CN105534540A - 用于制造检测器模块的传感器板的方法 - Google Patents
用于制造检测器模块的传感器板的方法 Download PDFInfo
- Publication number
- CN105534540A CN105534540A CN201510702634.6A CN201510702634A CN105534540A CN 105534540 A CN105534540 A CN 105534540A CN 201510702634 A CN201510702634 A CN 201510702634A CN 105534540 A CN105534540 A CN 105534540A
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- China
- Prior art keywords
- sensor
- reader unit
- sensor layer
- reader
- detector module
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- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 19
- 238000000034 method Methods 0.000 claims abstract description 38
- 238000005476 soldering Methods 0.000 claims description 25
- 238000010276 construction Methods 0.000 claims 2
- 230000004927 fusion Effects 0.000 claims 1
- 238000003466 welding Methods 0.000 description 10
- 229910000679 solder Inorganic materials 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 6
- 230000005855 radiation Effects 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000002156 mixing Methods 0.000 description 4
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 3
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- -1 cadmium zinc telluride selenide Chemical class 0.000 description 2
- 239000002800 charge carrier Substances 0.000 description 2
- 238000002591 computed tomography Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- PGAPATLGJSQQBU-UHFFFAOYSA-M thallium(i) bromide Chemical compound [Tl]Br PGAPATLGJSQQBU-UHFFFAOYSA-M 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 241000724291 Tobacco streak virus Species 0.000 description 1
- QDOSJNSYIUHXQG-UHFFFAOYSA-N [Mn].[Cd] Chemical compound [Mn].[Cd] QDOSJNSYIUHXQG-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000002059 diagnostic imaging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000011031 large-scale manufacturing process Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- YFDLHELOZYVNJE-UHFFFAOYSA-L mercury diiodide Chemical compound I[Hg]I YFDLHELOZYVNJE-UHFFFAOYSA-L 0.000 description 1
- QKEOZZYXWAIQFO-UHFFFAOYSA-M mercury(1+);iodide Chemical compound [Hg]I QKEOZZYXWAIQFO-UHFFFAOYSA-M 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/243—Modular detectors, e.g. arrays formed from self contained units
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Wire Bonding (AREA)
Abstract
Description
Claims (7)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102014221829.2 | 2014-10-27 | ||
| DE102014221829.2A DE102014221829B4 (de) | 2014-10-27 | 2014-10-27 | Verfahren zur Herstellung eines Sensorboards für ein Detektormodul und damit hergestelltes Detektormodul |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105534540A true CN105534540A (zh) | 2016-05-04 |
| CN105534540B CN105534540B (zh) | 2018-12-28 |
Family
ID=55698499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510702634.6A Active CN105534540B (zh) | 2014-10-27 | 2015-10-26 | 用于制造检测器模块的传感器板的方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US9810796B2 (zh) |
| CN (1) | CN105534540B (zh) |
| DE (1) | DE102014221829B4 (zh) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108020858A (zh) * | 2016-11-02 | 2018-05-11 | 西门子医疗有限公司 | 具有中间层的辐射检测器 |
| CN110058291A (zh) * | 2018-01-19 | 2019-07-26 | 西门子医疗有限公司 | 用于生产x射线探测器的组装方法、x射线探测器和x射线设备 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3355081B1 (en) * | 2017-01-27 | 2019-06-19 | Detection Technology Oy | Direct conversion compound semiconductor tile structure |
| EP3428692B1 (de) | 2017-07-10 | 2021-03-10 | Siemens Healthcare GmbH | Röntgendetektor mit zwischeneinheit und auswerteebene |
| DE102017217327B4 (de) | 2017-09-28 | 2021-04-22 | Siemens Healthcare Gmbh | Röntgendetektor aufweisend ein Trägerelement mit Schutzelement entlang der Seitenflächen |
| DE102018219577A1 (de) | 2018-11-15 | 2020-05-20 | Siemens Healthcare Gmbh | Röntgendetektor aufweisend eine Stapelanordnung |
| EP3663806A1 (de) | 2018-12-03 | 2020-06-10 | Siemens Healthcare GmbH | Photonendetektor, verfahren zur herstellung eines photonendetektors und röntgengerät |
| DE202020101726U1 (de) | 2020-03-31 | 2020-04-17 | Siemens Healthcare Gmbh | Vorrichtung zur Aufnahme eines Substrats und System zur Aufnahme einer Mehrzahl von Substraten |
| DE102022208591B3 (de) | 2022-08-18 | 2023-09-21 | Siemens Healthcare Gmbh | Positionierung von Sensoreinheiten mittels eines Positioniersubstrats und Detektormodul |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6510195B1 (en) * | 2001-07-18 | 2003-01-21 | Koninklijke Philips Electronics, N.V. | Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same |
| CN1654977A (zh) * | 2004-02-10 | 2005-08-17 | 西门子公司 | 用于x射线计算机层析摄影仪中的探测器模块和探测器 |
| CN1947660A (zh) * | 2005-10-14 | 2007-04-18 | 通用电气公司 | 用于多管芯背光照明二极管的模块组件 |
| US7223981B1 (en) * | 2002-12-04 | 2007-05-29 | Aguila Technologies Inc. | Gamma ray detector modules |
| CN101228631A (zh) * | 2005-06-02 | 2008-07-23 | 索尼株式会社 | 半导体图像传感器模块及其制造方法 |
| WO2011129133A1 (ja) * | 2010-04-15 | 2011-10-20 | 浜松ホトニクス株式会社 | 接続基板 |
| US20110309259A1 (en) * | 2010-06-21 | 2011-12-22 | Samsung Electronics Co., Ltd. | Large-scale X-ray detectors and methods of manufacturing the same |
| CN104025295A (zh) * | 2011-09-21 | 2014-09-03 | 科磊股份有限公司 | 用于高速图像获取的基于中介层的成像传感器及检验系统 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2689684B1 (fr) | 1992-04-01 | 1994-05-13 | Commissariat A Energie Atomique | Dispositif de micro-imagerie de rayonnements ionisants. |
| US8120683B1 (en) * | 1999-04-08 | 2012-02-21 | Nova R & D, Inc. | High resoultion digital imaging apparatus |
| US7439516B2 (en) * | 2004-10-01 | 2008-10-21 | General Electric Company | Module assembly for multiple die back-illuminated diode |
| TWI429066B (zh) * | 2005-06-02 | 2014-03-01 | Sony Corp | Semiconductor image sensor module and manufacturing method thereof |
| EP2665096B1 (en) | 2012-05-15 | 2020-04-22 | ams AG | A method of wafer-scale integration of semiconductor devices and semiconductor device |
-
2014
- 2014-10-27 DE DE102014221829.2A patent/DE102014221829B4/de active Active
-
2015
- 2015-10-15 US US14/883,751 patent/US9810796B2/en active Active
- 2015-10-26 CN CN201510702634.6A patent/CN105534540B/zh active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6510195B1 (en) * | 2001-07-18 | 2003-01-21 | Koninklijke Philips Electronics, N.V. | Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same |
| US7223981B1 (en) * | 2002-12-04 | 2007-05-29 | Aguila Technologies Inc. | Gamma ray detector modules |
| CN1654977A (zh) * | 2004-02-10 | 2005-08-17 | 西门子公司 | 用于x射线计算机层析摄影仪中的探测器模块和探测器 |
| CN101228631A (zh) * | 2005-06-02 | 2008-07-23 | 索尼株式会社 | 半导体图像传感器模块及其制造方法 |
| CN1947660A (zh) * | 2005-10-14 | 2007-04-18 | 通用电气公司 | 用于多管芯背光照明二极管的模块组件 |
| WO2011129133A1 (ja) * | 2010-04-15 | 2011-10-20 | 浜松ホトニクス株式会社 | 接続基板 |
| US20110309259A1 (en) * | 2010-06-21 | 2011-12-22 | Samsung Electronics Co., Ltd. | Large-scale X-ray detectors and methods of manufacturing the same |
| CN104025295A (zh) * | 2011-09-21 | 2014-09-03 | 科磊股份有限公司 | 用于高速图像获取的基于中介层的成像传感器及检验系统 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108020858A (zh) * | 2016-11-02 | 2018-05-11 | 西门子医疗有限公司 | 具有中间层的辐射检测器 |
| US10866328B2 (en) | 2016-11-02 | 2020-12-15 | Siemens Healthcare Gmbh | Radiation detector with an intermediate layer |
| CN110058291A (zh) * | 2018-01-19 | 2019-07-26 | 西门子医疗有限公司 | 用于生产x射线探测器的组装方法、x射线探测器和x射线设备 |
| CN110058291B (zh) * | 2018-01-19 | 2023-11-28 | 西门子医疗有限公司 | 用于生产x射线探测器的组装方法、x射线探测器和x射线设备 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE102014221829B4 (de) | 2018-02-22 |
| US20160116610A1 (en) | 2016-04-28 |
| DE102014221829A1 (de) | 2016-04-28 |
| CN105534540B (zh) | 2018-12-28 |
| US9810796B2 (en) | 2017-11-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20220207 Address after: Erlangen Patentee after: Siemens Healthineers AG Address before: Munich Patentee before: SIEMENS AG |
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| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20240830 Address after: German Phu F Haim Patentee after: Siemens Medical AG Country or region after: Germany Address before: Erlangen Patentee before: Siemens Healthineers AG Country or region before: Germany |