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de Lima et al., 2021 - Google Patents

Deep semi‐supervised classification based in deep clustering and cross‐entropy

de Lima et al., 2021

Document ID
6910210694304673584
Author
de Lima B
Neto A
Silva L
Machado V
Publication year
Publication venue
International Journal of Intelligent Systems

External Links

Snippet

Self‐labeled techniques, a semi‐supervised classification paradigm (SSC), are highly effective in alleviating the scarcity of labeled data used in classification tasks through an iterative process of self‐training. This problem was addressed by several approaches with …
Continue reading at onlinelibrary.wiley.com (other versions)

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