[go: up one dir, main page]

Jin et al., 2009 - Google Patents

Mechanical Researches on Young′ s Modulus of SCS Nanostructures

Jin et al., 2009

View PDF @Full View
Document ID
10737291202414669947
Author
Jin Q
Li T
Zhou P
Wang Y
Publication year
Publication venue
Journal of Nanomaterials

External Links

Snippet

Nanostructures of SingleCrystalSilicon (SCS) with superior electrical, mechanical, thermal, and optical properties are emerging in the development of novel nanodevices. Mechanical properties especially Young′ s modulus are essential in developing and utilizing such …
Continue reading at onlinelibrary.wiley.com (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANO-TECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nano-structures

Similar Documents

Publication Publication Date Title
Espinosa et al. Design and operation of a MEMS-based material testing system for nanomechanical characterization
Tan et al. Mechanical characterization of nanofibers–a review
US8069733B2 (en) Device and method for measuring electromechanical properties and microstructure of nano-materials under stress state
Zhang et al. In situ electron microscopy mechanical testing of silicon nanowires using electrostatically actuated tensile stages
Sharpe Jr Murray lecture tensile testing at the micrometer scale: Opportunities in experimental mechanics
JP2009526972A (en) Micromachines and nanomachines for testing the physical properties of micro- and nano-sized material samples that actuate internal stresses
Kiuchi et al. Mechanical characteristics of FIB deposited carbon nanowires using an electrostatic actuated nano tensile testing device
Jin et al. Mechanical Researches on Young′ s Modulus of SCS Nanostructures
Samuel et al. Mechanical testing of pyrolysed poly-furfuryl alcohol nanofibres
Sohgawa et al. Detection of amyloid beta fibril growth by liposome-immobilized micro-cantilever with NiCr thin-film strain gauge
Pennelli et al. Correlation between surface stress and apparent Young’s modulus of top-down silicon nanowires
Furmanchuk et al. Mechanical properties of silicon nanowires
Zhu et al. Young's Modulus Characterization of Nano‐Level Silicon Nanomembrane
Huang et al. Real-time quantitative electromechanical characterization of nanomaterials based on integrated MEMS device
JP4431733B2 (en) Ultra high vacuum scanning probe microscope
Sharpe Jr Mechanical Property Measurement at the Micro/Nano‐scale 1
Jin et al. A MEMS device for in-situ TEM test of SCS nanobeam
Wang et al. In situ TEM/SEM electronic/mechanical characterization of nano material with MEMS chip
Ya’akobovitz et al. A MEMS nano-extensometer with integrated de-amplification mechanism
Minary-Jolandan et al. Mechanical and electromechanical characterization of one-dimensional piezoelectric nanomaterials
Zhang A nano-tensile testing system for studying nanostructures inside an electron microscope: design, characterization and application
Jin et al. Confirmation on the size-dependence of Young's modulus of single crystal silicon from the TEM tensile tests
Jin et al. In-situ TEM tensile test of 90nm-thick< 110> SCS beam using MEMS chip
Jin et al. Young's modulus size effect of SCS nanobeam by tensile testing in electron microscopy
Zhang et al. An investigation of electrical transport properties through a monolithic square-configured micro-four-point probe with ultra-sharp tips