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AU2000274441A1 - Optical measurement apparatus and method for optical measurement - Google Patents

Optical measurement apparatus and method for optical measurement

Info

Publication number
AU2000274441A1
AU2000274441A1 AU2000274441A AU7444100A AU2000274441A1 AU 2000274441 A1 AU2000274441 A1 AU 2000274441A1 AU 2000274441 A AU2000274441 A AU 2000274441A AU 7444100 A AU7444100 A AU 7444100A AU 2000274441 A1 AU2000274441 A1 AU 2000274441A1
Authority
AU
Australia
Prior art keywords
optical measurement
measurement apparatus
optical
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2000274441A
Inventor
Yoshihiko Kawai
Tetsuya Morita
Koichiro Oba
Motohiro Suyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of AU2000274441A1 publication Critical patent/AU2000274441A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/442—Single-photon detection or photon counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/4433—Peak sensing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/444—Compensating; Calibrating, e.g. dark current, temperature drift, noise reduction or baseline correction; Adjusting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • G01J2001/4466—Avalanche

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
AU2000274441A 2000-09-25 2000-09-25 Optical measurement apparatus and method for optical measurement Abandoned AU2000274441A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2000/006562 WO2002027284A1 (en) 2000-09-25 2000-09-25 Optical measurement apparatus and method for optical measurement

Publications (1)

Publication Number Publication Date
AU2000274441A1 true AU2000274441A1 (en) 2002-04-08

Family

ID=11736511

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2000274441A Abandoned AU2000274441A1 (en) 2000-09-25 2000-09-25 Optical measurement apparatus and method for optical measurement

Country Status (4)

Country Link
US (1) US6940589B1 (en)
EP (1) EP1329700A4 (en)
AU (1) AU2000274441A1 (en)
WO (1) WO2002027284A1 (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2398118B (en) * 2003-02-07 2006-03-15 Imp College Innovations Ltd Photon arrival time detection
WO2004099865A2 (en) * 2003-05-02 2004-11-18 Massachusetts Institute Of Technology Digital photon-counting geiger-mode avalanche photodiode solid-state monolithic intensity imaging focal-plane with scalable readout circuitry
ITUD20050119A1 (en) * 2005-07-18 2007-01-19 Neuricam Spa PHOTOSENSITIVE ELEMENT FOR ELECTRO-OPTICAL SENSORS
US7576326B2 (en) 2006-06-07 2009-08-18 Xrf Corporation Devices and methods for detecting and analyzing radiation
CA2673386A1 (en) * 2006-12-22 2008-07-03 Washington University High performance imaging system for diffuse optical tomography and associated method of use
US9480425B2 (en) 2008-04-17 2016-11-01 Washington University Task-less optical mapping of dynamic brain function using resting state functional connectivity
JP5494063B2 (en) * 2010-03-17 2014-05-14 コニカミノルタ株式会社 Control device and image forming apparatus
CN106052861B (en) * 2016-07-27 2017-08-29 武汉京邦科技有限公司 A kind of silicon photoelectric multiplier test system and method for testing
FR3058230B1 (en) * 2016-10-27 2019-03-15 Detection Technology Sas SPECTROMETRY DEVICE
CN106949979A (en) * 2017-02-09 2017-07-14 北京建筑大学 A kind of light velocity measurement method based on LC oscillating circuits
US10852399B2 (en) * 2018-03-30 2020-12-01 Tower Semiconductor Ltd. Active quenching for single-photon avalanche diode using one- shot circuit
EP3930312B8 (en) * 2020-06-26 2023-10-25 Alpsentek GmbH Delta image sensor with digital pixel storage
CN119688093B (en) * 2024-12-13 2025-09-30 季华实验室 Single-photon detector performance parameter measurement method, device, equipment and medium

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63184073A (en) * 1986-07-23 1988-07-29 Shimadzu Corp Peak value detection circuit
JP3413241B2 (en) 1993-05-07 2003-06-03 浜松ホトニクス株式会社 Electron tube
US5349193A (en) * 1993-05-20 1994-09-20 Princeton Gamma Tech, Inc. Highly sensitive nuclear spectrometer apparatus and method
JPH08148113A (en) * 1994-11-24 1996-06-07 Hamamatsu Photonics Kk Photomultiplier tube
FR2738919B1 (en) * 1995-09-15 1997-10-17 Commissariat Energie Atomique METHOD AND DEVICE FOR THE CORRECTION OF SPECTROMETRIC MEASUREMENT IN THE FIELD OF GAMMA PHOTON DETECTION
JPH09196752A (en) * 1995-11-15 1997-07-31 Bunshi Bio Photonics Kenkyusho:Kk Photometric device
JPH09189604A (en) * 1996-01-11 1997-07-22 Hamamatsu Photonics Kk Method for determining counting prohibited time, and photon counter
JPH09297055A (en) 1996-05-02 1997-11-18 Hamamatsu Photonics Kk Electron tube
JPH09312145A (en) 1996-05-23 1997-12-02 Hamamatsu Photonics Kk Electron tube
JPH10300573A (en) * 1997-04-30 1998-11-13 Asahi Optical Co Ltd Light intensity measurement device
JP3742490B2 (en) 1997-07-22 2006-02-01 浜松ホトニクス株式会社 Optical waveform measuring device
JP3742491B2 (en) 1997-07-22 2006-02-01 浜松ホトニクス株式会社 Optical waveform measuring device
US6189221B1 (en) * 1998-12-31 2001-02-20 The Rival Company Can opener appliance having a side-cutting mechanism
JP2000275101A (en) * 1999-03-26 2000-10-06 Hamamatsu Photonics Kk Apparatus and method for measuring light

Also Published As

Publication number Publication date
WO2002027284A1 (en) 2002-04-04
EP1329700A1 (en) 2003-07-23
US6940589B1 (en) 2005-09-06
EP1329700A4 (en) 2011-03-23

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