CN109637975B - 基于单一溶液电镀的CNT与Cu复合导线的制备方法 - Google Patents
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- 238000009713 electroplating Methods 0.000 title claims abstract description 44
- 239000002131 composite material Substances 0.000 title claims abstract description 38
- 238000002360 preparation method Methods 0.000 title claims abstract description 10
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 claims abstract description 57
- 239000010949 copper Substances 0.000 claims abstract description 48
- 239000011259 mixed solution Substances 0.000 claims abstract description 23
- 239000000243 solution Substances 0.000 claims abstract description 21
- 238000000034 method Methods 0.000 claims abstract description 20
- OPQARKPSCNTWTJ-UHFFFAOYSA-L copper(ii) acetate Chemical compound [Cu+2].CC([O-])=O.CC([O-])=O OPQARKPSCNTWTJ-UHFFFAOYSA-L 0.000 claims abstract description 17
- 238000000137 annealing Methods 0.000 claims abstract description 5
- 238000009987 spinning Methods 0.000 claims description 36
- 229920002120 photoresistant polymer Polymers 0.000 claims description 14
- 239000000758 substrate Substances 0.000 claims description 14
- 238000007747 plating Methods 0.000 claims description 8
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims description 6
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- 238000002791 soaking Methods 0.000 claims description 3
- 239000002041 carbon nanotube Substances 0.000 claims description 2
- 238000011068 loading method Methods 0.000 claims description 2
- 239000002245 particle Substances 0.000 abstract description 11
- 229910000366 copper(II) sulfate Inorganic materials 0.000 abstract description 3
- 230000003647 oxidation Effects 0.000 abstract description 2
- 238000007254 oxidation reaction Methods 0.000 abstract description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 229910052739 hydrogen Inorganic materials 0.000 abstract 1
- 239000001257 hydrogen Substances 0.000 abstract 1
- 239000004020 conductor Substances 0.000 description 4
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 229910021389 graphene Inorganic materials 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000010584 magnetic trap Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000000452 restraining effect Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
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Abstract
本发明公开了基于单一溶液电镀的CNT与Cu复合导线的制备方法,通过制备CNT阵列、制备电极、刻蚀、电镀、氢气退火、电流退火,获得具有高电流载流能力的复合材料导线。本发明形成CNT/Cu复合导线的过程中,种子层与常规电镀在同一溶液中完成,避免了传统工艺中需要在乙腈/乙酸铜混合溶液中电镀种子层后再在CuSO4溶液中进行电镀的问题,既简化了电镀步骤,且避免了在更换溶液过程中内部Cu颗粒的氧化,制备的表面Cu颗粒粒度相较于采用CuSO4制备的样品更为均匀致密。本发明制备的CNT/Cu复合导线,能有效地提高导线的载流能力,使得电路在大电流工作下导线不易熔断。
Description
技术领域
本发明属于微电子技术、微系统技术领域,具体涉及基于单一溶液电镀的CNT与Cu复合导线的制备方法。
背景技术
原子芯片是一种可以实现对冷原子操控的片上微系统,常用的方法之一是在特定形貌的导线上通大电流产生磁阱来实现上述功能,可以极大地减小冷原子实验装置的体积和复杂度,对于冷原子系统的实用化具有重要的意义。为产生深势阱对冷原子团进行紧束缚,需要在原子芯片的微米级导线上长时间加载几安培的电流,这就要求导线的电流密度达到106A/cm2量级以上。同时,为了降低导线通电时的欧姆热,导线需要具备大的电导率。此外,随着电子器件的集成度不断提高,在限制导线尺寸的前提下,导线所需承载的载流密度也需不断增加。
目前,具有相对较高电导率与载流能力的金属材料Cu、Ag,其电导率与载流能力的理论值分别在105S/cm与106A/cm2量级。相比之下,石墨烯与碳纳米管(CNT)虽然电导率较低,仅仅为103S/cm量级,但具有109A/cm2量级的载流能力。国外研究机构提出将CNT与Cu制备成均匀的复合材料能使导线的载流能力从Cu的106A/cm2提升至6.3×108A/cm2,同时电导率能够达到105S/cm,即在兼具良好的导电性和电流承载能力。然而,目前给出的复合材料制备方法工艺流程复杂,且由于最终在CuSO4溶液中完成电镀,使得制得的复合材料表面Cu晶体颗粒粒度较大且颗粒尺寸不均。
因此,需要提出一种工艺步骤较为简化,同时制得导线的表面Cu晶体颗粒更为均匀的制备方法。
发明内容
本发明的目的在于提供一种基于单一溶液电镀的CNT与Cu复合导线的制备方法,本方法可以让种子层与常规电镀在同一溶液中完成,避免了传统工艺中需要在不同溶液中进行电镀的问题,简化了电镀步骤,避免了在更换溶液过程中内部Cu颗粒的氧化;在CuSO4溶液中电镀的Cu颗粒具有明显的晶界,而采用本发明制备的CNT/Cu复合材料导线表面颗粒更为均匀,能有效抑制电流的散射。
为实现上述目的,本发明所采用的技术方案是:
基于单一溶液电镀的CNT与Cu复合材料高载流导线制备方法,其特征在于,包括下述步骤:
1)在Si片上生长一层SiO2绝缘层并作为基底;
2)在基底上制备正交的CNT纺丝阵列,致密化后,在CNT纺丝阵列的两端分别制备Ti与Au作为电极,同时起到固定CNT纺丝阵列的作用;
3)采用光刻胶作为掩膜,按照所需导线结构光刻完毕后,祛除未受光刻胶保护的CNT,最后祛除光刻胶以得到CNT纺丝阵列导线;
4)配置乙酸铜、乙腈的混合溶液,并以0.001A通电电流对混合溶液进行极化,直到混合溶液电阻≤10000Ω;
5)采用Cu作为电镀阳极,长有CNT纺丝阵列导线的基底作为阴极,在步骤4)配置好的乙酸铜、乙腈混合溶液中,按照电镀电流I电镀2h;
6)将电镀电流I调整为电镀电流II,继续在乙酸铜、乙腈混合溶液中电镀2h,制得电镀后的CNT纺丝阵列与Cu复合导线;其中,电镀电流II为电镀电流I的10倍;
7)将电镀后的CNT纺丝阵列与Cu复合导线采用乙腈清洗后,在H2环境下采用250℃退火3h,其中H2气流量150sccm,Ar气流量200sccm;
8)对CNT纺丝阵列与Cu复合导线加载2×105A/cm2的电流,直至电阻稳定不再下降,得到最终的CNT纺丝阵列与Cu复合导线。
进一步的,步骤1)中,制备的SiO2绝缘层的厚度≥200nm。
步骤2)中,采用电子束蒸发分别制备Ti层与Au层作为电极。
步骤3)中,采用O2离子轰击祛除未受光刻胶保护的CNT,采用丙酮、乙二醇或其它能够溶解光刻胶的溶液浸泡祛除光刻胶以得到CNT纺丝阵列导线。
步骤4)中是按照乙酸铜在乙腈中浓度为27.5mmol/L配置混合溶液。
步骤5)与步骤6)中,与阴极接触的电极均不要接触乙酸铜、乙腈混合溶液。
步骤5)中电镀电流I和步骤6)中的电镀电流II为电镀电流大小与导线表面积的比值关系。电镀电流I为2mA/cm2,电镀电流II为20mA/cm2。
步骤8)中加载2×105A/cm2的电流为电流大小与导线横截面积的比值关系。
本发明制备过程简化了电镀步骤,所有电镀过程均在乙酸铜、乙腈混合溶液中完成,制备的CNT/Cu复合导线的载流能力明显提高,且表面Cu颗粒粒度均匀致密。通过本发明制备得到的复合导线可应用于需要承载大电流密度的微电子器件、约束及调控冷原子的原子芯片以及其它对大导线载流密度有要求的应用领域中。
附图说明
图1为本发明的制备流程示意图。
图2为本发明的电镀工艺示意图。
图3为本发明实施例1制备的CNT纺丝阵列导线的扫描电子显微镜照片。
图4为本发明实施例1制备的CNT纺丝阵列与Cu复合导线表面的扫描电子显微镜照片。
图5为本发明实施例1制备的CNT纺丝阵列与Cu复合导线表面的扫描电子显微镜照片。
图中:1为制备了SiO2层的Si衬底,2为制备完成的纺丝CNT阵列,3为制备完成的电极,4为刻蚀后的纺丝CNT阵列导线,5为电镀完Cu后的复合导线,6为具有刻蚀后纺丝CNT阵列导线的衬底,7为铜片,8为乙酸铜、乙腈的混合溶液,9为电镀阴极,10为电镀阳极。
具体实施方式
如图1-2所示,本实施例包括下述步骤:
1)通过PECVD在Si片上生长一层200nm厚的SiO2绝缘层并作为基底;
2)在基底上制备八层的正交的CNT纺丝阵列,致密化后,在CNT纺丝阵列两端采用电子束蒸发依次制备2nmTi与5nmAu作为电极,同时起到固定CNT纺丝阵列的作用;
3)采用AZ5214光刻胶作为掩膜,按照掩膜板结构光刻完毕后(导线面积约为0.01cm2),采用300W功率,O2离子轰击8min祛除未受光刻胶保护的CNT部分,最后丙酮浸泡2h去掉光刻胶得到CNT纺丝阵列导线;
4)采用0.827g乙酸铜与150ml乙腈配置混合溶液,在70℃下对混合溶液进行搅拌直至乙酸铜完全溶解在乙腈中。正负极均采用Cu,通过电流源对混合溶液进行极化,设置电流为0.001A,直至输出电压降低至10V;
5)采用Cu作为电镀阳极,步骤3)中得到的长有CNT纺丝阵列导线的基底作为阴极,在步骤5)中配置好的乙酸铜、乙腈混合溶液中,按2mA的电镀电流I电镀2h,注意与阴极接触的电极不要接触溶液;
6)完成步骤5)后,将电镀电流I调整为20mA的电镀电流II,继续在乙酸铜、乙腈混合溶液中电镀2h,制得电镀后的CNT纺丝阵列与Cu复合导线;
7)将制得电镀后的CNT纺丝阵列与Cu复合导线采用乙腈清洗后,在H2环境下采用250℃退火3h,其中H2气流量150sccm,Ar气流量200sccm;
8)采用恒流源对导线加载2×105A/cm2的电流,直至输出电压稳定不再下降。
通过上述具体实施步骤,制备得到的CNT纺丝阵列导线,如图3所示。
通过上述具体实施步骤,制备得到的CNT纺丝阵列与Cu复合导线表面,如图4-5所示。
Claims (7)
1.基于单一溶液电镀的CNT和Cu复合导线的制备方法,其特征在于包括下述步骤:
1)在Si片上生长一层SiO2绝缘层并作为基底;
2)在基底上制备正交的CNT纺丝阵列,致密化后,在CNT纺丝阵列的两端分别制备Ti层与Au层作为电极,同时起到固定CNT纺丝阵列的作用;
3)采用光刻胶作为掩膜,按照所需导线结构光刻完毕后,祛除未受光刻胶保护的CNT,再祛除光刻胶以得到CNT纺丝阵列导线;
4)配置乙酸铜、乙腈的混合溶液,并以0.001A通电电流对混合溶液进行极化,直到混合溶液电阻≤10000Ω;
5)采用Cu作为电镀阳极,长有CNT纺丝阵列导线的基底作为阴极,在步骤4)配置好的乙酸铜、乙腈的混合溶液中,按照电镀电流I电镀2h,其中,基底上与阴极连接的电极不要接触混合溶液;
6)将电镀电流I调整为电镀电流II,继续在乙酸铜、乙腈混合溶液中电镀2h,制得电镀后的CNT纺丝阵列与Cu复合导线;所述电镀电流II为电镀电流I的10倍;其中,基底上与阴极连接的电极不要接触混合溶液;
7)将电镀后的CNT纺丝阵列与Cu复合导线采用乙腈清洗后,在H2环境下采用250℃退火3h,其中H2气流量150sccm,Ar气流量200sccm;
8)对CNT纺丝阵列与Cu复合导线加载2×105A/cm2的电流,直至电阻稳定不再下降,得到最终的CNT纺丝阵列与Cu复合导线。
2.如权利要求1所述基于单一溶液电镀的CNT和Cu复合导线的制备方法,其特征在于,步骤1)中,制备的SiO2绝缘层的厚度≥200nm。
3.如权利要求1所述基于单一溶液电镀的CNT和Cu复合导线的制备方法,其特征在于,步骤2)中,CNT纺丝阵列的制备方法为:在基底上先拉出第一层CNT阵列,然后垂直于第一层CNT阵列的排布方向拉出第二层CNT阵列,如此反复,以得到正交多层的CNT纺丝阵列。
4.如权利要求1所述基于单一溶液电镀的CNT和Cu复合导线的制备方法,其特征在于,步骤2)中,采用电子束蒸发分别制备Ti层与Au层作为电极。
5.如权利要求1所述基于单一溶液电镀的CNT和Cu复合导线的制备方法,其特征在于,步骤3)中,采用O2离子轰击祛除未受光刻胶保护的CNT。
6.如权利要求1或5所述基于单一溶液电镀的CNT和Cu复合导线的制备方法,其特征在于,步骤3)中,采用丙酮浸泡祛除光刻胶以得到CNT纺丝阵列导线。
7.如权利要求1所述基于单一溶液电镀的CNT和Cu复合导线的制备方法,其特征在于,步骤4)中是按照乙酸铜在乙腈中浓度为27.5mmol/L配置混合溶液。
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