NO20011640L - Lysföler og lysfölersystem - Google Patents
Lysföler og lysfölersystemInfo
- Publication number
- NO20011640L NO20011640L NO20011640A NO20011640A NO20011640L NO 20011640 L NO20011640 L NO 20011640L NO 20011640 A NO20011640 A NO 20011640A NO 20011640 A NO20011640 A NO 20011640A NO 20011640 L NO20011640 L NO 20011640L
- Authority
- NO
- Norway
- Prior art keywords
- light sensor
- light
- incident
- charge carrier
- carrier generating
- Prior art date
Links
- 239000002800 charge carrier Substances 0.000 abstract 3
- 239000004065 semiconductor Substances 0.000 abstract 1
- 230000035807 sensation Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/198—Contact-type image sensors [CIS]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
- H10F30/282—Insulated-gate field-effect transistors [IGFET], e.g. MISFET [metal-insulator-semiconductor field-effect transistor] phototransistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
Landscapes
- Solid State Image Pick-Up Elements (AREA)
- Geophysics And Detection Of Objects (AREA)
- Air Bags (AREA)
- Prostheses (AREA)
- Light Receiving Elements (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Burglar Alarm Systems (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Measurement Of Current Or Voltage (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21831699 | 1999-08-02 | ||
| JP2000107468A JP4154555B2 (ja) | 2000-04-10 | 2000-04-10 | フォトセンサアレイ及び2次元画像の読取装置 |
| JP2000122157A JP3951088B2 (ja) | 2000-04-24 | 2000-04-24 | フォトセンサアレイおよび2次元画像の読取装置 |
| JP2000163303A JP3674942B2 (ja) | 1999-08-02 | 2000-05-31 | 光電変換素子、フォトセンサアレイおよび2次元画像の読取装置 |
| PCT/JP2000/005104 WO2001009960A1 (fr) | 1999-08-02 | 2000-07-28 | Photocapteur et systeme associe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| NO20011640D0 NO20011640D0 (no) | 2001-03-30 |
| NO20011640L true NO20011640L (no) | 2001-06-01 |
Family
ID=27476860
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO20011640A NO20011640L (no) | 1999-08-02 | 2001-03-30 | Lysföler og lysfölersystem |
Country Status (13)
| Country | Link |
|---|---|
| US (1) | US6670595B1 (fr) |
| EP (1) | EP1118126B1 (fr) |
| KR (1) | KR20010075560A (fr) |
| CN (1) | CN1316636C (fr) |
| AT (1) | ATE424043T1 (fr) |
| AU (1) | AU756447B2 (fr) |
| CA (1) | CA2346032C (fr) |
| DE (1) | DE60041627D1 (fr) |
| EA (1) | EA003343B1 (fr) |
| HK (1) | HK1041366B (fr) |
| NO (1) | NO20011640L (fr) |
| TW (1) | TW465105B (fr) |
| WO (1) | WO2001009960A1 (fr) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100382817B1 (ko) * | 1999-01-20 | 2003-05-09 | 엘지.필립스 엘시디 주식회사 | 생체감지패턴 및 이를 이용한 박막트랜지스터형 광센서 |
| US6765187B2 (en) * | 2001-06-27 | 2004-07-20 | Canon Kabushiki Kaisha | Imaging apparatus |
| JP4154874B2 (ja) * | 2001-07-30 | 2008-09-24 | カシオ計算機株式会社 | 指紋読取装置および指紋読取方法 |
| TWI243339B (en) * | 2002-03-19 | 2005-11-11 | Casio Computer Co Ltd | Image reading apparatus and drive control method |
| JP5157161B2 (ja) * | 2006-12-27 | 2013-03-06 | カシオ計算機株式会社 | フォトセンサ |
| US8354674B2 (en) * | 2007-06-29 | 2013-01-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device wherein a property of a first semiconductor layer is different from a property of a second semiconductor layer |
| AT505688A1 (de) * | 2007-09-13 | 2009-03-15 | Nanoident Technologies Ag | Sensormatrix aus halbleiterbauteilen |
| TWI354823B (en) | 2007-09-17 | 2011-12-21 | Au Optronics Corp | Display device, manufacturing method thereof, cont |
| JP2009164543A (ja) * | 2007-12-11 | 2009-07-23 | Sony Corp | 光センサ及び表示装置 |
| KR101322137B1 (ko) * | 2008-06-24 | 2013-10-25 | 엘지디스플레이 주식회사 | 액정표시장치 |
| CN102509736B (zh) | 2008-10-24 | 2015-08-19 | 株式会社半导体能源研究所 | 半导体器件和用于制造该半导体器件的方法 |
| JP5275515B2 (ja) * | 2010-04-30 | 2013-08-28 | シャープ株式会社 | 回路基板および表示装置 |
| KR20120075971A (ko) * | 2010-12-29 | 2012-07-09 | 삼성모바일디스플레이주식회사 | 적층형 포토다이오드 및 그 제조방법 |
| DK3080585T3 (da) * | 2013-12-10 | 2024-02-05 | Illumina Inc | Biosensorer til biologisk eller kemisk analyse og fremgangsmåder til fremstilling heraf |
| CN111276546B (zh) * | 2020-02-20 | 2022-07-29 | 武汉华星光电技术有限公司 | 显示面板及其制作方法 |
| CN115411135A (zh) * | 2021-05-13 | 2022-11-29 | 北京大学深圳研究生院 | 一种光电探测晶体管 |
| CN116314231A (zh) * | 2023-03-31 | 2023-06-23 | 京东方科技集团股份有限公司 | 一种光电传感器组件及电子设备 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU862753A1 (ru) * | 1980-04-03 | 1996-05-10 | Запорожский индустриальный институт | Фототранзистор |
| US4744637A (en) * | 1984-10-05 | 1988-05-17 | Canon Kabushiki Kaisha | Liquid crystal device with a protective layer of a particular coefficient of expansion |
| US5200634A (en) * | 1988-09-30 | 1993-04-06 | Hitachi, Ltd. | Thin film phototransistor and photosensor array using the same |
| DE69117785T2 (de) * | 1990-03-27 | 1997-02-06 | Canon Kk | Dünnschicht-Halbleiterbauelement |
| US5075237A (en) * | 1990-07-26 | 1991-12-24 | Industrial Technology Research Institute | Process of making a high photosensitive depletion-gate thin film transistor |
| JPH04299578A (ja) * | 1991-03-27 | 1992-10-22 | Canon Inc | 光電変換素子及び薄膜半導体装置 |
| RU2045110C1 (ru) * | 1992-03-27 | 1995-09-27 | Валерий Александрович Болдырев | Фотоприемник с ячеистой структурой |
| US5461419A (en) * | 1992-10-16 | 1995-10-24 | Casio Computer Co., Ltd. | Photoelectric conversion system |
| JP3019632B2 (ja) * | 1992-10-16 | 2000-03-13 | カシオ計算機株式会社 | フォトセンサシステム及びその駆動方法 |
| US5604360A (en) * | 1992-12-04 | 1997-02-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including a plurality of thin film transistors at least some of which have a crystalline silicon film crystal-grown substantially in parallel to the surface of a substrate for the transistor |
| WO1994026061A1 (fr) | 1993-04-29 | 1994-11-10 | Michael Friedland | Systeme de camera video mains libres |
| JPH08102547A (ja) * | 1994-09-30 | 1996-04-16 | Casio Comput Co Ltd | 光電変換装置及びその製造方法 |
| RU2114490C1 (ru) * | 1995-08-08 | 1998-06-27 | Винницкий государственный технический университет | Полупроводниковый оптический датчик |
| JPH0980470A (ja) * | 1995-09-14 | 1997-03-28 | Hitachi Electron Eng Co Ltd | Tft基板の配線欠陥修復方法 |
| JP3704406B2 (ja) * | 1996-10-30 | 2005-10-12 | 株式会社東芝 | 固体撮像装置 |
| US6310683B1 (en) * | 1997-08-05 | 2001-10-30 | Casio Computer Co., Ltd. | Apparatus for reading fingerprint |
-
2000
- 2000-07-28 WO PCT/JP2000/005104 patent/WO2001009960A1/fr not_active Ceased
- 2000-07-28 EA EA200100409A patent/EA003343B1/ru not_active IP Right Cessation
- 2000-07-28 EP EP00948313A patent/EP1118126B1/fr not_active Expired - Lifetime
- 2000-07-28 KR KR1020017004227A patent/KR20010075560A/ko not_active Ceased
- 2000-07-28 AT AT00948313T patent/ATE424043T1/de not_active IP Right Cessation
- 2000-07-28 AU AU61828/00A patent/AU756447B2/en not_active Ceased
- 2000-07-28 DE DE60041627T patent/DE60041627D1/de not_active Expired - Lifetime
- 2000-07-28 HK HK02100622.4A patent/HK1041366B/en not_active IP Right Cessation
- 2000-07-28 CA CA002346032A patent/CA2346032C/fr not_active Expired - Fee Related
- 2000-07-28 CN CNB008015880A patent/CN1316636C/zh not_active Expired - Fee Related
- 2000-07-31 US US09/630,242 patent/US6670595B1/en not_active Expired - Lifetime
- 2000-08-01 TW TW089115401A patent/TW465105B/zh not_active IP Right Cessation
-
2001
- 2001-03-30 NO NO20011640A patent/NO20011640L/no not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| CN1319257A (zh) | 2001-10-24 |
| AU756447B2 (en) | 2003-01-16 |
| EA200100409A1 (ru) | 2001-10-22 |
| HK1041366A1 (en) | 2002-07-05 |
| WO2001009960A1 (fr) | 2001-02-08 |
| EP1118126A1 (fr) | 2001-07-25 |
| US6670595B1 (en) | 2003-12-30 |
| CA2346032C (fr) | 2004-03-23 |
| NO20011640D0 (no) | 2001-03-30 |
| ATE424043T1 (de) | 2009-03-15 |
| DE60041627D1 (en) | 2009-04-09 |
| AU6182800A (en) | 2001-02-19 |
| HK1041366B (en) | 2009-06-19 |
| CN1316636C (zh) | 2007-05-16 |
| TW465105B (en) | 2001-11-21 |
| CA2346032A1 (fr) | 2001-02-08 |
| KR20010075560A (ko) | 2001-08-09 |
| EA003343B1 (ru) | 2003-04-24 |
| EP1118126B1 (fr) | 2009-02-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FC2A | Withdrawal, rejection or dismissal of laid open patent application |