[go: up one dir, main page]

CN100424897C - Gallium Nitride-Based Infrared-Visible Wavelength Conversion Detector - Google Patents

Gallium Nitride-Based Infrared-Visible Wavelength Conversion Detector Download PDF

Info

Publication number
CN100424897C
CN100424897C CNB2005100300628A CN200510030062A CN100424897C CN 100424897 C CN100424897 C CN 100424897C CN B2005100300628 A CNB2005100300628 A CN B2005100300628A CN 200510030062 A CN200510030062 A CN 200510030062A CN 100424897 C CN100424897 C CN 100424897C
Authority
CN
China
Prior art keywords
infrared
quantum well
layer
detector
emitting diode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB2005100300628A
Other languages
Chinese (zh)
Other versions
CN1773732A (en
Inventor
陆卫
侯颖
甑红楼
李宁
夏长生
张波
陈平平
陈效双
陈明法
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rainbow Optoelectronics Material Shanghai Co ltd
Shanghai Institute of Technical Physics of CAS
Original Assignee
Rainbow Optoelectronics Material Shanghai Co ltd
Shanghai Institute of Technical Physics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rainbow Optoelectronics Material Shanghai Co ltd, Shanghai Institute of Technical Physics of CAS filed Critical Rainbow Optoelectronics Material Shanghai Co ltd
Priority to CNB2005100300628A priority Critical patent/CN100424897C/en
Publication of CN1773732A publication Critical patent/CN1773732A/en
Application granted granted Critical
Publication of CN100424897C publication Critical patent/CN100424897C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Led Devices (AREA)
  • Light Receiving Elements (AREA)

Abstract

The present invention discloses an infrared-visible wavelength converting detector, which is made of gallium nitride (GaN) base material and can couple a multi-quantum well infrared detector and a light emitting diode on the same chip. The multi-quantum well infrared detector (QWIP) can convert infrared radiation signals into infrared electrooptical signals, and the infrared electrooptical signals are converted into optical signals of a visible waveband via the light emitting diode. The present invention has the advantages of realizing the upconversion of biasing voltage lower longwave thermal infrared to a visible light waveband, users can directly observe with eyes, and the present invention simplifies the structure of detecting systems. The material preparation of the present invention device has the advantages of mature technique and good material homogeneity.

Description

氮化镓基红外-可见波长转换探测器 Gallium Nitride-Based Infrared-Visible Wavelength Conversion Detector

技术领域 technical field

本发明涉及红外探测器和发光二极管,具体是指由氮化镓(GaN)基材料制成的将红外探测器和发光二极管串联耦合在同一块芯片上的红外-可见波长转换探测器。The invention relates to an infrared detector and a light-emitting diode, in particular to an infrared-visible wavelength conversion detector made of gallium nitride (GaN)-based material and coupled in series with the infrared detector and the light-emitting diode on the same chip.

背景技术 Background technique

传统的红外探测器多采用焦平面阵列技术。阵列中每个光电探测单元的信号送入外部硅读出电路,并转换成视频信号输出。此结构要求每一个光敏元在硅读出电路上形成一个相应的互联点。因此要准确地将焦平面阵列上的信息转换到与之相应的极大量的互联节点上,这种结构对器件的互联、制冷功耗、读出电路提出了很高的要求,也使得这种不同材料间的集成系统昂贵和不可靠,尤其易受到制冷与非制冷循环过程的热冲击影响。Traditional infrared detectors mostly use focal plane array technology. The signal of each photodetection unit in the array is sent to an external silicon readout circuit and converted into a video signal for output. This structure requires each photosensitive element to form a corresponding interconnect point on the silicon readout circuit. Therefore, it is necessary to accurately convert the information on the focal plane array to a correspondingly large number of interconnected nodes. Integrated systems between dissimilar materials are expensive and unreliable, and are especially susceptible to thermal shock from refrigeration and non-refrigeration cycles.

近年来,随着GaN基量子阱材料制备工艺与发光二极管技术的成熟,已使得串联生长GaN/AlGaN量子阱子带跃迁的红外探测器和GaN基单量子阱带间跃迁的发光二极管的上转换器件成为可能。该器件可通过GaN基量子阱红外探测器和发光二极管的有效耦合,将红外光转换成人眼最敏感的绿光,实现人眼的直接观测。它既比窄带材料HgCdTe器件有更成熟的材料制备工艺和更好的材料均匀性;又避免了一般红外探测器面临的读出电路互联和大制冷量需求问题,还省却了通常基于GaAs/AlGaAs量子阱的中远红外转换到近红外所需的CCD成像设备,简化了系统结构,降低了成本。In recent years, with the maturity of GaN-based quantum well material preparation process and light-emitting diode technology, the infrared detector with sub-band transition of GaN/AlGaN quantum well grown in series and the up-conversion of light-emitting diode with inter-band transition of GaN-based single quantum well have been made possible. devices become possible. The device can convert infrared light into green light, which is the most sensitive to human eyes, through the effective coupling of GaN-based quantum well infrared detectors and light-emitting diodes, and realize direct observation by human eyes. It not only has a more mature material preparation process and better material uniformity than narrow-band material HgCdTe devices; it also avoids the problems of readout circuit interconnection and large cooling capacity requirements faced by general infrared detectors, and also saves the usual GaAs/AlGaAs-based The CCD imaging equipment required for the conversion of the mid-to-far infrared to the near-infrared of the quantum well simplifies the system structure and reduces the cost.

发明内容 Contents of the invention

基于上述已有的状况,本发明的目的是提出一种GaN基材料的多量子阱红外探测器与可见光发光二极管串联耦合的红外-可见波长转换探测器。Based on the existing situation above, the object of the present invention is to propose an infrared-visible wavelength conversion detector in which a GaN-based multi-quantum well infrared detector and a visible light emitting diode are coupled in series.

为达到上述目的,本发明的GaN基红外-可见波长转换探测器包括衬底1,在衬底上依次排列生长下电极层2、多量子阱红外探测器3、AlaGa1-aN过渡层4、单量子阱发光二极管5、上电极层6。In order to achieve the above object, the GaN-based infrared-visible wavelength conversion detector of the present invention includes a substrate 1, on which the lower electrode layer 2, the multi-quantum well infrared detector 3, the Al a Ga 1-a N transition Layer 4, single quantum well light emitting diode 5, upper electrode layer 6.

所说的多量子阱红外探测器3是由交替生长50个周期的AlbGa1-bN势垒层/GaN势阱层组成,最后加一层AlbGa1-bN势垒层结束。GaN势阱层和AlbGa1-bN势垒层的层厚和b的取值与所要探测的红外波长有关。The multi-quantum well infrared detector 3 is composed of AlbGa1 -bN potential barrier layer/GaN potential well layer grown alternately for 50 cycles, and finally adds a layer of AlbGa1 -bN potential barrier layer to end . The thickness of the GaN potential well layer and the Al b Ga 1-b N barrier layer and the value of b are related to the infrared wavelength to be detected.

所说的单量子阱发光二极管5依次由InxGa1-xN势垒层、InyGa1-yN有源势阱层和AlaGa1-aN势垒层组成。发光二极管的发光波长可以通过调节未掺杂的InyGa1-yN有源层中的y值,从0.2到0.7,使其改变发光波长从蓝色到黄色。The single quantum well light emitting diode 5 is sequentially composed of an In x Ga 1-x N barrier layer, an In y Ga 1-y N active potential well layer and an Al a Ga 1-a N barrier layer. The light-emitting wavelength of the light-emitting diode can be changed from blue to yellow by adjusting the y value in the undoped In y Ga 1-y N active layer from 0.2 to 0.7.

本发明采用AlbGa1-bN/GaN作为红外探测器多量子阱生长材料,其原因是它具有较大的导带带阶,可以使得子带间跃迁的吸收波长有较大跨度(0.7微米~14微米),通过调节GaN量子阱厚度,AlGaN势垒高度,可使GaN量子阱子能带间的能量恰好对应于被探测的红外辐射光子能量,同时第一激发态处在与势垒共振的准束缚态或高于势垒的连续态中,即可用于红外探测。在单量子阱绿光发光二极管中,利用有源势阱层InyGa1-yN的禁带宽度随In含量变化而变化(1.9~3.5eV),适当调节组分,可实现带间人眼最敏感的绿光发射,即可做成绿光波段的发光二极管。所以选择GaN基材料既可生长量子阱红外探测器,又可制备绿光波段的发光二极管,能很好实现耦合集成。The present invention adopts AlbGa1 -bN /GaN as infrared detector multi-quantum well growth material, and its reason is that it has larger conduction band order, can make the absorption wavelength of transition between subbands have larger span (0.7 Micron to 14 microns), by adjusting the thickness of the GaN quantum well and the height of the AlGaN barrier, the energy between the subbands of the GaN quantum well can exactly correspond to the energy of the detected infrared radiation photon, and at the same time the first excited state is in the same state as the potential barrier In the quasi-bound state of resonance or in the continuum state above the potential barrier, it can be used for infrared detection. In the single quantum well green light-emitting diode, the bandgap width of the active potential well layer In y Ga 1-y N changes with the change of In content (1.9-3.5eV), and the inter-band gap can be realized by properly adjusting the composition. The most sensitive green light emitted by the eye can be made into a light-emitting diode in the green band. Therefore, the choice of GaN-based materials can not only grow quantum well infrared detectors, but also prepare light-emitting diodes in the green band, which can well realize coupling integration.

本发明器件的基本工作过程是:当在该串联器件两端加上恒定偏压,该偏压将同时作用在多量子阱红外探测器(QWIP)器件和绿光发光二极管(LED)器件上。当红外光通过光学系统进入QWIP时,QWIP吸收红外辐射引起子带跃迁产生可移动的自由电子。这些电子的一部分在电场作用下注入LED,在LED的有源区与空穴复合,发出可见光。由于QWIP是光导型器件,当吸收不同强度的红外辐射时,其电阻值的降低亦不同,所以加在LED两端的电压也相应不同,致使LED发光强度也不同。所以如果入射的辐射不均匀,QWIP的电子注入LED后,引起与之相应的输出可见光的强度也不均匀。即在无明显光学串音的情况下,输出绿光的空间分布重复了QWIP中光生电流的分布,也顺次重复了输入红外辐射的空间分布。简言之通过这个串联的无光敏元器件,实现了热红外光子到可见光绿光光子的上转换,即实现了把红外图像转换成眼睛可以直接观测的绿光波段图像。The basic working process of the device of the present invention is: when a constant bias voltage is applied to both ends of the series device, the bias voltage will simultaneously act on the multi-quantum well infrared detector (QWIP) device and the green light emitting diode (LED) device. When infrared light enters the QWIP through the optical system, the absorption of infrared radiation by the QWIP causes subband transitions to generate mobile free electrons. Some of these electrons are injected into the LED under the action of an electric field, and recombine with holes in the active area of the LED to emit visible light. Since QWIP is a photoconductive device, when it absorbs different intensities of infrared radiation, its resistance decreases differently, so the voltage applied to both ends of the LED is also correspondingly different, resulting in different luminous intensity of the LED. Therefore, if the incident radiation is not uniform, after the QWIP electrons are injected into the LED, the intensity of the corresponding output visible light will be not uniform. That is, in the absence of obvious optical crosstalk, the spatial distribution of the output green light repeats the distribution of the photogenerated current in QWIP, which in turn also repeats the spatial distribution of the input infrared radiation. In short, through this series of non-photosensitive components, the upconversion of thermal infrared photons to visible green light photons is realized, that is, the conversion of infrared images into green light band images that can be directly observed by the eyes is realized.

该上转换器件中的量子阱红外探测器既可为N型,也可为P型,只须注意所加偏压与LED端相应即可。但由于跃迁选择定则,N型QWIP必须在其上刻蚀光栅以使垂直入射的红外光得以有效吸收。The quantum well infrared detector in the up-conversion device can be either N-type or P-type, and it only needs to pay attention to the bias voltage applied corresponding to the LED terminal. However, due to the transition selection rule, the N-type QWIP must etch a grating on it to effectively absorb the vertically incident infrared light.

本发明的器件有如下积极效果和优点:Device of the present invention has following positive effect and advantage:

1.较之于一般的中远红外转换到近红外的上转换器件所需要的CCD成像设备,而本发明的器件人眼可以直接观测,简化了系统结构。1. Compared with the CCD imaging equipment required by the general up-conversion device from mid-far infrared to near-infrared, the device of the present invention can be directly observed by human eyes, which simplifies the system structure.

2.较之于传统的红外探测器,本发明的器件无需分离的光敏元,避免了Si读出电路,从而不涉及电路互联问题,避免了通常焦平面器件需要较大制冷量的问题,降低了器件制备的技术难度与成本。2. Compared with the traditional infrared detector, the device of the present invention does not need a separate photosensitive element, avoids the Si readout circuit, thus does not involve the problem of circuit interconnection, avoids the problem that the usual focal plane device needs a large cooling capacity, and reduces The technical difficulty and cost of device fabrication are reduced.

3.本发明器件所用材料制备工艺成熟,材料均匀性好。3. The material used in the device of the present invention has a mature preparation process and good material uniformity.

附图说明 Description of drawings

图1为本发明探测器的结构和功能实施示意简图。Fig. 1 is a schematic diagram of the structure and function implementation of the detector of the present invention.

图2为多量子阱红外探测器-绿光发光二极管的能带和物理过程示意图。Fig. 2 is a schematic diagram of the energy band and physical process of the multi-quantum well infrared detector-green light-emitting diode.

具体实施方式 Detailed ways

下面以N型QWIP和绿光LED串联耦合的红外-可见波长转换探测器为实施例,其中N型QWIP的红外吸收峰设定在2.9微米附近,LED的EL谱的峰值波长在525nm,结合附图对本发明的具体实施方式作进一步的详细说明:The following is an example of an infrared-visible wavelength conversion detector coupled in series with an N-type QWIP and a green LED, wherein the infrared absorption peak of the N-type QWIP is set at around 2.9 microns, and the peak wavelength of the EL spectrum of the LED is at 525nm. The figure further elaborates the specific embodiment of the present invention:

本发明的探测器是利用半导体材料外延的典型技术,如分子束外延技术,金属有机化学气相沉积技术等,在Al2O3蓝宝石衬底1上依次排列生长:The detector of the present invention utilizes a typical technique of semiconductor material epitaxy, such as molecular beam epitaxy technique , metal organic chemical vapor deposition technique, etc., and is arranged and grown sequentially on Al2O3 sapphire substrate 1:

n*-GaN下电极层2;n*-GaN lower electrode layer 2;

交替生长50个周期的10nm厚Al0.35Ga0.65N势垒层(51层)和3.5nm厚GaN势阱层(50层),其中GaN量子阱中的掺杂浓度是8*1017cm-3,由此形成一个多量子阱的红外探测器3;Alternately grow 50 cycles of 10nm thick Al 0.35 Ga 0.65 N barrier layers (51 layers) and 3.5nm thick GaN potential well layers (50 layers), where the doping concentration in the GaN quantum wells is 8*10 17 cm -3 , thereby forming an infrared detector 3 with multiple quantum wells;

100nm厚的Al0.1Ga0.9N过渡层4;100nm thick Al 0.1 Ga 0.9 N transition layer 4;

接着是50nm厚的N型In0.05Ga0.95N势垒层及2nm厚的未掺杂的In0.43Ga0.57N有源层和100nm的P型Al0.1Ga0.9N势垒层,形成一个单量子阱发光二极管5;Then there is a 50nm thick N-type In 0.05 Ga 0.95 N barrier layer and a 2nm thick undoped In 0.43 Ga 0.57 N active layer and a 100nm P-type Al 0.1 Ga 0.9 N barrier layer to form a single quantum well LED 5;

接着是200nm的P型GaN上电极层6,并在其上刻蚀出光栅层7,完成红外-可见波长转换探测器的制备。Next is a 200nm P-type GaN upper electrode layer 6, and a grating layer 7 is etched thereon to complete the preparation of the infrared-visible wavelength conversion detector.

本实施例选择单量子阱LED是源于单量子阱相比于双异质结构的LED有更高的发光强度和色纯度。In this embodiment, the single quantum well LED is selected because the single quantum well has higher luminous intensity and color purity than the double heterostructure LED.

Claims (2)

1. a gallium nitride-base infrared visable wavelength conversion detector comprises substrate (1), it is characterized in that:
On substrate (1), be arranged in order growth lower electrode layer (2), multiple quantum well infrared detector (3), Al aGa 1-aN transition zone (4), single quantum well light-emitting diode (5), upper electrode layer (6);
Said multiple quantum well infrared detector (3) is by the alternating growth Al in 50 cycles bGa 1-bN barrier layer/GaN potential well layer adds one deck Al at last bGa 1-bThe N barrier layer is formed; GaN potential well layer and Al bGa 1-bThe bed thickness of N barrier layer is relevant with the infrared wavelength that will survey with the value of b;
Said single quantum well light-emitting diode (5) is successively by In xGa 1-xN barrier layer, In yGa 1-yActive potential well layer of N and Al aGa 1-aThe N barrier layer is formed, and the emission wavelength of light-emitting diode can be by regulating unadulterated In yGa 1-yY value in the N active layer, from 0.2 to 0.7, make it change emission wavelength from the blueness to the yellow.
2. according to a kind of gallium nitride-base infrared visable wavelength conversion detector of claim 1, it is characterized in that: said multiple quantum well infrared detector both can be the N type, also can be the P type, if the N type then needs to form grating layer (7) on the top of upper electrode layer (6) by etching.
CNB2005100300628A 2005-09-28 2005-09-28 Gallium Nitride-Based Infrared-Visible Wavelength Conversion Detector Expired - Fee Related CN100424897C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB2005100300628A CN100424897C (en) 2005-09-28 2005-09-28 Gallium Nitride-Based Infrared-Visible Wavelength Conversion Detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB2005100300628A CN100424897C (en) 2005-09-28 2005-09-28 Gallium Nitride-Based Infrared-Visible Wavelength Conversion Detector

Publications (2)

Publication Number Publication Date
CN1773732A CN1773732A (en) 2006-05-17
CN100424897C true CN100424897C (en) 2008-10-08

Family

ID=36760573

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2005100300628A Expired - Fee Related CN100424897C (en) 2005-09-28 2005-09-28 Gallium Nitride-Based Infrared-Visible Wavelength Conversion Detector

Country Status (1)

Country Link
CN (1) CN100424897C (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100498288C (en) * 2006-06-30 2009-06-10 中国科学院上海技术物理研究所 Detector converted on infrared wavelength, near-infrared wavelength
EP2064746A2 (en) 2006-09-29 2009-06-03 University of Florida Research Foundation, Incorporated Method and apparatus for infrared detection and display
CN100524842C (en) * 2007-06-04 2009-08-05 中国科学院上海技术物理研究所 AlGaN/PZT ultraviolet/infrared double-waveband detector
CN101630717B (en) * 2008-07-16 2011-06-01 中国科学院半导体研究所 Organic-inorganic composite device structure capable of converting low-frequency light to high-frequency light
KR101815072B1 (en) 2009-11-24 2018-01-30 유니버시티 오브 플로리다 리서치 파운데이션, 인크. Method and apparatus for sensing infrared radiation
SG185375A1 (en) * 2010-05-24 2012-12-28 Univ Florida Method and apparatus for providing a charge blocking layer on an infrared up-conversion device
US20120049310A1 (en) * 2010-09-01 2012-03-01 Du Pont Apollo Limited Thin film photoelectric conversion module and fabrication method of the same
CN104540582A (en) * 2011-04-12 2015-04-22 康宁公司 Laser diodes comprising QWI output window and waveguide areas and methods of manufacture
CN103597624A (en) * 2011-06-06 2014-02-19 佛罗里达大学研究基金会有限公司 Transparent infrared-to-visible up-conversion device
RU2014102650A (en) 2011-06-30 2015-08-10 Юниверсити Оф Флорида Рисеч Фаундэйшн, Инк. REINFORCING INFRARED PHOTODETECTOR AND ITS APPLICATION FOR DETECTING IR RADIATION
CN102629637B (en) * 2011-12-22 2014-12-24 清华大学 Wavelength up-conversion device containing quantum cascade structure
CN103915538B (en) * 2014-03-28 2016-08-24 中国科学院上海技术物理研究所 A kind of 2 D photon crystal thick film for improving QWIP-LED light extraction efficiency
CA2988784A1 (en) 2015-06-11 2017-03-09 University Of Florida Research Foundation, Incorporated Monodisperse, ir-absorbing nanoparticles and related methods and devices
CN107768461B (en) * 2016-08-18 2020-06-09 清华大学 Semiconductor infrared detector with embedded heavy doping grating layer
CN107665931A (en) * 2017-08-30 2018-02-06 中国科学院上海技术物理研究所 A kind of integrated enhancing quantum trap infrared detector of guide mode resonance and design method
CN108011017B (en) * 2017-11-27 2020-04-21 清华大学 Up-conversion devices and materials and methods of making the same
CN110581123A (en) * 2018-06-08 2019-12-17 上海交通大学 A photonic frequency up-conversion device and its growth method
CN109148496A (en) * 2018-07-06 2019-01-04 上海交通大学 A kind of no pixel image device and preparation method thereof
CN109148636A (en) * 2018-07-06 2019-01-04 上海交通大学 A kind of single-photon detector and preparation method thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5510627A (en) * 1994-06-29 1996-04-23 The United States Of America As Represented By The Secretary Of The Navy Infrared-to-visible converter
US6028323A (en) * 1996-07-19 2000-02-22 National Research Council Of Canada Quantum well infared image conversion panel and associated methods
CN1090335C (en) * 1998-10-22 2002-09-04 中国科学院上海技术物理研究所 Quantum trap infra-red focus planar chip without discrete image element optical read-out

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5510627A (en) * 1994-06-29 1996-04-23 The United States Of America As Represented By The Secretary Of The Navy Infrared-to-visible converter
US6028323A (en) * 1996-07-19 2000-02-22 National Research Council Of Canada Quantum well infared image conversion panel and associated methods
CN1090335C (en) * 1998-10-22 2002-09-04 中国科学院上海技术物理研究所 Quantum trap infra-red focus planar chip without discrete image element optical read-out

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
InGaAlP/InGaP多量子阱中的红外向可见光的上转换. 尉吉勇,黄柏标,于永芹,张琦,姚书山,张晓阳,秦晓燕.人工晶体学报,第34卷第4期. 2005 *

Also Published As

Publication number Publication date
CN1773732A (en) 2006-05-17

Similar Documents

Publication Publication Date Title
CN100424897C (en) Gallium Nitride-Based Infrared-Visible Wavelength Conversion Detector
US6410940B1 (en) Micro-size LED and detector arrays for minidisplay, hyper-bright light emitting diodes, lighting, and UV detector and imaging sensor applications
US11302835B2 (en) Semiconductor photodetector assembly
US10593838B2 (en) Semiconductor device
US6541788B2 (en) Mid infrared and near infrared light upconverter using self-assembled quantum dots
US8791470B2 (en) Nano structured LEDs
JP7209338B2 (en) semiconductor element
JPH077223A (en) Color semiconductor device
US6137123A (en) High gain GaN/AlGaN heterojunction phototransistor
US20060266998A1 (en) Quantum dot intermediate band infrared photodetector
JP6174931B2 (en) Semiconductor optical element array, manufacturing method thereof, and display device using semiconductor optical element array
US10847676B2 (en) Semiconductor device and semiconductor device package including same
KR20180076497A (en) Semiconductor device and semiconductor device package having thereof
Yu et al. Highly responsive broadband (250~ 1000 nm) DUV-NIR photodetector and tunable emitter enabled by III-V nanowire on silicon for integrated photonics
US10686091B2 (en) Semiconductor device
Razeghi Deep ultraviolet light-emitting diodes and photodetectors for UV communications
JP2002083996A (en) Gallium nitride based compound semiconductor light receiving element and light receiving array using the same
JP2000188424A (en) Multi-wavelength photo detector
CN100498288C (en) Detector converted on infrared wavelength, near-infrared wavelength
KR102569563B1 (en) Semiconductor device and light emitting device package having thereof
JP4505401B2 (en) Light receiving element
McClintock et al. Back-illuminated solar-blind photodetectors for imaging applications
US12107188B2 (en) Semiconductor device
KR102643093B1 (en) Semiconductor Device And Light Apparatus
JP2007123587A (en) Light receiving element

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20081008

Termination date: 20150928

EXPY Termination of patent right or utility model