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MX2017016241A - Elementos informaticos integrados que incorporan una capa de liberacion de tension. - Google Patents

Elementos informaticos integrados que incorporan una capa de liberacion de tension.

Info

Publication number
MX2017016241A
MX2017016241A MX2017016241A MX2017016241A MX2017016241A MX 2017016241 A MX2017016241 A MX 2017016241A MX 2017016241 A MX2017016241 A MX 2017016241A MX 2017016241 A MX2017016241 A MX 2017016241A MX 2017016241 A MX2017016241 A MX 2017016241A
Authority
MX
Mexico
Prior art keywords
thin films
substrate
substance
stress relief
electromagnetic radiation
Prior art date
Application number
MX2017016241A
Other languages
English (en)
Inventor
l perkins David
M Price James
Original Assignee
Halliburton Energy Services Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Halliburton Energy Services Inc filed Critical Halliburton Energy Services Inc
Publication of MX2017016241A publication Critical patent/MX2017016241A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/10—Detecting, e.g. by using light barriers
    • G01V8/12—Detecting, e.g. by using light barriers using one transmitter and one receiver
    • G01V8/14—Detecting, e.g. by using light barriers using one transmitter and one receiver using reflectors
    • E—FIXED CONSTRUCTIONS
    • E21—EARTH OR ROCK DRILLING; MINING
    • E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
    • E21B47/00—Survey of boreholes or wells
    • E21B47/09—Locating or determining the position of objects in boreholes or wells, e.g. the position of an extending arm; Identifying the free or blocked portions of pipes
    • E21B47/092—Locating or determining the position of objects in boreholes or wells, e.g. the position of an extending arm; Identifying the free or blocked portions of pipes by detecting magnetic anomalies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N2021/4126—Index of thin films

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Geology (AREA)
  • Mining & Mineral Resources (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Fluid Mechanics (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Light Receiving Elements (AREA)

Abstract

Un dispositivo informático óptico incluye una fuente de radiación electromagnética que emite radiación electromagnética para interactuar ópticamente con una sustancia y un núcleo de elemento informático integrado (ICE). El núcleo de ICE incluye un sustrato, una primera pluralidad de películas delgadas depositadas alternadamente en el sustrato con una segunda pluralidad de películas delgadas mediante un proceso de deposición de películas delgadas, en donde la primera pluralidad de películas delgadas está hecha de un material de índice de refracción alto y la segunda pluralidad de películas delgadas está hecha de material de índice de refracción bajo. Una capa de liberación de tensión se deposita en el sustrato mediante el proceso de deposición de películas delgadas e interpone el sustrato y una primera capa de la primera pluralidad de películas delgadas. Un detector está posicionado para recibir la radiación electromagnética modificada que interactúa ópticamente con la sustancia y el núcleo de ICE y generar una señal de salida que indica la característica de la sustancia.
MX2017016241A 2015-07-30 2015-07-30 Elementos informaticos integrados que incorporan una capa de liberacion de tension. MX2017016241A (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2015/042956 WO2017019096A1 (en) 2015-07-30 2015-07-30 Integrated computational elements incorporating a stress relief layer

Publications (1)

Publication Number Publication Date
MX2017016241A true MX2017016241A (es) 2018-04-20

Family

ID=57885720

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2017016241A MX2017016241A (es) 2015-07-30 2015-07-30 Elementos informaticos integrados que incorporan una capa de liberacion de tension.

Country Status (4)

Country Link
US (1) US20180171781A1 (es)
EP (1) EP3329088A4 (es)
MX (1) MX2017016241A (es)
WO (1) WO2017019096A1 (es)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE540009C2 (en) * 2016-06-03 2018-02-20 Braennstroem Gruppen Ab Method and apparatus for determining a concentration of a substance in a liquid medium
WO2020210201A1 (en) * 2019-04-08 2020-10-15 Chevron U.S.A. Inc. Systems and methods for modeling substance characteristics
CN110095816B (zh) * 2019-04-19 2020-07-28 清华大学 水陆两用便携式磁场探测仪
CN112408810B (zh) * 2020-11-24 2022-11-11 中国电子科技集团公司第十八研究所 一种空间太阳电池用激光防护玻璃盖片及其制备方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1502285A2 (en) * 2002-05-07 2005-02-02 ASM America, Inc. Silicon-on-insulator structures and methods
FI117728B (fi) * 2004-12-21 2007-01-31 Planar Systems Oy Monikerrosmateriaali ja menetelmä sen valmistamiseksi
EP1975988B1 (en) * 2007-03-28 2015-02-25 Siltronic AG Multilayered semiconductor wafer and process for its production
US20130035262A1 (en) * 2011-08-05 2013-02-07 Freese Robert P Integrated Computational Element Analytical Methods for Microorganisms Treated with a Pulsed Light Source
US8765061B2 (en) * 2012-09-14 2014-07-01 Halliburton Energy Services, Inc. Systems and methods for inspecting and monitoring a pipeline
US9217705B1 (en) * 2013-09-30 2015-12-22 Halliburton Energy Services, Inc. Methods for assaying ionic materials using an integrated computational element
MX367538B (es) * 2013-10-22 2019-08-26 Halliburton Energy Services Inc Utilización de dispositivos informáticos ópticos para determinar analitos desconocidos.
WO2015094243A1 (en) * 2013-12-18 2015-06-25 Halliburton Energy Services, Inc. Systems and methods to reduce delamination in integrated computational elements used downhole

Also Published As

Publication number Publication date
EP3329088A1 (en) 2018-06-06
WO2017019096A1 (en) 2017-02-02
US20180171781A1 (en) 2018-06-21
EP3329088A4 (en) 2019-02-27

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