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ATE386335T1 - ATMOSPHERIC PRESSURE PHOTOIONIZATION: A NEW IONIZATION PROCESS FOR LIQUID CHROMATOGRAPHY-MASS SPECROMETRY - Google Patents

ATMOSPHERIC PRESSURE PHOTOIONIZATION: A NEW IONIZATION PROCESS FOR LIQUID CHROMATOGRAPHY-MASS SPECROMETRY

Info

Publication number
ATE386335T1
ATE386335T1 AT00972498T AT00972498T ATE386335T1 AT E386335 T1 ATE386335 T1 AT E386335T1 AT 00972498 T AT00972498 T AT 00972498T AT 00972498 T AT00972498 T AT 00972498T AT E386335 T1 ATE386335 T1 AT E386335T1
Authority
AT
Austria
Prior art keywords
atmospheric pressure
analyte
ionization
dopant
spray
Prior art date
Application number
AT00972498T
Other languages
German (de)
Inventor
Damon Robb
Andries Bruins
Original Assignee
Mds Inc Through Its Mds Sciex
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mds Inc Through Its Mds Sciex filed Critical Mds Inc Through Its Mds Sciex
Application granted granted Critical
Publication of ATE386335T1 publication Critical patent/ATE386335T1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Extraction Or Liquid Replacement (AREA)

Abstract

There is provided a method of, and apparatus for, analyzing a sample of an analyte provided as a sample solution comprising a solvent and an analyte. A dopant is provided, either separately or as the solvent of the sample solution. The sample solution is formed into a spray, for example in a nebulizer, and the solvent evaporated. The sample stream is irradiated in a region at atmospheric pressure, either in the liquid state prior to formation of a spray, or in the liquid state after formation of a droplet spray, or in the vapour state after evaporation of the sprayed droplets, to ionize the dopant. Then, subsequent collisions between the ionized dopant and the analyte, either directly or indirectly, result in ionization of the analyte. Analyte ions are passed from the atmospheric pressure ionization region into a mass analyzer for mass analysis. This technique has been found to give much enhanced ionization for some substances, as compared to atmospheric pressure chemical ionization.
AT00972498T 1999-10-29 2000-10-26 ATMOSPHERIC PRESSURE PHOTOIONIZATION: A NEW IONIZATION PROCESS FOR LIQUID CHROMATOGRAPHY-MASS SPECROMETRY ATE386335T1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US16270999P 1999-10-29 1999-10-29

Publications (1)

Publication Number Publication Date
ATE386335T1 true ATE386335T1 (en) 2008-03-15

Family

ID=22586814

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00972498T ATE386335T1 (en) 1999-10-29 2000-10-26 ATMOSPHERIC PRESSURE PHOTOIONIZATION: A NEW IONIZATION PROCESS FOR LIQUID CHROMATOGRAPHY-MASS SPECROMETRY

Country Status (8)

Country Link
US (1) US6534765B1 (en)
EP (1) EP1226602B1 (en)
JP (1) JP4600909B2 (en)
AT (1) ATE386335T1 (en)
AU (1) AU772052B2 (en)
CA (1) CA2386832C (en)
DE (1) DE60038033T2 (en)
WO (1) WO2001033605A2 (en)

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WO2006060130A2 (en) * 2004-11-09 2006-06-08 E.I. Dupont De Nemours And Company Ion source for a mass spectrometer
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US7138626B1 (en) 2005-05-05 2006-11-21 Eai Corporation Method and device for non-contact sampling and detection
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US7642510B2 (en) * 2006-08-22 2010-01-05 E.I. Du Pont De Nemours And Company Ion source for a mass spectrometer
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Also Published As

Publication number Publication date
CA2386832A1 (en) 2001-05-10
DE60038033T2 (en) 2009-04-23
JP2003515105A (en) 2003-04-22
WO2001033605A3 (en) 2002-01-03
DE60038033D1 (en) 2008-03-27
CA2386832C (en) 2009-09-29
JP4600909B2 (en) 2010-12-22
WO2001033605A2 (en) 2001-05-10
AU1122101A (en) 2001-05-14
WO2001033605A9 (en) 2002-08-29
AU772052B2 (en) 2004-04-08
EP1226602B1 (en) 2008-02-13
EP1226602A2 (en) 2002-07-31
US6534765B1 (en) 2003-03-18

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