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CN115144740B - A power-on latch circuit, a power-on latch device and a power-on latch method - Google Patents

A power-on latch circuit, a power-on latch device and a power-on latch method Download PDF

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CN115144740B
CN115144740B CN202210745094.XA CN202210745094A CN115144740B CN 115144740 B CN115144740 B CN 115144740B CN 202210745094 A CN202210745094 A CN 202210745094A CN 115144740 B CN115144740 B CN 115144740B
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/31704Design for test; Design verification
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541Scan latches or cell details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318583Design for test
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/24Resetting means
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356Bistable circuits

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  • Theoretical Computer Science (AREA)
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  • Tests Of Electronic Circuits (AREA)

Abstract

本发明公开一种上电锁存电路、上电锁存装置及上电锁存方法,涉及数字电路技术领域,以对目标芯片管脚单元的输入信号进行锁存,减少对芯片管脚的占用。所述上电锁存电路,包括复位控制单元、锁存控制单元以及信号寄存单元。复位控制单元的输出端与锁存控制单元的输入端电连接,锁存控制单元的输出端与信号寄存单元的使能端电连接,目标芯片管脚单元与信号寄存单元的数据输入端电连接,信号寄存单元的输出端与外部测试模式信号端电连接。所述上电锁存装置包括上述技术方案所提的上电锁存电路。本发明提供的上电锁存电路、上电锁存装置及上电锁存方法应用于数字电路。

The present invention discloses a power-on latch circuit, a power-on latch device and a power-on latch method, which relate to the technical field of digital circuits, and are used to latch the input signal of a target chip pin unit to reduce the occupation of chip pins. The power-on latch circuit includes a reset control unit, a latch control unit and a signal register unit. The output end of the reset control unit is electrically connected to the input end of the latch control unit, the output end of the latch control unit is electrically connected to the enable end of the signal register unit, the target chip pin unit is electrically connected to the data input end of the signal register unit, and the output end of the signal register unit is electrically connected to the external test mode signal end. The power-on latch device includes the power-on latch circuit mentioned in the above technical solution. The power-on latch circuit, the power-on latch device and the power-on latch method provided by the present invention are applied to digital circuits.

Description

一种上电锁存电路、上电锁存装置及上电锁存方法A power-on latch circuit, a power-on latch device and a power-on latch method

技术领域Technical Field

本发明涉及数字电路领域,尤其涉及一种上电锁存电路、上电锁存装置及上电锁存方法。The present invention relates to the field of digital circuits, and in particular to a power-on latching circuit, a power-on latching device and a power-on latching method.

背景技术Background Art

目前,随着集成电路的高速发展,芯片集成度越来越高,导致逻辑规模和工作模式也越来越复杂,基于芯片级的DFT(可测试性设计,Design for test)就越来越重要。At present, with the rapid development of integrated circuits, the chip integration is getting higher and higher, resulting in increasingly complex logic scale and working mode. Chip-level DFT (Design for test) is becoming more and more important.

在现有的DFT测试方案中,通常需要提供一个专门的芯片管脚用于提供测试模式的信号电平,以控制芯片处于DFT模式或者处于功能模式。当该芯片管脚的信号电平输入信号为信号“1”时,芯片处于DFT模式,可以对芯片进行DFT测试;当该芯片管脚的信号电平输入信号为信号“0”时,芯片处于功能模式,芯片可以正常工作。但在芯片包装出厂后,无需再切换至DFT模式对芯片进行测试,该芯片管脚只能作为闲置的管脚与信号“0”连接。在芯片管脚有限的情况下,会造成芯片管脚资源的损失。In existing DFT test solutions, it is usually necessary to provide a dedicated chip pin to provide the signal level of the test mode to control the chip to be in DFT mode or in functional mode. When the signal level input signal of the chip pin is signal "1", the chip is in DFT mode and the chip can be tested by DFT; when the signal level input signal of the chip pin is signal "0", the chip is in functional mode and the chip can work normally. However, after the chip is packaged and shipped, there is no need to switch to DFT mode to test the chip. The chip pin can only be used as an idle pin connected to signal "0". In the case of limited chip pins, it will cause a loss of chip pin resources.

发明内容Summary of the invention

本发明的目的在于提供一种上电锁存电路、上电锁存装置及上电锁存方法,用于对目标芯片管脚单元的输入信号进行锁存,以避免芯片管脚资源的损失。The object of the present invention is to provide a power-on latch circuit, a power-on latch device and a power-on latch method for latching an input signal of a target chip pin unit to avoid the loss of chip pin resources.

第一方面,本发明提供一种上电锁存电路,用于对目标芯片管脚单元的输入信号进行锁存,包括复位控制单元、锁存控制单元以及信号寄存单元。复位控制单元的输出端与锁存控制单元的输入端电连接,锁存控制单元的输出端与信号寄存单元的使能端电连接,目标芯片管脚单元与信号寄存单元的数据输入端电连接,信号寄存单元的输出端与外部测试模式信号端电连接。In a first aspect, the present invention provides a power-on latch circuit for latching an input signal of a target chip pin unit, comprising a reset control unit, a latch control unit and a signal register unit. The output end of the reset control unit is electrically connected to the input end of the latch control unit, the output end of the latch control unit is electrically connected to the enable end of the signal register unit, the target chip pin unit is electrically connected to the data input end of the signal register unit, and the output end of the signal register unit is electrically connected to the external test mode signal end.

在锁存期内,复位控制单元用于向锁存控制单元提供锁存启动信号,锁存控制单元用于在锁存启动信号的作用下,生成锁存控制信号,并将锁存控制信号发送给信号寄存单元;信号寄存单元用于根据锁存控制信号,对目标芯片管脚单元的输入信号进行锁存,并将锁存的输入信号传输至外部测试模式信号端。During the latching period, the reset control unit is used to provide a latching start signal to the latching control unit, and the latching control unit is used to generate a latching control signal under the action of the latching start signal, and send the latching control signal to the signal register unit; the signal register unit is used to latch the input signal of the target chip pin unit according to the latching control signal, and transmit the latched input signal to the external test mode signal terminal.

在锁存期后,锁存控制单元还用于生成锁存停止信号,并将锁存停止信号发送给信号寄存单元;信号寄存单元用于根据锁存停止信号,停止锁存目标芯片管脚单元的输入信号。After the latching period, the latching control unit is further used to generate a latching stop signal and send the latching stop signal to the signal registering unit; the signal registering unit is used to stop latching the input signal of the target chip pin unit according to the latching stop signal.

与现有技术相比,本发明提供的上电锁存电路中,复位控制单元的输出端与锁存控制单元的输入端电连接,锁存控制单元的输出端与信号寄存单元的使能端电连接,目标芯片管脚单元与信号寄存单元的数据输入端电连接,信号寄存单元的输出端与外部测试模式信号端电连接。基于此,在锁存期内,复位控制单元向锁存控制单元提供锁存启动信号,锁存控制单元能够根据锁存启动信号生成锁存控制信号,并将锁存控制信号发送给信号寄存单元。信号寄存单元能够根据锁存控制信号,对目标芯片管脚单元的输入信号进行锁存,最终将锁存的输入信号传输至外部测试模式信号端。当锁存到的输入信号为信号“1”时,外部测试模式信号端接收到的信号也为信号“1”,最终可以输出信号“1”,以控制芯片处于DFT测试模式。当锁存到的输入信号为信号“0”时,外部测试模式信号端接收到的信号也为信号“0”,最终可以输出信号“0”,以控制芯片处于功能模式。在锁存期后,锁存控制单元能够生成锁存停止信号,并将锁存停止信号发送给信号寄存单元以停止对于锁存目标芯片管脚单元的输入信号的锁存,使得目标芯片管脚单元的输入信号跳变不会对外部测试模式信号端接收到的信号产生影响,也就是说,无论目标芯片管脚单元的输入信号如何变化,都不会改变芯片的工作模式。由此,目标芯片管脚单元不仅能够作为其他的芯片功能管脚来使用,还能够通过本发明提供的上电锁存电路向外部测试模式信号端提供信号,以完成芯片工作模式的切换,相对于现有技术中需要设置一个专门的芯片管脚来进行芯片工作模式的切换,本发明不需要再设置一个专门的芯片管脚,避免了芯片管脚资源的损失。Compared with the prior art, in the power-on latch circuit provided by the present invention, the output end of the reset control unit is electrically connected to the input end of the latch control unit, the output end of the latch control unit is electrically connected to the enable end of the signal register unit, the target chip pin unit is electrically connected to the data input end of the signal register unit, and the output end of the signal register unit is electrically connected to the external test mode signal end. Based on this, during the latch period, the reset control unit provides a latch start signal to the latch control unit, and the latch control unit can generate a latch control signal according to the latch start signal, and send the latch control signal to the signal register unit. The signal register unit can latch the input signal of the target chip pin unit according to the latch control signal, and finally transmit the latched input signal to the external test mode signal end. When the latched input signal is a signal "1", the signal received by the external test mode signal end is also a signal "1", and finally a signal "1" can be output to control the chip to be in DFT test mode. When the latched input signal is signal "0", the signal received by the external test mode signal terminal is also signal "0", and finally the signal "0" can be output to control the chip to be in the functional mode. After the latch period, the latch control unit can generate a latch stop signal, and send the latch stop signal to the signal register unit to stop latching the input signal of the latched target chip pin unit, so that the input signal jump of the target chip pin unit will not affect the signal received by the external test mode signal terminal, that is, no matter how the input signal of the target chip pin unit changes, the working mode of the chip will not be changed. Thus, the target chip pin unit can not only be used as other chip function pins, but also can provide a signal to the external test mode signal terminal through the power-on latch circuit provided by the present invention to complete the switching of the chip working mode. Compared with the prior art, a special chip pin needs to be set to switch the chip working mode. The present invention does not need to set a special chip pin, thereby avoiding the loss of chip pin resources.

第二方面,本发明还提供一种上电锁存装置,包括第一方面所述的上电锁存电路。In a second aspect, the present invention further provides a power-on latching device, comprising the power-on latching circuit described in the first aspect.

与现有技术相比,本发明提供的上电锁存装置的有益效果与上述技术方案所述的上电锁存电路的有益效果相同,此处不做赘述。Compared with the prior art, the beneficial effects of the power-on latch device provided by the present invention are the same as the beneficial effects of the power-on latch circuit described in the above technical solution, which will not be described in detail here.

第三方面,本发明还提供一种上电锁存方法,应用于第一方面所述的上电锁存电路,上电锁存方法包括:In a third aspect, the present invention further provides a power-on latching method, which is applied to the power-on latching circuit described in the first aspect, and the power-on latching method comprises:

锁存期内,控制复位控制单元向锁存控制单元提供锁存启动信号;During the latching period, the reset control unit is controlled to provide a latching start signal to the latching control unit;

响应于锁存启动信号,锁存控制单元向信号寄存单元提供锁存控制信号;In response to the latch start signal, the latch control unit provides a latch control signal to the signal register unit;

响应于锁存控制信号,信号寄存单元对目标芯片管脚单元的输入信号进行锁存,并将锁存的输入信号传输至外部测试模式信号端;In response to the latch control signal, the signal register unit latches the input signal of the target chip pin unit and transmits the latched input signal to the external test mode signal terminal;

锁存期后,锁存控制单元向信号寄存单元提供锁存停止信号;After the latching period, the latching control unit provides a latching stop signal to the signal registering unit;

响应于锁存停止信号,信号寄存单元停止锁存目标芯片管脚单元的输入信号。In response to the latch stop signal, the signal register unit stops latching the input signal of the target chip pin unit.

与现有技术相比,本发明提供的上电锁存方法的有益效果与上述技术方案所述的上电锁存电路的有益效果相同,此处不做赘述。Compared with the prior art, the beneficial effects of the power-on latching method provided by the present invention are the same as the beneficial effects of the power-on latching circuit described in the above technical solution, and will not be described in detail here.

附图说明BRIEF DESCRIPTION OF THE DRAWINGS

此处所说明的附图用来提供对本发明的进一步理解,构成本发明的一部分,本发明的示意性实施例及其说明用于解释本发明,并不构成对本发明的不当限定。在附图中:The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

图1为本发明实施例中提供的上电锁存电路;FIG1 is a power-on latch circuit provided in an embodiment of the present invention;

图2为本发明实施例中提供的上电锁存电路的时序图。FIG. 2 is a timing diagram of a power-on latch circuit provided in an embodiment of the present invention.

附图标记:Reference numerals:

1-复位控制单元, 11-上电复位模块,1- Reset control unit, 11- Power-on reset module,

12-复位同步模块, 13-滤波模块,12-Reset synchronization module, 13-Filter module,

2-锁存控制单元, 21-计数寄存模块,2-Latch control unit, 21-Counting register module,

211-计数器, 212-第二寄存器,211-counter, 212-second register,

22-时钟模块, 221-时钟信号端,22-clock module, 221-clock signal terminal,

222-时钟门控器, 3-信号寄存单元,222-Clock gate controller, 3-Signal register unit,

31-第三寄存器, 32-第四寄存器,31-third register, 32-fourth register,

4-目标芯片管脚单元。4-Target chip pin unit.

具体实施方式DETAILED DESCRIPTION

为了便于清楚描述本发明实施例的技术方案,在本发明的实施例中,采用了“第一”、“第二”等字样对功能和作用基本相同的相同项或相似项进行区分。例如,第一阈值和第二阈值仅仅是为了区分不同的阈值,并不对其先后顺序进行限定。本领域技术人员可以理解“第一”、“第二”等字样并不对数量和执行次序进行限定,并且“第一”、“第二”等字样也并不限定一定不同。In order to clearly describe the technical solutions of the embodiments of the present invention, in the embodiments of the present invention, words such as "first" and "second" are used to distinguish the same items or similar items with basically the same functions and effects. For example, the first threshold and the second threshold are only used to distinguish different thresholds, and their order is not limited. Those skilled in the art can understand that words such as "first" and "second" do not limit the quantity and execution order, and words such as "first" and "second" do not necessarily limit them to be different.

需要说明的是,本发明中,“示例性的”或者“例如”等词用于表示作例子、例证或说明。本发明中被描述为“示例性的”或者“例如”的任何实施例或设计方案不应被解释为比其他实施例或设计方案更优选或更具优势。确切而言,使用“示例性的”或者“例如”等词旨在以具体方式呈现相关概念。It should be noted that, in the present invention, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present invention should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

本发明中,“至少一个”是指一个或者多个,“多个”是指两个或两个以上。“和/或”,描述关联对象的关联关系,表示可以存在三种关系,例如,A和/或B,可以表示:单独存在A,同时存在A和B,单独存在B的情况,其中A,B可以是单数或者复数。字符“/”一般表示前后关联对象是一种“或”的关系。“以下至少一项(个)”或其类似表达,是指的这些项中的任意组合,包括单项(个)或复数项(个)的任意组合。例如,a,b或c中的至少一项(个),可以表示:a,b,c,a和b的结合,a和c的结合,b和c的结合,或a、b和c的结合,其中a,b,c可以是单个,也可以是多个。In the present invention, "at least one" means one or more, and "plurality" means two or more. "And/or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and/or B can mean: A exists alone, A and B exist at the same time, and B exists alone, where A and B can be singular or plural. The character "/" generally indicates that the associated objects before and after are in an "or" relationship. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, at least one of a, b or c can mean: a, b, c, the combination of a and b, the combination of a and c, the combination of b and c, or the combination of a, b and c, where a, b, c can be single or multiple.

如图1所示,本发明实施例提供一种上电锁存电路,用于对目标芯片管脚单元4的输入信号进行锁存,包括复位控制单元1、锁存控制单元2以及信号寄存单元3。As shown in FIG. 1 , an embodiment of the present invention provides a power-on latch circuit for latching an input signal of a target chip pin unit 4 , including a reset control unit 1 , a latch control unit 2 and a signal register unit 3 .

复位控制单元1的输出端与锁存控制单元2的输入端电连接,锁存控制单元2的输出端与信号寄存单元3的使能端E电连接,目标芯片管脚单元4与信号寄存单元3的数据输入端D电连接,信号寄存单元3的输出端与外部测试模式信号端TM电连接。The output end of the reset control unit 1 is electrically connected to the input end of the latch control unit 2, the output end of the latch control unit 2 is electrically connected to the enable end E of the signal register unit 3, the target chip pin unit 4 is electrically connected to the data input end D of the signal register unit 3, and the output end of the signal register unit 3 is electrically connected to the external test mode signal end TM.

在锁存期内,复位控制单元1用于向锁存控制单元2提供锁存启动信号,锁存控制单元2用于在锁存启动信号的作用下,生成锁存控制信号,并将锁存控制信号发送给信号寄存单元3;信号寄存单元3用于根据锁存控制信号,对目标芯片管脚单元4的输入信号进行锁存,并将锁存的输入信号传输至外部测试模式信号端TM。During the latching period, the reset control unit 1 is used to provide a latching start signal to the latching control unit 2, and the latching control unit 2 is used to generate a latching control signal under the action of the latching start signal, and send the latching control signal to the signal register unit 3; the signal register unit 3 is used to latch the input signal of the target chip pin unit 4 according to the latching control signal, and transmit the latched input signal to the external test mode signal terminal TM.

在锁存期后,锁存控制单元2还用于生成锁存停止信号,并将锁存停止信号发送给信号寄存单元3;信号寄存单元3用于根据锁存停止信号,停止锁存目标芯片管脚单元4的输入信号。After the latching period, the latching control unit 2 is further used to generate a latching stop signal and send the latching stop signal to the signal register unit 3; the signal register unit 3 is used to stop latching the input signal of the target chip pin unit 4 according to the latching stop signal.

具体实施时:当需要对目标芯片管脚单元4的输入信号进行锁存时,控制复位控制单元1生成锁存启动信号,并将锁存启动信号发送至锁存控制单元2,在锁存启动信号的作用下,锁存控制单元2启动。锁存控制单元2在启动后,生成锁存控制信号,并将锁存控制信号发送给信号寄存单元3,信号寄存单元3在锁存控制信号的作用下,对目标芯片管脚单元4的输入信号进行锁存,即目标芯片管脚单元4的输入信号被存储至信号寄存单元3,继而被信号寄存单元3提供至外部测试模式信号端TM。当锁存到的输入信号为信号“1”时,外部测试模式信号端TM接收到的信号也为信号“1”,最终可以输出信号“1”,控制芯片处于DFT测试模式。当锁存到的输入信号为信号“0”时,外部测试模式信号端TM接收到的信号也为信号“0”,最终可以输出信号“0”,控制芯片处于功能模式。在锁存结束后,锁存控制单元2生成锁存停止信号,并将锁存停止信号发送给信号寄存单元3,信号寄存单元3在锁存停止信号的作用下,停止锁存目标芯片管脚单元4的输入信号,即不论目标芯片管脚单元4的输入信号如何发生变化,该输入信号都不会被芯片寄存单元存储,也不会对外部测试模式信号端TM的输出信号产生影响。In specific implementation: when it is necessary to latch the input signal of the target chip pin unit 4, the control reset control unit 1 generates a latch start signal, and sends the latch start signal to the latch control unit 2. Under the action of the latch start signal, the latch control unit 2 is started. After being started, the latch control unit 2 generates a latch control signal, and sends the latch control signal to the signal register unit 3. Under the action of the latch control signal, the signal register unit 3 latches the input signal of the target chip pin unit 4, that is, the input signal of the target chip pin unit 4 is stored in the signal register unit 3, and then provided to the external test mode signal terminal TM by the signal register unit 3. When the latched input signal is a signal "1", the signal received by the external test mode signal terminal TM is also a signal "1", and finally the signal "1" can be output, and the control chip is in the DFT test mode. When the latched input signal is a signal "0", the signal received by the external test mode signal terminal TM is also a signal "0", and finally the signal "0" can be output, and the control chip is in the functional mode. After the latching is completed, the latch control unit 2 generates a latch stop signal and sends the latch stop signal to the signal register unit 3. Under the action of the latch stop signal, the signal register unit 3 stops latching the input signal of the target chip pin unit 4, that is, no matter how the input signal of the target chip pin unit 4 changes, the input signal will not be stored by the chip register unit, nor will it affect the output signal of the external test mode signal terminal TM.

通过上述上电锁存电路的电路结构以及具体实施过程可知:本发明实施例提供的上电锁存电路中,复位控制单元1的输出端与锁存控制单元2的输入端电连接,锁存控制单元2的输出端与信号寄存单元3的使能端E电连接,目标芯片管脚单元4与信号寄存单元3的数据输入端D电连接,信号寄存单元3的输出端与外部测试模式信号端TM电连接。基于此,在锁存期内,复位控制单元1向锁存控制单元2提供锁存启动信号,锁存控制单元2能够根据锁存启动信号生成锁存控制信号,并将锁存控制信号发送给信号寄存单元3。信号寄存单元3能够根据锁存控制信号,对目标芯片管脚单元4的输入信号进行锁存,最终将锁存的输入信号传输至外部测试模式信号端TM。当锁存到的输入信号为信号“1”时,外部测试模式信号端TM接收到的信号也为信号“1”,最终可以输出信号“1”,以控制芯片处于DFT测试模式。当锁存到的输入信号为信号“0”时,外部测试模式信号端TM接收到的信号也为信号“0”,最终可以输出信号“0”,以控制芯片处于功能模式。在锁存期后,锁存控制单元2能够生成锁存停止信号,并将锁存停止信号发送给信号寄存单元3以停止对于锁存目标芯片管脚单元4的输入信号的锁存,使得目标芯片管脚单元4的输入信号跳变不会对外部测试模式信号端TM接收到的信号产生影响,也就是说,无论目标芯片管脚单元4的输入信号如何变化,都不会改变芯片的工作模式。由此,目标芯片管脚单元4不仅能够作为其他的芯片功能管脚来使用,还能够通过本发明实施例提供的上电锁存电路向外部测试模式信号端TM提供信号,以完成芯片工作模式的切换,相对于现有技术中需要设置一个专门的芯片管脚来进行芯片工作模式的切换,本发明实施例不需要再设置一个专门的芯片管脚,避免了芯片管脚资源的损失。Through the circuit structure and specific implementation process of the above-mentioned power-on latch circuit, it can be known that in the power-on latch circuit provided by the embodiment of the present invention, the output end of the reset control unit 1 is electrically connected to the input end of the latch control unit 2, the output end of the latch control unit 2 is electrically connected to the enable end E of the signal register unit 3, the target chip pin unit 4 is electrically connected to the data input end D of the signal register unit 3, and the output end of the signal register unit 3 is electrically connected to the external test mode signal end TM. Based on this, during the latch period, the reset control unit 1 provides a latch start signal to the latch control unit 2, and the latch control unit 2 can generate a latch control signal according to the latch start signal, and send the latch control signal to the signal register unit 3. The signal register unit 3 can latch the input signal of the target chip pin unit 4 according to the latch control signal, and finally transmit the latched input signal to the external test mode signal end TM. When the latched input signal is a signal "1", the signal received by the external test mode signal end TM is also a signal "1", and finally a signal "1" can be output to control the chip to be in DFT test mode. When the latched input signal is signal "0", the signal received by the external test mode signal terminal TM is also signal "0", and finally the signal "0" can be output to control the chip to be in the functional mode. After the latch period, the latch control unit 2 can generate a latch stop signal, and send the latch stop signal to the signal register unit 3 to stop latching the input signal of the latch target chip pin unit 4, so that the input signal jump of the target chip pin unit 4 will not affect the signal received by the external test mode signal terminal TM, that is, no matter how the input signal of the target chip pin unit 4 changes, it will not change the working mode of the chip. Therefore, the target chip pin unit 4 can not only be used as other chip function pins, but also can provide a signal to the external test mode signal terminal TM through the power-on latch circuit provided by the embodiment of the present invention to complete the switching of the chip working mode. Compared with the prior art that needs to set a special chip pin to switch the chip working mode, the embodiment of the present invention does not need to set a special chip pin, thereby avoiding the loss of chip pin resources.

在实际中,上述目标芯片管脚单元4包括芯片管脚PIN0,以及与芯片管脚PIN0电连接的硅片管脚PAD0。硅片管脚PAD0具有PAD端、C端以及I端三个输入输出端,还具有输出使能OEN端,用于控制硅片管脚处于输出模式或者输入模式。当输出使能OEN端与信号“1”电连接时,硅片管脚PAD0处于输入模式,即从PAD端接收输入信号,从C端将信号输出;当输出使能OEN端与信号“0”电连接时,硅片管脚PAD0处于输出模式,即从I端接收信号,从PAD端输出信号。在本发明实施例中,当芯片管脚PIN0与硅片管脚PAD0的PAD端电连接时,需要将输出使能OEN端与信号“1”电连接,以将芯片管脚PIN0接收到的输入信号通过硅片管脚PAD0的C端传输至信号寄存单元3的数据输入端D;当芯片管脚PIN0与硅片管脚PAD0的I端电连接时,则需要将输出使能OEN端与信号“0”电连接,以将芯片管脚PIN0接收到的输入信号通过硅片管脚PAD0的PAD端传输至信号寄存单元3的数据输入端D。In practice, the target chip pin unit 4 includes a chip pin PIN0 and a silicon chip pin PAD0 electrically connected to the chip pin PIN0. The silicon chip pin PAD0 has three input and output terminals, namely, a PAD terminal, a C terminal and an I terminal, and also has an output enable OEN terminal for controlling the silicon chip pin to be in output mode or input mode. When the output enable OEN terminal is electrically connected to the signal "1", the silicon chip pin PAD0 is in input mode, that is, it receives the input signal from the PAD terminal and outputs the signal from the C terminal; when the output enable OEN terminal is electrically connected to the signal "0", the silicon chip pin PAD0 is in output mode, that is, it receives the signal from the I terminal and outputs the signal from the PAD terminal. In an embodiment of the present invention, when the chip pin PIN0 is electrically connected to the PAD end of the silicon chip pin PAD0, the output enable OEN end needs to be electrically connected to the signal "1" so that the input signal received by the chip pin PIN0 is transmitted to the data input end D of the signal register unit 3 through the C end of the silicon chip pin PAD0; when the chip pin PIN0 is electrically connected to the I end of the silicon chip pin PAD0, the output enable OEN end needs to be electrically connected to the signal "0" so that the input signal received by the chip pin PIN0 is transmitted to the data input end D of the signal register unit 3 through the PAD end of the silicon chip pin PAD0.

在一种可能的实现方式中,复位控制单元1包括上电复位模块11和复位同步模块12。上电复位模块11的输出端与复位同步模块12的数据输入端D电连接,用于向复位同步模块12提供上电复位信号,复位同步模块12的输出端与锁存控制单元2的输入端、锁存控制单元2的复位端以及信号寄存单元3的复位端电连接,用于根据上电复位信号,向锁存控制单元2的输入端、锁存控制单元2的复位端以及信号寄存单元3的复位端提供锁存启动信号,锁存启动信号用于控制锁存控制单元2启动,以及控制锁存控制单元2以及信号寄存单元3停止复位。In a possible implementation, the reset control unit 1 includes a power-on reset module 11 and a reset synchronization module 12. The output end of the power-on reset module 11 is electrically connected to the data input end D of the reset synchronization module 12, and is used to provide a power-on reset signal to the reset synchronization module 12. The output end of the reset synchronization module 12 is electrically connected to the input end of the latch control unit 2, the reset end of the latch control unit 2, and the reset end of the signal register unit 3, and is used to provide a latch start signal to the input end of the latch control unit 2, the reset end of the latch control unit 2, and the reset end of the signal register unit 3 according to the power-on reset signal. The latch start signal is used to control the latch control unit 2 to start, and control the latch control unit 2 and the signal register unit 3 to stop resetting.

具体实施时,在需要对目标芯片管脚单元4的输入信号进行锁存时,首先控制上电复位模块11上电,在上电复位模块11上电的过程中,其输出为信号“0”,复位同步模块12接收到信号“0”后,将信号“0”传输至锁存控制单元2的输入端、锁存控制单元2的复位端以及信号寄存单元3的复位端,且由于复位端一般为低电平有效,当接收到信号“0”时,锁存控制单元2以及信号寄存单元3在低电平信号“0”的作用下一直维持复位状态。当上电复位模块11上电完成后,其输出信号经过毫秒级别的延迟后跳变为信号“1”,此时,信号“1”为上电复位模块11生成的上电复位信号。复位同步模块12根据接收到的信号“1”,向锁存控制单元2的输入端、锁存控制单元2的复位端以及信号寄存单元3的复位端提供锁存启动信号,此时,锁存启动信号为信号“1”,接收到高电平信号“1”后,锁存控制单元2以及信号寄存单元3停止复位,锁存控制单元2在信号“1”的作用下启动。In specific implementation, when the input signal of the target chip pin unit 4 needs to be latched, the power-on reset module 11 is first controlled to be powered on. During the power-on process of the power-on reset module 11, its output is a signal "0". After the reset synchronization module 12 receives the signal "0", the signal "0" is transmitted to the input end of the latch control unit 2, the reset end of the latch control unit 2, and the reset end of the signal register unit 3. Since the reset end is generally low-level valid, when the signal "0" is received, the latch control unit 2 and the signal register unit 3 are always maintained in the reset state under the action of the low-level signal "0". After the power-on reset module 11 is powered on, its output signal jumps to a signal "1" after a delay of milliseconds. At this time, the signal "1" is the power-on reset signal generated by the power-on reset module 11. The reset synchronization module 12 provides a latch start signal to the input end of the latch control unit 2, the reset end of the latch control unit 2 and the reset end of the signal register unit 3 according to the received signal "1". At this time, the latch start signal is signal "1". After receiving the high-level signal "1", the latch control unit 2 and the signal register unit 3 stop resetting, and the latch control unit 2 is started under the action of the signal "1".

基于此,当需要对目标芯片管脚单元4的输入信号进行锁存时,控制上电复位模块11上电,继而通过上电复位模块11上电完成后产生的信号“1”,以控制锁存信号电路处于锁存期内。例如,当目标芯片管脚单元4的输入信号为信号“0”时,若此时需要对信号“0”进行锁存,则需要控制上电复位模块11进行上电。Based on this, when the input signal of the target chip pin unit 4 needs to be latched, the power-on reset module 11 is controlled to be powered on, and then the signal "1" generated after the power-on reset module 11 is powered on is used to control the latch signal circuit to be in the latch period. For example, when the input signal of the target chip pin unit 4 is signal "0", if the signal "0" needs to be latched at this time, the power-on reset module 11 needs to be controlled to be powered on.

可以理解的是,在一个锁存期内时,信号寄存单元3仅能对该时期内目标芯片管脚单元4的输入信号进行锁存。当上一个锁存期结束后,若需要对当前目标芯片管脚单元4的输入信号进行锁存时,则需要控制上电复位模块11重新上电,以控制锁存信号电路进入又一轮锁存期。It is understandable that, within a latching period, the signal register unit 3 can only latch the input signal of the target chip pin unit 4 within the period. After the last latching period ends, if the input signal of the current target chip pin unit 4 needs to be latched, the power-on reset module 11 needs to be controlled to be powered on again to control the latch signal circuit to enter another latching period.

在一些实施例中,如图1所示,复位控制单元1还包括滤波模块13,滤波模块13的数据输入端与上电复位模块11的输出端电连接,滤波模块13的输出端与复位同步模块12的数据输入端电连接,滤波模块13用于对上电复位信号进行滤波,并将滤波后上电复位信号传输至复位同步模块12。In some embodiments, as shown in Figure 1, the reset control unit 1 also includes a filtering module 13, the data input end of the filtering module 13 is electrically connected to the output end of the power-on reset module 11, and the output end of the filtering module 13 is electrically connected to the data input end of the reset synchronization module 12. The filtering module 13 is used to filter the power-on reset signal and transmit the filtered power-on reset signal to the reset synchronization module 12.

应理解,在上电过程中由于电源的输出抖动会直接影响上电复位模块11输出的上电复位信号,使得上电复位信号产生不必要的跳变,继而导致锁存启动信号的跳变,例如,当锁存启动信号为信号“1”时,若跳变成信号“0”,则会使锁存信号控制单元以及信号寄存单元3被复位,造成锁存混乱。基于此,滤波模块13可以对上电复位模块11的输出信号进行滤波,将上电复位信号中的毛刺滤除,使得上电复位信号能够一直保持信号“1”的稳定输出。在实际中,为了避免上电锁存电路因为时序问题或者亚稳态问题而导致的电路异常,复位同步模块12在接收到经过滤波模块13的上电复位信号后,需要延迟几个时钟周期后,再同步输出锁存启动信号,具体延迟的周期数目与实际应用中的时钟信号的频率有关,本发明实施例对此不做限定。It should be understood that during the power-on process, the output jitter of the power supply will directly affect the power-on reset signal output by the power-on reset module 11, causing the power-on reset signal to jump unnecessarily, which in turn causes the latch start signal to jump. For example, when the latch start signal is a signal "1", if it jumps to a signal "0", the latch signal control unit and the signal register unit 3 will be reset, causing latch confusion. Based on this, the filter module 13 can filter the output signal of the power-on reset module 11, filter out the burrs in the power-on reset signal, so that the power-on reset signal can always maintain a stable output of the signal "1". In practice, in order to avoid circuit abnormalities caused by timing problems or metastable problems in the power-on latch circuit, the reset synchronization module 12 needs to delay several clock cycles after receiving the power-on reset signal after passing through the filter module 13, and then synchronously output the latch start signal. The specific number of delayed cycles is related to the frequency of the clock signal in the actual application, and the embodiment of the present invention does not limit this.

在一个实施例中,如图1所示,滤波模块13包括多个第一寄存器以及或门。多个第一寄存器串联,每个第一寄存器的输出端还与或门的相应输入端电连接,或门的输出端与复位同步模块12的输入端电连接。In one embodiment, as shown in FIG1 , the filter module 13 includes a plurality of first registers and an OR gate. The plurality of first registers are connected in series, and the output of each first register is also electrically connected to the corresponding input of the OR gate, and the output of the OR gate is electrically connected to the input of the reset synchronization module 12 .

示例性的,如图1所示,滤波模块13可以包括3个第一寄存器,3个第一寄存器依次首尾相连,且3个第一寄存器的输出端均与或门输入端电连接。当上电复位模块11上电完成后,其输出信号变为信号“1”,此时,信号“1”为上电复位模块11生成的上电复位信号。第1个第一寄存器接收到信号“1”后,将信号“1”传输至第2个第一寄存器,同时也将信号“1”传输至或门的第一输入端,第2个第一寄存器接收到信号“1”后,将信号“1”传输至第3个第一寄存器,同时也将信号“1”传输至或门的第二输入端,第3个第一寄存器接收到信号“1”后,将信号“1”传输至或门的第三输入端,或门的其中一个输入端接收到“信号1”后,将信号“1”传输至复位同步模块12。若在上电复位模块11输出信号“1”的过程中,由于毛刺的存在导致信号发生跳变,使得第1个第一寄存器接收到了信号“0”,由于寄存器仅会在时钟信号的上升沿到来时将数据输入端D的信号采集到输出端,此时第2个第一寄存器发送给第3个第一寄存器的信号还是信号“1”,且第2个第一寄存器发送给或门的信号也是信号“1”,使得或门可以继续输出信号“1”。基于此,滤波电路可以对上电复位信号中的低电平毛刺进行滤除,使得复位同步模块12能够接收到稳定的上电复位信号。可以理解的是,滤波模块13还可以包括2个、4个或者5个第一寄存器,本发明实施例对此不做具体限定。Exemplarily, as shown in FIG1 , the filtering module 13 may include three first registers, the three first registers are connected end to end in sequence, and the output ends of the three first registers are electrically connected to the input end of the OR gate. When the power-on reset module 11 is powered on, its output signal becomes a signal "1", at which time, the signal "1" is a power-on reset signal generated by the power-on reset module 11. After the first first register receives the signal "1", the signal "1" is transmitted to the second first register, and the signal "1" is also transmitted to the first input end of the OR gate. After the second first register receives the signal "1", the signal "1" is transmitted to the third first register, and the signal "1" is also transmitted to the second input end of the OR gate. After the third first register receives the signal "1", the signal "1" is transmitted to the third input end of the OR gate. After one of the input ends of the OR gate receives the "signal 1", the signal "1" is transmitted to the reset synchronization module 12. If during the process of the power-on reset module 11 outputting the signal "1", the signal jumps due to the presence of glitches, so that the first first register receives the signal "0", since the register will only collect the signal of the data input terminal D to the output terminal when the rising edge of the clock signal arrives, at this time, the signal sent by the second first register to the third first register is still the signal "1", and the signal sent by the second first register to the OR gate is also the signal "1", so that the OR gate can continue to output the signal "1". Based on this, the filter circuit can filter out the low-level glitches in the power-on reset signal, so that the reset synchronization module 12 can receive a stable power-on reset signal. It can be understood that the filter module 13 can also include 2, 4 or 5 first registers, and the embodiment of the present invention does not specifically limit this.

在一种可能的实现方式中,如图1所示,锁存控制单元2包括计数寄存模块21以及时钟模块22。计数寄存模块21的输入端与复位控制单元1的输出端电连接,用于在锁存启动信号的控制下开始计数。计数寄存模块21的复位端与复位控制单元1的输出端电连接,用于在锁存启动信号的作用下,停止复位。In a possible implementation, as shown in FIG1 , the latch control unit 2 includes a counting register module 21 and a clock module 22. The input end of the counting register module 21 is electrically connected to the output end of the reset control unit 1, and is used to start counting under the control of the latch start signal. The reset end of the counting register module 21 is electrically connected to the output end of the reset control unit 1, and is used to stop resetting under the action of the latch start signal.

计数寄存模块21的第一输出端与时钟模块22的使能端E电连接,用于控制时钟模块22打开,时钟模块22的第一输出端与计数寄存模块21的计数端电连接,计数寄存模块21用于对时钟模块22的输出信号进行计数;计数寄存模块21还用于当计数寄存模块21的计数数值达到目标数值后,控制时钟模块22关闭。The first output end of the counting register module 21 is electrically connected to the enable end E of the clock module 22, and is used to control the clock module 22 to turn on. The first output end of the clock module 22 is electrically connected to the counting end of the counting register module 21. The counting register module 21 is used to count the output signal of the clock module 22; the counting register module 21 is also used to control the clock module 22 to turn off when the counting value of the counting register module 21 reaches the target value.

计数寄存模块21的第二输出端与信号寄存单元3的使能端E电连接,用于当计数寄存模块21的计数数值达到目标数值后,生成锁存控制信号,锁存控制信号用于控制信号寄存单元3对目标芯片管脚单元4的输入信号进行锁存。The second output end of the counting register module 21 is electrically connected to the enable end E of the signal register unit 3, and is used to generate a latch control signal when the count value of the counting register module 21 reaches the target value. The latch control signal is used to control the signal register unit 3 to latch the input signal of the target chip pin unit 4.

在锁存期后,计数寄存模块21还用于生成锁存停止信号,锁存停止信号用于控制信号寄存单元3停止锁存目标芯片管脚单元4的输入信号。After the latching period, the counting register module 21 is further used to generate a latching stop signal, and the latching stop signal is used to control the signal register unit 3 to stop latching the input signal of the target chip pin unit 4.

时钟模块22的第二输出端分别与复位控制单元1的时钟输入端、计数寄存模块21的时钟输入端以及信号寄存单元3的时钟输入端电连接,用于向复位控制单元1、计数寄存模块21以及信号寄存单元3提供时钟信号。The second output end of the clock module 22 is electrically connected to the clock input end of the reset control unit 1, the clock input end of the counting register module 21 and the clock input end of the signal register unit 3 respectively, and is used to provide a clock signal to the reset control unit 1, the counting register module 21 and the signal register unit 3.

具体实施时,计数寄存模块21接收到复位同步模块12发送的信号“1”后,开始计数,并在信号“1”的作用下停止复位。此时,在计数寄存模块21停止复位后,计数寄存模块21的第一输出端输出信号“1”,时钟模块22的使能端E接收到信号“1”后,时钟模块22打开,并将信号输出至计数寄存模块21的计数端,计数寄存模块21对时钟模块22的输出信号进行计数,当计数寄存模块21的计数数值达到目标数值,即计数寄存模块21计数满后,计数寄存模块21的第一输出端输出信号“0”,时钟模块22的使能端E接收到信号“0”后,时钟模块22关闭。同时,在计数寄存模块21启动后,计数寄存模块21计数满之前,计数寄存模块21的第二输出端向信号寄存单元3的使能端E输出信号“0”,信号寄存单元3的使能端E接收到信号“0”时,不会对数据输入端D接收到的信号进行存储。在计数寄存模块21计数满后,计数寄存模块21的第二输出端向信号寄存单元3的使能端E输出信号“1”,信号寄存单元3的使能端E接收到信号“1”后,才会对数据输入端D接收到的信号进行存储。In specific implementation, after the counting register module 21 receives the signal "1" sent by the reset synchronization module 12, it starts counting, and stops resetting under the action of the signal "1". At this time, after the counting register module 21 stops resetting, the first output terminal of the counting register module 21 outputs the signal "1", and after the enable terminal E of the clock module 22 receives the signal "1", the clock module 22 is turned on and outputs the signal to the counting terminal of the counting register module 21. The counting register module 21 counts the output signal of the clock module 22. When the count value of the counting register module 21 reaches the target value, that is, the counting register module 21 counts fully, the first output terminal of the counting register module 21 outputs the signal "0", and after the enable terminal E of the clock module 22 receives the signal "0", the clock module 22 is turned off. At the same time, after the counting register module 21 is started, before the counting register module 21 counts fully, the second output end of the counting register module 21 outputs a signal "0" to the enable end E of the signal register unit 3. When the enable end E of the signal register unit 3 receives the signal "0", the signal received by the data input end D will not be stored. After the counting register module 21 counts fully, the second output end of the counting register module 21 outputs a signal "1" to the enable end E of the signal register unit 3. Only after the enable end E of the signal register unit 3 receives the signal "1" will the signal received by the data input end D be stored.

在将目标管脚单元的输入信号存储至信号寄存单元3后,锁存期结束,计数寄存模块21的第二输出端向信号寄存单元3的使能端E输出信号“0”,以停止锁存目标芯片管脚单元4的输入信号。在锁存期后,信号寄存单元3不会对目标芯片管脚单元4的输入信号进行寄存,此时无论目标芯片管脚单元4的输入信号如何变化,都不会对信号寄存单元3的输出信号产生影响。After the input signal of the target pin unit is stored in the signal register unit 3, the latch period ends, and the second output end of the counting register module 21 outputs a signal "0" to the enable end E of the signal register unit 3 to stop latching the input signal of the target chip pin unit 4. After the latch period, the signal register unit 3 will not register the input signal of the target chip pin unit 4. At this time, no matter how the input signal of the target chip pin unit 4 changes, it will not affect the output signal of the signal register unit 3.

在一些实施例中,如图1所示,计数寄存模块21包括计数器211和第二寄存器212。计数器211的输入端以及复位端均与复位控制单元1的输出端电连接,计数器211的第一输出端Q1与时钟模块22的使能端E电连接,时钟模块22的第一输出端Q与计数器211的计数端电连接,计数器211用于在锁存启动信号的控制下,控制时钟模块22打开,并对时钟模块22的输出信号进行计数。In some embodiments, as shown in FIG1 , the counting register module 21 includes a counter 211 and a second register 212. The input terminal and the reset terminal of the counter 211 are electrically connected to the output terminal of the reset control unit 1, the first output terminal Q1 of the counter 211 is electrically connected to the enable terminal E of the clock module 22, the first output terminal Q of the clock module 22 is electrically connected to the counting terminal of the counter 211, and the counter 211 is used to control the clock module 22 to turn on under the control of the latch start signal, and count the output signal of the clock module 22.

计数器211的第二输出端Q2与第二寄存器212的数据输入端电连接,第二寄存器212的输出端与信号寄存单元3的使能端E电连接,第二寄存器212用于将计数器211生成的锁存控制信号或锁存停止信号传输至信号寄存单元3的使能端E。The second output terminal Q2 of the counter 211 is electrically connected to the data input terminal of the second register 212, and the output terminal of the second register 212 is electrically connected to the enable terminal E of the signal register unit 3. The second register 212 is used to transmit the latch control signal or latch stop signal generated by the counter 211 to the enable terminal E of the signal register unit 3.

时钟模块22的第二输出端还与第二寄存器212的时钟输入端电连接,用于向第二寄存器212提供时钟信号。The second output terminal of the clock module 22 is also electrically connected to the clock input terminal of the second register 212 for providing a clock signal to the second register 212 .

具体实施时,计数器211接收到复位同步模块12发送的信号“1”后,开始计数,计数器211以及第二寄存器212在信号“1”的作用下停止复位。此时,在计数器211停止复位后,计数器211的第一输出端Q1输出信号“1”,时钟模块22的使能端E接收到信号“1”后,时钟模块22打开,并将信号输出至计数器211的计数端,计数器211对时钟模块22的输出信号进行计数,当计数器211的计数数值达到目标数值,即计数器211计数满后,计数器211的第一输出端Q1输出信号“0”,时钟模块22的使能端E接收到信号“0”后,时钟模块22关闭。同时,在计数器211启动后,计数器211计数满之前,计数器211的第二输出端Q2向第二寄存器212输出信号“0”,第二寄存器212在时钟信号的上升沿到来时,将信号“0”传输至信号寄存单元3的使能端E,此时信号寄存单元3不会对数据输入端D接收到的信号进行存储。在计数器211计数满后,计数器211的第二输出端向第二寄存器212输出信号“1”,第二寄存器212在时钟信号的上升沿到来时,将信号“1”传输至信号寄存单元3的使能端E,信号寄存单元3的使能端E接收到信号“1”后,对数据输入端接收到的信号进行存储。In specific implementation, after the counter 211 receives the signal "1" sent by the reset synchronization module 12, it starts counting, and the counter 211 and the second register 212 stop resetting under the action of the signal "1". At this time, after the counter 211 stops resetting, the first output terminal Q1 of the counter 211 outputs the signal "1", and after the enable terminal E of the clock module 22 receives the signal "1", the clock module 22 is turned on and outputs the signal to the counting terminal of the counter 211. The counter 211 counts the output signal of the clock module 22. When the count value of the counter 211 reaches the target value, that is, the counter 211 counts fully, the first output terminal Q1 of the counter 211 outputs the signal "0", and after the enable terminal E of the clock module 22 receives the signal "0", the clock module 22 is turned off. At the same time, after the counter 211 is started and before the counter 211 counts fully, the second output terminal Q2 of the counter 211 outputs a signal "0" to the second register 212. When the rising edge of the clock signal arrives, the second register 212 transmits the signal "0" to the enable terminal E of the signal register unit 3. At this time, the signal register unit 3 does not store the signal received by the data input terminal D. After the counter 211 counts fully, the second output terminal of the counter 211 outputs a signal "1" to the second register 212. When the rising edge of the clock signal arrives, the second register 212 transmits the signal "1" to the enable terminal E of the signal register unit 3. After the enable terminal E of the signal register unit 3 receives the signal "1", it stores the signal received by the data input terminal.

在一些实施例中,如图1所示,时钟模块22包括时钟门控器222和时钟信号端221。时钟信号端221分别与复位控制单元1的时钟输入端、计数寄存模块21的时钟输入端、信号寄存单元3的时钟输入端以及时钟门控器222的时钟输入端CP电连接,用于向复位控制单元1、计数寄存模块21、信号寄存单元3以及时钟门控器222提供时钟信号。In some embodiments, as shown in FIG1 , the clock module 22 includes a clock gate controller 222 and a clock signal terminal 221. The clock signal terminal 221 is electrically connected to the clock input terminal of the reset control unit 1, the clock input terminal of the counting register module 21, the clock input terminal of the signal register unit 3, and the clock input terminal CP of the clock gate controller 222, respectively, and is used to provide a clock signal to the reset control unit 1, the counting register module 21, the signal register unit 3, and the clock gate controller 222.

时钟门控器222的使能端E与计数寄存模块21的第一输出端电连接,时钟门控器222的输出端与计数寄存模块21的计数端电连接。The enable terminal E of the clock gating controller 222 is electrically connected to the first output terminal of the counting register module 21 , and the output terminal of the clock gating controller 222 is electrically connected to the counting terminal of the counting register module 21 .

具体实施时,当时钟门控器222的使能端E接收到计数器211输出的信号“1”时,时钟门控器222打开,时钟信号端221通过时钟门控器222向计数器211提供时钟信号,计数器211对时钟信号进行计数,例如,1个时钟信号的周期记为1,2个时钟信号的周期记为2,由此,当计数器211计满之后,计数器211就向时钟门口器的使能端E输出信号“0”,以控制时钟门控器222关闭,从而使得计数器211停止计数。In a specific implementation, when the enable terminal E of the clock gate controller 222 receives the signal "1" output by the counter 211, the clock gate controller 222 is turned on, and the clock signal terminal 221 provides a clock signal to the counter 211 through the clock gate controller 222. The counter 211 counts the clock signal. For example, the cycle of 1 clock signal is recorded as 1, and the cycle of 2 clock signals is recorded as 2. Therefore, when the counter 211 is full, the counter 211 outputs a signal "0" to the enable terminal E of the clock gate controller to control the clock gate controller 222 to be closed, so that the counter 211 stops counting.

在实际应用中,时钟信号端221用于向复位控制单元1、计数寄存模块21、信号寄存单元3以及时钟门控器222提供时钟信号,使用同一个时钟信号端221提供时钟信号,能够最大程度的避免锁存电路的时序混乱。时钟信号端221提供的时钟信号可以利用晶振时钟产生。In practical applications, the clock signal terminal 221 is used to provide a clock signal to the reset control unit 1, the counting register module 21, the signal register unit 3 and the clock gate controller 222. Using the same clock signal terminal 221 to provide a clock signal can avoid the timing confusion of the latch circuit to the greatest extent. The clock signal provided by the clock signal terminal 221 can be generated using a crystal oscillator clock.

在一种可能的实现方式中,如图1所示,信号寄存单元3包括第三寄存器31以及第四寄存器32。锁存控制单元2的输出端与第三寄存器31的使能端E电连接,第三寄存器31的数据输入端D与目标芯片管脚单元4电连接,第三寄存器31的输出端与第四寄存器32的数据输入端D电连接。第四寄存器32的输出端与外部测试模式信号端TM电连接。In a possible implementation, as shown in FIG1 , the signal register unit 3 includes a third register 31 and a fourth register 32. The output end of the latch control unit 2 is electrically connected to the enable end E of the third register 31, the data input end D of the third register 31 is electrically connected to the target chip pin unit 4, and the output end of the third register 31 is electrically connected to the data input end D of the fourth register 32. The output end of the fourth register 32 is electrically connected to the external test mode signal end TM.

具体的,当第三寄存器31的使能端E接收到信号“0”时,第三寄存器31处于非使能状态,此时不论时钟信号的上升沿是否到来,第三寄存器31都不会将数据输入端D接收的信号传输至输出端Q。第三寄存器31的使能端E接收到信号“1”时,第三寄存器31处于使能状态,此时,当时钟信号的上升沿到来时,第三寄存器31才会将数据输入端D接收的信号传输至输出端Q,第四寄存器32将接收到信号后,在下一个时钟周期的上升沿到来时,将采集到的信号传输至输出端Q,继而将信号提供至外部测试模式信号端TM。Specifically, when the enable terminal E of the third register 31 receives a signal "0", the third register 31 is in a non-enabled state. At this time, regardless of whether the rising edge of the clock signal arrives, the third register 31 will not transmit the signal received by the data input terminal D to the output terminal Q. When the enable terminal E of the third register 31 receives a signal "1", the third register 31 is in an enabled state. At this time, when the rising edge of the clock signal arrives, the third register 31 will transmit the signal received by the data input terminal D to the output terminal Q. After receiving the signal, the fourth register 32 will transmit the collected signal to the output terminal Q when the rising edge of the next clock cycle arrives, and then provide the signal to the external test mode signal terminal TM.

应注意,上述实施例中的第一寄存器、第二寄存器212、第三寄存器31以及第四寄存器32可以是上升沿寄存器,即只有在时钟信号的上升沿到来时,才能将数据输入端D的信号传输至输出端Q,或者,上述实施例中的第一寄存器、第二寄存器212、第三寄存器31以及第四寄存器32也可以是下降沿寄存器,即只有在时钟信号的下降沿到来时,才能将数据输入端D的信号传输至输出端Q,对此,本发明实施例不做具体限定。It should be noted that the first register, the second register 212, the third register 31 and the fourth register 32 in the above embodiments may be rising edge registers, that is, the signal at the data input terminal D can be transmitted to the output terminal Q only when the rising edge of the clock signal arrives, or the first register, the second register 212, the third register 31 and the fourth register 32 in the above embodiments may be falling edge registers, that is, the signal at the data input terminal D can be transmitted to the output terminal Q only when the falling edge of the clock signal arrives, and the embodiments of the present invention do not make specific limitations on this.

下面将结合图1和图2,以目标芯片管脚单元4的输入信号是信号“1”为例,详细说明本发明实施例提供的上电锁存电路的工作原理,以下说明仅用于解释,不作为限定。1 and 2 , taking the input signal of the target chip pin unit 4 as a signal “1” as an example, the working principle of the power-on latch circuit provided by the embodiment of the present invention will be described in detail. The following description is only for explanation and is not intended to be limiting.

首先控制上电复位模块11给芯片上电,时钟信号端221提供时钟信号。First, the power-on reset module 11 is controlled to power on the chip, and the clock signal terminal 221 provides a clock signal.

在上电过程中,上电复位模块11输出信号“0”;滤波模块13中的多个第一寄存器以及复位同步模块12中的输出信号均为信号“0”;计数器211的计数端以及复位端同时接收到信号“0”,计数器211的复位端生效,处于复位状态,计数器211的第一输出端Q1默认输出信号“1”,第二输出端Q2默认输出信号“0”,第二寄存器212的复位端、第三寄存器31的复位端以及第四寄存器32的复位端接收到信号“0”,复位端生效,第二寄存器212、第三寄存器31以及第四寄存器32均处于复位状态,输出为信号“0”,外部测试模式信号端TM也接收到信号“0”。During the power-on process, the power-on reset module 11 outputs a signal "0"; the output signals of the multiple first registers in the filtering module 13 and the reset synchronization module 12 are all signal "0"; the counting end and the reset end of the counter 211 simultaneously receive the signal "0", the reset end of the counter 211 takes effect and is in a reset state, the first output end Q1 of the counter 211 outputs a signal "1" by default, and the second output end Q2 outputs a signal "0" by default, the reset end of the second register 212, the reset end of the third register 31 and the reset end of the fourth register 32 receive the signal "0", the reset end takes effect, the second register 212, the third register 31 and the fourth register 32 are all in a reset state, and the output is a signal "0", and the external test mode signal end TM also receives a signal "0".

上电完成后,上电复位模块11的输出信号由信号“0”变为信号“1”,滤波模块13的输出信号由信号“0”变为信号“1”,复位同步模块12中的输出信号由信号“0”变为信号“1”,最后,计数器211的计数端和复位端、第二寄存器212的复位端、第三寄存器31的复位端以及第四寄存器32的复位端接收的信号均由信号“0”变为信号“1”,此时,芯片处于非复位状态,计数器211开始计数。计数器211的第一输出端Q1和计数器211的第二输出端Q2仍然为初始状态,即:Q1=1,Q2=0,时钟门控器222的门控仍然是打开的,第三寄存器31的使能端E接收到的信号仍为信号“0”,处于非使能状态。After power-on is completed, the output signal of the power-on reset module 11 changes from signal "0" to signal "1", the output signal of the filter module 13 changes from signal "0" to signal "1", and the output signal in the reset synchronization module 12 changes from signal "0" to signal "1". Finally, the signals received by the counting end and reset end of the counter 211, the reset end of the second register 212, the reset end of the third register 31, and the reset end of the fourth register 32 all change from signal "0" to signal "1". At this time, the chip is in a non-reset state, and the counter 211 starts counting. The first output end Q1 of the counter 211 and the second output end Q2 of the counter 211 are still in the initial state, that is, Q1=1, Q2=0, the gating of the clock gating controller 222 is still open, and the signal received by the enable end E of the third register 31 is still signal "0", which is in a non-enabled state.

当计数器211计满的当前时钟周期内,计数器211的第一输出端Q1=1,计数器211的第二输出端Q2=1,此时第二寄存器212的输入端开始变为信号“1”。When the counter 211 counts full in the current clock cycle, the first output terminal Q1 of the counter 211 is 1, and the second output terminal Q2 of the counter 211 is 1. At this time, the input terminal of the second register 212 starts to change to a signal “1”.

当计数器211计满后的第2个时钟周期内,计数器211的第一输出端Q1=0,时钟门控器222关闭,计数器211停止计数。计数器211的第二输出端Q2=0,第二寄存器212在时钟信号的上升沿到来时,将上一个周期内数据输入端接收到的信号“1”采集到输出端,使得第三寄存器31的使能端E接收到的信号为信号“1”,第三寄存器31处于使能状态。之后,第二寄存器212的数据输入端再次变为信号“0”。In the second clock cycle after the counter 211 counts full, the first output terminal Q1 of the counter 211 is 0, the clock gate controller 222 is closed, and the counter 211 stops counting. The second output terminal Q2 of the counter 211 is 0, and when the rising edge of the clock signal arrives, the second register 212 collects the signal "1" received at the data input terminal in the previous cycle to the output terminal, so that the signal received by the enable terminal E of the third register 31 is signal "1", and the third register 31 is in the enabled state. Afterwards, the data input terminal of the second register 212 becomes signal "0" again.

当计数器211计满后的第3个时钟周期内,由于第2个时钟周期内第三寄存器31的使能端E接收到的信号为信号“1”,第3个时钟周期可以将第三寄存器31的数据输入端D接收到的信号,即将目标芯片管脚单元4的输入信号传输至第三寄存器31的输出端Q。此时,第二寄存器212的输出端采集到在第2个时钟周期内计数器211的第二输出端Q2=0,则第三寄存器31的使能端E也是信号“0”。In the third clock cycle after the counter 211 is full, since the signal received by the enable terminal E of the third register 31 in the second clock cycle is signal "1", the signal received by the data input terminal D of the third register 31, that is, the input signal of the target chip pin unit 4, can be transmitted to the output terminal Q of the third register 31 in the third clock cycle. At this time, the output terminal of the second register 212 collects the second output terminal Q2=0 of the counter 211 in the second clock cycle, and the enable terminal E of the third register 31 is also signal "0".

当计数器211计满后的第4个时钟周期内,第四寄存器32采集到第3个时钟周期内第三寄存器31的输出,即为目标芯片管脚单元4的输入信号,由于第三寄存器31的使能端E接收到信号“0”,所以第三寄存器31的输出端Q一直保持目标芯片管脚单元4在计数器211计满后的第3个时钟周期内的输出信号不变。In the 4th clock cycle after the counter 211 is full, the fourth register 32 collects the output of the third register 31 in the 3rd clock cycle, which is the input signal of the target chip pin unit 4. Since the enable terminal E of the third register 31 receives the signal "0", the output terminal Q of the third register 31 always keeps the output signal of the target chip pin unit 4 in the 3rd clock cycle after the counter 211 is full unchanged.

锁存过程结束后,除非上电复位模块11重新上电,否则第四寄存器32一直输出锁存期内的目标芯片管脚单元4的输入信号。After the latching process is completed, unless the power-on reset module 11 is powered on again, the fourth register 32 keeps outputting the input signal of the target chip pin unit 4 during the latching period.

本发明实施例还提供一种上电锁存装置,包括上述实施例中提供的上电锁存电路。An embodiment of the present invention further provides a power-on latching device, comprising the power-on latching circuit provided in the above embodiment.

与现有技术相比,本发明实施例提供的上电锁存装置的有益效果与上述技术方案所述的上电锁存电路的有益效果相同,此处不做赘述。Compared with the prior art, the beneficial effects of the power-on latch device provided by the embodiment of the present invention are the same as the beneficial effects of the power-on latch circuit described in the above technical solution, which will not be described in detail here.

本发明实施例还提供一种上电锁存方法,应用于上述实施例中提供的上电锁存电路,所述上电锁存方法包括:An embodiment of the present invention further provides a power-on latching method, which is applied to the power-on latching circuit provided in the above embodiment. The power-on latching method includes:

锁存期内,控制复位控制单元向锁存控制单元提供锁存启动信号;During the latching period, the reset control unit is controlled to provide a latching start signal to the latching control unit;

响应于锁存启动信号,锁存控制单元向信号寄存单元提供锁存控制信号;In response to the latch start signal, the latch control unit provides a latch control signal to the signal register unit;

响应于锁存控制信号,信号寄存单元对目标芯片管脚单元的输入信号进行锁存,并将锁存的输入信号传输至外部测试模式信号端;In response to the latch control signal, the signal register unit latches the input signal of the target chip pin unit and transmits the latched input signal to the external test mode signal terminal;

锁存期后,锁存控制单元向信号寄存单元提供锁存停止信号;After the latching period, the latching control unit provides a latching stop signal to the signal registering unit;

响应于锁存停止信号,信号寄存单元停止锁存目标芯片管脚单元的输入信号。In response to the latch stop signal, the signal register unit stops latching the input signal of the target chip pin unit.

与现有技术相比,本发明实施例提供的上电锁存方法的有益效果与上述技术方案所述的上电锁存电路的有益效果相同,此处不做赘述。Compared with the prior art, the beneficial effects of the power-on latching method provided by the embodiment of the present invention are the same as the beneficial effects of the power-on latching circuit described in the above technical solution, which will not be described in detail here.

尽管在此结合各实施例对本发明进行了描述,然而,在实施所要求保护的本发明过程中,本领域技术人员通过查看附图、公开内容、以及所附权利要求书,可理解并实现公开实施例的其他变化。在权利要求中,“包括”(comprising)一词不排除其他组成部分或步骤,“一”或“一个”不排除多个的情况。单个处理器或其他单元可以实现权利要求中列举的若干项功能。相互不同的从属权利要求中记载了某些措施,但这并不表示这些措施不能组合起来产生良好的效果。Although the present invention is described herein in conjunction with various embodiments, in the process of implementing the claimed invention, those skilled in the art may understand and implement other variations of the disclosed embodiments by viewing the drawings, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other components or steps, and "one" or "an" does not exclude multiple situations. A single processor or other unit may implement several functions listed in the claims. Certain measures are recorded in different dependent claims, but this does not mean that these measures cannot be combined to produce good results.

尽管结合具体特征及其实施例对本发明进行了描述,显而易见的,在不脱离本发明的精神和范围的情况下,可对其进行各种修改和组合。相应地,本说明书和附图仅仅是所附权利要求所界定的本发明的示例性说明,且视为已覆盖本发明范围内的任意和所有修改、变化、组合或等同物。显然,本领域的技术人员可以对本发明进行各种改动和变型而不脱离本发明的精神和范围。这样,倘若本发明的这些修改和变型属于本发明权利要求及其等同技术的范围之内,则本发明也意图包括这些改动和变型在内。Although the present invention has been described in conjunction with specific features and embodiments thereof, it is apparent that various modifications and combinations may be made thereto without departing from the spirit and scope of the present invention. Accordingly, this specification and the accompanying drawings are merely exemplary illustrations of the present invention as defined by the appended claims and are deemed to cover any and all modifications, variations, combinations or equivalents within the scope of the present invention. Obviously, those skilled in the art may make various modifications and variations to the present invention without departing from the spirit and scope of the present invention. Thus, the present invention is intended to include such modifications and variations if they fall within the scope of the claims of the present invention and their equivalents.

Claims (9)

1.一种上电锁存电路,其特征在于,用于对目标芯片管脚单元的输入信号进行锁存,包括复位控制单元、锁存控制单元以及信号寄存单元,其中:1. A power-on latch circuit, characterized in that it is used to latch the input signal of the target chip pin unit, comprising a reset control unit, a latch control unit and a signal register unit, wherein: 所述复位控制单元的输出端与所述锁存控制单元的输入端电连接,所述锁存控制单元的输出端与所述信号寄存单元的使能端电连接,所述目标芯片管脚单元与所述信号寄存单元的数据输入端电连接,所述信号寄存单元的输出端与外部测试模式信号端电连接;The output end of the reset control unit is electrically connected to the input end of the latch control unit, the output end of the latch control unit is electrically connected to the enable end of the signal register unit, the target chip pin unit is electrically connected to the data input end of the signal register unit, and the output end of the signal register unit is electrically connected to the external test mode signal end; 所述复位控制单元包括上电复位模块和复位同步模块,其中:The reset control unit includes a power-on reset module and a reset synchronization module, wherein: 所述上电复位模块的输出端与所述复位同步模块的数据输入端电连接,用于向所述复位同步模块提供上电复位信号,所述复位同步模块的输出端与所述锁存控制单元的输入端、所述锁存控制单元的复位端以及所述信号寄存单元的复位端电连接,用于根据所述上电复位信号,向所述锁存控制单元的输入端、所述锁存控制单元的复位端以及所述信号寄存单元的复位端提供锁存启动信号;The output end of the power-on reset module is electrically connected to the data input end of the reset synchronization module, and is used to provide a power-on reset signal to the reset synchronization module; the output end of the reset synchronization module is electrically connected to the input end of the latch control unit, the reset end of the latch control unit, and the reset end of the signal register unit, and is used to provide a latch start signal to the input end of the latch control unit, the reset end of the latch control unit, and the reset end of the signal register unit according to the power-on reset signal; 在锁存期内,所述复位控制单元用于向所述锁存控制单元提供锁存启动信号,所述锁存控制单元用于在所述锁存启动信号的作用下,生成锁存控制信号,并将所述锁存控制信号发送给所述信号寄存单元;所述信号寄存单元用于根据所述锁存控制信号,对所述目标芯片管脚单元的输入信号进行锁存,并将锁存的所述输入信号传输至所述外部测试模式信号端;During the latch period, the reset control unit is used to provide a latch start signal to the latch control unit, and the latch control unit is used to generate a latch control signal under the action of the latch start signal, and send the latch control signal to the signal register unit; the signal register unit is used to latch the input signal of the target chip pin unit according to the latch control signal, and transmit the latched input signal to the external test mode signal terminal; 在锁存期后,所述锁存控制单元还用于生成锁存停止信号,并将所述锁存停止信号发送给所述信号寄存单元;所述信号寄存单元用于根据所述锁存停止信号,停止锁存所述目标芯片管脚单元的输入信号。After the latch period, the latch control unit is further used to generate a latch stop signal and send the latch stop signal to the signal register unit; the signal register unit is used to stop latching the input signal of the target chip pin unit according to the latch stop signal. 2.根据权利要求1所述的上电锁存电路,其特征在于,所述复位控制单元还包括滤波模块,所述滤波模块的数据输入端与所述上电复位模块的输出端电连接,所述滤波模块的输出端与所述复位同步模块的数据输入端电连接,所述滤波模块用于对所述上电复位信号进行滤波,并将滤波后所述上电复位信号传输至所述复位同步模块。2. The power-on latch circuit according to claim 1 is characterized in that the reset control unit also includes a filtering module, a data input end of the filtering module is electrically connected to an output end of the power-on reset module, an output end of the filtering module is electrically connected to a data input end of the reset synchronization module, and the filtering module is used to filter the power-on reset signal and transmit the filtered power-on reset signal to the reset synchronization module. 3.根据权利要求2所述的上电锁存电路,其特征在于,所述滤波模块包括多个第一寄存器以及或门,其中:3. The power-on latch circuit according to claim 2, wherein the filtering module comprises a plurality of first registers and an OR gate, wherein: 所述多个第一寄存器串联,每个所述第一寄存器的输出端还与所述或门的相应输入端电连接,所述或门的输出端与所述复位同步模块的输入端电连接。The multiple first registers are connected in series, and the output end of each of the first registers is also electrically connected to the corresponding input end of the OR gate, and the output end of the OR gate is electrically connected to the input end of the reset synchronization module. 4.根据权利要求1所述的上电锁存电路,其特征在于,所述锁存控制单元包括计数寄存模块以及时钟模块,其中:4. The power-on latch circuit according to claim 1, wherein the latch control unit comprises a counting register module and a clock module, wherein: 所述计数寄存模块的输入端与所述复位控制单元的输出端电连接,用于在所述锁存启动信号的控制下开始计数;所述计数寄存模块的复位端与所述复位控制单元的输出端电连接,用于在所述锁存启动信号的作用下,停止复位;The input end of the counting register module is electrically connected to the output end of the reset control unit, and is used to start counting under the control of the latch start signal; the reset end of the counting register module is electrically connected to the output end of the reset control unit, and is used to stop resetting under the action of the latch start signal; 所述计数寄存模块的第一输出端与所述时钟模块的使能端电连接,用于控制所述时钟模块打开,所述时钟模块的第一输出端与所述计数寄存模块的计数端电连接,所述计数寄存模块用于对所述时钟模块的输出信号进行计数;所述计数寄存模块还用于当所述计数寄存模块的计数数值达到目标数值后,控制所述时钟模块关闭;The first output end of the counting register module is electrically connected to the enable end of the clock module, and is used to control the clock module to be turned on. The first output end of the clock module is electrically connected to the counting end of the counting register module, and the counting register module is used to count the output signal of the clock module; the counting register module is also used to control the clock module to be turned off when the count value of the counting register module reaches the target value; 所述计数寄存模块的第二输出端与所述信号寄存单元的使能端电连接,用于当所述计数寄存模块的计数数值达到目标数值后,生成所述锁存控制信号,所述锁存控制信号用于控制所述信号寄存单元对所述目标芯片管脚单元的输入信号进行锁存;The second output end of the counting register module is electrically connected to the enable end of the signal register unit, and is used to generate the latch control signal when the count value of the counting register module reaches the target value, and the latch control signal is used to control the signal register unit to latch the input signal of the target chip pin unit; 在锁存期后,所述计数寄存模块还用于生成所述锁存停止信号,所述锁存停止信号用于控制所述信号寄存单元停止锁存所述目标芯片管脚单元的输入信号;After the latch period, the counting register module is further used to generate the latch stop signal, and the latch stop signal is used to control the signal register unit to stop latching the input signal of the target chip pin unit; 所述时钟模块的第二输出端分别与所述复位控制单元的时钟输入端、所述计数寄存模块的时钟输入端以及所述信号寄存单元的时钟输入端电连接,用于向所述复位控制单元、所述计数寄存模块以及所述信号寄存单元提供时钟信号。The second output end of the clock module is electrically connected to the clock input end of the reset control unit, the clock input end of the counting register module and the clock input end of the signal register unit respectively, and is used to provide a clock signal to the reset control unit, the counting register module and the signal register unit. 5.根据权利要求4所述的上电锁存电路,其特征在于,所述计数寄存模块包括计数器和第二寄存器,其中:5. The power-on latch circuit according to claim 4, characterized in that the counting register module comprises a counter and a second register, wherein: 所述计数器的输入端以及复位端均与所述复位控制单元的输出端电连接,所述计数器的第一输出端与所述时钟模块的使能端电连接,所述时钟模块的第一输出端与所述计数器的计数端电连接,所述计数器用于在所述锁存启动信号的控制下,控制所述时钟模块打开,并对所述时钟模块的输出信号进行计数;The input terminal and the reset terminal of the counter are both electrically connected to the output terminal of the reset control unit, the first output terminal of the counter is electrically connected to the enable terminal of the clock module, the first output terminal of the clock module is electrically connected to the counting terminal of the counter, and the counter is used to control the clock module to turn on under the control of the latch start signal and count the output signal of the clock module; 所述计数器的第二输出端与所述第二寄存器的数据输入端电连接,所述第二寄存器的输出端与所述信号寄存单元的使能端电连接,所述第二寄存器用于将所述计数器生成的所述锁存控制信号或所述锁存停止信号传输至所述信号寄存单元的使能端;The second output end of the counter is electrically connected to the data input end of the second register, the output end of the second register is electrically connected to the enable end of the signal register unit, and the second register is used to transmit the latch control signal or the latch stop signal generated by the counter to the enable end of the signal register unit; 所述时钟模块的第二输出端还与所述第二寄存器的时钟输入端电连接,用于向所述第二寄存器提供所述时钟信号。The second output terminal of the clock module is also electrically connected to the clock input terminal of the second register, and is used to provide the clock signal to the second register. 6.根据权利要求4所述的上电锁存电路,其特征在于,所述时钟模块包括时钟门控器和时钟信号端,其中:6. The power-on latch circuit according to claim 4, characterized in that the clock module comprises a clock gate controller and a clock signal terminal, wherein: 所述时钟信号端分别与所述复位控制单元的时钟输入端、所述计数寄存模块的时钟输入端、所述信号寄存单元的时钟输入端以及所述时钟门控器的时钟输入端电连接,用于向所述复位控制单元、所述计数寄存模块、所述信号寄存单元以及所述时钟门控器提供所述时钟信号;The clock signal terminal is electrically connected to the clock input terminal of the reset control unit, the clock input terminal of the counting register module, the clock input terminal of the signal register unit and the clock input terminal of the clock gate controller, respectively, and is used to provide the clock signal to the reset control unit, the counting register module, the signal register unit and the clock gate controller; 所述时钟门控器的使能端与所述计数寄存模块的第一输出端电连接,所述时钟门控器的输出端与所述计数寄存模块的计数端电连接。The enable end of the clock gating controller is electrically connected to the first output end of the counting register module, and the output end of the clock gating controller is electrically connected to the counting end of the counting register module. 7.根据权利要求1所述的上电锁存电路,其特征在于,所述信号寄存单元包括第三寄存器以及第四寄存器,其中:7. The power-on latch circuit according to claim 1, wherein the signal register unit comprises a third register and a fourth register, wherein: 所述锁存控制单元的输出端与所述第三寄存器的使能端电连接,所述第三寄存器的数据输入端与所述目标芯片管脚单元电连接,所述第三寄存器的输出端与所述第四寄存器的数据输入端电连接;The output end of the latch control unit is electrically connected to the enable end of the third register, the data input end of the third register is electrically connected to the target chip pin unit, and the output end of the third register is electrically connected to the data input end of the fourth register; 所述第四寄存器的输出端与所述外部测试模式信号端电连接。The output terminal of the fourth register is electrically connected to the external test mode signal terminal. 8.一种上电锁存装置,其特征在于,包括权利要求1-7任一项所述的上电锁存电路。8. A power-on latch device, characterized by comprising the power-on latch circuit according to any one of claims 1 to 7. 9.一种上电锁存方法,其特征在于,应用于权利要求1-7任一项所述的上电锁存电路,所述上电锁存方法包括:9. A power-on latching method, characterized in that it is applied to the power-on latching circuit according to any one of claims 1 to 7, and the power-on latching method comprises: 锁存期内,控制复位控制单元向锁存控制单元提供锁存启动信号;During the latching period, the reset control unit is controlled to provide a latching start signal to the latching control unit; 响应于所述锁存启动信号,所述锁存控制单元向信号寄存单元提供锁存控制信号;In response to the latch start signal, the latch control unit provides a latch control signal to the signal register unit; 响应于所述锁存控制信号,所述信号寄存单元对目标芯片管脚单元的输入信号进行锁存,并将锁存的所述输入信号传输至外部测试模式信号端;In response to the latch control signal, the signal register unit latches the input signal of the target chip pin unit, and transmits the latched input signal to the external test mode signal terminal; 锁存期后,所述锁存控制单元向所述信号寄存单元提供锁存停止信号;After the latch period, the latch control unit provides a latch stop signal to the signal register unit; 响应于所述锁存停止信号,所述信号寄存单元停止锁存所述目标芯片管脚单元的输入信号。In response to the latch stop signal, the signal register unit stops latching the input signal of the target chip pin unit.
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