Jin et al., 2023 - Google Patents
Highly efficient silicon-based thin-film Schottky barrier photodetectorsJin et al., 2023
- Document ID
- 6091297583186583925
- Author
- Jin Y
- Seok J
- Yu K
- Publication year
- Publication venue
- ACS Photonics
External Links
Snippet
Internal photoemission (IPE) is a promising phenomenon for sub-bandgap photodetection at near-infrared wavelengths using large bandgap semiconductor materials. To improve the photon-to-electron conversion efficiency in silicon-based sub-bandgap Schottky barrier …
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GASES [GHG] EMISSION, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/54—Material technologies
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Feng et al. | Achieving infrared detection by all-Si plasmonic hot-electron detectors with high detectivity | |
| Tang et al. | Thermal imaging with plasmon resonance enhanced HgTe colloidal quantum dot photovoltaic devices | |
| Huang et al. | Waveguide-integrated black phosphorus photodetector for mid-infrared applications | |
| Chen et al. | Synergistic effects of plasmonics and electron trapping in graphene short-wave infrared photodetectors with ultrahigh responsivity | |
| Sun et al. | Photodetection by hot electrons or hot holes: a comparable study on physics and performances | |
| Gong et al. | Angle-independent hot carrier generation and collection using transparent conducting oxides | |
| Zhang et al. | Planar hot-electron photodetection with Tamm plasmons | |
| Wen et al. | Hot electron harvesting via photoelectric ejection and photothermal heat relaxation in hotspots-enriched plasmonic/photonic disordered nanocomposites | |
| Jin et al. | Highly efficient silicon-based thin-film Schottky barrier photodetectors | |
| Li et al. | Circularly polarized light detection with hot electrons in chiral plasmonic metamaterials | |
| Knight et al. | Embedding plasmonic nanostructure diodes enhances hot electron emission | |
| Ahmadivand et al. | Generation of magnetoelectric photocurrents using toroidal resonances: a new class of infrared plasmonic photodetectors | |
| Cao et al. | Resonant germanium nanoantenna photodetectors | |
| Liu et al. | Transparent, broadband, flexible, and bifacial-operable photodetectors containing a large-area graphene–gold oxide heterojunction | |
| Chalabi et al. | Hot-electron photodetection with a plasmonic nanostripe antenna | |
| Shokri Kojori et al. | Plasmon field effect transistor for plasmon to electric conversion and amplification | |
| Tsai et al. | Ultra-high-responsivity broadband detection of Si metal–semiconductor–metal schottky photodetectors improved by ZnO nanorod arrays | |
| Krayer et al. | Near-IR imaging based on hot carrier generation in nanometer-scale optical coatings | |
| Strasfeld et al. | Imaging Schottky barriers and ohmic contacts in PbS quantum dot devices | |
| Fan et al. | Redesigning photodetector electrodes as an optical antenna | |
| Zhai et al. | Hot electron generation in silicon micropyramids covered with nanometer-thick gold films for near-infrared photodetectors | |
| Nordin et al. | All-epitaxial integration of long-wavelength infrared plasmonic materials and detectors for enhanced responsivity | |
| Liang et al. | Microcavity-integrated carbon nanotube photodetectors | |
| Grajower et al. | Optimization and experimental demonstration of plasmonic enhanced internal photoemission silicon Schottky detectors in the mid-IR | |
| Babicheva et al. | Hot electron photoemission from plasmonic nanostructures: the role of surface photoemission and transition absorption |