DeBord, 2012 - Google Patents
Evaluation of Hypervelocity Gold Nanoparticles for Nanovolume Surface Mass SpectrometryDeBord, 2012
View PDF- Document ID
- 9169306501333797767
- Author
- DeBord J
- Publication year
External Links
Snippet
Impacts of high kinetic energy massive gold clusters (~ 500 keV Au400+ 4) exhibit significantly enhanced secondary ion yields relative to traditional atomic or polyatomic primary ions (eg Au3 and C60). The one-of-a-kind instrument used to generate these …
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold data:image/svg+xml;base64,PD94bWwgdmVyc2lvbj0nMS4wJyBlbmNvZGluZz0naXNvLTg4NTktMSc/Pgo8c3ZnIHZlcnNpb249JzEuMScgYmFzZVByb2ZpbGU9J2Z1bGwnCiAgICAgICAgICAgICAgeG1sbnM9J2h0dHA6Ly93d3cudzMub3JnLzIwMDAvc3ZnJwogICAgICAgICAgICAgICAgICAgICAgeG1sbnM6cmRraXQ9J2h0dHA6Ly93d3cucmRraXQub3JnL3htbCcKICAgICAgICAgICAgICAgICAgICAgIHhtbG5zOnhsaW5rPSdodHRwOi8vd3d3LnczLm9yZy8xOTk5L3hsaW5rJwogICAgICAgICAgICAgICAgICB4bWw6c3BhY2U9J3ByZXNlcnZlJwp3aWR0aD0nMzAwcHgnIGhlaWdodD0nMzAwcHgnIHZpZXdCb3g9JzAgMCAzMDAgMzAwJz4KPCEtLSBFTkQgT0YgSEVBREVSIC0tPgo8cmVjdCBzdHlsZT0nb3BhY2l0eToxLjA7ZmlsbDojRkZGRkZGO3N0cm9rZTpub25lJyB3aWR0aD0nMzAwLjAnIGhlaWdodD0nMzAwLjAnIHg9JzAuMCcgeT0nMC4wJz4gPC9yZWN0Pgo8dGV4dCB4PScxMzguMCcgeT0nMTcwLjAnIGNsYXNzPSdhdG9tLTAnIHN0eWxlPSdmb250LXNpemU6NDBweDtmb250LXN0eWxlOm5vcm1hbDtmb250LXdlaWdodDpub3JtYWw7ZmlsbC1vcGFjaXR5OjE7c3Ryb2tlOm5vbmU7Zm9udC1mYW1pbHk6c2Fucy1zZXJpZjt0ZXh0LWFuY2hvcjpzdGFydDtmaWxsOiMzQjQxNDMnID5BPC90ZXh0Pgo8dGV4dCB4PScxNjUuNicgeT0nMTcwLjAnIGNsYXNzPSdhdG9tLTAnIHN0eWxlPSdmb250LXNpemU6NDBweDtmb250LXN0eWxlOm5vcm1hbDtmb250LXdlaWdodDpub3JtYWw7ZmlsbC1vcGFjaXR5OjE7c3Ryb2tlOm5vbmU7Zm9udC1mYW1pbHk6c2Fucy1zZXJpZjt0ZXh0LWFuY2hvcjpzdGFydDtmaWxsOiMzQjQxNDMnID51PC90ZXh0Pgo8cGF0aCBkPSdNIDE4OS44LDE1MC4wIEwgMTg5LjgsMTQ5LjggTCAxODkuOCwxNDkuNyBMIDE4OS44LDE0OS41IEwgMTg5LjcsMTQ5LjMgTCAxODkuNiwxNDkuMiBMIDE4OS42LDE0OS4wIEwgMTg5LjUsMTQ4LjkgTCAxODkuNCwxNDguNyBMIDE4OS4zLDE0OC42IEwgMTg5LjEsMTQ4LjUgTCAxODkuMCwxNDguNCBMIDE4OC44LDE0OC4zIEwgMTg4LjcsMTQ4LjIgTCAxODguNSwxNDguMSBMIDE4OC40LDE0OC4xIEwgMTg4LjIsMTQ4LjAgTCAxODguMCwxNDguMCBMIDE4Ny45LDE0OC4wIEwgMTg3LjcsMTQ4LjAgTCAxODcuNSwxNDguMCBMIDE4Ny40LDE0OC4xIEwgMTg3LjIsMTQ4LjEgTCAxODcuMCwxNDguMiBMIDE4Ni45LDE0OC4yIEwgMTg2LjcsMTQ4LjMgTCAxODYuNiwxNDguNCBMIDE4Ni41LDE0OC41IEwgMTg2LjMsMTQ4LjcgTCAxODYuMiwxNDguOCBMIDE4Ni4xLDE0OC45IEwgMTg2LjAsMTQ5LjEgTCAxODYuMCwxNDkuMiBMIDE4NS45LDE0OS40IEwgMTg1LjksMTQ5LjYgTCAxODUuOCwxNDkuNyBMIDE4NS44LDE0OS45IEwgMTg1LjgsMTUwLjEgTCAxODUuOCwxNTAuMyBMIDE4NS45LDE1MC40IEwgMTg1LjksMTUwLjYgTCAxODYuMCwxNTAuOCBMIDE4Ni4wLDE1MC45IEwgMTg2LjEsMTUxLjEgTCAxODYuMiwxNTEuMiBMIDE4Ni4zLDE1MS4zIEwgMTg2LjUsMTUxLjUgTCAxODYuNiwxNTEuNiBMIDE4Ni43LDE1MS43IEwgMTg2LjksMTUxLjggTCAxODcuMCwxNTEuOCBMIDE4Ny4yLDE1MS45IEwgMTg3LjQsMTUxLjkgTCAxODcuNSwxNTIuMCBMIDE4Ny43LDE1Mi4wIEwgMTg3LjksMTUyLjAgTCAxODguMCwxNTIuMCBMIDE4OC4yLDE1Mi4wIEwgMTg4LjQsMTUxLjkgTCAxODguNSwxNTEuOSBMIDE4OC43LDE1MS44IEwgMTg4LjgsMTUxLjcgTCAxODkuMCwxNTEuNiBMIDE4OS4xLDE1MS41IEwgMTg5LjMsMTUxLjQgTCAxODkuNCwxNTEuMyBMIDE4OS41LDE1MS4xIEwgMTg5LjYsMTUxLjAgTCAxODkuNiwxNTAuOCBMIDE4OS43LDE1MC43IEwgMTg5LjgsMTUwLjUgTCAxODkuOCwxNTAuMyBMIDE4OS44LDE1MC4yIEwgMTg5LjgsMTUwLjAgTCAxODcuOCwxNTAuMCBaJyBzdHlsZT0nZmlsbDojMDAwMDAwO2ZpbGwtcnVsZTpldmVub2RkO2ZpbGwtb3BhY2l0eToxO3N0cm9rZTojMDAwMDAwO3N0cm9rZS13aWR0aDowLjBweDtzdHJva2UtbGluZWNhcDpidXR0O3N0cm9rZS1saW5lam9pbjptaXRlcjtzdHJva2Utb3BhY2l0eToxOycgLz4KPC9zdmc+Cg== data:image/svg+xml;base64,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 [Au] 0 title abstract description 63
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
- H01J49/0059—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by a photon beam, photo-dissociation
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/0027—Methods for using particle spectrometers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Brunelle et al. | Biological tissue imaging with time‐of‐flight secondary ion mass spectrometry and cluster ion sources | |
| US7960691B2 (en) | Second ion mass spectrometry method and imaging method | |
| Vickerman | Molecular imaging and depth profiling by mass spectrometry—SIMS, MALDI or DESI? | |
| US8309913B2 (en) | Angled dual-polarity mass spectrometer | |
| Vickerman | Molecular surface mass spectrometry by SIMS | |
| Novikov et al. | The Aun cluster probe in secondary ion mass spectrometry: Influence of the projectile size and energy on the desorption/ionization rate from biomolecular solids | |
| Fletcher et al. | C60, Buckminsterfullerene: its impact on biological ToF‐SIMS analysis | |
| Jiang et al. | High mass resolution multireflection time-of-Flight secondary ion mass spectrometer | |
| SOMOGYI | Mass spectrometry instrumentation and techniques | |
| Wörgötter et al. | Surface-induced reactions and decomposition of the benzene molecular ion C6H6+: Product ion intensities, angular and translational energy distributions | |
| Tabrizchi et al. | Design, construction and calibration of a laser ionization time-of-flight mass spectrometer | |
| DeBord | Evaluation of Hypervelocity Gold Nanoparticles for Nanovolume Surface Mass Spectrometry | |
| Belgacem et al. | Axial spatial distribution focusing: Improving MALDI‐TOF/RTOF mass spectrometric performance for high‐energy collision‐induced dissociation of biomolecules | |
| Wickramasinghe | Femtosecond laser desorption postionization mass spectrometry imaging of geological samples | |
| Wieghaus et al. | Grazing incidence surface‐induced dissociation of protonated peptides generated by matrix‐assisted laser desorption/ionization | |
| Struyf et al. | Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis | |
| Kumar et al. | An experimental set up for studying the fusion edge plasma facing materials using TOF mass spectrometry | |
| Krückeberg et al. | Decay pathway determination of even-size dicationic silver clusters: Ag162+ and Ag182+ revisited by pre-precursor selection and sequential decay | |
| Carado | New Instrumental Developments in Cluster ToF-SIMS | |
| Stoytschew | Megaelectron volt secondary-ion mass spectrometry–yield dependence on experimental parameters and new capabilities of the technique | |
| Krutilin | Water-based Cryogenic Mass Spectrometry with Ultra-short Laser Pulses | |
| Sun et al. | Hybrid System Combining SIMS and Focused Ion Beam-scanning Electron Microscopy | |
| Bottrill | High-energy collision-induced dissociation of macromolecules using tandem double-focusing/time-of-flight mass spectrometry | |
| SMITH et al. | Applications of new mass spectrometric technologies for the structural characterisation of synthetic polymers | |
| Liang | Characterization of Nanoscale Objects and Domains with Massive Cluster SIMS |