[go: up one dir, main page]

Leinweber et al., 2010 - Google Patents

Nitrogen compounds in dissolved and solid environmental samples

Leinweber et al., 2010

Document ID
10055903099449387742
Author
Leinweber P
Kruse J
Walley F
Gillespie A
Eckhardt K
Blyth R
Regier T
Publication year
Publication venue
Developments in Soil Science

External Links

Snippet

The chapter describes the state of the art in Nitrogen K-edge X-ray absorption near-edge structure (N-XANES) spectroscopy applied to environmental problems. Technical details of beamline optimization are given as well as advice for sample preparation and spectral …
Continue reading at www.sciencedirect.com (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6402—Atomic fluorescence; Laser induced fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation

Similar Documents

Publication Publication Date Title
Jeynes et al. “Total IBA”–Where are we?
Siegbahn et al. Electron Spectroscopy with Monochromatized X-rays: This technique constitutes a second-generation approach for a new analytical method.
Folkmann Analytical use of ion-induced X-rays
Okuda et al. Rapid and simple determination of multi-elements in aerosol samples collected on quartz fiber filters by using EDXRF coupled with fundamental parameter quantification technique
Kada et al. Development of micro-optics for high-resolution IL spectroscopy with a proton microbeam probe
Riley et al. Analytical capabilities for iodine detection: Review of possibilities for different applications
Bernardoni et al. ED‐XRF set‐up for size‐segregated aerosol samples analysis
Leinweber et al. Nitrogen compounds in dissolved and solid environmental samples
Al-Merey et al. X-ray fluorescence analysis of geological samples: exploring the effect of sample thickness on the accuracy of results
Marguí et al. A first evaluation of the analytical capabilities of the new X-ray fluorescence facility at International Atomic Energy Agency-Elettra Sincrotrone Trieste for multipurpose total reflection X-ray fluorescence analysis
Kada et al. Determining aerosol particles by in-air micro-IL analysis combined with micro-PIXE
Marguí et al. X-ray fluorescence spectrometry for trace element analysis of vegetation samples
Dion et al. Improving alpha spectrometry energy resolution by ion implantation with ICP-MS
Onorati et al. Gamma background characterization on VESUVIO: Before and after the moderator upgrade
Kunzendorf et al. Determination of rare-earth elements in rocks by isotope-excited X-ray fluorescence spectrometry
Borysiuk et al. Optimization of 18O measurement using NRA for studies of isotopic content in fossil meteorites
Cantaluppi et al. Multielemental analysis of powder samples by direct measurement with TXRF
Jaklevic et al. APPLICATION OP X-RAY FLUORESCENCE TECHNIQUES TO MEASURE ELEMENTAL COMPOSITION OF PARTICLES IN THE ATMOSPHERE
Gomez-Morilla et al. An evaluation of the accuracy and precision of X-ray microanalysis techniques using BCR-126A glass reference material
Sun et al. Quantitative analysis of single aerosol particles using polycapillary X-ray optics
Hulett et al. Analysis of compounds of biological interest by electron spectroscopy
JP2007322411A (en) Energy level measurement and analysis methods
Kawai et al. Comparison between X-ray photoelectron and X-ray absorption spectra of an environmental aerosol sample measured by synchrotron radiation
Angeyo et al. Radioisotope photon‐excited energy dispersive x‐ray fluorescence technique for the analysis of organic matrices
Zavilopulo et al. Dynamic mass spectrometer for studies of organic and inorganic molecules