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Branz et al., 1994 - Google Patents

Structural relaxation and structural memory at amorphous silicon dangling bonds

Branz et al., 1994

Document ID
3759997736074417522
Author
Branz H
Fedders P
Publication year
Publication venue
MRS Online Proceedings Library (OPL)

External Links

Snippet

We examine the energy and time scales of configurational relaxation around the dangling bond defect, D, in hydrogenated Amorphous silicon (a-Si: H). After D captures or emits charge, its bond angle, electron energy eigenvalues and local structural environment all …
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