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CA2529942A1 - Systemes et procedes de mesures de phases - Google Patents

Systemes et procedes de mesures de phases Download PDF

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Publication number
CA2529942A1
CA2529942A1 CA002529942A CA2529942A CA2529942A1 CA 2529942 A1 CA2529942 A1 CA 2529942A1 CA 002529942 A CA002529942 A CA 002529942A CA 2529942 A CA2529942 A CA 2529942A CA 2529942 A1 CA2529942 A1 CA 2529942A1
Authority
CA
Canada
Prior art keywords
phase
sample
light
signal
interferometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002529942A
Other languages
English (en)
Inventor
Christopher M. Fang-Yen
Gabriel Popescu
Changhuei Yang
Adam P. Wax
Ramachandra R. Dasari
Michael S. Feld
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Massachusetts Institute of Technology
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/823,389 external-priority patent/US7365858B2/en
Application filed by Individual filed Critical Individual
Publication of CA2529942A1 publication Critical patent/CA2529942A1/fr
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/0209Low-coherence interferometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02001Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007Two or more frequencies or sources used for interferometric measurement

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
CA002529942A 2003-06-19 2004-06-18 Systemes et procedes de mesures de phases Abandoned CA2529942A1 (fr)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US47973203P 2003-06-19 2003-06-19
US60/479,732 2003-06-19
US10/823,389 US7365858B2 (en) 2001-12-18 2004-04-13 Systems and methods for phase measurements
US10/823,389 2004-04-13
PCT/US2004/019456 WO2005001445A2 (fr) 2001-12-18 2004-06-18 Systemes et procedes de mesures de phases

Publications (1)

Publication Number Publication Date
CA2529942A1 true CA2529942A1 (fr) 2005-01-06

Family

ID=35874879

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002529942A Abandoned CA2529942A1 (fr) 2003-06-19 2004-06-18 Systemes et procedes de mesures de phases

Country Status (3)

Country Link
EP (1) EP1644720A2 (fr)
JP (2) JP5416883B2 (fr)
CA (1) CA2529942A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113706509A (zh) * 2021-08-30 2021-11-26 常州工利精机科技有限公司 一种可用于冲压件表面微缺陷成像的检测方法
CN114785650A (zh) * 2022-05-10 2022-07-22 北京邮电大学 一种新型盲相位搜索算法结构及实现方法
CN116337134A (zh) * 2023-01-03 2023-06-27 镭脉工业科技(上海)有限公司 一种激光监控仪器的使用方法

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JP4898639B2 (ja) 2007-11-22 2012-03-21 キヤノン株式会社 絶対位置の計測装置及び計測方法
US8599383B2 (en) 2009-05-06 2013-12-03 The Regents Of The University Of California Optical cytometry
JP5775069B2 (ja) * 2010-04-23 2015-09-09 浜松ホトニクス株式会社 細胞観察装置および細胞観察方法
WO2011132586A1 (fr) * 2010-04-23 2011-10-27 浜松ホトニクス株式会社 Procédé et appareil pour l'observation de cellules
WO2013019984A1 (fr) * 2011-08-02 2013-02-07 The Regents Of The University Of California Mesures rapides massivement parallèles de réponse à un médicament unicellulaire via l'interférométrie de cellules vivantes
JP6227337B2 (ja) * 2013-01-24 2017-11-08 株式会社日立エルジーデータストレージ 光計測装置
EP3004373B1 (fr) 2013-05-24 2018-03-14 The Regents of The University of California Identification de lymphocytes t désirables au moyen de réactions à modification de masse
US9316536B2 (en) 2013-06-24 2016-04-19 ASTRODESIGN, Inc. Spatial frequency reproducing apparatus and optical distance measuring apparatus
JP5843330B1 (ja) * 2014-07-10 2016-01-13 日本電信電話株式会社 光干渉断層装置
JP6436753B2 (ja) * 2014-12-05 2018-12-12 国立大学法人茨城大学 位相差干渉顕微装置
JP2018500575A (ja) * 2015-01-04 2018-01-11 ホーガン,ジョシュア,ノエル 干渉システムのための基準信号フィルタ
CN104614072B (zh) * 2015-02-10 2016-09-21 中国科学院上海光学精密机械研究所 基于全反射镜的二维光谱测量装置及测量方法
EP3467480B1 (fr) 2016-05-30 2023-08-23 Nikon Corporation Dispositif d'observation et procédé d'observation
CN109997010B (zh) * 2016-11-18 2022-06-24 齐戈股份有限公司 用于优化干涉仪的光学性能的方法及设备
KR20180124489A (ko) * 2017-05-12 2018-11-21 휴멘 주식회사 광간섭 측정 장치
EP3712596A4 (fr) * 2017-11-14 2021-11-24 Nikon Corporation Procédé de génération d'image de phase quantitative, dispositif de génération d'image de phase quantitative et programme
KR102127326B1 (ko) * 2018-12-17 2020-06-29 국방과학연구소 광 증폭기의 위상 잡음 보정 방법 및 시스템
US12203924B2 (en) 2019-10-23 2025-01-21 The Johns Hopkins University Offset illumination capillaroscope
CN111122617A (zh) * 2019-12-26 2020-05-08 东莞理工学院 一种基于中子成像的增材制造气孔裂纹检测方法和装置
CN112945140B (zh) * 2021-01-29 2022-09-16 四川大学 一种基于查找表和区域分割的彩色物体三维测量方法
KR20240068628A (ko) * 2021-09-16 2024-05-17 오츠카덴시가부시끼가이샤 광학 측정 시스템 및 광학 측정 방법
CN114414528A (zh) * 2021-12-07 2022-04-29 广东科学技术职业学院 基于5g微波光子信号的双光纤端面干涉盐度检测方法
CN114374779B (zh) * 2021-12-16 2023-06-20 中国科学院上海高等研究院 一种全光场成像相机及其成像方法及全光场成像装置
CN118883025B (zh) * 2024-09-27 2024-12-13 中国科学院长春光学精密机械与物理研究所 定焦及焦距测量装置及方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7004247A (fr) * 1970-03-25 1971-09-28
US5220405A (en) * 1991-12-20 1993-06-15 International Business Machines Corporation Interferometer for in situ measurement of thin film thickness changes
US5991033A (en) * 1996-09-20 1999-11-23 Sparta, Inc. Interferometer with air turbulence compensation
JP4021975B2 (ja) * 1997-08-28 2007-12-12 オリンパス株式会社 光走査プローブ装置
JPH11237223A (ja) * 1998-02-20 1999-08-31 Hitachi Electron Eng Co Ltd 光干渉計の干渉位相検出方式
US6034774A (en) * 1998-06-26 2000-03-07 Eastman Kodak Company Method for determining the retardation of a material using non-coherent light interferometery
JP2000275582A (ja) * 1999-03-24 2000-10-06 Olympus Optical Co Ltd 被写界深度拡大システム
US6611339B1 (en) * 2000-06-09 2003-08-26 Massachusetts Institute Of Technology Phase dispersive tomography
JP4786027B2 (ja) * 2000-12-08 2011-10-05 オリンパス株式会社 光学系及び光学装置
JP4020714B2 (ja) * 2001-08-09 2007-12-12 オリンパス株式会社 顕微鏡

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113706509A (zh) * 2021-08-30 2021-11-26 常州工利精机科技有限公司 一种可用于冲压件表面微缺陷成像的检测方法
CN113706509B (zh) * 2021-08-30 2024-02-27 常州工利精机科技有限公司 一种可用于冲压件表面微缺陷成像的检测方法
CN114785650A (zh) * 2022-05-10 2022-07-22 北京邮电大学 一种新型盲相位搜索算法结构及实现方法
CN114785650B (zh) * 2022-05-10 2024-02-27 北京邮电大学 一种新型盲相位搜索算法结构及实现方法
CN116337134A (zh) * 2023-01-03 2023-06-27 镭脉工业科技(上海)有限公司 一种激光监控仪器的使用方法

Also Published As

Publication number Publication date
JP5416883B2 (ja) 2014-02-12
JP2013152243A (ja) 2013-08-08
JP2007524075A (ja) 2007-08-23
EP1644720A2 (fr) 2006-04-12

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