CN102636445A - Method for testing error compensation with spectrophotometer - Google Patents
Method for testing error compensation with spectrophotometer Download PDFInfo
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- CN102636445A CN102636445A CN2012101277667A CN201210127766A CN102636445A CN 102636445 A CN102636445 A CN 102636445A CN 2012101277667 A CN2012101277667 A CN 2012101277667A CN 201210127766 A CN201210127766 A CN 201210127766A CN 102636445 A CN102636445 A CN 102636445A
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- haze
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- 238000012360 testing method Methods 0.000 title claims abstract description 57
- 238000000034 method Methods 0.000 title claims abstract description 25
- 239000011521 glass Substances 0.000 claims abstract description 14
- 239000003595 mist Substances 0.000 claims description 17
- 230000005540 biological transmission Effects 0.000 claims description 11
- 239000004809 Teflon Substances 0.000 claims description 6
- 229920006362 Teflon® Polymers 0.000 claims description 6
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 claims description 6
- 239000000470 constituent Substances 0.000 claims description 5
- 239000004576 sand Substances 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 4
- 238000007747 plating Methods 0.000 claims description 4
- 230000008092 positive effect Effects 0.000 claims description 4
- 239000000126 substance Substances 0.000 claims description 4
- 239000010409 thin film Substances 0.000 claims description 4
- 238000012545 processing Methods 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 abstract description 3
- 238000002834 transmittance Methods 0.000 abstract 5
- 230000008520 organization Effects 0.000 abstract 2
- 238000004140 cleaning Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000011056 performance test Methods 0.000 description 3
- 239000000428 dust Substances 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
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Abstract
The invention relates to a method for testing error compensation with a spectrophotometer, belonging to the solar cell optical properties testing technology. The technical scheme comprises the following steps: selecting a TCO (transparent conductive oxide) glass sample, testing total transmittance (TT) and diffuse transmittance (DT) in a third-party testing organization, and calculating the Haze value at a wavelength of 600nm as a calibration value; performing baseline calibration of a spectrophotometer with a contaminated integrating sphere whiteboard, testing the TT and DT values of the sample, calculating the Haze value at a wavelength of 600nm, comparing with the calibration value, calculating the Haze difference, and performing compensation to the test value by a formula of Haze = TT/ DT. The method provided by the invention compensates the test results by observing the difference between the actual test value and the calibration value of a third-party testing organization to achieve the purpose of improving test accuracy, thereby reducing consumables usage and testing cost.
Description
Technical field
The present invention relates to a kind of method of spectrophotometer test error compensation, belong to solar cell optical performance test technical field.
Background technology
In the solar cell actual production process, need carry out performance test to the semi-manufacture that each operation produces, confirm whether can reach the technological requirement of expection; Need be in the thin film solar production run to front glass and the back of the body glass that is coated with transparent conductive oxide; Be called for short TCO glass and carry out optical performance tests such as total transmissivity TT, diffuse transmission DT, mist degree Haze, test uses instrument to be the UV, visible light near infrared spectrometer, but because in test process; Operating personnel need the integrating sphere blank in the instrument is frequent dismounting and installation; Make the integrating sphere blank be easy to polluted, proofread and correct because the integrating sphere blank is used to test preceding instrument baseline straightening degree, if the integrating sphere blank is contaminated; Will cause test result higher, accuracy descends.At present; The method that does not also have spectrophotometer effectively to clean the integrating sphere blank, the integrating sphere blank can only constantly be changed as consumptive material, because the integrating sphere blank costs an arm and a leg; This is undoubtedly a no small investment concerning spectrophotometer uses frequent thin film solar industry.
Summary of the invention
The method that the purpose of this invention is to provide a kind of spectrophotometer test error compensation; Test result is compensated; Reach the purpose that improves test accuracy; Avoid causing test accuracy to descend, thereby reduce consumptive material use amount and testing cost, solve the problems referred to above that background technology exists because of blank pollutes.
Technical scheme of the present invention is: a kind of method of spectrophotometer test error compensation; Comprise following processing step: 1. the integrating sphere blank that has polluted is cleaned; Cleaner front and back sample test result's difference if there is not positive effect, just needs test data is compensated; 2. choose a slice TCO glass sample, total transmissivity TT, diffuse transmission DT value tested, and the mist degree Haze value when calculating wavelength and being 600nm in third party testing agency, and with this haze value as calibration value; 3. with above-mentioned contaminated integrating sphere blank spectrophotometer is carried out total transmissivity TT, the diffuse transmission DT value of baseline calibration and specimen; And the mist degree Haze value when calculating wavelength and being 600nm; Compare with calibration value; Calculate mist degree Haze difference, and then test value is compensated mist degree Haze=total transmissivity TT value/diffuse transmission DT value.
Described total transmissivity TT, diffuse transmission DT value are tested wavelength 300 to 2000nm, step-length 5nm, relatively the mist degree Haze value at 600nm place.
Said TCO glass is plating ZnO glass and back of the body plating ZnO glass before the thin-film solar cells.
Said spectrophotometric is counted lambda950 series spectrophotometer.
Described integrating sphere blank has two kinds of heterogeneities, adopts different clean methods, and first kind of integrating sphere blank constituent is teflon; Be commonly called as the Helen; Chemical formula (CF2CF2) m forms its stable chemical performance with the compacting of compacting instrument; Be difficult for reacting, but quality is softer with acidity and alkaline matter; Clean method: use sand papering; Second kind of integrating sphere blank constituent is that teflon and BaSO4 mix, and its stable chemical performance is difficult for reacting with acidity and alkaline matter, and quality is harder; Clean method: with its surface of rubber wiping.
Good effect of the present invention: spectrophotometric integrating sphere blank very easily receives the pollution of external environment, and can't clear up, thereby causes sample DT and TT value to raise, and then causes the Haze test value bigger than normal.If reach with the method that more renews the integrating sphere blank and to test purpose accurately, this can let spectrophotometer use frequent enterprise constantly to increase testing cost.The present invention compensates test result through the difference between the calibration value of the actual test value of observation sample and the third-party institution, reaches the purpose that improves test accuracy, thereby reduces consumptive material use amount and testing cost.
Description of drawings
Fig. 1 is the embodiment of the invention one new integrating sphere blank, contaminated integrating sphere blank and cleaning back integrating sphere blank TT test data comparison diagram;
Fig. 2 is the embodiment of the invention one new integrating sphere blank, contaminated integrating sphere blank and cleaning back integrating sphere blank Drive Test data comparison diagram;
Fig. 3 is the embodiment of the invention two new integrating sphere blanks, contaminated integrating sphere blank and cleaning back integrating sphere blank TT test data comparison diagram;
Fig. 4 is the embodiment of the invention two new integrating sphere blanks, contaminated integrating sphere blank and cleaning back integrating sphere blank Drive Test data comparison diagram.
Embodiment
Below in conjunction with accompanying drawing, the present invention is further specified through embodiment.
Embodiment one:
For constituent is the integrating sphere blank of teflon; The method cleaning of NO360# sand papering is adopted in contaminated back, and concrete grammar is for using the NO360# waterproof abrasive paper, towards a direction polishing; And use the non-dust cloth wiped clean, there are not spot or other impurity until whiteboard surface.Before and after the cleaning, to carry out total transmissivity TT, diffuse transmission DT value test comparison with a slice TCO glass sample, method of testing is: in wavelength coverage is the 300-2000nm scope, and sampling interval 5nm.The result sees figures.1.and.2; Find by the result, do not have positive effect with the method cleaning blank of sand papering, so need compensate test data; Method is following: send third party testing agency to demarcate in sample; Carry out the mist degree Haze value that the instrument baseline correction also continues 7 days specimen with contaminated blank, ask its mean value, the result is following:
| wavelength（nm） | Contaminated blank (Haze) | Third party's mechanism for testing result (Haze) | |
| 600 | 28.37% | 24.76% | -3.61% |
Continue 7 days specimen, calculate the mean value of mist degree Haze, carry out difference with third party's test result and be calculated as 3.61%, still need the sample test result be deducted 3.6% deviation, be the exact value of mist degree Haze.
Embodiment two:
For composition is that teflon and BaSO4 mix the integrating sphere blank, and the method wiping of common rubber wiping is adopted in contaminated back, and concrete grammar is that whiteboard surface is cleaned with non-dust cloth in wiping limit, limit, does not have spot or other impurity until the surface.To carry out total transmissivity TT, diffuse transmission DT value test comparison with a slice TCO glass sample, in wavelength coverage is the 300-2000nm scope, sampling interval 5nm.The result is with reference to Fig. 3 and Fig. 4, found by the result, cleans blank with the method for sand papering and do not have positive effect.With this blank instrument is carried out baseline calibration equally, and continue the mist degree Haze value of 7 days specimen, ask its mean value, the result is following:
| wavelength（nm） | Cleaning back (Haze) | Third party's mechanism for testing result (Haze) | Difference (Haze) |
| 600 | 29.12% | 24.76% | -4.36% |
Continue 7 days specimen, calculate the mean value of mist degree Haze, carry out difference with third party's test result and be calculated as 4.36%, still need the sample test result be deducted 4.4% deviation, be the exact value of mist degree Haze.
Claims (4)
1. the method for spectrophotometer test error compensation; It is characterized in that comprising following processing step: 1. the integrating sphere blank that has polluted is cleaned; Cleaner front and back sample test result's difference if there is not positive effect, just needs test data is compensated; 2. choose a slice TCO glass sample, total transmissivity TT, diffuse transmission DT value tested, and the mist degree Haze value when calculating wavelength and being 600nm in third party testing agency, and with this haze value as calibration value; 3. with above-mentioned contaminated integrating sphere blank spectrophotometer is carried out total transmissivity TT, the diffuse transmission DT value of baseline calibration and specimen; And the mist degree Haze value when calculating wavelength and being 600nm; Compare with calibration value; Calculate mist degree Haze difference, and then test value is compensated mist degree Haze=total transmissivity TT value/diffuse transmission DT value.
2. according to the method for the said a kind of spectrophotometer test error compensation of claim 1, it is characterized in that describedly total transmissivity TT, diffuse transmission DT value being tested wavelength 300 to 2000nm, step-length 5nm, the mist degree Haze value at comparison 600nm place.
3. according to the method for claim 1 or 2 said a kind of spectrophotometer test errors compensation, it is characterized in that said TCO glass is plating ZnO glass and back of the body plating ZnO glass before the thin-film solar cells; Said spectrophotometric is counted lambda950 series spectrophotometer.
4. according to the method for claim 1 or 2 said a kind of spectrophotometer test errors compensation; It is characterized in that described integrating sphere blank has two kinds of heterogeneities; Adopt different clean methods, first kind of integrating sphere blank constituent is teflon, chemical formula (CF2CF2) m; Form clean method with the compacting of compacting instrument: use sand papering; Second kind of integrating sphere blank constituent is that teflon and BaSO4 mix clean method: with its surface of rubber wiping.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012101277667A CN102636445A (en) | 2012-04-27 | 2012-04-27 | Method for testing error compensation with spectrophotometer |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2012101277667A CN102636445A (en) | 2012-04-27 | 2012-04-27 | Method for testing error compensation with spectrophotometer |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1864110A2 (en) * | 2005-03-04 | 2007-12-12 | Sun Chemical Corporation | Method and apparatus for measuring the transparency of a film |
| CN102163648A (en) * | 2010-02-12 | 2011-08-24 | 住友重机械工业株式会社 | Manufacture method for solar cell and solar cell |
| CN102519915A (en) * | 2011-12-28 | 2012-06-27 | 北京奥博泰科技有限公司 | Spectral measuring device and method for spectral haze of photovoltaic glass |
-
2012
- 2012-04-27 CN CN2012101277667A patent/CN102636445A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1864110A2 (en) * | 2005-03-04 | 2007-12-12 | Sun Chemical Corporation | Method and apparatus for measuring the transparency of a film |
| CN102163648A (en) * | 2010-02-12 | 2011-08-24 | 住友重机械工业株式会社 | Manufacture method for solar cell and solar cell |
| CN102519915A (en) * | 2011-12-28 | 2012-06-27 | 北京奥博泰科技有限公司 | Spectral measuring device and method for spectral haze of photovoltaic glass |
Non-Patent Citations (2)
| Title |
|---|
| 夏铭等: "《透光率/雾度仪校准结果的不确定度评定》", 《计测技术》 * |
| 鲁大学: "《透明导电氧化物镀膜玻璃在光伏电池中的应用》", 《玻璃深加工》 * |
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Application publication date: 20120815 |