| Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data F Wang, W Zhang, S Sun, X Li, C Gu Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013 | 133 | 2013 |
| Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space S Sun, X Li, H Liu, K Luo, B Gu Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 2015 | 88 | 2015 |
| Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space S Sun, X Li, H Liu, K Luo, B Gu International Conference On Computer Aided Design, 478-485, 2013 | 88 | 2013 |
| Efficient SRAM failure rate prediction via Gibbs sampling C Dong, X Li Proceedings of the 48th Design Automation Conference, 200-205, 2011 | 86 | 2011 |
| Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion X Li, W Zhang, F Wang, S Sun, C Gu Proceedings of the International Conference on Computer-Aided Design, 627-634, 2012 | 47 | 2012 |
| Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space S Sun, X Li 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 324-331, 2014 | 44 | 2014 |
| Indirect performance sensing for on-chip self-healing of analog and RF circuits S Sun, F Wang, S Yaldiz, X Li, L Pileggi, A Natarajan, M Ferriss, ... IEEE Transactions on Circuits and Systems I: Regular Papers 61 (8), 2243-2252, 2014 | 39 | 2014 |
| Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits X Li, F Wang, S Sun, C Gu 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 795-802, 2013 | 35 | 2013 |
| Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion S Sun, F Wang, S Yaldiz, X Li, L Pileggi, A Natarajan, M Ferriss, ... Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 1-4, 2013 | 23 | 2013 |
| Machine learning for noise sensor placement and full-chip voltage emergency detection X Liu, S Sun, X Li, H Qian, P Zhou IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 13 | 2016 |
| A statistical methodology for noise sensor placement and full-chip voltage map generation X Liu, S Sun, P Zhou, X Li, H Qian Proceedings of the 52nd Annual Design Automation Conference, 1-6, 2015 | 9 | 2015 |
| Sparse regression driven mixture importance sampling for memory design M Malik, RV Joshi, R Kanj, S Sun, H Homayoun, T Li IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (1), 63-72, 2017 | 8 | 2017 |
| Improved GPSR in inter-vehicle communication S Sun, J Hu, X Luo, Q Wang 2010 International Conference on Communications and Mobile Computing 2, 259-265, 2010 | 8 | 2010 |
| Large-scale circuit performance modeling by bayesian model fusion J Tao, F Wang, P Cachecho, W Zhang, S Sun, X Li, R Kanj, C Gu, X Zeng Machine learning in VLSI computer-aided design, 403-422, 2019 | 6 | 2019 |
| Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space S Sun, X Li 2015 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2015 | 6 | 2015 |
| Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits S Sun, X Li, C Gu Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 1-4, 2013 | 5 | 2013 |
| Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space S Sun, X Li The 20th Asia and South Pacific Design Automation Conference, 302-307, 2015 | 2 | 2015 |
| Accurate image specular highlight removal based on light field imaging. In 2015 Visual Communications and Image Processing (VCIP) C Xu, X Wang, H Wang, Y Zhang IEEE, 2015 | 2 | 2015 |
| Fast Statistical Analysis of Rare Circuit Failure Events J Tao, S Sun, X Li, H Liu, K Luo, B Gu, X Zeng Machine Learning in VLSI Computer-Aided Design, 349-373, 2019 | 1 | 2019 |
| Fast Statistical Analysis of Rare Failure Events for SRAM Circuits in High-Dimensional Variation Space S Sun Carnegie Mellon University Pittsburgh, PA, 2015 | 1 | 2015 |
