AU2001289121A1 - Fluid delivery ring and methods for making and implementing the same - Google Patents
Fluid delivery ring and methods for making and implementing the sameInfo
- Publication number
- AU2001289121A1 AU2001289121A1 AU2001289121A AU8912101A AU2001289121A1 AU 2001289121 A1 AU2001289121 A1 AU 2001289121A1 AU 2001289121 A AU2001289121 A AU 2001289121A AU 8912101 A AU8912101 A AU 8912101A AU 2001289121 A1 AU2001289121 A1 AU 2001289121A1
- Authority
- AU
- Australia
- Prior art keywords
- implementing
- making
- methods
- same
- fluid delivery
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000012530 fluid Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49428—Gas and water specific plumbing component making
- Y10T29/49432—Nozzle making
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49428—Gas and water specific plumbing component making
- Y10T29/49432—Nozzle making
- Y10T29/49433—Sprayer
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/672,173 US6481447B1 (en) | 2000-09-27 | 2000-09-27 | Fluid delivery ring and methods for making and implementing the same |
| US09/672,173 | 2000-09-27 | ||
| PCT/US2001/028996 WO2002027767A2 (en) | 2000-09-27 | 2001-09-12 | Fluid delivery ring and methods for making and implementing the same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2001289121A1 true AU2001289121A1 (en) | 2002-04-08 |
Family
ID=24697439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2001289121A Abandoned AU2001289121A1 (en) | 2000-09-27 | 2001-09-12 | Fluid delivery ring and methods for making and implementing the same |
Country Status (9)
| Country | Link |
|---|---|
| US (3) | US6481447B1 (en) |
| EP (1) | EP1320871B1 (en) |
| JP (1) | JP4559702B2 (en) |
| KR (1) | KR100766757B1 (en) |
| CN (1) | CN1225770C (en) |
| AU (1) | AU2001289121A1 (en) |
| DE (1) | DE60138199D1 (en) |
| TW (1) | TW520523B (en) |
| WO (1) | WO2002027767A2 (en) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100481309B1 (en) * | 2002-06-27 | 2005-04-07 | 삼성전자주식회사 | Apparatus for drying semiconductor substrate |
| US7383843B2 (en) * | 2002-09-30 | 2008-06-10 | Lam Research Corporation | Method and apparatus for processing wafer surfaces using thin, high velocity fluid layer |
| KR20060068453A (en) * | 2004-12-16 | 2006-06-21 | 삼성전자주식회사 | Semiconductor device manufacturing apparatus and method |
| JP5180661B2 (en) * | 2008-04-18 | 2013-04-10 | 株式会社ディスコ | Spinner cleaning device and processing device |
| CN103084349A (en) * | 2011-11-03 | 2013-05-08 | 无锡华润上华科技有限公司 | Wafer cleaning method |
| JP5871582B2 (en) * | 2011-11-22 | 2016-03-01 | 株式会社ディスコ | Etching device |
| JP2015062956A (en) * | 2012-09-19 | 2015-04-09 | 株式会社荏原製作所 | Polishing device |
| CN105470177B (en) * | 2016-01-05 | 2018-09-07 | 清华大学 | Wafer cleaning drying device |
| CN111146122B (en) * | 2019-12-26 | 2022-10-28 | 厦门通富微电子有限公司 | Liquid collection device, developing/etching machine table and developing/etching method |
| CN115083969B (en) * | 2022-07-07 | 2025-09-26 | 至微半导体(上海)有限公司 | Wafer cleaning system with nitrogen blowing and wafer cleaning method |
Family Cites Families (60)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2204599A (en) * | 1936-01-09 | 1940-06-18 | Jenkins Alexander Frederick | Spray gun |
| US4313266A (en) | 1980-05-01 | 1982-02-02 | The Silicon Valley Group, Inc. | Method and apparatus for drying wafers |
| JPS59142839A (en) * | 1983-02-01 | 1984-08-16 | Canon Inc | Cleaning method of vapor-phase apparatus |
| US4610851A (en) * | 1984-11-28 | 1986-09-09 | Colvert James H | Air distributor for FCCU catalyst regenerator |
| JPS61296724A (en) * | 1985-06-26 | 1986-12-27 | Hitachi Ltd | High pressure jet scrubber cleaning equipment |
| US4651440A (en) | 1986-05-16 | 1987-03-24 | Eastman Kodak Company | Spin drying apparatus |
| JPS63271931A (en) * | 1987-04-28 | 1988-11-09 | Tokyo Electron Ltd | Development device |
| US4902609A (en) * | 1987-08-20 | 1990-02-20 | Eastman Kodak Company | Photographic print material with increased exposure latitude |
| JPH02138737A (en) | 1987-08-31 | 1990-05-28 | Oki Electric Ind Co Ltd | Sheet-fed spin drying device for semiconductor wafer |
| US5297739A (en) * | 1987-11-23 | 1994-03-29 | Torus Corporation | Enhanced rising device with circular array of orifices |
| JPH01260823A (en) * | 1988-04-12 | 1989-10-18 | Mitsubishi Electric Corp | Semiconductor wafer development equipment |
| JP2589140B2 (en) * | 1988-05-13 | 1997-03-12 | 富士通株式会社 | Cleaning method for semiconductor manufacturing equipment |
| US4950156A (en) | 1989-06-28 | 1990-08-21 | Digital Equipment Corporation | Inert gas curtain for a thermal processing furnace |
| JPH03131026A (en) * | 1989-10-17 | 1991-06-04 | Seiko Epson Corp | Cleaning device |
| JPH03178121A (en) * | 1989-12-06 | 1991-08-02 | Fujitsu Ltd | Semiconductor exposing device |
| US5962085A (en) * | 1991-02-25 | 1999-10-05 | Symetrix Corporation | Misted precursor deposition apparatus and method with improved mist and mist flow |
| US5312487A (en) * | 1991-09-20 | 1994-05-17 | Tokyo Electron Kabushiki Kaisha | Coating apparatus |
| JP3131026B2 (en) | 1992-06-09 | 2001-01-31 | 住友ゴム工業株式会社 | Wound golf ball |
| JP3178121B2 (en) | 1992-10-30 | 2001-06-18 | オムロン株式会社 | Terminal block |
| EP0967633A1 (en) | 1993-07-30 | 1999-12-29 | Applied Materials, Inc. | Gas inlets for wafer processing chamber |
| US5417153A (en) * | 1993-08-09 | 1995-05-23 | International Flavors & Fragrances Inc. | Fluidizing spray chilling system for producing encapsulated materials |
| US5614055A (en) * | 1993-08-27 | 1997-03-25 | Applied Materials, Inc. | High density plasma CVD and etching reactor |
| US5865896A (en) * | 1993-08-27 | 1999-02-02 | Applied Materials, Inc. | High density plasma CVD reactor with combined inductive and capacitive coupling |
| TW273067B (en) * | 1993-10-04 | 1996-03-21 | Tokyo Electron Co Ltd | |
| US5312047A (en) * | 1993-11-09 | 1994-05-17 | Akers Louis A | Lawn mower washer ring |
| US5744049A (en) * | 1994-07-18 | 1998-04-28 | Applied Materials, Inc. | Plasma reactor with enhanced plasma uniformity by gas addition, and method of using same |
| JP3699142B2 (en) * | 1994-09-30 | 2005-09-28 | アネルバ株式会社 | Thin film forming equipment |
| AU5172196A (en) * | 1995-02-27 | 1996-09-18 | Randy J. Cooper | Lawn and garden sprinkler with bendable tubes |
| KR100210965B1 (en) * | 1995-06-19 | 1999-07-15 | 이시다 아키라 | A supplying method and apparatus for fluid used treatment of substrate |
| JPH0917764A (en) * | 1995-06-28 | 1997-01-17 | Sigma Merutetsuku Kk | Liquid chemical treatment apparatus |
| TW283250B (en) * | 1995-07-10 | 1996-08-11 | Watkins Johnson Co | Plasma enhanced chemical processing reactor and method |
| JPH0936080A (en) * | 1995-07-13 | 1997-02-07 | Toray Eng Co Ltd | Method for washing machined silicon ingot |
| TW356554B (en) * | 1995-10-23 | 1999-04-21 | Watkins Johnson Co | Gas injection system for semiconductor processing |
| US5738574A (en) * | 1995-10-27 | 1998-04-14 | Applied Materials, Inc. | Continuous processing system for chemical mechanical polishing |
| US6027662A (en) | 1996-03-29 | 2000-02-22 | Lam Research Corporation | Materials processing by separately generated process medium constituents |
| US6116184A (en) * | 1996-05-21 | 2000-09-12 | Symetrix Corporation | Method and apparatus for misted liquid source deposition of thin film with reduced mist particle size |
| US5851041A (en) | 1996-06-26 | 1998-12-22 | Ontrak Systems, Inc. | Wafer holder with spindle assembly and wafer holder actuator |
| WO1998000576A1 (en) * | 1996-06-28 | 1998-01-08 | Lam Research Corporation | Apparatus and method for high density plasma chemical vapor deposition |
| US6013155A (en) * | 1996-06-28 | 2000-01-11 | Lam Research Corporation | Gas injection system for plasma processing |
| US5950327A (en) | 1996-07-08 | 1999-09-14 | Speedfam-Ipec Corporation | Methods and apparatus for cleaning and drying wafers |
| JP2002509643A (en) * | 1996-07-08 | 2002-03-26 | スピードファム−アイピーイーシー コーポレイション | Wafer cleaning, rinsing and drying method and apparatus |
| US5885358A (en) * | 1996-07-09 | 1999-03-23 | Applied Materials, Inc. | Gas injection slit nozzle for a plasma process reactor |
| KR100205318B1 (en) * | 1996-10-11 | 1999-07-01 | 구본준 | Method of manufacturing insulating film with free electrons |
| JP3402972B2 (en) * | 1996-11-14 | 2003-05-06 | 東京エレクトロン株式会社 | Method for manufacturing semiconductor device |
| US6096100A (en) * | 1997-12-12 | 2000-08-01 | Texas Instruments Incorporated | Method for processing wafers and cleaning wafer-handling implements |
| US5989652A (en) * | 1997-01-31 | 1999-11-23 | Tokyo Electron Limited | Method of low temperature plasma enhanced chemical vapor deposition of tin film over titanium for use in via level applications |
| JPH10223607A (en) * | 1997-02-03 | 1998-08-21 | Mitsubishi Electric Corp | Plasma processing equipment |
| US6139406A (en) * | 1997-06-24 | 2000-10-31 | Applied Materials, Inc. | Combined slurry dispenser and rinse arm and method of operation |
| US5884640A (en) * | 1997-08-07 | 1999-03-23 | Applied Materials, Inc. | Method and apparatus for drying substrates |
| US6323119B1 (en) * | 1997-10-10 | 2001-11-27 | Applied Materials, Inc. | CVD deposition method to improve adhesion of F-containing dielectric metal lines for VLSI application |
| US6129290A (en) * | 1997-11-06 | 2000-10-10 | Nikkanen; John P. | Snow maker |
| US6248168B1 (en) * | 1997-12-15 | 2001-06-19 | Tokyo Electron Limited | Spin coating apparatus including aging unit and solvent replacement unit |
| WO1999045585A1 (en) | 1998-03-05 | 1999-09-10 | Tokyo Electron Limited | Plasma processing apparatus and plasma processing method |
| JPH11297652A (en) * | 1998-04-14 | 1999-10-29 | Dainippon Screen Mfg Co Ltd | Substrate treatment apparatus |
| US6143078A (en) * | 1998-11-13 | 2000-11-07 | Applied Materials, Inc. | Gas distribution system for a CVD processing chamber |
| US6394109B1 (en) * | 1999-04-13 | 2002-05-28 | Applied Materials, Inc. | Method and apparatus for removing carbon contamination in a sub-atmospheric charged particle beam lithography system |
| KR100304706B1 (en) * | 1999-06-16 | 2001-11-01 | 윤종용 | Chemical mechanical polishing apparatus and method for washing contaminant in a polishing head |
| US6221740B1 (en) * | 1999-08-10 | 2001-04-24 | Silicon Genesis Corporation | Substrate cleaving tool and method |
| US6592709B1 (en) * | 2000-04-05 | 2003-07-15 | Applied Materials Inc. | Method and apparatus for plasma processing |
| KR20060095024A (en) * | 2005-02-25 | 2006-08-30 | 삼성전자주식회사 | Spin Coater for Semiconductor Manufacturing |
-
2000
- 2000-09-27 US US09/672,173 patent/US6481447B1/en not_active Expired - Lifetime
-
2001
- 2001-09-12 WO PCT/US2001/028996 patent/WO2002027767A2/en not_active Ceased
- 2001-09-12 AU AU2001289121A patent/AU2001289121A1/en not_active Abandoned
- 2001-09-12 JP JP2002531467A patent/JP4559702B2/en not_active Expired - Fee Related
- 2001-09-12 CN CNB018163165A patent/CN1225770C/en not_active Expired - Fee Related
- 2001-09-12 DE DE60138199T patent/DE60138199D1/en not_active Expired - Lifetime
- 2001-09-12 EP EP01968917A patent/EP1320871B1/en not_active Expired - Lifetime
- 2001-09-12 KR KR1020037004393A patent/KR100766757B1/en not_active Expired - Fee Related
- 2001-09-19 TW TW090123401A patent/TW520523B/en not_active IP Right Cessation
-
2002
- 2002-09-19 US US10/251,483 patent/US7040017B2/en not_active Expired - Lifetime
-
2005
- 2005-11-23 US US11/285,986 patent/US7494550B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP1320871B1 (en) | 2009-04-01 |
| JP2004510348A (en) | 2004-04-02 |
| KR20030030038A (en) | 2003-04-16 |
| US20060070639A1 (en) | 2006-04-06 |
| US7494550B2 (en) | 2009-02-24 |
| KR100766757B1 (en) | 2007-10-17 |
| WO2002027767A2 (en) | 2002-04-04 |
| TW520523B (en) | 2003-02-11 |
| EP1320871A2 (en) | 2003-06-25 |
| CN1225770C (en) | 2005-11-02 |
| CN1466772A (en) | 2004-01-07 |
| US7040017B2 (en) | 2006-05-09 |
| US20030015224A1 (en) | 2003-01-23 |
| DE60138199D1 (en) | 2009-05-14 |
| US6481447B1 (en) | 2002-11-19 |
| JP4559702B2 (en) | 2010-10-13 |
| WO2002027767A3 (en) | 2003-01-30 |
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