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CN104636771A - Non-contact module testing circuit and method - Google Patents

Non-contact module testing circuit and method Download PDF

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Publication number
CN104636771A
CN104636771A CN201310561914.0A CN201310561914A CN104636771A CN 104636771 A CN104636771 A CN 104636771A CN 201310561914 A CN201310561914 A CN 201310561914A CN 104636771 A CN104636771 A CN 104636771A
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CN
China
Prior art keywords
contact modular
card reader
terminal
contact
card
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201310561914.0A
Other languages
Chinese (zh)
Inventor
曹伟
孙雪芳
金玮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Huahong Integrated Circuit Co Ltd
Original Assignee
Shanghai Huahong Integrated Circuit Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Huahong Integrated Circuit Co Ltd filed Critical Shanghai Huahong Integrated Circuit Co Ltd
Priority to CN201310561914.0A priority Critical patent/CN104636771A/en
Publication of CN104636771A publication Critical patent/CN104636771A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a non-contact module testing circuit which comprises a PC (personal computer) terminal, a server and a Decard D8 card reader. The PC terminal is sued for compiling software to drive the D8 card reader to send out instructions for testing serial numbers; the server is used for storing a serial number database for non-contact products; the D8 card reader is internally provided with an antenna and a decoding chip, two ends of the antenna are connected with PAD of a non-contact module, and the decoding chip is used for decoding the instructions for testing the serial numbers on the PC terminal and being coupled to the non-contact module through the antenna; testing return values, namely the serial numbers of the non-contact module are demodulated and transmitted to the PC terminal; the PC terminal compares the returned serial numbers from the non-contact module with the serial number database in the server, if the serial numbers are matched with the serial number database, then the non-contact module conforms to requirements. The invention further discloses a non-contact module testing method. The serial numbers of the non-contact module can be tested, so that consistency of the serial numbers can be guaranteed.

Description

The test circuit of non-contact modular and method
Technical field
The present invention relates to non-contact modular field tests, particularly relate to a kind of test circuit of non-contact modular.The invention still further relates to a kind of method of testing of non-contact modular.
Background technology
RFID(radio-frequency (RF) identification) technology utilizes radiofrequency signal realize non-contact information transmission by Space Coupling and pass through the technology that transmitted information reaches identifying purpose, is automatic identification technology in the embody rule of radio microware technical elements and development.
From the viewpoint of embody rule, RFID technique has obvious advantage in the following aspects:
One is that RFID uses radio-frequency technique to carry out remote, contactless read-write.
Two is that it is not subject to the impact of external environment, under general rugged surroundings are as dust, moist environment, still can keep its serviceability.
Three is storage and the amendment that can carry out information.
Four is can Reusability, and data storage can preserve 10 years, and repetitive read-write is greater than 100,000 times.
RFID itself have safety, accurately, fast, the fundamental such as low consumption, provide desirable information carrier, by read write line, people can be told inquisitive information under minimum manual intervention.
At present, during the test non-contact modular of industry inherence, the simple functions of equal test response and so on, and often have ignored the sequence number distinguishing non-contact modular uniqueness.When some non-contact modular adds industrial and commercial use testing of equipment non-contact modular sequence number, just simple test, does not do relevant process to sequence number yet.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of test circuit of non-contact modular, can test non-contact modular sequence number, ensures the consistance of sequence number; For this reason, the present invention also will provide a kind of method of testing of non-contact modular.
For solving the problems of the technologies described above, the test circuit of non-contact modular of the present invention, comprising:
One PC(PC) terminal, the instruction of cycle tests number is sent for writing software-driven D8 card reader;
One server, for preserving the serial number data storehouse of noncontact product;
One moral card D8 card reader, has a built-in aerial and decoding chip, the two ends of this built-in aerial and the PAD(input/output port of tested non-contact modular) be connected; For the instruction of the cycle tests number of described PC terminal of decoding, and according to agreement by described antenna-coupled to non-contact modular; The test rreturn value of demodulation non-contact modular and sequence number are also sent to described PC terminal;
In the sequence number that non-contact modular returns by described PC terminal and server, compare in serial number data storehouse, if coupling, then this non-contact modular meets the requirements, otherwise then searches reason, and does respective feedback.
The method of testing of non-contact modular of the present invention adopts following technical scheme to realize, and a built-in antenna in moral card D8 card reader also arranges a demodulation chip; Be connected with tested non-contact modular PAD by connecting line at the two ends end to end of described antenna, the power that antenna produces put on non-contact modular, makes non-contact modular obtain corresponding power; Write the instruction that software-driven moral card D8 card reader sends cycle tests number, tested non-contact modular returns sequence number to moral card D8 card reader, the sequence number storehouse that moral card D8 card reader obtains the noncontact product stored in sequence number and a server is compared, if coupling, then this non-contact modular meets the requirements, otherwise then search reason, and do respective feedback, ensure the consistance of sequence number.
In view of the equipment that moral card D8 card reader is test card general, ripe on the market, software service is fairly perfect, can be used for testing non-contact modular by improving.The present invention is on the intact basis of non-contact modular electrical property, can ensure that the sequence number of non-contact modular comes from the server of oneself company, the non-contact modular chip of the business that guarantees supply processing meets the requirement of oneself company, effectively can distinguish source and the uniqueness of non-contact modular.
Accompanying drawing explanation
Below in conjunction with accompanying drawing and embodiment, the present invention is further detailed explanation:
Accompanying drawing is the test circuit one embodiment theory diagram of described non-contact modular.
Embodiment
Shown in accompanying drawing, the test circuit of described non-contact modular in the embodiment shown in the figures, comprises a PC terminal, a server and a moral card D8 card reader.
Need to do corresponding improvement to moral card D8 card reader, a built-in antenna (not shown) in this moral card D8 card reader also arranges a demodulation chip (not shown), at antenna two ends end to end, select certain method, be connected with tested non-contact modular PAD by connecting line, the power that such antenna produces puts on non-contact modular, makes non-contact modular obtain corresponding power.
Send the instruction of cycle tests number at described PC terminal composes software, moral card D8 card reader is decoded the instruction of these cycle testss number, and according to ISO/IEC14443 agreement by described antenna-coupled to tested moral non-contact modular.Described non-contact modular can return test result and sequence number according to the instruction of cycle tests number, and the sequence number that card reader demodulation non-contact modular returns also is sent to PC terminal.Showing to compare in the serial number data storehouse of the noncontact product preserved in the sequence number that non-contact modular returns by PC and server, if coupling, then illustrates that this non-contact modular meets oneself companies ask, otherwise then will search reason, and do corresponding feedback.
Above by embodiment to invention has been detailed description, but these are not construed as limiting the invention.Without departing from the principles of the present invention, those skilled in the art also can make many distortion and improvement, and these also should be considered as protection scope of the present invention.

Claims (2)

1. a test circuit for non-contact modular, is characterized in that, comprising:
One PC terminal, sends the instruction of cycle tests number for writing software-driven D8 card reader;
One server, for preserving the serial number data storehouse of noncontact product;
One moral card D8 card reader, have a built-in aerial and decoding chip, the two ends of this built-in aerial are connected with the input/output port PAD of tested non-contact modular; For the instruction of the cycle tests number of described PC terminal of decoding, and according to agreement by described antenna-coupled to non-contact modular; The test rreturn value of demodulation non-contact modular and sequence number are also sent to described PC terminal;
In the sequence number that non-contact modular returns by described PC terminal and server, compare in serial number data storehouse, if coupling, then this non-contact modular meets the requirements, otherwise then searches reason, and does respective feedback.
2. a method of testing for non-contact modular, is very characterised in that: a built-in antenna in moral card D8 card reader also arranges a demodulation chip; Be connected with tested non-contact modular input/output port PAD by connecting line at the two ends end to end of described antenna, the power that antenna produces put on non-contact modular, makes non-contact modular obtain corresponding power; Write the instruction that software-driven moral card D8 card reader sends cycle tests number, tested non-contact modular returns sequence number to moral card D8 card reader, the sequence number storehouse that moral card D8 card reader obtains the noncontact product stored in sequence number and a server is compared, if coupling, then this non-contact modular meets the requirements, otherwise then search reason, and do respective feedback, ensure the consistance of sequence number.
CN201310561914.0A 2013-11-12 2013-11-12 Non-contact module testing circuit and method Pending CN104636771A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310561914.0A CN104636771A (en) 2013-11-12 2013-11-12 Non-contact module testing circuit and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310561914.0A CN104636771A (en) 2013-11-12 2013-11-12 Non-contact module testing circuit and method

Publications (1)

Publication Number Publication Date
CN104636771A true CN104636771A (en) 2015-05-20

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310561914.0A Pending CN104636771A (en) 2013-11-12 2013-11-12 Non-contact module testing circuit and method

Country Status (1)

Country Link
CN (1) CN104636771A (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1524250A (en) * 2001-05-04 2004-08-25 Smart Card Access Control System
CN1987903A (en) * 2005-12-19 2007-06-27 清华大学 Non-contact paper base electronic passenger ticket based on electronic label technology
CN101305381A (en) * 2004-07-15 2008-11-12 万事达卡国际股份有限公司 Payment card signal characterization methods and circuits
CN102737259A (en) * 2011-04-13 2012-10-17 白向阳 Identity authentication apparatus of culture-independent microorganism detection chip
CN103116530A (en) * 2013-01-23 2013-05-22 同致电子科技(昆山)有限公司 Mistake-proofing system of emitter factory code serial numbers
CN103366203A (en) * 2013-07-08 2013-10-23 无锡博凌激光技术有限公司 Intelligent card chip detection system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1524250A (en) * 2001-05-04 2004-08-25 Smart Card Access Control System
CN101305381A (en) * 2004-07-15 2008-11-12 万事达卡国际股份有限公司 Payment card signal characterization methods and circuits
CN1987903A (en) * 2005-12-19 2007-06-27 清华大学 Non-contact paper base electronic passenger ticket based on electronic label technology
CN102737259A (en) * 2011-04-13 2012-10-17 白向阳 Identity authentication apparatus of culture-independent microorganism detection chip
CN103116530A (en) * 2013-01-23 2013-05-22 同致电子科技(昆山)有限公司 Mistake-proofing system of emitter factory code serial numbers
CN103366203A (en) * 2013-07-08 2013-10-23 无锡博凌激光技术有限公司 Intelligent card chip detection system

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Application publication date: 20150520

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