CN106611799B - A kind of two-sided crystal silicon solar energy battery of inkjet printing and preparation method thereof - Google Patents
A kind of two-sided crystal silicon solar energy battery of inkjet printing and preparation method thereof Download PDFInfo
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 88
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 84
- 239000010703 silicon Substances 0.000 title claims abstract description 84
- 238000007641 inkjet printing Methods 0.000 title claims abstract description 32
- 238000002360 preparation method Methods 0.000 title claims abstract description 19
- 239000013078 crystal Substances 0.000 title description 7
- 239000000758 substrate Substances 0.000 claims abstract description 55
- 238000002161 passivation Methods 0.000 claims abstract description 53
- 229910052814 silicon oxide Inorganic materials 0.000 claims abstract description 47
- 239000005543 nano-size silicon particle Substances 0.000 claims abstract description 45
- 238000009792 diffusion process Methods 0.000 claims abstract description 39
- 239000011574 phosphorus Substances 0.000 claims abstract description 39
- 229910052698 phosphorus Inorganic materials 0.000 claims abstract description 39
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims abstract description 38
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 34
- 229910052709 silver Inorganic materials 0.000 claims abstract description 32
- 239000004332 silver Substances 0.000 claims abstract description 32
- 229910021419 crystalline silicon Inorganic materials 0.000 claims abstract description 31
- 238000000034 method Methods 0.000 claims description 40
- 238000005530 etching Methods 0.000 claims description 20
- 238000000151 deposition Methods 0.000 claims description 18
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 15
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 15
- 238000004518 low pressure chemical vapour deposition Methods 0.000 claims description 13
- 230000008021 deposition Effects 0.000 claims description 12
- 238000001020 plasma etching Methods 0.000 claims description 12
- 238000004140 cleaning Methods 0.000 claims description 11
- 238000012986 modification Methods 0.000 claims description 10
- 230000004048 modification Effects 0.000 claims description 10
- 229910004205 SiNX Inorganic materials 0.000 claims description 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 8
- 239000003513 alkali Substances 0.000 claims description 7
- 239000012670 alkaline solution Substances 0.000 claims description 6
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 6
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 5
- 229920005591 polysilicon Polymers 0.000 claims description 5
- 238000000231 atomic layer deposition Methods 0.000 claims description 4
- 238000006555 catalytic reaction Methods 0.000 claims description 4
- 229910021645 metal ion Inorganic materials 0.000 claims description 4
- 230000003647 oxidation Effects 0.000 claims description 4
- 238000007254 oxidation reaction Methods 0.000 claims description 4
- 238000009279 wet oxidation reaction Methods 0.000 claims description 4
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 claims description 2
- 239000004744 fabric Substances 0.000 claims description 2
- 238000010329 laser etching Methods 0.000 claims description 2
- 230000031700 light absorption Effects 0.000 abstract description 7
- 230000003287 optical effect Effects 0.000 abstract description 7
- 238000005516 engineering process Methods 0.000 abstract description 6
- 239000010408 film Substances 0.000 description 81
- 239000005360 phosphosilicate glass Substances 0.000 description 34
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 24
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 16
- XHXFXVLFKHQFAL-UHFFFAOYSA-N phosphoryl trichloride Chemical compound ClP(Cl)(Cl)=O XHXFXVLFKHQFAL-UHFFFAOYSA-N 0.000 description 16
- 238000006243 chemical reaction Methods 0.000 description 14
- 239000007789 gas Substances 0.000 description 9
- 238000012360 testing method Methods 0.000 description 9
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 8
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 8
- 239000000243 solution Substances 0.000 description 8
- 229910052581 Si3N4 Inorganic materials 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- 239000005388 borosilicate glass Substances 0.000 description 5
- 239000012535 impurity Substances 0.000 description 5
- RLOWWWKZYUNIDI-UHFFFAOYSA-N phosphinic chloride Chemical compound ClP=O RLOWWWKZYUNIDI-UHFFFAOYSA-N 0.000 description 5
- 239000002994 raw material Substances 0.000 description 5
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 5
- 238000005245 sintering Methods 0.000 description 5
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 4
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 4
- 229910019213 POCl3 Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 4
- 229910052796 boron Inorganic materials 0.000 description 4
- 238000003486 chemical etching Methods 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 230000007797 corrosion Effects 0.000 description 4
- 238000005260 corrosion Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 4
- 239000003517 fume Substances 0.000 description 4
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 description 4
- 229910000041 hydrogen chloride Inorganic materials 0.000 description 4
- 239000003317 industrial substance Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 238000005498 polishing Methods 0.000 description 4
- 229910021426 porous silicon Inorganic materials 0.000 description 4
- 230000006798 recombination Effects 0.000 description 3
- 238000005215 recombination Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 238000009795 derivation Methods 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 239000011737 fluorine Substances 0.000 description 2
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 description 2
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 2
- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 229910018503 SF6 Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000010849 ion bombardment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 229910001961 silver nitrate Inorganic materials 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
- SFZCNBIFKDRMGX-UHFFFAOYSA-N sulfur hexafluoride Chemical compound FS(F)(F)(F)(F)F SFZCNBIFKDRMGX-UHFFFAOYSA-N 0.000 description 1
- 229960000909 sulfur hexafluoride Drugs 0.000 description 1
- 238000006557 surface reaction Methods 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
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- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
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Abstract
本发明公开了一种喷墨打印双面晶体硅太阳能电池,包括P型硅基体,P型硅基体的正面设有磷扩散层、绒面织构、减反钝化膜、正面银电极,背面设置有纳米氧化硅层、非晶或多晶P+层、透明导电薄膜层、背面银电极;其能够有效改进光线吸收和电流收集,减少光学和电学损失。本发明还公开了一种喷墨打印双面晶体硅太阳能电池的制备方法,其通过增加纳米氧化硅层、非晶或多晶P+层、透明导电薄膜层,采用喷墨打印技术形成全黑的太阳能电池,从而有效改进光线吸收和电流收集,减少光学和电学损失。
The invention discloses an ink-jet printing double-sided crystalline silicon solar cell, which comprises a P-type silicon substrate. The front of the P-type silicon substrate is provided with a phosphorus diffusion layer, a suede texture, an anti-reflection passivation film, a front silver electrode, and a back surface. It is provided with a nano-silicon oxide layer, an amorphous or polycrystalline P + layer, a transparent conductive film layer, and a silver electrode on the back; it can effectively improve light absorption and current collection, and reduce optical and electrical losses. The invention also discloses a preparation method of inkjet printing double-sided crystalline silicon solar cells, which uses inkjet printing technology to form all black by adding nano-silicon oxide layer, amorphous or polycrystalline P + layer, and transparent conductive film layer solar cells, thereby effectively improving light absorption and current collection, reducing optical and electrical losses.
Description
技术领域technical field
本发明涉及晶体硅太阳能电池制造技术领域,尤其涉及一种喷墨打印双面晶体硅太阳能电池及其制备方法。The invention relates to the technical field of manufacturing crystalline silicon solar cells, in particular to an inkjet printing double-sided crystalline silicon solar cell and a preparation method thereof.
背景技术Background technique
随着太阳能电池技术的提高,其工业化生产逐渐朝着高效、低成本方向发展。然而,制约太阳能电池效率的两个主要因素分别为光学损失和电学损失。With the improvement of solar cell technology, its industrial production is gradually developing towards high efficiency and low cost. However, the two main factors restricting the efficiency of solar cells are optical loss and electrical loss.
现有技术中,高效背钝化太阳能电池是背钝化与金属化区域局域重掺杂技术相结合的代表,其优势在于:In the prior art, high-efficiency back passivation solar cells are representative of the combination of back passivation and local heavy doping technology in the metallization region, and its advantages lie in:
1)具有优异的背反射器:由于电池背面介质膜的存在,使得内部背反射从常规的全铝背场65%增加到92-95%,其一方面增加长波光的吸收,另一方面对未来薄片电池的发展提供了技术上的保证;1) Excellent back reflector: Due to the existence of the dielectric film on the back of the battery, the internal back reflection is increased from 65% of the conventional all-aluminum back field to 92-95%, which increases the absorption of long-wave light on the one hand, and on the other hand The development of thin-film batteries in the future provides a technical guarantee;
2)介质薄膜优越的背面钝化技术:由于背面介质膜良好的钝化作用,介质薄膜区域的背面复合速率降低至10-50cm/s。2) Superior backside passivation technology of the dielectric film: due to the good passivation effect of the backside dielectric film, the backside recombination rate of the dielectric film area is reduced to 10-50cm/s.
上述高效背钝化太阳能电池结构,虽早在上世纪九十年代已由澳大利亚新南威尔士大学提出,并获得了世界纪录25%的晶硅太阳能电池。但由于其采用背面点接触的设计,使得电池串联电阻增加,电学损失加大,不利于光线吸收和电流收集。The above-mentioned high-efficiency back passivation solar cell structure was proposed by the University of New South Wales in Australia as early as the 1990s, and obtained a world record of 25% crystalline silicon solar cells. However, due to its point-contact design on the back, the series resistance of the battery increases and the electrical loss increases, which is not conducive to light absorption and current collection.
发明内容Contents of the invention
本发明的目的之一在于提出一种喷墨打印双面晶体硅太阳能电池,能够有效改进光线吸收和电流收集,减少光学和电学损失。One of the objectives of the present invention is to propose an inkjet printed double-sided crystalline silicon solar cell, which can effectively improve light absorption and current collection, and reduce optical and electrical losses.
本发明的目的之二在于提出一种喷墨打印双面晶体硅太阳能电池的制备方法,其采用喷墨打印技术形成全黑的太阳能电池,从而有效改进光线吸收和电流收集,减少光学和电学损失。The second object of the present invention is to propose a preparation method for inkjet printing double-sided crystalline silicon solar cells, which uses inkjet printing technology to form a completely black solar cell, thereby effectively improving light absorption and current collection, and reducing optical and electrical losses .
为达此目的,本发明采用以下技术方案:For reaching this purpose, the present invention adopts following technical scheme:
一方面,本发明提供一种喷墨打印双面晶体硅太阳能电池,包括P型硅基体,所述P型硅基体的正面设置有磷扩散层,所述磷扩散层的正面设置有绒面织构,所述绒面织构的正面设置有减反钝化膜,所述减反钝化膜的正面设置有正面银电极;所述P型硅基体的背面设置有纳米氧化硅层,所述纳米氧化硅层的背面设置有非晶或多晶P+层,所述非晶或多晶P+层的背面设置有透明导电薄膜层,所述透明导电薄膜层的背面设置有背面银电极。In one aspect, the present invention provides an inkjet printed double-sided crystalline silicon solar cell, comprising a P-type silicon substrate, a phosphorus diffusion layer is provided on the front of the P-type silicon substrate, and a suede fabric is provided on the front of the phosphorus diffusion layer. structure, the front of the suede texture is provided with an anti-reflection passivation film, and the front of the anti-reflection passivation film is provided with a front silver electrode; the back of the P-type silicon substrate is provided with a nano-silicon oxide layer, and the An amorphous or polycrystalline P + layer is provided on the back of the nano-silicon oxide layer, a transparent conductive film layer is provided on the back of the amorphous or polycrystalline P+ layer , and a back silver electrode is provided on the back of the transparent conductive film layer.
该喷墨打印双面晶体硅太阳能电池,通过在P型硅基体的背面设置纳米氧化硅层、非晶或多晶P+层以及透明导电薄膜层,其中,纳米氧化硅层可以提供电池背面的高质量钝化,而非晶或多晶P+层可以用于形成隧穿结构,再配合透明导电薄膜层,可以显著提高电池背钝化质量和电流导出性能,降低背面复合损失和电流导出损失;进一步地,配合以P型硅基体的正面的绒面织构,增加电池的光线吸收和电流收集,减少光学和电学损失,提高晶体硅太阳能电池的转换效率。In this inkjet printing double-sided crystalline silicon solar cell, a nano-silicon oxide layer, an amorphous or polycrystalline P + layer, and a transparent conductive film layer are arranged on the back of the P-type silicon substrate, wherein the nano-silicon oxide layer can provide the solar cell on the back of the cell. High-quality passivation, amorphous or polycrystalline P + layer can be used to form a tunnel structure, combined with a transparent conductive thin film layer, can significantly improve the quality of the battery back passivation and current conduction performance, reduce the rear recombination loss and current conduction loss ; Further, with the texture of the front surface of the P-type silicon substrate, the light absorption and current collection of the battery are increased, the optical and electrical losses are reduced, and the conversion efficiency of the crystalline silicon solar cell is improved.
优选地,所述P型硅基体为p型硅片,其电阻率为0.5-6Ω·cm;例如为0.5Ω·cm、0.8Ω·cm、1.0Ω·cm、1.3Ω·cm、1.5Ω·cm、1.9Ω·cm、2.0Ω·cm、2.2Ω·cm、2.6Ω·cm、2.8Ω·cm、3.0Ω·cm、3.5Ω·cm、3.7Ω·cm、4.0Ω·cm、4.1Ω·cm、4.4Ω·cm、4.9Ω·cm、5.0Ω·cm、5.6Ω·cm或6.0Ω·cm等。Preferably, the p-type silicon substrate is a p-type silicon wafer, and its resistivity is 0.5-6Ω·cm; for example, 0.5Ω·cm, 0.8Ω·cm, 1.0Ω·cm, 1.3Ω·cm, 1.5Ω·cm cm, 1.9Ω·cm, 2.0Ω·cm, 2.2Ω·cm, 2.6Ω·cm, 2.8Ω·cm, 3.0Ω·cm, 3.5Ω·cm, 3.7Ω·cm, 4.0Ω·cm, 4.1Ω·cm cm, 4.4Ω·cm, 4.9Ω·cm, 5.0Ω·cm, 5.6Ω·cm or 6.0Ω·cm, etc.
优选地,所述减反钝化膜为SiNx钝化膜或SiO2/SiNx叠层钝化膜。Preferably, the antireflection passivation film is a SiNx passivation film or a SiO 2 /SiNx stacked passivation film.
优选地,所述纳米氧化硅层的厚度为0.3-5nm;例如为0.3nm、0.35nm、0.5nm、0.8nm、1.0nm、1.1nm、1.3nm、1.6nm、1.9nm、2.0nm、2.2nm、2.4nm、2.7nm、3.0nm、3.3nm、3.5nm、3.9nm、4.0nm、4.6nm、4.7nm或5.0nm等。Preferably, the thickness of the nano-silicon oxide layer is 0.3-5nm; for example, 0.3nm, 0.35nm, 0.5nm, 0.8nm, 1.0nm, 1.1nm, 1.3nm, 1.6nm, 1.9nm, 2.0nm, 2.2nm , 2.4nm, 2.7nm, 3.0nm, 3.3nm, 3.5nm, 3.9nm, 4.0nm, 4.6nm, 4.7nm or 5.0nm, etc.
优选地,所述非晶或多晶p+层的厚度为10-1000nm,掺杂浓度为1017~1022cm-3;例如厚度为10nm、13nm、17nm、20nm、25nm、30nm、36nm、40nm、47nm、50nm、51nm、58nm、60nm、76nm、82nm、94nm、100nm、113nm、119nm、125nm、134nm、150nm、176nm、181nm、190nm、200nm、222nm、235nm、245nm、260nm、279nm、298nm、315nm、340nm、400nm、416nm、482nm、500nm、538nm、597nm、600nm、636nm、684nm、700nm、756nm、800nm、837nm、900nm、901nm、957nm、968nm、978nm或1000nm等,例如掺杂浓度为1017cm-3、1018cm-3、1019cm-3、1020cm-3、1021cm-3或1022cm-3等。Preferably, the thickness of the amorphous or polycrystalline p+ layer is 10-1000nm, and the doping concentration is 10 17 -10 22 cm -3 ; for example, the thickness is 10nm, 13nm, 17nm, 20nm, 25nm, 30nm, 36nm, 40nm . , 340nm, 400nm, 416nm, 482nm, 500nm, 538nm, 597nm, 600nm, 636nm, 684nm, 700nm, 756nm, 800nm, 837nm, 900nm, 901nm, 957nm, 968nm, 978nm or 1000nm, etc., for example, the doping concentration is 10 17 cm -3 , 10 18 cm -3 , 10 19 cm -3 , 10 20 cm -3 , 10 21 cm -3 or 10 22 cm -3 , etc.
优选地,所述透明导电薄膜层的厚度为10-500nm;例如为10nm、13nm、15nm、19nm、25nm、30nm、34nm、36nm、40nm、49nm、65nm、71nm、75nm、83nm、90nm、100nm、103nm、106nm、109nm、110nm、126nm、137nm、142nm、168nm、179nm、198nm、200nm、215nm、236nm、249nm、268nm、300nm、306nm、325nm、378nm、395nm、400nm、411nm、456nm、468nm、479nm、480nm、485nm、498nm或500nm等。Preferably, the thickness of the transparent conductive film layer is 10-500nm; for example, 10nm, 13nm, 15nm, 19nm, 25nm, 30nm, 34nm, 36nm, 40nm, 49nm, 65nm, 71nm, 75nm, 83nm, 90nm, 100nm, 103nm, 106nm, 109nm, 110nm, 126nm, 137nm, 142nm, 168nm, 179nm, 198nm, 200nm, 215nm, 236nm, 249nm, 268nm, 300nm, 306nm, 325nm, 378nm, 395nm, 400nm, 411nm, 456nm, 468nm, 479nm, 480nm, 485nm, 498nm or 500nm etc.
另一方面,本发明还提供一种喷墨打印双面晶体硅太阳能电池的制备方法,包括以下步骤:On the other hand, the present invention also provides a method for preparing an inkjet printed double-sided crystalline silicon solar cell, comprising the following steps:
1)去除P型硅基体表面的损伤层并制绒;1) removing the damaged layer on the surface of the P-type silicon substrate and making texture;
2)在步骤1)中得到的产品的表面进行刻蚀,形成全黑凹凸表面结构,并进行绒面修饰,形成绒面织构;2) The surface of the product obtained in step 1) is etched to form an all-black concave-convex surface structure, and a suede finish is carried out to form a suede texture;
3)在步骤2)中得到的产品的表面进行磷扩散制结,形成磷扩散层;3) performing phosphorus diffusion on the surface of the product obtained in step 2) to form a phosphorus diffusion layer;
4)在步骤3)中得到的产品的边缘进行刻蚀,背面进行去结和去PSG;4) The edge of the product obtained in step 3) is etched, and the back side is subjected to dejunction and PSG removal;
5)在步骤4)中得到的产品的正面进行减反钝化膜沉积,形成减反钝化膜;5) Depositing an anti-reflection passivation film on the front of the product obtained in step 4) to form an anti-reflection passivation film;
6)在步骤5)中得到的产品的背面进行纳米氧化硅生长,形成纳米氧化硅层;6) Carry out nano-silicon oxide growth on the back side of the product obtained in step 5), forming a nano-silicon oxide layer;
7)在步骤6)中得到的产品的背面进行掺杂硼非晶或多晶硅沉积,形成非晶或多晶P+层;7) Boron-doped amorphous or polysilicon deposition is carried out on the back side of the product obtained in step 6) to form an amorphous or polycrystalline P + layer;
8)在步骤7)中得到的产品的背面进行透明导电薄膜沉积,形成透明导电薄膜层;8) The back side of the product obtained in step 7) is deposited with a transparent conductive film to form a transparent conductive film layer;
9)在步骤8)中得到的产品的正面采用喷墨打印方式,形成正面银电极;9) The front of the product obtained in step 8) adopts an inkjet printing method to form a front silver electrode;
10)在步骤9)中得到的产品的背面采用喷墨打印方式,形成背面银电极。10) The back of the product obtained in step 9) is ink-jet printed to form a silver electrode on the back.
优选地,步骤1)中,所述制绒具体为:采用槽式热碱方式,也即为碱制绒。Preferably, in step 1), the texturing is specifically: adopting a tank type hot alkali method, that is, alkali texturing.
优选地,步骤2)中,所述刻蚀具体为:采用SF6气体反应离子刻蚀、激光刻蚀或金属离子催化反应方式。Preferably, in step 2), the etching specifically includes: adopting SF 6 gas reactive ion etching, laser etching or metal ion catalytic reaction.
其中,反应离子腐蚀(Reactive Ion Etching,简称RIE)中,反应气体(如CF4)在RF或直流电场中被激发分解,产生活性粒子(如游离的F原子),活性粒子与被腐蚀材料反应,生成挥发性物质,再用抽气泵将挥发性物质排除反应腔室。RIE常用的反应气体有SF6、CHF3、CCl4等。Among them, in Reactive Ion Etching (RIE for short), the reactive gas (such as CF 4 ) is excited and decomposed in RF or DC electric field to generate active particles (such as free F atoms), and the active particles react with the corroded material , to generate volatile substances, and then use the aspirator to remove the volatile substances from the reaction chamber. The commonly used reaction gases in RIE are SF 6 , CHF 3 , CCl 4 and so on.
SF6为六氟化硫,该气体已有百年历史,它是法国两位化学家Moissan和Lebeau于1900年合成的人造惰性气体。SF6对硅的腐蚀主要是由SF6分解产生的游离F基引起的。腐蚀硅产生的挥发性物质挥发将硅带走,其中其主要作用的是SiF4。氟的等离子体硅腐蚀反应自发进行,不需要离子轰击。因此自由氟基产生高的腐蚀速率,但由于是自发腐蚀,腐蚀外形近似各向同性。SF 6 is sulfur hexafluoride, which has a history of one hundred years. It is an artificial inert gas synthesized by two French chemists, Moissan and Lebeau in 1900. The corrosion of SF 6 to silicon is mainly caused by the free F radicals generated by the decomposition of SF 6 . The volatilization of volatile substances produced by etching silicon will take silicon away, and the main function is SiF 4 . The plasma silicon etch reaction of fluorine proceeds spontaneously and does not require ion bombardment. Therefore, the free fluorine radicals produce a high corrosion rate, but due to the spontaneous corrosion, the corrosion profile is approximately isotropic.
优选地,步骤2)中,所述绒面修饰具体为:采用碱溶液清洗方式。Preferably, in step 2), the suede modification specifically includes: cleaning with an alkaline solution.
优选地,步骤4)中,所述刻蚀、去结和去PSG(磷硅玻璃)具体为:采用在线式水上漂清洗方式。Preferably, in step 4), the etching, dejunction and PSG (phosphosilicate glass) removal specifically include: adopting an online water rinsing method.
其中,在线式水上漂清洗方式为:通过滚轮传动硅片使得硅片在腐蚀性溶液的表面漂浮,使硅片只有背面和边缘能够与溶液接触并反应以实现刻蚀。Among them, the online water rinsing method is: the silicon wafer is driven by rollers to make the silicon wafer float on the surface of the corrosive solution, so that only the back and edge of the silicon wafer can contact and react with the solution to achieve etching.
优选地,步骤6)中,所述纳米氧化硅生长具体为:采用湿法氧化、臭氧氧化、热氧化、原子层沉积生长或低压化学气相沉积方式。Preferably, in step 6), the growth of nano-silicon oxide specifically includes: wet oxidation, ozone oxidation, thermal oxidation, atomic layer deposition growth or low-pressure chemical vapor deposition.
其中,纳米氧化硅生长是指在硅片表面生长厚度为纳米级(0~100nm)的氧化硅膜层;Among them, nano-silicon oxide growth refers to the growth of a silicon oxide film layer with a thickness of nanometer (0-100 nm) on the surface of a silicon wafer;
优选地,步骤7)中,所述掺杂硼非晶或多晶硅沉积具体为:采用低压化学气相沉积方式。Preferably, in step 7), the boron-doped amorphous or polysilicon deposition specifically includes: adopting a low-pressure chemical vapor deposition method.
其中,非晶或多晶P+层的意思是,该层的晶体形式可以为非晶,也可以为多晶,掺杂非晶硅和多晶硅层都能与硅片基底形成优良PP+高低结背场,只是非晶硅层沉积后,后续步骤不能有高于300度的高温过程,而多晶硅层可以耐高温过程并不影响性能。Among them, the amorphous or polycrystalline P + layer means that the crystal form of the layer can be amorphous or polycrystalline, and both doped amorphous silicon and polycrystalline silicon layers can form excellent PP + high-low junctions with the silicon substrate. The back field is just that after the deposition of the amorphous silicon layer, the subsequent steps cannot have a high-temperature process higher than 300 degrees, while the polysilicon layer can withstand high-temperature processes without affecting performance.
优选地,步骤8)中,所述透明导电薄膜沉积具体为:采用磁控溅射方式。Preferably, in step 8), the deposition of the transparent conductive film is specifically: using magnetron sputtering.
其中,透明导电薄膜为ITO(锡掺杂三氧化铟)或AZO(铝掺杂氧化锌)。Wherein, the transparent conductive film is ITO (tin-doped indium trioxide) or AZO (aluminum-doped zinc oxide).
该制备方法,通过在P型硅基体的背面进行纳米氧化硅生长形成纳米氧化硅层,在纳米氧化硅层的背面掺杂硼非晶或多晶硅沉积,形成非晶或多晶P+层,在非晶或多晶P+层的背面进行透明导电薄膜沉积,形成透明导电薄膜层,利用纳米氧化硅层可以提供电池背面的高质量钝化,而非晶或多晶P+层可以用于形成隧穿结构,再配合透明导电薄膜层,可以显著提高电池背钝化质量和电流导出性能,降低背面复合损失和电流导出损失;进一步地,在P型硅基体的表面通过刻蚀,形成全黑凹凸表面结构,再利用喷墨打印技术制备正面银电极和背面银电极,从而可以增加电池的光线吸收和电流收集,减少光学和电学损失,提高晶体硅太阳能电池的转换效率。In this preparation method, a nano-silicon oxide layer is formed by growing nano-silicon oxide on the back of the P-type silicon substrate, and boron is doped on the back of the nano-silicon oxide layer to deposit amorphous or polycrystalline silicon to form an amorphous or polycrystalline P + layer. The back of the amorphous or polycrystalline P + layer is deposited with a transparent conductive film to form a transparent conductive film layer, and the use of a nano-silicon oxide layer can provide high-quality passivation on the back of the battery, and the amorphous or polycrystalline P + layer can be used to form The tunneling structure, combined with the transparent conductive film layer, can significantly improve the quality of the battery’s back passivation and current derivation performance, and reduce the backside recombination loss and current derivation loss; further, the surface of the P-type silicon substrate is etched to form a completely black Concave-convex surface structure, and then use inkjet printing technology to prepare front silver electrodes and back silver electrodes, which can increase the light absorption and current collection of the battery, reduce optical and electrical losses, and improve the conversion efficiency of crystalline silicon solar cells.
附图说明Description of drawings
图1是本发明的喷墨打印双面晶体硅太阳能电池的结构示意图。Fig. 1 is a schematic structural view of an inkjet printed double-sided crystalline silicon solar cell of the present invention.
图中:1-正面银电极;2-减反钝化膜;3-绒面织构;4-磷扩散层;5-P型硅基体;6-纳米氧化硅层;7-非晶或多晶p+层;8-透明导电薄膜层;9-背面银电极。In the figure: 1-front silver electrode; 2-anti-reflection passivation film; 3-texture texture; 4-phosphorus diffusion layer; 5-P-type silicon substrate; 6-nanometer silicon oxide layer; 7-amorphous or poly crystal p+ layer; 8-transparent conductive film layer; 9-back silver electrode.
具体实施方式Detailed ways
下面结合附图并通过具体实施方式来进一步说明本发明的技术方案。The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and through specific implementation methods.
实施例1Example 1
如图1所示,一种喷墨打印双面晶体硅太阳能电池,包括P型硅基体5,所述P型硅基体5的正面设置有磷扩散层4,所述磷扩散层4的正面设置有绒面织构3,所述绒面织构3的正面设置有减反钝化膜2,所述减反钝化膜2的正面设置有正面银电极1;所述P型硅基体5的背面设置有纳米氧化硅层6,所述纳米氧化硅层6的背面设置有非晶或多晶P+层7,所述非晶或多晶P+层7的背面设置有透明导电薄膜层8,所述透明导电薄膜层8的背面设置有背面银电极9。As shown in Figure 1, an inkjet printing double-sided crystalline silicon solar cell includes a P-type silicon substrate 5, a phosphorus diffusion layer 4 is arranged on the front side of the P-type silicon substrate 5, and a phosphorus diffusion layer 4 is arranged on the front side of the phosphorus diffusion layer 4. There is a suede texture 3, the front of the suede texture 3 is provided with an anti-reflection passivation film 2, and the front of the anti-reflection passivation film 2 is provided with a front silver electrode 1; the P-type silicon substrate 5 A nano-silicon oxide layer 6 is arranged on the back, an amorphous or polycrystalline P + layer 7 is arranged on the back of the nano-silicon oxide layer 6, and a transparent conductive film layer 8 is arranged on the back of the amorphous or polycrystalline P+ layer 7 , the back side of the transparent conductive film layer 8 is provided with a back side silver electrode 9 .
一种喷墨打印双面晶体硅太阳能电池的制备方法,包括以下步骤:A preparation method for inkjet printing double-sided crystalline silicon solar cells, comprising the following steps:
1)去除P型硅基体5表面的损伤层并制绒;其中,步骤1)中,所述制绒具体为:采用槽式热碱方式。1) Removing the damaged layer on the surface of the P-type silicon substrate 5 and making texturing; wherein, in step 1), the texturing specifically includes: adopting a tank-type hot alkali method.
具体地,选择156mm的P型单晶硅片作为P型硅基体5,其电阻率为1Ω·cm。Specifically, a 156 mm P-type single crystal silicon wafer is selected as the P-type silicon substrate 5, and its resistivity is 1Ω·cm.
对P型硅基体5去损伤后,用质量浓度分数为0.5%的氢氧化钠或氢氧化钾溶液,在75℃下,对P型硅基体5的表面进行化学腐蚀,制备出金字塔形状的绒面,随后用质量浓度分数为1%的氢氟酸进行清洗去除杂质。After removing damage to the P-type silicon substrate 5, chemically etch the surface of the P-type silicon substrate 5 with a sodium hydroxide or potassium hydroxide solution with a mass concentration fraction of 0.5% at 75° C. to prepare a pyramid-shaped velvet. surface, followed by cleaning with 1% hydrofluoric acid to remove impurities.
2)在步骤1)中得到的产品的表面进行刻蚀,形成全黑凹凸表面结构,并进行绒面修饰,形成绒面织构3;2) Etching the surface of the product obtained in step 1) to form an all-black concave-convex surface structure, and performing suede modification to form a suede texture 3;
其中,步骤2)中,所述刻蚀具体为:采用SF6气体,利用反应离子刻蚀方式;具体地,采用反应离子刻蚀的方法,使用SF6气体形成等离子体与硅片表面反应,在已有绒面形成纳米级的绒面织构3,该绒面织构3的表面为凹凸不平的结构,从而光反射时表面会显示全黑。Wherein, in step 2), the etching is specifically: adopting SF 6 gas, utilizing reactive ion etching; specifically, adopting the method of reactive ion etching, using SF 6 gas to form plasma and react with the surface of the silicon wafer, A nano-scale suede texture 3 is formed on the existing suede surface, and the surface of the suede texture 3 has an uneven structure, so that the surface will appear completely black when light is reflected.
其中,所述绒面修饰具体为:采用碱溶液清洗方式;具体地,使用质量浓度分数为0.5%的氢氧化钠或氢氧化钾溶液,在25℃下,对P型硅基体5的表面进行化学腐蚀,修饰表面多孔硅结构,降低表面缺陷。Wherein, the suede modification specifically includes: cleaning with an alkaline solution; specifically, using a sodium hydroxide or potassium hydroxide solution with a mass concentration fraction of 0.5% at 25°C to clean the surface of the P-type silicon substrate 5 Chemical etching, modifying the surface porous silicon structure, reducing surface defects.
3)在步骤2)中得到的产品的表面进行磷扩散制结,形成磷扩散层4;3) performing phosphorus diffusion on the surface of the product obtained in step 2) to form a phosphorus diffusion layer 4;
具体地,通过管式高温热扩散方式,采用POCl3对硅片的正面进行磷扩散,形成方阻为95Ω/sq的N型层;Specifically, through the tube-type high-temperature thermal diffusion method, POCl3 is used to diffuse phosphorus on the front side of the silicon wafer to form an N-type layer with a square resistance of 95Ω/sq;
其中,POCl3为三氯氧磷,是一种工业化工原料,为无色透明、具有刺激性臭味的液体,在潮湿空气中剧烈发烟,水解成磷酸和氯化氢,进一步生成HP2O4Cl3。Among them, POCl 3 is phosphorus oxychloride, which is an industrial chemical raw material. It is a colorless, transparent liquid with a pungent odor. It fumes violently in humid air and is hydrolyzed into phosphoric acid and hydrogen chloride, which further produces HP 2 O 4 Cl 3 .
4)在步骤3)中得到的产品的边缘进行刻蚀,背面进行去结和去PSG;4) The edge of the product obtained in step 3) is etched, and the back side is subjected to dejunction and PSG removal;
其中,步骤4)中,所述刻蚀、去结和去PSG具体为:采用在线式水上漂清洗方式。具体地,采用湿法in line设备(也即,在线滚轮式设备)去除背面磷硅玻璃(PSG)(虽然仅仅在硅片的正面进行磷扩散形成磷硅玻璃,但是磷硅玻璃会渗透进入硅片的背面),实现背面抛光,然后去除正面磷硅玻璃,然后采用质量浓度分数为5%的氢氟酸溶液清洗。Wherein, in step 4), the etching, knot removal and PSG removal are specifically: adopting an online water rinsing method. Specifically, the backside phosphosilicate glass (PSG) is removed by wet in-line equipment (that is, on-line roller equipment) (although phosphorus is diffused only on the front side of the silicon wafer to form phosphosilicate glass, but the phosphosilicate glass will penetrate into the silicon The back of the sheet) to achieve back polishing, and then remove the front phosphosilicate glass, and then use a hydrofluoric acid solution with a mass concentration of 5% to clean it.
5)在步骤4)中得到的产品的正面进行减反钝化膜2沉积,形成减反钝化膜2;其中,所述减反钝化膜2为SiNx钝化膜;5) Depositing an anti-reflection passivation film 2 on the front of the product obtained in step 4), forming an anti-reflection passivation film 2; wherein, the anti-reflection passivation film 2 is a SiNx passivation film;
具体地,在P型硅基体5的正面用PECVD(等离子化学气相沉积)的方法生长氮化硅减反膜,钝化减反膜的厚度为80nm。Specifically, a silicon nitride anti-reflection film is grown on the front surface of the P-type silicon substrate 5 by PECVD (Plasma Chemical Vapor Deposition), and the thickness of the passivation anti-reflection film is 80 nm.
6)在步骤5)中得到的产品的背面进行纳米氧化硅生长,形成纳米氧化硅层6;其中,步骤6)中,所述纳米氧化硅生长具体为:采用湿法氧化方式。具体地,所述纳米氧化硅层6的厚度为1.2nm。6) Nano-silicon oxide growth is performed on the back of the product obtained in step 5) to form a nano-silicon oxide layer 6; wherein, in step 6), the growth of nano-silicon oxide is specifically: adopting a wet oxidation method. Specifically, the thickness of the nano-silicon oxide layer 6 is 1.2 nm.
7)在步骤6)中得到的产品的背面进行掺杂硼非晶或多晶硅沉积,形成非晶或多晶P+层7;其中,步骤6)中,所述掺杂硼非晶或多晶硅沉积具体为:采用低压化学气相沉积(LPCVD)方式;优选的,非晶或多晶p+层7的晶体形式为多晶形式,所述非晶或多晶P+层7的厚度为40nm,掺杂浓度为3×1020cm-3。7) Boron-doped amorphous or polycrystalline silicon is deposited on the back of the product obtained in step 6) to form an amorphous or polycrystalline P + layer 7; wherein, in step 6), the boron-doped amorphous or polycrystalline silicon is deposited Specifically: low-pressure chemical vapor deposition (LPCVD) is adopted; preferably, the crystal form of the amorphous or polycrystalline p + layer 7 is polycrystalline, and the thickness of the amorphous or polycrystalline p+ layer 7 is 40nm, doped The concentration is 3×10 20 cm -3 .
8)在步骤7)中得到的产品的背面进行透明导电薄膜沉积,形成透明导电薄膜层8;8) The back side of the product obtained in step 7) is deposited with a transparent conductive film to form a transparent conductive film layer 8;
其中,步骤8)中,所述透明导电薄膜沉积具体为:采用磁控溅射方式。Wherein, in step 8), the deposition of the transparent conductive film is specifically: using magnetron sputtering.
优选的,所述透明导电薄膜层8的厚度为100nm。Preferably, the thickness of the transparent conductive film layer 8 is 100 nm.
9)在步骤8)中得到的产品的正面采用喷墨打印方式,形成正面银电极1;9) The front of the product obtained in step 8) adopts an inkjet printing method to form a front silver electrode 1;
10)在步骤9)中得到的产品的背面采用喷墨打印方式,形成背面银电极9。10) The back side of the product obtained in step 9) is ink-jet printed to form the back silver electrode 9 .
具体地,通过喷墨打印背面电极及细栅线后烘干,然后喷墨打印正面电极及细栅线。Specifically, the back electrodes and fine grid lines are printed by inkjet and then dried, and then the front electrodes and fine grid lines are inkjet printed.
最后烧结,测试,最终可以形成喷墨打印双面晶体硅太阳能电池。Finally, sintering, testing, and finally inkjet printing double-sided crystalline silicon solar cells can be formed.
该实施例中,电池转换效率批次平均效率达到22.3%,且光衰减,正面主栅,背面电极和铝背场拉力,以及组件端可靠性测试均符合TUV标准。In this embodiment, the battery conversion efficiency batch average efficiency reaches 22.3%, and the light attenuation, front busbar, back electrode and aluminum back field tension, and component side reliability test all meet TUV standards.
实施例2Example 2
如图1所示,一种喷墨打印双面晶体硅太阳能电池,包括P型硅基体5,所述P型硅基体5的正面设置有磷扩散层4,所述磷扩散层4的正面设置有绒面织构3,所述绒面织构3的正面设置有减反钝化膜2,所述减反钝化膜2的正面设置有正面银电极1;所述P型硅基体5的背面设置有纳米氧化硅层6,所述纳米氧化硅层6的背面设置有非晶或多晶P+层7,所述非晶或多晶P+层7的背面设置有透明导电薄膜层8,所述透明导电薄膜层8的背面设置有背面银电极9。As shown in Figure 1, an inkjet printing double-sided crystalline silicon solar cell includes a P-type silicon substrate 5, a phosphorus diffusion layer 4 is arranged on the front side of the P-type silicon substrate 5, and a phosphorus diffusion layer 4 is arranged on the front side of the phosphorus diffusion layer 4. There is a suede texture 3, the front of the suede texture 3 is provided with an anti-reflection passivation film 2, and the front of the anti-reflection passivation film 2 is provided with a front silver electrode 1; the P-type silicon substrate 5 A nano-silicon oxide layer 6 is arranged on the back, an amorphous or polycrystalline P + layer 7 is arranged on the back of the nano-silicon oxide layer 6, and a transparent conductive film layer 8 is arranged on the back of the amorphous or polycrystalline P+ layer 7 , the back side of the transparent conductive film layer 8 is provided with a back side silver electrode 9 .
一种喷墨打印双面晶体硅太阳能电池的制备方法,包括以下步骤:A preparation method for inkjet printing double-sided crystalline silicon solar cells, comprising the following steps:
1)去除P型硅基体5表面的损伤层并制绒;其中,步骤1)中,所述制绒具体为:采用槽式热碱方式。1) Removing the damaged layer on the surface of the P-type silicon substrate 5 and making texturing; wherein, in step 1), the texturing specifically includes: adopting a tank-type hot alkali method.
具体地,选择156mm的P型单晶硅片作为P型硅基体5,其电阻率为1Ω·cm。Specifically, a 156 mm P-type single crystal silicon wafer is selected as the P-type silicon substrate 5, and its resistivity is 1Ω·cm.
对P型硅基体5去损伤后,用质量浓度分数为0.5%的氢氧化钠或氢氧化钾溶液,在75℃下,对P型硅基体5的表面进行化学腐蚀,制备出金字塔形状的绒面,随后用质量浓度分数为1%的氢氟酸进行清洗去除杂质。After removing damage to the P-type silicon substrate 5, chemically etch the surface of the P-type silicon substrate 5 with a sodium hydroxide or potassium hydroxide solution with a mass concentration fraction of 0.5% at 75° C. to prepare a pyramid-shaped velvet. surface, followed by cleaning with 1% hydrofluoric acid to remove impurities.
2)在步骤1)中得到的产品的表面进行刻蚀,形成全黑凹凸表面结构,并进行绒面修饰,形成绒面织构3;2) Etching the surface of the product obtained in step 1) to form an all-black concave-convex surface structure, and performing suede modification to form a suede texture 3;
其中,步骤2)中,所述刻蚀具体为:利用金属离子催化反应方式;具体地,采用金属离子催化反应的方法,使用硝酸银溶液与硅片表面反应生产纳米银颗粒,在通过HF/HNO3混合溶液在表面纳米银颗粒催化下在有绒面形成纳米级的绒面织构3,该绒面织构3的表面为凹凸不平的结构,从而光反射时表面会显示全黑。Wherein, step 2) in, described etching is specifically: utilize metal ion catalytic reaction mode; Specifically, adopt the method for metal ion catalytic reaction, use silver nitrate solution to react with silicon chip surface to produce nano-silver particle, pass HF/ The HNO 3 mixed solution is catalyzed by the nano-silver particles on the surface to form a nano-scale suede texture 3 on the suede surface. The surface of the suede texture 3 is an uneven structure, so that the surface will appear completely black when light is reflected.
其中,所述绒面修饰具体为:采用碱溶液清洗方式;具体地,使用质量浓度分数为0.5%的氢氧化钠或氢氧化钾溶液,在25℃下,对P型硅基体5的表面进行化学腐蚀,修饰表面多孔硅结构,降低表面缺陷。Wherein, the suede modification specifically includes: cleaning with an alkaline solution; specifically, using a sodium hydroxide or potassium hydroxide solution with a mass concentration fraction of 0.5% at 25°C to clean the surface of the P-type silicon substrate 5 Chemical etching, modifying the surface porous silicon structure, reducing surface defects.
3)在步骤2)中得到的产品的表面进行磷扩散制结,形成磷扩散层4;3) performing phosphorus diffusion on the surface of the product obtained in step 2) to form a phosphorus diffusion layer 4;
具体地,通过管式高温热扩散方式,采用POCl3对硅片的正面进行磷扩散,形成方阻为100Ω/sq的N型层;Specifically, by means of tubular high-temperature thermal diffusion, POCl3 is used to diffuse phosphorus on the front side of the silicon wafer to form an N-type layer with a square resistance of 100Ω/sq;
其中,POCl3为三氯氧磷,是一种工业化工原料,为无色透明、具有刺激性臭味的液体,在潮湿空气中剧烈发烟,水解成磷酸和氯化氢,进一步生成HP2O4Cl3。Among them, POCl 3 is phosphorus oxychloride, which is an industrial chemical raw material. It is a colorless, transparent liquid with a pungent odor. It fumes violently in humid air and is hydrolyzed into phosphoric acid and hydrogen chloride, which further produces HP 2 O 4 Cl 3 .
4)在步骤3)中得到的产品的边缘进行刻蚀,背面进行去结和去PSG;4) The edge of the product obtained in step 3) is etched, and the back side is subjected to dejunction and PSG removal;
其中,步骤4)中,所述刻蚀、去结和去PSG具体为:采用在线式水上漂清洗方式。具体地,采用湿法in line设备(也即,在线滚轮式设备)去除背面磷硅玻璃(PSG)(虽然仅仅在硅片的正面进行磷扩散形成磷硅玻璃,但是磷硅玻璃会渗透进入硅片的背面),实现背面抛光,然后去除正面磷硅玻璃,然后采用质量浓度分数为5%的氢氟酸溶液清洗。Wherein, in step 4), the etching, knot removal and PSG removal are specifically: adopting an online water rinsing method. Specifically, the backside phosphosilicate glass (PSG) is removed by wet in-line equipment (that is, on-line roller equipment) (although phosphorus is diffused only on the front side of the silicon wafer to form phosphosilicate glass, but the phosphosilicate glass will penetrate into the silicon The back of the sheet) to achieve back polishing, and then remove the front phosphosilicate glass, and then use a hydrofluoric acid solution with a mass concentration of 5% to clean it.
5)在步骤4)中得到的产品的正面进行减反钝化膜2沉积,形成减反钝化膜2;其中,所述减反钝化膜2为SiO2/SiNx叠层钝化膜;5) Depositing an anti-reflection passivation film 2 on the front of the product obtained in step 4) to form an anti-reflection passivation film 2; wherein, the anti-reflection passivation film 2 is a SiO 2 /SiNx laminated passivation film;
具体地,在P型硅基体5的正面用PECVD(等离子化学气相沉积)的方法生长氮化硅减反膜,钝化减反膜的厚度为80nm。Specifically, a silicon nitride anti-reflection film is grown on the front surface of the P-type silicon substrate 5 by PECVD (Plasma Chemical Vapor Deposition), and the thickness of the passivation anti-reflection film is 80 nm.
6)在步骤5)中得到的产品的背面进行纳米氧化硅生长,形成纳米氧化硅层6;其中,步骤6)中,所述纳米氧化硅生长具体为:采用ALD(原子层沉积生长)方式。具体地,所述纳米氧化硅层6的厚度为1.3nm。6) The back side of the product obtained in step 5) is grown with nano-silicon oxide to form a nano-silicon oxide layer 6; wherein, in step 6), the growth of nano-silicon oxide is specifically: using ALD (atomic layer deposition growth) method . Specifically, the thickness of the nano-silicon oxide layer 6 is 1.3 nm.
7)在步骤6)中得到的产品的背面进行掺杂硼非晶或多晶硅沉积,形成非晶或多晶P+层7;其中,步骤7)中,所述掺杂硼非晶或多晶硅沉积具体为:采用低压化学气相沉积(LPCVD)方式;优选的,非晶或多晶P+层7的晶体形式为非晶形式,所述非晶或多晶P+层7的厚度为40nm,掺杂浓度为1020cm-3。7) Boron-doped amorphous or polycrystalline silicon is deposited on the back of the product obtained in step 6) to form an amorphous or polycrystalline P + layer 7; wherein, in step 7), the boron-doped amorphous or polycrystalline silicon is deposited Specifically, low-pressure chemical vapor deposition (LPCVD) is adopted; preferably, the crystal form of the amorphous or polycrystalline P + layer 7 is amorphous, and the thickness of the amorphous or polycrystalline P + layer 7 is 40nm, doped The impurity concentration is 10 20 cm -3 .
8)在步骤7)中得到的产品的背面进行透明导电薄膜沉积,形成透明导电薄膜层8;8) The back side of the product obtained in step 7) is deposited with a transparent conductive film to form a transparent conductive film layer 8;
其中,步骤8)中,所述透明导电薄膜沉积具体为:采用磁控溅射方式。Wherein, in step 8), the deposition of the transparent conductive film is specifically: using magnetron sputtering.
优选的,所述透明导电薄膜层8的厚度为100nm。Preferably, the thickness of the transparent conductive film layer 8 is 100 nm.
9)在步骤8)中得到的产品的正面采用喷墨打印方式,形成正面银电极1;9) The front of the product obtained in step 8) adopts an inkjet printing method to form a front silver electrode 1;
10)在步骤9)中得到的产品的背面采用喷墨打印方式,形成背面银电极9。10) The back side of the product obtained in step 9) is ink-jet printed to form the back silver electrode 9 .
具体地,通过喷墨打印背面电极及细栅线后烘干,然后喷墨打印正面电极及细栅线。Specifically, the back electrodes and fine grid lines are printed by inkjet and then dried, and then the front electrodes and fine grid lines are inkjet printed.
最后烧结,测试,最终可以形成喷墨打印双面晶体硅太阳能电池。Finally, sintering, testing, and finally inkjet printing double-sided crystalline silicon solar cells can be formed.
该实施例中,电池转换效率批次平均效率达到21.1%,且光衰减,正面主栅,背面电极和铝背场拉力,以及组件端可靠性测试均符合TUV标准。In this embodiment, the battery conversion efficiency batch average efficiency reaches 21.1%, and the light attenuation, front busbar, back electrode and aluminum back field tension, and component side reliability test all meet TUV standards.
实施例3Example 3
如图1所示,一种喷墨打印双面晶体硅太阳能电池,包括P型硅基体5,所述P型硅基体5的正面设置有磷扩散层4,所述磷扩散层4的正面设置有绒面织构3,所述绒面织构3的正面设置有减反钝化膜2,所述减反钝化膜2的正面设置有正面银电极1;所述P型硅基体5的背面设置有纳米氧化硅层6,所述纳米氧化硅层6的背面设置有非晶或多晶P+层7,所述非晶或多晶P+层7的背面设置有透明导电薄膜层8,所述透明导电薄膜层8的背面设置有背面银电极9。As shown in Figure 1, an inkjet printing double-sided crystalline silicon solar cell includes a P-type silicon substrate 5, a phosphorus diffusion layer 4 is arranged on the front side of the P-type silicon substrate 5, and a phosphorus diffusion layer 4 is arranged on the front side of the phosphorus diffusion layer 4. There is a suede texture 3, the front of the suede texture 3 is provided with an anti-reflection passivation film 2, and the front of the anti-reflection passivation film 2 is provided with a front silver electrode 1; the P-type silicon substrate 5 A nano-silicon oxide layer 6 is arranged on the back, an amorphous or polycrystalline P + layer 7 is arranged on the back of the nano-silicon oxide layer 6, and a transparent conductive film layer 8 is arranged on the back of the amorphous or polycrystalline P+ layer 7 , the back side of the transparent conductive film layer 8 is provided with a back side silver electrode 9 .
一种喷墨打印双面晶体硅太阳能电池的制备方法,包括以下步骤:A preparation method for inkjet printing double-sided crystalline silicon solar cells, comprising the following steps:
1)去除P型硅基体5表面的损伤层并制绒;其中,步骤1)中,所述制绒具体为:采用槽式热碱方式。1) Removing the damaged layer on the surface of the P-type silicon substrate 5 and making texturing; wherein, in step 1), the texturing specifically includes: adopting a tank-type hot alkali method.
具体地,选择156mm的P型单晶硅片作为P型硅基体5,其电阻率为1Ω·cm。Specifically, a 156 mm P-type single crystal silicon wafer is selected as the P-type silicon substrate 5, and its resistivity is 1Ω·cm.
对P型硅基体5去损伤后,用质量浓度分数为0.5%的氢氧化钠或氢氧化钾溶液,在75℃下,对P型硅基体5的表面进行化学腐蚀,制备出金字塔形状的绒面,随后用质量浓度分数为1%的氢氟酸进行清洗去除杂质。After removing damage to the P-type silicon substrate 5, chemically etch the surface of the P-type silicon substrate 5 with a sodium hydroxide or potassium hydroxide solution with a mass concentration fraction of 0.5% at 75° C. to prepare a pyramid-shaped velvet. surface, followed by cleaning with 1% hydrofluoric acid to remove impurities.
2)在步骤1)中得到的产品的表面进行刻蚀,形成全黑凹凸表面结构,并进行绒面修饰,形成绒面织构3;2) Etching the surface of the product obtained in step 1) to form an all-black concave-convex surface structure, and performing suede modification to form a suede texture 3;
其中,步骤2)中,所述刻蚀具体为:采用SF6气体,利用RIE(反应离子刻蚀)反应方式;具体地,采用RIE反应的方法,使用SF6气体形成等离子体与硅片表面反应,在已有绒面形成纳米级的绒面织构3,该绒面织构3的表面为凹凸不平的结构,从而光反射时表面会显示全黑。Wherein, in step 2), the etching is specifically: adopting SF 6 gas, utilizing RIE (Reactive Ion Etching) reaction mode; specifically, adopting the method of RIE reaction, using SF 6 gas to form plasma and silicon chip surface reaction, a nano-scale suede texture 3 is formed on the existing suede surface, and the surface of the suede texture 3 is an uneven structure, so that the surface will appear completely black when light is reflected.
其中,所述绒面修饰具体为:采用碱溶液清洗方式;具体地,使用质量浓度分数为0.5%的氢氧化钠或氢氧化钾溶液,在25℃下,对P型硅基体5的表面进行化学腐蚀,修饰表面多孔硅结构,降低表面缺陷。Wherein, the suede modification specifically includes: cleaning with an alkaline solution; specifically, using a sodium hydroxide or potassium hydroxide solution with a mass concentration fraction of 0.5% at 25°C to clean the surface of the P-type silicon substrate 5 Chemical etching, modifying the surface porous silicon structure, reducing surface defects.
3)在步骤2)中得到的产品的表面进行磷扩散制结,形成磷扩散层4;3) performing phosphorus diffusion on the surface of the product obtained in step 2) to form a phosphorus diffusion layer 4;
具体地,通过管式高温热扩散方式,采用POCl3对硅片的正面进行磷扩散,形成方阻为110Ω/sq的N型层;Specifically, through the tubular high-temperature thermal diffusion method, POCl3 is used to diffuse phosphorus on the front side of the silicon wafer to form an N-type layer with a square resistance of 110Ω/sq;
其中,POCl3为三氯氧磷,是一种工业化工原料,为无色透明、具有刺激性臭味的液体,在潮湿空气中剧烈发烟,水解成磷酸和氯化氢,进一步生成HP2O4Cl3。Among them, POCl 3 is phosphorus oxychloride, which is an industrial chemical raw material. It is a colorless, transparent liquid with a pungent odor. It fumes violently in humid air and is hydrolyzed into phosphoric acid and hydrogen chloride, which further produces HP 2 O 4 Cl 3 .
4)在步骤3)中得到的产品的边缘进行刻蚀,背面进行去结和去PSG;4) The edge of the product obtained in step 3) is etched, and the back side is subjected to dejunction and PSG removal;
其中,步骤4)中,所述刻蚀、去结和去PSG具体为:采用在线式水上漂清洗方式。具体地,采用湿法in line设备(也即,在线滚轮式设备)去除背面磷硅玻璃(PSG)(虽然仅仅在硅片的正面进行磷扩散形成磷硅玻璃,但是磷硅玻璃会渗透进入硅片的背面),实现背面抛光,然后去除正面磷硅玻璃,然后采用质量浓度分数为5%的氢氟酸溶液清洗。Wherein, in step 4), the etching, knot removal and PSG removal are specifically: adopting an online water rinsing method. Specifically, the backside phosphosilicate glass (PSG) is removed by wet in-line equipment (that is, on-line roller equipment) (although phosphorus is diffused only on the front side of the silicon wafer to form phosphosilicate glass, but the phosphosilicate glass will penetrate into the silicon The back of the sheet) to achieve back polishing, and then remove the front phosphosilicate glass, and then use a hydrofluoric acid solution with a mass concentration of 5% to clean it.
5)在步骤4)中得到的产品的正面进行减反钝化膜2沉积,形成减反钝化膜2;其中,所述减反钝化膜2为SiO2/SiNx叠层钝化膜;5) Depositing an anti-reflection passivation film 2 on the front of the product obtained in step 4) to form an anti-reflection passivation film 2; wherein, the anti-reflection passivation film 2 is a SiO 2 /SiNx laminated passivation film;
具体地,在P型硅基体5的正面用PECVD(等离子化学气相沉积)的方法生长氮化硅减反膜,钝化减反膜的厚度为80nm。Specifically, a silicon nitride anti-reflection film is grown on the front surface of the P-type silicon substrate 5 by PECVD (Plasma Chemical Vapor Deposition), and the thickness of the passivation anti-reflection film is 80 nm.
6)在步骤5)中得到的产品的背面进行纳米氧化硅生长,形成纳米氧化硅层6;其中,步骤6)中,所述纳米氧化硅生长具体为:采用湿法氧化方式。具体地,所述纳米氧化硅层6的厚度为1.2nm。6) Nano-silicon oxide growth is performed on the back of the product obtained in step 5) to form a nano-silicon oxide layer 6; wherein, in step 6), the growth of nano-silicon oxide is specifically: adopting a wet oxidation method. Specifically, the thickness of the nano-silicon oxide layer 6 is 1.2 nm.
7)在步骤6)中得到的产品的背面进行掺杂硼非晶或多晶硅沉积,形成非晶或多晶P+层7;其中,步骤7)中,所述掺杂硼非晶或多晶硅沉积具体为:采用低压化学气相沉积(LPCVD)方式;优选的,非晶或多晶P+层7的晶体形式为多晶形式,所述非晶或多晶p+层7的厚度为50nm,掺杂浓度为5×1020cm-3。7) Boron-doped amorphous or polycrystalline silicon is deposited on the back of the product obtained in step 6) to form an amorphous or polycrystalline P + layer 7; wherein, in step 7), the boron-doped amorphous or polycrystalline silicon is deposited Specifically, low-pressure chemical vapor deposition (LPCVD) is adopted; preferably, the crystal form of the amorphous or polycrystalline p + layer 7 is polycrystalline, and the thickness of the amorphous or polycrystalline p+ layer 7 is 50 nm, doped The concentration is 5×10 20 cm -3 .
8)在步骤7)中得到的产品的背面进行透明导电薄膜沉积,形成透明导电薄膜层8;8) The back side of the product obtained in step 7) is deposited with a transparent conductive film to form a transparent conductive film layer 8;
其中,步骤8)中,所述透明导电薄膜沉积具体为:采用磁控溅射方式。Wherein, in step 8), the deposition of the transparent conductive film is specifically: using magnetron sputtering.
优选的,所述透明导电薄膜层8的厚度为100nm。Preferably, the thickness of the transparent conductive film layer 8 is 100 nm.
9)在步骤8)中得到的产品的正面采用喷墨打印方式,形成正面银电极1;9) The front of the product obtained in step 8) adopts an inkjet printing method to form a front silver electrode 1;
10)在步骤9)中得到的产品的背面采用喷墨打印方式,形成背面银电极9。10) The back side of the product obtained in step 9) is ink-jet printed to form the back silver electrode 9 .
具体地,通过喷墨打印背面电极及细栅线后烘干,然后喷墨打印正面电极及细栅线。Specifically, the back electrodes and fine grid lines are printed by inkjet and then dried, and then the front electrodes and fine grid lines are inkjet printed.
最后烧结,测试,最终可以形成喷墨打印双面晶体硅太阳能电池。Finally, sintering, testing, and finally inkjet printing double-sided crystalline silicon solar cells can be formed.
该实施例中,电池转换效率批次平均效率达到21.2%,且光衰减,正面主栅,背面电极和铝背场拉力,以及组件端可靠性测试均符合TUV标准。In this embodiment, the battery conversion efficiency batch average efficiency reaches 21.2%, and the light attenuation, front busbar, back electrode and aluminum back field tension, and component side reliability test all meet TUV standards.
实施例4Example 4
如图1所示,一种喷墨打印双面晶体硅太阳能电池,包括P型硅基体5,所述P型硅基体5的正面设置有磷扩散层4,所述磷扩散层4的正面设置有绒面织构3,所述绒面织构3的正面设置有减反钝化膜2,所述减反钝化膜2的正面设置有正面银电极1;所述P型硅基体5的背面设置有纳米氧化硅层6,所述纳米氧化硅层6的背面设置有非晶或多晶P+层7,所述非晶或多晶P+层7的背面设置有透明导电薄膜层8,所述透明导电薄膜层8的背面设置有背面银电极9。As shown in Figure 1, an inkjet printing double-sided crystalline silicon solar cell includes a P-type silicon substrate 5, a phosphorus diffusion layer 4 is arranged on the front side of the P-type silicon substrate 5, and a phosphorus diffusion layer 4 is arranged on the front side of the phosphorus diffusion layer 4. There is a suede texture 3, the front of the suede texture 3 is provided with an anti-reflection passivation film 2, and the front of the anti-reflection passivation film 2 is provided with a front silver electrode 1; the P-type silicon substrate 5 A nano-silicon oxide layer 6 is arranged on the back, an amorphous or polycrystalline P + layer 7 is arranged on the back of the nano-silicon oxide layer 6, and a transparent conductive film layer 8 is arranged on the back of the amorphous or polycrystalline P+ layer 7 , the back side of the transparent conductive film layer 8 is provided with a back side silver electrode 9 .
一种喷墨打印双面晶体硅太阳能电池的制备方法,包括以下步骤:A preparation method for inkjet printing double-sided crystalline silicon solar cells, comprising the following steps:
1)去除P型硅基体5表面的损伤层并制绒;其中,步骤1)中,所述制绒具体为:采用槽式热碱方式。1) Removing the damaged layer on the surface of the P-type silicon substrate 5 and making texturing; wherein, in step 1), the texturing specifically includes: adopting a tank-type hot alkali method.
具体地,选择156mm的P型单晶硅片作为P型硅基体5,其电阻率为1Ω·cm。Specifically, a 156 mm P-type single crystal silicon wafer is selected as the P-type silicon substrate 5, and its resistivity is 1Ω·cm.
对P型硅基体5去损伤后,用质量浓度分数为0.5%的氢氧化钠或氢氧化钾溶液,在75℃下,对P型硅基体5的表面进行化学腐蚀,制备出金字塔形状的绒面,随后用质量浓度分数为1%的氢氟酸进行清洗去除杂质。After removing damage to the P-type silicon substrate 5, chemically etch the surface of the P-type silicon substrate 5 with a sodium hydroxide or potassium hydroxide solution with a mass concentration fraction of 0.5% at 75° C. to prepare a pyramid-shaped velvet. surface, followed by cleaning with 1% hydrofluoric acid to remove impurities.
2)在步骤1)中得到的产品的表面进行刻蚀,形成全黑凹凸表面结构,并进行绒面修饰,形成绒面织构3;2) Etching the surface of the product obtained in step 1) to form an all-black concave-convex surface structure, and performing suede modification to form a suede texture 3;
其中,步骤2)中,所述刻蚀具体为:采用SF6气体,利用RIE反应方式;具体地,采用RIE刻蚀的方法,使用SF6气体形成等离子体与硅片表面反应,在已有绒面形成纳米级的绒面织构3,该绒面织构3的表面为凹凸不平的结构,从而光反射时表面会显示全黑。Wherein, in step 2), the etching is specifically: adopting SF 6 gas, utilizing the RIE reaction mode; specifically, adopting the method of RIE etching, using SF 6 gas to form plasma and react with the silicon wafer surface, in the existing The suede surface forms a nano-scale suede texture 3, and the surface of the suede texture 3 has an uneven structure, so that the surface will appear completely black when light is reflected.
其中,所述绒面修饰具体为:采用碱溶液清洗方式;具体地,使用质量浓度分数为0.5%的氢氧化钠或氢氧化钾溶液,在25℃下,对P型硅基体5的表面进行化学腐蚀,修饰表面多孔硅结构,降低表面缺陷。Wherein, the suede modification specifically includes: cleaning with an alkaline solution; specifically, using a sodium hydroxide or potassium hydroxide solution with a mass concentration fraction of 0.5% at 25°C to clean the surface of the P-type silicon substrate 5 Chemical etching, modifying the surface porous silicon structure, reducing surface defects.
3)在步骤2)中得到的产品的表面进行磷扩散制结,形成磷扩散层4;3) performing phosphorus diffusion on the surface of the product obtained in step 2) to form a phosphorus diffusion layer 4;
具体地,通过管式高温热扩散方式,采用POCl3对硅片的正面进行磷扩散,形成方阻为120Ω/sq的N型层;Specifically, through the tube-type high-temperature thermal diffusion method, POCl3 is used to diffuse phosphorus on the front side of the silicon wafer to form an N-type layer with a square resistance of 120Ω/sq;
其中,POCl3为三氯氧磷,是一种工业化工原料,为无色透明、具有刺激性臭味的液体,在潮湿空气中剧烈发烟,水解成磷酸和氯化氢,进一步生成HP2O4Cl3。Among them, POCl 3 is phosphorus oxychloride, which is an industrial chemical raw material. It is a colorless, transparent liquid with a pungent odor. It fumes violently in humid air and is hydrolyzed into phosphoric acid and hydrogen chloride, which further produces HP 2 O 4 Cl 3 .
4)在步骤3)中得到的产品的边缘进行刻蚀,背面进行去结和去PSG;4) The edge of the product obtained in step 3) is etched, and the back side is subjected to dejunction and PSG removal;
其中,步骤4)中,所述刻蚀、去结和去PSG具体为:采用在线式水上漂清洗方式。具体地,采用湿法in line设备(也即,在线滚轮式设备)去除背面磷硅玻璃(PSG)(虽然仅仅在硅片的正面进行磷扩散形成磷硅玻璃,但是磷硅玻璃会渗透进入硅片的背面),实现背面抛光,然后去除正面磷硅玻璃,然后采用质量浓度分数为5%的氢氟酸溶液清洗。Wherein, in step 4), the etching, knot removal and PSG removal are specifically: adopting an online water rinsing method. Specifically, the backside phosphosilicate glass (PSG) is removed by wet in-line equipment (that is, on-line roller equipment) (although phosphorus is diffused only on the front side of the silicon wafer to form phosphosilicate glass, but the phosphosilicate glass will penetrate into the silicon The back of the sheet) to achieve back polishing, and then remove the front phosphosilicate glass, and then use a hydrofluoric acid solution with a mass concentration of 5% to clean it.
5)在步骤4)中得到的产品的正面进行减反钝化膜2沉积,形成减反钝化膜2;其中,所述减反钝化膜2为SiO2/SiNx叠层钝化膜;5) Depositing an anti-reflection passivation film 2 on the front of the product obtained in step 4) to form an anti-reflection passivation film 2; wherein, the anti-reflection passivation film 2 is a SiO 2 /SiNx laminated passivation film;
具体地,在P型硅基体5的正面用PECVD(等离子化学气相沉积)的方法生长氮化硅减反膜,钝化减反膜的厚度为80nm。Specifically, a silicon nitride anti-reflection film is grown on the front surface of the P-type silicon substrate 5 by PECVD (Plasma Chemical Vapor Deposition), and the thickness of the passivation anti-reflection film is 80 nm.
6)在步骤5)中得到的产品的背面进行纳米氧化硅生长,形成纳米氧化硅层6;其中,步骤6)中,所述纳米氧化硅生长具体为:采用LPCVD沉积方式。具体地,所述纳米氧化硅层6的厚度为1.2nm。6) Nano-silicon oxide growth is performed on the back of the product obtained in step 5) to form a nano-silicon oxide layer 6; wherein, in step 6), the growth of nano-silicon oxide is specifically: using LPCVD deposition. Specifically, the thickness of the nano-silicon oxide layer 6 is 1.2 nm.
7)在步骤6)中得到的产品的背面进行掺杂硼非晶或多晶硅沉积,形成非晶或多晶P+层7;其中,步骤7)中,所述掺杂硼非晶或多晶硅沉积具体为:采用低压化学气相沉积(LPCVD)方式;优选的,非晶或多晶P+层7的晶体形式为10nm非晶与40nm多晶形式,所述非晶或多晶P+层7的组合厚度为50nm,掺杂浓度为8×1020cm-3。7) Boron-doped amorphous or polycrystalline silicon is deposited on the back of the product obtained in step 6) to form an amorphous or polycrystalline P + layer 7; wherein, in step 7), the boron-doped amorphous or polycrystalline silicon is deposited Specifically: adopt low-pressure chemical vapor deposition (LPCVD); preferably, the crystal form of the amorphous or polycrystalline P + layer 7 is 10nm amorphous and 40nm polycrystalline, and the amorphous or polycrystalline P + layer 7 The combined thickness is 50nm, and the doping concentration is 8×10 20 cm -3 .
8)在步骤7)中得到的产品的背面进行透明导电薄膜沉积,形成透明导电薄膜层8;8) The back side of the product obtained in step 7) is deposited with a transparent conductive film to form a transparent conductive film layer 8;
其中,步骤8)中,所述透明导电薄膜沉积具体为:采用磁控溅射方式。Wherein, in step 8), the deposition of the transparent conductive film is specifically: using magnetron sputtering.
优选的,所述透明导电薄膜层8的厚度为100nm。Preferably, the thickness of the transparent conductive film layer 8 is 100 nm.
9)在步骤8)中得到的产品的正面采用喷墨打印方式,形成正面银电极1;9) The front of the product obtained in step 8) adopts an inkjet printing method to form a front silver electrode 1;
10)在步骤9)中得到的产品的背面采用喷墨打印方式,形成背面银电极9。10) The back side of the product obtained in step 9) is ink-jet printed to form the back silver electrode 9 .
具体地,通过喷墨打印背面电极及细栅线后烘干,然后喷墨打印正面电极及细栅线。Specifically, the back electrodes and fine grid lines are printed by inkjet and then dried, and then the front electrodes and fine grid lines are inkjet printed.
最后烧结,测试,最终可以形成喷墨打印双面晶体硅太阳能电池。Finally, sintering, testing, and finally inkjet printing double-sided crystalline silicon solar cells can be formed.
该实施例中,电池转换效率批次平均效率达到22.15%,且光衰减,正面主栅,背面电极和铝背场拉力,以及组件端可靠性测试均符合TUV标准。In this embodiment, the battery conversion efficiency batch average efficiency reaches 22.15%, and the light attenuation, front busbar, back electrode and aluminum back field tension, and component side reliability test all meet TUV standards.
对比例1Comparative example 1
常规喷墨打印双面晶体硅太阳能电池的制备方法,包括以下步骤:The preparation method of conventional inkjet printing double-sided crystalline silicon solar cells comprises the following steps:
1)去除P型硅基体表面的损伤层并制绒;1) removing the damaged layer on the surface of the P-type silicon substrate and making texture;
2)在步骤1)中得到的产品的背表面进行硼扩散制结,形成硼扩散层;2) performing boron diffusion on the back surface of the product obtained in step 1) to form a boron diffusion layer;
具体地,通过管式高温热扩散方式,采用BBr3对硅片的背面进行硼扩散,形成方阻为40Ω/sq的P+型层;Specifically, BBr 3 is used to diffuse boron on the back of the silicon wafer through a tube-type high-temperature thermal diffusion method to form a P + type layer with a square resistance of 40Ω/sq;
3)在步骤2)中得到的产品的正面进行单面去结;3) the front side of the product obtained in step 2) is deknotted on one side;
其中,步骤3)中,所述去结具体为:采用在线式滚轮带液清洗方式。具体地,采用湿法in line设备(也即,在线滚轮式设备)去除正面硼硅玻璃(BSG)。Wherein, in step 3), the knot removal specifically includes: adopting an online roller cleaning method. Specifically, the front side borosilicate glass (BSG) is removed using a wet in-line device (ie, an in-line roller-type device).
5)在步骤4)中得到的产品的正面进行磷扩散制结,形成磷掺杂层;5) performing phosphorous diffusion on the front side of the product obtained in step 4) to form a phosphorous doped layer;
具体地,通过管式高温热扩散方式,采用POCl3对硅片的正面进行磷扩散,形成方阻为100Ω/sq的N型层。Specifically, by means of tubular high-temperature thermal diffusion, POCl 3 is used to diffuse phosphorus on the front side of the silicon wafer to form an N-type layer with a square resistance of 100Ω/sq.
6)在步骤5)中得到的产品进行边缘刻蚀和BSG及PSG去除;6) the product obtained in step 5) carries out edge etching and BSG and PSG removal;
具体地,采用在线式水上漂清洗方式。具体地,采用湿法in line设备(也即,在线滚轮式设备)去除边结、正面磷硅玻璃(PSG)和背面硼硅玻璃(BSG)。Specifically, an online water rinsing method is adopted. Specifically, wet in-line equipment (ie, in-line roller equipment) is used to remove edge knots, front-side phosphosilicate glass (PSG) and back-side borosilicate glass (BSG).
7)在步骤6)中得到的产品的双面进行氮化硅沉积,厚度为80nm;7) Silicon nitride is deposited on both sides of the product obtained in step 6), with a thickness of 80nm;
8)在步骤7)中得到的产品的正面制备正面银电极;8) prepare front silver electrodes on the front of the product obtained in step 7);
9)在步骤8)中得到的产品的背面制备背面银电极。9) Prepare a back silver electrode on the back of the product obtained in step 8).
最后烧结,测试,最终形成双面晶体硅太阳能电池。Finally, sintering, testing, and finally forming a double-sided crystalline silicon solar cell.
这种制备方法中,电池转换效率批次平均效率仅仅为20.1%,其明显不如本发明的制备方法的电池转换效率批次平均效率。In this preparation method, the battery conversion efficiency batch average efficiency is only 20.1%, which is obviously not as good as the battery conversion efficiency batch average efficiency of the preparation method of the present invention.
申请人声明,本发明通过上述实施例来说明本发明的详细方法,但本发明并不局限于上述详细方法,即不意味着本发明必须依赖上述详细方法才能实施。所属技术领域的技术人员应该明了,对本发明的任何改进,对本发明产品各原料的等效替换及辅助成分的添加、具体方式的选择等,均落在本发明的保护范围和公开范围之内。The applicant declares that the present invention illustrates the detailed methods of the present invention through the above-mentioned examples, but the present invention is not limited to the above-mentioned detailed methods, that is, it does not mean that the present invention must rely on the above-mentioned detailed methods to be implemented. Those skilled in the art should understand that any improvement of the present invention, the equivalent replacement of each raw material of the product of the present invention, the addition of auxiliary components, the selection of specific methods, etc., all fall within the scope of protection and disclosure of the present invention.
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| CN115274914B (en) * | 2021-04-30 | 2025-10-31 | 泰州中来光电科技有限公司 | Preparation process of front-side local passivation contact battery, assembly and system |
| CN114361273A (en) * | 2021-12-03 | 2022-04-15 | 宁夏隆基乐叶科技有限公司 | Silicon wafer, preparation method thereof and solar cell |
| CN114914329A (en) * | 2022-06-17 | 2022-08-16 | 安徽华晟新能源科技有限公司 | Preparation method of solar cell |
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| CN102447064A (en) * | 2010-10-06 | 2012-05-09 | 曾永斌 | Polymer solar cell and preparation method thereof |
| CN203503678U (en) * | 2012-07-23 | 2014-03-26 | 东莞市长安东阳光铝业研发有限公司 | A kind of HIT solar cell |
| CN104795127A (en) * | 2015-03-30 | 2015-07-22 | 无锡帝科电子材料科技有限公司 | Electric conduction slurry and application of electric conduction slurry in N type silicon wafer solar cells |
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| US7705237B2 (en) * | 2006-11-27 | 2010-04-27 | Sunpower Corporation | Solar cell having silicon nano-particle emitter |
| CN103403885A (en) * | 2011-03-08 | 2013-11-20 | 默克专利股份有限公司 | Metallisation barrier based on aluminium oxide |
| CN102157622B (en) * | 2011-03-08 | 2013-05-01 | 中国科学院苏州纳米技术与纳米仿生研究所 | Method for manufacturing serial uniwafer integrated multi-junction thin film solar cell |
| CN103035782B (en) * | 2013-01-05 | 2016-08-17 | 大连理工大学 | A kind of solar cell surface low temperature passivation method |
| US9105769B2 (en) * | 2013-09-12 | 2015-08-11 | International Business Machines Corporation | Shallow junction photovoltaic devices |
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| CN102447064A (en) * | 2010-10-06 | 2012-05-09 | 曾永斌 | Polymer solar cell and preparation method thereof |
| CN203503678U (en) * | 2012-07-23 | 2014-03-26 | 东莞市长安东阳光铝业研发有限公司 | A kind of HIT solar cell |
| CN104795127A (en) * | 2015-03-30 | 2015-07-22 | 无锡帝科电子材料科技有限公司 | Electric conduction slurry and application of electric conduction slurry in N type silicon wafer solar cells |
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