AU2001265089A1 - Rc-timer scheme - Google Patents

Rc-timer scheme

Info

Publication number: AU2001265089A1
Authority: AU; Australia
Prior art keywords: timer scheme; timer; scheme
Prior art date: 2000-06-30
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Abandoned

Application number

AU2001265089A

Inventor

Wilson Kan

Timothy Maloney

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Intel Corp

Original Assignee

Intel Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2000-06-30

Filing date

2001-05-25

Publication date

2002-01-14

2001-05-25 Application filed by Intel Corp filed Critical Intel Corp

2002-01-14 Publication of AU2001265089A1 publication Critical patent/AU2001265089A1/en

Status Abandoned legal-status Critical Current

Classifications

- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/04—Modifications for accelerating switching
- H03K17/042—Modifications for accelerating switching by feedback from the output circuit to the control circuit
- H03K17/04206—Modifications for accelerating switching by feedback from the output circuit to the control circuit in field-effect transistor switches
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/28—Modifications for introducing a time delay before switching
- H03K17/284—Modifications for introducing a time delay before switching in field effect transistor switches
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/01—Shaping pulses
- H03K5/08—Shaping pulses by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding

Landscapes

Physics & Mathematics (AREA)
Nonlinear Science (AREA)
Semiconductor Integrated Circuits (AREA)
Electronic Switches (AREA)
Emergency Protection Circuit Devices (AREA)

AU2001265089A 2000-06-30 2001-05-25 Rc-timer scheme Abandoned AU2001265089A1 (en)

Applications Claiming Priority (4)

Application Number	Priority Date	Filing Date	Title
US09/608,909 US6510033B1 (en)	2000-06-30	2000-06-30	RC-timer circuit to reduce current leakage in future semiconductor processes
US09/608,909		2000-06-30
US09608909		2000-06-30
PCT/US2001/017262 WO2002003552A2 (en)	2000-06-30	2001-05-25	Rc-timer scheme

Publications (1)

Publication Number	Publication Date
AU2001265089A1 true AU2001265089A1 (en)	2002-01-14

Family

ID=24438584

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
AU2001265089A Abandoned AU2001265089A1 (en)	2000-06-30	2001-05-25	Rc-timer scheme

Country Status (6)

Country	Link
US (2)	US6510033B1 (en)
EP (1)	EP1297628A2 (en)
CN (1)	CN100446251C (en)
AU (1)	AU2001265089A1 (en)
TW (1)	TW544554B (en)
WO (1)	WO2002003552A2 (en)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US6510033B1 (en) *	2000-06-30	2003-01-21	Intel Corporation	RC-timer circuit to reduce current leakage in future semiconductor processes
US6801416B2 (en) *	2001-08-23	2004-10-05	Institute Of Microelectronics	ESD protection system for high frequency applications
WO2003081742A1 (en) *	2002-03-22	2003-10-02	Freescale Semiconductor, Inc.	Circuit for electrostatic discharge protection
US7209332B2 (en) *	2002-12-10	2007-04-24	Freescale Semiconductor, Inc.	Transient detection circuit
US7049866B2 (en)	2004-03-24	2006-05-23	Agere Systems Inc.	Compensating for leakage currents in loop filter capacitors in PLLs and the like
US7138843B2 (en) *	2004-10-18	2006-11-21	Micrel, Incorporated	Timer circuit with adaptive reference
JP2006302971A (en) *	2005-04-15	2006-11-02	Fujitsu Ltd	Power supply clamp circuit and semiconductor device
US20070171587A1 (en) *	2006-01-26	2007-07-26	Chien-Ming Lee	Esd protection circuit with feedback technique
CN100574030C (en) *	2006-09-27	2009-12-23	鸿富锦精密工业（深圳）有限公司	Leakage current protection circuit
US20090195951A1 (en) *	2008-02-05	2009-08-06	Bart Sorgeloos	Method and Apparatus for Improved Electrostatic Discharge Protection
CN101546178B (en) *	2008-03-24	2011-08-10	纬创资通股份有限公司	Timing control device
US8267706B2 (en)	2008-11-12	2012-09-18	Panduit Corp.	Patch cord with insertion detection and light illumination capabilities
TWI379398B (en) *	2009-05-20	2012-12-11	Ind Tech Res Inst	Electrostatic discharge clamp circuit
KR101773641B1 (en)	2010-01-22	2017-09-12	가부시키가이샤 한도오따이 에네루기 켄큐쇼	Semiconductor device
US8514533B2 (en)	2010-06-24	2013-08-20	Intel Corporation	Method, apparatus, and system for protecting supply nodes from electrostatic discharge
US9013842B2 (en)	2011-01-10	2015-04-21	Infineon Technologies Ag	Semiconductor ESD circuit and method
US9425616B2 (en) *	2011-07-15	2016-08-23	Taiwan Semiconductor Manufacturing Company, Ltd.	RC triggered ESD protection device
US8413101B2 (en)	2011-07-15	2013-04-02	Infineon Technologies Ag	System and method for detecting parasitic thyristors in an integrated circuit
JP5781022B2 (en) *	2012-06-15	2015-09-16	株式会社東芝	Electrostatic protection circuit and semiconductor device
US8981857B2 (en) *	2012-11-15	2015-03-17	Freescale Semiconductor, Inc.	Temperature dependent timer circuit
CN103677027A (en) *	2013-12-04	2014-03-26	中国航空工业集团公司第六三一研究所	Time delay circuit and method based on area optimization
JP2016111186A (en) *	2014-12-05	2016-06-20	ソニー株式会社	Semiconductor integrated circuit
CN107968568B (en) *	2017-12-12	2024-03-12	清华四川能源互联网研究院	Low-power consumption constant-on-time timing circuit design method and timing circuit
US20210376788A1 (en) *	2018-08-29	2021-12-02	Arizona Board Of Regents On Behalf Of Arizona State University	Self-powered voltage ramp for photovoltaic module testing
US11095286B2 (en) *	2019-06-12	2021-08-17	Skyworks Solutions, Inc.	Electrostatic discharge clamp topology

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JPS6427094A (en) *	1987-07-23	1989-01-30	Mitsubishi Electric Corp	Mos-type semiconductor memory
JP3375659B2 (en) *	1991-03-28	2003-02-10	テキサスインスツルメンツインコーポレイテツド	Method of forming electrostatic discharge protection circuit
US5506457A (en) *	1995-04-07	1996-04-09	International Business Machines Corporation	Electronic switch for decoupling capacitor
US5770969A (en) *	1995-08-22	1998-06-23	International Business Machines Corporation	Controllable decoupling capacitor
US5835328A (en)	1995-12-21	1998-11-10	Intel Corporation	Breakdown-tiggered transient discharge circuit
US5940258A (en) *	1996-02-29	1999-08-17	Texas Instruments Incorporated	Semiconductor ESD protection circuit
US5719737A (en) *	1996-03-21	1998-02-17	Intel Corporation	Voltage-tolerant electrostatic discharge protection device for integrated circuit power supplies
US5838146A (en) *	1996-11-12	1998-11-17	Analog Devices, Inc.	Method and apparatus for providing ESD/EOS protection for IC power supply pins
US5828259A (en)	1996-11-18	1998-10-27	International Business Machines Corporation	Method and apparatus for reducing disturbances on an integrated circuit
US5789964A (en) *	1997-02-14	1998-08-04	International Business Machines Corporation	Decoupling capacitor network for off-state operation
US5907464A (en)	1997-03-24	1999-05-25	Intel Corporation	MOSFET-based power supply clamps for electrostatic discharge protection of integrated circuits
US5892381A (en) *	1997-06-03	1999-04-06	Motorola, Inc.	Fast start-up circuit
US5978192A (en) *	1997-11-05	1999-11-02	Harris Corporation	Schmitt trigger-configured ESD protection circuit
US5956219A (en)	1998-06-08	1999-09-21	Intel Corporation	High voltage power supply clamp circuitry for electrostatic discharge (ESD) protection
US6008970A (en)	1998-06-17	1999-12-28	Intel Corporation	Power supply clamp circuitry for electrostatic discharge (ESD) protection
US5946177A (en) *	1998-08-17	1999-08-31	Motorola, Inc.	Circuit for electrostatic discharge protection
US6084464A (en) *	1999-10-29	2000-07-04	Vlsi Technology, Inc	On-chip decoupling capacitor system with parallel fuse
US6510033B1 (en) *	2000-06-30	2003-01-21	Intel Corporation	RC-timer circuit to reduce current leakage in future semiconductor processes
US6556408B1 (en) *	2000-07-31	2003-04-29	Texas Instruments Incorporated	Compensation circuit for leakage through electrostatic discharge protection devices

2000
- 2000-06-30 US US09/608,909 patent/US6510033B1/en not_active Expired - Fee Related
2001
- 2001-04-16 TW TW090109042A patent/TW544554B/en not_active IP Right Cessation
- 2001-05-25 EP EP01939587A patent/EP1297628A2/en not_active Ceased
- 2001-05-25 AU AU2001265089A patent/AU2001265089A1/en not_active Abandoned
- 2001-05-25 CN CNB018146015A patent/CN100446251C/en not_active Expired - Fee Related
- 2001-05-25 WO PCT/US2001/017262 patent/WO2002003552A2/en not_active Ceased
2003
- 2003-01-21 US US10/349,302 patent/US6795286B2/en not_active Expired - Fee Related

Also Published As

Publication number	Publication date
EP1297628A2 (en)	2003-04-02
CN1449584A (en)	2003-10-15
TW544554B (en)	2003-08-01
WO2002003552A3 (en)	2002-07-18
US6795286B2 (en)	2004-09-21
US20030107858A1 (en)	2003-06-12
US6510033B1 (en)	2003-01-21
WO2002003552A2 (en)	2002-01-10
CN100446251C (en)	2008-12-24

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