MX2013003499A - Sistema y metodo para analizar tamaños de poro de substratos. - Google Patents
Sistema y metodo para analizar tamaños de poro de substratos.Info
- Publication number
- MX2013003499A MX2013003499A MX2013003499A MX2013003499A MX2013003499A MX 2013003499 A MX2013003499 A MX 2013003499A MX 2013003499 A MX2013003499 A MX 2013003499A MX 2013003499 A MX2013003499 A MX 2013003499A MX 2013003499 A MX2013003499 A MX 2013003499A
- Authority
- MX
- Mexico
- Prior art keywords
- substrate
- substrates
- exit
- pore sizes
- device containing
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title abstract 15
- 239000011148 porous material Substances 0.000 title abstract 3
- 239000002245 particle Substances 0.000 abstract 4
- 239000012530 fluid Substances 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D46/00—Filters or filtering processes specially modified for separating dispersed particles from gases or vapours
- B01D46/24—Particle separators, e.g. dust precipitators, using rigid hollow filter bodies
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D46/00—Filters or filtering processes specially modified for separating dispersed particles from gases or vapours
- B01D46/24—Particle separators, e.g. dust precipitators, using rigid hollow filter bodies
- B01D46/2403—Particle separators, e.g. dust precipitators, using rigid hollow filter bodies characterised by the physical shape or structure of the filtering element
- B01D46/2418—Honeycomb filters
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D46/00—Filters or filtering processes specially modified for separating dispersed particles from gases or vapours
- B01D46/42—Auxiliary equipment or operation thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95692—Patterns showing hole parts, e.g. honeycomb filtering structures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
- G01N2015/0846—Investigating permeability, pore-volume, or surface area of porous materials by use of radiation, e.g. transmitted or reflected light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
- G01N2015/086—Investigating permeability, pore-volume, or surface area of porous materials of films, membranes or pellicules
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Geometry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Un sistema para analizar el tamaño de poro de un substrato o dispositivo que contiene el substrato, adaptado para separar fluidos y que tiene al menos dos superficies, una primera y una segunda superficie, que están aisladas una de la otra y en donde el substrato o dispositivo que contiene el substrato tiene una salida para que los fluidos pasen a través del substrato, en donde el sistema comprende: a) un generador de partículas (15) con la capacidad de generar partículas de un tamaño controlado; b) un sistema (18) para crear un diferencial de presión entre la primera y la segunda superficie del substrato; c) una fuente de luz (24) separada de la salida del substrato o dispositivo que contiene el substrato adaptado para iluminar partículas que salen de la salida del substrato o dispositivo que contiene el substrato; d) una trayectoria de flujo cerrada del generador de partículas hacia la primera superficie del substrato; e) un retenedor de substrato o dispositivo (11) adaptado para retener el substrato o dispositivo en la ubicación adecuada en el sistema; y f) una o más imágenes de referencia. También se describen métodos para utilizar el sistema para identificar tamaños de poro de substratos.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US38864510P | 2010-10-01 | 2010-10-01 | |
| PCT/US2011/053226 WO2012044570A1 (en) | 2010-10-01 | 2011-09-26 | System and method for analyzing pore sizes of substrates |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MX2013003499A true MX2013003499A (es) | 2013-05-20 |
Family
ID=44860504
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2013003499A MX2013003499A (es) | 2010-10-01 | 2011-09-26 | Sistema y metodo para analizar tamaños de poro de substratos. |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US8749783B2 (es) |
| EP (1) | EP2622329A1 (es) |
| KR (1) | KR101798268B1 (es) |
| CN (2) | CN103154711A (es) |
| BR (1) | BR112013004675A2 (es) |
| CA (1) | CA2813354A1 (es) |
| MX (1) | MX2013003499A (es) |
| WO (1) | WO2012044570A1 (es) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160083283A1 (en) * | 2014-09-19 | 2016-03-24 | Asahi Glass Company, Limited | Ceramic member and defect test system |
| JP6557105B2 (ja) * | 2015-09-25 | 2019-08-07 | 株式会社Subaru | 検査対象品の品質検査方法および品質検査装置 |
| WO2021157487A1 (ja) * | 2020-02-06 | 2021-08-12 | 富士フイルム株式会社 | 医用画像処理装置、内視鏡システム、医用画像処理方法、及びプログラム |
| JP6756939B1 (ja) * | 2020-03-31 | 2020-09-16 | 日本碍子株式会社 | 柱状ハニカムフィルタの検査方法 |
| KR102813892B1 (ko) * | 2021-11-05 | 2025-05-28 | 한국전자기술연구원 | 셀의 기공 구조 분석 장치, 시스템 및 방법 |
| WO2024072781A1 (en) * | 2022-09-30 | 2024-04-04 | Corning Incorporated | Methods of making honeycomb bodies with tracer particles |
| KR102760348B1 (ko) * | 2023-03-15 | 2025-01-24 | 조성천 | 레이저를 이용한 필터 리킹계측장치 |
| WO2025133573A1 (en) * | 2023-12-20 | 2025-06-26 | Johnson Matthey Public Limited Company | Methods and apparatus relating to wall-flow filters |
Family Cites Families (42)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3351760A (en) | 1963-08-26 | 1967-11-07 | Robert L Brown | Methods of evaluating and inspecting adhesively bonded joints and structures adapted for such evaluation and inspection |
| JPH03255934A (ja) | 1990-03-06 | 1991-11-14 | Ngk Insulators Ltd | 排ガス浄化用ハニカム構造体の検査方法及び装置 |
| US5076692A (en) | 1990-05-31 | 1991-12-31 | Tencor Instruments | Particle detection on a patterned or bare wafer surface |
| JP2722362B2 (ja) | 1992-03-27 | 1998-03-04 | 三井金属鉱業株式会社 | 粒子または欠陥の大きさ情報の測定方法および装置 |
| JP2847458B2 (ja) | 1993-03-26 | 1999-01-20 | 三井金属鉱業株式会社 | 欠陥評価装置 |
| EP0624788B1 (en) | 1993-03-31 | 1998-11-04 | Ngk Insulators, Ltd. | Method of and apparatus for inspecting honeycomb-shaped object having plural through holes |
| DE69409736T2 (de) | 1993-08-30 | 1998-10-01 | Millipore Invest Holdings | Prüfung der Unversehrtheit poröser Strukturen mittels Schallemission |
| US5790247A (en) | 1995-10-06 | 1998-08-04 | Photon Dynamics, Inc. | Technique for determining defect positions in three dimensions in a transparent structure |
| JPH09229662A (ja) | 1996-02-27 | 1997-09-05 | Hitachi Ltd | コーティング状況診断方法 |
| JPH10123067A (ja) | 1996-10-17 | 1998-05-15 | Mitsubishi Heavy Ind Ltd | 多孔質体の欠陥検査方法 |
| JP3166841B2 (ja) | 1998-04-10 | 2001-05-14 | 日本電気株式会社 | パーティクル検査装置 |
| FR2785388B1 (fr) | 1998-10-29 | 2000-12-01 | Snecma | Procede et instrument de controle de la liaison de l'ame alveolee d'un nid d'abeilles sur une peau |
| JP3839177B2 (ja) | 1998-12-28 | 2006-11-01 | イビデン株式会社 | 多孔質セラミック部材のピンホール検査装置 |
| DE19904691C2 (de) | 1999-02-05 | 2003-05-28 | Esytec En U Systemtechnik Gmbh | Vorrichtung und Verfahren zur simultanen In-situ-Bestimmung der Teilchengröße und Massenkonzentration von fluidgetragenen Partikeln |
| US6936835B2 (en) | 2000-09-21 | 2005-08-30 | Hitachi, Ltd. | Method and its apparatus for inspecting particles or defects of a semiconductor device |
| US6797975B2 (en) | 2000-09-21 | 2004-09-28 | Hitachi, Ltd. | Method and its apparatus for inspecting particles or defects of a semiconductor device |
| US6731384B2 (en) | 2000-10-10 | 2004-05-04 | Hitachi, Ltd. | Apparatus for detecting foreign particle and defect and the same method |
| US6809809B2 (en) | 2000-11-15 | 2004-10-26 | Real Time Metrology, Inc. | Optical method and apparatus for inspecting large area planar objects |
| US6630996B2 (en) | 2000-11-15 | 2003-10-07 | Real Time Metrology, Inc. | Optical method and apparatus for inspecting large area planar objects |
| JP3904933B2 (ja) * | 2001-03-30 | 2007-04-11 | 日本碍子株式会社 | 欠陥を検出する検査方法及び検査装置 |
| ATE332883T1 (de) | 2001-04-23 | 2006-08-15 | Dow Global Technologies Inc | Verfahren zur herstellung eines monolithischen wanddurchflussfilters |
| US7012685B1 (en) | 2001-08-06 | 2006-03-14 | Wilson David J | Clogged filter detector |
| US20030045098A1 (en) | 2001-08-31 | 2003-03-06 | Applied Materials, Inc. | Method and apparatus for processing a wafer |
| US6960756B1 (en) * | 2001-11-15 | 2005-11-01 | Visionworks Llc | Particle size and shape distribution analyzer |
| JP2003270158A (ja) | 2002-03-12 | 2003-09-25 | Denso Corp | 貫通検査装置 |
| US6666070B1 (en) | 2002-06-26 | 2003-12-23 | Corning Incorporated | Method for testing the integrity of DPFs |
| JP3972749B2 (ja) * | 2002-07-03 | 2007-09-05 | 住友金属鉱山株式会社 | 検査装置および貫通孔の検査方法 |
| JP3845067B2 (ja) | 2003-03-24 | 2006-11-15 | 日本碍子株式会社 | 多孔質濾過体の細孔径測定方法 |
| JP2004286703A (ja) | 2003-03-25 | 2004-10-14 | Ngk Insulators Ltd | ハニカム構造体の検査方法及び検査装置 |
| US7410528B2 (en) | 2004-11-30 | 2008-08-12 | Corning Incorporated | Method and system for testing the integrity of green plugged honeycomb structure |
| EP1833772A2 (en) | 2004-12-21 | 2007-09-19 | Corning Incorporated | Method and system for identifying and repairing defective cells in a plugged honeycomb structure |
| WO2007015810A2 (en) | 2005-07-29 | 2007-02-08 | Corning Incorporated | Method, system and apparatus for detecting defects in a honeycomb body using a particulate fluid |
| US7701570B2 (en) * | 2005-12-12 | 2010-04-20 | Corning Incorporated | Collimated light method and system for detecting defects in honeycombs |
| KR20080109031A (ko) | 2006-03-28 | 2008-12-16 | 니뽄 가이시 가부시키가이샤 | 다공질체의 결함 검출 방법 |
| US7674309B2 (en) | 2006-03-31 | 2010-03-09 | Corning Incorporated | Honeycomb filter defect detecting method and apparatus |
| US20080173071A1 (en) | 2007-01-22 | 2008-07-24 | Park Timothy A | Honeycomb filter defect detecting method |
| JP2008241531A (ja) | 2007-03-28 | 2008-10-09 | Denso Corp | 多孔質体の検査方法及び検査装置 |
| JP5508852B2 (ja) * | 2007-08-30 | 2014-06-04 | 日本碍子株式会社 | 被検体の欠陥検査方法 |
| JP5345422B2 (ja) * | 2008-03-21 | 2013-11-20 | 日本碍子株式会社 | ハニカム構造体欠陥検査装置 |
| US8538119B2 (en) * | 2008-06-04 | 2013-09-17 | Hitachi High-Technologies Corporation | Particle image analysis method and apparatus |
| US8250343B2 (en) | 2009-07-21 | 2012-08-21 | National Instruments Corporation | Axial motion control processing by multiple cores respectively executing each of a sequence of functions in parallel for respective portions of a motion system |
| EP2537022A1 (en) | 2010-02-17 | 2012-12-26 | Dow Global Technologies LLC | Filter and membrane defect detection system |
-
2011
- 2011-09-26 CN CN2011800453468A patent/CN103154711A/zh active Pending
- 2011-09-26 BR BR112013004675A patent/BR112013004675A2/pt not_active IP Right Cessation
- 2011-09-26 KR KR1020137007868A patent/KR101798268B1/ko not_active Expired - Fee Related
- 2011-09-26 US US13/817,016 patent/US8749783B2/en not_active Expired - Fee Related
- 2011-09-26 EP EP11774126.4A patent/EP2622329A1/en not_active Withdrawn
- 2011-09-26 CA CA2813354A patent/CA2813354A1/en not_active Abandoned
- 2011-09-26 CN CN201610552401.7A patent/CN106290399A/zh active Pending
- 2011-09-26 MX MX2013003499A patent/MX2013003499A/es not_active Application Discontinuation
- 2011-09-26 WO PCT/US2011/053226 patent/WO2012044570A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US8749783B2 (en) | 2014-06-10 |
| BR112013004675A2 (pt) | 2016-07-26 |
| EP2622329A1 (en) | 2013-08-07 |
| US20130141722A1 (en) | 2013-06-06 |
| CA2813354A1 (en) | 2012-04-05 |
| KR20130114109A (ko) | 2013-10-16 |
| CN106290399A (zh) | 2017-01-04 |
| WO2012044570A1 (en) | 2012-04-05 |
| KR101798268B1 (ko) | 2017-11-15 |
| CN103154711A (zh) | 2013-06-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| MX2013003499A (es) | Sistema y metodo para analizar tamaños de poro de substratos. | |
| PH12017500957A1 (en) | Aerosol provision systems | |
| UA116637C2 (uk) | Мікрофлюїдна система для орієнтування і/або сортування біологічних часток | |
| IL267052A (en) | Systems, methods and media for presenting augmented reality interactive presentations | |
| TW200741792A (en) | Charged particle beam device | |
| GB0801375D0 (en) | Fluid-borne particle detector | |
| MA42359A1 (fr) | Appareils et procédés de production de couches à effet optique comprenant des particules de pigment magnétiques ou magnétisables non sphériques orientées | |
| EP2350943A4 (en) | SYSTEMS, METHODS, AND COMPUTER-READABLE MEDIA FOR PAYMENT-FREE AND PAYMENT-FREE TRANSFER OF VIRTUAL CARDS BETWEEN MOBILE DEVICES | |
| WO2013102026A3 (en) | Method and system for video composition | |
| SG157342A1 (en) | Lithographic apparatus and a method of operating the apparatus | |
| CL2017001764A1 (es) | Sistema de contención para módulos de baterías | |
| WO2014062719A3 (en) | Systems, apparatus, and methods for sorting particles | |
| MX358384B (es) | Un dispositivo generador de aerosol con boquillas de flujo de aire. | |
| WO2007140347A3 (en) | Extraction of light from a light conducting medium in a preferred emanation pattern | |
| IN2014DE01079A (es) | ||
| WO2008121229A3 (en) | Method and apparatus for concentrating molecules | |
| GB2567360A (en) | Methods for optical micropatterning of hydrogels and uses thereof | |
| MX2009001793A (es) | Metodos y aparatos para dispensar muestras de polvo. | |
| GB201110454D0 (en) | Microfluidic photoporation | |
| MX2019011316A (es) | Aparato y metodo para el tratamiento de un sustrato con una multiplicidad de particulas solidas. | |
| EP3326723A4 (en) | DISCHARGE DEVICE AND DISCHARGE PROCESS FOR LIQUID MATERIAL WITH SOLIDS PARTICLES AND COATING DEVICE | |
| MX2014000322A (es) | Tecnologia de simulacion integrada. | |
| MY172981A (en) | Electrostatic coalescer and method for electrostatic coalescence | |
| EP3517656A3 (en) | Method and device for plating a recess in a substrate | |
| MX2018005086A (es) | Modulos de chip microfluidico, sistemas, y metodos para mejorar la calidad del aire. |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FA | Abandonment or withdrawal |