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AU2003256029A1 - A monitoring apparatus - Google Patents

A monitoring apparatus

Info

Publication number
AU2003256029A1
AU2003256029A1 AU2003256029A AU2003256029A AU2003256029A1 AU 2003256029 A1 AU2003256029 A1 AU 2003256029A1 AU 2003256029 A AU2003256029 A AU 2003256029A AU 2003256029 A AU2003256029 A AU 2003256029A AU 2003256029 A1 AU2003256029 A1 AU 2003256029A1
Authority
AU
Australia
Prior art keywords
monitoring apparatus
monitoring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003256029A
Inventor
Liam Kehoe
Patrick Vincent Kelly
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Optical Metrology Patents Ltd
Original Assignee
Optical Metrology Patents Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optical Metrology Patents Ltd filed Critical Optical Metrology Patents Ltd
Publication of AU2003256029A1 publication Critical patent/AU2003256029A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
AU2003256029A 2002-07-31 2003-07-31 A monitoring apparatus Abandoned AU2003256029A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US39941302P 2002-07-31 2002-07-31
US60/399,413 2002-07-31
PCT/IE2003/000109 WO2004015368A1 (en) 2002-07-31 2003-07-31 A monitoring apparatus

Publications (1)

Publication Number Publication Date
AU2003256029A1 true AU2003256029A1 (en) 2004-02-25

Family

ID=31715682

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003256029A Abandoned AU2003256029A1 (en) 2002-07-31 2003-07-31 A monitoring apparatus

Country Status (4)

Country Link
EP (1) EP1540277A1 (en)
JP (1) JP2005534934A (en)
AU (1) AU2003256029A1 (en)
WO (1) WO2004015368A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2870935A1 (en) * 2004-05-25 2005-12-02 Insidix Sarl DEVICE FOR MEASURING SURFACE DEFORMATIONS
RU2445572C1 (en) * 2010-11-09 2012-03-20 Государственное образовательное учреждение высшего профессионального образования "Санкт-Петербургский государственный университет информационных технологий, механики и оптики" Apparatus for controlling deformations of elongated object
ITBA20120040A1 (en) * 2012-06-25 2013-12-26 Cenms Srl OPTICAL DEVICE FOR THE CONTEMPORARY MEASUREMENT OF DEFORMATIONS IN THE FLOOR AND OUTSIDE THE PLAN
CN103149087B (en) * 2013-02-07 2015-05-20 湘潭大学 Follow-up window and digital image-based non-contact real-time strain measurement method
CN106595522B (en) * 2016-12-15 2018-11-09 东南大学 A kind of error calibration method of optical grating projection three-dimension measuring system
CN109029279B (en) * 2018-07-23 2020-01-10 清华大学 Deformation measuring method and device
CN110207606B (en) * 2019-06-27 2021-04-20 航天神舟飞行器有限公司 Out-of-plane strain measurement method based on digital image correlation

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5898486A (en) * 1994-03-25 1999-04-27 International Business Machines Corporation Portable moire interferometer and corresponding moire interferometric method
DE19614896B4 (en) * 1996-04-16 2005-04-07 Chemnitzer Werkstoffmechanik Gmbh Method for field determination of deformation states in microscopically dimensioned test areas and use of the method

Also Published As

Publication number Publication date
EP1540277A1 (en) 2005-06-15
JP2005534934A (en) 2005-11-17
WO2004015368A1 (en) 2004-02-19

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase