CN101750765B - 液晶显示器公共电极线断线不良的检测方法 - Google Patents
液晶显示器公共电极线断线不良的检测方法 Download PDFInfo
- Publication number
- CN101750765B CN101750765B CN2008102403783A CN200810240378A CN101750765B CN 101750765 B CN101750765 B CN 101750765B CN 2008102403783 A CN2008102403783 A CN 2008102403783A CN 200810240378 A CN200810240378 A CN 200810240378A CN 101750765 B CN101750765 B CN 101750765B
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- pixel electrode
- voltage
- common electrode
- picture
- liquid crystal
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- 238000001514 detection method Methods 0.000 title claims abstract description 68
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 56
- 230000008859 change Effects 0.000 claims description 37
- 238000000034 method Methods 0.000 abstract description 21
- 230000008569 process Effects 0.000 abstract description 13
- 238000012423 maintenance Methods 0.000 abstract description 3
- 239000000463 material Substances 0.000 abstract description 3
- 239000002699 waste material Substances 0.000 abstract description 3
- 239000003990 capacitor Substances 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 18
- 230000000694 effects Effects 0.000 description 15
- 230000005540 biological transmission Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 239000012528 membrane Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000010422 painting Methods 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Liquid Crystal (AREA)
- Liquid Crystal Display Device Control (AREA)
Abstract
Description
Claims (13)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008102403783A CN101750765B (zh) | 2008-12-18 | 2008-12-18 | 液晶显示器公共电极线断线不良的检测方法 |
| US12/638,020 US8417020B2 (en) | 2008-12-18 | 2009-12-15 | Method for detecting the line broken fault of common electrode lines of LCD |
| JP2009286840A JP5514530B2 (ja) | 2008-12-18 | 2009-12-17 | 液晶ディスプレーにおける共通電極線の断線不良の測定方法 |
| KR1020090126784A KR101109760B1 (ko) | 2008-12-18 | 2009-12-18 | 액정 디스플레이에서의 공통 전극선의 단선 불량의 측정 방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008102403783A CN101750765B (zh) | 2008-12-18 | 2008-12-18 | 液晶显示器公共电极线断线不良的检测方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101750765A CN101750765A (zh) | 2010-06-23 |
| CN101750765B true CN101750765B (zh) | 2011-12-28 |
Family
ID=42266187
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008102403783A Expired - Fee Related CN101750765B (zh) | 2008-12-18 | 2008-12-18 | 液晶显示器公共电极线断线不良的检测方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8417020B2 (zh) |
| JP (1) | JP5514530B2 (zh) |
| KR (1) | KR101109760B1 (zh) |
| CN (1) | CN101750765B (zh) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102810304B (zh) * | 2012-08-09 | 2015-02-18 | 京东方科技集团股份有限公司 | 一种像素单元、像素结构、显示装置及像素驱动方法 |
| CN103969538B (zh) | 2013-01-24 | 2016-11-16 | 上海天马微电子有限公司 | 内嵌式触摸屏的电测试方法 |
| CN103293771B (zh) * | 2013-06-26 | 2015-11-25 | 深圳市华星光电技术有限公司 | 液晶配向检查机及方法 |
| JP2016102932A (ja) * | 2014-11-28 | 2016-06-02 | 株式会社ジャパンディスプレイ | 液晶表示装置 |
| CN104898333B (zh) * | 2015-06-17 | 2017-07-28 | 合肥鑫晟光电科技有限公司 | 一种阵列基板及其线不良维修方法、显示装置 |
| CN106128407B (zh) * | 2016-09-13 | 2018-12-07 | 深圳市华星光电技术有限公司 | 像素驱动方法及像素驱动系统 |
| TWI703511B (zh) * | 2019-07-09 | 2020-09-01 | 洽吧智能股份有限公司 | 螢幕裂損檢測系統 |
| CN116665563A (zh) * | 2023-04-19 | 2023-08-29 | 重庆惠科金渝光电科技有限公司 | 显示面板的检测方法及显示面板的检测装置 |
| CN116189631B (zh) | 2023-04-24 | 2023-07-11 | 惠科股份有限公司 | 驱动方法、装置、液晶显示设备及存储介质 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6340963B1 (en) * | 1998-11-26 | 2002-01-22 | Hitachi, Ltd. | Liquid crystal display device |
| CN1247999C (zh) * | 2000-07-05 | 2006-03-29 | Oht株式会社 | 检查装置及检查方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1993023845A1 (en) * | 1992-05-14 | 1993-11-25 | Seiko Epson Corporation | Liquid crystal display and electronic equipment using the liquid crystal display |
| JP2889132B2 (ja) * | 1994-10-12 | 1999-05-10 | 株式会社フロンテック | 薄膜トランジスタの検査装置 |
| KR100370801B1 (ko) | 1998-09-30 | 2003-12-01 | 엘지.필립스 엘시디 주식회사 | 박막트랜지스터어레이기판의검사방법 |
| JP4308376B2 (ja) * | 1999-08-09 | 2009-08-05 | セイコーインスツル株式会社 | 指紋読み取り装置 |
| KR100675088B1 (ko) * | 2000-02-16 | 2007-01-26 | 엘지.필립스 엘시디 주식회사 | 액정 표시장치 및 액정 표시장치 제조방법 |
| JP2002258232A (ja) * | 2001-02-28 | 2002-09-11 | Advanced Display Inc | 液晶表示装置の検査方法及び検査装置 |
| JP4487024B2 (ja) * | 2002-12-10 | 2010-06-23 | 株式会社日立製作所 | 液晶表示装置の駆動方法および液晶表示装置 |
| KR100543714B1 (ko) * | 2003-02-13 | 2006-01-20 | 공재연 | 디스플레이 장치의 화소 검사방법 및 검사장치 |
| KR101056373B1 (ko) * | 2004-09-07 | 2011-08-11 | 삼성전자주식회사 | 액정 표시 장치의 아날로그 구동 전압 및 공통 전극 전압발생 장치 및 액정 표시 장치의 아날로그 구동 전압 및공통 전극 전압 제어 방법 |
| US7466161B2 (en) * | 2005-04-22 | 2008-12-16 | Photon Dynamics, Inc. | Direct detect sensor for flat panel displays |
| KR20070029393A (ko) * | 2005-09-09 | 2007-03-14 | 삼성전자주식회사 | 표시 장치의 제조 장치 및 방법 |
| JP2007140315A (ja) * | 2005-11-22 | 2007-06-07 | Sony Corp | 発光装置 |
| JP4831525B2 (ja) * | 2006-02-28 | 2011-12-07 | 株式会社島津製作所 | Tftアレイの検査方法及びtftアレイ検査装置 |
| KR20080066308A (ko) | 2007-01-12 | 2008-07-16 | 삼성전자주식회사 | 표시패널, 이의 검사방법 및 이의 제조방법 |
-
2008
- 2008-12-18 CN CN2008102403783A patent/CN101750765B/zh not_active Expired - Fee Related
-
2009
- 2009-12-15 US US12/638,020 patent/US8417020B2/en not_active Expired - Fee Related
- 2009-12-17 JP JP2009286840A patent/JP5514530B2/ja not_active Expired - Fee Related
- 2009-12-18 KR KR1020090126784A patent/KR101109760B1/ko active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6340963B1 (en) * | 1998-11-26 | 2002-01-22 | Hitachi, Ltd. | Liquid crystal display device |
| CN1247999C (zh) * | 2000-07-05 | 2006-03-29 | Oht株式会社 | 检查装置及检查方法 |
Non-Patent Citations (1)
| Title |
|---|
| JP特开2008-171000A 2008.07.24 |
Also Published As
| Publication number | Publication date |
|---|---|
| US8417020B2 (en) | 2013-04-09 |
| JP5514530B2 (ja) | 2014-06-04 |
| KR101109760B1 (ko) | 2012-03-13 |
| US20100158347A1 (en) | 2010-06-24 |
| KR20100071018A (ko) | 2010-06-28 |
| JP2010146004A (ja) | 2010-07-01 |
| CN101750765A (zh) | 2010-06-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: JINGDONGFANG SCIENCE AND TECHNOLOGY GROUP CO., LTD Free format text: FORMER OWNER: BEIJING BOE PHOTOELECTRICITY SCIENCE + TECHNOLOGY CO., LTD. Effective date: 20141208 Owner name: BEIJING BOE PHOTOELECTRICITY SCIENCE + TECHNOLOGY Effective date: 20141208 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 100176 DAXING, BEIJING TO: 100015 CHAOYANG, BEIJING |
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| TR01 | Transfer of patent right |
Effective date of registration: 20141208 Address after: 100015 Jiuxianqiao Road, Beijing, No. 10, No. Patentee after: BOE Technology Group Co., Ltd. Patentee after: Beijing BOE Photoelectricity Science & Technology Co., Ltd. Address before: 100176 Beijing economic and Technological Development Zone, West Central Road, No. 8 Patentee before: Beijing BOE Photoelectricity Science & Technology Co., Ltd. |
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20111228 Termination date: 20201218 |