Shang et al., 2016 - Google Patents
Low power voltage sensing through capacitance to digital conversionShang et al., 2016
View PDF- Document ID
- 99751781769647334
- Author
- Shang D
- Xu Y
- Gao K
- Xia F
- Yakovlev A
- Publication year
- Publication venue
- 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
External Links
Snippet
Capacitance sensors are widely used for sensing physical parameters. Conventional capacitance to digital methods use complex analog ADC techniques which are power hungry. Recently a fully digital solution was proposed with improved power consumption …
- 238000006243 chemical reaction 0 title abstract description 11
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
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- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06F—ELECTRICAL DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/50—Computer-aided design
- G06F17/5009—Computer-aided design using simulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage
- G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06F—ELECTRICAL DIGITAL DATA PROCESSING
- G06F1/00—Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
- G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
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