CN118464198B - Current measurement method used in resistor array driving process - Google Patents

Abstract

The invention relates to the technical field of current measurement of resistor arrays, in particular to a current measurement method used in a resistor array driving process. Firstly, acquiring a two-dimensional distribution model of a detecting element; collecting current data of different test voltages under fixed preset infrared radiation; further acquiring a position factor of each detecting element; further dividing the current data to obtain energy aggregation parameters of the target detection element in each time window; further acquiring a heat aggregation factor of the target detection element in each time window; further acquiring an initial resistance correction coefficient of the target detection element; and further obtaining a current correction coefficient according to the thermal aggregation factor and the initial resistance correction coefficient to obtain a correction current value. The invention starts from two angles of influence of heat aggregation effect of the detecting element and influence of initial resistance of the detecting element in long-time operation of the resistor array, eliminates the distribution position of the detecting element and the interference of the initial resistance, and acquires accurate current data.

Description

A method for measuring current in a resistor array driving process

Technical Field

The present invention relates to the technical field of current measurement of resistor arrays, and in particular to a current measurement method used in a resistor array driving process.

Background Art

The resistor array is the core device of the infrared target simulation system. It is a heating element as the main part of the radiation. It is composed of multiple infrared detection elements. Each detection element has a micro resistor. When the micro resistor receives infrared radiation, it will produce a thermal effect, causing the resistance value to change, so that the infrared radiation intensity of the target object can be detected. In order to obtain the change in resistance value, the calculation is performed by providing a stable voltage to the micro resistor and measuring the change in current value.

There are usually some errors in the production or installation of the detection element. These errors will cause the initial resistance value to be inconsistent, resulting in inconsistent current values generated by the detection element after receiving radiation, which will lead to poor presentation of infrared images, that is, the response curve of each detection element under the same drive is inconsistent; in addition, long-term high-frequency use will cause the energy of the detection element to accumulate, and the concentration of detection elements at different positions is different, so it is necessary to perform non-uniformity correction on the current value generated by the detection element. The existing non-uniformity correction is corrected by a fixed voltage, ignoring the influence between the energy generated by the micro-resistance itself under different voltages and currents and the energy generated by radiation, and the processing of edge effects is not detailed enough, resulting in unsatisfactory correction results.

Summary of the invention

In order to solve the technical problem that the non-uniformity correction result of the resistor array in the prior art is not ideal, the purpose of the present invention is to provide a current measurement method for the resistor array driving process, and the technical solution adopted is as follows:

A current measurement method for a resistor array driving process, the method comprising:

Acquire a two-dimensional distribution model of detection elements in the resistor array; select test voltages in a preset test voltage sequence as target voltages in turn; under fixed preset infrared radiation, based on the target voltage, collect current data of a preset test time length of each detection element; select any detection element as a target detection element;

Under the target voltage, according to the distribution characteristics of each detection element in the two-dimensional distribution model, the position factor of each detection element is obtained; the current data is segmented to obtain time windows; according to the fluctuation characteristics of the current data of the target detection element, the energy concentration parameter of the target detection element in each time window is obtained; according to the position factor and the energy concentration parameter of the target detection element, the thermal concentration factor of the target detection element in each time window is obtained;

According to the variation characteristics of the heat aggregation factor of the target detection element under different test voltages, an initial resistance correction coefficient of the target detection element is obtained;

According to the heat aggregation factor and the initial resistance correction coefficient, the current correction coefficient of the target detection element in each time window is obtained; and the current data is corrected by the current correction coefficient to obtain a corrected current value.

Furthermore, the method for obtaining the position factor includes:

The position factor of each detection element is obtained according to the distance between each detection element and the center of the resistor array in the two-dimensional distribution model; the position factor is normalized; and the distance between the detection element and the center of the resistor array in the two-dimensional distribution model is positively correlated with the position factor.

Furthermore, the method for obtaining the energy concentration parameters includes:

According to the overall characteristics of the current data in each time window, a representative current value of the target detection element in each time window is obtained; and the range of the current data in each time window is obtained as a first rate parameter;

The current representative values corresponding to each time window and a preset first parameter number of time windows preceding the time window in time sequence form a first sequence to be analyzed;

According to the variation characteristics of the current representative value in the first sequence to be analyzed corresponding to each time window, combined with the first rate parameter, the energy concentration parameter of the target detection element in each time window is obtained; the first rate parameter is positively correlated with the energy concentration parameter.

Furthermore, the energy concentration parameter calculation method includes:

Acquire a first-order difference sequence of the first sequence to be analyzed corresponding to any time window of the target detection element;

According to the change characteristics of the elements in the first-order difference sequence and in combination with the first rate parameter, the energy concentration parameter of the target detection element in the corresponding time window is obtained.

Furthermore, the method of obtaining the energy concentration parameter of the target detection element in the corresponding time window according to the change characteristics of the elements in the first-order difference sequence in combination with the first rate parameter includes:

Obtaining a second rate parameter according to a proportion characteristic of negative elements in the first-order difference sequence;

Take the absolute value of each element in the first-order difference sequence; according to the absolute value of each element in the first-order difference sequence, combined with the first rate parameter and the second rate parameter, obtain the energy concentration parameter of the target detection element in the corresponding time window; the absolute value of each element in the first-order difference sequence and the second rate parameter are positively correlated with the energy concentration parameter.

Furthermore, the method for obtaining the heat aggregation factor includes:

According to the energy focusing parameter and the position factor, a first focusing factor of the target detection element is acquired; the energy focusing parameter is negatively correlated with the first focusing factor; and the position factor is positively correlated with the first focusing factor;

According to the energy focusing parameter and the position factor, a second focusing factor of the target detection element is acquired; the energy focusing parameter is positively correlated with the second focusing factor; and the position factor is negatively correlated with the second focusing factor;

According to the first clustering factor and the second clustering factor corresponding to the target detection element in each time window, the thermal clustering factor of the target detection element in each time window is obtained; the first clustering factor is negatively correlated with the thermal clustering factor; and the second clustering factor is positively correlated with the thermal clustering factor.

Furthermore, the method for obtaining the initial resistance correction coefficient includes:

Performing curve fitting on all the thermal aggregation factors corresponding to the current data of the target detection element at the target voltage to obtain a curve to be analyzed; the horizontal axis of the curve to be analyzed is time, and the vertical axis is the thermal aggregation factor;

Obtaining a thermal aggregation factor corresponding to the end of the to-be-analyzed curve corresponding to the minimum test voltage in the preset test voltage sequence as a standard thermal aggregation factor; obtaining a time when the to-be-analyzed curve corresponding to each test voltage reaches the standard thermal aggregation factor as a cutoff time;

Sorting all test voltages in ascending order to obtain a voltage sequence to be analyzed; taking the product of the square of each test voltage and the corresponding cut-off time as the energy factor of the target detection element at each test voltage; and obtaining a second sequence to be analyzed by sorting all energy factors in the same manner as the voltage sequence to be analyzed;

According to the fluctuation characteristics of the elements in the second sequence to be analyzed, an initial resistance correction coefficient of the target detection element is obtained.

Furthermore, the current correction coefficient must be subjected to Gaussian convolution smoothing processing.

Furthermore, the current correction coefficient is also normalized.

Furthermore, the preset test time length is at least 10 minutes.

The present invention has the following beneficial effects:

The present invention first obtains a two-dimensional distribution model of detection elements in a resistor array, so as to facilitate the subsequent analysis of the distribution characteristics of the detection elements; further, the test voltage is selected in turn as the target voltage in the preset test voltage sequence, and under a fixed preset infrared radiation, the current data of each detection element of the preset test time length is collected based on the target voltage to provide a data basis; further, any detection element is selected as the target detection element, so as to facilitate the subsequent analysis one by one; further, under the target voltage, the position factor of each detection element is obtained to characterize the distribution position of the detection element, so as to prepare for the subsequent correction of the energy aggregation characteristics of the detection element based on the distribution position of the detection element; further, the current data is segmented, so as to capture the local characteristics of the current data in more detail, and at the same time, the current data is segmented, which is also conducive to shortening the time. The amount of data analyzed each time is convenient for parallel calculation to improve the analysis efficiency; further obtain the energy aggregation parameters of the target detection element in each time window, characterize the energy aggregation characteristics of the target detection element in each time window, and prepare for the subsequent analysis of the thermal aggregation characteristics of the detection element; further fuse the position factor and energy aggregation parameter of the target detection element, correct the energy aggregation characteristics with the help of distribution characteristics, obtain the thermal aggregation factor, characterize the thermal aggregation situation of the target detection element, and prepare for the subsequent analysis of resistance influence and correction of current value; further obtain the initial resistance correction coefficient of the target detection element, characterize the influence of the initial resistance of the detection element on the current data, and provide more basis for correcting the current data; finally fuse the thermal aggregation factor and the initial resistance correction coefficient, correct the current data, and obtain the corrected current value. The present invention starts from two angles: the influence of the thermal aggregation effect on the detection element during long-term operation of the resistor array and the influence of the initial resistance of the detection element, eliminates the interference of the distribution position and initial resistance of the detection element, and obtains accurate current data.

BRIEF DESCRIPTION OF THE DRAWINGS

In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

FIG1 is a flow chart of a current measurement method for a resistor array driving process provided by an embodiment of the present invention;

FIG2 is a flow chart of a method for obtaining a heat aggregation factor provided by an embodiment of the present invention;

FIG. 3 is a schematic diagram of a target sample space provided by an embodiment of the present invention.

DETAILED DESCRIPTION

In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of the current measurement method for the resistor array driving process proposed by the present invention, its specific implementation method, structure, characteristics and effects in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

A specific scheme of a current measurement method for a resistor array driving process provided by the present invention is described in detail below with reference to the accompanying drawings.

Please refer to FIG. 1 , which shows a flow chart of a current measurement method for a resistor array driving process provided by an embodiment of the present invention, which specifically includes:

Step S1: obtain a two-dimensional distribution model of detection elements in the resistor array; select test voltages as target voltages in a preset test voltage sequence; under fixed preset infrared radiation, based on the target voltage, collect current data of each detection element for a preset test time length; select any detection element as a target detection element.

In an embodiment of the present invention, in order to analyze the influence of the distribution position of the detection elements in the resistor array on the thermal aggregation efficiency of the detection elements, the affected characteristics of the current value are finally analyzed, and the resistor array is usually distributed in two dimensions when acquiring an infrared image, so the two-dimensional distribution model of the detection elements in the resistor array is first obtained; in order to obtain test data for subsequent analysis steps, a test voltage sequence is first set, and under a fixed preset infrared radiation, all test voltages in the preset test voltage sequence are traversed, current data for a certain period of time is collected, and any detection element is selected as the target detection element for analysis one by one.

It should be noted that, in one embodiment of the present invention, the resistor array used is , each detection element is analogous to a pixel point, and the entire two-dimensional distribution model is analogous to The image of the pixel; the test voltage sequence is , in volts; the current acquisition frequency is 100 Hz, and the preset test time length is not less than 10 minutes, which is 10 minutes in one embodiment of the present invention. In other embodiments of the present invention, the implementer can adjust the test data settings by himself.

Step S2: Under the target voltage, according to the distribution characteristics of each detection element in the two-dimensional distribution model, obtain the position factor of each detection element; divide the current data to obtain the time window; according to the fluctuation characteristics of the current data of the target detection element, obtain the energy aggregation parameter of the target detection element in each time window; according to the position factor and energy aggregation parameter of the target detection element, obtain the thermal aggregation factor of the target detection element in each time window.

It should be noted that, for each test voltage, the method for analyzing the heat aggregation factor is the same, and only any target voltage is taken as an example here, and no further details are given.

In order to facilitate the subsequent analysis of the influence of the distribution position of the detection elements in the resistor array on the thermal aggregation efficiency of the detection elements, the position factor characterizing the distribution position of the detection elements is first obtained according to the distribution characteristics of each detection element in the two-dimensional distribution model.

Preferably, in one embodiment of the present invention, considering that when infrared radiation is projected onto the resistor matrix, the radiation energy is evenly dispersed on the resistor matrix, but long-term operation will cause the energy accumulation of the detection elements, causing changes in local temperature conditions, affecting the ability of the microresistor to receive infrared radiation, and the fewer detection elements around the detection element at the edge, the better the heat dissipation conditions, the greater the corresponding energy loss, and the energy loss of the detection elements at the four corners is the largest, so the position factor of each detection element is obtained based on the distance between each detection element and the center of the resistor array in the two-dimensional distribution model; the position factor is normalized; the distance between the detection element and the center of the resistor array in the two-dimensional distribution model is positively correlated with the position factor.

In one embodiment of the present invention, the calculation formula of the position factor includes:

;

in, Indicates the sequence number of the detection element; Indicates The position factor of each detector; Indicates The horizontal coordinate of each detection element; Indicates The vertical coordinate of each detection element; The abscissa represents the center of the resistor matrix; The ordinate represents the center of the resistor matrix; Indicates the maximum horizontal coordinate of all detection elements; The maximum ordinate of all detection elements; and Together they form the coordinates of the detection element in the upper right corner of the resistor matrix.

In the calculation formula of the position factor, since the resistance matrix used in the embodiment of the present invention is a square, the distances from the detection elements at the four outermost corners of the resistance matrix to the center of the resistance matrix are consistent and maximum, so by arbitrarily selecting the Euclidean distance between the coordinates of the detection element at one of the outermost corners and the center coordinates, the maximum distance can be obtained, which is used to normalize the distance from each detection element to the center of the resistance matrix; the larger the Euclidean distance between the coordinates of the detection element and the coordinates of the center of the resistance matrix, the closer the detection element is to the edge of the resistance matrix and the farther it is from the center, the larger the position factor.

It should be noted that in other embodiments of the present invention, the implementer may also set the position factor to be negatively correlated with the distance from the detection element to the center of the resistance matrix, that is, the closer the detection element is to the center of the resistance matrix, the larger the position factor. Correspondingly, when subsequently calculating the thermal aggregation factor, the position factor is negatively correlated with the edge position parameter, and the first aggregation factor of the target detection element is obtained based on the energy loss parameter and the edge position factor.

Considering that long-term current data contains various current change patterns of the whole world, it is easy to ignore the subtle changes of local current. Segmented analysis of current data can capture the local characteristics of current data more carefully and obtain characteristic parameters that can better represent local current data. The subsequent correction of current data of different segments also makes the corrected current data more accurate. At the same time, segmenting current data is also conducive to shortening the amount of data analyzed each time, facilitating parallel calculation and improving analysis efficiency, so the current data is divided according to the preset time window length.

In one embodiment of the present invention, the preset time window length is 0.5 seconds; in other embodiments of the present invention, implementers may also adjust the time window length by themselves.

After the current data is segmented, the energy aggregation parameters of the target detection element in each time window can be obtained according to the fluctuation characteristics of the current data of the target detection element, and the energy aggregation characteristics of the target detection element in each time window can be characterized to prepare for the subsequent analysis of the thermal aggregation characteristics of the detection element.

Preferably, in one embodiment of the present invention, considering that the longer the working time of the detection element is, the more heat is accumulated, the higher the temperature is, the greater the resistance is, and at the same time the voltage remains unchanged, so the current gradually decreases, therefore, from the current data, the characteristics of the current decrease are analyzed to obtain the energy concentration parameters;

Considering that the greater the range of the current data in the time window, and since the length of the time window is fixed, that is, the time length is constant, the greater the current change rate, the range of the current data in each time window is obtained as the first rate parameter to measure the severity of the current change. The first rate parameter is positively correlated with the energy aggregation parameter;

In order to facilitate the analysis of the current change characteristics of a time window and its adjacent windows in front of it in time sequence, according to the overall characteristics of the current data in each time window, the current representative value of the target detection element in each time window is obtained, the data is simplified, and the key values that can reflect the current change trend are extracted. Then, the current representative values corresponding to each time window and the preset first parameter time windows in front of it in time sequence form a first sequence to be analyzed; by analyzing the first sequence to be analyzed, the change pattern of the current over time can be captured, and the change trend of the current can be analyzed;

Based on this, according to the change characteristics of the current representative value in the first sequence to be analyzed corresponding to each time window, combined with the first rate parameter, the energy concentration parameter of the target detection element in each time window is obtained; the first rate parameter is positively correlated with the energy concentration parameter.

It should be noted that, in one embodiment of the present invention, the current representative value is the mean value of the current data in each time window, and the preset first parameter is 10, that is, the first sequence to be analyzed includes the time window and its 10 adjacent time windows in the front sequence. For example, the sequence number of a time window is 50, then the corresponding sequence number of the time window in the first sequence to be analyzed is [40, 50]; in other embodiments of the present invention, the implementer may also use the median instead of the average value as the current representative value, and may also use the average value and the median for weighted acquisition of the current representative value; the implementer may also set other preset first parameters.

Preferably, in one embodiment of the present invention, considering that the first-order difference sequence is obtained by the difference between every two adjacent elements in the first sequence to be analyzed, and the subtrahend is a current representative value with a larger sequence number, reflecting the change of the current representative value in adjacent time windows, the first-order difference can capture the rate of change of the current representative value, reveal the changing trend of the current between adjacent time windows, help identify the direction and amplitude of the current change, and reflect the dynamic characteristics of the current response.

Based on this, the first-order difference sequence of the first sequence to be analyzed corresponding to any time window of the target detection element is obtained; the energy concentration parameters are analyzed with the help of the first-order difference sequence, and the energy concentration parameters of the target detection element in the corresponding time window are obtained according to the change characteristics of the elements in the first-order difference sequence combined with the first rate parameter.

Preferably, in one embodiment of the present invention, considering that the more negative elements in the first-order difference sequence, the more obvious the current value decrease characteristic is, the second rate parameter is obtained according to the proportion characteristic of the negative elements in the first-order difference sequence to represent the direction of current change. The larger the second rate parameter is, the more obvious the current decrease characteristic is, the more obvious the resistance increase characteristic is, the more obvious the heat concentration effect is, and the second rate parameter is positively correlated with the energy concentration parameter.

Considering that the absolute value of an element represents the amplitude of the temperature data change in adjacent time windows, the absolute value of each element in the first-order difference sequence is taken. The larger the absolute value of the element, the larger the amplitude of change. Therefore, the absolute value of the element is positively correlated with the energy aggregation parameter.

According to the absolute value of each element in the first-order difference sequence, combined with the first rate parameter and the second rate parameter, the energy concentration parameter of the target detection element in the corresponding time window is obtained.

In one embodiment of the present invention, the calculation formula of the energy concentration parameter includes:

;

in, Indicates the sequence number of the detection element; Indicates the sequence number of the time window; Indicates The detector Energy aggregation parameters for each time window; Indicates The detector The range of the current data within a time window is also the first rate parameter; Indicates the preset first parameter, which is also the number of elements in the first-order difference sequence; Indicates The detector The number of negative elements in the first-order difference sequence corresponding to a time window; Indicates The detector A second rate parameter corresponding to a time window; Represents the sequence number of the element in the first-order difference sequence; Indicates The detector time window, the corresponding first-order difference sequence is The data value of the element; Indicates taking the absolute value.

In the calculation formula of energy concentration parameter, The larger the value, the greater the amplitude of the current data change in the time window. Because the detection element will accumulate heat during operation, the local temperature will rise, causing the resistance to increase. Under the condition of constant voltage, the current will show a downward trend. The larger it is, the greater the drop in current, which means more heat accumulation and greater energy concentration; The larger it is, the more negative elements there are in the first-order difference sequence, the more obvious the current decline trend is, and the greater the degree of energy concentration is; The larger the value is, the greater the change in the current representative value of the adjacent time window is, which means that the greater the current change is, the greater the degree of energy concentration is.

It should be noted that in other embodiments of the present invention, the implementer may also perform analysis without the help of a first-order difference sequence. For example, the standard deviation of the elements in the first sequence to be analyzed is obtained, and the similarity between the elements is reflected after negative correlation mapping, thereby characterizing the consistency of the changing trend of the current representative value in the first sequence to be analyzed. The range of the first sequence to be analyzed is obtained to characterize the amplitude of the changing trend. Therefore, based on the standard deviation and the range, the energy aggregation parameter can be obtained. The standard deviation is negatively correlated with the energy aggregation parameter, and the range is positively correlated with the energy aggregation parameter. The implementer may also perform analysis with the help of the slopes of adjacent elements in the first sequence to be analyzed. The smaller the slope, the more obvious the reduction feature of the current representative value and the greater the reduction amplitude. The implementer may also use other basic mathematical operations or function mappings to achieve correlation mapping, which are technical means well known to those skilled in the art and will not be elaborated here.

Among them, a positive correlation means that the dependent variable will increase as the independent variable increases, and the dependent variable will decrease as the independent variable decreases. The specific relationship can be a multiplication relationship, an addition relationship, or the power of an exponential function, which is determined by actual application; a negative correlation means that the dependent variable will decrease as the independent variable increases, and the dependent variable will increase as the independent variable decreases. It can be a subtraction relationship, a division relationship, etc., which is determined by actual application.

The position factor characterizes the distribution characteristics of the target detection element, and the energy concentration parameter characterizes the energy concentration characteristics of the target detection element in each time window. Therefore, after obtaining the position factor and the energy concentration parameter, the two can be fused to obtain the thermal concentration factor of the target detection element in each time window.

Preferably, in one embodiment of the present invention, the method for obtaining the heat aggregation factor includes:

Please refer to FIG. 2 , which shows a flow chart of a method for obtaining a heat aggregation factor provided by an embodiment of the present invention, which specifically includes:

Step S201: negatively correlate the energy concentration parameter to obtain the energy loss parameter; negatively correlate the position factor to obtain the center position parameter.

Taking into account that the closer the detection element is to the edge, the faster the energy loss is, the smaller the corresponding energy aggregation parameter is. In order to measure the energy loss characteristics, the energy aggregation parameter is negatively correlated and mapped to obtain the energy loss parameter, which provides a basis for the subsequent analysis of the thermal aggregation characteristics of the detection element. Similarly, the position factor characterizes the distribution characteristics of the detection element. The larger the position factor is, the closer the detection element is to the edge. Therefore, the center position parameter can be obtained after negative correlation mapping the position factor. The larger the center position parameter is, the closer the detection element is to the center of the resistor array. At this point, the energy loss parameter and position factor, energy aggregation parameter and center position parameter of the target detection element are obtained, which is convenient for the subsequent analysis of the thermal aggregation parameters of the detection element from the two perspectives of energy loss and energy aggregation.

Step S202: acquiring a first clustering factor of the target detection element according to the energy loss parameter and the position factor; the energy loss parameter and the position factor are both positively correlated with the first clustering factor.

Considering that the larger the energy loss parameter is, the greater the energy loss rate of the detection element is, and the slower the energy aggregation is; the larger the position factor is, the closer the detection element is to the edge, the easier it is to lose energy, and the slower the energy aggregation is. Therefore, according to the energy loss parameter and the position factor, the first aggregation factor of the target detection element is obtained. The first aggregation factor measures the thermal aggregation characteristics of the detection element from the perspective of energy loss. The energy loss parameter and the position factor are positively correlated with the first aggregation factor.

Step S203: acquiring a second clustering factor of the target detection element according to the energy clustering parameter and the center position parameter; the energy clustering parameter and the center position parameter are both positively correlated with the second clustering factor.

Considering that the larger the energy aggregation parameter is, the greater the energy aggregation rate of the detection element is, the faster the energy aggregation speed is, and the larger the center position parameter is, it reflects that the closer the detection element is to the center of the resistance matrix, the less likely the energy is to be lost, the more heat is accumulated, and the faster the aggregation speed is. Therefore, according to the energy aggregation parameter and the center position parameter, the second aggregation factor of the target detection element is obtained, and the thermal aggregation characteristics of the detection element are measured from the perspective of energy aggregation. The energy aggregation parameter and the center position parameter are positively correlated with the second aggregation factor.

Step S204: Obtain a thermal clustering factor of the target detection element in each time window according to the first clustering factor and the second clustering factor corresponding to the target detection element in each time window; the first clustering factor is negatively correlated with the thermal clustering factor; the second clustering factor is positively correlated with the thermal clustering factor.

The first clustering factor measures the thermal clustering characteristics of the detection element from the perspective of energy loss. The larger the first clustering factor, the faster the energy loss, the slower the energy aggregation, and the smaller the thermal clustering factor. The first clustering factor is negatively correlated with the thermal clustering factor. The second clustering factor measures the thermal clustering characteristics of the detection element from the perspective of energy aggregation. The larger the second clustering factor, the faster the energy aggregation speed, the larger the thermal clustering factor, and the second clustering factor is positively correlated with the thermal aggregation factor. The first clustering factor and the second clustering factor corresponding to the target detection element in each time window are fused to obtain the thermal clustering factor of the target detection element in each time window.

In one embodiment of the present invention, the calculation formula of the heat aggregation factor includes:

;

in, Indicates the sequence number of the detection element; Indicates The position factor of each detector; Indicates the sequence number of the time window; Indicates The detector Heat aggregation factor for each time window; Indicates The detector Energy aggregation parameters for each time window; Indicates The detector Energy loss parameters for each time window; Indicates The center position parameters of each detector.

In the calculation formula of the thermal aggregation factor, since the value range of the position factor is 0~1, the center position parameter is obtained by subtracting the position factor from 1; since the energy aggregation parameter is not normalized, but the energy aggregation parameter must be greater than or equal to zero, the inverse can be taken for negative correlation mapping. At the same time, in order to prevent the denominator from being zero, a constant 1 is added when the energy aggregation parameter is used as the denominator for negative correlation mapping.

It should be noted that in other embodiments of the present invention, the implementer may also use The negative correlation index can be used for negative correlation mapping, or the energy concentration parameter can be normalized and the energy loss parameter can be obtained by subtracting 1 from the energy concentration parameter. These are technical means well known to those skilled in the art and will not be described in detail here.

It should be noted that when the resistor array is running, the temperature of the detection element will definitely show an upward trend, but the upward trend of the detection elements at different positions is different, so the thermal aggregation factor must be positive; in other embodiments of the present invention, the implementer can also normalize the thermal aggregation factor.

All test voltages in the test voltage sequence are traversed to obtain test results of all test voltages, and the heat aggregation factor is obtained through analysis.

Step S3: Obtaining the initial resistance correction coefficient of the target detection element according to the variation characteristics of the thermal aggregation factor of the target detection element under different test voltages.

Step S2 calculates the thermal aggregation factor corresponding to each test voltage, but the ability to distinguish and correct the energy generated by the microresistor itself is still insufficient; because the higher the voltage, the higher the energy generated by the initial resistance, which further affects the local temperature, resulting in higher thermal radiation resistance, lower current value, and higher corresponding thermal aggregation factor, so the change characteristics of the thermal aggregation factor of the target detection element under different test voltages are analyzed to obtain the initial resistance correction coefficient of the target detection element, so as to facilitate the subsequent accurate correction of the current data.

Preferably, in one embodiment of the present invention, based on the electric energy formula , in the formula, Indicates electrical work, Indicates voltage, Represents resistance, Represents time. Since the real-time resistance of the real-time detection element is constantly changing, while the initial resistance is a fixed value, the more obvious the linear relationship between the energy generated by the initial resistance and the product of the square of the voltage and the time, the greater the thermal influence of the initial resistance. Therefore, when analyzing the linear change of voltage, the linearity of the time required to reach the same thermal aggregation factor and the product of the square of the voltage is greater, the greater the linearity is, the greater the influence of the initial resistance is, and the greater the initial resistance correction coefficient is. In order to facilitate the analysis of the time required to reach the same thermal aggregation factor, firstly, all thermal aggregation factors corresponding to the current data of the target detection element under the target voltage are curve fitted to obtain the curve to be analyzed. The horizontal axis of the curve to be analyzed is time, and the vertical axis is the thermal aggregation factor.

In one embodiment of the present invention, in order to facilitate analysis, all curves to be analyzed of the target detection element under all test voltages are placed in the same coordinate system to form a target sample space; please refer to Figure 3, which shows a schematic diagram of a target sample space provided by an embodiment of the present invention. In Figure 3, the horizontal axis is time, the vertical axis is the thermal aggregation factor, and the test voltages corresponding to the three curves are U1, U2 and U3, respectively, and U1<U2<U3.

Since the smaller the voltage, the smaller the power, and the lower the current drop rate, the thermal aggregation factor that can be achieved by the lowest test voltage is the smallest, so the thermal aggregation factor corresponding to the end of the to-be-analyzed curve corresponding to the minimum test voltage in the preset test voltage sequence is obtained as the standard thermal aggregation factor; the time corresponding to the to-be-analyzed curve corresponding to each test voltage reaching the standard thermal aggregation factor is obtained as the cutoff time;

In order to analyze the cut-off time changes caused by voltage changes, all test voltages are sorted in ascending order to obtain the voltage sequence to be analyzed, such as [ ]; the product of the square of each test voltage and the corresponding cut-off time is used as the energy factor of the target detection element at each test voltage; all energy factors are sorted in the same way as the voltage sequence to be analyzed to obtain the second sequence to be analyzed, for example [ ];

According to the fluctuation characteristics of the elements in the second sequence to be analyzed, the initial resistance correction coefficient of the target detection element is obtained.

In one embodiment of the present invention, considering that the smaller the variance of the absolute values of the differences between adjacent elements in the second sequence to be analyzed is, the more stable the differences between adjacent elements in the second sequence to be analyzed is, the more obvious the linearity of the product of the square of the voltage and the cut-off time is, and the greater the influence of the initial resistance is, the initial resistance correction coefficient is obtained by the variance of the absolute values of the differences between adjacent elements in the second sequence to be analyzed.

In other embodiments of the present invention, the implementer may also form a third sequence to be analyzed based on the absolute values of adjacent elements, and perform analysis based on the slopes of adjacent elements in the third sequence to be analyzed. The closer the overall slope is to zero, the more stable the elements in the third sequence to be analyzed, and the larger the initial resistance correction coefficient.

Step S4: According to the heat aggregation factor and the initial resistance correction coefficient, the current correction coefficient of the target detection element in each time window is obtained; the current data is corrected by the current correction coefficient to obtain a corrected current value.

The thermal aggregation factor includes the current data of the detection element and the distribution of the detection element, while the initial resistance correction coefficient includes the initial resistance influence characteristics of the detection element. Therefore, the two are further integrated to obtain the current correction coefficient of each time window, providing a basis for adaptive correction of current data.

Preferably, in one embodiment of the present invention, considering that the initial resistance correction coefficient is obtained by calculating the variance, the smaller the variance, the greater the initial resistance interference, the more heat generated by the initial resistance, and the real-time resistance increase rate is too fast, resulting in a too fast drop in current, and it is necessary to correct it in the direction of increasing current; and the larger the heat concentration factor, the more serious the heat concentration, which also causes the resistance to be too large, and the current also needs to be corrected in the direction of increasing current; therefore, the current correction coefficient is positively correlated with the heat concentration factor, and the current correction coefficient is negatively correlated.

In one embodiment of the present invention, the ratio of the heat concentration factor corresponding to each window of the target detection element to the current correction coefficient is used as the initial current correction coefficient. Considering that direct correction may cause the current on the detection element surface to be not smooth enough, a Gaussian convolution kernel is used for smoothing to obtain a smooth current correction coefficient, wherein the size of the Gaussian convolution kernel is , after normalizing the smoothed current correction coefficient after Gaussian convolution smoothing, the final current correction coefficient is obtained.

It should be noted that the use of Gaussian convolution kernels for Gaussian convolution smoothing and normalization is a well-known technical means for those skilled in the art, and will not be described in detail here. In other embodiments of the present invention, the initial resistance correction coefficient may also be used The negative correlation mapping function of the form of negative correlation mapping is performed, and then multiplied by the heat aggregation factor to obtain the initial current correction coefficient; other smoothing methods can also be used, such as window mean smoothing.

In one embodiment of the present invention, the calculation formula of the corrected current value includes:

;

in, Indicates the sequence number of the detection element; Indicates the sequence number of the time window; Indicates The detector Current correction factor for a time window; Indicates The detector The first Current data; Indicates The detector The first Current data, corresponding corrected current value.

In the calculation formula of the corrected current value, due to The value range of is between 0 and 1, so Minimum , up to 2 times In other embodiments of the present invention, the implementer may also add a range factor before the current correction factor, for example , used to adjust the correction range of current data.

In another embodiment of the present invention, taking into account the computational efficiency in practical applications, the detection element plane can be evenly divided, and the correction coefficient of the central detection element of each area is calculated. All current values of the entire area are corrected with the correction coefficient, and the number of detection elements in each divided area should be no less than 64.

In summary, in order to solve the technical problem that the non-uniformity correction result of the resistor array is not ideal in the prior art, the present invention proposes a current measurement method for the resistor array driving process. The present invention first obtains the two-dimensional distribution model of the detection element in the resistor array; under the fixed preset infrared radiation, the current data is collected at the target voltage; the position factor of each detection element is further obtained; the current data is further divided by the preset time window length; further according to the fluctuation characteristics of the current data of the target detection element, the energy aggregation parameter of the target detection element in each time window is obtained; further according to the position factor and energy aggregation parameter of the target detection element, the thermal aggregation factor of the target detection element in each time window is obtained; further according to the change characteristics of the thermal aggregation factor of the target detection element under different test voltages, the initial resistance correction coefficient of the target detection element is obtained; further according to the thermal aggregation factor and the initial resistance correction coefficient, the current correction coefficient of the target detection element in each time window is obtained; finally, the corrected current value is obtained according to the current correction coefficient and the current data. The present invention starts from the two angles of the influence of the thermal aggregation effect on the detection element during the long-term operation of the resistor array and the initial resistance difference of the detection element, eliminates the interference of the different distribution positions and initial resistances of the detection elements, and obtains accurate current data.

It should be noted that the sequence of the above embodiments of the present invention is only for description and does not represent the advantages and disadvantages of the embodiments. The processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

Claims (6)

1. A method for current measurement in a resistor array driving process, the method comprising:

Acquiring a two-dimensional distribution model of the detecting elements in the resistor array; sequentially selecting a test voltage from a preset test voltage sequence as a target voltage; collecting current data of a preset test time length of each detecting element based on the target voltage under fixed preset infrared radiation; selecting any detecting element as a target detecting element;

Acquiring a position factor of each detecting element according to the distribution characteristic of each detecting element in the two-dimensional distribution model under the target voltage; dividing the current data according to the length of a preset time window, wherein the time domain range corresponding to each segment of segmented current data is used as a time window; according to the fluctuation characteristics of the current data of the target detection element, acquiring the energy aggregation parameters of the target detection element in each time window; acquiring a heat aggregation factor of the target detecting element in each time window according to the position factor and the energy aggregation parameter of the target detecting element;

acquiring an initial resistance correction coefficient of the target detecting element according to the change characteristics of the heat aggregation factor of the target detecting element under different test voltages;

Acquiring a current correction coefficient of the target detecting element in each time window according to the thermal aggregation factor and the initial resistance correction coefficient; correcting the current data through the current correction coefficient to obtain a corrected current value;

The method for acquiring the position factor comprises the following steps:

Acquiring a position factor of each detecting element according to the distance between each detecting element and the center of the resistor array in the two-dimensional distribution model; the position factors are subjected to normalization processing; the distance between the detecting element and the center of the resistor array in the two-dimensional distribution model is positively correlated with the position factor;

The method for acquiring the energy aggregation parameter comprises the following steps:

Acquiring a current representative value of the target detecting element in each time window according to the integral characteristics of the current data in each time window; obtaining the extremely poor current data in each time window as a first rate parameter;

Forming a first sequence to be analyzed by each time window and the current representative value corresponding to the time window of the preset first parameter with the front time sequence;

According to the change characteristics of the current representative value in the first sequence to be analyzed corresponding to each time window, combining the first speed parameter to obtain the energy aggregation parameter of the target detecting element in each time window; the first rate parameter and the energy aggregation parameter are positively correlated;

the method for acquiring the heat aggregation factor comprises the following steps:

Acquiring a first aggregation factor of the target detection element according to the energy aggregation parameter and the position factor; the energy aggregation parameter is inversely related to the first aggregation factor; the location factor is positively correlated with the first aggregation factor;

acquiring a second aggregation factor of the target detection element according to the energy aggregation parameter and the position factor; the energy aggregation parameter is positively correlated with the second aggregation factor; said location factor being inversely related to said second aggregation factor;

Acquiring a thermal aggregation factor of the target detecting element in each time window according to the first aggregation factor and the second aggregation factor of the target detecting element in each time window; the first aggregation factor is inversely related to the thermal aggregation factor; the second aggregation factor is positively correlated with the thermal aggregation factor;

The method for acquiring the initial resistance correction coefficient comprises the following steps:

Performing curve fitting on all the heat aggregation factors corresponding to the current data of the target detection element under the target voltage to obtain a curve to be analyzed; the horizontal axis of the curve to be analyzed is time, and the vertical axis is a heat aggregation factor;

acquiring a heat aggregation factor corresponding to the tail end of a curve to be analyzed corresponding to the minimum test voltage in the preset test voltage sequence as a standard heat aggregation factor; acquiring the time when the curve to be analyzed corresponding to each test voltage reaches the standard heat aggregation factor as the cut-off time;

Sequencing all the test voltages in ascending order to obtain a voltage sequence to be analyzed; taking the product of the square of each test voltage and the corresponding cut-off time as an energy factor of the target detecting element at each test voltage; all the energy factors are utilized in the same sequencing mode of the voltage sequence to be analyzed, and a second sequence to be analyzed is obtained;

And acquiring an initial resistance correction coefficient of the target detection element according to the fluctuation characteristics of the elements in the second sequence to be analyzed.

2. A current measurement method for use in a resistor array driving process according to claim 1, wherein the energy aggregation parameter calculation method comprises:

acquiring a first-order differential sequence of the first sequence to be analyzed corresponding to any time window of the target detection element;

And according to the change characteristics of the elements in the first-order differential sequence, combining the first rate parameters, and acquiring the energy aggregation parameters of the target detection element in the corresponding time window.

3. The method for measuring current in a resistor array driving process according to claim 2, wherein the method for acquiring the energy aggregation parameter of the target detector in the corresponding time window according to the variation characteristics of the elements in the first-order differential sequence and in combination with the first rate parameter comprises:

acquiring a second rate parameter according to the proportion characteristic of the negative value element in the first-order differential sequence;

Taking an absolute value of each element in the first-order differential sequence; according to the absolute value of each element in the first-order differential sequence, combining the first rate parameter and the second rate parameter to obtain the energy aggregation parameter of the target detection element in a corresponding time window; the absolute value of each element in the first order differential sequence and the second rate parameter are positively correlated with the energy aggregation parameter.

4. A current measurement method for use in a resistor array driving process according to claim 1, wherein the current correction factor is subjected to gaussian convolution smoothing.

5. A current measurement method for use in a resistor array driving process according to claim 1, wherein the current correction factor is further normalized.

6. A current measurement method for use in a resistor array driving process according to claim 1, wherein the predetermined test time period is at least 10 minutes.