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NO20051850D0 - Infrarod deteksjon av gass - diffraktiv. - Google Patents

Infrarod deteksjon av gass - diffraktiv.

Info

Publication number
NO20051850D0
NO20051850D0 NO20051850A NO20051850A NO20051850D0 NO 20051850 D0 NO20051850 D0 NO 20051850D0 NO 20051850 A NO20051850 A NO 20051850A NO 20051850 A NO20051850 A NO 20051850A NO 20051850 D0 NO20051850 D0 NO 20051850D0
Authority
NO
Norway
Prior art keywords
diffractive
gas detection
infrared gas
infrared
detection
Prior art date
Application number
NO20051850A
Other languages
English (en)
Other versions
NO20051850A (no
NO322368B1 (no
Inventor
Odd Lovhaugen
Alain Ferber
Ib-Rune Johansen
Hakon Sagberg
Original Assignee
Sinvent As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sinvent As filed Critical Sinvent As
Priority to NO20051850A priority Critical patent/NO322368B1/no
Publication of NO20051850D0 publication Critical patent/NO20051850D0/no
Priority to US11/911,627 priority patent/US7957004B2/en
Priority to PCT/NO2006/000123 priority patent/WO2006110041A1/en
Priority to JP2008506393A priority patent/JP5512967B2/ja
Priority to EP06733102.5A priority patent/EP1875205B1/en
Publication of NO20051850A publication Critical patent/NO20051850A/no
Publication of NO322368B1 publication Critical patent/NO322368B1/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters
    • G02B5/284—Interference filters of etalon type comprising a resonant cavity other than a thin solid film, e.g. gas, air, solid plates

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
NO20051850A 2005-04-15 2005-04-15 Infrarod deteksjon av gass - diffraktiv. NO322368B1 (no)

Priority Applications (5)

Application Number Priority Date Filing Date Title
NO20051850A NO322368B1 (no) 2005-04-15 2005-04-15 Infrarod deteksjon av gass - diffraktiv.
US11/911,627 US7957004B2 (en) 2005-04-15 2006-04-03 Interference filter
PCT/NO2006/000123 WO2006110041A1 (en) 2005-04-15 2006-04-03 Interference filter
JP2008506393A JP5512967B2 (ja) 2005-04-15 2006-04-03 干渉フィルター
EP06733102.5A EP1875205B1 (en) 2005-04-15 2006-04-03 Interference filter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO20051850A NO322368B1 (no) 2005-04-15 2005-04-15 Infrarod deteksjon av gass - diffraktiv.

Publications (3)

Publication Number Publication Date
NO20051850D0 true NO20051850D0 (no) 2005-04-15
NO20051850A NO20051850A (no) 2006-09-25
NO322368B1 NO322368B1 (no) 2006-09-25

Family

ID=35267056

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20051850A NO322368B1 (no) 2005-04-15 2005-04-15 Infrarod deteksjon av gass - diffraktiv.

Country Status (5)

Country Link
US (1) US7957004B2 (no)
EP (1) EP1875205B1 (no)
JP (1) JP5512967B2 (no)
NO (1) NO322368B1 (no)
WO (1) WO2006110041A1 (no)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NO20051851A (no) * 2005-04-15 2006-10-02 Sinvent As Justerbart interferensfilter
NL2002968A1 (nl) * 2008-06-30 2009-12-31 Asml Netherlands Bv Optical element, lithographic apparatus including such an optical element, device manufacturing method, and device manufactured thereby.
JP5136250B2 (ja) * 2008-07-11 2013-02-06 三菱電機株式会社 光学フィルターの製造方法
US8896839B2 (en) * 2008-07-30 2014-11-25 Pason Systems Corp. Multiplex tunable filter spectrometer
US8184293B2 (en) 2008-07-30 2012-05-22 Pason Systems Corp. Methods and systems for chemical composition measurement and monitoring using a rotating filter spectrometer
JP5810512B2 (ja) 2010-11-12 2015-11-11 セイコーエプソン株式会社 光学装置
JP2012150353A (ja) * 2011-01-20 2012-08-09 Seiko Epson Corp 波長可変干渉フィルター、光モジュール、および光分析装置
US9702811B2 (en) 2012-04-26 2017-07-11 Halliburton Energy Services, Inc. Methods and devices for optically determining a characteristic of a substance using integrated computational elements
US8879053B2 (en) 2012-04-26 2014-11-04 Halliburton Energy Services, Inc. Devices having an integrated computational element and a proximal interferent monitor and methods for determining a characteristic of a sample therewith
US8941046B2 (en) 2012-04-26 2015-01-27 Halliburton Energy Services, Inc. Methods and devices for optically determining a characteristic of a substance
US9013702B2 (en) 2012-04-26 2015-04-21 Halliburton Energy Services, Inc. Imaging systems for optical computing devices
US8912477B2 (en) 2012-04-26 2014-12-16 Halliburton Energy Services, Inc. Methods and devices for optically determining a characteristic of a substance
US9658149B2 (en) * 2012-04-26 2017-05-23 Halliburton Energy Services, Inc. Devices having one or more integrated computational elements and methods for determining a characteristic of a sample by computationally combining signals produced therewith
US9019501B2 (en) 2012-04-26 2015-04-28 Halliburton Energy Services, Inc. Methods and devices for optically determining a characteristic of a substance
JP5987573B2 (ja) * 2012-09-12 2016-09-07 セイコーエプソン株式会社 光学モジュール、電子機器、及び駆動方法
NO344002B1 (en) 2015-09-29 2019-08-12 Sintef Tto As Optical gas detector
NL2020622B1 (en) 2018-01-24 2019-07-30 Lllumina Cambridge Ltd Reduced dimensionality structured illumination microscopy with patterned arrays of nanowells
FR3120452B1 (fr) 2021-03-02 2023-06-23 Commissariat Energie Atomique Emetteur optoélectronique à balayage angulaire rapide

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US3930718A (en) 1974-04-12 1976-01-06 The United States Of America As Represented By The Secretary Of The Navy Electro-optic modulator
US3939348A (en) 1974-06-11 1976-02-17 Allied Chemical Corporation Infrared gas analysis
US4309108A (en) * 1977-01-17 1982-01-05 The Perkin-Elmer Corporation Analyzer for coherent radiation
EP0069368B1 (de) 1981-07-08 1987-09-16 Julius & August Erbslöh GmbH & Co. Verfahren zur Herstellung von Verbundprofilen aus einem Strangpressprofil und einem Chemiewerkstoff-Körper
DE3667864D1 (de) 1985-10-16 1990-02-01 British Telecomm Vorrichtung und verfahren zur wellenlaengenselektion.
US4822998A (en) * 1986-05-15 1989-04-18 Minolta Camera Kabushiki Kaisha Spectral sensor with interference filter
DE3925692C1 (no) * 1989-08-03 1990-08-23 Hartmann & Braun Ag, 6000 Frankfurt, De
US5151585A (en) * 1991-08-12 1992-09-29 Hughes Danbury Optical Systems, Inc. Coherent radiation detector
FI91564C (fi) 1991-10-31 1994-07-11 Valtion Teknillinen Anturi
US5289314A (en) * 1992-03-25 1994-02-22 Hughes Aircraft Company Coatings for laser detector etalons
FI96450C (fi) 1993-01-13 1996-06-25 Vaisala Oy Yksikanavainen kaasun pitoisuuden mittausmenetelmä ja -laitteisto
DE4334578C2 (de) 1993-10-11 1999-10-07 Dirk Winfried Rossberg Spektral abstimmbarer Infrarot-Sensor
GB2286041B (en) 1994-01-20 1998-04-08 Marconi Gec Ltd High resolution infrared spectroscope
FI98325C (fi) 1994-07-07 1997-05-26 Vaisala Oy Selektiivinen infrapunadetektori
DE4431412C1 (de) * 1994-08-24 1996-03-14 William Newton Vorrichtung zur Durchführung spektroskopischer Messungen
US5550373A (en) 1994-12-30 1996-08-27 Honeywell Inc. Fabry-Perot micro filter-detector
US5920391A (en) 1995-10-27 1999-07-06 Schlumberger Industries, S.A. Tunable Fabry-Perot filter for determining gas concentration
GB2314617B (en) 1996-06-24 2000-08-23 Graviner Ltd Kidde High sensitivity gas detection
FI108581B (fi) 1996-10-03 2002-02-15 Valtion Teknillinen Sähköisesti säädettävä optinen suodin
US6500521B2 (en) * 1999-05-14 2002-12-31 Agere Systems Inc. Stepped etalon
US6853654B2 (en) 1999-07-27 2005-02-08 Intel Corporation Tunable external cavity laser
US6246480B1 (en) * 1999-09-01 2001-06-12 Lucent Technologies Inc. Stepped etalon
US6590710B2 (en) 2000-02-18 2003-07-08 Yokogawa Electric Corporation Fabry-Perot filter, wavelength-selective infrared detector and infrared gas analyzer using the filter and detector
JP4158076B2 (ja) 2000-02-18 2008-10-01 横河電機株式会社 波長選択型赤外線検出素子及び赤外線ガス分析計
IL136849A (en) 2000-06-18 2004-09-27 Beamus Ltd Optical dynamic devices particularly for beam steering and optical communication
FR2820513B1 (fr) 2001-02-05 2004-05-21 Centre Nat Rech Scient Dispositif optoelectronique a filtrage de longueur d'onde par couplage de cavites
US6804429B2 (en) 2001-02-09 2004-10-12 The Board Of Trustees Of The Leland Stanford Junior University Reconfigurable wavelength multiplexers and filters employing micromirror array in a gires-tournois interferometer
DE60103482T2 (de) * 2001-08-17 2005-06-02 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Lichtinterferenz
US20040001258A1 (en) 2002-06-28 2004-01-01 Mandeep Singh Solid state etalons with low thermally-induced optical path length change
JP2005031326A (ja) 2003-07-11 2005-02-03 Nippon Telegr & Teleph Corp <Ntt> 光フィルター
US7142573B2 (en) 2003-10-17 2006-11-28 Coronado Technology Group, Llc Etalon cavity with filler layer for thermal tuning
WO2006130164A2 (en) * 2004-08-19 2006-12-07 University Of Pittsburgh Chip-scale optical spectrum analyzers with enhanced resolution

Also Published As

Publication number Publication date
NO20051850A (no) 2006-09-25
JP2008537801A (ja) 2008-09-25
EP1875205B1 (en) 2018-01-24
US20080273208A1 (en) 2008-11-06
US7957004B2 (en) 2011-06-07
NO322368B1 (no) 2006-09-25
JP5512967B2 (ja) 2014-06-04
WO2006110041A1 (en) 2006-10-19
EP1875205A1 (en) 2008-01-09

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Legal Events

Date Code Title Description
CHAD Change of the owner's name or address (par. 44 patent law, par. patentforskriften)

Owner name: SINTEF TTO, NO

MM1K Lapsed by not paying the annual fees