[go: up one dir, main page]

AR070418A1 - Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco - Google Patents

Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco

Info

Publication number
AR070418A1
AR070418A1 ARP090100485A ARP090100485A AR070418A1 AR 070418 A1 AR070418 A1 AR 070418A1 AR P090100485 A ARP090100485 A AR P090100485A AR P090100485 A ARP090100485 A AR P090100485A AR 070418 A1 AR070418 A1 AR 070418A1
Authority
AR
Argentina
Prior art keywords
focus error
sample
frequency
expansion
magnitude
Prior art date
Application number
ARP090100485A
Other languages
English (en)
Inventor
Francisco Balzarotti
Andrea Veronica Bragas
Oscar Eduardo Martinez
Esteban Alejo Domene
Nelida Mingolo
Original Assignee
Consejo Nac Invest Cient Tec
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Consejo Nac Invest Cient Tec filed Critical Consejo Nac Invest Cient Tec
Priority to ARP090100485A priority Critical patent/AR070418A1/es
Priority to BRPI1000503-0A priority patent/BRPI1000503A2/pt
Priority to US12/704,879 priority patent/US8622612B2/en
Publication of AR070418A1 publication Critical patent/AR070418A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/16—Investigating or analyzing materials by the use of thermal means by investigating thermal coefficient of expansion

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Se mide una senal de error de foco resultante de la dilatacion inducida fototérmicamente en una muestra del material bajo análisis. Se dispone un láser como fuente de calentamiento modulada periodicamente que se hace incidir en la muestra y un dispositivo de medicion de error de foco que incide en la superficie que esta siendo calentada. Un dispositivo medidor de error de foco genera una senal representativa del desplazamiento de la superficie del material en direccion perpendicular debido a la dilatacion producida por el calentamiento periodico, la cual es filtrada analogica o digitalmente para discriminar la componente del desplazamiento a la frecuencia en que fue modulado o a alguna otra frecuencia relacionada con ésta, como alguna armonica o suma con otra modulacion. La senal de error de foco, calibrada adecuadamente, da una medida precisa y sensible de la magnitud de la dilatacion. Dicha magnitud y su dependencia con la frecuencia de la modulacion permite determinar propiedades físicas como el coeficiente de dilatacion o el de difusividad térmica, el espesor de la película de recubrimiento o el coeficiente de absorcion de la luz incidente en el haz de calentamiento. Variando la longitud de onda de la radiacion incidente es posible determinar el espectro de absorcion de la muestra aun para partículas de muy pequeno tamano en que la fraccion de energía absorbida es minuscula.
ARP090100485A 2009-02-12 2009-02-12 Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco AR070418A1 (es)

Priority Applications (3)

Application Number Priority Date Filing Date Title
ARP090100485A AR070418A1 (es) 2009-02-12 2009-02-12 Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco
BRPI1000503-0A BRPI1000503A2 (pt) 2009-02-12 2010-02-11 mÉtodo para determinar a dilataÇço tÉrmica de um material e aparelho para determinar a dilataÇço tÉrmica de um material
US12/704,879 US8622612B2 (en) 2009-02-12 2010-02-12 Method and apparatus for determining the thermal expansion of a material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ARP090100485A AR070418A1 (es) 2009-02-12 2009-02-12 Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco

Publications (1)

Publication Number Publication Date
AR070418A1 true AR070418A1 (es) 2010-04-07

Family

ID=42138868

Family Applications (1)

Application Number Title Priority Date Filing Date
ARP090100485A AR070418A1 (es) 2009-02-12 2009-02-12 Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco

Country Status (3)

Country Link
US (1) US8622612B2 (es)
AR (1) AR070418A1 (es)
BR (1) BRPI1000503A2 (es)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012172524A1 (en) 2011-06-17 2012-12-20 Consejo Nacional De Investigaciones Cientificas Y Tecnicas (Conicet) Method and photothermal apparatus for contactless determination of thermal and optical properties of material

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010061950A1 (de) * 2010-11-25 2012-05-31 Carl Zeiss Smt Gmbh Verfahren sowie Anordnung zum Bestimmen des Erwärmungszustandes eines Spiegels in einem optischen System
DE102011051561A1 (de) * 2011-07-05 2013-01-10 BÄHR-Thermoanalyse GmbH Dilatometer zur Messung von metallischen Proben
US8992076B2 (en) 2010-12-15 2015-03-31 Waters Gmbh Dilatometer for measuring metallic samples
FR2980846B1 (fr) * 2011-10-03 2014-05-30 Commissariat Energie Atomique Procede de determination sans contact de l'epaisseur d'un echantillon, systeme correspondant
WO2014094882A1 (en) * 2012-12-21 2014-06-26 European Space Agency Additive manufacturing method using focused light heating source
FR3007831B1 (fr) * 2013-07-01 2015-06-19 Enovasense Procede de mesure de l'epaisseur d'une couche d'un materiau, procede de galvanisation et dispositif de mesure associes
US9939396B2 (en) * 2015-01-30 2018-04-10 Netzsch-Gerätebau GmbH 3D diffusivity
RU2610550C1 (ru) * 2015-09-14 2017-02-13 Шлюмберже Текнолоджи Б.В. Способ определения температурного коэффициента линейного расширения материала и устройство для его осуществления
MX2019011322A (es) * 2017-03-24 2020-01-27 Corning Inc Sistemas y métodos para medir la temperatura del vidrio durante la conversión del tubo.
CN110057313A (zh) * 2019-03-21 2019-07-26 天津大学 一种自动激光聚焦形貌测量系统
CN112881459B (zh) * 2021-01-12 2021-10-26 清华大学 薄膜材料热膨胀系数的测试装置
CN113008929B (zh) * 2021-02-22 2025-03-21 哈尔滨工业大学（深圳） 热导测量装置、系统及方法
CN113267526B (zh) * 2021-05-13 2024-04-02 今化科技(武汉)有限公司 一种硅烷交联聚乙烯电缆料的热收缩性能测试方法
US12459852B2 (en) 2021-05-24 2025-11-04 Corning Incorporated Feedback control systems and methods for glass tube converting processes
US12060295B2 (en) 2021-05-24 2024-08-13 Corning Incorporated Converter systems and methods for controlling operation of glass tube converting processes
CN115561554B (zh) * 2022-10-17 2023-07-14 中国空气动力研究与发展中心超高速空气动力研究所 基于聚光灯加热的热透波材料电性能的测试装置及方法
CN120594589B (zh) * 2025-08-06 2025-10-21 四川领先微晶玻璃有限公司 一种用于低膨胀微晶玻璃的膨胀系数分析系统

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI64465C (fi) * 1982-03-15 1983-11-10 Mauri Luukkala Foerfarande och apparat foer att maeta ytornas egenskaper av fasta tillstaondets materialer
US4679946A (en) * 1984-05-21 1987-07-14 Therma-Wave, Inc. Evaluating both thickness and compositional variables in a thin film sample
US4989980A (en) * 1989-03-02 1991-02-05 Honeywell Inc. Method and apparatus for measuring coefficient of thermal expansion
US5479261A (en) * 1991-05-29 1995-12-26 Honeywell Inc. Readout system for dilatometers
US5645351A (en) * 1992-05-20 1997-07-08 Hitachi, Ltd. Temperature measuring method using thermal expansion and an apparatus for carrying out the same
JP3318795B2 (ja) * 1993-10-08 2002-08-26 ソニー株式会社 変位検出装置
CA2126481C (en) * 1994-06-22 2001-03-27 Andreas Mandelis Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids
US5991102A (en) * 1994-11-25 1999-11-23 Asahi Kogaku Kogyo Kabushiki Kaisha Beam protecting device
US6549271B2 (en) * 1997-01-28 2003-04-15 Nikon Corporation Exposure apparatus and method
US5936717A (en) * 1997-05-06 1999-08-10 Agfa Corporation Thermal compensation focus adjustment
DE10013172C2 (de) * 2000-03-17 2002-05-16 Wagner Internat Ag Altstaetten Verfahren und Vorrichtung zur photothermischen Analyse einer Materialschicht, insbesondere zur Schichtdickenmessung
US20020011852A1 (en) * 2000-03-21 2002-01-31 Andreas Mandelis Non-contact photothermal radiometric metrologies and instrumentation for characterization of semiconductor wafers, devices and non electronic materials
US6958967B2 (en) * 2000-11-17 2005-10-25 Matsushita Electric Industrial Co., Ltd. Holographic optical information recording/reproducing device
US20020094580A1 (en) * 2001-01-16 2002-07-18 Jorgenson James W. Photothermal absorbance detection apparatus and method of using same
US20040212802A1 (en) * 2001-02-20 2004-10-28 Case Steven K. Optical device with alignment compensation
US6917039B2 (en) * 2002-02-13 2005-07-12 Therma-Wave, Inc. Method and system for combined photothermal modulated reflectance and photothermal IR radiometric system
US7123553B2 (en) * 2002-05-31 2006-10-17 Matsushita Electric Industrial Co., Ltd. Lens support mechanism, optical head device and optical information processor
US6965434B2 (en) * 2002-09-13 2005-11-15 Centre National De La Recherche Scientifiques (C.N.R.S.) Method and device for photothermal imaging tiny metal particles immersed in a given medium
US6756591B1 (en) * 2003-03-14 2004-06-29 Centre National De La Recherche Method and device for photothermal imaging tiny particles immersed in a given medium
US7075058B2 (en) * 2003-03-28 2006-07-11 The United States Of America As Represented By The United States Department Of Energy Photothermal imaging scanning microscopy
US6865034B1 (en) * 2003-04-01 2005-03-08 Bae Systems Information And Electronic Systems Integration Inc. Method and apparatus for eliminating alignment error in an optical system
EP1662292A2 (en) * 2003-07-08 2006-05-31 Matsushita Electric Industrial Co., Ltd. Beam shaping optical device, optical head, and optical information medium drive device
US8674257B2 (en) * 2008-02-11 2014-03-18 Applied Materials, Inc. Automatic focus and emissivity measurements for a substrate system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012172524A1 (en) 2011-06-17 2012-12-20 Consejo Nacional De Investigaciones Cientificas Y Tecnicas (Conicet) Method and photothermal apparatus for contactless determination of thermal and optical properties of material

Also Published As

Publication number Publication date
US8622612B2 (en) 2014-01-07
US20100208242A1 (en) 2010-08-19
BRPI1000503A2 (pt) 2011-07-26

Similar Documents

Publication Publication Date Title
AR070418A1 (es) Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco
ATE545003T1 (de) Verteilter faseroptischer sensor
JP2013205253A (ja) 膜厚測定方法および膜厚測定装置
CN102507499B (zh) 采用光热干涉测量大气气溶胶吸收系数的装置
WO2014056708A3 (en) Mark position measuring apparatus and method, lithographic apparatus and device manufacturing method
JP2009192524A5 (es)
WO2008081873A1 (ja) 位相回復法を用いたｘ線集光方法及びその装置
Rivera-Ortega et al. Simple apparatus to calculate the refractive index of liquids based on Snell’s law
CN101482504B (zh) 材料激光空间散射特性的检测方法
CN103808693B (zh) 使用测量平板透明介质折射率的实验装置的实验方法
CA2633729A1 (en) Method and sensor for determining the hydrocarbon dew point in a gas
Iadicicco et al. Deflection monitoring method using fiber Bragg gratings applied to tracking particle detectors
AR088019A1 (es) Metodo y aparato fototermico para la determinacion sin contacto de propiedades termicas y opticas de un material
CN107064213A (zh) 一种测量薄膜导热系数的装置
JP6091331B2 (ja) 乾き度測定装置および湿り蒸気用配管
RU2010123872A (ru) Способ и устройство для определения расхода протекающей жидкости
KR101807094B1 (ko) 가스 이미지 측정 시스템 및 방법
CN104165864A (zh) 一种无标记导模共振布儒斯特传感器检测装置
JP2009229196A5 (es)
JP4547551B2 (ja) 断熱材の断熱特性リモートセンシング方法及び装置
Díaz-Herrera et al. Fibre-optic SPR sensor with a FBG interrogation scheme for readout enhancement
JP2009069054A5 (es)
TW200630603A (en) Device for measuring the reflection factor
KR102387341B1 (ko) 배향 특성 측정 방법, 배향 특성 측정 프로그램, 및 배향 특성 측정 장치
CN102830089A (zh) 一种带光栅的液体折射率测量装置

Legal Events

Date Code Title Description
FG Grant, registration
FD Application declared void or lapsed, e.g., due to non-payment of fee