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MX2009001092A - Fuente de bajo ruido. - Google Patents

Fuente de bajo ruido.

Info

Publication number
MX2009001092A
MX2009001092A MX2009001092A MX2009001092A MX2009001092A MX 2009001092 A MX2009001092 A MX 2009001092A MX 2009001092 A MX2009001092 A MX 2009001092A MX 2009001092 A MX2009001092 A MX 2009001092A MX 2009001092 A MX2009001092 A MX 2009001092A
Authority
MX
Mexico
Prior art keywords
signal
amplified
output signal
low
phase noise
Prior art date
Application number
MX2009001092A
Other languages
English (en)
Inventor
Eugene Rzyski
Todd Wangsness
Original Assignee
Omniphase Res Lab Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omniphase Res Lab Inc filed Critical Omniphase Res Lab Inc
Publication of MX2009001092A publication Critical patent/MX2009001092A/es

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/32—Modifications of amplifiers to reduce non-linear distortion
    • H03F1/3223—Modifications of amplifiers to reduce non-linear distortion using feed-forward
    • H03F1/3229—Modifications of amplifiers to reduce non-linear distortion using feed-forward using a loop for error extraction and another loop for error subtraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/26—Modifications of amplifiers to reduce influence of noise generated by amplifying elements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/32—Modifications of amplifiers to reduce non-linear distortion
    • H03F1/3223—Modifications of amplifiers to reduce non-linear distortion using feed-forward
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/372—Noise reduction and elimination in amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2201/00—Indexing scheme relating to details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements covered by H03F1/00
    • H03F2201/32—Indexing scheme relating to modifications of amplifiers to reduce non-linear distortion
    • H03F2201/3212—Using a control circuit to adjust amplitude and phase of a signal in a signal path

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Amplifiers (AREA)

Abstract

En una modalidad, una fuente de bajo ruido incluye: una fuente de señal; un amplificador variable adaptado para amplificar una señal de salida proveniente de la fuente de señal para proporcionar una señal amplificada; un amplificador de alimentación de reenvío adaptado para amplificar la señal amplificada a fin de proporcionar una señal de salida amplificada; un sistema de medición de ruido de fase adaptado para proporcionar una primera señal de retroalimentación en respuesta al ruido de fase en la señal de salida amplificada; y un procesador adaptado para controlar la amplificación suministrada por el amplificador variable en respuesta a la señal de retroalimentación a fin de reducir al mínimo el ruido de fase en la señal de salida amplificada.
MX2009001092A 2006-07-28 2007-07-28 Fuente de bajo ruido. MX2009001092A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/494,884 US7693674B2 (en) 2005-05-20 2006-07-28 Low-noise source
PCT/US2007/074675 WO2008014503A2 (en) 2006-07-28 2007-07-28 Low-noise source

Publications (1)

Publication Number Publication Date
MX2009001092A true MX2009001092A (es) 2009-05-28

Family

ID=38982421

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2009001092A MX2009001092A (es) 2006-07-28 2007-07-28 Fuente de bajo ruido.

Country Status (7)

Country Link
US (2) US7693674B2 (es)
EP (1) EP2069812A2 (es)
JP (1) JP2009545277A (es)
KR (1) KR20090069164A (es)
AU (1) AU2007278883A1 (es)
MX (1) MX2009001092A (es)
WO (1) WO2008014503A2 (es)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101009117B1 (ko) * 2008-08-25 2011-01-18 삼성전기주식회사 휴대용 단말기의 피드포워드 방식의 위상 잡음 제거 장치 및 그 방법
US8976981B2 (en) * 2010-10-07 2015-03-10 Blackberry Limited Circuit, system and method for isolating a transducer from an amplifier in an electronic device
US8995944B2 (en) 2010-12-09 2015-03-31 Rf Micro Devices, Inc. Radio frequency switch for suppressing intermodulation
US8706070B2 (en) * 2011-03-15 2014-04-22 Rf Micro Devices, Inc. RF system for reducing intermodulation (IM) products
US9804220B2 (en) * 2014-11-26 2017-10-31 Taiwan Semiconductor Manufacturing Company Ltd. Device testing and monitoring method thereof
US9859930B2 (en) * 2015-08-11 2018-01-02 Mediatek Inc. Multi-path low-noise amplifier and associated low-noise amplifier module and receiver
US10749565B1 (en) * 2019-04-30 2020-08-18 T-Mobile Usa, Inc. RF front end reduction of receiver de-sensitivity

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69620272T2 (de) * 1996-09-24 2003-07-24 Hewlett-Packard Co. (N.D.Ges.D.Staates Delaware), Palo Alto Datenverabeitungsgerät und -verfahren
US6393372B1 (en) * 1999-05-17 2002-05-21 Eugene Rzyski Automated frequency stepping noise measurement system
JP4558155B2 (ja) * 2000-07-28 2010-10-06 株式会社日立国際電気 増幅装置
US6496064B2 (en) * 2000-08-15 2002-12-17 Eugene Rzyski Intermodulation product cancellation circuit
US7053702B2 (en) * 2000-11-20 2006-05-30 Soma Networks, Inc. Feed forward amplifier
JP2005318202A (ja) * 2004-04-28 2005-11-10 Japan Radio Co Ltd 発振回路及びそれを有する位相同期ループ
US8965727B2 (en) 2005-05-20 2015-02-24 Omniphase Research Laboratories, Inc. Intelligent low noise design

Also Published As

Publication number Publication date
US7693674B2 (en) 2010-04-06
US20070032976A1 (en) 2007-02-08
US8014967B2 (en) 2011-09-06
JP2009545277A (ja) 2009-12-17
WO2008014503A3 (en) 2008-05-29
WO2008014503A2 (en) 2008-01-31
AU2007278883A1 (en) 2008-01-31
EP2069812A2 (en) 2009-06-17
KR20090069164A (ko) 2009-06-29
US20100049463A1 (en) 2010-02-25

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