Shang et al., 2024 - Google Patents
Insulation degradation characteristics and phase-field simulation of epoxy resin for valve-side bushing under strongly coupled electrothermal fieldShang et al., 2024
- Document ID
- 7586636974792959398
- Author
- Shang G
- Liu X
- Shao Y
- Chen M
- Sun Y
- Zhang Q
- Tang H
- Li X
- Publication year
- Publication venue
- IEEE Transactions on Dielectrics and Electrical Insulation
External Links
Snippet
As voltage levels increase, insulation materials often suffer insulation failures in recent years, such as epoxy resin (ER) for valve-side bushings. Under the combined effect of a strongly coupled electrothermal field, the bushing radial insulation breakdown accident …
- 238000004088 simulation 0 title abstract description 52
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