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AU2001282891A1 - Contact apparatus particularly useful with test equipment - Google Patents

Contact apparatus particularly useful with test equipment

Info

Publication number
AU2001282891A1
AU2001282891A1 AU2001282891A AU8289101A AU2001282891A1 AU 2001282891 A1 AU2001282891 A1 AU 2001282891A1 AU 2001282891 A AU2001282891 A AU 2001282891A AU 8289101 A AU8289101 A AU 8289101A AU 2001282891 A1 AU2001282891 A1 AU 2001282891A1
Authority
AU
Australia
Prior art keywords
particularly useful
test equipment
contact apparatus
apparatus particularly
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001282891A
Inventor
John C. Bergeron
Stephen A. Boyle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rika Electronics International Inc
Original Assignee
RIKA ELECTRONICS INTERNATIONAL
Rika Electronics International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKA ELECTRONICS INTERNATIONAL, Rika Electronics International Inc filed Critical RIKA ELECTRONICS INTERNATIONAL
Publication of AU2001282891A1 publication Critical patent/AU2001282891A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2103/00—Two poles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
AU2001282891A 2000-07-13 2001-07-11 Contact apparatus particularly useful with test equipment Abandoned AU2001282891A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US21783700P 2000-07-13 2000-07-13
US60217837 2000-07-13
PCT/US2001/022216 WO2002007265A1 (en) 2000-07-13 2001-07-11 Contact apparatus particularly useful with test equipment

Publications (1)

Publication Number Publication Date
AU2001282891A1 true AU2001282891A1 (en) 2002-01-30

Family

ID=22812718

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001282891A Abandoned AU2001282891A1 (en) 2000-07-13 2001-07-11 Contact apparatus particularly useful with test equipment

Country Status (5)

Country Link
US (1) US6652326B2 (en)
JP (1) JP2004504703A (en)
AU (1) AU2001282891A1 (en)
TW (1) TW531938B (en)
WO (1) WO2002007265A1 (en)

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US6331836B1 (en) * 2000-08-24 2001-12-18 Fast Location.Net, Llc Method and apparatus for rapidly estimating the doppler-error and other receiver frequency errors of global positioning system satellite signals weakened by obstructions in the signal path
US6822542B2 (en) * 2001-07-26 2004-11-23 Xytrans, Inc. Self-adjusted subminiature coaxial connector
WO2003076957A1 (en) * 2002-03-05 2003-09-18 Rika Denshi America, Inc. Apparatus for interfacing electronic packages and test equipment
US6921299B2 (en) * 2003-01-06 2005-07-26 R & R Home Networking Coupling device for coaxial cable and communication applications
TWI241757B (en) * 2003-05-16 2005-10-11 Parry Chen RF coaxial conductor
FR2862355B1 (en) * 2003-11-18 2006-02-10 Ecl SYSTEM FOR CONNECTING TWO TREES IN TRANSLATION
CN2682641Y (en) * 2003-11-20 2005-03-02 上海莫仕连接器有限公司 Crimp connected conductive terminal
US7321234B2 (en) * 2003-12-18 2008-01-22 Lecroy Corporation Resistive test probe tips and applications therefor
US20230204626A1 (en) * 2003-12-31 2023-06-29 Microfabrica Inc. Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes
US6927332B1 (en) * 2004-03-22 2005-08-09 Motorola, Inc. Flexible test cable
US7315176B2 (en) * 2004-06-16 2008-01-01 Rika Denshi America, Inc. Electrical test probes, methods of making, and methods of using
JP5185625B2 (en) 2004-12-13 2013-04-17 インテスト コーポレイション Reflection reduction signal module
JP4632133B2 (en) * 2005-09-26 2011-02-16 セイコーエプソン株式会社 Conductive connection device
US7116121B1 (en) * 2005-10-27 2006-10-03 Agilent Technologies, Inc. Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts
KR101097111B1 (en) * 2005-12-06 2011-12-22 유니테크노 인코퍼레이티드 Double-ended contact probe
KR100734296B1 (en) * 2005-12-19 2007-07-02 삼성전자주식회사 Socket pin for inspection device with self-cleaning function and inspection device including same
JP4800804B2 (en) * 2006-03-14 2011-10-26 日置電機株式会社 Probes and measuring equipment
US7545159B2 (en) * 2006-06-01 2009-06-09 Rika Denshi America, Inc. Electrical test probes with a contact element, methods of making and using the same
US7695322B2 (en) * 2006-06-12 2010-04-13 Southwest Microwave, Inc. Arizona Corporation Coaxial connector
US7728613B2 (en) * 2006-11-20 2010-06-01 Analog Devices, Inc. Device under test pogo pin type contact element
CN201029138Y (en) * 2007-02-08 2008-02-27 富士康(昆山)电脑接插件有限公司 electrical connector terminal
JP4999079B2 (en) * 2007-04-10 2012-08-15 サンユー工業株式会社 probe
US7847191B2 (en) * 2007-11-06 2010-12-07 Xerox Corporation Electrical component, manufacturing system and method
MY151561A (en) * 2007-12-06 2014-06-13 Test Tooling Solutions M Sdn Bhd Eco contactor
EP2144338A1 (en) * 2008-07-11 2010-01-13 Tyco Electronics Nederland B.V. Coaxial probe
US7922529B1 (en) * 2009-11-23 2011-04-12 Neocoil, Llc High mating cycle low insertion force coaxial connector
DE102010014940B4 (en) * 2010-04-14 2013-12-19 Semikron Elektronik Gmbh & Co. Kg Power semiconductor module with connection elements
JP5937208B2 (en) * 2011-08-30 2016-06-22 Ｌｅｅｎｏ工業株式会社Ｌｅｅｎｏ Ｉｎｄｕｓｔｒｉａｌ Ｉｎｃ． Coaxial probe
US8758066B2 (en) * 2012-02-03 2014-06-24 Interconnect Devices, Inc. Electrical connector with insulation member
US9627814B2 (en) * 2012-04-04 2017-04-18 Holland Electronics Llc Moving part coaxial connectors
CN104184003B (en) * 2013-05-20 2016-03-23 中航光电科技股份有限公司 A radio frequency coaxial adapter
CN104865425B (en) * 2014-02-24 2018-07-20 旺矽科技股份有限公司 Probe device with spring sleeve type probe
JP6359347B2 (en) * 2014-06-02 2018-07-18 日本発條株式会社 Probe unit and contact probe
US9933455B2 (en) 2015-05-04 2018-04-03 Qualcomm Incorporated Known good die testing for high frequency applications
KR101954086B1 (en) * 2017-11-07 2019-03-06 리노공업주식회사 A test probe assembly and test socket
JP7096095B2 (en) * 2018-07-27 2022-07-05 株式会社エンプラス Sockets for contact pins and electrical components
CN109030887A (en) * 2018-08-10 2018-12-18 浙江金连接科技有限公司 A kind of test probe beryllium-bronze imperial crown top pillar head
US11973301B2 (en) 2018-09-26 2024-04-30 Microfabrica Inc. Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making
US12181493B2 (en) 2018-10-26 2024-12-31 Microfabrica Inc. Compliant probes including dual independently operable probe contact elements including at least one flat extension spring, methods for making, and methods for using
US12078657B2 (en) 2019-12-31 2024-09-03 Microfabrica Inc. Compliant pin probes with extension springs, methods for making, and methods for using
JP6774590B1 (en) * 2018-11-27 2020-10-28 日本発條株式会社 Probe unit
CN113228422B (en) 2018-11-30 2024-06-21 康宁光电通信Rf有限责任公司 Compressible electrical contact having bifurcated cutting sections
WO2021108080A1 (en) * 2019-11-30 2021-06-03 Corning Optical Communications Rf Llc Connector assemblies
USD936611S1 (en) 2019-11-30 2021-11-23 Corning Optical Communications Rf Llc Compressible electrical contact
USD936610S1 (en) 2019-11-30 2021-11-23 Corning Optical Communications Rf Llc Compressible electrical contact
US12196781B2 (en) 2019-12-31 2025-01-14 Microfabrica Inc. Probes with planar unbiased spring elements for electronic component contact, methods for making such probes, and methods for using such probes
US12196782B2 (en) 2019-12-31 2025-01-14 Microfabrica Inc. Probes with planar unbiased spring elements for electronic component contact, methods for making such probes, and methods for using such probes
US11563294B2 (en) * 2020-05-22 2023-01-24 Corning Optical Communications Rf Llc Spring-loaded interconnects having pre-configured flexible cable
US12146898B2 (en) 2020-10-02 2024-11-19 Microfabrica Inc. Multi-beam probes with decoupled structural and current carrying beams and methods of making
US12212083B2 (en) 2020-11-30 2025-01-28 Corning Optical Communications Rf Llc Compressible electrical assemblies with divaricated-cut sections
CN113109607A (en) * 2021-04-12 2021-07-13 渭南高新区木王科技有限公司 Double-end double-acting heavy current test probe
CN113805001A (en) * 2021-09-09 2021-12-17 湖南电科院检测集团有限公司 High-voltage product test device with protective measures
WO2024110046A1 (en) * 2022-11-24 2024-05-30 Feinmetall Gmbh Spring contact pin

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3416125A (en) * 1966-10-20 1968-12-10 Ostby & Barton Co Co-axial connector
JPS6114383U (en) * 1984-06-29 1986-01-28 株式会社ヨコオ contact probe
JPH0637337Y2 (en) * 1986-01-29 1994-09-28 横河・ヒユ−レツト・パツカ−ド株式会社 Probe device
JPH0624785Y2 (en) * 1987-06-15 1994-06-29 株式会社横尾製作所 Both ends movable contact pin
US5157325A (en) * 1991-02-15 1992-10-20 Compaq Computer Corporation Compact, wireless apparatus for electrically testing printed circuit boards
US5175493A (en) 1991-10-11 1992-12-29 Interconnect Devices, Inc. Shielded electrical contact spring probe assembly
US5936421A (en) 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
US6053777A (en) * 1998-01-05 2000-04-25 Rika Electronics International, Inc. Coaxial contact assembly apparatus
WO2000031828A2 (en) 1998-11-25 2000-06-02 Rika Electronics International, Inc. Electrical contact system

Also Published As

Publication number Publication date
WO2002007265A1 (en) 2002-01-24
TW531938B (en) 2003-05-11
US6652326B2 (en) 2003-11-25
JP2004504703A (en) 2004-02-12
US20020013085A1 (en) 2002-01-31

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