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AU5540590A - Process and device for large-scale profilometric measurement and their application to the measurement of the condition of surfaces irrespective of shape - Google Patents

Process and device for large-scale profilometric measurement and their application to the measurement of the condition of surfaces irrespective of shape

Info

Publication number
AU5540590A
AU5540590A AU55405/90A AU5540590A AU5540590A AU 5540590 A AU5540590 A AU 5540590A AU 55405/90 A AU55405/90 A AU 55405/90A AU 5540590 A AU5540590 A AU 5540590A AU 5540590 A AU5540590 A AU 5540590A
Authority
AU
Australia
Prior art keywords
measurement
scale
condition
shape
application
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU55405/90A
Other languages
English (en)
Inventor
Jacques Bielle
Jean Mignot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INSTITUT SUPERIEUR D'ETAT DE SURFACE (ISES)
Original Assignee
INST SUPERIEUR ETAT SURFACE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INST SUPERIEUR ETAT SURFACE filed Critical INST SUPERIEUR ETAT SURFACE
Publication of AU5540590A publication Critical patent/AU5540590A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AU55405/90A 1989-04-11 1990-04-05 Process and device for large-scale profilometric measurement and their application to the measurement of the condition of surfaces irrespective of shape Abandoned AU5540590A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8904711 1989-04-11
FR8904711A FR2645638A1 (fr) 1989-04-11 1989-04-11 Procede et dispositif de mesurage profilometrique de large echelle et leurs applications a la mesure de l'etat de surfaces de forme quelconque

Publications (1)

Publication Number Publication Date
AU5540590A true AU5540590A (en) 1990-11-05

Family

ID=9380561

Family Applications (1)

Application Number Title Priority Date Filing Date
AU55405/90A Abandoned AU5540590A (en) 1989-04-11 1990-04-05 Process and device for large-scale profilometric measurement and their application to the measurement of the condition of surfaces irrespective of shape

Country Status (3)

Country Link
AU (1) AU5540590A (fr)
FR (1) FR2645638A1 (fr)
WO (1) WO1990012277A1 (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3199141B2 (ja) * 1993-07-07 2001-08-13 ソニー株式会社 ドラムリード測定装置と測定方法
US6745616B1 (en) * 1999-10-21 2004-06-08 Mitutoyo Corporation Surface texture measuring machine, leveling device for surface texture measuring machine and orientation-adjusting method of workpiece of surface texture measuring machine
TW550375B (en) 2001-09-07 2003-09-01 Olympus Optical Co Apparatus for measuring a surface profile
CN101614515B (zh) * 2008-06-26 2011-11-30 鸿富锦精密工业（深圳）有限公司 高度量测治具
CN102435127A (zh) * 2011-11-28 2012-05-02 苏州工业园区隆盛电器成套设备制造有限公司 一种轨道车辆用变压器的平整度的检验方法
CN103196386B (zh) * 2013-03-12 2015-11-18 浙江大学宁波理工学院 非接触式回转零件形状误差精度检测装置和方法
CN103196367B (zh) * 2013-03-12 2015-05-06 浙江大学宁波理工学院 基于图像域的轴套类零件形位误差测量装置及方法
CN107328331B (zh) * 2017-08-25 2023-05-23 郑州市质量技术监督检验测试中心 基于视觉的分布式钢直尺检定装置及其方法
CN108278979B (zh) * 2018-01-03 2019-10-08 华中科技大学 一种叶片原位接触式三维测量装置和方法
CN108318363B (zh) * 2018-02-12 2023-10-27 三峡大学 用于底枢蘑菇头磨损的检测装置及其检测方法
CN110836626A (zh) * 2019-11-04 2020-02-25 上海天庹智能设备有限公司 压缩机叶片尺寸精确测量装置
CN111947553B (zh) * 2020-07-17 2022-05-27 苏州华亚智能科技股份有限公司 用于地铁牵引变流器机柜的平面度检测装置
CN112484605B (zh) * 2020-12-21 2024-05-03 昆明理工大学 一种便携式岩体结构面粗糙度轮廓测量仪及其测量方法
CN113048866B (zh) * 2021-02-19 2023-06-06 深圳市普乐华科技有限公司 一种非晶纳米晶铁芯卷绕机用检测机构
CN118197016B (zh) * 2024-01-23 2024-12-03 河北康合电杆有限公司 用于架设输电线缆的杆体识别报警系统
CN119304692B (zh) * 2024-12-03 2025-09-09 中国石油大学(华东) 一种基于数控机床的工件在位检测装置与方法
CN119223233B (zh) * 2024-12-04 2025-02-18 洛阳奥内斯机械科技有限公司 一种桨叶形位公差测量工装
CN120293037A (zh) * 2025-04-08 2025-07-11 哈尔滨工业大学 圆环形零部件端面与柱面外轮廓垂直度测量系统及方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD156635B (fr) *
US4560924A (en) * 1983-07-22 1985-12-24 Magnetic Peripherals Inc. Flatness measuring apparatus
GB2165361B (en) * 1984-04-10 1988-01-27 Mitutoyo Mfg Co Ltd Surface roughness measuring machine
US4706360A (en) * 1986-05-13 1987-11-17 Morton Thiokol, Inc. Thread gage
FR2620223B1 (fr) * 1987-09-09 1994-03-25 Institut Superieur Etat Surface Procede pour faire glisser un support mobile sur une surface de reference et dispositif associe
JPH0614112A (ja) * 1992-06-29 1994-01-21 Fujitsu Ltd 発番号音声通知システム

Also Published As

Publication number Publication date
WO1990012277A1 (fr) 1990-10-18
FR2645638A1 (fr) 1990-10-12

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