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MX2019008904A - Probador funcional para tarjetas de circuito impreso y metodos y sistemas asociados. - Google Patents

Probador funcional para tarjetas de circuito impreso y metodos y sistemas asociados.

Info

Publication number
MX2019008904A
MX2019008904A MX2019008904A MX2019008904A MX2019008904A MX 2019008904 A MX2019008904 A MX 2019008904A MX 2019008904 A MX2019008904 A MX 2019008904A MX 2019008904 A MX2019008904 A MX 2019008904A MX 2019008904 A MX2019008904 A MX 2019008904A
Authority
MX
Mexico
Prior art keywords
printed circuit
circuit boards
methods
module
pcbs
Prior art date
Application number
MX2019008904A
Other languages
English (en)
Inventor
Allen Feucht Jonathan
Andrew Pias Peter
Benjamin Carson Daniel
Original Assignee
Checksum Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Checksum Llc filed Critical Checksum Llc
Publication of MX2019008904A publication Critical patent/MX2019008904A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

Se describen en la presente sistemas y métodos para probar tarjetas de circuito impreso (PCB). En una modalidad, un probador para tarjetas de circuito impreso (PCB) incluye un accesorio de prueba que tiene una pluralidad de contactos eléctricos para contactar con las PCB que son unidades bajo prueba (UUT). El accesorio de prueba lleva un módulo maestro periférico de prueba remota (RTPM), y un módulo esclavo periférico de prueba remota (RTPS). El módulo RTPM y el módulo RTPS son conectados a través de un bus periférico de prueba remota (RTP).
MX2019008904A 2017-02-10 2018-02-09 Probador funcional para tarjetas de circuito impreso y metodos y sistemas asociados. MX2019008904A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762457593P 2017-02-10 2017-02-10
PCT/US2018/017550 WO2018148497A1 (en) 2017-02-10 2018-02-09 Functional tester for printed circuit boards, and associated systems and methods

Publications (1)

Publication Number Publication Date
MX2019008904A true MX2019008904A (es) 2020-01-15

Family

ID=63107092

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2019008904A MX2019008904A (es) 2017-02-10 2018-02-09 Probador funcional para tarjetas de circuito impreso y metodos y sistemas asociados.

Country Status (6)

Country Link
US (2) US11262396B2 (es)
EP (1) EP3580575B1 (es)
JP (1) JP2020507764A (es)
CN (1) CN110268277B (es)
MX (1) MX2019008904A (es)
WO (1) WO2018148497A1 (es)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10212658B2 (en) * 2016-09-30 2019-02-19 Kinetic Technologies Systems and methods for managing communication between devices
US10757484B2 (en) 2017-01-05 2020-08-25 Kinetic Technologies Systems and methods for pulse-based communication
MX2019008904A (es) 2017-02-10 2020-01-15 Checksum Llc Probador funcional para tarjetas de circuito impreso y metodos y sistemas asociados.
CN109765479B (zh) * 2019-01-28 2021-10-01 合肥京东方视讯科技有限公司 一种电路板缺件检测装置和方法
WO2020264109A1 (en) * 2019-06-28 2020-12-30 Checksum, Llc Dual-step printed circuit board test, and associated systems and methods
CN112666452A (zh) * 2019-10-15 2021-04-16 成都欧珀移动通信有限公司 电路板测试结构及装置
CN111366836B (zh) * 2020-02-25 2022-03-29 上海机电工程研究所 适用于pcb板维修测试设备测试加电的安全保护电路装置
CN112363087B (zh) * 2020-11-09 2024-05-10 博众精工科技股份有限公司 一种测试装置
US20220390512A1 (en) * 2021-06-03 2022-12-08 TestEye Technologies Inc. Systems and devices for intelligent integrated testing
CN113721128A (zh) * 2021-08-19 2021-11-30 海纳川海拉电子(江苏)有限公司 一种led电路板自动化测试装置及测试方法
CN116028284B (zh) * 2022-08-18 2023-10-20 荣耀终端有限公司 一种电子设备
EP4375677A1 (en) * 2022-11-23 2024-05-29 Mikrodust AB Compact test fixture
CN115792766A (zh) * 2022-12-09 2023-03-14 上海仁昊电子科技有限公司 一种轨道电路测试设备校验系统
CN117665381B (zh) * 2024-01-31 2024-05-24 荣耀终端有限公司 检测电路、电子设备和方法

Family Cites Families (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5236825B2 (es) 1973-04-11 1977-09-19
EP0143623A3 (en) * 1983-11-25 1987-09-23 Mars Incorporated Automatic test equipment
JPH068627B2 (ja) 1985-07-01 1994-02-02 トヨタ自動車株式会社 内燃機関の燃料噴射弁
US4866714A (en) * 1987-10-15 1989-09-12 Westinghouse Electric Corp. Personal computer-based dynamic burn-in system
US5483518A (en) * 1992-06-17 1996-01-09 Texas Instruments Incorporated Addressable shadow port and protocol for serial bus networks
US5032789A (en) 1989-06-19 1991-07-16 Hewlett-Packard Company Modular/concurrent board tester
US5216361A (en) * 1991-07-10 1993-06-01 Schlumberger Technologies, Inc. Modular board test system having wireless receiver
US5343478A (en) * 1991-11-27 1994-08-30 Ncr Corporation Computer system configuration via test bus
US5578930A (en) * 1995-03-16 1996-11-26 Teradyne, Inc. Manufacturing defect analyzer with improved fault coverage
US5852617A (en) * 1995-12-08 1998-12-22 Samsung Electronics Co., Ltd. Jtag testing of buses using plug-in cards with Jtag logic mounted thereon
JPH09304466A (ja) * 1996-05-13 1997-11-28 Daifuku Co Ltd 基板検査装置
TW453441U (en) * 1999-08-24 2001-09-01 Delta Electronics Inc I2C test unit
JP2002014131A (ja) * 2000-06-27 2002-01-18 Toppan Printing Co Ltd 回路基板の検査方法及び検査装置
US6968545B1 (en) * 2000-09-11 2005-11-22 Agilent Technologies, Inc. Method and apparatus for no-latency conditional branching
US6868513B1 (en) * 2000-10-26 2005-03-15 International Business Machines Corporation Automated multi-device test process and system
US7379475B2 (en) * 2002-01-25 2008-05-27 Nvidia Corporation Communications processor
US6988232B2 (en) 2001-07-05 2006-01-17 Intellitech Corporation Method and apparatus for optimized parallel testing and access of electronic circuits
US6628130B2 (en) * 2001-07-18 2003-09-30 Agilent Technologies, Inc. Wireless test fixture for printed circuit board test systems
JP2003075515A (ja) * 2001-08-31 2003-03-12 Mitsubishi Electric Corp 半導体集積回路の試験装置およびその試験方法
US7003563B2 (en) * 2001-11-02 2006-02-21 Hewlett-Packard Development Company, L.P. Remote management system for multiple servers
US6717541B1 (en) * 2002-04-29 2004-04-06 Iowa State University Research Foundation, Inc. Fast low cost multiple sensor readout system
JP2004245816A (ja) * 2002-12-19 2004-09-02 Fuji Xerox Co Ltd 回路基板検査装置
US7139949B1 (en) 2003-01-17 2006-11-21 Unisys Corporation Test apparatus to facilitate building and testing complex computer products with contract manufacturers without proprietary information
US7603498B2 (en) * 2004-03-19 2009-10-13 Dell Products L.P. System and method for managing multiple information handling systems using embedded control logic
US7307433B2 (en) * 2004-04-21 2007-12-11 Formfactor, Inc. Intelligent probe card architecture
US7362089B2 (en) * 2004-05-21 2008-04-22 Advantest Corporation Carrier module for adapting non-standard instrument cards to test systems
US7345495B2 (en) * 2004-06-30 2008-03-18 Intel Corporation Temperature and voltage controlled integrated circuit processes
US7253652B2 (en) 2005-07-26 2007-08-07 Marvell International Ltd. Integrated systems testing
US7761622B2 (en) * 2007-07-26 2010-07-20 Hewlett-Packard Development Company, L.P. Centralized server rack management using USB
JP2009229304A (ja) * 2008-03-24 2009-10-08 Advantest Corp 試験システム及びモジュール制御方法
EP2341353A1 (en) 2010-01-05 2011-07-06 Research In Motion Limited Self-aligning test fixture for printed circuit board
JP2011179996A (ja) * 2010-03-02 2011-09-15 Yokogawa Electric Corp システム診断装置、システム診断方法
KR101309081B1 (ko) * 2012-02-29 2013-09-17 주식회사 유니테스트 번인 테스터
CN202870623U (zh) * 2012-11-22 2013-04-10 山东省科学院自动化研究所 汽车车身电子单元的通用测试工装
TW201423387A (zh) * 2012-12-12 2014-06-16 Hon Hai Prec Ind Co Ltd Sas擴展卡測試系統及方法
US9459312B2 (en) 2013-04-10 2016-10-04 Teradyne, Inc. Electronic assembly test system
US9817066B1 (en) * 2014-08-26 2017-11-14 Xilinx, Inc. Configurable JTAG-to-serial bus translator
CN104237699B (zh) * 2014-09-28 2018-01-02 上海斐讯数据通信技术有限公司 一种usb接口通信测试系统及方法
CN104598415A (zh) * 2014-11-27 2015-05-06 英业达科技有限公司 通用串行总线测试治具
AT14695U1 (de) * 2015-01-19 2016-04-15 Bachmann Gmbh Serielles Bussystem mit Koppelmodulen
DE102015209033A1 (de) * 2015-05-18 2016-11-24 Robert Bosch Gmbh Verfahren und Vorrichtung zum Liefern einer Prüfantwort
MX2019008904A (es) 2017-02-10 2020-01-15 Checksum Llc Probador funcional para tarjetas de circuito impreso y metodos y sistemas asociados.

Also Published As

Publication number Publication date
EP3580575C0 (en) 2025-07-23
US11686759B2 (en) 2023-06-27
CN110268277A (zh) 2019-09-20
US20220236315A1 (en) 2022-07-28
JP2020507764A (ja) 2020-03-12
CN110268277B (zh) 2022-05-27
WO2018148497A1 (en) 2018-08-16
US20200033396A1 (en) 2020-01-30
EP3580575A1 (en) 2019-12-18
US11262396B2 (en) 2022-03-01
EP3580575B1 (en) 2025-07-23
EP3580575A4 (en) 2020-08-19

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