacitor to be tested according with the pre-inspection standard;

when the pre-inspection module judges that one of the capacitors to be detected does not accord with the pre-inspection standard, the pre-inspection module removes the capacitor to be detected which does not accord with the pre-inspection standard from the corresponding position to be detected.

2. The capacitance testing device of claim 1, wherein the pre-check module comprises:

a first voltage source electrically connected to a first end and a second end of each of the positions to be tested for providing a first test voltage to the first end and the second end of each of the positions to be tested;

a first current setting unit for setting a first test current flowing through each of the positions to be tested;

and each voltage detection unit is electrically connected with one of the positions to be detected and used for detecting whether the capacitors to be detected in the positions to be detected meet the pre-inspection standard or not.

3. The apparatus according to claim 2, wherein one of the test locations is defined as a first test location, and the first voltage source and the first current setting unit are respectively configured to provide the first test voltage and the first test current to the first test location for a predetermined time.

4. The apparatus according to claim 3, wherein the voltage detection unit determines whether the voltage across the first end and the second end of the first dut is within a predetermined voltage range, and the capacitor under test in the first dut conforms to the predetermined inspection standard when the voltage across the first end and the second end of the first dut is within the predetermined voltage range.

5. The capacitance testing device according to claim 2, wherein the charge test module has a second voltage source for providing a second test voltage, the first test voltage being less than the second test voltage.

6. The capacitance testing device according to claim 1, wherein the material feeding module is configured to place the capacitors to be tested on the positions to be tested on a tray, and the positions to be tested are arranged in a first array.

7. The apparatus according to claim 6, wherein the pre-inspection module simultaneously determines whether the positions to be inspected corresponding to one row of the first array meet the pre-inspection criteria.

8. The apparatus according to claim 6, wherein the pre-inspection module marks the or the plurality of positions to be tested in the first array that do not meet the pre-inspection criteria.

Images