ATE488011T1 - OPTICAL DEVICE MADE OF A MULTIPLE CURVED OPTICAL CRYSTALS FOR FOCUSING X-RAYS - Google Patents
OPTICAL DEVICE MADE OF A MULTIPLE CURVED OPTICAL CRYSTALS FOR FOCUSING X-RAYSInfo
- Publication number
- ATE488011T1 ATE488011T1 AT03766927T AT03766927T ATE488011T1 AT E488011 T1 ATE488011 T1 AT E488011T1 AT 03766927 T AT03766927 T AT 03766927T AT 03766927 T AT03766927 T AT 03766927T AT E488011 T1 ATE488011 T1 AT E488011T1
- Authority
- AT
- Austria
- Prior art keywords
- rays
- crystals
- capture
- divergent
- focusing
- Prior art date
Links
- 239000013078 crystal Substances 0.000 title abstract 5
- 230000003287 optical effect Effects 0.000 title abstract 3
- 230000005670 electromagnetic radiation Effects 0.000 abstract 1
- 229910052732 germanium Inorganic materials 0.000 abstract 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 abstract 1
- 239000011159 matrix material Substances 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Particle Accelerators (AREA)
Abstract
Devices for improving the capturing and utilization of high-energy electromagnetic radiation, for example, x-rays, gamma rays, and neutrons, for use in physical, medical, and industrial analysis and control applications are disclosed. The devices include optics having a plurality of optical crystals, for example, doubly-curved silicon or germanium crystals, arranged to optimize the capture and redirection of divergent radiation via Bragg diffraction. In one aspect, a plurality of optic crystals having varying atomic diffraction plane orientations are used to capture and focus divergent x-rays upon a target. In another aspect, a two- or three-dimensional matrix of crystals is positioned relative to an x-ray source to capture and focus divergent x-rays in three dimensions.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US40080902P | 2002-08-02 | 2002-08-02 | |
| PCT/US2003/023412 WO2004013867A2 (en) | 2002-08-02 | 2003-07-25 | An optical device for directing x-rays having a plurality of optical crystals |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE488011T1 true ATE488011T1 (en) | 2010-11-15 |
Family
ID=31495884
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT03766927T ATE488011T1 (en) | 2002-08-02 | 2003-07-25 | OPTICAL DEVICE MADE OF A MULTIPLE CURVED OPTICAL CRYSTALS FOR FOCUSING X-RAYS |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7035374B2 (en) |
| EP (1) | EP1527461B1 (en) |
| JP (1) | JP2005534921A (en) |
| AT (1) | ATE488011T1 (en) |
| AU (1) | AU2003256831A1 (en) |
| DE (1) | DE60334910D1 (en) |
| WO (1) | WO2004013867A2 (en) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101520423B (en) * | 2003-03-27 | 2011-01-19 | 株式会社理学 | X-ray fluorescence analyzer |
| JP5031215B2 (en) * | 2004-09-21 | 2012-09-19 | ジョルダン バレー アプライド ラディエイション リミテッド | Multifunctional X-ray analysis system |
| JP4121146B2 (en) * | 2005-06-24 | 2008-07-23 | 株式会社リガク | Twin analyzer |
| CN101356589B (en) * | 2005-08-01 | 2013-02-27 | 纽约州立大学研究基金会 | X-ray imaging systems employing point-focusing, curved monochromating optics |
| US7738629B2 (en) * | 2006-11-16 | 2010-06-15 | X-Ray Optical Systems, Inc. | X-ray focusing optic having multiple layers with respective crystal orientations |
| JP2008191547A (en) * | 2007-02-07 | 2008-08-21 | Japan Atomic Energy Agency | Multilayer nonuniform pitch grooves concave diffraction grating and diffraction grating spectroscope |
| US20090041198A1 (en) * | 2007-08-07 | 2009-02-12 | General Electric Company | Highly collimated and temporally variable x-ray beams |
| JP2010014418A (en) * | 2008-07-01 | 2010-01-21 | Japan Atomic Energy Agency | Multilayer film grating spectroscope |
| JP5344123B2 (en) * | 2008-07-18 | 2013-11-20 | 独立行政法人 宇宙航空研究開発機構 | X-ray reflector, X-ray reflector, and method for producing X-ray reflector |
| US8041008B2 (en) * | 2009-01-29 | 2011-10-18 | The Invention Science Fund I, Llc | Diagnostic delivery service |
| US8130904B2 (en) * | 2009-01-29 | 2012-03-06 | The Invention Science Fund I, Llc | Diagnostic delivery service |
| US8130908B2 (en) * | 2009-02-23 | 2012-03-06 | X-Ray Optical Systems, Inc. | X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic |
| EP2438431A4 (en) * | 2009-06-03 | 2013-10-23 | Thermo Scient Portable Analytical Instr Inc | X-ray system and methods with detector interior to focusing element |
| US8537967B2 (en) * | 2009-09-10 | 2013-09-17 | University Of Washington | Short working distance spectrometer and associated devices, systems, and methods |
| US8058621B2 (en) * | 2009-10-26 | 2011-11-15 | General Electric Company | Elemental composition detection system and method |
| US8243878B2 (en) | 2010-01-07 | 2012-08-14 | Jordan Valley Semiconductors Ltd. | High-resolution X-ray diffraction measurement with enhanced sensitivity |
| US8687766B2 (en) | 2010-07-13 | 2014-04-01 | Jordan Valley Semiconductors Ltd. | Enhancing accuracy of fast high-resolution X-ray diffractometry |
| US8437450B2 (en) | 2010-12-02 | 2013-05-07 | Jordan Valley Semiconductors Ltd. | Fast measurement of X-ray diffraction from tilted layers |
| US8781070B2 (en) | 2011-08-11 | 2014-07-15 | Jordan Valley Semiconductors Ltd. | Detection of wafer-edge defects |
| US9057685B2 (en) | 2011-08-15 | 2015-06-16 | X-Ray Optical Systems, Inc. | Sample viscosity and flow control for heavy samples, and X-ray analysis applications thereof |
| US9335280B2 (en) | 2011-10-06 | 2016-05-10 | X-Ray Optical Systems, Inc. | Mobile transport and shielding apparatus for removable x-ray analyzer |
| WO2013063253A1 (en) | 2011-10-26 | 2013-05-02 | X-Ray Optical Systems, Inc. | Support structure and highly aligned monochromating x-ray optics for x-ray analysis engines and analyzers |
| WO2013130525A1 (en) * | 2012-02-28 | 2013-09-06 | X-Ray Optical Systems, Inc. | X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics |
| KR101316794B1 (en) | 2012-06-25 | 2013-10-11 | 한국과학기술연구원 | Neutron focusing apparatus for ultra sammall angle neutron scattering |
| US9883793B2 (en) | 2013-08-23 | 2018-02-06 | The Schepens Eye Research Institute, Inc. | Spatial modeling of visual fields |
| US9726624B2 (en) | 2014-06-18 | 2017-08-08 | Bruker Jv Israel Ltd. | Using multiple sources/detectors for high-throughput X-ray topography measurement |
| WO2016108235A1 (en) * | 2014-12-30 | 2016-07-07 | Convergent R.N.R Ltd | New constructions of x-ray lenses for converging x-rays |
| US11250968B2 (en) | 2014-12-30 | 2022-02-15 | Convergent R.N.R. Ltd. | Constructions of x-ray lenses for converging x-rays |
| JP6069609B2 (en) * | 2015-03-26 | 2017-02-01 | 株式会社リガク | Double-curved X-ray condensing element and its constituent, double-curved X-ray spectroscopic element and method for producing the constituent |
| US10677744B1 (en) * | 2016-06-03 | 2020-06-09 | U.S. Department Of Energy | Multi-cone x-ray imaging Bragg crystal spectrometer |
| JP7418208B2 (en) * | 2016-09-15 | 2024-01-19 | ユニバーシティ オブ ワシントン | X-ray spectrometer and its usage |
| FR3079035B1 (en) * | 2018-03-14 | 2022-10-28 | Alpyx | OPTICAL DEVICE FOR X-RAYS |
| KR102718046B1 (en) * | 2018-07-04 | 2024-10-17 | 가부시키가이샤 리가쿠 | X-ray Fluorescence Spectrometer |
| EP4035186A4 (en) * | 2019-09-24 | 2022-12-07 | Convergent R.N.R Ltd | X-ray optical arrangement |
| US11874239B2 (en) * | 2022-03-11 | 2024-01-16 | Uchicago Argonne, Llc | Advanced X-ray emission spectrometers |
| US12247934B2 (en) | 2022-07-29 | 2025-03-11 | X-Ray Optical Systems, Inc. | Polarized, energy dispersive x-ray fluorescence system and method |
| CN115791855B (en) * | 2022-11-14 | 2025-03-18 | 中国科学院上海光学精密机械研究所 | Backlit X-ray diffraction imaging device based on bent crystal coupling |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3927319A (en) * | 1974-06-28 | 1975-12-16 | Univ Southern California | Crystal for X-ray crystal spectrometer |
| NL8302263A (en) * | 1983-06-27 | 1985-01-16 | Philips Nv | ROENTGEN ANALYSIS DEVICE WITH DOUBLE CURVED MONOCHROMATOR CRYSTAL. |
| JPH02257100A (en) * | 1989-03-29 | 1990-10-17 | Shimadzu Corp | Manufacturing method of Johansson-type curved crystal |
| US5127028A (en) * | 1990-08-01 | 1992-06-30 | Wittry David B | Diffractord with doubly curved surface steps |
| DE4027285A1 (en) * | 1990-08-29 | 1992-03-05 | Zeiss Carl Fa | X-RAY MICROSCOPE |
| US5315113A (en) * | 1992-09-29 | 1994-05-24 | The Perkin-Elmer Corporation | Scanning and high resolution x-ray photoelectron spectroscopy and imaging |
| JP2922758B2 (en) * | 1993-08-27 | 1999-07-26 | 理学電機工業株式会社 | X-ray spectrometer |
| JPH09166488A (en) * | 1995-12-13 | 1997-06-24 | Shimadzu Corp | X-ray spectrometer |
| US5787146A (en) * | 1996-10-18 | 1998-07-28 | Spad Technologies, Inc. | X-ray imaging system using diffractive x-ray optics for high definition low dosage three dimensional imaging of soft tissue |
| EP0884736B1 (en) * | 1997-06-11 | 2004-01-28 | Istituto Nazionale Di Fisica Nucleare | Multi-stepped diffractor constructed with constant step width angle (multi-stepped monochromator) |
| US6285506B1 (en) * | 1999-01-21 | 2001-09-04 | X-Ray Optical Systems, Inc. | Curved optical device and method of fabrication |
| US6317483B1 (en) * | 1999-11-29 | 2001-11-13 | X-Ray Optical Systems, Inc. | Doubly curved optical device with graded atomic planes |
| US6606371B2 (en) * | 1999-12-20 | 2003-08-12 | Agere Systems Inc. | X-ray system |
-
2003
- 2003-07-25 AU AU2003256831A patent/AU2003256831A1/en not_active Abandoned
- 2003-07-25 AT AT03766927T patent/ATE488011T1/en not_active IP Right Cessation
- 2003-07-25 JP JP2004526172A patent/JP2005534921A/en active Pending
- 2003-07-25 EP EP03766927A patent/EP1527461B1/en not_active Expired - Lifetime
- 2003-07-25 DE DE60334910T patent/DE60334910D1/en not_active Expired - Lifetime
- 2003-07-25 WO PCT/US2003/023412 patent/WO2004013867A2/en not_active Ceased
-
2005
- 2005-02-01 US US11/048,146 patent/US7035374B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| DE60334910D1 (en) | 2010-12-23 |
| US7035374B2 (en) | 2006-04-25 |
| EP1527461B1 (en) | 2010-11-10 |
| AU2003256831A8 (en) | 2004-02-23 |
| JP2005534921A (en) | 2005-11-17 |
| EP1527461A2 (en) | 2005-05-04 |
| AU2003256831A1 (en) | 2004-02-23 |
| WO2004013867A2 (en) | 2004-02-12 |
| WO2004013867A3 (en) | 2004-08-05 |
| US20050201517A1 (en) | 2005-09-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |