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ATE488011T1 - OPTICAL DEVICE MADE OF A MULTIPLE CURVED OPTICAL CRYSTALS FOR FOCUSING X-RAYS - Google Patents

OPTICAL DEVICE MADE OF A MULTIPLE CURVED OPTICAL CRYSTALS FOR FOCUSING X-RAYS

Info

Publication number
ATE488011T1
ATE488011T1 AT03766927T AT03766927T ATE488011T1 AT E488011 T1 ATE488011 T1 AT E488011T1 AT 03766927 T AT03766927 T AT 03766927T AT 03766927 T AT03766927 T AT 03766927T AT E488011 T1 ATE488011 T1 AT E488011T1
Authority
AT
Austria
Prior art keywords
rays
crystals
capture
divergent
focusing
Prior art date
Application number
AT03766927T
Other languages
German (de)
Inventor
Zewu Chen
Original Assignee
X Ray Optical Sys Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by X Ray Optical Sys Inc filed Critical X Ray Optical Sys Inc
Application granted granted Critical
Publication of ATE488011T1 publication Critical patent/ATE488011T1/en

Links

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Particle Accelerators (AREA)

Abstract

Devices for improving the capturing and utilization of high-energy electromagnetic radiation, for example, x-rays, gamma rays, and neutrons, for use in physical, medical, and industrial analysis and control applications are disclosed. The devices include optics having a plurality of optical crystals, for example, doubly-curved silicon or germanium crystals, arranged to optimize the capture and redirection of divergent radiation via Bragg diffraction. In one aspect, a plurality of optic crystals having varying atomic diffraction plane orientations are used to capture and focus divergent x-rays upon a target. In another aspect, a two- or three-dimensional matrix of crystals is positioned relative to an x-ray source to capture and focus divergent x-rays in three dimensions.
AT03766927T 2002-08-02 2003-07-25 OPTICAL DEVICE MADE OF A MULTIPLE CURVED OPTICAL CRYSTALS FOR FOCUSING X-RAYS ATE488011T1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40080902P 2002-08-02 2002-08-02
PCT/US2003/023412 WO2004013867A2 (en) 2002-08-02 2003-07-25 An optical device for directing x-rays having a plurality of optical crystals

Publications (1)

Publication Number Publication Date
ATE488011T1 true ATE488011T1 (en) 2010-11-15

Family

ID=31495884

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03766927T ATE488011T1 (en) 2002-08-02 2003-07-25 OPTICAL DEVICE MADE OF A MULTIPLE CURVED OPTICAL CRYSTALS FOR FOCUSING X-RAYS

Country Status (7)

Country Link
US (1) US7035374B2 (en)
EP (1) EP1527461B1 (en)
JP (1) JP2005534921A (en)
AT (1) ATE488011T1 (en)
AU (1) AU2003256831A1 (en)
DE (1) DE60334910D1 (en)
WO (1) WO2004013867A2 (en)

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CN101356589B (en) * 2005-08-01 2013-02-27 纽约州立大学研究基金会 X-ray imaging systems employing point-focusing, curved monochromating optics
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US20090041198A1 (en) * 2007-08-07 2009-02-12 General Electric Company Highly collimated and temporally variable x-ray beams
JP2010014418A (en) * 2008-07-01 2010-01-21 Japan Atomic Energy Agency Multilayer film grating spectroscope
JP5344123B2 (en) * 2008-07-18 2013-11-20 独立行政法人 宇宙航空研究開発機構 X-ray reflector, X-ray reflector, and method for producing X-ray reflector
US8041008B2 (en) * 2009-01-29 2011-10-18 The Invention Science Fund I, Llc Diagnostic delivery service
US8130904B2 (en) * 2009-01-29 2012-03-06 The Invention Science Fund I, Llc Diagnostic delivery service
US8130908B2 (en) * 2009-02-23 2012-03-06 X-Ray Optical Systems, Inc. X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
EP2438431A4 (en) * 2009-06-03 2013-10-23 Thermo Scient Portable Analytical Instr Inc X-ray system and methods with detector interior to focusing element
US8537967B2 (en) * 2009-09-10 2013-09-17 University Of Washington Short working distance spectrometer and associated devices, systems, and methods
US8058621B2 (en) * 2009-10-26 2011-11-15 General Electric Company Elemental composition detection system and method
US8243878B2 (en) 2010-01-07 2012-08-14 Jordan Valley Semiconductors Ltd. High-resolution X-ray diffraction measurement with enhanced sensitivity
US8687766B2 (en) 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
US8437450B2 (en) 2010-12-02 2013-05-07 Jordan Valley Semiconductors Ltd. Fast measurement of X-ray diffraction from tilted layers
US8781070B2 (en) 2011-08-11 2014-07-15 Jordan Valley Semiconductors Ltd. Detection of wafer-edge defects
US9057685B2 (en) 2011-08-15 2015-06-16 X-Ray Optical Systems, Inc. Sample viscosity and flow control for heavy samples, and X-ray analysis applications thereof
US9335280B2 (en) 2011-10-06 2016-05-10 X-Ray Optical Systems, Inc. Mobile transport and shielding apparatus for removable x-ray analyzer
WO2013063253A1 (en) 2011-10-26 2013-05-02 X-Ray Optical Systems, Inc. Support structure and highly aligned monochromating x-ray optics for x-ray analysis engines and analyzers
WO2013130525A1 (en) * 2012-02-28 2013-09-06 X-Ray Optical Systems, Inc. X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics
KR101316794B1 (en) 2012-06-25 2013-10-11 한국과학기술연구원 Neutron focusing apparatus for ultra sammall angle neutron scattering
US9883793B2 (en) 2013-08-23 2018-02-06 The Schepens Eye Research Institute, Inc. Spatial modeling of visual fields
US9726624B2 (en) 2014-06-18 2017-08-08 Bruker Jv Israel Ltd. Using multiple sources/detectors for high-throughput X-ray topography measurement
WO2016108235A1 (en) * 2014-12-30 2016-07-07 Convergent R.N.R Ltd New constructions of x-ray lenses for converging x-rays
US11250968B2 (en) 2014-12-30 2022-02-15 Convergent R.N.R. Ltd. Constructions of x-ray lenses for converging x-rays
JP6069609B2 (en) * 2015-03-26 2017-02-01 株式会社リガク Double-curved X-ray condensing element and its constituent, double-curved X-ray spectroscopic element and method for producing the constituent
US10677744B1 (en) * 2016-06-03 2020-06-09 U.S. Department Of Energy Multi-cone x-ray imaging Bragg crystal spectrometer
JP7418208B2 (en) * 2016-09-15 2024-01-19 ユニバーシティ オブ ワシントン X-ray spectrometer and its usage
FR3079035B1 (en) * 2018-03-14 2022-10-28 Alpyx OPTICAL DEVICE FOR X-RAYS
KR102718046B1 (en) * 2018-07-04 2024-10-17 가부시키가이샤 리가쿠 X-ray Fluorescence Spectrometer
EP4035186A4 (en) * 2019-09-24 2022-12-07 Convergent R.N.R Ltd X-ray optical arrangement
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Also Published As

Publication number Publication date
DE60334910D1 (en) 2010-12-23
US7035374B2 (en) 2006-04-25
EP1527461B1 (en) 2010-11-10
AU2003256831A8 (en) 2004-02-23
JP2005534921A (en) 2005-11-17
EP1527461A2 (en) 2005-05-04
AU2003256831A1 (en) 2004-02-23
WO2004013867A2 (en) 2004-02-12
WO2004013867A3 (en) 2004-08-05
US20050201517A1 (en) 2005-09-15

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