[go: up one dir, main page]

CN109212636B - Design method of free-form surface lens for DMD photoetching imaging system - Google Patents

Design method of free-form surface lens for DMD photoetching imaging system Download PDF

Info

Publication number
CN109212636B
CN109212636B CN201811218613.7A CN201811218613A CN109212636B CN 109212636 B CN109212636 B CN 109212636B CN 201811218613 A CN201811218613 A CN 201811218613A CN 109212636 B CN109212636 B CN 109212636B
Authority
CN
China
Prior art keywords
free
dmd
form surface
surface lens
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201811218613.7A
Other languages
Chinese (zh)
Other versions
CN109212636A (en
Inventor
陆子凤
刘华
孙彦杰
李乾坤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Northeast Normal University
Original Assignee
Northeast Normal University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Northeast Normal University filed Critical Northeast Normal University
Priority to CN201811218613.7A priority Critical patent/CN109212636B/en
Publication of CN109212636A publication Critical patent/CN109212636A/en
Application granted granted Critical
Publication of CN109212636B publication Critical patent/CN109212636B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00Simple or compound lenses
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0012Optical design, e.g. procedures, algorithms, optimisation routines

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

一种用于DMD光刻成像系统的自由曲面透镜及其设计方法,属于光学技术领域,DMD单微镜与自由曲面透镜的距离为1mm,自由曲面透镜的材料为硅晶体,外轮廓尺寸为12mm×21mm,厚度为1mm,前表面面型为平面,后表面面型为自由曲面,最大畸变量为10.63μm,方法包括计算能够平滑光刻图案边缘的DMD单微镜的线性错位,设计具有特殊畸变特性的自由曲面透镜,投影成像系统的建模,本发明可以缩小DMD扫描光刻图案边缘锯齿,以获得最佳的光刻图形质量。

Figure 201811218613

A free-form surface lens used in a DMD lithography imaging system and a design method thereof belong to the field of optical technology. ×21mm, thickness is 1mm, the front surface is flat, the back surface is free-form, the maximum distortion is 10.63μm, the method includes calculating the linear dislocation of the DMD single micromirror that can smooth the edge of the lithography pattern, and the design has a special The free-form surface lens with distortion characteristics, the modeling of the projection imaging system, and the invention can reduce the jagged edges of the DMD scanning lithography pattern to obtain the best lithography pattern quality.

Figure 201811218613

Description

一种用于DMD光刻成像系统的自由曲面透镜的设计方法A design method of free-form surface lens for DMD lithography imaging system

技术领域technical field

本发明属于光学技术领域,特别是涉及到应用在基于数字微镜阵列的光刻系统中的解决DMD无掩模扫描光刻图案边缘存在锯齿这一问题的具有特殊畸变的自由曲面透镜。The invention belongs to the field of optical technology, in particular to a free-form lens with special distortion which is applied in a lithography system based on a digital micromirror array to solve the problem of sawtooth on the edge of a DMD maskless scanning lithography pattern.

背景技术Background technique

微光电器件的迅速发展使基于DMD的无掩模扫描光刻技术受到了人们的广泛关注。其光刻过程是利用计算机优化产生一系列“虚拟”的数字图形,并控制投影曝光设备把图形一幅幅地投影到基片上。在光刻过程中,其它方向由于没有扫描方向的曝光能量叠加,刻线边缘存在锯齿问题,不光滑,这极大地降低了DMD扫描光刻图案的质量。With the rapid development of micro-optical devices, DMD-based maskless scanning lithography has received extensive attention. The photolithography process uses computer optimization to generate a series of "virtual" digital graphics, and controls projection exposure equipment to project the graphics onto the substrate one by one. In the lithography process, because the exposure energy in other directions is not superimposed in the scanning direction, the edge of the scribed line has the problem of jaggedness and is not smooth, which greatly reduces the quality of the DMD scanning lithography pattern.

目前,缩小DMD扫描光刻图案边缘锯齿的方法主要有三种:At present, there are three main methods to reduce the jagged edges of DMD scanning lithography patterns:

(1)灰度刻写技术,通过脉冲宽度的调节控制单微镜的翻转时间,形成不同的灰度等级图案,达到缩小光刻图案边缘锯齿的目的。但是,刻写复杂图案时,由于需要处理与传输复杂的数据,其刻写效率受到了限制。(2)提高成像透镜的缩小倍率,这在一定程度上提高了光刻图案的质量,但是随着成像透镜缩小倍率的增大,系统对焦难度加大,同时单次扫描刻写面积急剧减小,光刻效率降低。(3)倾斜光刻平台或DMD,使单像素的曝光能量在扫描方向外叠加。但是存在倾斜角度难以精确控制,系统的装调难度增加等问题。(1) Grayscale writing technology, which controls the flipping time of a single micromirror by adjusting the pulse width to form different grayscale patterns to achieve the purpose of reducing the jagged edges of the lithography pattern. However, when writing complex patterns, the writing efficiency is limited due to the need to process and transmit complex data. (2) Improve the reduction magnification of the imaging lens, which improves the quality of the lithography pattern to a certain extent. However, with the increase of the reduction magnification of the imaging lens, the system is more difficult to focus, and the writing area of a single scan decreases sharply. The lithography efficiency is reduced. (3) Tilt the lithography platform or DMD so that the exposure energy of a single pixel is superimposed outside the scanning direction. However, there are problems such as difficulty in precise control of the inclination angle, and increased difficulty in the installation and adjustment of the system.

为此,如何在不改变光刻效率和增加系统装调难度的前提下,提高光刻图案质量,是亟需解决的问题。Therefore, how to improve the quality of the lithography pattern without changing the lithography efficiency and increasing the difficulty of system assembly and adjustment is an urgent problem to be solved.

发明内容SUMMARY OF THE INVENTION

本发明所要解决的技术问题是:提供一种用于DMD光刻成像系统的自由曲面透镜的设计方法,可以缩小DMD扫描光刻图案边缘锯齿,以获得最佳的光刻图形质量。The technical problem to be solved by the present invention is to provide a design method of a free-form surface lens used in a DMD lithography imaging system, which can reduce the jagged edges of the DMD scanning lithography pattern to obtain the best lithography pattern quality.

一种用于DMD光刻成像系统的自由曲面透镜的设计方法,其特征是:包括以下步骤,且以下步骤顺次进行,A method for designing a free-form surface lens for a DMD lithography imaging system, characterized in that it comprises the following steps, and the following steps are performed in sequence,

步骤一、计算能够平滑光刻图案边缘的DMD单微镜的线性错位Step 1. Calculate the linear dislocation of the DMD single micromirror that can smooth the edge of the lithography pattern

设定y方向为光刻扫描方向,j、i分别为DMD单微镜所在行和列,DMD单微镜的数量为i×j,L为DMD单微镜的边长,S为投影透镜的放大倍率,θ为安装该自由曲面透镜后与安装前对应列中每一个微镜成像后中心连线所成偏转角度,获得垂直于扫描方向上DMD单微镜的线性错位量为Δxj,Δxj=S×L×(j-1)×tanθ;The y direction is set as the lithography scanning direction, j and i are the row and column where the DMD single micromirror is located, the number of the DMD single micromirror is i×j, L is the side length of the DMD single micromirror, and S is the projection lens. Magnification, θ is the deflection angle formed by the line connecting the center of each micromirror in the corresponding column after the installation of the free-form lens and the imaging center of each micromirror in the corresponding column before installation. The linear misalignment of the DMD single micromirror perpendicular to the scanning direction is Δx j , Δx j =S×L×(j-1)×tanθ;

步骤二、设计具有最大畸变量10.68μm的自由曲面透镜Step 2. Design a free-form surface lens with a maximum distortion of 10.68μm

由上至下按照光线路径依次设置DMD单微镜、自由曲面透镜、投影成像透镜以及光刻基板,建立直角坐标系,获取入射光线单位方向矢量参数,Matlab软件中采用马夸尔特算法进行多项式拟合后,获得自由曲面透镜的矢高z的最大值小于0.8236mm;Set the DMD single micromirror, free-form surface lens, projection imaging lens and lithography substrate in sequence from top to bottom according to the light path, establish a rectangular coordinate system, and obtain the unit direction vector parameters of the incident light. The Marquardt algorithm is used in Matlab software to perform polynomial After fitting, the maximum value of the sag height z of the free-form lens is less than 0.8236mm;

步骤三、投影成像系统的建模Step 3. Modeling of the projection imaging system

将自由曲面透镜面型导入光学软件Zemax中,获得该自由曲面透镜模型。The free-form lens surface was imported into the optical software Zemax to obtain the free-form lens model.

所述步骤一中安装该自由曲面透镜后与安装前对应列中每一个微镜成像后中心连线所成偏转角度为θ的光刻图案曝光总能量En的表达式为:The expression of the total exposure energy En of the lithography pattern formed by the deflection angle θ formed by the center connection line after the imaging of each micromirror in the corresponding column before the installation of the free-form surface lens in the first step is:

Figure GDA0002549462610000021
Figure GDA0002549462610000021

式中,Pi,j为单微镜中心光功率,t为时间积分变量,n为光刻图案像素的数目,M为扫描方向上单微镜的数目。where P i,j is the central optical power of a single micromirror, t is the time integral variable, n is the number of pixels in the lithography pattern, and M is the number of single micromirrors in the scanning direction.

通过上述设计方案,本发明可以带来如下有益效果:一种用于DMD光刻成像系统的自由曲面透镜及其设计方法,可以缩小DMD扫描光刻图案边缘锯齿,以获得最佳的光刻图形质量。Through the above-mentioned design scheme, the present invention can bring the following beneficial effects: a free-form surface lens used in a DMD lithography imaging system and a design method thereof, which can reduce the jagged edges of the DMD scanning lithography pattern to obtain the best lithography pattern quality.

附图说明Description of drawings

以下结合附图和具体实施方式对本发明作进一步的说明:The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments:

图1为本发明DMD单微镜正常和线性错位排布示意图。FIG. 1 is a schematic diagram of the normal and linear dislocation arrangement of the DMD single micromirror of the present invention.

图2为本发明DMD单微镜线性错位Δx101不同时,单像素和刻线的曝光效果图;Fig. 2 is the exposure effect diagram of the single pixel and the scribed line when the linear dislocation Δx 101 of the DMD single micromirror of the present invention is different;

图3为本发明自由曲面透镜在DMD投影成像系统的工作原理图。FIG. 3 is a working principle diagram of the free-form surface lens of the present invention in the DMD projection imaging system.

图4为本发明自由曲面透镜面型图。FIG. 4 is a surface profile diagram of a free-form surface lens of the present invention.

图5为本发明自由曲面透镜模型图。FIG. 5 is a model diagram of a free-form surface lens of the present invention.

图6为本发明实施例效果图。FIG. 6 is an effect diagram of an embodiment of the present invention.

图中1-DMD单微镜、2-自由曲面透镜、3-投影成像透镜、4-光刻基板。In the figure, 1-DMD single micromirror, 2-free-form surface lens, 3-projection imaging lens, 4-lithography substrate.

具体实施方式Detailed ways

一种用于DMD光刻成像系统的自由曲面透镜,其特征是:DMD单微镜与自由曲面透镜的距离为1mm,自由曲面透镜的材料为硅晶体,外轮廓尺寸为12mm×21mm,厚度为1mm,前表面面型为平面,后表面面型为自由曲面,最大畸变量为10.68μm。A free-form surface lens for a DMD lithography imaging system, characterized in that the distance between the DMD single micromirror and the free-form surface lens is 1mm, the material of the free-form surface lens is silicon crystal, the outer contour size is 12mm×21mm, and the thickness is 1mm, the front surface profile is a plane, the back surface profile is a free-form surface, and the maximum distortion is 10.68μm.

一种用于DMD光刻成像系统的自由曲面透镜的设计方法,其特征是:包括以下步骤,且以下步骤顺次进行,A method for designing a free-form surface lens for a DMD lithography imaging system, characterized in that it comprises the following steps, and the following steps are performed in sequence,

步骤一、能够平滑光刻图案边缘的DMD单微镜线性错位的计算Step 1. Calculation of linear dislocation of DMD single micromirror that can smooth the edge of lithography pattern

针对光刻图案边缘在扫描方向外存在锯齿的问题,提出如图1所示的单微镜线性错位形式。若设定y方向为光刻扫描方向(以下扫描方向均为此方向),j、i分别为单微镜所在的行和列,DMD的单微镜数目为i×j,L为单微镜的边长,投影透镜的放大倍率为S,在垂直于扫描方向上DMD单微镜的线性错位量为Δxj,安装该自由曲面透镜后与安装前对应列中每一个微镜成像后中心连线所成偏转角度为θ,则Δxj的表达式如(1)所示:Aiming at the problem that the edge of the lithography pattern has sawtooth outside the scanning direction, the linear dislocation form of the single micromirror as shown in Fig. 1 is proposed. If the y direction is set as the lithography scanning direction (the scanning direction below is the same direction), j and i are the row and column where the single micromirror is located, the number of single micromirrors of the DMD is i×j, and L is the single micromirror , the magnification of the projection lens is S, and the linear displacement of the DMD single micromirror in the direction perpendicular to the scanning direction is Δx j . The deflection angle formed by the line is θ, then the expression of Δx j is shown in (1):

Δxj=S×L×(j-1)×tanθ.......(1)Δx j =S×L×(j-1)×tanθ.......(1)

光刻图案曝光总能量En的表达式为:The expression of the total exposure energy En of the lithography pattern is:

Figure GDA0002549462610000031
Figure GDA0002549462610000031

式中Pi,j为单微镜中心光功率,t为时间积分变量,n为光刻图案像素的数目,M为扫描方向上单微镜的数目。当光刻胶的曝光阈值为E0,扫描方向上单微镜的数目为101个,En≥101E0时,单像素和刻线的曝光效果如图2所示,由左到右Δx101依次为0、0.5L和L。刻线的锯齿值如下表1所示。where P i,j is the central optical power of a single micromirror, t is the time integral variable, n is the number of pixels in the lithography pattern, and M is the number of single micromirrors in the scanning direction. When the exposure threshold of the photoresist is E 0 , the number of single micromirrors in the scanning direction is 101, and E n ≥ 101E 0 , the exposure effect of a single pixel and a scribed line is shown in Figure 2, from left to right Δx 101 0, 0.5L and L in order. The sawtooth values of the reticle are shown in Table 1 below.

Figure GDA0002549462610000041
Figure GDA0002549462610000041

表1刻线锯齿的值Table 1 Values of the serrations of the graticule

从表1可见,当Δx101取L(0.9En)时,以微镜的中心点连线为准取刻线线长与线宽的值,横线边缘锯齿由0.14个像素缩小至0个像素,斜线边缘锯齿由0.338个像素缩小至0.115个像素。斜线的宽度增加较大但不影响图形形状,这里以横线与竖线的线宽、线长变化为准,横线线长与线宽的改变量分别0.04和0.126个像素,竖线线长与线宽的改变量分别为-0.063和0.046个像素。图2和表1都说明了通过单微镜线性错位的方式,能够平滑光刻图案边缘。It can be seen from Table 1 that when Δx 101 is taken as L(0.9En), the value of the line length and line width of the scribed line is taken as the line connecting the center points of the micromirror, and the jagged edge of the horizontal line is reduced from 0.14 pixels to 0 pixels. , the slash edge aliasing is reduced from 0.338 pixels to 0.115 pixels. The width of the oblique line increases greatly but does not affect the shape of the graph. Here, the line width and length of the horizontal line and the vertical line shall prevail. The change of the line length and line width of the horizontal line is 0.04 and 0.126 pixels respectively. The changes in length and line width are -0.063 and 0.046 pixels, respectively. Both Figure 2 and Table 1 illustrate that the edge of the lithography pattern can be smoothed by means of linear dislocation of a single micromirror.

步骤二、具有特殊畸变特性的自由曲面透镜的设计Step 2. Design of free-form surface lens with special distortion characteristics

将激光光源设为405nm,DMD(1080×1920)的像素边长为10.68μm,整体尺寸为11.664mm×20.732mm,投影成像透镜的放大倍率为1,可得具有特殊畸变的自由曲面透镜的参数,如表2所示。The laser light source is set to 405nm, the pixel side length of DMD (1080×1920) is 10.68μm, the overall size is 11.664mm×20.732mm, and the magnification of the projection imaging lens is 1. The parameters of the free-form surface lens with special distortion can be obtained. ,As shown in table 2.

Figure GDA0002549462610000042
Figure GDA0002549462610000042

表2自由曲面透镜参数Table 2 Freeform lens parameters

自由曲面透镜的工作原理如图3所示,由上到下依次为DMD单微镜1、自由曲面透镜2、投影成像透镜3和光刻基板4。其中z为光轴方向,θ为安装该自由曲面透镜后与安装前对应列中每一个微镜成像后中心连线所成偏转角度。入射光线I与光轴z平行,自由曲面透镜使DMD微镜阵列表面A形成微镜阵列线性错位后的虚物B,虚物B到DMD的距离d由公式下式给出The working principle of the free-form surface lens is shown in FIG. 3 . From top to bottom, there are a DMD single micromirror 1 , a free-form surface lens 2 , a projection imaging lens 3 and a lithography substrate 4 . Among them, z is the direction of the optical axis, and θ is the deflection angle formed by the line connecting the imaging center of each micromirror in the corresponding column after the free-form surface lens is installed. The incident ray I is parallel to the optical axis z, and the free-form surface lens makes the surface A of the DMD micromirror array form a virtual object B after the micromirror array is linearly displaced, and the distance d from the virtual object B to the DMD is given by the following formula

d=(ni-1)×h……(3)d=(n i -1)×h...(3)

ni和h分别为自由曲面透镜的折射率和厚度。n i and h are the refractive index and thickness of the free-form surface lens, respectively.

虚物B经投影成像系统最终成像在光刻基板上,由于自由曲面透镜的作用,才导致DMD微镜阵列成像后发生了线性错位,如图中基板上的斜线相对于水平线发生错位,安装该自由曲面透镜后与安装前对应列中每一个微镜成像后中心连线所成偏转角度为θ。The virtual object B is finally imaged on the lithography substrate by the projection imaging system. Due to the action of the free-form surface lens, the DMD micromirror array is linearly dislocated after imaging. The deflection angle formed by the line connecting the rear of the free-form surface lens and the imaging center of each micromirror in the corresponding column before installation is θ.

经过直角坐标系的建立、入射光线单位方向矢量等参数的获取,依据单微镜的线性错位分析和空间光学snell定律以及多元微分数学知识等,可得自由曲面透镜面型的初始数据,在Matlab软件中采用马夸尔特算法(Levenberg-marquardt)进行多项式拟合后,可得自由曲面透镜的面型如图4所示,透镜矢高z的最大值接近0.8236mm。After the establishment of the rectangular coordinate system, the acquisition of parameters such as the unit direction vector of the incident light, according to the linear dislocation analysis of the single micromirror, the Snell's law of space optics, and the knowledge of multivariate differential mathematics, the initial data of the free-form lens surface can be obtained. In Matlab After polynomial fitting using the Levenberg-marquardt algorithm in the software, the surface shape of the free-form lens can be obtained as shown in Figure 4, and the maximum value of the lens sag z is close to 0.8236mm.

步骤三、投影成像系统的建模Step 3. Modeling of the projection imaging system

将自由曲面透镜面型导入光学软件Zemax中,获得该透镜模型,如图5所示。以DMD芯片尺寸的长边作为物面高度,短边作为物面宽度,利用放大倍率为1的理想成像透镜组形成无象差双远心光学系统,在像面上进行1:1的成像。The free-form lens surface shape was imported into the optical software Zemax to obtain the lens model, as shown in Figure 5. Taking the long side of the DMD chip size as the height of the object surface and the short side as the width of the object surface, an ideal imaging lens group with a magnification of 1 is used to form an aberration-free double-telecentric optical system, which performs 1:1 imaging on the image plane.

本发明设计的一种用于DMD光刻成像系统的自由曲面透镜模拟仿真对刻线边缘的平滑结果如图6所示,Figure 6 shows the smoothing result of the free-form surface lens simulation simulation on the edge of the scribed line designed by the present invention for the DMD lithography imaging system.

取曝光总能量为I,单微镜的边长为L,扫描方向上单微镜的数目为101个,投影成像透镜的放大倍率为1,以光刻图案“树”为例,模拟仿真安装自由曲面透镜前后“树”的曝光效果,图6为安装自由曲面透镜前后“树”的边缘图。Take the total exposure energy as I, the side length of a single micromirror as L, the number of single micromirrors in the scanning direction as 101, and the magnification of the projection imaging lens as 1, taking the lithography pattern "tree" as an example to simulate the installation The exposure effect of the "tree" before and after the free-form lens, Figure 6 is the edge map of the "tree" before and after installing the free-form lens.

Claims (2)

1. A design method of a free-form surface lens for a DMD photoetching imaging system is characterized by comprising the following steps: comprises the following steps which are sequentially carried out,
step one, calculating linear dislocation of DMD single micromirror capable of smoothing edge of photoetching pattern
Setting the y direction as the photoetching scanning direction, j and i as the rows and columns of DMD single micromirrors, i × j as the number of DMD single micromirrors, L as the side length of DMD single micromirrors, S as the magnification of projection lens, and theta as the deflection angle formed by the central connecting line after installing the free-form surface lens and after imaging each micromirror in the corresponding column before installing to obtain the angle perpendicular to the scanning directionLinear misalignment of DMD micromirrors is Δ xj,Δxj=S×L×(j-1)×tanθ;
Step two, designing a free-form surface lens with the maximum distortion of 10.68 mu m
The method comprises the steps that a DMD single micromirror, a free-form surface lens, a projection imaging lens and a photoetching substrate are sequentially arranged from top to bottom according to a light path, a rectangular coordinate system is established, unit direction vector parameters of incident light are obtained, and after polynomial fitting is carried out in Matlab software by adopting a Marquardt algorithm, the maximum value of the rise z of the free-form surface lens is smaller than 0.8236 mm;
step three, modeling of projection imaging system
The free-form surface lens model is obtained by introducing the free-form surface lens shape into the optical software Zemax.
2. The method of claim 1, wherein the free-form surface lens comprises: in the first step, the total exposure energy E of the photoetching pattern with the deflection angle theta formed by the central connecting line after the free-form surface lens is installed and after the imaging of each micromirror in the corresponding row before installationnThe expression of (a) is:
Figure FDA0002549462600000011
in the formula, Pi,jThe central optical power of the single micromirror, t is the time integral variable, n is the number of pixels of the lithography pattern, and M is the number of single micromirrors in the scanning direction.
CN201811218613.7A 2018-10-19 2018-10-19 Design method of free-form surface lens for DMD photoetching imaging system Expired - Fee Related CN109212636B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811218613.7A CN109212636B (en) 2018-10-19 2018-10-19 Design method of free-form surface lens for DMD photoetching imaging system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811218613.7A CN109212636B (en) 2018-10-19 2018-10-19 Design method of free-form surface lens for DMD photoetching imaging system

Publications (2)

Publication Number Publication Date
CN109212636A CN109212636A (en) 2019-01-15
CN109212636B true CN109212636B (en) 2020-09-25

Family

ID=64981134

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811218613.7A Expired - Fee Related CN109212636B (en) 2018-10-19 2018-10-19 Design method of free-form surface lens for DMD photoetching imaging system

Country Status (1)

Country Link
CN (1) CN109212636B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101916047A (en) * 2010-07-27 2010-12-15 浙江大学 A Lithography Exposure Device Using Freeform Surface Lens to Realize Off-axis Illumination
CN107942520A (en) * 2017-11-22 2018-04-20 东北师范大学 Even optical element and its design method for DMD digital photolithography systems

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4041700B2 (en) * 2002-06-25 2008-01-30 フジノン株式会社 Illumination optical system and projection display device using the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101916047A (en) * 2010-07-27 2010-12-15 浙江大学 A Lithography Exposure Device Using Freeform Surface Lens to Realize Off-axis Illumination
CN107942520A (en) * 2017-11-22 2018-04-20 东北师范大学 Even optical element and its design method for DMD digital photolithography systems

Also Published As

Publication number Publication date
CN109212636A (en) 2019-01-15

Similar Documents

Publication Publication Date Title
CN101790775B (en) Maskless exposure method
CN104669621B (en) Light-cured type 3D printing equipment and its imaging system
JP6493584B2 (en) Illumination optical unit for EUV projection lithography
JP2017511979A (en) Pixel blending for multiple charged particle beam lithography
CN102103332B (en) High-speed digital scanning direct write photoetching device
JP5133841B2 (en) Slice image generation method and modeling apparatus
CN101576715B (en) Calibration method for microscopic imaging systems
US20120262686A1 (en) Optical Imaging Writer System
JP5595001B2 (en) Projection optical system, exposure apparatus, and device manufacturing method
CN107942520A (en) Even optical element and its design method for DMD digital photolithography systems
CN109270804A (en) Tilt the calibration method of adjustment of direct write exposure machine lens ratio and deflection angle
Chien et al. Maskless lithography based on oblique scanning of point array with digital distortion correction
CN108681213B (en) Digital lithography system and method
JP4532200B2 (en) Drawing device
JP6843151B2 (en) Light intensity adjustment method
CN111562725B (en) Method for improving photoetching resolution ratio based on space-time cooperative transformation exposure
CN201993577U (en) High-speed digital scanning and direct writing photoetching device
CN109212636B (en) Design method of free-form surface lens for DMD photoetching imaging system
CN106933047B (en) A kind of exposure method
CN108305231B (en) Lens distortion correction method in maskless photoetching technology
CN105185703A (en) Wafer edge leveling method
JP4744954B2 (en) Substrate manufacturing method and exposure apparatus
KR102225409B1 (en) Pattern lithography method, photomask manufacturing method, and display device manufacturing method
CN115847804A (en) Projection photocuring 3D printer splicing assembly method
KR101137446B1 (en) method for real-time correction of digital lithographic pattern and apparatus thereof

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20200925

Termination date: 20211019