Li et al., 2017 - Google Patents
Optical diffraction tomography microscopy with transport of intensity equation using a light-emitting diode arrayLi et al., 2017
- Document ID
- 10376844907006123957
- Author
- Li J
- Chen Q
- Zhang J
- Zhang Z
- Zhang Y
- Zuo C
- Publication year
- Publication venue
- Optics and lasers in engineering
External Links
Snippet
Optical diffraction tomography (ODT) is an effective label-free technique for quantitatively refractive index imaging, which enables long-term monitoring of the internal three- dimensional (3D) structures and molecular composition of biological cells with minimal …
- 238000003325 tomography 0 title abstract description 34
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/10—Condensers affording dark-field illumination
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/178—Methods for obtaining spatial resolution of the property being measured
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Instruments as specified in the subgroups and characterised by the use of optical measuring means
- G01B9/02—Interferometers for determining dimensional properties of, or relations between, measurement objects
- G01B9/02091—Tomographic low coherence interferometers, e.g. optical coherence tomography
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B27/00—Other optical systems; Other optical apparatus
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Instruments as specified in the subgroups and characterised by the use of optical measuring means
- G01B9/02—Interferometers for determining dimensional properties of, or relations between, measurement objects
- G01B9/02001—Interferometers for determining dimensional properties of, or relations between, measurement objects characterised by manipulating or generating specific radiation properties
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Li et al. | Optical diffraction tomography microscopy with transport of intensity equation using a light-emitting diode array | |
| Wang et al. | Optical ptychography for biomedical imaging: recent progress and future directions | |
| Kandel et al. | Epi-illumination gradient light interference microscopy for imaging opaque structures | |
| Li et al. | Efficient quantitative phase microscopy using programmable annular LED illumination | |
| Zuo et al. | Lensless phase microscopy and diffraction tomography with multi-angle and multi-wavelength illuminations using a LED matrix | |
| Wu et al. | Lens-free on-chip 3D microscopy based on wavelength-scanning Fourier ptychographic diffraction tomography | |
| US8731272B2 (en) | Computational adaptive optics for interferometric synthetic aperture microscopy and other interferometric imaging | |
| McLeod et al. | Unconventional methods of imaging: computational microscopy and compact implementations | |
| JP6622154B2 (en) | Three-dimensional refractive index imaging and fluorescence structured illumination microscope system using wavefront controller and method using the same | |
| CA2934556C (en) | Optical tomography apparatus and method | |
| Soto et al. | Optical diffraction tomography with fully and partially coherent illumination in high numerical aperture label-free microscopy | |
| Hosseini et al. | Scanning color optical tomography (SCOT) | |
| Liu et al. | Tomographic diffractive microscopy and multiview profilometry with flexible aberration correction | |
| CN108169173A (en) | A kind of big visual field high-resolution three dimensional diffraction chromatography micro imaging method | |
| US9052180B2 (en) | Spatial light interference tomography | |
| Zdańkowski et al. | Common-path intrinsically achromatic optical diffraction tomography | |
| Yu et al. | Full-color three-dimensional microscopy by wide-field optical coherence tomography | |
| CN111610150B (en) | Full-field structured light coherence coding tomography device and method | |
| Ravichandran et al. | Depth enhancement in spectral domain optical coherence tomography using bidirectional imaging modality with a single spectrometer | |
| Kuś | Illumination-related errors in limited-angle optical diffraction tomography | |
| Bouchal et al. | Vortex topographic microscopy for full-field reference-free imaging and testing | |
| CN116337811A (en) | Optical diffraction tomography microscopic imaging method based on opposite illumination | |
| Xiu et al. | Controllable tomography phase microscopy | |
| Wang et al. | Imaging and positioning through scattering media noninvasively by bi-directional exposure | |
| Ali et al. | Structured illumination optical diffraction tomography with beam-propagation-based reconstruction |