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Dumiszewska et al., 2005 - Google Patents

Problems with cracking of Al x Ga 1-x N layers.

Dumiszewska et al., 2005

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Document ID
9547037260423986914
Author
Dumiszewska E
Lenkiewicz D
Strupinski W
Jasik A
Jakiela R
Wesolowski M
Publication year
Publication venue
Optica Applicata

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Snippet

AlxGa1–xN is a wide band-gap material, which can be used for manufacture of UV detectors. Unfortunately, there are problems with the cracking of those layers occurring above some critical thickness, which is a bit smaller from the one used for detectors (about 1 …
Continue reading at www.researchgate.net (PDF) (other versions)

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