CN107391326A - A kind of method for testing pressure of storage device, device and server - Google Patents

Abstract

Embodiments of the present invention provide a storage device stress testing method, device, and server. The source partition and the target partition are determined from the partition set of the storage device, wherein the source partition is the partition where the test file is located, and the target partition is The partition is the partition to be operated on by the test file; the mark file is established, and the mark file is used to describe the operation completion state of the test file, and the state of the mark file is the mark state during the operation of the test file; the test The file is operated from the source partition to the target partition; after a reference time, when the status of the marked file is marked, it is determined that the test is abnormal. The embodiment of the present invention controls the operation of the test file through the source partition and the target partition, and determines the test result according to the state of the marked file, effectively performs a stress test on the storage device, and then accurately verifies the reliability of the storage device.

Description

Stress testing method, device and server for storage device

technical field

The invention relates to the technical field of storage device testing, in particular to a storage device stress testing method, device and server.

Background technique

With the development of computer technology, files carrying data information have grown from a few KB to tens of GB or even hundreds of GB at present. For example, an image file of an operating system or an audio-visual file can usually reach 2 to 3 GB. Files are usually stored in a storage device; the storage device can include a hard disk or a disk array composed of multiple hard disks, and is configured as multiple partitions, so that users can store files in different partitions according to the attributes of the files.

In the process of organizing files, users may need to frequently perform file operations such as copying and cutting. Since the files are usually up to several GB, the storage device may face greater read and write pressure; and if the reliability of the storage device Not high, under the high reading and writing pressure caused by large file operations, files may be damaged or lost, which may cause data security risks or even security accidents to users. Therefore, how to perform a stress test on a storage device, verify the reliability of the storage device, and ensure data security is a technical problem urgently needed to be solved by those skilled in the art.

Contents of the invention

In view of the above-mentioned shortcomings of the prior art, the object of the present invention is to provide a storage device stress test method, device and server, which are used to perform a stress test on the storage device and verify its reliability.

In order to achieve the above object and other related objects, according to the first aspect of the present invention, an embodiment of the present invention provides a method for stress testing a storage device, the method including the following steps:

From the partition set of the storage device, determine a source partition and a target partition, wherein the source partition is the partition where the test file is located, and the target partition is the partition to which the test file is to be operated;

Establishing a marking file, the marking file is used to describe the completion status of the test file test operation, and the state of the marking file is the marking state during the operation of the test file;

Manipulate test files from source partition to target partition;

After the reference time passes, when the status of the marked file is marked, it is determined that the test is abnormal.

Optionally, the determining the source partition and the target partition includes:

Use the partition where the test file is located as the source partition;

Delete the source partition from the partition set to obtain the candidate partition;

A target partition is randomly selected from the set of candidate partitions.

Optionally, the determining the source partition and the target partition includes:

Use the partition where the test file is located as the source partition;

According to the order of the drive letter of the partition set, select the adjacent partition and the partition after the source partition as the target partition.

Optionally, the establishment of the identification file includes:

Establishing a label file in the target partition;

or,

Create a label file in the source partition;

The operation of test files from the source partition to the target partition includes,

Bind the markup file to the test file;

Operate the bound test file from the source partition to the target partition.

Optionally, the method also includes:

During the process of the test file being operated from the source partition to the target partition, the file stream of the test file is read, and the operation speed is calculated;

Wherein, the size of each sub-file in the file stream is the same.

Optionally, before operating the test file from the source partition to the target partition, the method further includes:

Get the capacity of the target partition;

Determine the size of the test file according to the capacity of the target partition;

Said operating the test file from the source partition to the target partition includes selecting a test file of a corresponding size from the test file library, and operating the test file from the source partition to the target partition.

According to the second aspect of the present invention, an embodiment of the present invention further provides a pressure testing device for a storage device, the device comprising:

A partition determining module, configured to determine a source partition and a target partition from a partition set of the storage device, wherein the source partition is the partition where the test file is located, and the target partition is the partition to which the test file is to be operated;

A marking module, used to create a marking file, the marking file is used to describe the operation completion status of the test file, and the state of the marking file is the marking state during the operation of the test file;

The operation module is used to operate the test file from the source partition to the target partition;

The detection module is configured to determine that the test is abnormal when the status of the marked file is the marked state after the reference time has elapsed.

Optionally, the partition determination module is used to,

Use the partition where the test file is located as the source partition;

Delete the source partition from the partition set to obtain the candidate partition set;

A target partition is randomly selected from the set of candidate partitions.

Optionally, the marking module is used for,

Establishing a label file in the target partition;

or,

Create a label file in the source partition;

The operation module is also used for,

Bind the markup file to the test file;

Operate the bound test file from the source partition to the target partition.

According to a third aspect of the present invention, an embodiment of the present invention further provides a server, where the server includes at least one processor; and,

a memory communicatively coupled to the at least one processor; wherein,

The memory stores instructions executable by the one processor, the instructions being executed by the at least one processor, to enable the at least one processor to:

From the partition set of the storage device, determine a source partition and a target partition, wherein the source partition is the partition where the test file is located, and the target partition is the partition to which the test file is to be operated;

Establishing a marking file, the marking file is used to describe the operation completion state of the test file, and the state of the marking file is the marking state during the operation of the test file;

Manipulate test files from source partition to target partition;

After the reference time passes, when the status of the marked file is marked, it is determined that the test is abnormal.

As mentioned above, a storage device stress testing method, device and server provided by the embodiments of the present invention have the following beneficial effects: by determining the source partition and the target partition from the partition set of the storage device, wherein the source partition For the partition where the test file is located, the target partition is the partition to be operated on by the test file; set up a mark file, the mark file is used to describe the operation completion status of the test file, and described in the operation process of the test file The status of the marked file is the marked state; the test file is operated from the source partition to the target partition; after a reference time, when the state of the marked file is the marked state, it is determined that the test is abnormal. The embodiment of the present invention controls the operation of the test file through the source partition and the target partition, and determines the test result according to the state of the marked file, effectively performs a stress test on the storage device, and then accurately verifies the reliability of the storage device.

Description of drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description serve to explain the principles of the invention.

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, In other words, other drawings can also be obtained from these drawings without paying creative labor.

FIG. 1 is a network architecture diagram of a storage device provided by an embodiment of the present invention;

FIG. 2 is a schematic flowchart of a method for stress testing a storage device provided by an embodiment of the present invention;

FIG. 3 is a schematic flowchart of a method for determining a source partition and a target partition provided by an embodiment of the present invention;

FIG. 4 is a schematic flowchart of another method for determining a source partition and a target partition provided by an embodiment of the present invention;

FIG. 5 is a schematic flowchart of a test file operation method provided by an embodiment of the present invention;

FIG. 6 is a schematic flowchart of another storage device stress testing method provided by an embodiment of the present invention;

FIG. 7 is a schematic structural diagram of a pressure testing device for a storage device provided by an embodiment of the present invention;

FIG. 8 is a schematic diagram of a hardware structure of a server implementing a method for stress testing a storage device according to an embodiment of the present invention.

detailed description

In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

See Figures 1 through 8. It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of the present invention, so that only the components related to the present invention are shown in the diagrams rather than the number, shape and Dimensional drawing, the type, quantity and proportion of each component can be changed arbitrarily during actual implementation, and the component layout type may also be more complicated.

Referring to FIG. 1 , it is a network architecture diagram of a storage device provided by an embodiment of the present invention. As shown in Figure 1, the storage device includes a disk array 2 and a storage machine 3; the disk array 2 is usually set inside the server 1, and the server 1 is connected through a RAID (English: Redundant Arrays of Independent Disk, Chinese: disk array) card A disk array 2 composed of multiple hard disks. The disk array 2 formed in the embodiment of the present invention may include RAID0, RAID1, RAID5, and RAID10. The server 1 may also control the disk array 2 to be divided into multiple partitions. Server 1 can also be connected to storage machine 3 through HBA (English: Host Bus Adapter, Chinese: Host Bus Adapter) card, and multiple SAN (English: Storage Area Network, Chinese: storage area network) partitions can be set in storage machine 3. In this way, the server 1 can access the partitions in the disk array 2 and the SAN partitions in the storage machine 3 . The storage device stress test method provided by the embodiment of the present invention can be applied to the above-mentioned storage device architecture. Of course, the above-mentioned storage device architecture is only an exemplary embodiment, and the storage device stress test method provided by the embodiment of the present invention can also be The embodiment of the present invention does not limit the application to storage devices of other arbitrary architectures.

Referring to FIG. 2 , it is a schematic flowchart of a stress testing method for a storage device provided by an embodiment of the present invention. As shown in FIG. 2 , the embodiment of the present invention shows a process in which a server executes a stress testing method for a storage device:

Step S101: From the partition set of the storage device, determine a source partition and a target partition, wherein the source partition is the partition where the test file is located, and the target partition is the partition to which the test file is to be operated.

In a common storage device, the storage space is usually divided into multiple partitions. In an exemplary embodiment, the multiple partitions may be "partition d", "partition e", "partition f" and "partition g "Wait. In the embodiment of the invention, by determining the source partition and the target partition, it is convenient to execute the operation of the test file in the subsequent test steps; wherein, the source partition can be understood as the partition saved by the test file, and the target partition can be understood as The partition to which the test file is to be operated. An exemplary embodiment When copying the test file from "partition d" to "partition e", "partition d" may be the source partition, and "partition e" may be the target partition.

In order to determine the source partition and the target partition so as to facilitate the implementation of test control, in the first implementation case, refer to FIG. 3 , which is a schematic flowchart of a method for determining the source partition and the target partition provided by the embodiment of the present invention. As shown in Figure 3, the method includes:

Step S1011: Use the partition where the test file is located as the source partition.

If the test file is in "partition d", you can use "partition d" as the source partition.

Step S1012: Delete the source partition from the partition set to obtain a candidate partition set.

The server may obtain all the partition sets of the storage device, and the specific process of obtaining the partition sets will not be repeated in this embodiment of the present invention. In an exemplary embodiment, the partition set may be {"partition d", "partition e", "partition f", "partition g"}.

According to the source partition determined in step S1011, the source partition is deleted from the partition set to obtain the candidate partition set. When the source partition is determined to be "partition d", after the source partition is deleted, a candidate partition set {"partition e", "partition f", "partition g"} can be obtained.

Step S1013: Randomly select a target partition from the candidate partition set.

According to the candidate partition set obtained in step S1012, a target partition is randomly selected from the candidate partition set. When the candidate partition set is {"partition e", "partition f", "partition g"}, a partition can be randomly selected from the candidate partition set as the target partition, for example, "partition f" can be randomly selected as the target partition.

In this way, the source partition can be "partition d" and the target partition can be "partition f", and the operation of the test file can be performed in subsequent steps. The operation of the test file can be a copy or cut operation, or copy and delete Combination of operations, so that after the operation of the test file, you can continue to return to step S1011, and determine the new source partition as "partition f", and continue to execute steps S1012 to S1013 to complete the determination of the target partition.

It can be seen from the description of the above embodiments that the embodiment of the present invention can access all disk partitions in a random traversal manner, thereby completing the stress test operation for each disk partition, because during the access process of the storage system, each disk The access sequence of the partitions may be random rather than executed sequentially. Therefore, the random traversal method adopted in the embodiment of the present invention can effectively match the actual use process of the storage device, thereby improving the accuracy of the stress test of the storage device.

In the second implementation situation, refer to FIG. 4 , which is a schematic flowchart of another method for determining a source partition and a target partition provided by an embodiment of the present invention. As shown in Figure 4, the method includes:

Step S1014: Use the partition where the test file is located as the source partition.

Likewise, in an exemplary embodiment, if the test file is in "partition d", then "partition d" may be used as the source partition.

Step S1015: According to the order of the drive letter of the partition set, select the adjacent partition and the partition after the source partition as the target partition.

In the embodiment of the present invention, the target partition may be determined according to the order of the drive letter of the partition set. Also taking the partition set as {"partition d", "partition e", "partition f", "partition g"} as an example, when the source partition is determined to be "partition d" according to step S1014, since "partition e" is If the alphabetical order of characters is after "partition d" and adjacent to "partition d", then the target partition can be determined as "partition d", and the source partition is "partition d" and the target partition is "partition e". Test file operations for subsequent steps. Further, after executing the test file operation, return to step S1014 again, so as to determine that the new source partition is "partition e". In this way, the embodiment of the present invention can traverse each disk partition in a fixed order, thereby completing the stress test of the storage device, reducing the complexity of the operation, and facilitating the rapid execution of the test.

Of course, it should be noted that the order of the drive letters of the above-mentioned partition set is only an exemplary embodiment, and may be sorted in ascending or descending order according to the letter of the drive letter, or in ascending or descending order according to the number in the name of the drive letter during specific implementation. There is no limitation in the embodiment of the present invention.

Step S102: Create a flag file, the flag file is used to describe the operation completion state of the test file, and the state of the flag file is the flag state during the operation of the test file.

During specific implementation, when the test file is started to be operated, for example, the test file is copied from the source partition to the target partition, the mark file is established, and the state of the mark file is set to mark state, which is used to mark that the test file is being operated. In an exemplary embodiment, when the server executes the test file operation, the marked file can be set to an exclusive state or an occupied state. Since the marked file is occupied, when the process in the server accesses the marked file, it will prompt that it cannot be opened. ; When the server monitors the system process or obtains the completion message of the test file operation process, it sets the marked file to the unoccupied state. At this time, the server can access the marked file and open it normally, without prompting that the file is occupied and cannot be opened.

In the first implementation situation, an identification file may be created in the target partition. In an exemplary embodiment, when the test file is copied from "partition d" to "partition e", the target partition is "partition e", and a logo file can be created in "partition e".

In the second implementation situation, a label file may be created in the source partition. In an exemplary embodiment, when the test file is copied from "partition d" to "partition e", then the source partition is "partition d", and the logo file can be created in "partition d".

Step S103: Operating the test file from the source partition to the target partition.

In order to ensure the pressure on the storage device, during specific implementation, the test file is usually a large file, for example, the test file can use a 500GB file; and, in the embodiment of the present invention, the form of the test file is not As a limitation, the test file can be a combination of one or more of text files, video files, and audio files; in addition, the test file can be a file with a larger capacity, or a plurality of small files collection of files.

While the test is in progress, the test files are manipulated from the source partition to the target partition. The operation on the test file may be copying, cutting, or a combination of copying and cutting, which is not limited in this embodiment of the present invention.

According to the creation method of the label file in step S102, when creating the label file in the source partition, refer to FIG. 5 , which is a schematic flowchart of a test file operation method provided by the embodiment of the present invention. As shown in Figure 5, the method includes:

Step S1031: Bind the markup file to the test file.

When the markup file is created in the source partition, the markup file and the test file can be bound together and operated together with the test file.

Step S1032: Operate the bound test file from the source partition to the target partition.

During specific implementation, the marked file can be operated to the target partition together with the test file, and the marked state of the marked file can be configured according to the setting method of the above-mentioned embodiment; After completing and configuring the completed flag state, operate the test file from the source partition to the target partition.

In order to accurately measure the performance of the storage device under the stress test, in the embodiment of the present invention, it is also possible to read the file stream of the test file and calculate the operation speed during the operation of the test file from the source partition to the target partition; wherein , each subfile in the file stream is the same size. During specific implementation, during the operation process of executing the test file, the test tool provided by the system can be used to read the file stream of the test file, which will not be repeated in the embodiment of the present invention; and the file stream usually includes a plurality of sub-files. In the embodiment of the present invention, in order to ensure the accuracy of the test, the size of each subfile is set to be the same, so that the operating speed obtained by the test can be guaranteed to be obtained under the same configuration environment; in an exemplary embodiment, the size of the subfile can be Set to 1KB etc.

Step S104: When the reference time elapses, when the status of the marked file is marked, it is determined that the test is abnormal.

In the embodiment of the present invention, the corresponding reference time can be set according to the size of the test file. For example, when the test file is 500GB, the test can be calculated according to the above-mentioned operating speed according to the statistical results of historical tests and the operating speed is 10MB/s. It takes 51200 seconds to complete the file operation, and the reference time can be set to 51200 seconds; or an evaluation coefficient can be determined, and the product of the evaluation coefficient and the above-mentioned required time can be used as the reference time, for example, through the statistical results of historical tests, If the evaluation coefficient is determined to be 1.2, then the reference time can be determined to be 1.2×51200=61440 seconds.

The reference time is used as a judgment basis to judge whether the test is abnormal. In an exemplary embodiment, when the reference time is reached, the server can access the marked file. If the state of the marked file is still marked, such as being occupied or monopolized, the marked test file is still in operation, and it may be due to file loss. If the operation delay of the test file is caused by the package, etc., the test abnormality is further determined; when the reference time is reached, the server accesses the marked file. If the state of the marked file is not marked, such as unoccupied, the server can open the marked file normally. It means that the operation of the test file has been successfully completed, and it can be determined that the test is passed.

Of course, after the test is determined to pass, the test file may be further verified. The specific verification process can include: obtaining the first verification code of the test file in the source partition, the first verification code can be MD5 code or hash verification code, etc.; The second check code of the test file after the operation is completed; if the first check code is consistent with the second check code, it can be determined that the test file has passed the check and the test file is complete; if the first check code is consistent with the second check code If the verification codes are not equal, it can be determined that the verification of the test file fails, and the test file may be damaged.

It can be seen from the description of the above embodiments that the embodiment of the present invention provides a stress testing method for a storage device, which determines the source partition and the target partition from the partition set of the storage device, wherein the source partition is the location where the test file is located. Partition, the target partition is the partition to be operated on by the test file; set up a mark file, the mark file is used to describe the operation completion status of the test file, and the state of the mark file during the operation of the test file is Marking the state; operating the test file from the source partition to the target partition; after a reference time, when the state of the marked file is marked, it is determined that the test is abnormal. The embodiment of the present invention controls the operation of the test file through the source partition and the target partition, and determines the test result according to the state of the marked file, effectively performs a stress test on the storage device, and then accurately verifies the reliability of the storage device.

In order to improve the flexibility of the storage device stress test, refer to FIG. 6 , which is a schematic flowchart of another storage device stress test method provided by an embodiment of the present invention. As shown in Figure 6, the method includes the following steps:

Step S201: From the partition set of the storage device, determine a source partition and a target partition, wherein the source partition is the partition where the test file is located, and the target partition is the partition to which the test file is to be operated.

Step S202: Create a flag file, the flag file is used to describe the operation completion state of the test file, and the state of the flag file is the flag state during the operation of the test file.

Step S203: Obtain the capacity of the target partition;

According to the target partition determined in step S201, the capacity of the target partition is acquired. During specific implementation, the server can use tools such as "fdisk" to obtain the capacity of the storage device, which will not be described in detail in the embodiments of the present invention. In an exemplary embodiment, the target partition is "partition e", and the capacity of "partition e" is further obtained to be 500GB.

Step S204: Determine the size of the test file according to the capacity of the target partition.

According to the target partition capacity acquired in step S203, when the target partition is "partition e" and the capacity of "partition e" is 500GB, the size of the test file can be further determined. In the embodiment of the present invention, it is determined that the size of the test file is smaller than the capacity of the target partition. In an exemplary embodiment, it may be determined that the size of the test file is 499GB or the like.

Step S205: Select a test file of a corresponding size from the test file library, and operate the test file from the source partition to the target partition.

After the size of the test file is obtained from step S204, a test file of a corresponding size may be further selected from the test file library. In an exemplary embodiment, a test file library with files of different sizes may be established. For example, the test file library may include multiple test files of different sizes such as 100GB, 200GB, 400GB, and 500GB. When the size of the test file is determined to be 499GB, the closest test file can be selected from the test file library, for example, a test file of 400GB is selected for subsequent operations.

Step S206: When the reference time elapses, when the status of the marked file is marked, it is determined that the test is abnormal.

For the similarities between the embodiment of the present invention and the foregoing embodiment, reference may be made to the description of the foregoing embodiment, and details are not repeated here.

It can be seen from the description of the above embodiments that another storage device stress test method provided by the embodiment of the present invention can adapt to the stress test of storage devices with different partition sizes by dynamically adjusting the size of the target partition to select the test file to be used. Effectively provides flexibility and applicability of testing.

Through the description of the above method embodiments, those skilled in the art can clearly understand that the present invention can be implemented by means of software plus a necessary general-purpose hardware platform, and of course also by hardware, but in many cases the former is better implementation. Based on this understanding, the essence of the technical solution of the present invention or the part that contributes to the prior art can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions to make a A computer device (which may be a personal computer, a server, or a network device, etc.) executes all or part of the steps of the methods described in the various embodiments of the present invention. The foregoing storage medium includes various media capable of storing program codes such as read-only memory (ROM), random access memory (RAM), magnetic disk or optical disk.

Corresponding to the embodiment of the stress testing method for the storage device provided by the present invention, the present invention also provides a stress testing device for the storage device.

Referring to FIG. 7 , it is a schematic structural diagram of a pressure testing device for a storage device provided by an embodiment of the present invention. As shown in Figure 7, the device includes:

The partition determination module 11 is configured to determine a source partition and a target partition from the partition set of the storage device, wherein the source partition is the partition where the test file is located, and the target partition is the partition to which the test file is to be operated;

The marking module 12 is used to create a marking file, the marking file is used to describe the operation completion state of the test file, and the state of the marking file is the marking state during the operation of the test file;

An operating module 13, configured to operate the test file from the source partition to the target partition;

The detection module 14 is configured to determine that the test is abnormal when the status of the marked file is marked when the reference time has passed.

In the first implementation situation, the partition determination module 11 can also be used to use the partition where the test file is located as the source partition;

Delete the source partition from the partition set to obtain the candidate partition set;

A target partition is randomly selected from the set of candidate partitions.

In the second implementation situation, the partition determination module 11 can also be used to use the partition where the test file is located as the source partition;

According to the order of the drive letter of the partition set, select the adjacent partition and the partition after the source partition as the target partition.

In order to create a marking file, in the first implementation situation, the marking module 12 may be used to create a marking file in the target partition. In the second implementation situation, the marking module 12 may be used to create a marking file in the source partition.

According to the way that the marking module 12 establishes the marking file, when the marking module 12 sets up the marking file in the source partition, the operation module 13 can also be used to bind the marking file to the test file; partition operation to the target partition.

In order to accurately evaluate the performance of the storage device under the stress test, in the embodiment of the present invention, the operation module 13 can also read the file stream of the test file during the operation of the test file from the source partition to the target partition, computing the speed of the operation; wherein each sub-file in the file stream has the same size.

In order to increase the flexibility of the stress test of the storage device, in the embodiment of the present invention, before the operation module 13 operates the test file from the source partition to the target partition, it may also include:

Get the capacity of the target partition;

Determine the size of the test file according to the capacity of the target partition;

Select a test file of the corresponding size from the test file library, and operate the selected test file from the source partition to the target partition.

Referring to FIG. 8 , it is a schematic diagram of a hardware structure of a server performing a stress testing method for a storage device according to an embodiment of the present invention. As shown in FIG. 8 , the server includes:

One or more processors 810 and memory 820, one processor 810 is taken as an example in FIG. 8 .

The server executing the method for stress testing storage devices may further include: an input device 830 and an output device 840 .

The processor 810, the memory 820, the input device 830, and the output device 840 may be connected through a bus or in other ways. In FIG. 8, connection through a bus is taken as an example.

The memory 820, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer-executable programs and modules, such as the stress test method of the storage device in the embodiment of the present application. program instructions/modules (for example, the partition determination module 11, the labeling module 12, the operation module 13, and the detection module 14 shown in FIG. 7). The processor 810 executes various functional applications and data processing of the server by running the non-volatile software programs, instructions and modules stored in the memory 820, that is, implements the stress testing method of the storage device in the above method embodiment.

The memory 820 may include a program storage area and a data storage area, wherein the program storage area may store an operating system and an application program required by at least one function; the data storage area may store data created according to the use of the stress testing device of the storage device, etc. . In addition, the memory 820 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid-state storage devices. In some embodiments, the storage 820 may optionally include storages that are remotely located relative to the processor 810, and these remote storages may be connected to the stress testing device of the storage device through a network. Examples of the aforementioned networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

The input device 830 can receive input numbers or character information, and generate key signal input related to user settings and function control of the stress test device of the storage device. The output device 840 may include a display device such as a display screen.

The one or more modules are stored in the memory 820 , and when executed by the one or more processors 810 , execute the storage device stress testing method in any of the above method embodiments.

The above-mentioned server can execute the method provided by the embodiment of the present invention, and has corresponding functional modules and beneficial effects for executing the method. For technical details that are not exhaustively described in this embodiment, refer to the method provided in the embodiment of the present invention.

The device embodiments described above are only illustrative, and the units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in One place, or it can be distributed to multiple network elements. Part or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment

Each embodiment in this specification is described in a progressive manner, the same and similar parts of each embodiment can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the device or system embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and for relevant parts, please refer to part of the description of the method embodiments. The device and system embodiments described above are only illustrative, and the units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, It can be located in one place, or it can be distributed to multiple network elements. Part or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. It can be understood and implemented by those skilled in the art without creative effort.

It should be noted that in this article, relative terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply these No such actual relationship or order exists between entities or operations. Furthermore, the term "comprises", "comprises" or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or apparatus comprising a set of elements includes not only those elements, but also includes elements not expressly listed. other elements of or also include elements inherent in such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus comprising said element.

The above descriptions are only specific embodiments of the present invention, so that those skilled in the art can understand or implement the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the present invention will not be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (10)

1. A method of stress testing a storage device, comprising the steps of:

determining a source partition and a target partition from a partition set of a storage device, wherein the source partition is a partition where a test file is located, and the target partition is a partition to which the test file is to be operated;

establishing a marking file, wherein the marking file is used for describing the operation completion state of a test file, and the state of the marking file is a marking state in the operation process of the test file;

operating the test file from the source partition to the target partition;

and determining test exception when the state of the marking file is the marking state after the reference time.

2. The method of stress testing of a storage device of claim 1, wherein said determining a source partition and a target partition comprises:

taking the partition where the test file is located as a source partition;

deleting the source partition from the partition set to obtain a candidate partition set;

randomly selecting a target partition from the candidate partition set.

3. The method of stress testing of a storage device of claim 1, wherein said determining a source partition and a target partition comprises:

taking the partition where the test file is located as a source partition;

and selecting the partitions adjacent to and arranged after the source partition as the target partition according to the partition set drive order.

4. A method for stress testing of a storage device according to any of claims 1 to 3, wherein said creating an indication file comprises:

establishing a marking file in the target partition;

or,

establishing a marking file in the source partition;

the operating of the test file from the source partition to the target partition includes,

binding the markup file to the test file;

and operating the bound test file from the source partition to the target partition.

5. The method for stress testing of a storage device of claim 1, further comprising:

reading a file stream of a test file and calculating the operation speed in the process of operating the test file from a source partition to a target partition;

wherein the size of each subfile in the file stream is the same.

6. The method for stress testing of a storage device according to claim 1, wherein before operating the test file from the source partition to the target partition, further comprising:

acquiring the capacity of a target partition;

determining the size of the test file according to the capacity of the target partition;

the operating the test file from the source partition to the target partition includes selecting a test file of a corresponding size from a test file library, and operating the selected test file from the source partition to the target partition.

7. A pressure testing apparatus for a storage device, comprising:

the device comprises a partition determining module, a partition determining module and a partition determining module, wherein the partition determining module is used for determining a source partition and a target partition from a partition set of a storage device, the source partition is a partition where a test file is located, and the target partition is a partition to which the test file is to be operated;

the system comprises a marking module, a test module and a control module, wherein the marking module is used for establishing a marking file, the marking file is used for describing the operation completion state of a test file, and the state of the marking file is a marking state in the operation process of the test file;

the operation module is used for operating the test file from the source partition to the target partition;

and the detection module is used for determining test abnormity when the state of the marking file is the marking state after reference time.

8. The pressure testing apparatus of claim 7, wherein the partition determination module is configured to,

taking the partition where the test file is located as a source partition;

deleting the source partition from the partition set to obtain a candidate partition set;

randomly selecting a target partition from the candidate partition set.

9. Pressure testing device of a storage device according to claim 7 or 8, characterized in that the designation module is adapted to,

establishing a marking file in the target partition;

or,

establishing a marking file in the source partition;

the operation module is also used for operating the operation module,

binding the markup file to the test file;

and operating the bound test file from the source partition to the target partition.

10. A server, characterized in that the server comprises at least one processor; and the number of the first and second groups,

a memory communicatively coupled to the at least one processor; wherein,

the memory stores instructions executable by the one processor to cause the at least one processor to:

determining a source partition and a target partition from a partition set of a storage device, wherein the source partition is a partition where a test file is located, and the target partition is a partition to which the test file is to be operated;

establishing a marking file, wherein the marking file is used for describing the operation completion state of a test file, and the state of the marking file is a marking state in the operation process of the test file;

operating the test file from the source partition to the target partition;

and determining test exception when the state of the marking file is the marking state after the reference time.