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CN105634454B - A kind of electrification reset circuit reinforced suitable for aerospace with the single-particle of SRAM type FPGA - Google Patents

A kind of electrification reset circuit reinforced suitable for aerospace with the single-particle of SRAM type FPGA Download PDF

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CN105634454B
CN105634454B CN201610108491.0A CN201610108491A CN105634454B CN 105634454 B CN105634454 B CN 105634454B CN 201610108491 A CN201610108491 A CN 201610108491A CN 105634454 B CN105634454 B CN 105634454B
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CN105634454A (en
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陈雷
李学武
王文锋
赵元富
孙华波
倪劼
李智
张健
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Beijing Microelectronic Technology Institute
Mxtronics Corp
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Mxtronics Corp
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22Modifications for ensuring a predetermined initial state when the supply voltage has been applied
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22Modifications for ensuring a predetermined initial state when the supply voltage has been applied
    • H03K17/223Modifications for ensuring a predetermined initial state when the supply voltage has been applied in field-effect transistor switches

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Abstract

一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,它内部包含电源VCC、三个相同的上电冗余模块、出错检测及冗余输出控制模块和三个可控输出缓冲器,出错检测及冗余输出控制模块可以检测出出错的上电冗余模块,并把上电冗余模块进行复位,清除单粒子效应的累积;出错检测及冗余输出控制模块可以控制可控输出缓冲器切断出错的上电冗余模块的输出,确保上电复位电路的输出正确。本上电复位电路清除了由单粒子翻转效应引起的错误累计现象,同时对模块输出进行控制,消除单粒子效应对输出的影响,实现显著的抗单粒子效应的能力。

A single-event hardened power-on reset circuit suitable for SRAM FPGAs used in aerospace, which includes a power supply VCC, three identical power-on redundant modules, error detection and redundant output control modules, and three controllable output buffers The error detection and redundant output control module can detect the faulty power-on redundant module, and reset the power-on redundant module to clear the accumulation of single event effects; the error detection and redundant output control module can control the controllable The output buffer cuts off the output of the faulty power-on redundancy module to ensure the correct output of the power-on reset circuit. The power-on reset circuit clears the error accumulation phenomenon caused by the single event reversal effect, and at the same time controls the output of the module, eliminates the influence of the single event effect on the output, and achieves a significant ability to resist the single event effect.

Description

一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路A single-event hardened power-on-reset circuit suitable for SRAM-type FPGAs used in aerospace

技术领域technical field

本发明涉及一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,属于抗单粒子效应加固集成电路领域。The invention relates to a single-event reinforced power-on reset circuit suitable for SRAM type FPGA used in aerospace, and belongs to the field of anti-single-event effect reinforced integrated circuits.

背景技术Background technique

SRAM型FPGA芯片在启动需要一个上电复位过程。上电复位电路在FPGA芯片启动的时候,给出一个复位信号,一直保持着有效的电平,等到电源电压升到其他电路可正常工作的程度后改变复位信号,启动芯片上其他电路,上电成功后保持稳定状态,使芯片正常工作。现有的上电复位电路用于宇航用用SRAM型FPGA时,将面临严重的可靠性问题:在空间恶劣环境中上电复位电路将产生单粒子翻转(SEU)与单粒子瞬态(SET)等单粒子效应。当上电复位电路发生单粒子翻转(SEU)与单粒子瞬态(SET)时将会产生错误的上电复位信号,导致芯片掉电、用户功能丢失,严重影响宇航用SRAM型FPGA的可靠性,随着工艺的进步,SRAM型FPGA芯片对单粒子效应的敏感性不断加大,对上电复位电路的可靠性提出了更高的要求。同时经过加固设计的宇航用SRAM型FPGA,内部包含多种存储单元,这些存储单元因抗辐射需求的不同,采用了不同的加固措施,导致这些存储单元正常工作需要的电压不同,清零时间不同,现有的上电复位电路难以保证合理的复位脉冲宽度,特别是随着工艺尺寸缩小,不同类型存储单元的偏差不断增大,对复位脉冲宽度的正确性提高了更高要求。The SRAM type FPGA chip needs a power-on reset process when starting. The power-on reset circuit gives a reset signal when the FPGA chip is started, and keeps a valid level. After the power supply voltage rises to a level where other circuits can work normally, the reset signal is changed, and other circuits on the chip are started. After success, maintain a stable state and make the chip work normally. When the existing power-on reset circuit is used in SRAM FPGA for aerospace, it will face serious reliability problems: the power-on reset circuit will generate single event upset (SEU) and single event transient (SET) in the harsh environment of space. single event effects. When single event upset (SEU) and single event transient (SET) occur in the power-on reset circuit, a wrong power-on reset signal will be generated, resulting in power-off of the chip and loss of user functions, seriously affecting the reliability of aerospace SRAM FPGAs , with the progress of the technology, the sensitivity of the SRAM FPGA chip to the single event effect is increasing, which puts forward higher requirements for the reliability of the power-on reset circuit. At the same time, the reinforced SRAM FPGA for aerospace contains a variety of storage units. These storage units adopt different reinforcement measures due to different radiation resistance requirements, resulting in different voltages and different clearing times for these storage units to work normally. , the existing power-on reset circuit is difficult to guarantee a reasonable reset pulse width, especially as the process size shrinks, the deviation of different types of memory cells continues to increase, and higher requirements are placed on the correctness of the reset pulse width.

发明内容Contents of the invention

本发明解决的技术问题为:克服现有技术不足,提供一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,通过出错检测及冗余输出控制模块把发生单粒子效应出错的上电冗余模块输出关断,使最终上电复位输出保持正确;采用带有复位输入的延时去毛刺电路,去除电平监测模块的因电源波动和单粒子效应产生的瞬态波动,同时在该上电冗余模块出错时,通过出错检测及冗余输出控制模块的输出对延时去毛刺电路进行复位;采用带有复位输入的数字辅助延时模块,在该上电冗余模块出错时,通过出错检测及冗余输出控制模块的输出对数字辅助延时模块进行复位清零,清除了单粒子翻转的累积效应,使其回到正确状态,从而实现抗单粒子翻转效应和抗单粒子瞬态效应能力;通过内部存储单元状态监测模块监测对FPGA中的加固存储单元进行一次完整读写操作所需最小时间,保证了复位脉冲宽度可以满足FPGA对所有加固存储单元的正确复位。The technical problem solved by the present invention is: to overcome the deficiencies in the prior art, to provide a single-event-reinforced power-on reset circuit suitable for aerospace SRAM-type FPGAs, and to control the errors of single-event effects through error detection and redundant output control modules. The output of the power-on redundant module is turned off, so that the final power-on reset output remains correct; a delay deburring circuit with a reset input is used to remove the transient fluctuations of the level monitoring module due to power fluctuations and single event effects, and at the same time When the power-on redundant module makes an error, the delay deburring circuit is reset through the output of the error detection and redundant output control module; a digital auxiliary delay module with a reset input is adopted, and when the power-on redundant module makes an error At the same time, the digital auxiliary delay module is reset and cleared through the error detection and the output of the redundant output control module, and the cumulative effect of the single event reversal is cleared, so that it returns to the correct state, thereby realizing the anti-single event reversal effect and anti-single event reversal. Particle transient effect capability; through the internal storage unit state monitoring module, the minimum time required for a complete read and write operation of the hardened storage unit in the FPGA is monitored, ensuring that the reset pulse width can meet the correct reset of all the hardened storage units by the FPGA.

本发明解决的技术方案为:一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,包括电源VCC、三个相同的上电冗余模块、出错检测及冗余输出控制模块和三个可控输出缓冲器;三个相同的上电冗余模块,分别为第一上电冗余模块、第二上电冗余模块、第三上电冗余模块;三个可控输出缓冲器分别为第一可控输出缓冲器、第二可控输出缓冲器、第三可控输出缓冲器;The technical solution solved by the present invention is: a single particle reinforced power-on reset circuit suitable for aerospace SRAM type FPGA, including power supply VCC, three identical power-on redundant modules, error detection and redundant output control modules and Three controllable output buffers; three identical power-on redundant modules, namely the first power-on redundant module, the second power-on redundant module, and the third power-on redundant module; three controllable output buffers The devices are respectively the first controllable output buffer, the second controllable output buffer, and the third controllable output buffer;

每个上电冗余模块,包括电平监测模块、延时去毛刺电路、内部存储单元状态监测模块、数字辅助延时模块;Each power-on redundant module includes a level monitoring module, a delay deburring circuit, an internal storage unit status monitoring module, and a digital auxiliary delay module;

电源给电平监测模块供电,电平监测模块实时检测电源的电压值,当电源的电压值大于等于设定的上阈值电压Vthr时,电平监测模块输出一个高电平信号送至延时去毛刺电路,该高电平信号即结束复位信号,当电源的电压值低于设定的上阈值电压Vthr时,电平监测模块输出一个低电平信号送至延时去毛刺电路;The power supply supplies power to the level monitoring module, and the level monitoring module detects the voltage value of the power supply in real time. When the voltage value of the power supply is greater than or equal to the set upper threshold voltage Vthr, the level monitoring module outputs a high level signal and sends it to the delay In the glitch circuit, the high level signal ends the reset signal. When the voltage value of the power supply is lower than the set upper threshold voltage Vthr, the level monitoring module outputs a low level signal and sends it to the delay deburring circuit;

延时去毛刺电路,接收电平监测模块送来的高电平信号或低电平信号,判断出错检测及冗余输出控制模块反馈的为高电平信号时,同时当从电平监测模块接收的高电平信号或低电平信号的单个脉冲宽度小于等于设定的脉冲宽度时,将该单个脉冲作为毛刺滤除,得到平顺的高电平信号或平顺的低电平信号送至内部存储单元状态监测模块;判断出错检测及冗余输出控制模块反馈的为低电平信号时,当出错检测及冗余输出控制模块反馈的低电平信号中的脉冲小于等于设定的脉冲宽度时,将该单个脉冲作为毛刺滤除,得到平顺的低电平信号送至内部存储单元状态监测模块;The delay deburring circuit receives the high-level signal or low-level signal sent by the level monitoring module, and judges that when the feedback from the error detection and redundant output control module is a high-level signal, at the same time when it receives the high-level signal from the level monitoring module When the single pulse width of the high-level signal or low-level signal is less than or equal to the set pulse width, the single pulse is filtered out as a glitch, and a smooth high-level signal or a smooth low-level signal is sent to the internal storage Unit state monitoring module; when judging that the feedback from the error detection and redundant output control module is a low-level signal, when the pulse in the low-level signal fed back by the error detection and redundant output control module is less than or equal to the set pulse width, The single pulse is filtered out as a glitch, and the smooth low-level signal is sent to the internal storage unit status monitoring module;

内部存储单元状态监测模块,包括多个存储单元;An internal storage unit status monitoring module, including multiple storage units;

内部存储单元状态监测模块,当接收延时去毛刺电路送来的平顺的低电平信号,将内部存储单元状态监测模块中的多个存储单元锁定,即停止向该存储单元写入数据,同时向数字辅助延时模块输出高电平信号;内部存储单元状态监测模块,当接收延时去毛刺电路送来的平顺的高电平信号,向内部存储单元状态监测模块中的多个存储单元写入与存储单元中存储的值相反的值,然后将多个存储单元锁定,即停止向该存储单元写入数据,同时后向数字辅助延时模块输出低电平信号;The internal storage unit status monitoring module, when receiving the smooth low-level signal sent by the delay deburring circuit, locks multiple storage units in the internal storage unit status monitoring module, that is, stops writing data to the storage unit, and at the same time Output high-level signals to the digital auxiliary delay module; the internal storage unit status monitoring module, when receiving the smooth high-level signal sent by the delay deburring circuit, writes to multiple storage units in the internal storage unit status monitoring module Enter the value opposite to the value stored in the storage unit, and then lock multiple storage units, that is, stop writing data to the storage unit, and output a low level signal to the digital auxiliary delay module at the same time;

数字辅助延时模块包括多个寄存器和一个振荡器;The digital auxiliary delay module includes multiple registers and an oscillator;

数字辅助延时模块,接收内部存储单元状态监测模块送来的高电平信号或低电平信号,当从内部存储单元状态监测模块接收到高电平信号时且出错检测及冗余输出控制模块的反馈为高电平时,数字辅助延时模块中的多个寄存器处于锁定状态,即寄存器内存储的数值不变,输出低电平信号,即数字辅助延时模块的输出为低电平信号;The digital auxiliary delay module receives the high-level signal or low-level signal sent by the internal storage unit status monitoring module, and when the high-level signal is received from the internal storage unit status monitoring module, the error detection and redundant output control module When the feedback is high level, multiple registers in the digital auxiliary delay module are locked, that is, the value stored in the register remains unchanged, and a low level signal is output, that is, the output of the digital auxiliary delay module is a low level signal;

当从内部存储单元状态监测模块接收到高电平信号时且出错检测及冗余输出控制模块的反馈为低电平时,或当从内部存储单元状态监测模块接收到低电平信号时且出错检测及冗余输出控制模块的反馈为高电平时,或当从内部存储单元状态监测模块接收到低电平信号时且出错检测及冗余输出控制模块的反馈为低电平时,振荡器开始振荡输出时钟信号,每一次振荡后寄存器计数一次,当寄存器寄满后,输出高电平,即数字辅助延时模块的输出为高电平信号;When a high level signal is received from the internal storage unit status monitoring module and the feedback from the error detection and redundant output control module is low level, or when a low level signal is received from the internal storage unit status monitoring module and the error detection And when the feedback from the redundant output control module is high level, or when a low level signal is received from the internal storage unit status monitoring module and the feedback from the error detection and redundant output control module is low level, the oscillator starts to oscillate and output The clock signal, the register counts once after each oscillation, and when the register is full, it outputs a high level, that is, the output of the digital auxiliary delay module is a high level signal;

将第一上电冗余模块的输出记为POR_Good1信号、第二上电冗余模块POR_Good2信号、第三上电冗余模块POR_Good3信号;将第一上电冗余模块的输出记为POR_Good1信号、第二上电冗余模块POR_Good2信号、第三上电冗余模块POR_Good3信号均送至出错检测及冗余输出控制模块;将第一上电冗余模块的输出记为POR_Good1信号送至第一可控输出缓冲器;将第二上电冗余模块的输出记为POR_Good2信号送至第二可控输出缓冲器;将第三上电冗余模块的输出记为POR_Good3信号送至第三可控输出缓冲器;The output of the first power-on redundant module is recorded as POR_Good1 signal, the second power-on redundant module POR_Good2 signal, the third power-on redundant module POR_Good3 signal; the output of the first power-on redundant module is recorded as POR_Good1 signal, Both the POR_Good2 signal of the second power-on redundant module and the POR_Good3 signal of the third power-on redundant module are sent to the error detection and redundant output control module; the output of the first power-on redundant module is recorded as the POR_Good1 signal and sent to the first control output buffer; record the output of the second power-on redundant module as POR_Good2 signal and send it to the second controllable output buffer; record the output of the third power-on redundant module as POR_Good3 signal and send it to the third controllable output buffer;

出错检测及冗余输出控制模块有三个输入和三个输出,三个输出分别为OUT1、OUT2和OUT3,OUT1输出反馈至第一上电冗余模块的延时去毛刺电路、数字辅助延时模块并送至第一可控输出缓冲器,OUT2输出反馈至第二上电冗余模块的延时去毛刺电路、数字辅助延时模块并送至第二可控输出缓冲器,OUT3输出反馈至第三上电冗余模块的延时去毛刺电路、数字辅助延时模块并送至第三可控输出缓冲器;The error detection and redundant output control module has three inputs and three outputs, the three outputs are OUT1, OUT2 and OUT3, and the output of OUT1 is fed back to the delay deburring circuit of the first power-on redundant module and the digital auxiliary delay module And sent to the first controllable output buffer, the output of OUT2 is fed back to the delay and deburring circuit of the second power-on redundant module, and the digital auxiliary delay module is sent to the second controllable output buffer, and the output of OUT3 is fed back to the second The delay deburring circuit of the three-power-on redundant module and the digital auxiliary delay module are sent to the third controllable output buffer;

出错检测及冗余输出控制模块的三个输入分别将接收的POR_Good1信号、POR_Good2信号、POR_Good3信号进行比较,若POR_Good1信号、POR_Good2信号、POR_Good3信号均相同,则出错检测及冗余输出控制模块的三个输出OUT1、OUT2和OUT3均为高电平;若POR_Good1信号与POR_Good2信号和POR_Good3信号不同,则OUT1为低电平,OUT2和OUT3为高电平;若POR_Good2信号与POR_Good1信号和POR_Good3信号不同,则OUT2为低电平,OUT1和OUT3为高电平;若POR_Good3信号与POR_Good1信号和POR_Good2信号不同,则OUT3为低电平,OUT1和OUT2为高电平;The three inputs of the error detection and redundant output control module compare the received POR_Good1 signal, POR_Good2 signal, and POR_Good3 signal respectively. If the POR_Good1 signal, POR_Good2 signal, and POR_Good3 signal are all the same, the three inputs of the error detection and redundant output control module Each output OUT1, OUT2 and OUT3 are high level; if POR_Good1 signal is different from POR_Good2 signal and POR_Good3 signal, then OUT1 is low level, OUT2 and OUT3 are high level; if POR_Good2 signal is different from POR_Good1 signal and POR_Good3 signal, Then OUT2 is low level, OUT1 and OUT3 are high level; if the POR_Good3 signal is different from the POR_Good1 signal and POR_Good2 signal, then OUT3 is low level, and OUT1 and OUT2 are high level;

当第一可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为高电平时,将第一上电冗余模块的输出POR_Good1信号反相后输出;当第一可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为低电平时,第一可控输出缓冲器不输出信号;When the first controllable output buffer receives the output signal of the error detection and redundant output control module as a high level, it outputs the output POR_Good1 signal of the first power-on redundant module after inversion; when the first controllable The output buffer, when receiving the output signal of the error detection and redundant output control module is low level, the first controllable output buffer does not output the signal;

当第二可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为高电平时,将第二上电冗余模块的输出POR_Good2信号反相后输出;当第二可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为低电平时,第二可控输出缓冲器不输出信号;When the second controllable output buffer receives the output signal of the error detection and redundant output control module as a high level, it outputs the output POR_Good2 signal of the second power-on redundant module after inversion; when the second controllable The output buffer, when receiving the output signal of the error detection and redundant output control module is low level, the second controllable output buffer does not output the signal;

当第三可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为高电平时,将第三上电冗余模块的输出POR_Good3信号反相后输出;当第三可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为低电平时,第三可控输出缓冲器不输出信号。When the third controllable output buffer receives the output signal of the error detection and redundant output control module as a high level, it outputs the output POR_Good3 signal of the third power-on redundant module after inversion; when the third controllable The output buffer, when receiving the output signal of the error detection and redundant output control module is low level, the third controllable output buffer does not output the signal.

所述电平监测模块包括:PMOS管M2、PMOS管M3、PMOS管M5、PMOS管M5、NMOS管M1、NMOS管M4、NMOS管M7、电容C1、电容C2、反相器;The level monitoring module includes: PMOS transistor M2, PMOS transistor M3, PMOS transistor M5, PMOS transistor M5, NMOS transistor M1, NMOS transistor M4, NMOS transistor M7, capacitor C1, capacitor C2, and an inverter;

PMOS管M2的栅极接地,PMOS管M2的源极连接电源VCC,PMOS管M2的漏极同时连接NMOS管M1的栅极和漏极电容C1的一端、PMOS管M3的栅极;NMOS管M1的源极接地;The gate of the PMOS transistor M2 is grounded, the source of the PMOS transistor M2 is connected to the power supply VCC, and the drain of the PMOS transistor M2 is simultaneously connected to the gate of the NMOS transistor M1, one end of the drain capacitor C1, and the gate of the PMOS transistor M3; the NMOS transistor M1 The source of the ground;

电容C1的另一端接电源VCC,NMOS管M4的栅极连接电源VCC,PMOS管M3的源极连接电源VCC,PMOS管M3的漏极连接NMOS管M4的漏极、电容C2的一端、PMOS管M5的漏极、PMOS管M6的栅极、NMOS管M7的栅极;NMOS管M4的源极接地;电容C2的另一端接地;PMOS管M5的源极接电源VCC,PMOS管M5的栅极连接PMOS管M6的漏极和NMOS管M7的漏极、反相器的输入端;PMOS管M6的源极连接电源VCC;NMOS管M7的源极接地;反相器的输出端VCC_Good作为电平监测模块的输出。The other end of the capacitor C1 is connected to the power supply VCC, the gate of the NMOS transistor M4 is connected to the power supply VCC, the source of the PMOS transistor M3 is connected to the power supply VCC, the drain of the PMOS transistor M3 is connected to the drain of the NMOS transistor M4, one end of the capacitor C2, and the PMOS transistor The drain of M5, the gate of PMOS transistor M6, and the gate of NMOS transistor M7; the source of NMOS transistor M4 is grounded; the other end of capacitor C2 is grounded; the source of PMOS transistor M5 is connected to the power supply VCC, and the gate of PMOS transistor M5 Connect the drain of the PMOS transistor M6 to the drain of the NMOS transistor M7 and the input terminal of the inverter; the source of the PMOS transistor M6 is connected to the power supply VCC; the source of the NMOS transistor M7 is grounded; the output terminal VCC_Good of the inverter is used as the level Monitor the output of the module.

所述延时去毛刺电路包括:与门AND31、反相器INV31、反相器INV32、反相器INV33、反相器INV34、电容C31、电容C32、电容C33和与非门NAND31;The delay deburring circuit includes: AND gate AND31, inverter INV31, inverter INV32, inverter INV33, inverter INV34, capacitor C31, capacitor C32, capacitor C33 and NAND gate NAND31;

与门AND31的一个输入端为VCC_Good连接电平监测模块的输出VCC_Good,另一个输入端为ER_RST连接出错检测及冗余输出控制模块的输出,其中第一上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT1、第二上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT2相连、第三上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT3;与门AND31的输出端连接反相器INV31的输入端,同时连接与非门NAND31的一个输入端和电容C31的一端;电容C31的另一端连接电源VCC;反相器INV31的输出端连接电容C32的一端的同时连接反相器INV32的输入端;电容C32的另一端接地;反相器INV32的输出端连接反相器INV33的输入端;反相器INV33的输出端连接反相器INV34的输入端;反相器INV34的输出端连接电容C33的一端的同时连接与非门NAND31的另一个输入端;电容C33的另一端连接到电源VCC;与非门NAND31的输出端Power_Good作为延时去毛刺电路的输出。One input terminal of the AND gate AND31 is VCC_Good connected to the output VCC_Good of the level monitoring module, and the other input terminal is connected to the output of the error detection and redundant output control module ER_RST, wherein the delay deburring circuit of the first power-on redundant module Connect the output OUT1 of the error detection and redundant output control module, the delay deburring circuit of the second power-on redundant module, connect the output OUT2 of the error detection and redundant output control module, and the delay of the third power-on redundant module The deburring circuit is connected to the output OUT3 of the error detection and redundant output control module; the output terminal of the AND gate AND31 is connected to the input terminal of the inverter INV31, and simultaneously connected to an input terminal of the NAND gate NAND31 and one end of the capacitor C31; the output terminal of the capacitor C31 The other end is connected to the power supply VCC; the output end of the inverter INV31 is connected to one end of the capacitor C32 and the input end of the inverter INV32; the other end of the capacitor C32 is grounded; the output end of the inverter INV32 is connected to the input of the inverter INV33 end; the output end of the inverter INV33 is connected to the input end of the inverter INV34; the output end of the inverter INV34 is connected to one end of the capacitor C33 while connecting the other input end of the NAND gate NAND31; the other end of the capacitor C33 is connected to Power supply VCC; the output terminal Power_Good of the NAND gate NAND31 is used as the output of the delay deburring circuit.

所述内部存储单元状态监测模块包括:反相器INV41、反相器INV42、……、反相器INV4n、存储单元SRAM41、存储单元SRAM42、……、存储单元SRAM4n、NMOS管M41、NMOS管M42、……、NMOS管M4n、或门OR4n;The internal storage unit status monitoring module includes: inverter INV41, inverter INV42, ..., inverter INV4n, storage unit SRAM41, storage unit SRAM42, ..., storage unit SRAM4n, NMOS tube M41, NMOS tube M42 ,..., NMOS tube M4n, OR gate OR4n;

反相器INV41的输入端连接到延时去毛刺电路的输出端Power_Good,同时连接到反相器INV42的输入端、反相器INV4n的输入端、存储单元SRAM41的R输入端、存储单元SRAM42的R输入端、存储单元SRAM4n的R输入端、NMOS管M41的栅极、NMOS管M42的栅极、NMOS管M4n的栅极;反相器INV41的输出端连接到存储单元SRAM41的RN输入端;反相器INV42的输出端连接到存储单元SRAM42的RN输入端;反相器INV4n的输出端连接到存储单元SRAM4n的RN输入端;存储单元SRAM41的Z输出端连接到或门OR4n的第一输入端;存储单元SRAM41的ZN输出端连接到NMOS管M41的漏极;存储单元SRAM42的Z输出端连接到或门OR4n的第二输入端;存储单元SRAM42的ZN输出端连接到NMOS管M42的漏极;存储单元SRAM4n的Z输出端连接到或门OR4n的第n输入端;存储单元SRAM4n的ZN输出端连接到NMOS管M4n的漏极;NMOS管M41的源极接地;NMOS管M42的源极接地;NMOS管M4n的源极接地;或门OR4n的POR_Latch输出端连接到存储单元SRAM41的WL、存储单元SRAM42的WL输入端、存储单元SRAM4n的WL输入端,同时作为内部存储单元状态监测模块的输出。The input end of the inverter INV41 is connected to the output end Power_Good of the delay deburring circuit, and simultaneously connected to the input end of the inverter INV42, the input end of the inverter INV4n, the R input end of the storage unit SRAM41, and the R input end of the storage unit SRAM42. R input terminal, the R input terminal of the storage unit SRAM4n, the grid of the NMOS transistor M41, the grid of the NMOS transistor M42, and the grid of the NMOS transistor M4n; the output terminal of the inverter INV41 is connected to the RN input terminal of the storage unit SRAM41; The output end of the inverter INV42 is connected to the RN input end of the storage unit SRAM42; the output end of the inverter INV4n is connected to the RN input end of the storage unit SRAM4n; the Z output end of the storage unit SRAM41 is connected to the first input of the OR gate OR4n end; the ZN output end of the storage unit SRAM41 is connected to the drain of the NMOS transistor M41; the Z output end of the storage unit SRAM42 is connected to the second input end of the OR gate OR4n; the ZN output end of the storage unit SRAM42 is connected to the drain of the NMOS transistor M42 The Z output terminal of the storage unit SRAM4n is connected to the nth input terminal of the OR gate OR4n; the ZN output terminal of the storage unit SRAM4n is connected to the drain of the NMOS transistor M4n; the source of the NMOS transistor M41 is grounded; the source of the NMOS transistor M42 ground; the source of the NMOS tube M4n is grounded; the POR_Latch output of the OR gate OR4n is connected to the WL of the storage unit SRAM41, the WL input of the storage unit SRAM42, and the WL input of the storage unit SRAM4n, and at the same time as the internal storage unit status monitoring module output.

所述数字辅助延时模块包括:与门AND51、振荡器OSC、寄存器FF51、寄存器FF52、寄存器FF53、寄存器FF54、寄存器FF55、寄存器FF56、寄存器FF57、寄存器FF58、寄存器FF59;The digital auxiliary delay module includes: AND gate AND51, oscillator OSC, register FF51, register FF52, register FF53, register FF54, register FF55, register FF56, register FF57, register FF58, register FF59;

与门AND51的一个输入端为ER_RST连接出错检测及冗余输出控制模块的输出,其中第一上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT1、第二上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT2相连、第三上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT3;与门AND51的输出端连接寄存器寄存器FF51的R输入端,同时连接振荡器OSC的控制输入端;寄存器FF52的R输入端为POR_Latch,接受内部存储单元状态监测模块的输出POR_Latch,同时连接寄存器FF53的R输入端、寄存器FF54的R输入端、寄存器FF55的R输入端、寄存器FF56的R输入端、寄存器FF57的R输入端、寄存器FF58的R输入端、寄存器FF59的R输入端;振荡器OSC的输出端连接到寄存器FF51的时钟输入端;寄存器FF51的QN输出端连接寄存器FF51的D输入端;寄存器FF51的Q输出端连接寄存器FF52的时钟输入端;寄存器FF52的QN输出端连接寄存器FF52的D输入端;寄存器FF51的Q输出端连接寄存器FF53的时钟输入端;寄存器FF53的QN输出端连接寄存器FF53的D输入端;寄存器FF53的Q输出端连接寄存器FF54的时钟输入端;寄存器FF54的QN输出端连接寄存器FF54的D输入端;寄存器FF54的Q输出端连接寄存器FF55的时钟输入端;寄存器FF55的QN输出端连接寄存器FF55的D输入端;寄存器FF55的Q输出端连接寄存器FF56的时钟输入端;寄存器FF56的QN输出端连接寄存器FF56的D输入端;寄存器FF56的Q输出端连接寄存器FF57的时钟输入端;寄存器FF57的QN输出端连接寄存器FF57的D输入端;寄存器FF57的Q输出端连接寄存器FF58的时钟输入端;寄存器FF58的QN输出端连接寄存器FF58的D输入端;寄存器FF58的Q输出端连接寄存器FF59的时钟输入端;寄存器FF59的D输入端连接到电源VCC;寄存器FF59的Q输出端连接到与门AND51的另一个输入端的同时同时作为数字辅助延时模块的输出POR_Good。One input terminal of AND gate AND51 is the output of ER_RST connection error detection and redundant output control module, wherein the delay deburring circuit of the first power-on redundant module is connected with output OUT1 of the error detection and redundant output control module, the second The delay deburring circuit connection error detection of the power-on redundant module and the output OUT2 of the redundant output control module are connected, and the delay deburring circuit connection error detection of the third power-on redundant module is connected to the output OUT3 of the redundant output control module ; The output terminal of the AND gate AND51 is connected to the R input terminal of the register register FF51, and is connected to the control input terminal of the oscillator OSC at the same time; the R input terminal of the register FF52 is POR_Latch, which accepts the output POR_Latch of the internal storage unit status monitoring module, and is connected to the register FF53 at the same time The R input terminal of register FF54, the R input terminal of register FF55, the R input terminal of register FF56, the R input terminal of register FF57, the R input terminal of register FF58, the R input terminal of register FF59; the oscillator OSC The output terminal of register FF51 is connected to the clock input terminal of register FF51; the QN output terminal of register FF51 is connected to the D input terminal of register FF51; the Q output terminal of register FF51 is connected to the clock input terminal of register FF52; the QN output terminal of register FF52 is connected to the register FF52 D input; the Q output of register FF51 is connected to the clock input of register FF53; the QN output of register FF53 is connected to the D input of register FF53; the Q output of register FF53 is connected to the clock input of register FF54; the QN of register FF54 The output terminal is connected to the D input terminal of register FF54; the Q output terminal of register FF54 is connected to the clock input terminal of register FF55; the QN output terminal of register FF55 is connected to the D input terminal of register FF55; the Q output terminal of register FF55 is connected to the clock input terminal of register FF56 terminal; the QN output terminal of register FF56 is connected to the D input terminal of register FF56; the Q output terminal of register FF56 is connected to the clock input terminal of register FF57; the QN output terminal of register FF57 is connected to the D input terminal of register FF57; the Q output terminal of register FF57 Connect the clock input terminal of register FF58; the QN output terminal of register FF58 is connected to the D input terminal of register FF58; the Q output terminal of register FF58 is connected to the clock input terminal of register FF59; the D input terminal of register FF59 is connected to the power supply VCC; The Q output terminal is connected to the other input terminal of the AND gate AND51 and at the same time serves as the output POR_Good of the digital auxiliary delay module.

所述出错检测及冗余输出控制模块包括:异或门XOR61、异或门XOR62、异或门XOR63、与非门NAND61、与非门NAND62、与非门NAND63;The error detection and redundant output control module includes: XOR gate XOR61, XOR gate XOR62, XOR gate XOR63, NAND gate NAND61, NAND gate NAND62, NAND gate NAND63;

异或门XOR61的一个输入端POR_Good1连接第一上电冗余模块的数字辅助延时模块的输出,同时连接异或门XOR62的一个输入端;异或门XOR62的另一个输入端POR_Good2连接第二上电冗余模块的数字辅助延时模块的输出,同时连接异或门XOR63的一个输入端;异或门XOR63的另一个输入端POR_Good3连接第三上电冗余模块的数字辅助延时模块的输出,同时连接异或门XOR61的另一个输入端;异或门XOR61的输出端连接与非门NAND61的一个输入端的同时连接与非门NAND63的一个输入端;异或门XOR62的输出端连接与非门NAND62的一个输入端的同时连接与非门NAND61的另一个输入端;异或门XOR63的输出端连接与非门NAND63的另一个输入端的同时连接与非门NAND62的另一个输入端;与非门NAND61的输出端作为出错检测及冗余输出控制模块的输出端OUT1;与非门NAND62的输出端作为出错检测及冗余输出控制模块的输出端OUT2;与非门NAND63的输出端作为出错检测及冗余输出控制模块的输出端OUT3。An input terminal POR_Good1 of the exclusive OR gate XOR61 is connected to the output of the digital auxiliary delay module of the first power-on redundant module, and is connected to an input terminal of the exclusive OR gate XOR62 at the same time; the other input terminal POR_Good2 of the exclusive OR gate XOR62 is connected to the second The output of the digital auxiliary delay module of the power-on redundant module is connected to an input terminal of the exclusive OR gate XOR63 at the same time; the other input terminal POR_Good3 of the exclusive OR gate XOR63 is connected to the digital auxiliary delay module of the third power-on redundant module Output, connect another input end of XOR gate XOR61 at the same time; The output end of XOR gate XOR61 connects an input end of NAND gate NAND61 and connects an input end of NAND gate NAND63 at the same time; The output end of XOR gate XOR62 connects and One input end of the NOT gate NAND62 is connected with the other input end of the NAND gate NAND61 simultaneously; The output end of the XOR gate XOR63 is connected with the other input end of the NAND gate NAND63 while connecting the other input end of the NAND gate NAND62; The output terminal of the gate NAND61 is used as the output terminal OUT1 of the error detection and redundant output control module; the output terminal of the NAND gate NAND62 is used as the output terminal OUT2 of the error detection and redundant output control module; the output terminal of the NAND gate NAND63 is used as the error detection And the output terminal OUT3 of the redundant output control module.

所述电平监测模块中NMOS管M1是大尺寸器件,该大尺寸器件宽长比为10;PMOS管M2是倒比管,该倒比管宽长比为1/10;NMOS管M1宽长比为PMOS管M2宽长比的100倍;PMOS管为M3大尺寸器件,该大尺寸器件宽长比为10;NMOS管M4是倒比管,该倒比管宽长比为1/20;PMOS管M3的宽长比为NMOS管M4宽长比的200倍。The NMOS transistor M1 in the level monitoring module is a large-scale device, and the width-to-length ratio of the large-size device is 10; the PMOS transistor M2 is an inverse ratio transistor, and the width-to-length ratio of the inverse ratio transistor is 1/10; the width and length of the NMOS transistor M1 is The ratio is 100 times the width-to-length ratio of the PMOS tube M2; the PMOS tube is a large-size device of M3, and the width-to-length ratio of the large-size device is 10; the NMOS tube M4 is an inverted tube, and the width-to-length ratio of the inverted tube is 1/20; The width-to-length ratio of the PMOS transistor M3 is 200 times that of the NMOS transistor M4.

本发明与现有技术相比的优点在于:The advantage of the present invention compared with prior art is:

(1)本发明采用出错检测及冗余输出控制模块对三个上电冗余模块的输出进行检测,把发生单粒子效应导致输出出错的上电冗余模块输出关闭,保证最终上电复位输出正确,同时把该子电路清零复位,使其回到正确状态,清除了单粒子翻转的累积,从而实现抗单粒子翻转效应和抗单粒子瞬态效应能力。(1) The present invention uses an error detection and redundant output control module to detect the output of three power-on redundant modules, and closes the output of the power-on redundant module that causes an output error due to a single event effect, so as to ensure the final power-on reset output Correct, at the same time, clear and reset the sub-circuit to make it return to the correct state, and clear the accumulation of single event upset, so as to realize the anti-single event upset effect and anti-single event transient effect ability.

(2)本发明采用4个PMOS管、3个NMOS管和两个电容实现了电平监测,与传统的电平监测相比,本发明使用的延时单元更少,使整体面积更小。(2) The present invention realizes level monitoring by using 4 PMOS transistors, 3 NMOS transistors and two capacitors. Compared with traditional level monitoring, the present invention uses fewer delay units and makes the overall area smaller.

(3)本发明采用带有复位输入端的延时去毛刺电路,在本上电冗余模块发生单粒子效应时,可以把出错检测及冗余输出控制模块的输出传导给内部存储单元状态监测模块。(3) The present invention adopts a time-delay deburring circuit with a reset input terminal, and when the single event effect occurs in the power-on redundant module, the output of the error detection and redundant output control module can be conducted to the internal storage unit state monitoring module .

(4)内部存储单元状态监测模块确保电平满足多种存储单元的需求,保证多种存储单元可以正确复位。(4) The internal storage unit state monitoring module ensures that the level meets the requirements of various storage units, and ensures that various storage units can be reset correctly.

(5)本发明采用带有复位输入端的数字辅助延时模块,在本上电冗余模块发生单粒子效应时,可以通过出错检测及冗余输出控制模块的输出复位数字辅助延时模块,清除已产生的单粒子翻转产生的影响,避免其累积。(5) the present invention adopts the digital auxiliary time-delay module that has the reset input end, when single event effect occurs in this power-on redundant module, can reset the digital auxiliary time-delay module by the output of error detection and redundant output control module, clear Effects of single event upsets that have occurred, avoiding their accumulation.

(6)本发明出错检测及冗余输出控制模块通过三个异或门和三个与门可检测出三路中的任意一路的错误,并通过输出切断该路的输出和对该路进行复位。(6) The error detection and redundant output control module of the present invention can detect the error of any one of the three paths through three XOR gates and three AND gates, and cut off the output of the path and reset the path through the output .

(7)本发明所述的电平监测模块中PMOS管M2是倒比管宽长比为1/10,NMOS管M4是倒比管其宽长比为1/20,使PMOS管M1和NMOS管M4的亚阈值区漏电很小,降低了整个模块的功耗;NMOS管M1宽长比为PMOS管M2的100倍,使当电源VCC大于NMOS管的开启阈值和PMOS管的开启阈值时,节点NOD1电压接近于NMOS管的开启阈值;PMOS管M3的宽长比是NMOS管M4宽长比的200倍,使电源VCC等于NMOS管的开启阈值与PMOS管的开启阈值之和时,节点NOD2电压可以瞬间被M3拉高至电源VCC的电压值。(7) In the level monitoring module of the present invention, the PMOS tube M2 is an inverse tube with a width-to-length ratio of 1/10, and the NMOS tube M4 is an inverse tube with a width-to-length ratio of 1/20, so that the PMOS tube M1 and the NMOS tube The leakage in the subthreshold region of the tube M4 is very small, which reduces the power consumption of the entire module; the width-to-length ratio of the NMOS tube M1 is 100 times that of the PMOS tube M2, so that when the power supply VCC is greater than the turn-on threshold of the NMOS tube and the turn-on threshold of the PMOS tube, The voltage of node NOD1 is close to the turn-on threshold of the NMOS transistor; the width-to-length ratio of the PMOS transistor M3 is 200 times the width-to-length ratio of the NMOS transistor M4, so that when the power supply VCC is equal to the sum of the turn-on threshold of the NMOS transistor and the turn-on threshold of the PMOS transistor, the node NOD2 The voltage can be instantly pulled up to the voltage value of the power supply VCC by M3.

附图说明Description of drawings

图1为本发明的上电复位电路整体框图;Fig. 1 is the overall block diagram of the power-on reset circuit of the present invention;

图2为本发明的电平监测模块电路图;Fig. 2 is a circuit diagram of the level monitoring module of the present invention;

图3为本发明的延时去毛刺电路图;Fig. 3 is the delay deburring circuit diagram of the present invention;

图4本发明的内部存储单元状态监测模块电路图;Fig. 4 internal storage unit state monitoring module circuit diagram of the present invention;

图5本发明的数字辅助延时模块电路图;Fig. 5 digital auxiliary delay module circuit diagram of the present invention;

图6本发明的出错检测及冗余输出控制模块电路图;Fig. 6 is the circuit diagram of error detection and redundant output control module of the present invention;

图7本发明的上电复位电路的单粒子实验结果与原有的上电复位电路的单粒子实验结果的对比图。FIG. 7 is a comparison diagram of the single event experimental results of the power-on reset circuit of the present invention and the original single event experimental results of the power-on reset circuit.

具体实施方式Detailed ways

本发明的基本思路为:一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,它内部包含电源VCC、三个相同的上电冗余模块、出错检测及冗余输出控制模块和三个可控输出缓冲器,出错检测及冗余输出控制模块可以检测出出错的上电冗余模块,并把上电冗余模块进行复位,清除单粒子效应的累积;出错检测及冗余输出控制模块可以控制可控输出缓冲器切断出错的上电冗余模块的输出,确保上电复位电路的输出正确。本上电复位电路清除了由单粒子翻转效应引起的错误累计现象,同时对模块输出进行控制,消除单粒子效应对输出的影响,实现显著的抗单粒子效应的能力。The basic idea of the present invention is: a single particle reinforced power-on reset circuit suitable for aerospace SRAM type FPGA, which internally includes a power supply VCC, three identical power-on redundant modules, error detection and redundant output control modules And three controllable output buffers, the error detection and redundant output control module can detect the faulty power-on redundant module, and reset the power-on redundant module to clear the accumulation of single event effects; error detection and redundancy The output control module can control the controllable output buffer to cut off the output of the faulty power-on redundant module, so as to ensure the correct output of the power-on reset circuit. The power-on reset circuit clears the error accumulation phenomenon caused by the single event reversal effect, and at the same time controls the output of the module, eliminates the influence of the single event effect on the output, and achieves a significant ability to resist the single event effect.

下面结合附图和具体实施例对本发明做进一步详细描述。The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

如图1所示,本发明提出一种适用于宇航用SRAM型FPGA的抗单粒子加固上电复位电路,其结构如图2所示,其特征在于包括:包括电源VCC、三个相同的上电冗余模块、出错检测及冗余输出控制模块和三个可控输出缓冲器;三个相同的上电冗余模块,分别为第一上电冗余模块、第二上电冗余模块、第三上电冗余模块;三个可控输出缓冲器分别为第一可控输出缓冲器、第二可控输出缓冲器、第三可控输出缓冲器;As shown in Figure 1, the present invention proposes an anti-single event hardened power-on reset circuit suitable for aerospace SRAM FPGAs, its structure is shown in Figure 2, and it is characterized in that it includes: a power supply VCC, three identical upper An electrical redundancy module, an error detection and redundant output control module, and three controllable output buffers; three identical electrical redundancy modules are respectively the first electrical redundancy module, the second electrical redundancy module, The third power-on redundant module; the three controllable output buffers are respectively the first controllable output buffer, the second controllable output buffer, and the third controllable output buffer;

每个上电冗余模块,包括电平监测模块、延时去毛刺电路、内部存储单元状态监测模块、数字辅助延时模块;Each power-on redundant module includes a level monitoring module, a delay deburring circuit, an internal storage unit status monitoring module, and a digital auxiliary delay module;

电源给电平监测模块供电,电平监测模块实时检测电源的电压值,当电源的电压值大于等于设定的上阈值电压Vthr时,电平监测模块输出一个高电平信号送至延时去毛刺电路,该高电平信号即结束复位信号,当电源的电压值低于设定的上阈值电压Vthr时,电平监测模块输出一个低电平信号送至延时去毛刺电路;The power supply supplies power to the level monitoring module, and the level monitoring module detects the voltage value of the power supply in real time. When the voltage value of the power supply is greater than or equal to the set upper threshold voltage Vthr, the level monitoring module outputs a high level signal and sends it to the delay In the glitch circuit, the high level signal ends the reset signal. When the voltage value of the power supply is lower than the set upper threshold voltage Vthr, the level monitoring module outputs a low level signal and sends it to the delay deburring circuit;

延时去毛刺电路,接收电平监测模块送来的高电平信号或低电平信号,判断出错检测及冗余输出控制模块反馈的为高电平信号时,同时当从电平监测模块接收的高电平信号或低电平信号的单个脉冲宽度小于等于设定的脉冲宽度时,将该单个脉冲作为毛刺滤除,得到平顺的高电平信号或平顺的低电平信号送至内部存储单元状态监测模块;判断出错检测及冗余输出控制模块反馈的为低电平信号时,当出错检测及冗余输出控制模块反馈的低电平信号中的脉冲小于等于设定的脉冲宽度时,将该单个脉冲作为毛刺滤除,得到平顺的低电平信号送至内部存储单元状态监测模块;The delay deburring circuit receives the high-level signal or low-level signal sent by the level monitoring module, and judges that when the feedback from the error detection and redundant output control module is a high-level signal, at the same time when it receives the high-level signal from the level monitoring module When the single pulse width of the high-level signal or low-level signal is less than or equal to the set pulse width, the single pulse is filtered out as a glitch, and a smooth high-level signal or a smooth low-level signal is sent to the internal storage Unit state monitoring module; when judging that the feedback from the error detection and redundant output control module is a low-level signal, when the pulse in the low-level signal fed back by the error detection and redundant output control module is less than or equal to the set pulse width, The single pulse is filtered out as a glitch, and the smooth low-level signal is sent to the internal storage unit status monitoring module;

内部存储单元状态监测模块,包括多个存储单元;An internal storage unit status monitoring module, including multiple storage units;

内部存储单元状态监测模块,当接收延时去毛刺电路送来的平顺的低电平信号,将内部存储单元状态监测模块中的多个存储单元锁定,即停止向该存储单元写入数据,同时向数字辅助延时模块输出高电平信号;内部存储单元状态监测模块,当接收延时去毛刺电路送来的平顺的高电平信号,向内部存储单元状态监测模块中的多个存储单元写入与存储单元中存储的值相反的值,然后将多个存储单元锁定,即停止向该存储单元写入数据,同时后向数字辅助延时模块输出低电平信号;The internal storage unit status monitoring module, when receiving the smooth low-level signal sent by the delay deburring circuit, locks multiple storage units in the internal storage unit status monitoring module, that is, stops writing data to the storage unit, and at the same time Output high-level signals to the digital auxiliary delay module; the internal storage unit status monitoring module, when receiving the smooth high-level signal sent by the delay deburring circuit, writes to multiple storage units in the internal storage unit status monitoring module Enter the value opposite to the value stored in the storage unit, and then lock multiple storage units, that is, stop writing data to the storage unit, and output a low level signal to the digital auxiliary delay module at the same time;

数字辅助延时模块包括多个寄存器和一个振荡器;The digital auxiliary delay module includes multiple registers and an oscillator;

数字辅助延时模块,接收内部存储单元状态监测模块送来的高电平信号或低电平信号,当从内部存储单元状态监测模块接收到高电平信号时且出错检测及冗余输出控制模块的反馈为高电平时,数字辅助延时模块中的多个寄存器处于锁定状态,即寄存器内存储的数值不变,输出低电平信号,即数字辅助延时模块的输出为低电平信号;The digital auxiliary delay module receives the high-level signal or low-level signal sent by the internal storage unit status monitoring module, and when the high-level signal is received from the internal storage unit status monitoring module, the error detection and redundant output control module When the feedback is high level, multiple registers in the digital auxiliary delay module are locked, that is, the value stored in the register remains unchanged, and a low level signal is output, that is, the output of the digital auxiliary delay module is a low level signal;

当从内部存储单元状态监测模块接收到高电平信号时且出错检测及冗余输出控制模块的反馈为低电平时,或当从内部存储单元状态监测模块接收到低电平信号时且出错检测及冗余输出控制模块的反馈为高电平时,或当从内部存储单元状态监测模块接收到低电平信号时且出错检测及冗余输出控制模块的反馈为低电平时,振荡器开始振荡输出时钟信号,每一次振荡后寄存器计数一次,当寄存器寄满后,输出高电平,即数字辅助延时模块的输出为高电平信号;When a high level signal is received from the internal storage unit status monitoring module and the feedback from the error detection and redundant output control module is low level, or when a low level signal is received from the internal storage unit status monitoring module and the error detection And when the feedback from the redundant output control module is high level, or when a low level signal is received from the internal storage unit status monitoring module and the feedback from the error detection and redundant output control module is low level, the oscillator starts to oscillate and output The clock signal, the register counts once after each oscillation, and when the register is full, it outputs a high level, that is, the output of the digital auxiliary delay module is a high level signal;

将第一上电冗余模块的输出记为POR_Good1信号、第二上电冗余模块POR_Good2信号、第三上电冗余模块POR_Good3信号;将第一上电冗余模块的输出记为POR_Good1信号、第二上电冗余模块POR_Good2信号、第三上电冗余模块POR_Good3信号均送至出错检测及冗余输出控制模块;将第一上电冗余模块的输出记为POR_Good1信号送至第一可控输出缓冲器;将第二上电冗余模块的输出记为POR_Good2信号送至第二可控输出缓冲器;将第三上电冗余模块的输出记为POR_Good3信号送至第三可控输出缓冲器;The output of the first power-on redundant module is recorded as POR_Good1 signal, the second power-on redundant module POR_Good2 signal, the third power-on redundant module POR_Good3 signal; the output of the first power-on redundant module is recorded as POR_Good1 signal, Both the POR_Good2 signal of the second power-on redundant module and the POR_Good3 signal of the third power-on redundant module are sent to the error detection and redundant output control module; the output of the first power-on redundant module is recorded as the POR_Good1 signal and sent to the first control output buffer; record the output of the second power-on redundant module as POR_Good2 signal and send it to the second controllable output buffer; record the output of the third power-on redundant module as POR_Good3 signal and send it to the third controllable output buffer;

出错检测及冗余输出控制模块有三个输入和三个输出,三个输出分别为OUT1、OUT2和OUT3,OUT1输出反馈至第一上电冗余模块的延时去毛刺电路、数字辅助延时模块并送至第一可控输出缓冲器,OUT2输出反馈至第二上电冗余模块的延时去毛刺电路、数字辅助延时模块并送至第二可控输出缓冲器,OUT3输出反馈至第三上电冗余模块的延时去毛刺电路、数字辅助延时模块并送至第三可控输出缓冲器;The error detection and redundant output control module has three inputs and three outputs, the three outputs are OUT1, OUT2 and OUT3, and the output of OUT1 is fed back to the delay deburring circuit of the first power-on redundant module and the digital auxiliary delay module And sent to the first controllable output buffer, the output of OUT2 is fed back to the delay and deburring circuit of the second power-on redundant module, and the digital auxiliary delay module is sent to the second controllable output buffer, and the output of OUT3 is fed back to the second The delay deburring circuit of the three-power-on redundant module and the digital auxiliary delay module are sent to the third controllable output buffer;

出错检测及冗余输出控制模块的三个输入分别将接收的POR_Good1信号、POR_Good2信号、POR_Good3信号进行比较,若POR_Good1信号、POR_Good2信号、POR_Good3信号均相同,则出错检测及冗余输出控制模块的三个输出OUT1、OUT2和OUT3均为高电平;若POR_Good1信号与POR_Good2信号和POR_Good3信号不同,则OUT1为低电平,OUT2和OUT3为高电平;若POR_Good2信号与POR_Good1信号和POR_Good3信号不同,则OUT2为低电平,OUT1和OUT3为高电平;若POR_Good3信号与POR_Good1信号和POR_Good2信号不同,则OUT3为低电平,OUT1和OUT2为高电平;The three inputs of the error detection and redundant output control module compare the received POR_Good1 signal, POR_Good2 signal, and POR_Good3 signal respectively. If the POR_Good1 signal, POR_Good2 signal, and POR_Good3 signal are all the same, the three inputs of the error detection and redundant output control module Each output OUT1, OUT2 and OUT3 are high level; if POR_Good1 signal is different from POR_Good2 signal and POR_Good3 signal, then OUT1 is low level, OUT2 and OUT3 are high level; if POR_Good2 signal is different from POR_Good1 signal and POR_Good3 signal, Then OUT2 is low level, OUT1 and OUT3 are high level; if the POR_Good3 signal is different from the POR_Good1 signal and POR_Good2 signal, then OUT3 is low level, and OUT1 and OUT2 are high level;

当第一可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为高电平时,将第一上电冗余模块的输出POR_Good1信号反相后输出;当第一可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为低电平时,第一可控输出缓冲器不输出信号;When the first controllable output buffer receives the output signal of the error detection and redundant output control module as a high level, it outputs the output POR_Good1 signal of the first power-on redundant module after inversion; when the first controllable The output buffer, when receiving the output signal of the error detection and redundant output control module is low level, the first controllable output buffer does not output the signal;

当第二可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为高电平时,将第二上电冗余模块的输出POR_Good2信号反相后输出;当第二可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为低电平时,第二可控输出缓冲器不输出信号;When the second controllable output buffer receives the output signal of the error detection and redundant output control module as a high level, it outputs the output POR_Good2 signal of the second power-on redundant module after inversion; when the second controllable The output buffer, when receiving the output signal of the error detection and redundant output control module is low level, the second controllable output buffer does not output the signal;

当第三可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为高电平时,将第三上电冗余模块的输出POR_Good3信号反相后输出;当第三可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为低电平时,第三可控输出缓冲器不输出信号。When the third controllable output buffer receives the output signal of the error detection and redundant output control module as a high level, it outputs the output POR_Good3 signal of the third power-on redundant module after inversion; when the third controllable The output buffer, when receiving the output signal of the error detection and redundant output control module is low level, the third controllable output buffer does not output the signal.

本发明采用出错检测及冗余输出控制模块对三个上电冗余模块的输出进行检测。当空间粒子撞击上电复位电路时,若空间粒子撞击在某个上电冗余模块的电平监测模块上,电平检测模块的输出将产生一个电流脉冲,这个电流脉冲传导到延时去毛刺电路时,这个电流脉冲将被延时去毛刺电路当做毛刺去除,不会继续传导到下一级;当空间粒子撞击在内部存储单元状态监测模块上或数字辅助延时模块内的存储单元或者寄存器时,都可能使这些存储单元或者寄存器翻转,最后上电冗余模块产生一个错误的输出,出错检测及冗余输出控制模块可以把该上电冗余模块检测出来,接着通过把发生单粒子效应导致输出出错的上电冗余模块输出关闭,保证最终上电复位输出正确,同时把该子电路清零复位,使其回到正确状态,清除了单粒子翻转的累积,从而实现抗单粒子翻转效应和抗单粒子瞬态效应能力。The invention adopts the error detection and redundant output control module to detect the output of three power-on redundant modules. When the space particle hits the power-on reset circuit, if the space particle hits the level monitoring module of a power-on redundant module, the output of the level detection module will generate a current pulse, and this current pulse is transmitted to the delay deburring When the circuit is connected, the current pulse will be removed by the delay deburring circuit as a burr, and will not continue to be transmitted to the next stage; when the space particles hit the internal storage unit status monitoring module or the storage unit or register in the digital auxiliary delay module These storage units or registers may be flipped over time, and finally the power-on redundant module generates an erroneous output. The error detection and redundant output control module can detect the power-on redundant module, and then pass the single-event effect The output of the power-on redundant module that causes an output error is turned off to ensure that the output of the final power-on reset is correct, and at the same time, the sub-circuit is cleared and reset to make it return to the correct state, clearing the accumulation of single event flips, so as to achieve anti-single event flips effects and immunity to single event transient effects.

本发明所述的电平监测模块如图2所示,包括:PMOS管M2、PMOS管M3、PMOS管M5、PMOS管M6、NMOS管M1、NMOS管M4、NMOS管M7、电容C1、电容C2、反相器;PMOS管M2的栅极接地,PMOS管M2的源极连接电源VCC,PMOS管M2的漏极同时连接NMOS管M1的栅极和漏极电容C1的一端、PMOS管M3的栅极;NMOS管M1的源极接地;电容C1的另一端接电源VCC,NMOS管M4的栅极连接电源VCC,PMOS管M3的源极连接电源VCC,PMOS管M3的漏极连接NMOS管M4的漏极、电容C2的一端、PMOS管M5的漏极、PMOS管M6的栅极、NMOS管M7的栅极;NMOS管M4的源极接地;电容C2的另一端接地;PMOS管M5的源极接电源VCC,PMOS管M5的栅极连接PMOS管M6的漏极和NMOS管M7的漏极、反相器的输入端;PMOS管M6的源极连接电源VCC;NMOS管M7的源极接地;反相器的输出端VCC_Good作为电平监测模块的输出。其只采用4个PMOS管、3个NMOS管和两个电容实现了电平监测,与传统的电平监测相比,本发明使用的延时单元更少,使整体面积更小。The level monitoring module of the present invention is shown in Figure 2, including: PMOS tube M2, PMOS tube M3, PMOS tube M5, PMOS tube M6, NMOS tube M1, NMOS tube M4, NMOS tube M7, capacitor C1, capacitor C2 , Inverter; the gate of the PMOS transistor M2 is grounded, the source of the PMOS transistor M2 is connected to the power supply VCC, the drain of the PMOS transistor M2 is simultaneously connected to the gate of the NMOS transistor M1 and one end of the drain capacitor C1, and the gate of the PMOS transistor M3 The source of the NMOS transistor M1 is grounded; the other end of the capacitor C1 is connected to the power supply VCC, the gate of the NMOS transistor M4 is connected to the power supply VCC, the source of the PMOS transistor M3 is connected to the power supply VCC, and the drain of the PMOS transistor M3 is connected to the NMOS transistor M4. The drain, one end of capacitor C2, the drain of PMOS transistor M5, the gate of PMOS transistor M6, the gate of NMOS transistor M7; the source of NMOS transistor M4 is grounded; the other end of capacitor C2 is grounded; the source of PMOS transistor M5 Connect to the power supply VCC, the gate of the PMOS transistor M5 is connected to the drain of the PMOS transistor M6 and the drain of the NMOS transistor M7, and the input terminal of the inverter; the source of the PMOS transistor M6 is connected to the power supply VCC; the source of the NMOS transistor M7 is grounded; The output terminal VCC_Good of the inverter is used as the output of the level monitoring module. It only uses 4 PMOS tubes, 3 NMOS tubes and two capacitors to realize the level monitoring. Compared with the traditional level monitoring, the present invention uses fewer delay units and makes the overall area smaller.

本发明所述的电平监测模块中NMOS管M1是大尺寸器件其宽长比为10,PMOS管M2是倒比管宽长比为1/10,NMOS管M1宽长比为PMOS管M2宽长比的100倍;PMOS管M3大尺寸器件其宽长比为10,NMOS管M4是倒比管其宽长比为1/20,PMOS管M3的宽长比为NMOS管M4宽长比的200倍。PMOS管M2和NMOS管M4是长远大于宽的倒比管,使PMOS管M2和NMOS管M4的亚阈值区漏电很小,降低了整个模块的功耗。同时电源VCC小于NMOS管的开启阈值和PMOS管的开启阈值时,电容C1使节点NOD1电压为电源VCC的电压值,电容C2使节点NOD2电压值为地;电源VCC大于NMOS管的开启阈值和PMOS管的开启阈值中的一个时,由于NMOS与PMOS不能同时导通,仅存在亚阈值区漏电,所以不会产生大电流;当电源VCC大于NMOS管的开启阈值和PMOS管的开启阈值时,且小于NMOS管的开启阈值与PMOS管的开启阈值之和时,由于NMOS管M1尺寸远大于PMOS管M2,所以NOD1电压接近于NMOS管的开启阈值;由于PMOS管M3栅源电压小于PMOS管的开启阈值,PMOS管M3截止,NMOS管M4使节点NOD2电压保持为地。最终电平监测模块输出VCC_Good为低电平;电源VCC等于NMOS管的开启阈值与PMOS管的开启阈值之和时节点NOD1电压近似为NMOS管的开启阈值,PMOS管M3栅源电压为PMOS管的开启阈值开始导通。由于PMOS管M3尺寸远大于NMOS管M4,节点NOD2电压瞬间被M3拉高至电源VCC的电压值,电平监测模块输出VCC_Good由低电平变为高电平;当电源VCC大于NMOS管的开启阈值与PMOS管的开启阈值之和时,节点NOD1电压始终为NMOS管的开启阈值,PMOS管M3常开,节点NOD2电压始终为电源VCC电压,电平监测模块输出VCC_Good为高电平。In the level monitoring module of the present invention, the NMOS tube M1 is a large-sized device with a width-to-length ratio of 10, and the PMOS tube M2 is an inverse ratio. The aspect ratio is 100 times; the width-to-length ratio of PMOS transistor M3 is 10 for large-scale devices, and the width-to-length ratio of NMOS transistor M4 is 1/20. 200 times. The PMOS transistor M2 and the NMOS transistor M4 are inverse ratio transistors whose length is longer than the width, so that the leakage in the subthreshold region of the PMOS transistor M2 and the NMOS transistor M4 is very small, reducing the power consumption of the entire module. At the same time, when the power supply VCC is less than the turn-on threshold of the NMOS transistor and the turn-on threshold of the PMOS transistor, the capacitor C1 makes the voltage of the node NOD1 the voltage value of the power supply VCC, and the capacitor C2 makes the voltage value of the node NOD2 the ground; the power supply VCC is greater than the turn-on threshold of the NMOS transistor and the PMOS transistor. When one of the turn-on thresholds of the transistor is used, since the NMOS and the PMOS cannot be turned on at the same time, there is only leakage in the sub-threshold region, so no large current will be generated; when the power supply VCC is greater than the turn-on threshold of the NMOS transistor and the turn-on threshold of the PMOS transistor, and When it is less than the sum of the turn-on threshold of the NMOS transistor and the turn-on threshold of the PMOS transistor, since the size of the NMOS transistor M1 is much larger than that of the PMOS transistor M2, the NOD1 voltage is close to the turn-on threshold of the NMOS transistor; since the gate-source voltage of the PMOS transistor M3 is smaller than the turn-on threshold of the PMOS transistor threshold, the PMOS transistor M3 is cut off, and the NMOS transistor M4 keeps the voltage of the node NOD2 at ground. The final level monitoring module output VCC_Good is low level; when the power supply VCC is equal to the sum of the turn-on threshold of the NMOS transistor and the turn-on threshold of the PMOS transistor, the voltage of node NOD1 is approximately the turn-on threshold of the NMOS transistor, and the gate-source voltage of the PMOS transistor M3 is the threshold of the PMOS transistor. The turn-on threshold initiates conduction. Since the size of PMOS transistor M3 is much larger than that of NMOS transistor M4, the voltage of node NOD2 is instantly pulled up to the voltage value of power supply VCC by M3, and the output VCC_Good of the level monitoring module changes from low level to high level; When the sum of the threshold and the turn-on threshold of the PMOS transistor, the node NOD1 voltage is always the turn-on threshold of the NMOS transistor, the PMOS transistor M3 is always on, the node NOD2 voltage is always the power supply VCC voltage, and the level monitoring module outputs VCC_Good as a high level.

本发明所述的延时去毛刺电路如图3所示,包括:与门AND31、反相器INV31、反相器INV32、反相器INV33、反相器INV34、电容C31、电容C32、电容C33和与非门NAND31;The delay deburring circuit of the present invention is shown in Figure 3, comprising: AND gate AND31, inverter INV31, inverter INV32, inverter INV33, inverter INV34, capacitor C31, capacitor C32, capacitor C33 And NAND gate NAND31;

与门AND31的一个输入端为VCC_Good连接电平监测模块的输出VCC_Good,另一个输入端为ER_RST连接出错检测及冗余输出控制模块的输出,其中第一上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT1、第二上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT2相连、第三上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT3;与门AND31的输出端连接反相器INV31的输入端,同时连接与非门NAND31的一个输入端和电容C31的一端;电容C31的另一端连接电源VCC;反相器INV31的输出端连接电容C32的一端的同时连接反相器INV32的输入端;电容C32的另一端接地;反相器INV32的输出端连接反相器INV33的输入端;反相器INV33的输出端连接反相器INV34的输入端;反相器INV34的输出端连接电容C33的一端的同时连接与非门NAND31的另一个输入端;电容C33的另一端连接到电源VCC;与非门NAND31的输出端Power_Good作为延时去毛刺电路的输出。One input terminal of the AND gate AND31 is VCC_Good connected to the output VCC_Good of the level monitoring module, and the other input terminal is connected to the output of the error detection and redundant output control module ER_RST, wherein the delay deburring circuit of the first power-on redundant module Connect the output OUT1 of the error detection and redundant output control module, the delay deburring circuit of the second power-on redundant module, connect the output OUT2 of the error detection and redundant output control module, and the delay of the third power-on redundant module The deburring circuit is connected to the output OUT3 of the error detection and redundant output control module; the output terminal of the AND gate AND31 is connected to the input terminal of the inverter INV31, and simultaneously connected to an input terminal of the NAND gate NAND31 and one end of the capacitor C31; the output terminal of the capacitor C31 The other end is connected to the power supply VCC; the output end of the inverter INV31 is connected to one end of the capacitor C32 and the input end of the inverter INV32; the other end of the capacitor C32 is grounded; the output end of the inverter INV32 is connected to the input of the inverter INV33 end; the output end of the inverter INV33 is connected to the input end of the inverter INV34; the output end of the inverter INV34 is connected to one end of the capacitor C33 while connecting the other input end of the NAND gate NAND31; the other end of the capacitor C33 is connected to Power supply VCC; the output terminal Power_Good of the NAND gate NAND31 is used as the output of the delay deburring circuit.

在本上电冗余模块未发生单粒子效应时,延时去毛刺电路的ER_RST输入端接收的出错检测及冗余输出控制模块的输出为高电平,当本上电冗余模块发生单粒子效应时,延时去毛刺电路的ER_RST输入端接收的出错检测及冗余输出控制模块的输出变为低电平,延时去毛刺电路把这个低电平信号传导到内部存储单元状态监测模块。When the power-on redundant module does not have a single event effect, the error detection received by the ER_RST input terminal of the delay deburring circuit and the output of the redundant output control module is high level, when the power-on redundant module has a single event When the effect occurs, the output of the error detection and redundant output control module received by the ER_RST input terminal of the delay deburring circuit becomes low level, and the delay deburring circuit transmits the low level signal to the internal storage unit status monitoring module.

本发明所述的内部存储单元状态监测模块如图4所示,包括:反相器INV41、反相器INV42、……、反相器INV4n、存储单元SRAM41、存储单元SRAM42、……、存储单元SRAM4n、NMOS管M41、NMOS管M42、NMOS管……、NMOS管M4n、或门OR4n;n为正整数,n大于等于3,具体数值可根据实际电路需要进行调整;The internal storage unit state monitoring module of the present invention is as shown in Figure 4, comprises: inverter INV41, inverter INV42, ..., inverter INV4n, storage unit SRAM41, storage unit SRAM42, ..., storage unit SRAM4n, NMOS tube M41, NMOS tube M42, NMOS tube..., NMOS tube M4n, OR gate OR4n; n is a positive integer, n is greater than or equal to 3, and the specific value can be adjusted according to the actual circuit needs;

反相器INV41的输入端连接到延时去毛刺电路的输出端Power_Good,同时连接到反相器INV42的输入端(反相器INV43到反相器INV4n-1的连接关系与反相器INV42相同)、反相器INV4n的输入端、存储单元SRAM41的R输入端、存储单元SRAM42的R输入端(存储单元SRAM43到存储单元SRAM4n-1的连接方式与存储单元SRAM42的相同)、存储单元SRAM4n的R输入端、NMOS管M41的栅极、NMOS管M42的栅极(NMOS管M43到NMOS管M4n-1的连接关系与NMOS管M42相同)、NMOS管M4n的栅极;反相器INV41的输出端连接到存储单元SRAM41的RN输入端;反相器INV42的输出端连接到存储单元SRAM42的RN输入端;反相器INV4n的输出端连接到存储单元SRAM4n的RN输入端;存储单元SRAM41的Z输出端连接到或门OR4n的第一输入端;存储单元SRAM41的ZN输出端连接到NMOS管M41的漏极;存储单元SRAM42的Z输出端连接到或门OR4n的第二输入端;存储单元SRAM42的ZN输出端连接到NMOS管M42的漏极;存储单元SRAM4n的Z输出端连接到或门OR4n的第n输入端;存储单元SRAM4n的ZN输出端连接到NMOS管M4n的漏极;NMOS管M41的源极接地;NMOS管M42的源极接地;NMOS管M4n的源极接地;或门OR4n的POR_Latch输出端连接到存储单元SRAM41的WL、存储单元SRAM42的WL输入端、存储单元SRAM4n的WL输入端,同时作为内部存储单元状态监测模块的输出。The input terminal of the inverter INV41 is connected to the output terminal Power_Good of the delay deburring circuit, and is simultaneously connected to the input terminal of the inverter INV42 (the connection relationship between the inverter INV43 and the inverter INV4n-1 is the same as that of the inverter INV42 ), the input terminal of the inverter INV4n, the R input terminal of the storage unit SRAM41, the R input terminal of the storage unit SRAM42 (the connection mode from the storage unit SRAM43 to the storage unit SRAM4n-1 is the same as that of the storage unit SRAM42), the storage unit SRAM4n R input terminal, gate of NMOS transistor M41, gate of NMOS transistor M42 (the connection relationship between NMOS transistor M43 and NMOS transistor M4n-1 is the same as that of NMOS transistor M42), gate of NMOS transistor M4n; output of inverter INV41 end is connected to the RN input end of the storage unit SRAM41; the output end of the inverter INV42 is connected to the RN input end of the storage unit SRAM42; the output end of the inverter INV4n is connected to the RN input end of the storage unit SRAM4n; the Z of the storage unit SRAM41 The output terminal is connected to the first input terminal of the OR gate OR4n; the ZN output terminal of the storage unit SRAM41 is connected to the drain of the NMOS transistor M41; the Z output terminal of the storage unit SRAM42 is connected to the second input terminal of the OR gate OR4n; the storage unit SRAM42 The ZN output terminal of the storage unit SRAM4n is connected to the drain of the NMOS transistor M42; the Z output terminal of the storage unit SRAM4n is connected to the nth input terminal of the OR gate OR4n; the ZN output terminal of the storage unit SRAM4n is connected to the drain of the NMOS transistor M4n; the NMOS transistor M41 The source of the NMOS transistor M42 is grounded; the source of the NMOS transistor M4n is grounded; the POR_Latch output of the OR gate OR4n is connected to the WL of the storage unit SRAM41, the WL input of the storage unit SRAM42, and the WL input of the storage unit SRAM4n Terminal, at the same time as the output of the internal storage unit status monitoring module.

Power_Good为高时,存储单元SRAM41、存储单元SRAM42(存储单元SRAM43到存储单元SRAM4n-1的状态变化与存储单元SRAM42相同)、存储单元SRAM4n处于写高电平的状态,或门OR4n的输入均为高电平,其输出POR_Latch为高。Power_Good从高变为低时,存储单元SRAM41、存储单元SRAM42、存储单元SRAM4n被写入低电平,写入完成后,或门OR4n的输入全部变为低电平,或门OR4n的输出POR_Latch变为低。通过存储单元SRAM41、存储单元SRAM42、存储单元SRAM4n的写入过程,确保了电源VCC的电压值处于这些类型的存储单元都是可以顺利写入的区间,保证多种存储单元都When Power_Good is high, the storage unit SRAM41, the storage unit SRAM42 (the state change from the storage unit SRAM43 to the storage unit SRAM4n-1 is the same as the storage unit SRAM42), the storage unit SRAM4n is in the state of writing high level, and the input of the OR gate OR4n is High level, its output POR_Latch is high. When Power_Good changes from high to low, the storage unit SRAM41, storage unit SRAM42, and storage unit SRAM4n are written into a low level. After the writing is completed, the inputs of the OR gate OR4n all change to a low level, and the output POR_Latch of the OR gate OR4n changes to is low. Through the writing process of the storage unit SRAM41, the storage unit SRAM42, and the storage unit SRAM4n, it is ensured that the voltage value of the power supply VCC is in the interval where these types of storage units can be written smoothly, and various storage units are guaranteed to be

本发明所述的数字辅助延时模块如图5所示,包括:与门AND51、振荡器OSC、寄存器FF51、寄存器FF52、寄存器FF53、寄存器FF54、寄存器FF55、寄存器FF56、寄存器FF57、寄存器FF58、寄存器FF59;The digital auxiliary delay module of the present invention is shown in Figure 5, comprising: AND gate AND51, oscillator OSC, register FF51, register FF52, register FF53, register FF54, register FF55, register FF56, register FF57, register FF58, Register FF59;

与门AND51的一个输入端为ER_RST连接出错检测及冗余输出控制模块的输出,其中第一上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT1、第二上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT2相连、第三上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT3;与门AND51的输出端连接寄存器寄存器FF51的R输入端,同时连接振荡器OSC的控制输入端;寄存器FF52的R输入端为POR_Latch,接受内部存储单元状态监测模块的输出POR_Latch,同时连接寄存器FF53的R输入端、寄存器FF54的R输入端、寄存器FF55的R输入端、寄存器FF56的R输入端、寄存器FF57的R输入端、寄存器FF58的R输入端、寄存器FF59的R输入端;振荡器OSC的输出端连接到寄存器FF51的时钟输入端;寄存器FF51的QN输出端连接寄存器FF51的D输入端;寄存器FF51的Q输出端连接寄存器FF52的时钟输入端;寄存器FF52的QN输出端连接寄存器FF52的D输入端;寄存器FF51的Q输出端连接寄存器FF53的时钟输入端;寄存器FF53的QN输出端连接寄存器FF53的D输入端;寄存器FF53的Q输出端连接寄存器FF54的时钟输入端;寄存器FF54的QN输出端连接寄存器FF54的D输入端;寄存器FF54的Q输出端连接寄存器FF55的时钟输入端;寄存器FF55的QN输出端连接寄存器FF55的D输入端;寄存器FF55的Q输出端连接寄存器FF56的时钟输入端;寄存器FF56的QN输出端连接寄存器FF56的D输入端;寄存器FF56的Q输出端连接寄存器FF57的时钟输入端;寄存器FF57的QN输出端连接寄存器FF57的D输入端;寄存器FF57的Q输出端连接寄存器FF58的时钟输入端;寄存器FF58的QN输出端连接寄存器FF58的D输入端;寄存器FF58的Q输出端连接寄存器FF59的时钟输入端;寄存器FF59的D输入端连接到电源VCC;寄存器FF59的Q输出端连接到与门AND51的另一个输入端的同时同时作为数字辅助延时模块的输出POR_Good。One input terminal of AND gate AND51 is the output of ER_RST connection error detection and redundant output control module, wherein the delay deburring circuit of the first power-on redundant module is connected with output OUT1 of the error detection and redundant output control module, the second The delay deburring circuit connection error detection of the power-on redundant module and the output OUT2 of the redundant output control module are connected, and the delay deburring circuit connection error detection of the third power-on redundant module is connected to the output OUT3 of the redundant output control module ; The output terminal of the AND gate AND51 is connected to the R input terminal of the register register FF51, and is connected to the control input terminal of the oscillator OSC at the same time; the R input terminal of the register FF52 is POR_Latch, which accepts the output POR_Latch of the internal storage unit status monitoring module, and is connected to the register FF53 at the same time The R input terminal of register FF54, the R input terminal of register FF55, the R input terminal of register FF56, the R input terminal of register FF57, the R input terminal of register FF58, the R input terminal of register FF59; the oscillator OSC The output terminal of register FF51 is connected to the clock input terminal of register FF51; the QN output terminal of register FF51 is connected to the D input terminal of register FF51; the Q output terminal of register FF51 is connected to the clock input terminal of register FF52; the QN output terminal of register FF52 is connected to the register FF52 D input; the Q output of register FF51 is connected to the clock input of register FF53; the QN output of register FF53 is connected to the D input of register FF53; the Q output of register FF53 is connected to the clock input of register FF54; the QN of register FF54 The output terminal is connected to the D input terminal of register FF54; the Q output terminal of register FF54 is connected to the clock input terminal of register FF55; the QN output terminal of register FF55 is connected to the D input terminal of register FF55; the Q output terminal of register FF55 is connected to the clock input terminal of register FF56 terminal; the QN output terminal of register FF56 is connected to the D input terminal of register FF56; the Q output terminal of register FF56 is connected to the clock input terminal of register FF57; the QN output terminal of register FF57 is connected to the D input terminal of register FF57; the Q output terminal of register FF57 Connect the clock input terminal of register FF58; the QN output terminal of register FF58 is connected to the D input terminal of register FF58; the Q output terminal of register FF58 is connected to the clock input terminal of register FF59; the D input terminal of register FF59 is connected to the power supply VCC; The Q output terminal is connected to the other input terminal of the AND gate AND51 and at the same time serves as the output POR_Good of the digital auxiliary delay module.

在本上电冗余模块未发生错误时,与门AND51的一个输入端为ER_RST连接出错检测及冗余输出控制模块的输出的值为高,与门AND51的输出与另一个输出端的POR_Good的值相同;内部存储单元状态监测模块的输出POR_Latch为高时,寄存器FF59的R输入端为高,寄存器FF59输出POR_Good为低,振荡器OSC振荡,寄存器FF51的R输入端为低可以正常计数,但寄存器FF52、寄存器FF53、寄存器FF54、寄存器FF55、寄存器FF56、寄存器FF57、寄存器FF58的R输入端都为高,处于清零状态;当内部存储单元状态监测模块的输出POR_Latch为低时,寄存器FF52、寄存器FF53、寄存器FF54、寄存器FF55、寄存器FF56、寄存器FF57、寄存器FF58的R输入端为低,处于正常可写入状态,随着振荡器OSC振荡,由寄存器FF51、寄存器FF52、寄存器FF53、寄存器FF54、寄存器FF55、寄存器FF56、寄存器FF57、寄存器FF58、寄存器FF59计数器开始计数,当计数器计满后,即寄存器FF59的输出POR_Good由低变为高,数字辅助延时模块的输出POR_Good由低变为高,POR_OUT信号将振荡器OSC关闭。When no error occurs in the power-on redundant module, one input terminal of the AND gate AND51 is connected to ER_RST and the value of the output of the redundant output control module is high, and the output of the AND gate AND51 and the value of POR_Good at the other output terminal The same; when the output POR_Latch of the internal storage unit status monitoring module is high, the R input terminal of register FF59 is high, the output POR_Good of register FF59 is low, the oscillator OSC oscillates, and the R input terminal of register FF51 is low to count normally, but the register The R input terminals of FF52, register FF53, register FF54, register FF55, register FF56, register FF57, and register FF58 are all high and are in the clearing state; when the output POR_Latch of the internal storage unit status monitoring module is low, the register FF52, register The R input terminals of FF53, register FF54, register FF55, register FF56, register FF57, and register FF58 are low and are in a normal writable state. With the oscillator OSC oscillating, the register FF51, register FF52, register FF53, register FF54, The register FF55, register FF56, register FF57, register FF58, and register FF59 counters start counting. When the counter is full, the output POR_Good of the register FF59 changes from low to high, and the output POR_Good of the digital auxiliary delay module changes from low to high. The POR_OUT signal turns off the oscillator OSC.

在本上电冗余模块发生单粒子效应产生错误输出时与门AND51的一个输入端为ER_RST连接出错检测及冗余输出控制模块的输出的值为低,AND51的值为低,振荡器OSC振荡,寄存器FF51的R输入端为低可以正常计数,寄存器FF52、寄存器FF53、寄存器FF54、寄存器FF55、寄存器FF56、寄存器FF57、寄存器FF58的R输入端为低,处于正常可写入状态,随着振荡器OSC振荡,由寄存器FF51、寄存器FF52、寄存器FF53、寄存器FF54、寄存器FF55、寄存器FF56、寄存器FF57、寄存器FF58、寄存器FF59计数器开始计数,当计数器计满后,即寄存器FF59的输出POR_Good由低变为高,数字辅助延时模块的输出POR_Good由低变为高,POR_OUT信号将振荡器OSC关闭。出错检测及冗余输出控制模块的输出把数字辅助延时模块进行了重置,使本上电冗余模块的输出重新变为高,清除已产生的单粒子翻转产生的影响,避免其累积。When a single event effect occurs in the power-on redundant module and an error output occurs, one input terminal of AND gate AND51 is connected to ER_RST for error detection and redundant output control. The output value of the module is low, the value of AND51 is low, and the oscillator OSC oscillates , the R input terminal of register FF51 is low and can count normally, the R input terminal of register FF52, register FF53, register FF54, register FF55, register FF56, register FF57, and register FF58 is low, and it is in a normal writable state. The register OSC oscillates, and the register FF51, register FF52, register FF53, register FF54, register FF55, register FF56, register FF57, register FF58, and register FF59 start counting. When the counter is full, the output POR_Good of register FF59 changes from low to low. is high, the output POR_Good of the digital auxiliary delay module changes from low to high, and the POR_OUT signal turns off the oscillator OSC. The output of the error detection and redundant output control module resets the digital auxiliary delay module, so that the output of the power-on redundant module becomes high again, and eliminates the influence of the generated single event reversal and avoids its accumulation.

本发明所述的出错检测及冗余输出控制模块如图6所示,包括:异或门XOR61、异或门XOR62、异或门XOR63、与非门NAND61、与非门NAND62、与非门NAND63;The error detection and redundant output control module of the present invention is shown in Figure 6, comprising: XOR gate XOR61, XOR gate XOR62, XOR gate XOR63, NAND gate NAND61, NAND gate NAND62, NAND gate NAND63 ;

异或门XOR61的一个输入端POR_Good1连接第一上电冗余模块的数字辅助延时模块的输出,同时连接异或门XOR62的一个输入端;异或门XOR62的另一个输入端POR_Good2连接第二上电冗余模块的数字辅助延时模块的输出,同时连接异或门XOR63的一个输入端;异或门XOR63的另一个输入端POR_Good3连接第三上电冗余模块的数字辅助延时模块的输出,同时连接异或门XOR61的另一个输入端;异或门XOR61的输出端连接与非门NAND61的一个输入端的同时连接与非门NAND63的一个输入端;异或门XOR62的输出端连接与非门NAND62的一个输入端的同时连接与非门NAND61的另一个输入端;异或门XOR63的输出端连接与非门NAND63的另一个输入端的同时连接与非门NAND62的另一个输入端;与非门NAND61的输出端作为出错检测及冗余输出控制模块的输出端OUT1;与非门NAND62的输出端作为出错检测及冗余输出控制模块的输出端OUT2;与非门NAND63的输出端作为出错检测及冗余输出控制模块的输出端OUT3。An input terminal POR_Good1 of the exclusive OR gate XOR61 is connected to the output of the digital auxiliary delay module of the first power-on redundant module, and is connected to an input terminal of the exclusive OR gate XOR62 at the same time; the other input terminal POR_Good2 of the exclusive OR gate XOR62 is connected to the second The output of the digital auxiliary delay module of the power-on redundant module is connected to an input terminal of the exclusive OR gate XOR63 at the same time; the other input terminal POR_Good3 of the exclusive OR gate XOR63 is connected to the digital auxiliary delay module of the third power-on redundant module Output, connect another input end of XOR gate XOR61 at the same time; The output end of XOR gate XOR61 connects an input end of NAND gate NAND61 and connects an input end of NAND gate NAND63 at the same time; The output end of XOR gate XOR62 connects and One input end of the NOT gate NAND62 is connected with the other input end of the NAND gate NAND61 simultaneously; The output end of the XOR gate XOR63 is connected with the other input end of the NAND gate NAND63 while connecting the other input end of the NAND gate NAND62; The output terminal of the gate NAND61 is used as the output terminal OUT1 of the error detection and redundant output control module; the output terminal of the NAND gate NAND62 is used as the output terminal OUT2 of the error detection and redundant output control module; the output terminal of the NAND gate NAND63 is used as the error detection And the output terminal OUT3 of the redundant output control module.

本发明所述的出错检测及冗余输出控制模块的真值表如下表1所示,从表中可以看出出错检测及冗余输出控制模块的三个输入分别将接收的POR_Good1信号、POR_Good2信号、POR_Good3信号进行比较,若POR_Good1信号、POR_Good2信号、POR_Good3信号均相同,则出错检测及冗余输出控制模块的三个输出OUT1、OUT2和OUT3均为高电平;若POR_Good1信号与POR_Good2信号和POR_Good3信号不同,则OUT1为低电平,OUT2和OUT3为高电平;若POR_Good2信号与POR_Good1信号和POR_Good3信号不同,则OUT2为低电平,OUT1和OUT3为高电平;若POR_Good3信号与POR_Good1信号和POR_Good2信号不同,则OUT3为低电平,OUT1和OUT2为高电平;出错检测及冗余输出控制模块通过三个异或门和三个与门可检测出三路中的任意一路的错误,通过该模块的输出连接到上电冗余模块,可以把上电冗余模块进行复位,清除单粒子效应的累积;连接到可控输出缓冲器可以切断该上电冗余模块的输出,避免错误的输出影响整个上电复位电路的输出。The truth table of the error detection and redundant output control module of the present invention is shown in the following table 1. From the table, it can be seen that the three inputs of the error detection and redundant output control module will receive the POR_Good1 signal and the POR_Good2 signal respectively. , POR_Good3 signal for comparison, if the POR_Good1 signal, POR_Good2 signal, POR_Good3 signal are the same, then the three outputs OUT1, OUT2 and OUT3 of the error detection and redundant output control module are high level; if the POR_Good1 signal and POR_Good2 signal and POR_Good3 If the signals are different, OUT1 is low level, and OUT2 and OUT3 are high level; if the POR_Good2 signal is different from the POR_Good1 signal and POR_Good3 signal, then OUT2 is low level, and OUT1 and OUT3 are high level; if the POR_Good3 signal is different from the POR_Good1 signal Different from the POR_Good2 signal, OUT3 is low level, OUT1 and OUT2 are high level; the error detection and redundant output control module can detect the error of any one of the three channels through three XOR gates and three AND gates , by connecting the output of the module to the power-on redundant module, the power-on redundant module can be reset to clear the accumulation of single event effects; the output of the power-on redundant module can be cut off by connecting to the controllable output buffer to avoid A wrong output affects the output of the entire power-on reset circuit.

表1 出错检测及冗余输出控制模块真值表Table 1 Truth table of error detection and redundant output control module

本发明的上电复位电路的单粒子实验结果与原有的上电复位电路的单粒子实验结果的对比如图7所示,图中的横坐标为LET,即线性能量传递;纵坐标为crosssection,即翻转截面;其中小黑方块代表加固前的上电复位电路的单粒子实验结果,粗的曲线为根据实验结果拟合出的weibull曲线,从曲线计算可得该上电复位电路的翻转阈值LETTH为3.07MeV.cm2/mg,饱和截面为2.13E-6cm2/device;其中小黑三角形代表本发明的上电复位电路的单粒子实验结果,因其在低LET值的情况下未发生单粒子错误,所以其在LET低于22MeV.cm2/mg时的翻转数为零,只有在22MeV.cm2/mg发生错误1次,在37MeV.cm2/mg发生错误2次,在79MeV.cm2/mg时发生错误1次,错误数太少,无法拟合weibull曲线,直接从错误数上可获得本发明的上电复位电路的翻转阈值LETTH为13MeV.cm2/mg与22MeV.cm2/mg之间,是原有电路的4.23至7.16倍,而其饱和截面为2E-7cm2/device,是原有的上电复位电路的10倍,加固效果显著。The comparison between the single particle experimental results of the power-on reset circuit of the present invention and the single particle experimental results of the original power-on reset circuit is shown in Figure 7, the abscissa in the figure is LET, that is, linear energy transfer; the ordinate is crosssection , that is, the flip section; the small black squares represent the single-particle experimental results of the power-on reset circuit before reinforcement, and the thick curve is the Weibull curve fitted according to the experimental results. From the curve calculation, the flip threshold of the power-on reset circuit can be obtained LETTH is 3.07MeV.cm2/mg, and the saturation cross section is 2.13E-6cm2/device; the small black triangle represents the single particle experiment result of the power-on reset circuit of the present invention, because no single particle occurs under the condition of low LET value Error, so the number of flips is zero when the LET is lower than 22MeV.cm2/mg, only 1 error occurs at 22MeV.cm2/mg, 2 errors occur at 37MeV.cm2/mg, and 79MeV.cm2/mg An error occurs once, and the number of errors is too small to fit the Weibull curve. The flipping threshold LETTH of the power-on reset circuit of the present invention can be obtained directly from the number of errors, which is between 13MeV.cm2/mg and 22MeV.cm2/mg, which is 4.23 to 7.16 times that of the original circuit, and its saturation cross section is 2E-7cm2/device, which is 10 times that of the original power-on reset circuit, and the reinforcement effect is remarkable.

综上所述,本发明通过出错检测及冗余输出控制模块把发生单粒子效应出错的上电冗余模块检测出来,通过把上电冗余模块进行复位,清除单粒子效应的累积;连接到可控输出缓冲器可以切断该上电冗余模块的输出,避免错误的输出影响整个上电复位电路的输出,从而获得了显著的单粒子效应加固效果。In summary, the present invention detects the power-on redundant module that has a single event effect error through the error detection and redundant output control module, and clears the accumulation of single event effect by resetting the power-on redundant module; The controllable output buffer can cut off the output of the power-on redundant module, so as to prevent the wrong output from affecting the output of the whole power-on reset circuit, thereby obtaining a remarkable reinforcement effect of single event effect.

Claims (7)

1.一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,其特征在于:包括电源VCC、三个相同的上电冗余模块、出错检测及冗余输出控制模块和三个可控输出缓冲器;三个相同的上电冗余模块,分别为第一上电冗余模块、第二上电冗余模块、第三上电冗余模块;三个可控输出缓冲器分别为第一可控输出缓冲器、第二可控输出缓冲器、第三可控输出缓冲器;1. A power-on reset circuit that is applicable to the single-particle reinforcement of SRAM type FPGA for aerospace, is characterized in that: comprise power supply VCC, three identical power-on redundant modules, error detection and redundant output control module and three Controllable output buffer; three identical power-on redundant modules, namely the first power-on redundant module, the second power-on redundant module, and the third power-on redundant module; the three controllable output buffers are respectively are the first controllable output buffer, the second controllable output buffer, and the third controllable output buffer; 每个上电冗余模块,包括电平监测模块、延时去毛刺电路、内部存储单元状态监测模块、数字辅助延时模块;Each power-on redundant module includes a level monitoring module, a delay deburring circuit, an internal storage unit status monitoring module, and a digital auxiliary delay module; 电源给电平监测模块供电,电平监测模块实时检测电源的电压值,当电源的电压值大于等于设定的上阈值电压Vthr时,电平监测模块输出一个高电平信号送至延时去毛刺电路,该高电平信号即结束复位信号,当电源的电压值低于设定的上阈值电压Vthr时,电平监测模块输出一个低电平信号送至延时去毛刺电路;The power supply supplies power to the level monitoring module, and the level monitoring module detects the voltage value of the power supply in real time. When the voltage value of the power supply is greater than or equal to the set upper threshold voltage Vthr, the level monitoring module outputs a high level signal and sends it to the delay In the glitch circuit, the high level signal ends the reset signal. When the voltage value of the power supply is lower than the set upper threshold voltage Vthr, the level monitoring module outputs a low level signal and sends it to the delay deburring circuit; 延时去毛刺电路,接收电平监测模块送来的高电平信号或低电平信号,判断出错检测及冗余输出控制模块反馈的为高电平信号时,同时当从电平监测模块接收的高电平信号或低电平信号的单个脉冲宽度小于等于设定的脉冲宽度时,将该单个脉冲作为毛刺滤除,得到平顺的高电平信号或平顺的低电平信号送至内部存储单元状态监测模块;判断出错检测及冗余输出控制模块反馈的为低电平信号时,当出错检测及冗余输出控制模块反馈的低电平信号中的脉冲小于等于设定的脉冲宽度时,将该单个脉冲作为毛刺滤除,得到平顺的低电平信号送至内部存储单元状态监测模块;The delay deburring circuit receives the high-level signal or low-level signal sent by the level monitoring module, and judges that when the feedback from the error detection and redundant output control module is a high-level signal, at the same time when it receives the high-level signal from the level monitoring module When the single pulse width of the high-level signal or low-level signal is less than or equal to the set pulse width, the single pulse is filtered out as a glitch, and a smooth high-level signal or a smooth low-level signal is sent to the internal storage Unit state monitoring module; when judging that the feedback from the error detection and redundant output control module is a low-level signal, when the pulse in the low-level signal fed back by the error detection and redundant output control module is less than or equal to the set pulse width, The single pulse is filtered out as a glitch, and the smooth low-level signal is sent to the internal storage unit status monitoring module; 内部存储单元状态监测模块,包括多个存储单元;An internal storage unit status monitoring module, including multiple storage units; 内部存储单元状态监测模块,当接收延时去毛刺电路送来的平顺的低电平信号,将内部存储单元状态监测模块中的多个存储单元锁定,即停止向该存储单元写入数据,同时向数字辅助延时模块输出高电平信号;内部存储单元状态监测模块,当接收延时去毛刺电路送来的平顺的高电平信号,向内部存储单元状态监测模块中的多个存储单元写入与存储单元中存储的值相反的值,然后将多个存储单元锁定,即停止向该存储单元写入数据,同时后向数字辅助延时模块输出低电平信号;The internal storage unit status monitoring module, when receiving the smooth low-level signal sent by the delay deburring circuit, locks multiple storage units in the internal storage unit status monitoring module, that is, stops writing data to the storage unit, and at the same time Output high-level signals to the digital auxiliary delay module; the internal storage unit status monitoring module, when receiving the smooth high-level signal sent by the delay deburring circuit, writes to multiple storage units in the internal storage unit status monitoring module Enter the value opposite to the value stored in the storage unit, and then lock multiple storage units, that is, stop writing data to the storage unit, and output a low level signal to the digital auxiliary delay module at the same time; 数字辅助延时模块包括多个寄存器和一个振荡器;The digital auxiliary delay module includes multiple registers and an oscillator; 数字辅助延时模块,接收内部存储单元状态监测模块送来的高电平信号或低电平信号,当从内部存储单元状态监测模块接收到高电平信号时且出错检测及冗余输出控制模块的反馈为高电平时,数字辅助延时模块中的多个寄存器处于锁定状态,即寄存器内存储的数值不变,输出低电平信号,即数字辅助延时模块的输出为低电平信号;The digital auxiliary delay module receives the high-level signal or low-level signal sent by the internal storage unit status monitoring module, and when the high-level signal is received from the internal storage unit status monitoring module, the error detection and redundant output control module When the feedback is high level, multiple registers in the digital auxiliary delay module are locked, that is, the value stored in the register remains unchanged, and a low level signal is output, that is, the output of the digital auxiliary delay module is a low level signal; 当从内部存储单元状态监测模块接收到高电平信号时且出错检测及冗余输出控制模块的反馈为低电平时,或当从内部存储单元状态监测模块接收到低电平信号时且出错检测及冗余输出控制模块的反馈为高电平时,或当从内部存储单元状态监测模块接收到低电平信号时且出错检测及冗余输出控制模块的反馈为低电平时,振荡器开始振荡输出时钟信号,每一次振荡后寄存器计数一次,当寄存器寄满后,输出高电平,即数字辅助延时模块的输出为高电平信号;When a high level signal is received from the internal storage unit status monitoring module and the feedback from the error detection and redundant output control module is low level, or when a low level signal is received from the internal storage unit status monitoring module and the error detection And when the feedback from the redundant output control module is high level, or when a low level signal is received from the internal storage unit status monitoring module and the feedback from the error detection and redundant output control module is low level, the oscillator starts to oscillate and output The clock signal, the register counts once after each oscillation, and when the register is full, it outputs a high level, that is, the output of the digital auxiliary delay module is a high level signal; 将第一上电冗余模块的输出记为POR_Good1信号、第二上电冗余模块POR_Good2信号、第三上电冗余模块POR_Good3信号;将第一上电冗余模块的输出记为POR_Good1信号、第二上电冗余模块POR_Good2信号、第三上电冗余模块POR_Good3信号均送至出错检测及冗余输出控制模块;将第一上电冗余模块的输出记为POR_Good1信号送至第一可控输出缓冲器;将第二上电冗余模块的输出记为POR_Good2信号送至第二可控输出缓冲器;将第三上电冗余模块的输出记为POR_Good3信号送至第三可控输出缓冲器;The output of the first power-on redundant module is recorded as POR_Good1 signal, the second power-on redundant module POR_Good2 signal, the third power-on redundant module POR_Good3 signal; the output of the first power-on redundant module is recorded as POR_Good1 signal, Both the POR_Good2 signal of the second power-on redundant module and the POR_Good3 signal of the third power-on redundant module are sent to the error detection and redundant output control module; the output of the first power-on redundant module is recorded as the POR_Good1 signal and sent to the first control output buffer; record the output of the second power-on redundant module as POR_Good2 signal and send it to the second controllable output buffer; record the output of the third power-on redundant module as POR_Good3 signal and send it to the third controllable output buffer; 出错检测及冗余输出控制模块有三个输入和三个输出,三个输出分别为OUT1、OUT2和OUT3,OUT1输出反馈至第一上电冗余模块的延时去毛刺电路、数字辅助延时模块并送至第一可控输出缓冲器,OUT2输出反馈至第二上电冗余模块的延时去毛刺电路、数字辅助延时模块并送至第二可控输出缓冲器,OUT3输出反馈至第三上电冗余模块的延时去毛刺电路、数字辅助延时模块并送至第三可控输出缓冲器;The error detection and redundant output control module has three inputs and three outputs, the three outputs are OUT1, OUT2 and OUT3, and the output of OUT1 is fed back to the delay deburring circuit of the first power-on redundant module and the digital auxiliary delay module And sent to the first controllable output buffer, the output of OUT2 is fed back to the delay and deburring circuit of the second power-on redundant module, and the digital auxiliary delay module is sent to the second controllable output buffer, and the output of OUT3 is fed back to the second The delay deburring circuit of the three-power-on redundant module and the digital auxiliary delay module are sent to the third controllable output buffer; 出错检测及冗余输出控制模块的三个输入分别将接收的POR_Good1信号、POR_Good2信号、POR_Good3信号进行比较,若POR_Good1信号、POR_Good2信号、POR_Good3信号均相同,则出错检测及冗余输出控制模块的三个输出OUT1、OUT2和OUT3均为高电平;若POR_Good1信号与POR_Good2信号和POR_Good3信号不同,则OUT1为低电平,OUT2和OUT3为高电平;若POR_Good2信号与POR_Good1信号和POR_Good3信号不同,则OUT2为低电平,OUT1和OUT3为高电平;若POR_Good3信号与POR_Good1信号和POR_Good2信号不同,则OUT3为低电平,OUT1和OUT2为高电平;The three inputs of the error detection and redundant output control module compare the received POR_Good1 signal, POR_Good2 signal, and POR_Good3 signal respectively. If the POR_Good1 signal, POR_Good2 signal, and POR_Good3 signal are all the same, the three inputs of the error detection and redundant output control module Each output OUT1, OUT2 and OUT3 are high level; if POR_Good1 signal is different from POR_Good2 signal and POR_Good3 signal, then OUT1 is low level, OUT2 and OUT3 are high level; if POR_Good2 signal is different from POR_Good1 signal and POR_Good3 signal, Then OUT2 is low level, OUT1 and OUT3 are high level; if the POR_Good3 signal is different from the POR_Good1 signal and POR_Good2 signal, then OUT3 is low level, and OUT1 and OUT2 are high level; 当第一可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为高电平时,将第一上电冗余模块的输出POR_Good1信号反相后输出;当第一可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为低电平时,第一可控输出缓冲器不输出信号;When the first controllable output buffer receives the output signal of the error detection and redundant output control module as a high level, it outputs the output POR_Good1 signal of the first power-on redundant module after inversion; when the first controllable The output buffer, when receiving the output signal of the error detection and redundant output control module is low level, the first controllable output buffer does not output the signal; 当第二可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为高电平时,将第二上电冗余模块的输出POR_Good2信号反相后输出;当第二可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为低电平时,第二可控输出缓冲器不输出信号;When the second controllable output buffer receives the output signal of the error detection and redundant output control module as a high level, it outputs the output POR_Good2 signal of the second power-on redundant module after inversion; when the second controllable The output buffer, when receiving the output signal of the error detection and redundant output control module is low level, the second controllable output buffer does not output the signal; 当第三可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为高电平时,将第三上电冗余模块的输出POR_Good3信号反相后输出;当第三可控输出缓冲器,在接收到出错检测及冗余输出控制模块的输出信号为低电平时,第三可控输出缓冲器不输出信号。When the third controllable output buffer receives the output signal of the error detection and redundant output control module as a high level, it outputs the output POR_Good3 signal of the third power-on redundant module after inversion; when the third controllable The output buffer, when receiving the output signal of the error detection and redundant output control module is low level, the third controllable output buffer does not output the signal. 2.根据权利要求1所述的一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,其特征在于:所述电平监测模块包括:PMOS管M2、PMOS管M3、PMOS管M5、NMOS管M1、NMOS管M4、NMOS管M7、电容C1、电容C2、反相器;2. A kind of power-on reset circuit suitable for single particle reinforcement of aerospace SRAM type FPGA according to claim 1, characterized in that: said level monitoring module comprises: PMOS transistor M2, PMOS transistor M3, PMOS transistor M5, NMOS tube M1, NMOS tube M4, NMOS tube M7, capacitor C1, capacitor C2, inverter; PMOS管M2的栅极接地,PMOS管M2的源极连接电源VCC,PMOS管M2的漏极同时连接NMOS管M1的栅极和漏极、电容C1的一端、PMOS管M3的栅极;NMOS管M1的源极接地;The gate of the PMOS transistor M2 is grounded, the source of the PMOS transistor M2 is connected to the power supply VCC, and the drain of the PMOS transistor M2 is simultaneously connected to the gate and drain of the NMOS transistor M1, one end of the capacitor C1, and the gate of the PMOS transistor M3; The source of M1 is grounded; 电容C1的另一端接电源VCC,NMOS管M4的栅极连接电源VCC,PMOS管M3的源极连接电源VCC,PMOS管M3的漏极连接NMOS管M4的漏极、电容C2的一端、PMOS管M5的漏极、PMOS管M6的栅极、NMOS管M7的栅极;NMOS管M4的源极接地;电容C2的另一端接地;PMOS管M5的源极接电源VCC,PMOS管M5的栅极连接PMOS管M6的漏极和NMOS管M7的漏极、反相器的输入端;PMOS管M6的源极连接电源VCC;NMOS管M7的源极接地;反相器的输出端VCC_Good作为电平监测模块的输出。The other end of the capacitor C1 is connected to the power supply VCC, the gate of the NMOS transistor M4 is connected to the power supply VCC, the source of the PMOS transistor M3 is connected to the power supply VCC, the drain of the PMOS transistor M3 is connected to the drain of the NMOS transistor M4, one end of the capacitor C2, and the PMOS transistor The drain of M5, the gate of PMOS transistor M6, and the gate of NMOS transistor M7; the source of NMOS transistor M4 is grounded; the other end of capacitor C2 is grounded; the source of PMOS transistor M5 is connected to the power supply VCC, and the gate of PMOS transistor M5 Connect the drain of the PMOS transistor M6 to the drain of the NMOS transistor M7 and the input terminal of the inverter; the source of the PMOS transistor M6 is connected to the power supply VCC; the source of the NMOS transistor M7 is grounded; the output terminal VCC_Good of the inverter is used as the level Monitor the output of the module. 3.根据权利要求1所述的一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,其特征在于:所述延时去毛刺电路包括:与门AND31、反相器INV31、反相器INV32、反相器INV33、反相器INV34、电容C31、电容C32、电容C33和与非门NAND31;3. A kind of power-on reset circuit suitable for single particle reinforcement of aerospace SRAM type FPGA according to claim 1, characterized in that: said delay deburring circuit comprises: AND gate AND31, inverter INV31, Inverter INV32, inverter INV33, inverter INV34, capacitor C31, capacitor C32, capacitor C33 and NAND gate NAND31; 与门AND31的一个输入端为VCC_Good连接电平监测模块的输出VCC_Good,另一个输入端为ER_RST连接出错检测及冗余输出控制模块的输出,其中第一上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT1、第二上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT2相连、第三上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT3;与门AND31的输出端连接反相器INV31的输入端,同时连接与非门NAND31的一个输入端和电容C31的一端;电容C31的另一端连接电源VCC;反相器INV31的输出端连接电容C32的一端的同时连接反相器INV32的输入端;电容C32的另一端接地;反相器INV32的输出端连接反相器INV33的输入端;反相器INV33的输出端连接反相器INV34的输入端;反相器INV34的输出端连接电容C33的一端的同时连接与非门NAND31的另一个输入端;电容C33的另一端连接到电源VCC;与非门NAND31的输出端Power_Good作为延时去毛刺电路的输出。One input terminal of the AND gate AND31 is VCC_Good connected to the output VCC_Good of the level monitoring module, and the other input terminal is connected to the output of the error detection and redundant output control module ER_RST, wherein the delay deburring circuit of the first power-on redundant module Connect the output OUT1 of the error detection and redundant output control module, the delay deburring circuit of the second power-on redundant module, connect the output OUT2 of the error detection and redundant output control module, and the delay of the third power-on redundant module The deburring circuit is connected to the output OUT3 of the error detection and redundant output control module; the output terminal of the AND gate AND31 is connected to the input terminal of the inverter INV31, and simultaneously connected to an input terminal of the NAND gate NAND31 and one end of the capacitor C31; the output terminal of the capacitor C31 The other end is connected to the power supply VCC; the output end of the inverter INV31 is connected to one end of the capacitor C32 and the input end of the inverter INV32; the other end of the capacitor C32 is grounded; the output end of the inverter INV32 is connected to the input of the inverter INV33 end; the output end of the inverter INV33 is connected to the input end of the inverter INV34; the output end of the inverter INV34 is connected to one end of the capacitor C33 while connecting the other input end of the NAND gate NAND31; the other end of the capacitor C33 is connected to Power supply VCC; the output terminal Power_Good of the NAND gate NAND31 is used as the output of the delay deburring circuit. 4.根据权利要求1所述的一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,其特征在于:所述内部存储单元状态监测模块包括:反相器INV41、反相器INV42、……、反相器INV4n、存储单元SRAM41、存储单元SRAM42、……、存储单元SRAM4n、NMOS管M41、NMOS管M42、……、NMOS管M4n、或门OR4n;4. A kind of power-on reset circuit suitable for single particle reinforcement of aerospace SRAM type FPGA according to claim 1, characterized in that: the internal storage unit state monitoring module includes: inverter INV41, inverter INV42, ..., inverter INV4n, storage unit SRAM41, storage unit SRAM42, ..., storage unit SRAM4n, NMOS transistor M41, NMOS transistor M42, ..., NMOS transistor M4n, or gate OR4n; 反相器INV41的输入端连接到延时去毛刺电路的输出端Power_Good,同时连接到反相器INV42的输入端、反相器INV4n的输入端、存储单元SRAM41的R输入端、存储单元SRAM42的R输入端、存储单元SRAM4n的R输入端、NMOS管M41的栅极、NMOS管M42的栅极、NMOS管M4n的栅极;反相器INV41的输出端连接到存储单元SRAM41的RN输入端;反相器INV42的输出端连接到存储单元SRAM42的RN输入端;反相器INV4n的输出端连接到存储单元SRAM4n的RN输入端;存储单元SRAM41的Z输出端连接到或门OR4n的第一输入端;存储单元SRAM41的ZN输出端连接到NMOS管M41的漏极;存储单元SRAM42的Z输出端连接到或门OR4n的第二输入端;存储单元SRAM42的ZN输出端连接到NMOS管M42的漏极;存储单元SRAM4n的Z输出端连接到或门OR4n的第n输入端;存储单元SRAM4n的ZN输出端连接到NMOS管M4n的漏极;NMOS管M41的源极接地;NMOS管M42的源极接地;NMOS管M4n的源极接地;或门OR4n的POR_Latch输出端连接到存储单元SRAM41的WL、存储单元SRAM42的WL输入端、存储单元SRAM4n的WL输入端,同时作为内部存储单元状态监测模块的输出。The input end of the inverter INV41 is connected to the output end Power_Good of the delay deburring circuit, and simultaneously connected to the input end of the inverter INV42, the input end of the inverter INV4n, the R input end of the storage unit SRAM41, and the R input end of the storage unit SRAM42. R input terminal, the R input terminal of the storage unit SRAM4n, the grid of the NMOS transistor M41, the grid of the NMOS transistor M42, and the grid of the NMOS transistor M4n; the output terminal of the inverter INV41 is connected to the RN input terminal of the storage unit SRAM41; The output end of the inverter INV42 is connected to the RN input end of the storage unit SRAM42; the output end of the inverter INV4n is connected to the RN input end of the storage unit SRAM4n; the Z output end of the storage unit SRAM41 is connected to the first input of the OR gate OR4n end; the ZN output end of the storage unit SRAM41 is connected to the drain of the NMOS transistor M41; the Z output end of the storage unit SRAM42 is connected to the second input end of the OR gate OR4n; the ZN output end of the storage unit SRAM42 is connected to the drain of the NMOS transistor M42 The Z output terminal of the storage unit SRAM4n is connected to the nth input terminal of the OR gate OR4n; the ZN output terminal of the storage unit SRAM4n is connected to the drain of the NMOS transistor M4n; the source of the NMOS transistor M41 is grounded; the source of the NMOS transistor M42 ground; the source of the NMOS tube M4n is grounded; the POR_Latch output of the OR gate OR4n is connected to the WL of the storage unit SRAM41, the WL input of the storage unit SRAM42, and the WL input of the storage unit SRAM4n, and at the same time as the internal storage unit status monitoring module output. 5.根据权利要求1所述的一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,其特征在于:所述数字辅助延时模块包括:与门AND51、振荡器OSC、寄存器FF51、寄存器FF52、寄存器FF53、寄存器FF54、寄存器FF55、寄存器FF56、寄存器FF57、寄存器FF58、寄存器FF59;5. A kind of power-on reset circuit suitable for single particle reinforcement of aerospace SRAM type FPGA according to claim 1, characterized in that: said digital auxiliary delay module comprises: AND gate AND51, oscillator OSC, register FF51, register FF52, register FF53, register FF54, register FF55, register FF56, register FF57, register FF58, register FF59; 与门AND51的一个输入端为ER_RST连接出错检测及冗余输出控制模块的输出,其中第一上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT1、第二上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT2相连、第三上电冗余模块的延时去毛刺电路连接出错检测及冗余输出控制模块的输出OUT3;与门AND51的输出端连接寄存器FF51的R输入端,同时连接振荡器OSC的控制输入端;寄存器FF52的R输入端为POR_Latch,接受内部存储单元状态监测模块的输出POR_Latch,同时连接寄存器FF53的R输入端、寄存器FF54的R输入端、寄存器FF55的R输入端、寄存器FF56的R输入端、寄存器FF57的R输入端、寄存器FF58的R输入端、寄存器FF59的R输入端;振荡器OSC的输出端连接到寄存器FF51的时钟输入端;寄存器FF51的QN输出端连接寄存器FF51的D输入端;寄存器FF51的Q输出端连接寄存器FF52的时钟输入端;寄存器FF52的QN输出端连接寄存器FF52的D输入端;寄存器FF51的Q输出端连接寄存器FF53的时钟输入端;寄存器FF53的QN输出端连接寄存器FF53的D输入端;寄存器FF53的Q输出端连接寄存器FF54的时钟输入端;寄存器FF54的QN输出端连接寄存器FF54的D输入端;寄存器FF54的Q输出端连接寄存器FF55的时钟输入端;寄存器FF55的QN输出端连接寄存器FF55的D输入端;寄存器FF55的Q输出端连接寄存器FF56的时钟输入端;寄存器FF56的QN输出端连接寄存器FF56的D输入端;寄存器FF56的Q输出端连接寄存器FF57的时钟输入端;寄存器FF57的QN输出端连接寄存器FF57的D输入端;寄存器FF57的Q输出端连接寄存器FF58的时钟输入端;寄存器FF58的QN输出端连接寄存器FF58的D输入端;寄存器FF58的Q输出端连接寄存器FF59的时钟输入端;寄存器FF59的D输入端连接到电源VCC;寄存器FF59的Q输出端连接到与门AND51的另一个输入端的同时作为数字辅助延时模块的输出POR_Good。One input terminal of AND gate AND51 is the output of ER_RST connection error detection and redundant output control module, wherein the delay deburring circuit of the first power-on redundant module is connected with output OUT1 of the error detection and redundant output control module, the second The delay deburring circuit connection error detection of the power-on redundant module and the output OUT2 of the redundant output control module are connected, and the delay deburring circuit connection error detection of the third power-on redundant module is connected to the output OUT3 of the redundant output control module ; The output terminal of the AND gate AND51 is connected to the R input terminal of the register FF51, and is connected to the control input terminal of the oscillator OSC at the same time; the R input terminal of the register FF52 is POR_Latch, which accepts the output POR_Latch of the internal storage unit status monitoring module, and is connected to the register FF53 at the same time R input terminal, R input terminal of register FF54, R input terminal of register FF55, R input terminal of register FF56, R input terminal of register FF57, R input terminal of register FF58, R input terminal of register FF59; oscillator OSC The output terminal is connected to the clock input terminal of register FF51; the QN output terminal of register FF51 is connected to the D input terminal of register FF51; the Q output terminal of register FF51 is connected to the clock input terminal of register FF52; the QN output terminal of register FF52 is connected to the D terminal of register FF52 Input terminal; the Q output terminal of register FF51 is connected to the clock input terminal of register FF53; the QN output terminal of register FF53 is connected to the D input terminal of register FF53; the Q output terminal of register FF53 is connected to the clock input terminal of register FF54; the QN output terminal of register FF54 The terminal is connected to the D input terminal of register FF54; the Q output terminal of register FF54 is connected to the clock input terminal of register FF55; the QN output terminal of register FF55 is connected to the D input terminal of register FF55; the Q output terminal of register FF55 is connected to the clock input terminal of register FF56 ; The QN output of register FF56 is connected to the D input of register FF56; the Q output of register FF56 is connected to the clock input of register FF57; the QN output of register FF57 is connected to the D input of register FF57; the Q output of register FF57 is connected to The clock input terminal of register FF58; the QN output terminal of register FF58 is connected to the D input terminal of register FF58; the Q output terminal of register FF58 is connected to the clock input terminal of register FF59; the D input terminal of register FF59 is connected to the power supply VCC; The output end is connected to the other input end of the AND gate AND51 and at the same time serves as the output POR_Good of the digital auxiliary delay module. 6.根据权利要求1所述的一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,其特征在于:所述出错检测及冗余输出控制模块包括:异或门XOR61、异或门XOR62、异或门XOR63、与非门NAND61、与非门NAND62、与非门NAND63;6. A kind of power-on reset circuit applicable to the single particle reinforcement of aerospace SRAM type FPGA according to claim 1, characterized in that: the error detection and redundant output control module comprises: exclusive OR gate XOR61, exclusive OR gate XOR62, XOR gate XOR63, NAND gate NAND61, NAND gate NAND62, NAND gate NAND63; 异或门XOR61的一个输入端POR_Good1连接第一上电冗余模块的数字辅助延时模块的输出,同时连接异或门XOR62的一个输入端;异或门XOR62的另一个输入端POR_Good2连接第二上电冗余模块的数字辅助延时模块的输出,同时连接异或门XOR63的一个输入端;异或门XOR63的另一个输入端POR_Good3连接第三上电冗余模块的数字辅助延时模块的输出,同时连接异或门XOR61的另一个输入端;异或门XOR61的输出端连接与非门NAND61的一个输入端的同时连接与非门NAND63的一个输入端;异或门XOR62的输出端连接与非门NAND62的一个输入端的同时连接与非门NAND61的另一个输入端;异或门XOR63的输出端连接与非门NAND63的另一个输入端的同时连接与非门NAND62的另一个输入端;与非门NAND61的输出端作为出错检测及冗余输出控制模块的输出端OUT1;与非门NAND62的输出端作为出错检测及冗余输出控制模块的输出端OUT2;与非门NAND63的输出端作为出错检测及冗余输出控制模块的输出端OUT3。An input terminal POR_Good1 of the exclusive OR gate XOR61 is connected to the output of the digital auxiliary delay module of the first power-on redundant module, and is connected to an input terminal of the exclusive OR gate XOR62 at the same time; the other input terminal POR_Good2 of the exclusive OR gate XOR62 is connected to the second The output of the digital auxiliary delay module of the power-on redundant module is connected to an input terminal of the exclusive OR gate XOR63 at the same time; the other input terminal POR_Good3 of the exclusive OR gate XOR63 is connected to the digital auxiliary delay module of the third power-on redundant module Output, connect another input end of XOR gate XOR61 at the same time; The output end of XOR gate XOR61 connects an input end of NAND gate NAND61 and connects an input end of NAND gate NAND63 at the same time; The output end of XOR gate XOR62 connects and One input end of the NOT gate NAND62 is connected with the other input end of the NAND gate NAND61 simultaneously; The output end of the XOR gate XOR63 is connected with the other input end of the NAND gate NAND63 while connecting the other input end of the NAND gate NAND62; The output terminal of the gate NAND61 is used as the output terminal OUT1 of the error detection and redundant output control module; the output terminal of the NAND gate NAND62 is used as the output terminal OUT2 of the error detection and redundant output control module; the output terminal of the NAND gate NAND63 is used as the error detection And the output terminal OUT3 of the redundant output control module. 7.根据权利要求2所述的一种适用于宇航用SRAM型FPGA的单粒子加固的上电复位电路,其特征在于:所述电平监测模块中NMOS管M1是大尺寸器件,该大尺寸器件宽长比为10;PMOS管M2是倒比管,该倒比管宽长比为1/10;NMOS管M1宽长比为PMOS管M2宽长比的100倍;PMOS管为M3大尺寸器件,该大尺寸器件宽长比为10;NMOS管M4是倒比管,该倒比管宽长比为1/20;PMOS管M3的宽长比为NMOS管M4宽长比的200倍。7. A kind of power-on reset circuit suitable for single particle reinforcement of aerospace SRAM type FPGA according to claim 2, characterized in that: the NMOS transistor M1 in the level monitoring module is a large-size device, and the large-size The width-to-length ratio of the device is 10; the PMOS tube M2 is an inverted tube, and the width-to-length ratio of the inverted tube is 1/10; the width-to-length ratio of the NMOS tube M1 is 100 times the width-to-length ratio of the PMOS tube M2; the PMOS tube is M3 in large size device, the large-size device has a width-to-length ratio of 10; the NMOS transistor M4 is an inverse ratio tube, and the inverse ratio tube has a width-to-length ratio of 1/20; the width-to-length ratio of the PMOS transistor M3 is 200 times the width-to-length ratio of the NMOS transistor M4.
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