AU2003226319A1 - Electropolishing and/or electroplating apparatus and methods - Google Patents
Electropolishing and/or electroplating apparatus and methodsInfo
- Publication number
- AU2003226319A1 AU2003226319A1 AU2003226319A AU2003226319A AU2003226319A1 AU 2003226319 A1 AU2003226319 A1 AU 2003226319A1 AU 2003226319 A AU2003226319 A AU 2003226319A AU 2003226319 A AU2003226319 A AU 2003226319A AU 2003226319 A1 AU2003226319 A1 AU 2003226319A1
- Authority
- AU
- Australia
- Prior art keywords
- electropolishing
- methods
- electroplating apparatus
- electroplating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000009713 electroplating Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/6708—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F3/00—Electrolytic etching or polishing
- C25F3/16—Polishing
- C25F3/30—Polishing of semiconducting materials
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F7/00—Constructional parts, or assemblies thereof, of cells for electrolytic removal of material from objects; Servicing or operating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67769—Storage means
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Electrochemistry (AREA)
- Sustainable Development (AREA)
- Life Sciences & Earth Sciences (AREA)
- Robotics (AREA)
- Electroplating Methods And Accessories (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Electrodes Of Semiconductors (AREA)
- Weting (AREA)
- ing And Chemical Polishing (AREA)
Applications Claiming Priority (17)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US37095502P | 2002-04-08 | 2002-04-08 | |
| US37091902P | 2002-04-08 | 2002-04-08 | |
| US37095602P | 2002-04-08 | 2002-04-08 | |
| US37092902P | 2002-04-08 | 2002-04-08 | |
| US60/370,919 | 2002-04-08 | ||
| US60/370,929 | 2002-04-08 | ||
| US60/370,956 | 2002-04-08 | ||
| US60/370,955 | 2002-04-08 | ||
| US37256602P | 2002-04-14 | 2002-04-14 | |
| US37254202P | 2002-04-14 | 2002-04-14 | |
| US37256702P | 2002-04-14 | 2002-04-14 | |
| US60/372,542 | 2002-04-14 | ||
| US60/372,566 | 2002-04-14 | ||
| US60/372,567 | 2002-04-14 | ||
| US39046002P | 2002-06-21 | 2002-06-21 | |
| US60/390,460 | 2002-06-21 | ||
| PCT/US2003/010725 WO2003087436A1 (en) | 2002-04-08 | 2003-04-08 | Electropolishing and/or electroplating apparatus and methods |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2003226319A1 true AU2003226319A1 (en) | 2003-10-27 |
Family
ID=29255769
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2003226319A Abandoned AU2003226319A1 (en) | 2002-04-08 | 2003-04-08 | Electropolishing and/or electroplating apparatus and methods |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US20050218003A1 (en) |
| EP (1) | EP1492907A4 (en) |
| JP (5) | JP2005522585A (en) |
| KR (1) | KR20040099407A (en) |
| CN (2) | CN101353810B (en) |
| AU (1) | AU2003226319A1 (en) |
| CA (1) | CA2479794A1 (en) |
| SG (1) | SG159384A1 (en) |
| TW (1) | TWI274393B (en) |
| WO (1) | WO2003087436A1 (en) |
Families Citing this family (70)
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| US6899804B2 (en) | 2001-04-10 | 2005-05-31 | Applied Materials, Inc. | Electrolyte composition and treatment for electrolytic chemical mechanical polishing |
| US7232514B2 (en) | 2001-03-14 | 2007-06-19 | Applied Materials, Inc. | Method and composition for polishing a substrate |
| US7323416B2 (en) | 2001-03-14 | 2008-01-29 | Applied Materials, Inc. | Method and composition for polishing a substrate |
| US7128825B2 (en) | 2001-03-14 | 2006-10-31 | Applied Materials, Inc. | Method and composition for polishing a substrate |
| US7997288B2 (en) | 2002-09-30 | 2011-08-16 | Lam Research Corporation | Single phase proximity head having a controlled meniscus for treating a substrate |
| US7675000B2 (en) | 2003-06-24 | 2010-03-09 | Lam Research Corporation | System method and apparatus for dry-in, dry-out, low defect laser dicing using proximity technology |
| US8062471B2 (en) | 2004-03-31 | 2011-11-22 | Lam Research Corporation | Proximity head heating method and apparatus |
| CN100419121C (en) * | 2004-05-12 | 2008-09-17 | 鸿富锦精密工业(深圳)有限公司 | Wet Etching Equipment |
| JP5155517B2 (en) | 2005-04-21 | 2013-03-06 | 株式会社荏原製作所 | Wafer delivery apparatus and polishing apparatus |
| US7928366B2 (en) | 2006-10-06 | 2011-04-19 | Lam Research Corporation | Methods of and apparatus for accessing a process chamber using a dual zone gas injector with improved optical access |
| WO2008019076A2 (en) * | 2006-08-04 | 2008-02-14 | E. I. Du Pont De Nemours And Company | Substrate carrier enclosure |
| US8474468B2 (en) * | 2006-09-30 | 2013-07-02 | Tokyo Electron Limited | Apparatus and method for thermally processing a substrate with a heated liquid |
| US20080107509A1 (en) * | 2006-11-07 | 2008-05-08 | Whitcomb Preston X | Vacuum end effector for handling highly shaped substrates |
| EP2097342B1 (en) * | 2006-11-27 | 2023-03-22 | Brooks CCS RS AG | Transfer device for an overhead conveying system |
| US8146902B2 (en) | 2006-12-21 | 2012-04-03 | Lam Research Corporation | Hybrid composite wafer carrier for wet clean equipment |
| US7479463B2 (en) * | 2007-03-09 | 2009-01-20 | Tokyo Electron Limited | Method for heating a chemically amplified resist layer carried on a rotating substrate |
| US9383138B2 (en) * | 2007-03-30 | 2016-07-05 | Tokyo Electron Limited | Methods and heat treatment apparatus for uniformly heating a substrate during a bake process |
| US8464736B1 (en) | 2007-03-30 | 2013-06-18 | Lam Research Corporation | Reclaim chemistry |
| US20080241400A1 (en) * | 2007-03-31 | 2008-10-02 | Tokyo Electron Limited | Vacuum assist method and system for reducing intermixing of lithography layers |
| US8141566B2 (en) | 2007-06-19 | 2012-03-27 | Lam Research Corporation | System, method and apparatus for maintaining separation of liquids in a controlled meniscus |
| US8172989B2 (en) * | 2007-11-26 | 2012-05-08 | Sunpower Corporation | Prevention of substrate edge plating in a fountain plating process |
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-
2003
- 2003-04-07 TW TW092107906A patent/TWI274393B/en not_active IP Right Cessation
- 2003-04-08 KR KR10-2004-7015977A patent/KR20040099407A/en not_active Ceased
- 2003-04-08 AU AU2003226319A patent/AU2003226319A1/en not_active Abandoned
- 2003-04-08 EP EP03746651A patent/EP1492907A4/en not_active Withdrawn
- 2003-04-08 WO PCT/US2003/010725 patent/WO2003087436A1/en not_active Ceased
- 2003-04-08 CN CN2008102128377A patent/CN101353810B/en not_active Expired - Fee Related
- 2003-04-08 SG SG200606992-6A patent/SG159384A1/en unknown
- 2003-04-08 US US10/510,522 patent/US20050218003A1/en not_active Abandoned
- 2003-04-08 CN CNB038102064A patent/CN100430526C/en not_active Expired - Fee Related
- 2003-04-08 CA CA002479794A patent/CA2479794A1/en not_active Abandoned
- 2003-04-08 JP JP2003584368A patent/JP2005522585A/en active Pending
-
2006
- 2006-06-08 JP JP2006159680A patent/JP2006319348A/en active Pending
- 2006-07-10 JP JP2006189857A patent/JP2006328543A/en active Pending
- 2006-08-24 JP JP2006227700A patent/JP2007077501A/en active Pending
- 2006-10-17 JP JP2006282453A patent/JP2007051377A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2003087436A1 (en) | 2003-10-23 |
| CN1653211A (en) | 2005-08-10 |
| JP2007077501A (en) | 2007-03-29 |
| TW200402821A (en) | 2004-02-16 |
| CN100430526C (en) | 2008-11-05 |
| CN101353810B (en) | 2012-02-15 |
| CA2479794A1 (en) | 2003-10-23 |
| JP2007051377A (en) | 2007-03-01 |
| EP1492907A1 (en) | 2005-01-05 |
| SG159384A1 (en) | 2010-03-30 |
| TWI274393B (en) | 2007-02-21 |
| JP2006328543A (en) | 2006-12-07 |
| KR20040099407A (en) | 2004-11-26 |
| CN101353810A (en) | 2009-01-28 |
| JP2005522585A (en) | 2005-07-28 |
| US20050218003A1 (en) | 2005-10-06 |
| JP2006319348A (en) | 2006-11-24 |
| EP1492907A4 (en) | 2008-01-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |