CN117147550A - Device, chip and method for detecting and analyzing formed component with verticality adjustment - Google Patents

Abstract

In the device, the chip and the method for detecting and analyzing the formed component with the verticality adjustment, the bearing component is used for bearing the detection chip; the bearing assembly comprises a verticality adjusting assembly and a bearing platform; the detection control component comprises a physical object detection analysis component; the image acquisition module acquires a perpendicularity evaluation microscopic image; the perpendicularity adjustment control component is used for analyzing the perpendicularity evaluation microscopic image and evaluating whether the perpendicularity is qualified or not; if the verticality is qualified, detecting a tangible object; if the perpendicularity is unqualified, the perpendicularity adjustment control component controls the perpendicularity adjustment component to adjust the perpendicularity of the bearing platform and the camera module. By utilizing the microscopic imaging technology, the perpendicularity of the bearing platform and the camera shooting assembly is adjusted by forming an adjusting surface through three adjusting points capable of adjusting the height of the bearing platform, and the accuracy and consistency of image acquisition in the subsequent forming component detection process can be improved.

Description

Device, chip and method for detecting and analyzing formed component with verticality adjustment

Technical Field

The application belongs to the technical field of forming component analysis based on microscopic amplified images, and particularly relates to a forming component detection analysis method, a forming component detection analysis device and a forming component detection analysis chip with perpendicularity adjustment function for adjusting perpendicularity between a chip and a microscopic imaging component in forming component detection analysis.

Background

In the technology of forming analysis based on microscopic amplified images, a forming analysis chip containing a detection sample is kept horizontal. In the process of forming microscopic imaging, the microscopic imaging component and the forming microscopic detection analysis chip need to be kept perpendicular and orthogonal to ensure the accuracy and consistency of acquiring microscopic images. If the microscopic imaging component and the formed component detection analysis chip cannot keep orthogonal vertical, even slight inclination which cannot be recognized by naked eyes can cause the imaging positions of pictures of different areas of the chip to be different. The larger the magnification of microscopic imaging, the greater the effect of tilting.

Therefore, in the initial stage of the analysis of the formed components, a method is required to adjust the perpendicularity between the microscopic imaging component and the formed component detection analysis chip, so as to ensure that the microscopic imaging component and the formed component detection analysis chip can maintain the perpendicularity as much as possible.

Disclosure of Invention

In the application, the applicant provides a formed component detection analysis device, a chip and a method with verticality adjustment, which can be used for analyzing and evaluating whether verticality is qualified or not based on a obtained verticality evaluation microscopic image; the perpendicularity between the microscopic imaging component and the formed component detection analysis chip is ensured to be in a set range, and the accuracy and consistency of image acquisition in the subsequent formed component detection process can be improved.

The technical scheme for solving the technical problems is that the device comprises a detection control component, a formed component detection component, a camera shooting component, a bearing component and a detection chip, wherein the formed component detection analysis device is provided with verticality adjustment; the camera shooting assembly comprises a camera shooting module; the formed component detection assembly comprises an image acquisition module and a verticality adjustment control assembly; the bearing component is used for bearing the detection chip; the bearing assembly comprises a verticality adjusting assembly and a bearing platform; the detection control component comprises a physical object detection analysis component; the detection chip comprises a sample accommodating cavity to be detected, and the detection sample accommodating cavity is used for accommodating the sample to be detected; the camera module is used for shooting an image of a sample to be detected in the sample accommodating cavity; the image acquisition module acquires an image shot by the camera module; the formed component detection assembly comprises a verticality adjustment control assembly; the image acquisition module acquires a perpendicularity evaluation microscopic image; the perpendicularity adjustment control component is used for analyzing the perpendicularity evaluation microscopic image and evaluating whether the perpendicularity is qualified or not; if the verticality is qualified, detecting a tangible object; if the perpendicularity is unqualified, the perpendicularity adjustment control component controls the perpendicularity adjustment component to adjust the perpendicularity of the bearing platform and the camera module.

The formed component detection assembly further comprises an XY movement control assembly, the bearing assembly comprises an XY movement assembly, the XY movement control assembly outputs a driving signal to the XY movement assembly, and the XY movement assembly drives the detection chip to move along the X direction or the Y direction on the horizontal plane; the camera shooting assembly comprises a sliding table module, and the sliding table module adjusts the distance between the camera shooting module and the detection chip.

The bearing assembly comprises a horizontal sensing assembly, the horizontal sensing assembly comprises a horizontal sensor, and the horizontal sensor can detect the levelness of the bearing assembly; the level sensor is a 3-axis acceleration sensor.

The verticality adjusting assembly comprises 3 or more adjusting devices, and the adjusting devices support the bearing platform.

The adjusting device comprises a screw rod and a screw rod nut, the bearing platform is coupled with the screw rod nut, and the perpendicularity of the bearing platform can be adjusted by rotating the screw rod; the adjusting device comprises a power device, and a shaft of the power device is mechanically coupled with the rotating screw rod; the power device is a stepping motor or an ultrasonic motor; the formed component detection assembly comprises a focusing control module, wherein the focusing control module controls the running of the power device to control the distance between the camera shooting module and the detection chip.

The adjusting device comprises a base and a supporting screw; the supporting screw supports the bearing platform, and the perpendicularity of the bearing platform can be adjusted by rotating the screw.

The technical scheme for solving the technical problems can also be that the formed component detection chip suitable for verticality adjustment comprises a cavity for accommodating a detection sample, wherein 3 or more marks are distributed on the cavity, the marks are used for verticality detection in an imaging detection process, and in the detection process, a camera obtains the distribution position and the size of the marks on the left and the right or the upper and the lower sides of a picture through shooting the image, and the verticality in the imaging process is judged.

The formed component detection chip suitable for verticality adjustment comprises any one of the following technical characteristics: technical characteristics A1: the mark is positioned on the lower surface of the inner part of the cavity; technical characteristics A2: the mark is positioned on the upper surface of the cavity; technical characteristics A3: the mark is positioned on the upper surface outside the cavity; technical characteristics A4: the mark is positioned on the lower surface outside the cavity.

The shape of the mark is round, triangle, square or pentagram.

The marks are distributed in an array.

The technical scheme for solving the technical problems can also be a formed component detection analysis method with verticality adjustment, which comprises any one of the following characteristics: step 10: shooting an image of a formed component detection chip suitable for verticality adjustment to obtain a verticality evaluation microscopic image; step 20: analyzing the perpendicularity evaluation microscopic image, and evaluating whether the perpendicularity is qualified or not; step 30: if the verticality is qualified, detecting the tangible component; step 40: and if the verticality is unqualified, performing verticality adjustment.

The method for detecting and analyzing the formed component with the verticality adjustment further comprises the following steps of 41: if the number of verticality adjustment times exceeds the setting, the verticality adjustment fails.

The method for detecting and analyzing the formed component with the verticality adjustment further comprises the following steps of: and detecting levelness, and if the levelness exceeds the setting, failing to adjust verticality.

In step 20, whether the verticality is qualified is determined by detecting the distribution form or definition of the formed components in the formed component detection chip suitable for verticality adjustment.

In step 20, whether the verticality is qualified or not is judged by detecting the distribution of the shot red blood cell image and the size of the red blood cell.

In step 20, whether the verticality is qualified or not is judged by detecting the distribution and the size of a reference particle image in the shot particle-containing solution.

The reference particles are floating particles or the reference particles are bottom particles.

In step 20, whether the verticality is qualified is determined by detecting the sizes of two or more marking points arranged on the component detection chip suitable for verticality adjustment.

The technical effect 1 of the technical scheme is that: before the detection of the physical object, the verticality is evaluated and adjusted, so that the detection of the physical element is ensured under the condition that the verticality meets the expectation. The method avoids the image forming deviation caused by the verticality deviation, ensures the consistency of subsequent images, and is the basis for subsequent image related calculation.

The technical effect 2 of the technical scheme is as follows: the XY moving assembly drives the detection chip to move along the X direction or the Y direction on the horizontal plane, so that the verticality detection can be started at any point of the XY plane.

The technical effect 3 of the technical scheme is that: the levelness of the bearing assembly can be sensed by the level sensing assembly, so that the perpendicularity adjustment is carried out on the basis of reasonable levelness, and the phenomenon that the levelness of the tangible object detection chip is lost due to the fact that the perpendicularity is adjusted is avoided. And the problem that a physical object detection chip loses levelness and a suspension sample possibly overflows is solved.

The technical effect 4 of the technical scheme is that: the perpendicularity adjusting component comprises 3 or more than 3 adjusting devices, a supporting plane is formed at 3 points, and perpendicularity between the plane of the bearing platform and the camera module can be adjusted.

The technical effect 5 of the technical scheme is as follows: the integral adjustment of the supporting plane can adjust the distance between the supporting plane and the camera module, and the imaging focal length is actually adjusted, so that the complexity of the focusing mechanism is reduced.

The technical effect 6 of the technical scheme is that: the stepping motor drives the screw rod to mechanically couple for adjustment, so that the manual adjustment can be exceeded, and the electric control fine adjustment is realized.

The technical effect 7 of the technical scheme is as follows: a base and a support screw; the perpendicularity of the bearing platform can be adjusted by rotating the screw, a convenient low-cost manual adjustment means is provided, and manual adjustment can be performed with low cost under the condition that the perpendicularity requirement is not high.

The technical effect 8 of the technical scheme is that: the perpendicularity is adjusted by distributing 3 or more marks on the cavity of the formation component detection chip, the marks are used for detecting perpendicularity in the imaging detection process, and in the detection process, a camera obtains the positions and the sizes of the marks distributed on the left and right or up and down of a picture through shooting an image, so that the perpendicularity in the imaging process is judged. The integration of the mark on the chip allows for standard references for perpendicularity adjustment, and the recognizability of the mark makes perpendicularity adjustment easier. Without the fiducial mark as a reference, the adjustment may be repeated and not quickly return to the desired perpendicularity adjustment range.

The technical effect 9 of the technical scheme is that: the mark is located the inside lower surface of cavity, inside upper surface, outside upper surface and outside lower surface, makes the chip type that can be used to the straightness adjustment more complete, and the mark can be according to the target demand of straightness adjustment, sets up in more convenient more suitable position.

The technical effect 10 of the technical scheme is as follows: the marks have various shapes, so that the marks with different shapes can be conveniently identified, and the marks with different shapes can be arranged at different positions in the same chip, so that the marks are conveniently identified in the perpendicularity adjusting process, and confusion caused by similar marks is avoided.

The technical effect 11 of the technical scheme is as follows: the marks are distributed in an array, namely a regular array distribution, so that the characteristics of the mark distribution can be used for verticality adjustment.

The technical effects 12 of the technical scheme are as follows: the method for detecting and analyzing the formed components with verticality adjustment comprises the steps of firstly evaluating and adjusting verticality before detecting the formed components, and ensuring that the formed components are detected under the condition that the verticality accords with the expected verticality. The method avoids the image forming deviation caused by the verticality deviation, ensures the consistency of subsequent images, and is the basis for subsequent image related calculation. If image acquisition and analysis are performed because the perpendicularity is not in line with expectations, image errors caused by the perpendicularity deviation are introduced into subsequent calculation, so that the deviation of the subsequent calculation is caused.

The technical effect 13 of the technical scheme is that: the number of times of perpendicularity adjustment sets an upper limit, unlimited perpendicularity adjustment is avoided, namely perpendicularity adjustment is controlled within a certain interval range, larger reference perpendicularity is ensured by mechanical design, and the adjustment is not ensured by the fine adjustment mechanism, so that the operation efficiency of the whole system and the device is ensured.

The technical effects 14 of the technical scheme are as follows: the levelness exceeds the setting, the verticality adjustment fails, the verticality adjustment is ensured to be carried out on the basis of reasonable levelness, and the phenomenon that the levelness of the setting range of the tangible object detection chip is lost due to the adjustment of the verticality is avoided. And the problem that a physical object detection chip loses levelness and a suspension sample possibly overflows is solved.

The technical effect 15 of the technical scheme is as follows: the perpendicularity evaluation microscopic image is analyzed, and besides the perpendicularity recognition and judgment are performed by utilizing the definition of the perpendicularity evaluation microscopic image, the perpendicularity judgment can be performed by utilizing the distribution form of the formed components in the perpendicularity evaluation microscopic image. In particular, the sample with higher density of formation components is more easily identified on the blood, and the distribution characteristics are better identifiable than the definition.

The technical effects 16 of the technical scheme are as follows: the test sample is blood, and the perpendicularity can be adjusted before the physical sample test is performed.

The technical effect 17 of the technical scheme is that: the detection sample is a particle-containing solution, the perpendicularity can be adjusted through reference particles in the particle-containing solution, and the size and the shape of the reference particles are relatively more fixed, so that the perpendicularity adjustment is facilitated. The reference particles can float or sink more conveniently for focusing, and the adjustment efficiency is improved.

The technical effects 18 of the technical scheme are as follows: the sizes of two or more marks can be intuitively and rapidly judged, so that the recognition in the perpendicularity adjustment process is convenient, and the adjustment efficiency is improved.

Drawings

FIG. 1 is a schematic functional block diagram of a component detection and analysis device with verticality adjustment;

FIG. 2 is a schematic functional block diagram of a component detection and analysis device with verticality adjustment;

FIG. 3 is a functional block diagram of a component detection and analysis device with verticality adjustment;

FIG. 4 is a schematic diagram of a device for detecting and analyzing a formed component with verticality adjustment;

FIG. 5 is a schematic view of a device for detecting and analyzing a formed component with verticality adjustment;

FIG. 6 is a schematic top view of a component-containing analytical chip and carrier platform;

FIG. 7 is a schematic side cross-sectional view of a component detection analysis chip and a carrier platform;

FIG. 8 is a schematic view of an electrically-powered adjustment of the perpendicularity of a load-bearing platform;

FIG. 9 is a schematic top view of a component-containing analytical chip and carrier platform; in the figure, reference numeral 100 is a carrying platform, and reference numeral 200 is a component detection and analysis chip;

FIG. 10 is a schematic side view of a chip with a component detection analysis; reference numeral 210 in the figure is a cavity with a component detection analysis chip;

FIG. 11 is a schematic top view of a component-containing detection and analysis chip and a carrier platform; in the figure, reference numeral 100 is a carrying platform, and reference numeral 200 is a component detection and analysis chip; reference numeral 220 denotes a mark or a flag bit on the formed component detection analysis chip;

FIG. 12 is a schematic top view of a chip with a component detection analysis; reference numeral 200 in the figure indicates a component detection and analysis chip; reference numeral 230 is an identification array on the formed component detection analysis chip;

FIG. 13 is a flow chart of a method of detecting and analyzing a formed component with verticality adjustment;

FIG. 14 is a flow chart of a method of detecting and analyzing a formed component with verticality adjustment;

FIG. 15 is a flow chart of a method of detecting and analyzing a formed component with verticality adjustment;

FIG. 16 is a schematic view of a device for detecting and analyzing a formed component with verticality adjustment.

Detailed Description

The present application is described in further detail below with reference to the accompanying drawings.

The following description of the preferred embodiments of the present application is not intended to limit the present application. The description of the preferred embodiments of the present application is merely illustrative of the general principles of the application. The embodiments described in this disclosure are only some, but not all, embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.

In the description of the present application, it should be understood that the terms "center," "longitudinal," "transverse," "length," "width," "thickness," "up," "down," "front," "back," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," etc. indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings are merely for convenience in describing the present application and to simplify the description, and do not indicate or imply that the device or element being referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present application. Furthermore, the terms "first," "second," and technical features numbered with numerals such as Arabic numerals 1,2,3, etc., and such numbers as "A" and "B" are used for descriptive purposes only and are not intended to represent a temporal or spatial sequential relationship for ease of illustration; and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, features defining "first", "second", and numbered with numerals 1,2,3, etc., may explicitly or implicitly include one or more such features. In the description of the present application, the meaning of "a number" is two or more, unless explicitly defined otherwise. The letter and number combinations "TA", "TB", "H" referred to in this application are for convenience of description only, and the specific meaning is determined by the specific vocabulary referred to.

As shown in fig. 1 to 5, an embodiment of a component detection and analysis device with verticality adjustment includes a detection control component, a component detection component, a camera component, a bearing component, and a detection chip; the camera shooting assembly comprises a sliding table module and a camera shooting module; the formed component detection assembly comprises a focusing control module and an image acquisition module; the detection chip comprises a sample accommodating cavity to be detected, and the detection sample accommodating cavity is used for accommodating the sample to be detected; the slipway module adjusts the distance between the camera module and the detection chip; the camera module is used for shooting an image of a sample to be detected in the sample accommodating cavity; the focusing control module controls the sliding table module to adjust the distance between the camera shooting module and the detection chip; the image acquisition module acquires an image shot by the camera module; the bearing component is used for bearing the detection chip; the bearing assembly comprises a verticality adjusting assembly; the detection control component comprises a component detection analysis component and a verticality adjustment control component. The detection control component comprises a physical object detection analysis component; the formed component detection assembly comprises a verticality adjustment control assembly; the image acquisition module acquires a perpendicularity evaluation microscopic image; the perpendicularity adjustment control component is used for analyzing the perpendicularity evaluation microscopic image and evaluating whether the perpendicularity is qualified or not; if the verticality is qualified, detecting a tangible object; if the perpendicularity is unqualified, the perpendicularity adjustment control component controls the perpendicularity adjustment component to adjust the perpendicularity of the bearing platform and the camera module.

The orthogonality or verticality between the microscopic imaging component and the formed component detection analysis chip refers to the orthogonality between the imaging optical path of the microscopic imaging component and the formed component detection analysis chip. As shown in fig. 4 and 5, the imaging optical path of the microscopic imaging assembly may be directly orthogonal to the formed component detection analysis chip. As shown in fig. 16, the imaging optical path of the microscopic imaging component may be adjusted by a mirror or a half mirror and then orthogonalized with the component detecting and analyzing chip. The imaging module in the present application includes the imaging modules in fig. 4, 5 and 16, and the purpose of the present application is to control the orthogonality between the light outputted from the imaging light path of the imaging module and the component-containing detection analysis chip.

As shown in fig. 4 to 5, the verticality adjustment control component adjusts the verticality between the bearing platform and the camera module. The camera module itself may be arranged generally in a direction perpendicular to the horizontal plane. The perpendicularity between the bearing platform and the camera module is adjusted only by adjusting the bearing platform, and the camera module is not adjusted.

The perpendicularity evaluation microscopic image is a microscopic magnified image obtained by the camera module. And carrying out perpendicularity evaluation microscopic image analysis according to the magnification and perpendicularity requirements of an actual microscopic imaging system. Specifically, the method can comprise the step of carrying out definition analysis of the perpendicularity evaluation microscopic image. And setting specific requirements of image definition analysis according to the target of verticality adjustment.

In some scenes with less high precision requirements, for example, when the precision requirement of the height difference is more than 3um, the perpendicularity can be judged by naked eyes to evaluate the definition of the microscopic image. Namely, when the minimum distance of the inclination of the bearing platform relative to the horizontal plane is more than 3um, the definition of the microscopic image can be judged by means of a machine or manually when the definition analysis of the perpendicularity evaluation microscopic image is carried out.

In some scenes with higher precision requirements, for example, when the precision requirement of the height difference is between 0.5 and 3um, that is, when the minimum distance of the inclination of the bearing platform relative to the horizontal plane is between 0.5 and 3um, the definition evaluation of the perpendicularity evaluation microscopic image can be performed through a machine.

The sharpness evaluation of the microscopic image is carried out through the machine, the image sharpness evaluation function can be utilized to focus and shoot pictures from top to bottom with a fixed step number, and a focusing sharpness curve table is made; finding the image position of an ideal horizontal plane, taking a definition function value interval corresponding to the up and down + -X steps, for example, when X-MAX-X is taken, taking the X-MAX or MAX-X interval as the position of the interval with definition conforming to the setting. When the perpendicularity adjusting assembly in the bearing assembly is adjusted, an image is acquired while adjustment is carried out, definition evaluation of the acquired image is carried out, definition of the image is acquired, and in a set definition interval, the image is considered to be clear and is in a focusing state, and the perpendicularity adjusting assembly is adjusted in place. In some embodiments, the depth of field of the microscope objective with 40 times magnification is about 3um deep, 16 steps of the Z axis corresponds to 1um, one step is 0.0625um, and the number of fine focusing fixed steps is 8 steps, namely 0.5um, so that finer definition evaluation can be performed.

In the embodiment with the forming component detecting and analyzing device with verticality adjustment as shown in fig. 2 to 3 and fig. 4 to 5, the forming component detecting component further includes an XY moving control component, the bearing component includes an XY moving component, the XY moving control component outputs a driving signal to the XY moving component, and the XY moving component drives the detecting chip to move along the X direction or the Y direction on the horizontal plane. The XY moving assembly drives the detection chip to move in the X direction or the Y direction, so that the camera module can obtain microscopic amplified images of different positions of the chip, and the perpendicularity between the microscopic imaging assembly and the formed component detection analysis chip can be adjusted only by moving in one direction of the Z axis.

In the embodiment of the component detection and analysis device with verticality adjustment, as shown in fig. 3, the carrying assembly comprises a level sensing assembly, and the level sensing assembly comprises a level sensor capable of detecting the levelness of the carrying assembly. The level sensor may be a 3-axis acceleration sensor or other types of levelness sensors. The perpendicularity of the bearing platform and the camera module is adjusted by the perpendicularity adjusting control component. The perpendicularity between the bearing platform and the camera module is adjusted only by adjusting the bearing platform, and the camera module is not adjusted. However, if the camera module is already very inclined, if the bearing platform is adjusted to be perpendicular to the camera module, the levelness of the bearing platform exceeds a certain degree, which can cause serious loss of the level of the detection chip, and even if the bearing platform can keep perpendicular to the camera module, other problems such as overflow of suspension with components in the chip can be caused, so that the upper limit of the levelness needs to be controlled.

As shown in fig. 6 to 9, in the embodiment with the component detecting and analyzing device for verticality adjustment, the verticality adjustment assembly includes 3 or more adjusting devices, and the adjusting devices support the carrying platform. The adjusting device comprises a base and a supporting screw; the supporting screw supports the bearing platform, and the perpendicularity of the bearing platform can be adjusted by rotating the screw.

In the embodiment with the component detecting and analyzing device with verticality adjustment shown in fig. 6 and 8, the verticality adjustment assembly comprises 3 or more adjusting devices, and the adjusting devices support the carrying platform.

In the embodiment with the component detecting and analyzing device with verticality adjustment shown in fig. 7, the adjusting device is a 3-group nut and screw structure arranged in the vertical direction, and the side view cross-sectional schematic diagram in fig. 7 only shows 2-group nut and screw structures, and the flatness between 3 points is adjusted by adjusting the depths of 3 screws.

In the embodiment of the verticality adjusting apparatus with the formation component detection and analysis device shown in fig. 8, the bearing platform adjusts the verticality electrically. The adjusting device comprises a screw rod and a screw rod nut, the bearing platform is coupled with the screw rod nut, and the perpendicularity of the bearing platform can be adjusted by rotating the screw rod. The adjusting device comprises a stepping motor, and the shaft of the stepping motor is mechanically coupled with the rotating screw rod.

As shown in fig. 6, in the embodiment of the component detection chip with the perpendicularity adjustment, the component detection chip with the perpendicularity adjustment comprises a cavity for accommodating a detection sample, 3 or more marks are distributed on the cavity, the marks are used for detecting the perpendicularity in the imaging detection process, and in the detection process, a camera obtains the distribution position and the size of the marks on the left side, the right side, the upper side and the lower side of a picture through shooting images, and the perpendicularity in the imaging process is judged. Analysis of the perpendicularity evaluation microscopic image the sharpness of the perpendicularity evaluation microscopic image may be analyzed. If the 3 marks can be clearly displayed in the perpendicularity evaluation microscopic image, the perpendicularity of the formed component detection chip and the camera module, which are suitable for perpendicularity adjustment, is consistent with expectations.

In addition to analyzing the sharpness of the perpendicularity evaluation microscopic image, the marker distribution locations in the perpendicularity evaluation microscopic image may also be analyzed. The size in the microscopy image can also be evaluated for perpendicularity. If the deviation between the distribution positions of the 3 marks and the expected positions is larger than the set deviation maximum value, the verticality of the formed component detection chip, namely the bearing platform and the camera module, which is suitable for verticality adjustment is considered to be inconsistent with the expected value; on the contrary, the deviation between the distribution positions of the 3 marks and the expected positions is smaller than the set deviation maximum value, and the verticality of the formed component detection chip suitable for verticality adjustment, namely the bearing platform and the camera module, can be considered to meet the expected.

In addition to analyzing the sharpness of the perpendicularity evaluation microscopic image, the size in the perpendicularity evaluation microscopic image may also be analyzed. If the sizes of the 3 marks and the expected sizes are larger than the set deviation maximum value, the perpendicularity of the formed component detection chip, namely the bearing platform and the camera module, which is suitable for perpendicularity adjustment is not in accordance with the expected value; on the contrary, the deviation between the size of the 3 marks and the expected size is smaller than the set deviation maximum value, and the verticality of the formed component detection chip suitable for verticality adjustment, namely the bearing platform and the camera module, can be considered to meet the expected.

As shown in fig. 6 and fig. 9 to fig. 12, an embodiment of a component detection chip suitable for verticality adjustment includes a cavity for accommodating a detection sample, and 3 or more marks are distributed on the cavity, and the marks are used for detecting verticality in an imaging detection process.

Referring to fig. 6, in an embodiment of a component detection chip with a squareness adjustment function, the chip is marked with three marking points, and reference numerals 1,2, and 3 respectively, and the chip may have a single-layer structure without a space for containing a liquid sample, or may have a multi-layer structure with a space for containing a liquid sample. The marks carried by the chip are marks which can be identified under a microscope, and the marks comprise concave marks, convex marks, printing ink and other mark forms; whether the bearing platform is horizontal relative to the center of the camera shooting assembly can be judged by observing the imaging definition of particles at different points. At least 3 different positions on the bearing platform can form adjusting points of the adjusting surface.

As shown in fig. 6, a and B, C are adjusting sites for adjusting the levelness of the bearing platform, and at least 3 points can form an adjusting surface. After the chip is placed in the bearing platform, the chip can move synchronously along with the movement of the bearing platform.

In a specific embodiment of the method for detecting and analyzing the formed component with verticality adjustment, the positions of three mark points on the chip are defined first, namely, the position corresponding to the mark 1 is the position corresponding to the chip A (green), namely, the position corresponding to the mark 2 is the position corresponding to the chip B (yellow), namely, the position corresponding to the mark 3 is the position corresponding to the chip C (red). The device is used for adjusting the point A, the point B and the point C on the bearing platform; the short straight line level of the point of the chip position B and the point of the chip position C is leveled firstly, and then the long straight line level between the chip position A and the chip position BC is leveled, and at the moment, the chip position A, the chip position B and the chip position C are positioned on the same horizontal plane.

As shown in fig. 6, corresponding to the chip position a, the chip position B and the chip position C, corresponding adjusting devices, namely an a point adjusting device, a B point adjusting device and a C point adjusting device, on the bearing platform are arranged on the bearing platform; the adjusting device can be a manual adjusting device, such as a screw, and the lifting adjustment of the platform at the corresponding position is realized by manually screwing the screw. The regulating device may also be a machine-controlled electrically controlled regulating device.

The chip position A, the chip position B and the chip position C can be set with colors, such as yellow, red and green; the chip position A, the chip position B and the chip position C are fixed three observation window positions, and after the point A adjusting device, the point B adjusting device and the point C adjusting device on the bearing platform are adjusted, the adjustment condition can be judged by observing microscopic amplified images, namely perpendicularity evaluation microscopic images, on the window positions; the feature of the observation verticality evaluation microscopic image can be the definition of the image or the information such as the distribution feature or the size of relevant tangible components or marks in the image.

In the application, the camera, namely the camera shooting module, can only move up and down along the Z axis and can not move along the X, Y axis; and the perpendicularity of the bearing platform and the camera module is adjusted only from one side of the bearing platform or the chip. In practice, the camera, i.e. the camera module, is not necessarily in a completely horizontal state, and leveling means that when the X, Y axis moves, the imaging focal plane of the platform and the camera remain relatively horizontal, i.e. when the carrying platform moves, the distances from each point on the carrying platform to the camera corresponding to the camera from top to bottom are consistent, especially the distances from each point on the chip to the camera are consistent, so that the consistency and accuracy of the microscopic imaging image of the chip are maintained.

In one embodiment of the method of forming a component detection analysis with verticality adjustment: firstly, taking the chip position B or the chip position C as a base point, if taking the chip position C as the base point, fixing a C point adjusting device such as a screw, wherein the C point adjusting device is motionless in the whole leveling process.

Then, the camera, namely the camera shooting assembly, moves from the initial displacement to a point C at a chip position, the camera shooting assembly moves a Z axis to find a focusing plane, and a point B adjusting device on a bearing platform corresponding to the point B at the chip position is screwed to focus when the camera shooting assembly moves to a point B at the chip position of the same X axis; further, the camera, namely the camera shooting component, returns to the point C of the chip position, the camera shooting component moves the Z axis to be in focus, then moves and screws the B point adjusting device on the bearing platform corresponding to the point B of the chip position to be in focus, the camera shooting component is repeatedly adjusted to the point B of the chip position and the point C of the chip position to be in the same focal plane, namely after the X axis is adjusted to move between the point B of the chip position and the point C of the chip position, the focal plane is not changed.

Similarly, the point A adjusting device such as a screw on the bearing platform corresponding to the point A of the chip position is adjusted by taking the point C of the chip position as a reference until the point A and the point BC of the chip position are in the same focal plane, and after the X or Y axis movement is adjusted from the point A of the chip position to the point C of the chip position or from the point A of the chip position to the point B of the chip position, the focal plane is not changed, and three points are leveled.

As shown in fig. 6, 11 and 12, in the embodiment with the formation component detection chip suitable for verticality adjustment, the mark is located on the lower surface of the cavity; or marking an upper surface located inside the cavity; or the indicia is located on the upper or lower surface outside of the cavity.

As shown in fig. 6, 11 and 12, in the embodiment of the component-forming detection chip suitable for verticality adjustment, the shape of the mark is circular. In some embodiments of the formed component detection chip suitable for perpendicularity adjustment, not shown in the drawings, the shape of the mark is triangular, square, or pentagram.

As shown in fig. 10 and 9, in the embodiment with the component detecting chip suitable for verticality adjustment, the chip is hollow and can be filled with liquid. Fig. 9 is a schematic top view of the liquid filled with particles. The method can judge whether the verticality of the formed component detection chip suitable for verticality adjustment, namely the bearing platform and the camera module is in a set range or not by observing the imaging definition of particles at different points; the component detection chip with the perpendicularity adjustment function is suitable for being filled with liquid with particles, the particles can be floating particles or settled particles, and the particles are uniformly distributed. The floating particles are shown in FIG. 10 floating adjacent to the inner upper surface of the formed component detection chip cavity suitable for perpendicularity adjustment. Also shown in fig. 10 is the case where the settled particles settle on the inner lower surface of the cavity of the formed component detection chip suitable for verticality adjustment.

In the embodiment with the formation component detection chip suitable for verticality adjustment, as shown in fig. 11 and 12, the marks are distributed in an array. The arrays may be sparsely distributed or densely distributed. Some or all of the elements in the array may be selected during the perpendicularity detection process.

As shown in fig. 13 to 15, an embodiment of the method for detecting and analyzing a formed component with verticality adjustment includes the steps of 10: shooting microscopic amplified images of the formed component detection chip suitable for verticality adjustment to obtain verticality evaluation microscopic images; step 20: analyzing the perpendicularity evaluation microscopic image, and evaluating whether the perpendicularity is qualified or not; step 30: if the verticality is qualified, detecting the tangible component; step 40: and if the verticality is unqualified, performing verticality adjustment.

As shown in fig. 14, in the embodiment of the method for detecting and analyzing the formed component with verticality adjustment, the method further includes step 41: if the number of verticality adjustment times exceeds the setting, the verticality adjustment fails.

Referring to fig. 15, in an embodiment of the method for detecting and analyzing a component with verticality adjustment, the method includes the steps of 50: and detecting levelness, and if the levelness exceeds the setting, failing to adjust verticality.

In the embodiment of the method and chip for detecting and analyzing the formed components with verticality adjustment shown in fig. 13 to 15 and fig. 9 to 12, in step 20, whether the verticality is qualified is determined by detecting the distribution pattern or definition of the photographed formed components in the formed component detection chip suitable for verticality adjustment. In the case where perpendicularity meets the expected setting, the distribution of some of the tangible components of the significantly uniform distribution characteristics, such as the red blood cells in the blood dilution, is substantially uniform, and in normal cases, the red blood cells are also uniformly distributed in the perpendicularity evaluation microscopic image. If the distribution characteristics of the trend are obviously presented in the image, such as dense on one side and sparse on the other side, the perpendicularity can be obviously judged to be not in line with the expectations. Of course, the chip may be other chips with uniformly distributed tangible components.

In some embodiments of the method for detecting and analyzing formed components with verticality adjustment, the sample to be detected in the formed component detecting chip suitable for verticality adjustment is blood, and in step 20, whether verticality is qualified is determined by detecting distribution of captured red blood cell images and size of red blood cells. Further, under normal conditions, in the case of magnification setting or fixation, the red blood cells will also show a corresponding size in the perpendicularity evaluation microscopic image, so that perpendicularity judgment can also be performed by the size of the tangible component. The detection sample in the component detection chip may be replaced with urine, feces, fluid accumulation, other fluid samples, or a non-fluid solution containing particles, in addition to blood.

As shown in fig. 9 to 10, in the embodiment of the method and the chip for detecting and analyzing the formed component with verticality adjustment, the detection sample in the formed component detection chip suitable for verticality adjustment is a particle-containing solution, and in step 20, whether verticality is qualified is determined by detecting the distribution and the size of the reference particle image in the photographed particle-containing solution. The test sample is blood and may be replaced with urine or other bodily fluids or specially configured solutions. The particle-containing solution may be a solution containing no body fluid, or may be a solution obtained by adding reference particles to blood, urine, feces, or a body fluid.

In the embodiment of the method and chip with verticality adjustment for detecting and analyzing the formed component, as shown in fig. 9 to 10, the reference particles are floating particles or the reference particles are bottom particles. The floating particles are shown in FIG. 10 floating adjacent to the inner upper surface of the formed component detection chip cavity suitable for perpendicularity adjustment. Also shown in fig. 10 is the case where the settled particles settle on the inner lower surface of the cavity of the formed component detection chip suitable for verticality adjustment.

In the embodiment of the method and chip for detecting and analyzing the formed component with verticality adjustment as shown in fig. 9, 11 and 12, in step 20, whether the verticality is acceptable is determined by detecting the sizes of two or more mark points provided on the formed component detection chip suitable for verticality adjustment. The size of the mark points in fig. 9, 11 and 12 are different, and the mark points can be applied to imaging assemblies with different magnification. And in the occasion with higher perpendicularity requirements, the position precision and the dimensional precision of the marked points are higher.

In the application, the perpendicularity between the camera shooting component and the chip is judged and adjusted by utilizing a microscopic imaging technology through the image definition of the target point position or other microscopic image characteristics, and the perpendicularity between the bearing platform and the camera shooting component is adjusted by utilizing three adjusting point positions capable of adjusting the height of the bearing platform to form an adjusting surface; whether the imaging is vertical or close to vertical is judged by judging imaging definition of different points, and in the subsequent formation component analysis process, imaging consistency and accuracy after the imaging component performs XY axial horizontal movement at different positions of the chip can be ensured. The perpendicularity can be judged through quantitative data evaluation of the perpendicularity evaluation microscopic image, and high-precision perpendicularity judgment can be carried out; the perpendicularity of the bearing platform and the camera shooting assembly can be quickly adjusted through adjustment of equipment, and the camera shooting assembly is objective and accurate.

While the application has been illustrated and described in terms of a preferred embodiment and several alternatives, the application is not limited by the specific description in this specification. Other alternative or equivalent components may also be used in the practice of the present application.

Claims (18)

1. A device for detecting and analyzing a formed component with verticality adjustment is characterized in that,

the device comprises a detection control assembly, a formed component detection assembly, a camera assembly, a bearing assembly and a detection chip;

the camera shooting assembly comprises a camera shooting module;

the formed component detection assembly comprises an image acquisition module and a verticality adjustment control assembly;

the bearing component is used for bearing the detection chip; the bearing assembly comprises a verticality adjusting assembly and a bearing platform;

the detection control component comprises a physical object detection analysis component;

the detection chip comprises a sample accommodating cavity to be detected, and the detection sample accommodating cavity is used for accommodating the sample to be detected;

the camera module is used for shooting an image of a sample to be detected in the sample accommodating cavity;

the image acquisition module acquires an image shot by the camera module;

the formed component detection assembly comprises a verticality adjustment control assembly;

the image acquisition module acquires a perpendicularity evaluation microscopic image;

the perpendicularity adjustment control component is used for analyzing the perpendicularity evaluation microscopic image and evaluating whether the perpendicularity is qualified or not; if the verticality is qualified, detecting a tangible object;

if the perpendicularity is unqualified, the perpendicularity adjustment control component controls the perpendicularity adjustment component to adjust the perpendicularity of the bearing platform and the camera module.

2. The device for detecting and analyzing the formed component with the verticality adjustment according to claim 1, wherein the formed component detecting component further comprises an XY movement control component, the bearing component comprises an XY movement component, the XY movement control component outputs a driving signal to the XY movement component, and the XY movement component drives the detecting chip to move in the X direction or the Y direction on a horizontal plane;

the camera shooting assembly comprises a sliding table module, and the sliding table module adjusts the distance between the camera shooting module and the detection chip.

3. The device for detecting and analyzing formed components with verticality adjustment according to claim 1, wherein the bearing assembly comprises a level sensing assembly, the level sensing assembly comprises a level sensor, and the level sensor is capable of detecting levelness of the bearing assembly; the level sensor is a 3-axis acceleration sensor.

4. The device for detecting and analyzing components with verticality adjustment according to claim 1, wherein the verticality adjustment assembly comprises 3 or more adjustment devices, and the adjustment devices support the carrying platform.

5. The device for detecting and analyzing the formed components with verticality adjustment according to claim 4, wherein the adjusting device comprises a screw rod and a screw rod nut, the bearing platform is coupled with the screw rod nut, and the verticality of the bearing platform can be adjusted by rotating the screw rod; the adjusting device comprises a power device, and a shaft of the power device is mechanically coupled with the rotating screw rod; the power device is a stepping motor or an ultrasonic motor;

the formed component detection assembly comprises a focusing control module, wherein the focusing control module controls the running of the power device to control the distance between the camera shooting module and the detection chip.

6. The device for detecting and analyzing a formed component with verticality adjustment according to claim 4, wherein the adjusting device comprises a base and a supporting screw; the supporting screw supports the bearing platform, and the perpendicularity of the bearing platform can be adjusted by rotating the screw.

7. The utility model provides a have formation of body to examine chip suitable for straightness adjustment, its characterized in that, including holding the cavity that detects the sample, distribute 3 or more marks on the cavity, the mark is arranged in imaging detection in-process straightness detection, and in the testing process, the camera obtains mark in the picture about or about distribution position and size, judges the straightness that hangs down in the imaging process through taking the image.

8. The component-having-detecting chip for verticality adjustment according to claim 1, comprising any one of the following technical features:

technical characteristics A1: the mark is positioned on the lower surface of the inner part of the cavity;

technical characteristics A2: the mark is positioned on the upper surface of the cavity;

technical characteristics A3: the mark is positioned on the upper surface outside the cavity;

technical characteristics A4: the mark is positioned on the lower surface outside the cavity.

9. The component-having-detection chip according to claim 1, wherein the mark has a shape of a circle, triangle, square or pentagram.

10. The formed component detection chip for verticality adjustment according to claim 1, wherein the marks are distributed in an array.

11. The method for detecting and analyzing the formed component with the verticality adjustment is characterized by comprising any one of the following characteristics:

step 10: shooting an image of a formed component detection chip suitable for verticality adjustment to obtain a verticality evaluation microscopic image;

step 20: analyzing the perpendicularity evaluation microscopic image, and evaluating whether the perpendicularity is qualified or not;

step 30: if the verticality is qualified, detecting the tangible component;

step 40: and if the verticality is unqualified, performing verticality adjustment.

12. The method for detecting and analyzing a strip verticality adjustment presence component as claimed in claim 11, further comprising step 41: if the number of verticality adjustment times exceeds the setting, the verticality adjustment fails.

13. The method for detecting and analyzing a strip verticality adjustment presence component as claimed in claim 11, further comprising step 50: and detecting levelness, and if the levelness exceeds the setting, failing to adjust verticality.

14. The method according to claim 11, wherein in step 20, whether the perpendicularity is acceptable is determined by detecting a distribution pattern or definition of the formed components in the formed component detection chip suitable for perpendicularity adjustment.

15. The method according to claim 11, wherein the sample to be tested in the verticality-adjusted component-containing test chip is blood, and in step 20, whether the verticality is acceptable is determined by detecting the distribution of the captured red blood cell image and the size of the red blood cell.

16. The method according to claim 11, wherein the sample to be tested in the verticality-adjusting component-containing test chip is a particle-containing solution, and in step 20, whether the verticality is acceptable is determined by detecting the distribution and the size of a reference particle image in the particle-containing solution.

17. The method of claim 16, wherein the reference particles are floating particles or the reference particles are bottom particles.

18. The method according to claim 1, wherein in step 20, whether the verticality is acceptable is determined by detecting the sizes of two or more mark points provided on the verticality-adjusting formed component detection chip.