Redesigned PCB for simultaneous Peltier control and surface resistance measurement
The complex consists of two boards - Signal and Power. The power acts like as a controller of the Peltier element. Signal measures surface resistance and temperature. In the table, the top line is the signal board. Lower - power. Drawings as part of a work of art.
More details about the device can be understood from the schematic drawing here. The notes are in Russian.
The controller for the complex is STM32L432KC Nucleo.
- To control the Peltier element, a
100 kHz PWMis used. IRS2104is used to control transistors.- The measurement of surface resistance is carried out by the
four-probe method. - Temperature measurement is carried out by
pt100. - There is an additional port for the
I2Cprotocol
| Four point probe is used to measure resistive properties of semiconductor wafers and thin films [1]. |
|---|
In this case are studing the I - V characteristic of an element depending on the temperature of the sample. It is important to understand the I – V characteristic near the metal-insulator phase transition (MIT), which is about 68 degrees Celsius. You must understand that the ultimate goal is to stabilize the temperature to a specific value. More about the TEC control [2]